Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JP3738844B2 - Roundness measuring machine - Google Patents
[go: Go Back, main page]

JP3738844B2 - Roundness measuring machine - Google Patents

Roundness measuring machine Download PDF

Info

Publication number
JP3738844B2
JP3738844B2 JP2002258742A JP2002258742A JP3738844B2 JP 3738844 B2 JP3738844 B2 JP 3738844B2 JP 2002258742 A JP2002258742 A JP 2002258742A JP 2002258742 A JP2002258742 A JP 2002258742A JP 3738844 B2 JP3738844 B2 JP 3738844B2
Authority
JP
Japan
Prior art keywords
measured
eccentricity
measurement
inclination
measuring machine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2002258742A
Other languages
Japanese (ja)
Other versions
JP2004093529A (en
Inventor
昇 菊地
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP2002258742A priority Critical patent/JP3738844B2/en
Priority to GB0320565A priority patent/GB2393790B/en
Priority to DE10340851.7A priority patent/DE10340851B4/en
Publication of JP2004093529A publication Critical patent/JP2004093529A/en
Application granted granted Critical
Publication of JP3738844B2 publication Critical patent/JP3738844B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/201Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures for measuring roundness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G01B7/282Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures for measuring roundness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/30Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Description

【0001】
【発明の属する技術分野】
本発明は真円度測定機に係り、特に被測定物の偏心補正や傾斜補正を行う時の測定倍率自動設定機能を有する真円度測定機に関する。
【0002】
【従来の技術】
真円度測定機で被測定物の真円度等を測定する場合、真円度測定機の回転軸に対して被測定物のチルチング(傾斜合わせ)とセンタリング(心出し)を行う必要がある。
【0003】
センタリングは、被測定物の1断面を測定して偏心量を求め、その偏心量が0になるように調整する。また、チルチングは被測定物の高さが異なる2断面を測定し、各断面の偏心量と高さの差とから傾斜量を求める。又は、被測定物の端面が被測定物の軸心と直角の場合は端面1回転分の高さを測定して傾斜量を求め、傾斜量が0になるように調整する。
【0004】
このセンタリング作業は、検出器で検出した変位量の1/2だけXYテーブルを正確に移動する必要があり、またチルチング作業もX方向とY方向の傾斜に分けて正確に調整する必要があり、どちらも調整作業に時間が掛かるとともに、調整作業に熟練者が必要であるという問題がある。
【0005】
この問題を解決するため、調整作業を容易に行うためのいくつかの方法が提案されている(例えば、特許文献1参照。)。
【0006】
【特許文献1】
特開平4−329306号公報
【0007】
【発明が解決しようとする課題】
しかし、これら提案された従来の方法においても、偏心量や傾斜量が大きい場合は、先ず低い測定倍率で測定を行い、その測定値に基いて調整する。そして測定倍率を徐々に上げて測定と調整を繰り返す必要があった。この場合測定倍率をいっきに高倍率に挙げて行うと、変位量が測定範囲からはみ出して測定できない場合があり、その場合は測定できる倍率まで落としてやり直す必要があった。
【0008】
そのため、測定倍率を変更しながら同じ操作を何度も繰り返さなければならないので煩わしく、また調整作業に時間が掛かるという問題が依然として残っていた。
【0009】
本発明は、このような事情に鑑みてなされたもので、被測定物の心出しや傾斜補正を行うに当たり、測定倍率を変更しながら同じ操作を何度も繰り返す必要がなく、被測定物の心出しや傾斜補正を容易に短時間で行うことのできる真円度測定機を提供することを目的とする。
【0010】
【課題を解決するための手段】
