JP3733586B2 - Foreign matter inspection device - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a foreign substance inspection apparatus such as an X-ray inspection apparatus.
[0002]
[Prior art]
X-rays are irradiated on the inspection object, a transmitted X-ray image is captured to obtain a captured image, and the captured image is mixed in the inspection object based on a processing result obtained by image processing. A foreign substance inspection apparatus that detects foreign substances is known. In addition, for inspection objects that have been inspected by this foreign substance inspection device, when post-processing such as excluding inspection objects including foreign substances based on the inspection results or distributing inspection objects according to the presence or absence of foreign substances There is.
[0003]
In the inspection by the foreign substance inspection apparatus, it is necessary to set each component of the foreign substance inspection apparatus in advance according to the type of the inspection object, the use state of the foreign substance inspection apparatus, the installation environment, and the like. The setting items include, for example, the X-ray condition of the generated X-ray, the detection sensitivity of the X-ray detector that detects the transmitted X-ray, the speed of the transfer conveyor that sequentially conveys the detection target, the operating time of the exclusion device, or the sensor And the magnification of the captured image with respect to the detection target.
[0004]
In such a foreign substance inspection apparatus, foreign substance inspections in various measurement states are realized by setting the setting items using apparatus setting parameters.
[0005]
[Problems to be solved by the invention]
Conventionally, when a foreign substance inspection apparatus changes the apparatus setting parameter during operation of the foreign substance inspection apparatus, it is difficult to identify which apparatus setting parameter the inspection result obtained has been inspected. It is designed not to change device setting parameters during operation. In some foreign matter inspection devices, considering that the main purpose is to accurately detect foreign matter in the inspection object, only the sensitivity threshold related to the detection sensitivity is available even during operation of the foreign matter inspection device. What can be changed is known.
[0006]
Therefore, when changing device setting parameters other than the sensitivity threshold, such as the speed of the conveyor and device setting parameters related to the sorting device during operation, change the device setting parameters after stopping the foreign substance inspection device once. The foreign substance inspection apparatus is restarted after the change, thereby clarifying the relationship between the change in the apparatus setting parameter and the inspection result.
[0007]
Thus, if the operation of the apparatus is stopped each time the apparatus setting parameter is changed, there are problems that the operation becomes complicated and the inspection efficiency is lowered.
In addition, even when counting the inspection object, if the counting is continued with the foreign object inspection device operated, the inspection results obtained will be mixed with those under different inspection conditions, so the foreign object inspection device must be stopped once. There is a problem similar to the above.
[0008]
Therefore, the present invention has an object to solve the problems of the above-described conventional foreign matter inspection apparatus, and to enable the device setting parameter to be changed even during operation in the foreign matter inspection device. The purpose is to accurately record the number of examinations even when the change is made.
[0009]
[Means for Solving the Problems]
According to the present invention, in a foreign matter inspection apparatus that performs foreign matter inspection based on a captured image of an inspection object, parameter change means for changing device setting parameters of each component of the foreign matter inspection device, and change history of the device setting parameters are recorded. The change history recording means records the change history of the device setting parameters over time based on a change command that the parameter change means performs on each component.
[0010]
The parameter changing means changes the device setting parameters of each component of the foreign substance inspection device based on a device setting parameter change request input from the operation panel or the external control device. Device setting parameters include, for example, X-ray conditions of generated X-rays, detection sensitivity of an X-ray detector for detecting transmitted X-rays, speed of a conveyor for sequentially transporting detection objects, operating time of an exclusion device, sensor Mounting position, magnification of the captured image with respect to the detection target, and the like.
[0011]
The parameter changing means sends the device setting parameter value to the component for which the device setting parameter is requested to be changed, and changes the device setting parameter to the change history recording unit. Let me record. The change history recording means records the change of the device setting parameter over time. As a result, even if the foreign substance inspection apparatus is in operation, it is possible to know the change history of how the component setting parameter of which component has been changed, so that the parameter value can be obtained without stopping the foreign substance inspection apparatus. Can be changed.