前記目的を達成するために、請求項1に記載の発明は、被測定物を検出器に対して相対的に回転させ、被測定物の真円度を測定する真円度測定機において、被測定物を載置すると共に、X方向微動つまみ及びY方向微動つまみを有するXYテーブルと、前記検出器によって被測定物の側面が1周分計測された時に、前記真円度測定機の回転中心と被測定物の中心とのX方向及びY方向の偏心量を算出する演算手段と、前記算出されたX方向及びY方向の偏心量を表示する表示手段と、前記表示されたX方向及びY方向の偏心量に基いて前記X方向微動つまみ及びY方向微動つまみが操作され、前記X方向及びY方向の偏心量が調整された時に、調整後の被測定物の側面1周分の計測データを予測する処理手段と、を有し、前記予測された計測データから被測定物の偏心補正に最適な測定倍率が前記処理手段によって決定されることを特徴としている。
【0011】
請求項1の発明によれば、低倍率で被測定物を測定して表示された偏心量に基いて偏心調整した後、次の測定データを予測し、その結果から心出しに最適な測定倍率が決定されるので、測定倍率を徐々に上げて測定と調整を繰り返す必要がなく、被測定物の心出しを容易に短時間で行うことができる。
【0012】
また、請求項2に記載の発明は、被測定物を検出器に対して相対的に回転させ、被測定物の真円度を測定する真円度測定機において、被測定物を載置すると共に、X方向傾斜調整つまみ及びY方向傾斜調整つまみを有する傾斜テーブルと、前記検出器によって被測定物の側面が少なくとも異なる2箇所の高さで夫々1周分計測された時に、あるいは低倍率で被測定物の端面が1回転分計測された時に、前記真円度測定機の回転軸に対する被測定物のX方向及びY方向の傾斜量を算出する演算手段と、前記算出されたX方向及びY方向の傾斜量を表示する表示手段と、前記表示されたX方向及びY方向の傾斜量に基いて前記X方向傾斜調整つまみ及びY方向傾斜調整つまみが操作され、前記X方向及びY方向の傾斜量が調整された時に、調整後の被測定物の側面の少なくとも異なる2箇所の高さにおける夫々1周分の計測データ、あるいは被測定物の端面1回転分の計測データを予測する処理手段と、を有し、前記予測された計測データから被測定物の傾斜補正に最適な測定倍率が前記処理手段によって決定されることを特徴としている。
【0013】
請求項2の発明によれば、低倍率で被測定物を測定して表示された傾斜量に基いて傾斜調整した後、次の測定データを予測し、その結果から傾斜補正に最適な測定倍率が決定されるので、測定倍率を徐々に上げて測定と調整を繰り返す必要がなく、被測定物の傾斜補正を容易に短時間で行うことができる。
【0014】
また、請求項3に記載の発明は、請求項1又は請求項2の発明において、前記表示手段で表示される表示がバーグラフであることを特徴としている。
【0015】
請求項3の発明によれば、補正量がバーグラフで表示されるので、バーがゼロ位置に減少するまでつまみを回せばよく、偏心補正や傾斜補正の調整を容易に行うことができる。
【0016】
【発明の実施の形態】
以下添付図面に従って、本発明に係る真円度測定機の好ましい実施の形態について詳説する。尚各図において、同一の部材については同一の番号又は符号を付している。
【0017】
図1は、本発明に係る真円度測定機の構成を表わすブロック図である。真円度測定機10は、図1に示すように、本体14には被測定物26を載置するXY/傾斜テーブル12が設けられている。XY/傾斜テーブル12は、X方向微動つまみ22及びY方向微動つまみ23によってX方向及びY方向に微動送りがされ、X方向傾斜つまみ25及びY方向傾斜つまみ24によってX方向及びY方向に傾斜調整がされるようになっている。
【0018】
また、XY/傾斜テーブル12は、軸受16を介してモータ20によって回転可能に支持されている。モータ20の回転軸にはエンコーダ18が取付けられ、回転角が高精度で読込まれるようになっている。
【0019】
また、真円度測定機10は先端子30が被測定物26に接触して被測定物26を測定する検出器28を有しており、検出信号は増幅器32、A/D変換器34を経由して演算/処理手段36に入力され、処理結果は表示手段40で表示される。また、真円度測定機10の動作はプログラム38で制御される。
【0020】
軸受16には超高精度の静圧エアーベアリングが用いられ、XY/傾斜テーブル12は0.005μmの回転精度で回転される。また、検出器28には差動変圧器を用いた電気マイクロメータが使用され、被測定物26に接触する先端子30の変位量を検出する。
【0021】
この真円度測定機10で被測定物26の真円度等を測定する場合は、被測定物26をXY/傾斜テーブル12上に載置した後、最初にXY/傾斜テーブル12の回転中心と被測定物26の中心との偏心補正と、XY/傾斜テーブル12の回転軸に対する被測定物26の傾斜補正とを行う。
【0022】
次に、検出器28の先端子30が被測定物26の側面に接触した状態でXY/傾斜テーブル12がモータ20によって1回転され、被測定物26の側面1周分のデータが採取される。アナログ電圧値として得られた検出信号は、増幅器32で増幅され、A/D変換器34でデジタル信号に変換されて演算/処理手段36に入力される。演算/処理手段36ではエンコーダ18から入力される回転角度データと、検出器28で検出された変位データとから被測定物26の真円度を演算し、表示手段40で表示する。
【0023】
次に前述の偏心補正の手順について、図2のフローチャートに従って説明する。先ず最初に被測定物26をXY/傾斜テーブル12に載置する。この状態を図3に示す。被測定物26は単にXY/傾斜テーブル12に載置されただけであるから、図3に示すように、被測定物26の中心26AはXY/傾斜テーブル12の回転中心12Aに対し図のX軸から角度θの方向に偏心量Rの心ズレ状態になっている(ステップS1)。
【0024】
この状態で検出器28の先端子30を被測定物26の側面に接触させ、XY/傾斜テーブル12を回転させながら低倍率で被測定物26を1周分測定する。この時の回転角度と検出器28の出力との関係を図4に示す。この場合、被測定物26はXY/傾斜テーブル12の回転中心12Aに対し偏心量Rを有しているので、回転角度と検出器28の出力との関係を示すグラフは、図4に示す用にサインカーブとなる(ステップS3)。
【0025】
偏心量RのX方向偏心量をΔX、Y方向偏心量をΔYとし、XY/傾斜テーブル12の回転角度をθn、その時の検出器出力をDTnとすると、被測定物26の1周分の検出器出力から、X方向及びY方向の偏心量は演算/処理手段36によって次式(1)、及び(2)
【0026】
【数1】

Figure 0003738844
【0027】
【数2】
Figure 0003738844
で算出される(ステップS5)。
【0028】
この状態でXY/傾斜テーブル12を0度の位置に戻し、「X方向目標検出器出力=1周測定時の0度での検出器出力−ΔX」となるように、X方向微動つまみ22を回転させ、X方向偏心量を調整する。具体的にはX方向及びY方向の偏心量は表示手段40によって、図5に示すようにバーグラフで表示されているので、バーグラフのバーが0位置になるまでX方向微動つまみ22を回転させればよい(ステップS7)。
【0029】
次いで、XY/傾斜テーブル12を90度の位置に回転し、「Y方向目標検出器出力=1周測定時の90度での検出器出力−ΔY」となるように、Y方向微動つまみ23を回転させ、Y方向偏心量を調整する。このときもY方向の偏心量はバーグラフで表示されているので、バーグラフのバーが0位置になるまでY方向微動つまみ23を回転させればよい(ステップS9)。
【0030】
ここで今行った偏心補正が1回目の補正か否かが確認され(ステップS11)、1回目の補正であった場合は演算/処理手段36によって偏心補正調整後の1周分測定データが予想される。
【0031】
この1周分測定データの予想は、以下のようにして行われる。即ち、調整されたX方向偏心量をx、Y方向偏心量をyとすると、「x=調整後の0度での検出器出力−X方向目標検出器出力」、「y=調整後の90度での検出器出力−Y方向目標検出器出力」であるので調整された偏心量は、「E=√(x2 +y2 )」であり、その時の偏心方向は、「A=tan-1( y/x)」で表わされ、偏心調整後の1周分予想データは次式(3)
【0032】
【数3】
Figure 0003738844
によって算出される(ステップS13)。図6にこの1周分の予想データのグラフを示す。
【0033】
次に、この予想された検出器データのMax値とMin値が測定範囲を超えない最大の測定倍率が演算/処理手段36によって自動的に決定される(ステップS15)。次いでこの決定された測定倍率がこの真円度測定機10の最高倍率か否か、あるいは自動決定された測定倍率が現状設定されている倍率のまま変更ないか否かが判定される(ステップS17)。
【0034】
自動決定された測定倍率が最高倍率の場合、あるいは現状設定されている倍率のまま変更ない場合は、この偏心補正手順はここで終了する。一方自動決定された測定倍率が最高倍率でない場合、あるいは現状設定されている倍率よりも高倍率の場合は、決定された測定倍率に変更し、被測定物1周分の測定を再度行う(ステップS19)。
【0035】
ステップS19の後はステップS5に戻り、ステップS7、ステップS9と繰り返され偏心補正が行われる。次いでステップS11において、補正が1回目ではないと判定され、最終補正が終了しているので偏心補正手順は終了となる。
【0036】
図7は、このようにして偏心補正が行われた後に被測定物26の真円度測定を行った時の検出器出力データを表わすグラフである。検出器出力データは、図7に示すように、偏心補正が適切に行われ、偏心による振れが見受けられない。
【0037】
XY/傾斜テーブル12の回転軸に対する被測定物26の傾斜補正は、被測定物26の異なる2箇所の高さ位置において1周分のデータが低倍率の測定倍率で採取され、夫々の高さにおけるX方向の偏心量、Y方向の偏心量が算出される。算出された2箇所の高さ夫々におけるX方向偏心量、Y方向偏心量、及び2箇所の高さ位置の差とから被測定物26のX方向の傾斜量、Y方向の傾斜量が演算/処理手段36によって算出される。
【0038】
得られたX方向の傾斜量、及びY方向の傾斜量を基に傾斜補正が行われる。先ず最初にXY/傾斜テーブル12の0度の位置で、X方向傾斜つまみが回転され、X方向の傾斜量が調整される。このとき表示手段40のバーグラフ表示を見ながら傾斜量調整が行われる。
【0039】
続いてXY/傾斜テーブル12が90度の位置に回転され、同様にしてY方向傾斜つまみが回転されて、Y方向の傾斜量が調整される。以下偏心補正の手順同様、調整後のデータが予想され、予想されたデータに基いて測定倍率が決定されて調整がもう一度繰り返される。この傾斜補正のフローは、基本的な流れは前述の偏心補正の流れと同じであるので、細部の説明は省略する。
【0040】
また、被測定物の端面が被測定物の軸心と直角の場合は端面1回転分の高さを測定して傾斜量を求めてもよい。
【0041】
尚、通常は偏心補正と傾斜補正との両方行う場合が多く、その場合前述の偏心補正のフローと傾斜補正のフローとが夫々単独で行われてもよいが、両方のフローがミックスされた形で行われる方がよい。
【0042】
以上説明した本発明に係る真円度測定機10では、被測定物26を載置したXY/傾斜テーブル12がモータ20によって回転されるワーク回転型の構成で説明したが、XY/傾斜テーブル12が回転せずに検出器28が回転する検出器回転型の構成であってもよい。また、検出器28には電気マイクロメータを用いたが、これに限らず、接触式あるいは非接触式の種々の検出器が用いられてもよい。更に、軸受16としてエアーベアリングを用いたが、これに限らず磁気軸受等その他の高精度軸受が用いられてもよい。
【0043】
【発明の効果】
以上説明したように本発明の真円度測定機によれば、低倍率で被測定物を測定して表示された偏心量に基いて偏心調整した後、次の測定データを予測し、その結果から心出しに最適な測定倍率が決定されるので、測定倍率を徐々に上げて測定と調整を繰り返す必要がなく、被測定物の心出しを容易に短時間で行うことができる。
【0044】
また、低倍率で被測定物を測定して表示された傾斜量に基いて傾斜調整した後、次の測定データを予測し、その結果から傾斜補正に最適な測定倍率が決定されるので、測定倍率を徐々に上げて測定と調整を繰り返す必要がなく、被測定物の傾斜補正を容易に短時間で行うことができる。
【0045】
更に、補正量がバーグラフで表示されるので、偏心補正や傾斜補正の調整を容易に行うことができる。
【図面の簡単な説明】
【図1】本発明の実施の形態に係る真円度測定機の構成を表わすブロック図
【図2】偏心補正の流れを表わすフローチャート
【図3】被測定物が載置された状態を表わす平面図
【図4】被測定物1周分の測定データを示すグラフ
【図5】バーグラフを表わす表示画面
【図6】予想データを示すグラフ
【図7】偏心補正後の測定データを示すグラフ
【符号の説明】
10…真円度測定機、12…XY/傾斜テーブル(XYテーブル、傾斜テーブル)、14…本体、22…X方向微動つまみ、23…Y方向微動つまみ、24…Y方向傾斜つまみ、25…X方向傾斜つまみ、26…被測定物、28…検出器、36…演算/処理手段(演算手段、処理手段)、40…表示手段[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a roundness measuring machine, and more particularly to a roundness measuring machine having an automatic measurement magnification setting function when performing eccentricity correction and inclination correction of an object to be measured.
[0002]
[Prior art]
When measuring the roundness of a measured object with a roundness measuring machine, it is necessary to perform tilting and centering of the measured object with respect to the rotation axis of the roundness measuring machine. .
[0003]
In the centering, an eccentric amount is obtained by measuring one cross section of the object to be measured, and is adjusted so that the eccentric amount becomes zero. In tilting, two cross sections with different heights of the object to be measured are measured, and an inclination amount is obtained from an eccentric amount and a height difference of each cross section. Alternatively, when the end surface of the object to be measured is perpendicular to the axis of the object to be measured, the height of one rotation of the end surface is measured to obtain the inclination amount, and the inclination amount is adjusted to be zero.
[0004]
In this centering work, it is necessary to accurately move the XY table by 1/2 of the amount of displacement detected by the detector, and the tilting work needs to be accurately adjusted by dividing the inclination in the X direction and the Y direction. In both cases, the adjustment work takes time, and there is a problem that an expert is required for the adjustment work.
[0005]
In order to solve this problem, several methods for easily performing the adjustment work have been proposed (see, for example, Patent Document 1).
[0006]
[Patent Document 1]
Japanese Unexamined Patent Publication No. 4-329306
[Problems to be solved by the invention]
However, even in these proposed conventional methods, when the amount of eccentricity or the amount of inclination is large, measurement is first performed at a low measurement magnification, and adjustment is performed based on the measurement value. And it was necessary to repeat measurement and adjustment by gradually increasing the measurement magnification. In this case, if the measurement magnification is increased to a high magnification at the same time, the amount of displacement may protrude from the measurement range and cannot be measured.
[0008]
For this reason, the same operation has to be repeated many times while changing the measurement magnification, which is troublesome, and the problem that the adjustment work takes time remains.
[0009]
The present invention has been made in view of such circumstances, and it is not necessary to repeat the same operation over and over while changing the measurement magnification when performing centering or tilt correction of the object to be measured. An object of the present invention is to provide a roundness measuring machine that can easily perform centering and inclination correction in a short time.