[0012]
In addition, the foreign matter inspection apparatus of the present invention includes inspection number recording means for recording the number of inspections for foreign matter inspection, and this inspection number recording means records after adding the number of inspections before the change after changing the device setting parameter. Select from various recording forms, such as a form that records the number of inspections before change and the number of inspections after change separately, or a form that discards the number of inspections before change and records only the number of inspections after change The number of examinations before and after the change of the apparatus setting parameter is recorded according to the form.
[0013]
Thus, even if the apparatus setting parameter is changed during the operation of the foreign substance inspection apparatus, the number of inspections recorded before and after the change can be identified, so that the number of inspections can be accurately recorded.
According to another aspect of the present invention, the parameter changing means forms a change sequence for determining a change order in accordance with the device setting parameter requested to be changed, and issues a command to the constituent parts in accordance with the change order. . Thereby, it is possible to prevent the interference of the operation between the constituent parts and the shift of the timing due to the movement of the inspection object.
[0014]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
FIG. 1 is a schematic configuration diagram for explaining a schematic configuration of a foreign substance inspection apparatus according to the present invention, and FIGS. 2 and 3 are schematic functions for explaining functions of one aspect of parameter changing means of the foreign substance inspection apparatus according to the present invention. FIGS. 4 and 5 are schematic functional diagrams and flowcharts for explaining functions of other modes of other parameter changing means of the foreign matter inspection apparatus of the present invention.
[0015]
In FIG. 1, a foreign substance inspection apparatus 1 performs various types of foreign substance inspection processes according to apparatus setting parameter values. Hereinafter, an X-ray foreign substance inspection apparatus that inspects foreign substances contained in an inspection object by irradiating the inspection object with X-rays and detecting transmitted X-rays will be described as an example.
The foreign matter inspection apparatus 1 irradiates the inspection target S from the X-ray generation means 2 provided in the upper part A of the case to the inspection target S moving on the transport conveyor 9 provided in the case B. The transmitted transmitted X-ray is imaged by an X-ray detector 10 such as an X-ray line sensor provided below the transport conveyor 9, and the captured image is processed by the image processing means 5, thereby existing in the inspection object. Detect foreign objects.
[0016]
The X-ray generation unit 2 includes an X-ray generation unit 2a that generates X-rays and an X-ray control unit 2b that controls the X-ray intensity generated by adjusting a voltage applied to the X-ray generation unit 2a. A position sensor 12 such as a photoelectric sensor is provided on the upstream side of the transport conveyor 9 and detects that the inspection object transported in the direction of the arrow in the figure has reached the X-ray irradiation position.
The foreign matter inspection apparatus 1 includes a control unit 3. The control means 3 controls each component part including the electric parts such as the X-ray generation means 2, the X-ray detector 10, the transfer conveyor 9, and the position sensor 12 and the image processing means 5, and also operates the operation panel 6 or foreign matter. A function of setting device setting parameters of each component based on a control device (not shown) that controls various devices including the inspection device 1 as a whole, and storing the set device setting parameters in the parameter storage unit 7 The parameter changing means 4 having
[0017]
Moreover, the foreign substance inspection apparatus 1 of the present invention includes a recording unit 8 that records a change history associated with a change in apparatus setting parameters. Upon receiving a change request for changing the device setting parameter from the operation panel 6 or a control device (not shown), the parameter changing unit 4 sends the device setting parameter to the corresponding various components to change the parameter value. The recording means 8 records the change history associated with.
In the lower part C of the casing, a power supply device 11 is provided, and power is supplied to each component included in the foreign matter inspection apparatus 1 in addition to the X-ray generation means 2, the transfer conveyor 9, the X-ray detector 10.
[0018]
According to the foreign substance inspection apparatus having the above-described configuration, the configuration of the parameter setting unit 4 and the recording unit 8 makes it possible to change how the device setting parameters of which component part are changed even when the foreign substance inspection apparatus is in operation. Since the change history can be recorded and known, the parameter value can be changed without stopping the foreign matter inspection apparatus.