[0010]
[Means for Solving the Problems]
In order to achieve the above-mentioned object, the invention according to claim 1 is a roundness measuring machine for measuring the roundness of a measured object by rotating the measured object relative to a detector. An XY table having an X direction fine movement knob and a Y direction fine movement knob, and a center of rotation of the roundness measuring machine when the side surface of the measurement object is measured by the detector for one round by the detector. Calculating means for calculating the amount of eccentricity between the X direction and the center of the measurement object in the X direction and the Y direction, display means for displaying the calculated amount of eccentricity in the X direction and Y direction, and the displayed X direction and Y When the X-direction fine adjustment knob and the Y-direction fine adjustment knob are operated based on the amount of eccentricity in the direction, and the amount of eccentricity in the X direction and Y direction is adjusted, the measurement data for one side of the side of the measured object after adjustment And processing means for predicting, the predicted measurement Optimum measurement magnification eccentricity correction of the workpiece from over data is being determined by said processing means.
[0011]
According to the first aspect of the present invention, after measuring the object to be measured at a low magnification and adjusting the eccentricity based on the displayed eccentricity, the next measurement data is predicted, and from the result, the optimum measurement magnification for centering Therefore, it is not necessary to repeat measurement and adjustment by gradually increasing the measurement magnification, and the object to be measured can be easily centered in a short time.
[0012]
According to a second aspect of the present invention, the object to be measured is placed in a roundness measuring machine that rotates the object to be measured relative to the detector and measures the roundness of the object to be measured. A tilt table having an X-direction tilt adjustment knob and a Y-direction tilt adjustment knob, and when the side surface of the object to be measured is measured at one height at least at two different positions by the detector, or at a low magnification. When the end face of the object to be measured is measured for one rotation, an arithmetic means for calculating the amount of inclination of the object to be measured with respect to the rotation axis of the roundness measuring device in the X direction and the Y direction, and the calculated X direction and Display means for displaying the amount of inclination in the Y direction, and the X direction inclination adjustment knob and the Y direction inclination adjustment knob are operated based on the displayed X direction and Y direction inclination amounts, and the X direction and Y direction After adjustment when the tilt amount is adjusted Processing means for predicting measurement data for one rotation at each of at least two different heights of the side surface of the object to be measured or measurement data for one rotation of the end surface of the object to be measured. It is characterized in that the processing means determines the optimum measurement magnification for correcting the inclination of the object to be measured from the data.
[0013]
According to the second aspect of the present invention, after measuring the object to be measured at a low magnification and adjusting the inclination based on the displayed inclination amount, the next measurement data is predicted, and from the result, the optimum measurement magnification for the inclination correction. Therefore, it is not necessary to repeat measurement and adjustment by gradually increasing the measurement magnification, and the tilt correction of the object to be measured can be easily performed in a short time.
[0014]
The invention described in claim 3 is characterized in that, in the invention of claim 1 or 2, the display displayed by the display means is a bar graph.
[0015]
According to the invention of claim 3, since the correction amount is displayed in a bar graph, it is sufficient to turn the knob until the bar is reduced to the zero position, and the eccentricity correction and the inclination correction can be easily adjusted.
[0016]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, preferred embodiments of a roundness measuring machine according to the present invention will be described in detail with reference to the accompanying drawings. In addition, in each figure, the same number or code | symbol is attached | subjected about the same member.
[0017]
FIG. 1 is a block diagram showing the configuration of a roundness measuring machine according to the present invention. As shown in FIG. 1, in the roundness measuring machine 10, an XY / tilting table 12 on which a measurement object 26 is placed is provided on a main body 14. The XY / tilt table 12 is finely fed in the X direction and Y direction by the X direction fine adjustment knob 22 and the Y direction fine adjustment knob 23, and is adjusted in inclination in the X direction and Y direction by the X direction inclination knob 25 and the Y direction inclination knob 24. Is supposed to be done.
[0018]
The XY / tilting table 12 is rotatably supported by a motor 20 via a bearing 16. An encoder 18 is attached to the rotation shaft of the motor 20, and the rotation angle is read with high accuracy.
[0019]
Further, the roundness measuring machine 10 has a detector 28 that measures the device under test 26 with the tip 30 coming into contact with the device under test 26. The detection signal is sent from the amplifier 32 and the A / D converter 34. Then, it is input to the arithmetic / processing means 36 and the processing result is displayed on the display means 40. The operation of the roundness measuring device 10 is controlled by a program 38.
[0020]
An ultra-high precision hydrostatic air bearing is used as the bearing 16, and the XY / tilting table 12 is rotated with a rotational accuracy of 0.005 μm. Further, an electric micrometer using a differential transformer is used as the detector 28 to detect the amount of displacement of the tip terminal 30 that contacts the device under test 26.
[0021]
When measuring the roundness or the like of the measurement object 26 with the roundness measuring device 10, after the measurement object 26 is placed on the XY / tilting table 12, the rotation center of the XY / tilting table 12 is first set. And the center of the measurement object 26 are corrected, and the inclination correction of the measurement object 26 with respect to the rotation axis of the XY / tilting table 12 is performed.
[0022]
Next, the XY / tilting table 12 is rotated once by the motor 20 with the tip terminal 30 of the detector 28 in contact with the side surface of the object to be measured 26, and data for one round of the side surface of the object to be measured 26 is collected. . The detection signal obtained as an analog voltage value is amplified by the amplifier 32, converted into a digital signal by the A / D converter 34, and input to the calculation / processing means 36. The calculation / processing means 36 calculates the roundness of the device under test 26 from the rotation angle data input from the encoder 18 and the displacement data detected by the detector 28 and displays it on the display means 40.
[0023]
Next, the above-described eccentricity correction procedure will be described with reference to the flowchart of FIG. First, the object to be measured 26 is placed on the XY / tilting table 12. This state is shown in FIG. Since the device under test 26 is simply placed on the XY / tilting table 12, the center 26A of the device under test 26 is X in the figure relative to the rotation center 12A of the XY / tilting table 12, as shown in FIG. The eccentricity R is shifted in the direction of the angle θ from the axis (step S1).
[0024]
In this state, the front terminal 30 of the detector 28 is brought into contact with the side surface of the measurement object 26, and the measurement object 26 is measured for one round at a low magnification while the XY / tilting table 12 is rotated. The relationship between the rotation angle at this time and the output of the detector 28 is shown in FIG. In this case, since the DUT 26 has an eccentricity R with respect to the rotation center 12A of the XY / tilting table 12, a graph showing the relationship between the rotation angle and the output of the detector 28 is shown in FIG. Is a sine curve (step S3).
[0025]
The amount of eccentricity R in the X direction is ΔX, the Y direction eccentricity is ΔY, the rotation angle of XY / tilting table 12 is θn, and the detector output at that time is DTn. From the output of the device, the amount of eccentricity in the X and Y directions is calculated by the calculation / processing means 36 according to the following equations (1) and (2):
[0026]
[Expression 1]
Figure 0003738844
[0027]
[Expression 2]
Figure 0003738844
(Step S5).
[0028]
In this state, the XY / tilting table 12 is returned to the 0 degree position, and the X direction fine movement knob 22 is adjusted so that “X direction target detector output = detector output at 0 degree during one round measurement−ΔX”. Rotate to adjust the amount of eccentricity in the X direction. Specifically, since the eccentric amount in the X direction and the Y direction is displayed as a bar graph as shown in FIG. 5 by the display means 40, the X direction fine adjustment knob 22 is rotated until the bar of the bar graph reaches the 0 position. (Step S7).
[0029]
Next, the XY / tilting table 12 is rotated to a position of 90 degrees, and the Y-direction fine movement knob 23 is adjusted so that “Y-direction target detector output = detector output at 90 degrees during one round measurement−ΔY”. Rotate to adjust the Y direction eccentricity. At this time, since the amount of eccentricity in the Y direction is displayed as a bar graph, the Y direction fine adjustment knob 23 may be rotated until the bar of the bar graph reaches the 0 position (step S9).
[0030]
Here, it is confirmed whether or not the eccentric correction that has just been made is the first correction (step S11). If it is the first correction, the measurement data for one round after the eccentricity correction adjustment is predicted by the calculation / processing means 36. Is done.
[0031]
The prediction of the measurement data for one round is performed as follows. That is, if the adjusted X-direction eccentricity amount is x and the Y-direction eccentricity amount is y, “x = detector output at 0 degrees after adjustment−X-direction target detector output”, “y = 90 after adjustment. Therefore, the adjusted eccentricity is “E = √ (x 2 + y 2 )”, and the eccentric direction at that time is “A = tan −1. (y / x) ", and the predicted data for one round after the eccentricity adjustment is given by the following equation (3)
[0032]
[Equation 3]
Figure 0003738844
(Step S13). FIG. 6 shows a graph of predicted data for one round.
[0033]
Next, the maximum measurement magnification at which the Max value and the Min value of the predicted detector data do not exceed the measurement range is automatically determined by the calculation / processing means 36 (step S15). Next, it is determined whether or not the determined measurement magnification is the maximum magnification of the roundness measuring device 10, or whether or not the automatically determined measurement magnification remains unchanged from the currently set magnification (step S17). ).
[0034]