[0019]
Hereinafter, one aspect of the parameter changing means of the foreign substance inspection apparatus of the present invention will be described with reference to FIGS. 2 and 3, and another aspect of the parameter changing means of the foreign substance inspection apparatus of the present invention will be described with reference to FIGS. .
First, an aspect of parameter changing means of the foreign matter inspection apparatus of the present invention will be described. In the schematic functional diagram shown in FIG. 2, the control means 3 includes parameter changing means 4. The parameter changing unit 4 is connected to the operation panel 6, the component device 15, the parameter storage unit 7, and the recording unit 8.
[0020]
The parameter changing means 4 receives a change request for changing the device setting parameter from the operation panel 6 or a control device (not shown), and based on this change request, various components such as the transport conveyor 9 provided in the foreign matter inspection apparatus 1, A device setting parameter is sent to a component device 15 (a portion surrounded by a broken line in FIG. 2) such as a device such as a sorting device 14 arranged adjacent to the inspection device 1 to change the parameter.
Further, the parameter changing means 4 updates the parameter value of the apparatus setting parameter stored in the parameter storing means 7 for the requested change, and thereafter uses this apparatus setting parameter value to perform a foreign substance inspection process. Do.
[0021]
Further, the parameter changing unit 4 causes the recording unit 8 to record the device setting parameter change history and the number of examinations as a process characteristic of the present invention. In the configuration shown in FIG. 2, the recording unit 8 includes a change history recording unit 8a and an inspection number recording unit 8b. The change history recording means 8a records a component for changing the apparatus setting parameter and its parameter value for each change to form a change history. By displaying the change history on, for example, a display unit provided in the operation panel, it is possible to know the component that has changed the parameter value and the changed parameter value.
[0022]
The inspection number recording means 8b is a means for recording the inspection number of the inspected inspection object, and counts the inspection object inspected by the counting means 13 using the output of the sensor or component equipment provided in the foreign matter inspection apparatus. Record. The inspection number recording means 8b can select the recording form of the inspection number after changing the apparatus setting parameter. As the recording form of the number of inspections, for example, after the change of the device setting parameter, the form of recording by adding to the number of inspections before the change, the form of recording separately the number of inspections before the change and the number of inspections after the change Alternatively, there are various recording forms such as a form in which the number of inspections before change is discarded and only the number of inspections after change is recorded, and can be changed when the apparatus setting parameter is changed. This selection can be set by selection from the operation panel 6 by issuing a command to display the selection on the operation panel 6 from the parameter changing means 4 when the apparatus setting parameter is changed.
[0023]
Since the number of inspections can be selected according to changes in the device setting parameters, the number of inspections recorded before and after the change can be changed even if the device setting parameters are changed during the operation of the foreign matter inspection device. Can be identified.
[0024]
Next, a parameter changing procedure performed by the parameter changing unit shown in FIG. 2 will be described using the flowchart of FIG.
When a parameter change request is input from the operation panel or a control device (not shown) (step S1), the parameter changing unit 4 analyzes the change request and analyzes analysis data such as the configuration target device to be changed and the device setting parameter value to be changed. Obtained (step S2). The parameter changing means 4 forms a command for changing the parameter value based on the obtained analysis data and outputs it to the corresponding component device. Examples of the command include a command output to the parameter change destination, a change command for changing the device setting parameter to a change parameter value, and a command output to the operation panel 6, and the number of inspections in the inspection number recording unit 8 b. There are a display command for selecting the handling, a command output to the change history recording means 8a, and a recording command for recording the parameter change destination and the changed parameter value.
[0025]
When the parameter changing unit 4 issues a selection command for selecting the recording form of the number of examinations to the operation panel 6, the operation panel 6 displays this selection command on the display portion, and how the device setting parameter is changed. To record the number of examinations in a different recording form (step S3).
[0026]
When the inspection number recording mode is selected from the operation panel in accordance with the display command (step S4), the parameter changing unit 4 instructs the selected recording mode to the inspection number recording unit 8b. The inspection number recording means 8b records the inspection number obtained after the parameter is changed according to the commanded recording mode. In the recording of the number of inspections, the recording format of the number of inspections and the recording mode of the parameters can be confirmed by associating and recording in what recording mode the recording was performed when the parameter was changed (step) S5).
When the inspection number recording mode is not selected in the step S4, the parameter changing unit 4 instructs the recording number recording unit 8b to record a preset recording mode (step S6).
[0027]
Next, another aspect of the parameter changing means of the foreign matter inspection apparatus of the present invention will be described. This aspect forms a change sequence that determines the change order according to the requested device setting parameter, issues a command to the component according to the change order, and thereby malfunctions due to the setting order of the device setting parameter. It is to prevent. Here, the description of the schematic configuration shown in FIG. 4 is omitted for the portions common to the schematic configuration shown in FIG.
[0028]
The control unit 3 includes a parameter changing unit 4 and is connected to the operation panel 6, the component device 15, the parameter storage unit 7, and the recording unit 8 in the same manner as the schematic configuration shown in FIG. The parameter changing unit 4 shown in FIG. 4 includes an analyzing unit 4a that analyzes a change request from the operation panel 6 and a control device (not shown), a command unit 4b that outputs various commands based on the analysis results, and a component device. An operation confirmation means 4c for inputting 15 operation state signals and confirming the operation is provided.
[0029]
The analysis unit 4a analyzes the change request and obtains analysis data such as the component device to be changed and the value of the device setting parameter to be changed. The command means 4b includes a change sequence creation means 4b1 for creating a change sequence based on the analysis data, a parameter storage means 7, a change history recording means 8a, an inspection number recording means 8b, a component device 15 and the like based on the created change sequence. There is provided command output means 4b2 for outputting commands corresponding to the respective sections. Each command output to each part by the command output means 4b2 can be the same as that of the parameter changing means 4 in the above aspect.
[0030]
The change sequence determines the order and timing of commands for related component devices when changing the device setting parameters, thereby preventing malfunctions caused by the parameter setting order. For example, when changing the transfer speed of the transfer conveyor, after changing the parameter value of the transfer speed, the setting of the distribution speed and timing of the distribution device is changed according to a change sequence having a predetermined time. The predetermined time can be, for example, the time from when the inspection result is obtained until the inspection object reaches the sorting device. By providing such a predetermined time, an erroneous distribution based on the inspection result of different inspection objects can be performed. The operation can be prevented. The change sequence can be shaped based on the analysis result by preparing a program for forming the change sequence.
[0031]
The command output means 4b2 outputs a command to each part in accordance with the change sequence created by the change sequence creation means 4b1. At this time, when the change sequence is executed in accordance with the operation state of each part of the component device 15, the change sequence is executed based on the confirmation signal from the operation confirmation unit 4c.
[0032]
Next, a parameter changing procedure performed by the parameter changing unit shown in FIG. 4 will be described using the flowchart of FIG.
When the parameter change unit 4 inputs a parameter change request from the operation panel or a control device (not shown) (step S11), the analysis unit 4a analyzes the change request, changes the component device to be changed, the value of the device setting parameter to be changed, and the like. Is obtained (step S12). The change sequence creation means 4b1 creates a command for changing the parameter value and its procedure as a change sequence based on the obtained analysis data (step S13).
[0033]
When the parameter changing unit 4 (command output unit 4b2) issues a selection command for selecting the recording form of the number of examinations to the operation panel 6, the operation panel 6 displays this selection command on the display portion and changes the device setting parameter. After that, the recording format of the number of examinations is selected. When the inspection number recording mode is selected from the operation panel in response to the display command (step S14), the parameter changing unit 4 commands the selected recording mode to the inspection number recording unit 8b. The inspection number recording means 8b records the inspection number obtained after the parameter is changed according to the commanded recording mode. In the recording of the number of inspections, the recording format of the number of inspections and the recording mode of the parameters can be confirmed by associating and recording in what recording mode the recording was performed when the parameter was changed (step) S15). When the inspection number recording mode is not selected in the step S14, the parameter changing unit 4 instructs the recording number recording unit 8b to record a preset recording mode (step S16).
[0034]
The command output means 4b2 outputs a command to the corresponding component device according to the order determined by the change sequence. As in the case of the above-described mode, the command is a command to be output to a parameter change destination, a change command to change the device setting parameter to a change parameter value, a command to be output to the operation panel 6, and an inspection number recording unit There are a display command for selecting the handling of the number of examinations in 8b, a command to be output to the change history recording means 8a, and a recording command for recording the parameter change destination and the changed parameter value (step S17).
[0035]
When the change sequence requests operation confirmation, after confirming the operation of the portion requested by the operation confirmation means 4c (step S18), a command is output in accordance with the next change sequence in step S17. When all the commands set by the change sequence are completed, the parameter change by the set change sequence is completed, and thereafter the number of examinations is recorded in the recording mode set in the steps S14 to S16.
In the step S19, if the operation confirmation cannot be obtained, it is displayed on the display means (step S20).
[0036]
According to the embodiment of the present invention, the parameter changing means forms a change sequence for determining the change order in accordance with the device setting parameter requested to be changed, and issues a command to the component according to the change order. Thereby, it is possible to prevent the interference of the operation between the constituent parts and the shift of the timing due to the movement of the inspection object.
[0037]
【The invention's effect】
As described above, according to the foreign matter inspection apparatus of the present invention, the apparatus setting parameter can be changed even during operation, and even when the apparatus setting parameter is changed during operation. The number of inspections can be recorded accurately.
[Brief description of the drawings]
FIG. 1 is a schematic configuration diagram for explaining a schematic configuration of a foreign matter inspection apparatus of the present invention.
FIG. 2 is a schematic functional diagram for explaining the function of one aspect of parameter changing means of the foreign matter inspection apparatus of the present invention.
FIG. 3 is a flowchart for explaining the function of one aspect of parameter changing means of the foreign matter inspection apparatus of the present invention.
FIG. 4 is a schematic functional diagram for explaining functions of another aspect of another parameter changing unit of the foreign matter inspection apparatus of the present invention.
FIG. 5 is a flowchart for explaining the function of another aspect of another parameter changing means of the foreign matter inspection apparatus of the present invention.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ... Foreign substance inspection apparatus, 2 ... X-ray generation means, 2a ... X-ray generation unit, 2b ... X-ray control means, 3 ... Control means, 4 ... Parameter change means, 4a ... Analysis means, 4b ... Command means, 4b1 ... Change sequence creation means, 4b2 ... command output means, 4c ... operation confirmation means, 5 ... image processing means, 6 ... operation panel, 7 ... parameter storage means, 8 ... recording means, 8a ... change history recording means, 8b ... number of examinations Recording means, 9 ... conveyance conveyor, 10 ... X-ray detector (X-ray line sensor), 11 ... power supply device, 12 ... sensor (photoelectric sensor), 13 ... counting means, 14 ... sorting device, 15 ... component equipment, S ... inspection object.

Claims (1)

In a foreign matter inspection apparatus that performs foreign matter inspection based on a captured image of an inspection object,
Parameter changing means for changing device setting parameters of each component of the foreign substance inspection device;
Change history recording means for recording a change history of the device setting parameters;
Provided with inspection number recording means for recording the number of inspections of foreign matter inspection,
The change history recording means records the device setting parameter change history over time based on a change command that the parameter changing means performs on each component,
The number-of-inspection-recording means is configured to add and record the number of inspections before the change before and after the change of the device setting parameter, to record the number of inspections before the change and the number of inspections after the change separately, or to change A foreign matter inspection apparatus that records in a recording form selected from among forms in which the number of previous inspections is discarded and only the number of inspections after change is recorded.

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