If the automatically determined measurement magnification is the maximum magnification, or if the currently set magnification remains unchanged, this eccentricity correction procedure ends here. On the other hand, when the automatically determined measurement magnification is not the maximum magnification or higher than the currently set magnification, the measurement magnification is changed to the determined measurement magnification, and the measurement for one round of the object to be measured is performed again (step). S19).
[0035]
After step S19, the process returns to step S5, and steps S7 and S9 are repeated to perform eccentricity correction. Next, in step S11, it is determined that the correction is not the first time, and since the final correction has been completed, the eccentricity correction procedure ends.
[0036]
FIG. 7 is a graph showing the detector output data when the roundness of the device under test 26 is measured after the eccentricity correction is performed as described above. As shown in FIG. 7, the detector output data is appropriately corrected for eccentricity, and no shake due to eccentricity is observed.
[0037]
In the inclination correction of the object to be measured 26 with respect to the rotation axis of the XY / tilting table 12, data for one round is collected at a low magnification measurement magnification at two different height positions of the object to be measured 26. The amount of eccentricity in the X direction and the amount of eccentricity in the Y direction are calculated. From the calculated X-direction eccentricity amount, Y-direction eccentricity amount at the two heights, and the difference between the two height positions, the X-direction inclination amount and the Y-direction inclination amount of the measurement object 26 are calculated / Calculated by the processing means 36.
[0038]
The tilt correction is performed based on the obtained tilt amount in the X direction and the tilt amount in the Y direction. First, the X-direction tilt knob is rotated at the 0 degree position of the XY / tilt table 12 to adjust the tilt amount in the X direction. At this time, the tilt amount is adjusted while viewing the bar graph display of the display means 40.
[0039]
Subsequently, the XY / tilt table 12 is rotated to a position of 90 degrees, and the Y-direction tilt knob is similarly rotated to adjust the amount of tilt in the Y direction. Thereafter, similarly to the procedure of eccentricity correction, the adjusted data is predicted, the measurement magnification is determined based on the predicted data, and the adjustment is repeated once more. The basic flow of this inclination correction flow is the same as the above-described eccentricity correction flow, and thus detailed description thereof is omitted.
[0040]
Further, when the end surface of the object to be measured is perpendicular to the axis of the object to be measured, the amount of inclination may be obtained by measuring the height of one end surface rotation.
[0041]
Normally, both the eccentricity correction and the inclination correction are often performed. In this case, the above-described eccentricity correction flow and the inclination correction flow may be performed independently. However, both flows are mixed. It is better to be done at.
[0042]
In the roundness measuring device 10 according to the present invention described above, the XY / tilting table 12 on which the object to be measured 26 is placed has been described as a work rotation type configuration rotated by the motor 20. It may be a detector rotation type configuration in which the detector 28 rotates without rotating. Moreover, although the electric micrometer was used for the detector 28, not only this but various detectors of a contact type or a non-contact type may be used. Furthermore, although an air bearing is used as the bearing 16, the present invention is not limited to this, and other high-precision bearings such as a magnetic bearing may be used.
[0043]
【The invention's effect】
As described above, according to the roundness measuring machine of the present invention, after measuring the measured object at a low magnification and adjusting the eccentricity based on the displayed eccentricity, the next measurement data is predicted, and the result Therefore, it is not necessary to repeat the measurement and adjustment by gradually increasing the measurement magnification, and the object to be measured can be easily centered in a short time.
[0044]
In addition, after measuring the measured object at a low magnification and adjusting the tilt based on the displayed tilt amount, the next measurement data is predicted, and the optimal measurement magnification for tilt correction is determined from the result, so the measurement There is no need to repeat the measurement and adjustment by gradually increasing the magnification, and the inclination of the object to be measured can be easily corrected in a short time.
[0045]
Furthermore, since the correction amount is displayed as a bar graph, the eccentricity correction and the inclination correction can be easily adjusted.
[Brief description of the drawings]
FIG. 1 is a block diagram showing a configuration of a roundness measuring machine according to an embodiment of the present invention. FIG. 2 is a flowchart showing a flow of eccentricity correction. FIG. 3 is a plane showing a state where an object to be measured is placed. [Fig. 4] Graph showing measurement data for one round of the object to be measured [Fig. 5] Display screen showing bar graph [Fig. 6] Graph showing expected data [Fig. 7] Graph showing measurement data after eccentricity correction [Fig. Explanation of symbols]
DESCRIPTION OF SYMBOLS 10 ... Roundness measuring machine, 12 ... XY / inclination table (XY table, inclination table), 14 ... Main body, 22 ... X direction fine adjustment knob, 23 ... Y direction fine adjustment knob, 24 ... Y direction inclination knob, 25 ... X Direction tilting knob, 26 ... object to be measured, 28 ... detector, 36 ... calculation / processing means (calculation means, processing means), 40 ... display means

Claims (3)

被測定物を検出器に対して相対的に回転させ、被測定物の真円度を測定する真円度測定機において、
被測定物を載置すると共に、X方向微動つまみ及びY方向微動つまみを有するXYテーブルと、
前記検出器によって被測定物の側面が1周分計測された時に、前記真円度測定機の回転中心と被測定物の中心とのX方向及びY方向の偏心量を算出する演算手段と、
前記算出されたX方向及びY方向の偏心量を表示する表示手段と、
前記表示されたX方向及びY方向の偏心量に基いて前記X方向微動つまみ及びY方向微動つまみが操作され、前記X方向及びY方向の偏心量が調整された時に、調整後の被測定物の側面1周分の計測データを予測する処理手段と、を有し、
前記予測された計測データから被測定物の偏心補正に最適な測定倍率が前記処理手段によって決定されることを特徴とする真円度測定機。
In a roundness measuring machine that rotates the measured object relative to the detector and measures the roundness of the measured object,
An XY table for placing an object to be measured and having an X-direction fine movement knob and a Y-direction fine movement knob;
An arithmetic means for calculating the amount of eccentricity in the X direction and the Y direction between the rotation center of the roundness measuring machine and the center of the object to be measured when the side surface of the object to be measured is measured by the detector for one round;
Display means for displaying the calculated amount of eccentricity in the X and Y directions;
When the X-direction fine movement knob and the Y-direction fine movement knob are operated based on the displayed X-direction and Y-direction eccentricity amounts, and the eccentricity amounts in the X-direction and Y-direction are adjusted, the measured object after adjustment And a processing means for predicting measurement data for one side of the side surface,
The roundness measuring machine, wherein the processing means determines a measurement magnification optimum for correcting the eccentricity of the object to be measured from the predicted measurement data.
被測定物を検出器に対して相対的に回転させ、被測定物の真円度を測定する真円度測定機において、
被測定物を載置すると共に、X方向傾斜調整つまみ及びY方向傾斜調整つまみを有する傾斜テーブルと、
前記検出器によって被測定物の側面が少なくとも異なる2箇所の高さで夫々1周分計測された時に、あるいは低倍率で被測定物の端面が1回転分計測された時に、前記真円度測定機の回転軸に対する被測定物のX方向及びY方向の傾斜量を算出する演算手段と、
前記算出されたX方向及びY方向の傾斜量を表示する表示手段と、
前記表示されたX方向及びY方向の傾斜量に基いて前記X方向傾斜調整つまみ及びY方向傾斜調整つまみが操作され、前記X方向及びY方向の傾斜量が調整された時に、調整後の被測定物の側面の少なくとも異なる2箇所の高さにおける夫々1周分の計測データ、あるいは被測定物の端面1回転分の計測データを予測する処理手段と、を有し、
前記予測された計測データから被測定物の傾斜補正に最適な測定倍率が前記処理手段によって決定されることを特徴とする真円度測定機。
In a roundness measuring machine that rotates the measured object relative to the detector and measures the roundness of the measured object,
An inclination table for placing the object to be measured and having an X direction inclination adjustment knob and a Y direction inclination adjustment knob,
The roundness is measured when the detector measures at least two different heights of the side surface of the object to be measured, or when the end surface of the object to be measured is measured by one rotation at a low magnification. Computing means for calculating the amount of inclination of the object to be measured with respect to the rotation axis of the machine in the X direction and the Y direction;
Display means for displaying the calculated amount of inclination in the X and Y directions;
When the X-direction tilt adjustment knob and the Y-direction tilt adjustment knob are operated based on the displayed X-direction and Y-direction tilt amounts to adjust the X-direction and Y-direction tilt amounts, Processing means for predicting measurement data for one rotation at each of at least two different heights of the side surface of the measurement object, or measurement data for one rotation of the end face of the measurement object,
The roundness measuring machine, wherein the processing means determines a measurement magnification optimum for the inclination correction of the object to be measured from the predicted measurement data.
前記表示手段で表示される表示がバーグラフであることを特徴とする、請求項1又は請求項2に記載の真円度測定機。The roundness measuring machine according to claim 1 or 2, wherein the display displayed by the display means is a bar graph.
JP2002258742A 2002-09-04 2002-09-04 Roundness measuring machine Expired - Fee Related JP3738844B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2002258742A JP3738844B2 (en) 2002-09-04 2002-09-04 Roundness measuring machine
GB0320565A GB2393790B (en) 2002-09-04 2003-09-02 Roundness measurement apparatus
DE10340851.7A DE10340851B4 (en) 2002-09-04 2003-09-04 Roundness measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002258742A JP3738844B2 (en) 2002-09-04 2002-09-04 Roundness measuring machine

Publications (2)

Publication Number Publication Date
JP2004093529A JP2004093529A (en) 2004-03-25
JP3738844B2 true JP3738844B2 (en) 2006-01-25

Family

ID=28786861

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002258742A Expired - Fee Related JP3738844B2 (en) 2002-09-04 2002-09-04 Roundness measuring machine

Country Status (3)

Country Link
JP (1) JP3738844B2 (en)
DE (1) DE10340851B4 (en)
GB (1) GB2393790B (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090259435A1 (en) * 2005-12-05 2009-10-15 Masato Enomoto Roundness Measuring Instrument and Method of Determining Quality of Tip Head
JP2008292199A (en) 2007-05-22 2008-12-04 Mitsutoyo Corp Device, method, and program for measuring roundness
JP5292564B2 (en) * 2009-05-18 2013-09-18 株式会社ミツトヨ Shape measuring apparatus, calibration method thereof, and calibration program
US9347761B2 (en) 2013-06-06 2016-05-24 Cedarflat Precision Inc. Two-way roundness device
DE102016110453A1 (en) 2016-06-07 2017-12-07 Carl Mahr Holding Gmbh Measuring device and method for adjusting the position of a rotationally symmetrical workpiece
CN109238212B (en) * 2018-07-13 2020-04-21 进峰(江门)五金制造有限公司 Automatic end cover coaxiality detector
JP7674300B2 (en) * 2022-03-31 2025-05-09 日本特殊陶業株式会社 Coating device, film forming method, and method for manufacturing solid oxide electrochemical cell

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB861323A (en) * 1956-06-12 1961-02-15 Rank Precision Ind Ltd Improvements in and relating to electronic gauging systems
DE2654025C2 (en) * 1976-11-27 1986-05-07 Dr.-Ing. Perthen Gmbh, 3000 Hannover Method and device for centering a workpiece on a roundness tester
DE3123489A1 (en) * 1981-06-13 1982-12-30 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut METHOD FOR MEASURING THE ROUNDNESS DIFFERENCES OF ROTATION BODIES AND DEVICES FOR IMPLEMENTING THE METHOD
EP0240150B1 (en) * 1986-03-04 1991-04-17 Rank Taylor Hobson Limited Workpiece position control
GB8605325D0 (en) * 1986-03-04 1986-04-09 Rank Taylor Hobson Ltd Workpiece position control
JPH04329306A (en) * 1991-05-02 1992-11-18 Tokyo Seimitsu Co Ltd Centering process for out-of-roundness measuring machine and its device
JPH0611337A (en) * 1992-06-25 1994-01-21 Tokyo Seimitsu Co Ltd Method and device for correcting inclination of out-of-roundness measuring machine
JPH0693902A (en) * 1992-09-10 1994-04-05 Toyota Motor Corp Inter-cylinder injection type spark ignition internal combustion engine
US6526364B2 (en) * 2000-01-19 2003-02-25 Mitutoyo Corporation Method and apparatus for measuring roundness

Also Published As

Publication number Publication date
GB0320565D0 (en) 2003-10-01
GB2393790B (en) 2007-04-11
DE10340851A1 (en) 2004-03-18
JP2004093529A (en) 2004-03-25
GB2393790A (en) 2004-04-07
DE10340851B4 (en) 2016-01-14

Similar Documents

Publication Publication Date Title
JP4968600B1 (en) Roundness measuring device and method of correcting misalignment
JP6031732B1 (en) Method for calculating amount of misalignment of surface shape measuring device and surface shape measuring device
US7197835B2 (en) Detector supporting mechanism
JP6664074B2 (en) Flatness measurement device
US8504316B2 (en) Form measuring instrument, and calibration method and calibration program therefor
JP6671011B2 (en) Roundness measuring device
JP2018036130A (en) Circularity measuring instrument
JP2008286535A (en) Apparatus, method and program for measuring roundness
JP3738844B2 (en) Roundness measuring machine
JP2017161252A (en) Surface shape measuring method and surface shape measuring apparatus
JP5652631B2 (en) Method of calculating the amount of misalignment in a roundness measuring device
JP2017161244A (en) Flatness measurement method
JP2001201340A (en) Circularity measuring device
JP5716427B2 (en) Roundness measuring device and method of correcting misalignment
JPH07280741A (en) Wafer misalignment correction method
JPH04329306A (en) Centering process for out-of-roundness measuring machine and its device
JPH0611337A (en) Method and device for correcting inclination of out-of-roundness measuring machine
JPH0666559A (en) Roundness measuring apparatus
JP7553816B2 (en) Shape measuring machine and alignment method therefor
JP2012145492A (en) Circularity measuring apparatus and misalignment quantity correction method of the same
JP7742016B2 (en) Shape measuring instrument and its calibration method
JPH05231864A (en) Roundness measuring machine
CN114171417B (en) Method and apparatus for detecting wafer position
JPH03249516A (en) Flatness measuring instrument
CN118023913B (en) Bearing adjusting method and device based on main shaft assembly tool

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20040525

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20050902

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20051012

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20051025

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091111

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20091111

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101111

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111111

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121111

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121111

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131111

Year of fee payment: 8

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees