JP3753989B2 - Method for manufacturing thick film circuit board using copper conductor paste - Google Patents
Method for manufacturing thick film circuit board using copper conductor paste Download PDFInfo
- Publication number
- JP3753989B2 JP3753989B2 JP2002036240A JP2002036240A JP3753989B2 JP 3753989 B2 JP3753989 B2 JP 3753989B2 JP 2002036240 A JP2002036240 A JP 2002036240A JP 2002036240 A JP2002036240 A JP 2002036240A JP 3753989 B2 JP3753989 B2 JP 3753989B2
- Authority
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- Prior art keywords
- copper
- conductor paste
- glass frit
- circuit board
- copper conductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title claims description 207
- 229910052802 copper Inorganic materials 0.000 title claims description 158
- 239000010949 copper Substances 0.000 title claims description 158
- 239000004020 conductor Substances 0.000 title claims description 65
- 238000004519 manufacturing process Methods 0.000 title claims description 24
- 238000000034 method Methods 0.000 title claims description 19
- 239000011521 glass Substances 0.000 claims description 70
- 239000000758 substrate Substances 0.000 claims description 51
- 239000002245 particle Substances 0.000 claims description 38
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical group [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 24
- 238000007747 plating Methods 0.000 claims description 24
- 239000000843 powder Substances 0.000 claims description 23
- 239000000919 ceramic Substances 0.000 claims description 20
- 238000010304 firing Methods 0.000 claims description 18
- 239000011347 resin Substances 0.000 claims description 17
- 229920005989 resin Polymers 0.000 claims description 17
- 239000011230 binding agent Substances 0.000 claims description 16
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 14
- 229910052759 nickel Inorganic materials 0.000 claims description 12
- 239000003960 organic solvent Substances 0.000 claims description 12
- 239000000203 mixture Substances 0.000 claims description 10
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 claims description 9
- 239000005751 Copper oxide Substances 0.000 claims description 9
- 229910000431 copper oxide Inorganic materials 0.000 claims description 9
- 238000007639 printing Methods 0.000 claims description 7
- 229910015902 Bi 2 O 3 Inorganic materials 0.000 claims description 5
- 238000007772 electroless plating Methods 0.000 claims description 5
- 238000001035 drying Methods 0.000 claims description 4
- 239000010410 layer Substances 0.000 description 42
- 230000000052 comparative effect Effects 0.000 description 12
- 238000007650 screen-printing Methods 0.000 description 5
- 239000002344 surface layer Substances 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 230000008961 swelling Effects 0.000 description 4
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- WUOACPNHFRMFPN-UHFFFAOYSA-N alpha-terpineol Chemical compound CC1=CCC(C(C)(C)O)CC1 WUOACPNHFRMFPN-UHFFFAOYSA-N 0.000 description 3
- SQIFACVGCPWBQZ-UHFFFAOYSA-N delta-terpineol Natural products CC(C)(O)C1CCC(=C)CC1 SQIFACVGCPWBQZ-UHFFFAOYSA-N 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 229940116411 terpineol Drugs 0.000 description 3
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 2
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 229920002678 cellulose Polymers 0.000 description 2
- 235000010980 cellulose Nutrition 0.000 description 2
- 239000003638 chemical reducing agent Substances 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 2
- SWXVUIWOUIDPGS-UHFFFAOYSA-N diacetone alcohol Chemical compound CC(=O)CC(C)(C)O SWXVUIWOUIDPGS-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- HJOVHMDZYOCNQW-UHFFFAOYSA-N isophorone Chemical compound CC1=CC(=O)CC(C)(C)C1 HJOVHMDZYOCNQW-UHFFFAOYSA-N 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 229910052763 palladium Inorganic materials 0.000 description 2
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- -1 polyoxymethylene Polymers 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- 238000005245 sintering Methods 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000005979 thermal decomposition reaction Methods 0.000 description 2
- CYSGHNMQYZDMIA-UHFFFAOYSA-N 1,3-Dimethyl-2-imidazolidinon Chemical compound CN1CCN(C)C1=O CYSGHNMQYZDMIA-UHFFFAOYSA-N 0.000 description 1
- FPZWZCWUIYYYBU-UHFFFAOYSA-N 2-(2-ethoxyethoxy)ethyl acetate Chemical compound CCOCCOCCOC(C)=O FPZWZCWUIYYYBU-UHFFFAOYSA-N 0.000 description 1
- KWSLGOVYXMQPPX-UHFFFAOYSA-N 5-[3-(trifluoromethyl)phenyl]-2h-tetrazole Chemical compound FC(F)(F)C1=CC=CC(C2=NNN=N2)=C1 KWSLGOVYXMQPPX-UHFFFAOYSA-N 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- JPVYNHNXODAKFH-UHFFFAOYSA-N Cu2+ Chemical compound [Cu+2] JPVYNHNXODAKFH-UHFFFAOYSA-N 0.000 description 1
- 239000001856 Ethyl cellulose Substances 0.000 description 1
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 239000000020 Nitrocellulose Substances 0.000 description 1
- 239000004677 Nylon Substances 0.000 description 1
- 229920000571 Nylon 11 Polymers 0.000 description 1
- 229920002292 Nylon 6 Polymers 0.000 description 1
- 229930040373 Paraformaldehyde Natural products 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 239000005062 Polybutadiene Substances 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 229920006397 acrylic thermoplastic Polymers 0.000 description 1
- 239000012190 activator Substances 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 1
- 229910002113 barium titanate Inorganic materials 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 239000001913 cellulose Substances 0.000 description 1
- 229920002301 cellulose acetate Polymers 0.000 description 1
- 150000001879 copper Chemical class 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 229910001431 copper ion Inorganic materials 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 239000007822 coupling agent Substances 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000003599 detergent Substances 0.000 description 1
- 235000014113 dietary fatty acids Nutrition 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 235000019325 ethyl cellulose Nutrition 0.000 description 1
- 229920001249 ethyl cellulose Polymers 0.000 description 1
- 229940116333 ethyl lactate Drugs 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000000194 fatty acid Substances 0.000 description 1
- 229930195729 fatty acid Natural products 0.000 description 1
- 150000004665 fatty acids Chemical class 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- RLSSMJSEOOYNOY-UHFFFAOYSA-N m-cresol Chemical compound CC1=CC=CC(O)=C1 RLSSMJSEOOYNOY-UHFFFAOYSA-N 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229940100630 metacresol Drugs 0.000 description 1
- 229920000609 methyl cellulose Polymers 0.000 description 1
- 239000001923 methylcellulose Substances 0.000 description 1
- 235000010981 methylcellulose Nutrition 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229920001220 nitrocellulos Polymers 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- URLKBWYHVLBVBO-UHFFFAOYSA-N p-dimethylbenzene Natural products CC1=CC=C(C)C=C1 URLKBWYHVLBVBO-UHFFFAOYSA-N 0.000 description 1
- 229920003254 poly(benzobisthiazole) Polymers 0.000 description 1
- 229920001490 poly(butyl methacrylate) polymer Polymers 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920002857 polybutadiene Polymers 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 229920001195 polyisoprene Polymers 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- 229920006324 polyoxymethylene Polymers 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
- 239000012266 salt solution Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910001379 sodium hypophosphite Inorganic materials 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- ISXSCDLOGDJUNJ-UHFFFAOYSA-N tert-butyl prop-2-enoate Chemical compound CC(C)(C)OC(=O)C=C ISXSCDLOGDJUNJ-UHFFFAOYSA-N 0.000 description 1
- RBNWAMSGVWEHFP-UHFFFAOYSA-N trans-p-Menthane-1,8-diol Chemical compound CC(C)(O)C1CCC(C)(O)CC1 RBNWAMSGVWEHFP-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
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- Parts Printed On Printed Circuit Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
Description
【0001】
【発明の属する技術分野】
本発明は銅導体ペーストを用いた厚膜回路基板の製造方法に係り、詳しくは焼成した銅膜の膨れがなく、基板と銅膜との密着力を高めた膜厚50μm以上の回路基板の製造方法に関する。
【0002】
【従来の技術】
今日、セラミックス基板上に回路を印刷するために、銅系ペーストが用いられている。この銅系ペーストを基板へ接着する場合には、例えば特開平8−298359号公報にも記載されているように、本来ミクロンサイズの銅粉がセラミックス基板と反応接着することができないために、ペースト内に所定量のガラスフリットを配合し、印刷後基板にあるガラスフリットが焼成後に基板と銅膜とを接着する役割を与えていた。しかし、その反面ガラスフリットが焼成後の銅膜内にも多量に残存するため、銅膜の電気抵抗値が高くなり、またガラス層で銅膜と基板とを接着しているため、熱膨張差による歪みが出やすくなって、熱衝撃性が弱くなると言った問題が発生した。
【0003】
このような不具合点を一部解消したペーストとして、例えば特開昭60−70746号公報に記載されているように、銅、ガラスフリット、そしてタングステン、モリブデン、レニウム等の非銅系物質を有機溶媒中に分散させた組成からなっており、また特公平3−50365号公報に記載されているように、銅酸化物を被覆した金属銅粒子、銅酸化物粒子、ガラス等のガラスフリットを有機溶媒中に分散させた組成からなっている。
【発明が解決しようとする課題】
【0004】
上記銅系ペーストもガラスフリットとして好ましくは4〜10重量%の多くの量を添加して基板と銅膜との接着の役割を果している。しかし、既存の銅系ペーストは600°C以上の焼成時におけるガラスの軟化を利用し、基板と銅膜の間にガラス層を形成し、接着させている。
【0005】
しかも、ガラスフリットを含む銅系ペーストを使用して厚さ50μm以上の厚膜の回路基板を作製する場合には、スクリーン印刷によって銅系ペーストを印刷、乾燥、焼成を繰り返して所定の厚膜を形成し、そして焼成して回路基板を作製していたが、ガラスフリットが耐薬品性に劣る鉛入りであるために、銅膜の表面にめっき層を設けることが不可能であり、しかも焼成時にガラスフリットや有機成分などが熱分解し、これによって発生するガスが銅膜を膨張させていた。
【0006】
本発明は、このような問題点を改善するものであり、銅膜の膨れがなく、基板と銅膜との密着力を高めた膜厚50μm以上の回路基板の製造方法を提供することを目的とする。
【0007】
【課題を解決するための手段】
即ち、本願請求項1記載の発明では、銅導体ペーストを基板上に印刷し、焼成することにより銅膜を形成する厚膜回路基板の製造方法において、セラミックス基板上にガラスフリットを含有する銅導体ペーストを印刷、乾燥した1層目の層を形成し、続いてその上にガラスフリットを含有しない銅導体ペーストを印刷、乾燥した層を少なくとも1層形成した後、焼成して厚膜の銅膜を形成する厚膜回路基板の製造方法において、セラミックス基板上に特定量のガラスフリットを含有する銅導体ペーストを印刷、乾燥した1層目の層を形成し、続いてその上にガラスフリットを含有しない銅導体ペーストを印刷、乾燥した層を少なくとも1層形成した後、焼成して厚膜の銅膜を形成する銅導体ペーストを用いた厚膜回路基板の製造方法にあり、銅導体ペーストを印刷するごとに充分乾燥した後、焼成するために、セラミックス基板と銅膜との界面ではガラスフリットが存在して充分密着するとともに表層はガラスフリットを含まないために、膨れのない厚膜の銅膜が得られる。
【0008】
本願請求項2記載の発明では、ガラスフリットを銅微粉と銅粉との総量に対して2〜4質量%含有する銅導体ペーストを用いた厚膜回路基板の製造方法にあり、セラミックス基板と銅膜との界面では適量のガラスフリットが存在して充分密着するとともに表層はガラスフリットを含まないために、膨れのない厚膜の銅膜が得られる。
【0009】
本願請求項3記載の発明では、請求項1又は2記載で作製した銅膜を形成したセラミックス基板を無電解めっき処理し、該銅膜の上にめっき層を付着した銅導体ペーストを用いた厚膜回路基板の製造方法にあり、表層はガラスフリットを含まないために、めっき層の密着力も維持できる。
【0010】
本願の請求項4記載の発明では、無電解めっき層がニッケルめっき層である銅導体ペーストを用いた厚膜回路基板の製造方法である。
【0011】
本願の請求項5記載の発明では、ガラスフリットを含有する銅導体ペーストが、一次平均粒子径0.01〜0.3μmの銅、銅酸化物、もしくはこれらの混合物からなる銅微粉、一次平均粒子径0.5〜5μmの銅粉、バインダー樹脂、軟化点500〜600℃をもつ少なくともSiO2−B2 O3 −ZnO系とSiO2−B2 O3 −Bi2O3系の2種以上のガラス成分を含むガラスフリット、そして有機溶剤を配合したものである銅導体ペーストを用いた厚膜回路基板の製造方法にある。
【0012】
本願の請求項6記載の発明では、ガラスフリットを含有しない銅導体ペーストが、一次平均粒子径0.01〜0.3μmの銅、銅酸化物、もしくはこれらの混合物からなる銅微粉、一次平均粒子径0.5〜5μmの銅粉、バインダー樹脂、そして有機溶剤を配合したものである銅導体ペーストを用いた厚膜回路基板の製造方法にある。
【0013】
本願の請求項7記載の発明では、ガラスフリットを含有しない銅導体ペーストの層が2〜4層である銅導体ペーストを用いた厚膜回路基板の製造方法にある。
【0014】
【発明の実施の形態】
本発明において1層目の銅導体ペーストは、ガラスフリットを含有する銅導体ペーストであり、具体的には一次平均粒子径0.01〜0.3μmの銅、銅酸化物、もしくはこれらの混合物からなる銅微粉、一次平均粒子径0.5〜5μmの銅粉、バインダー樹脂、軟化点500〜600℃をもつ少なくともSiO2−B2O3 −ZnO系とSiO2−B2 O3 −Bi2O3系の2種以上のガラス成分を含むガラスフリット、そして有機溶剤を配合したものである。
【0015】
また、2層目以降の銅導体ペーストは、ガラスフリットを含有しない銅導体ペーストであり、一次平均粒子径0.01〜0.3μmの銅、銅酸化物、もしくはこれらの混合物からなる銅微粉、一次平均粒子径0.5〜5μmの銅粉、バインダー樹脂、そして有機溶剤を配合したものである。
【0016】
銅導体ペーストを構成する銅、銅酸化物、もしくはこれらの混合物からなる銅微粉は、例えば沈殿法と呼ばれる方法、即ち金属塩溶液から還元剤を用いて直接金属微粒子を沈殿析出させる方法によって得られるものであり、ホルマリン、ヒドラジン、次亜リン酸ソーダ、水素化ホウ素塩などの還元剤を、銅イオンを含む水溶液に適当な条件のもとで添加することにより、銅微粉を得ることができる。上記銅微粉は耐酸化性、分散性等の改善のため、有機脂肪酸やカップリング剤により表面処理が行われる。
【0017】
上記銅微粉の一次平均粒子径は0.01〜0.3μmの範囲である。好ましくは、0.01〜0.2μmの範囲にあり、この範囲であれば銅微粉の凝集がなくなって緻密な銅膜が形成され、その電気抵抗値も小さくなる。
【0018】
また、銅導体ペーストを構成する銅粉は、一次平均粒子径0.5〜5μmの範囲にある銅粉をベースにしたもので、この範囲内にある粉径の異なる銅粉を1〜3種類以上添加したものである。具体的な銅粉は、一次平均粒子径2〜5μmの範囲にある最も粒子径が大きいベース銅粉と、一次平均粒子径1〜2μmの範囲で次に粒子径が大きい第1補助銅粉と、そして一次平均粒子径0.5〜1μmの範囲で最も粒子径が小さい第2補助銅粉の三段階の粒子径範囲から構成されている場合や、一次平均粒子径0.5〜1μmの範囲にあるベース銅粉と、一次平均粒子径0.1〜0.5μmの範囲にある補助銅粉の二段階の粒子径範囲から構成されている。
【0019】
上記銅粉を三段階の粒子径範囲から構成した場合では、銅粉中、ベース銅粉が80〜98重量%に対して第1補助銅粉が1〜19重量%、第2補助銅粉が1〜19重量%になっている。特に、補助銅粉については、これに限定されることなく、これらの一次平均粒子径範囲以下の第3補助銅粉を使用してもよい。
【0020】
上記補助銅粉の各銅粉は、比較的球形に近いものが望ましい。これは各銅粉が空隙を少なくして配列するためである。一次平均粒子径の異った銅粉を使用すると、一次平均粒子径の小さな補助銅粉が一次平均粒子径の最も大きなベース銅粉が配列したときに生じる隙間や空隙を充填するため、焼成後の膜は内部欠陥が少なく、焼き締まりも良好になる効果がある。
【0021】
ベース銅粉の一次平均粒子径が5μmを超えると、酸化の影響を受けにくく焼成条件設定が広くなるが、低い温度では充分に焼結せず焼き締まり不足が生じて銅膜と基板との密着力が低下する。また、インクロール工程で銅粉がつぶれてしまって銅箔状となり、スクリーン印刷時にメッシュずまりが発生することがある。一方、ベース銅粉の一次平均粒子径が0.5μm未満では、銅粉の総粒子面積が大きくなり過ぎて、酸化の影響が大きくなり、電気抵抗値が高くなる。また、カサ密度が大きいため焼き締まり性が悪くなる。
【0022】
ベース銅粉の添加量が98重量%を超えると、低い温度では充分に焼結せずに焼き締まり不足が生じて銅膜と基板との接着力が低下し、一方80重量%未満では混合銅粉の総粒子面積が大きくなり過ぎることになり、前述と同様の不具合が起こる。
尚、補助銅粉はベース銅粉が配列したときに生じる間隙や空隙を充填するために添加するものであり、その一次平均粒子径と添加量はベース銅粉のそれらに大きく影響を受ける。
【0023】
銅導体ペーストを構成するバインダー樹脂は、例えばポリブチルメタクリレート、ポリメチルメタクリレート等のアクリル類、ニトロセルロース、エチルセルロース、酢酸セルロース、ブチルセルロース、メチルセルロース等のセルロース類、ポリオキシメチレン等のポリエーテル類、ポリブタジエン、ポリイソプレン等のポリビニル類、ナイロン6、ナイロン6.6、ナイロン11等のポリアミドであり、特に制限されないが、焼成中で分解する必要がある。
【0024】
このバインダー樹脂としては、熱分解温度の相違する樹脂を少なくとも2種類以上含めることが好ましい。これは焼成した場合でもバインダー樹脂が一度に熱分解せず環境温度に応じて分解するため、銅膜中に残存することがない。
【0025】
上記バインダー樹脂を溶かす有機溶剤としては、カルビトール、カルビトールアセテート、テレピネオール(ターピノール)、メタクレゾール、ジメチルイミダゾリジノン、ジメチルホルムアミド、ターピノール、ジアセトンアルコール、トリエチレングリコール、パラキシレン、乳酸エチル、イソホロン等の高沸点の有機溶剤であり、2種類以上混合してもよい。
【0026】
本発明で使用するガラスフリットは、銅、銅酸化物、もしくはこれらの混合物からなる銅微粉や銅粉の焼結温度より低く、かつバインダー樹脂の熱分解温度より高い軟化点を有するものが使用される。とりわけ、銅導体ペーストの焼成過程において軟化したガラスフリットを基板方向へ流動させるのと同時に銅微粉や銅粉も基板方向へ移動させ、焼成後の膜の平滑化を図り、銅膜への半田付け性を改良して基板と銅膜間の密着力を向上させ、しかもその電気抵抗値の上昇を抑えるうえで重要になる。
【0027】
このガラスフリットは、少なくともSiO2−B2 O3 −ZnO系とSiO2−B2 O3 −Bi2O3系を含むもので、一次平均粒子径1〜10μmの範囲で500〜600℃の低軟化点を有している。具体的には、SiO2−B2 O3 −ZnO系とSiO2−B2 O3 −Bi2 O3 系にSiO2−B2 O3 −TiO2系やSiO2−B2 O3 −ZrO系等が添加される。
【0028】
ガラスフリットの軟化点はバインダー樹脂のポリマー分が分解する温度以上で、かつ銅微粉の焼結する温度以下が必要で、この温度差間で2種類以上添加すると効果がある。これはポリマー分の分解が起こって、軟化点の小さいSiO2−B2 O3 −Bi2O3系のガラス粉末が軟化し、続いて軟化点の大きいSiO2−B2 O3 −ZnO系が軟化して銅微粉の粒径を小さく保つことができる。
【0029】
その添加量は銅微粉と銅粉との総量に対して0.5〜4質量%である。4質量%を超えると、ガラスフリットが焼成後の銅膜内に残存するため、銅膜の電気抵抗値が上昇する傾向があり、また銅膜と基板との界面にガラス層を形成し、熱膨張による歪みをおこしやすく、熱衝撃性が弱くなる。一方、0.5質量%未満では、銅膜のひび割れや焼き締めの改善が期待できない。
【0030】
そして、上記銅導体ペーストは、バインダー樹脂と有機溶剤からなる有機分が2〜16質量%の範囲にして粘度調節されている。有機分が2質量%未満の場合には、銅導体ペーストの粘度が高くなり、また有機分が14質量%を超えると、粘度が低くなり印刷性に劣る。
【0031】
また、含有している全ての銅微粉と銅粉が84〜98質量%の範囲にある。98質量%を超えると、ペーストが高粘度となり焼き締まり不足が生じて銅膜と基板との接着力が低下し、一方84質量%未満ではペーストが焼成により収縮するために、前述と同様の不具合が起こる。
【0032】
本発明で使用するセラミックス基板は、アルミナ、窒化アルミ、炭化珪素、窒化珪素、サイアロン、チタン酸バリウム、PBZT等である。
【0033】
しかして、本発明に係る厚膜回路基板の製造方法を、図1を参照しながら以下に示す。
(1)ガラスフリットを含有する銅導体ペーストをスクリーン印刷等によってセラミックス基板1上に塗布する。スクリーン印刷の手順は水平に置かれたスクリーン(例えば、ステンレス平織物、300メッシュ)の下に、0.1〜2ミリメートルの間隔をもたせて基板を設置する。このスクリーンの上に銅導体ペーストをのせた後、スキージーを用いてスクリーン全面に広げる。この時には、スクリーンとセラミックス基板とは間隔を有している。続いて、スクリーンがセラミックス基板に接触する程度にスキージーでスクリーンを押さえ付けて移動させ、印刷をする。以後これを繰り返す。
【0034】
(2)上記基板1をオーブンにて150〜220℃で15〜30分間十分に乾燥して1層目の膜2を形成する。
【0035】
(3)続いて1層目の膜2の上にガラスフリットを含有しない銅導体ペーストを上記と同様にスクリーン印刷によって塗付する。
【0036】
(4)同様に上記基板1をオーブンにて150〜220℃で15〜30分間十分に乾燥して2層目の膜3を形成する。
(5)上記(3)、(4)を繰り返して、3層目の膜3a、4層目の膜3bを形成して所定の厚みに仕上げる。
(6)続いて、上記基板1をベルト炉に入れ、窒素中、600〜1000℃の温度下で焼成時間20〜60分、ピーク保持時間4〜12分間で焼成し、そして冷却時間9〜27分で焼成工程を終え、銅粉を焼結させるとともに基板と反応接着させ所定厚みの銅膜4を作製する。この焼成工程時には、所定量の酸素がこの炉に送り込まれ、銅膜と基板との密着力を高めて銅膜の電気抵抗値を減少させる。
(7)そして、このセラミックス基板1を無電解金属めっき液に浸漬すると、セラミックス基板1の表面の銅が分散・結合されている領域においてめっき層5が形成される。このとき、銅はほぼ均一に分散していることから、めっき層5の析出にばらつきが生じにくくなり、膜厚の均一なめっき層5を形成することができる。しかも上記のように銅はセラミックス基板1上に接合されているため、セラミックス基板1に粗化処理が施されていなくても銅による反応接着によって、めっき層5とセラミックス基板1との間に高い密着性が付与される。
【0037】
上記無電解めっき処理として無電解銅めっき処理や無電解ニッケルめっき処理等を施すことができる。
【0038】
【実施例】
次に、本発明を具体的な実施例により更に詳細に説明する。
実施例1〜3、比較例1〜8
(銅導体ペーストの作製)
所定粒径をもった銅微粉、銅粉、そして所定量のガラスフリット、バインダー樹脂、そして有機溶剤を表1に示すように混合した。銅粉としてベース銅粉と2種類の補助銅粉からなる3種を使用した。また、アクリル樹脂をカルビトールとテレピネオールとで溶かしたものを用意した。上記これらを混合し、更にインクロールにて均一に混合することによって茶色の銅導体ペーストを作製した。
【0039】
【表1】
【0040】
(銅膜の作製)
ガラスフリット入り銅導体ペーストをアルミナ基板の上にステンレススクリーン#250を用いて2×2mmの範囲で印刷した。このアルミナ基板をベルト炉に入れ、180℃で30分間乾燥して1層目の膜を形成した。
【0041】
続いて、1層目の膜の上にガラスフリットを含まない銅導体ペーストを同様の方法、条件でスクリーン印刷した後、乾燥して2層目の膜を作製し、同様にしてその上に3層目の膜そして4層目の膜を積層した。
【0042】
上記アルミナ基板を直接ベルト炉に入れ、窒素中で酸素濃度50ppm以下、900℃の焼成温度、ベルト速度40mm/分下での所定の焼成時間、900℃での所定のピーク保持時間、そして所定の冷却時間で焼成工程を終えて厚膜回路基板を作製した。
【0043】
続いて、上記基板を温度40℃の酸性洗浄剤(ACL−007、上村工業社製)に180秒間浸漬後、100g/lの硫酸に60秒間浸漬して表面処理、酸化物を除去した後、無電解ニッケルめっき析出の触媒としてパラジウムを銅膜に付着させるため、パラジウム活性化剤(MSR−28、上村工業社製)に浸漬し、これを80℃の無電解ニッケルめっき液(NPR−4、上村工業社製)に7分間浸漬した後、150℃で20秒間乾燥してめっき層を付着した厚膜回路基板を作製した。
【0044】
作製した厚膜回路基板の焼成後の表面外観(膨れの有無)、膜厚、初期密着力、ニッケルめっき後の密着力をそれぞれ下記の方法で測定した。その結果を表2(実施例)と表3(比較例)に示す。
【0045】
1.焼成後の表面外観
ニッケルめっきした前の厚膜回路基板の膨れの有無を肉眼で観察した。
【0046】
2.膜厚
ニッケルめっきする前の厚膜回路基板の銅膜の膜厚を触針式膜厚計(テンコールAS500、テンコー社製)で測定した。
【0047】
3.初期密着力(L型ピール強度)
ニッケルめっきする前の厚膜回路基板における基板と銅膜間の接着力を測定したものである。L型に曲げた直径0.8mmのスズめっき銅線を2mm×2mmの大きさに焼成した銅膜の表面に半田付して固定し、垂直に折り曲げた銅線の付着力をバネ計りで計測し基板と銅膜間の接着力を求めた。
【0048】
4.ニッケルめっき後の密着力
ニッケルめっきした後の厚膜回路基板における基板と銅膜間の接着力を上記3の方法で測定した。
【0049】
【表2】
【0050】
【表3】
【0051】
この結果、実施例では、基板と銅膜の接着面となる層に所定量のガラスフリットを含有した銅導体ペーストを印刷し、2層目以降にガラスフリットを含まない銅導体ペーストを印刷、乾燥を繰り返すもので、印刷するごとに十分乾燥を行うためバインダー樹脂の分解が促進されたことにより、これを焼成すると基板と銅膜の界面ではガラスフリットが存在して十分密着するとともに表層部分はガラスフリットを含まないため、ニッケルめっきした前の厚膜回路基板では膨れの無い銅厚膜が得られた。
【0052】
しかし、比較例1と比較例2では、ガラスフリットを含有した銅導体ペーストのみを印刷、乾燥を繰り返し、これを焼成して厚膜銅導体回路を形成した場合、ガラスフリットやバインダー樹脂の分解により発生するガスによって銅膜に膨れが発生し導体特性が低下した。比較例3では、ガラスフリットを含まない銅導体ペーストのみを印刷、乾燥を繰り返し、これを焼成して厚膜銅導体回路を形成した場合、膨れは発生してないが、銅と基板が反応せず十分な密着力が得られなかった。
【0053】
比較例4では、ガラスフリットの添加量の少ない銅導体ペーストのみを印刷、乾燥を繰り返し、これを焼成して厚膜銅導体回路を形成した場合も、比較例1と同様に膨れが発生していた。比較例5では、ガラスフリットの添加量の多い銅導体ペーストのみを印刷、乾燥を繰り返し、これを焼成して厚膜銅導体回路を形成した場合も、比較例1と同様に膨れが発生していた。
【0054】
比較例6では、1層目にガラスフリットを含まない銅導体ペーストCと、2層目以降にガラスフリットを含む銅導体ペーストAを用いた場合も焼成膜が基板と密着しない結果になった。比較例7では、1層目にガラスフリットが0.5質量%を含む銅導体ペースEを使用しても、焼成膜に脹れが発生した。また、比較例8では、1層目にガラスフリットが10質量%を含む銅導体ペースEを使用しても、焼成膜に脹れが発生した。
【0055】
【発明の効果】
以上のように本願の請求項記載の発明では、セラミックス基板上に所定量のガラスフリットを含有する銅導体ペーストを印刷、乾燥した1層目の層を形成し、続いてその上にガラスフリットを含有しない銅導体ペーストを印刷、乾燥した層を少なくとも1層形成した後、焼成して厚膜の銅膜を形成する銅導体ペーストを用いた厚膜回路基板の製造方法にあり、銅導体ペーストを印刷するごとに充分乾燥した後、焼成するために、セラミックス基板と銅膜との界面ではガラスフリットが存在して充分密着するとともに表層はガラスフリットを含まないために、膨れのない厚膜の銅膜が得られる効果がある。
【図面の簡単な説明】
【図1】本発明に係る製造方法によって得られた厚膜回路基板の断面図である。
【符号の説明】
1 セラミックス基板
2 1層目の膜
3 2層目の膜
3a 3層目の膜
3b 4層目の膜
4 銅膜
5 めっき層[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a method for manufacturing a thick film circuit board using a copper conductor paste, and more particularly, to manufacture a circuit board having a film thickness of 50 μm or more with no adhesion of the fired copper film and enhanced adhesion between the board and the copper film. Regarding the method.
[0002]
[Prior art]
Today, copper-based pastes are used to print circuits on ceramic substrates. When this copper-based paste is bonded to a substrate, for example, as described in Japanese Patent Application Laid-Open No. 8-298359, the original micron-sized copper powder cannot be reactively bonded to the ceramic substrate. A predetermined amount of glass frit was blended in the glass frit, and the glass frit on the substrate after printing gave a role of bonding the substrate and the copper film after firing. However, since the glass frit remains in the copper film after firing in large quantities, the electrical resistance value of the copper film is increased, and the copper film and the substrate are bonded by the glass layer, so that the thermal expansion difference There was a problem that the distortion caused by the phenomenon became easier and the thermal shock resistance became weaker.
[0003]
As a paste that partially eliminates such inconveniences, as described in, for example, JP-A-60-70746, copper, glass frit, and non-copper substances such as tungsten, molybdenum, rhenium, and the like are used as organic solvents. As described in Japanese Patent Publication No. 3-50365, a glass frit such as metal copper particles coated with copper oxide, copper oxide particles, or glass is used as an organic solvent. It consists of a composition dispersed in it.
[Problems to be solved by the invention]
[0004]
The copper-based paste is also added as a glass frit, preferably in a large amount of 4 to 10% by weight, and plays a role of adhesion between the substrate and the copper film. However, the existing copper-based paste utilizes the softening of glass during firing at 600 ° C. or higher, and forms and adheres a glass layer between the substrate and the copper film.
[0005]
Moreover, when a circuit board having a thickness of 50 μm or more is produced using a copper-based paste containing glass frit, the copper-based paste is printed by screen printing, dried and fired repeatedly to form a predetermined thick film. It was formed and fired to produce a circuit board. However, it is impossible to provide a plating layer on the surface of the copper film because the glass frit contains lead which is inferior in chemical resistance. Glass frit, organic components, etc. were thermally decomposed, and the gas generated thereby expanded the copper film.
[0006]
The present invention is intended to improve such problems and to provide a method for producing a circuit board having a film thickness of 50 μm or more in which the copper film does not swell and the adhesion between the board and the copper film is enhanced. And
[0007]
[Means for Solving the Problems]
That is, according to the first aspect of the present invention, in a method of manufacturing a thick film circuit board in which a copper film is formed by printing a copper conductor paste on a substrate and firing, a copper conductor containing glass frit on a ceramic substrate. A paste is printed and dried to form a first layer, and then a copper conductor paste not containing glass frit is printed thereon, at least one dried layer is formed, and then fired to form a thick copper film In the method for manufacturing a thick film circuit board, a copper conductor paste containing a specific amount of glass frit is printed on a ceramic substrate, and a dried first layer is formed, followed by containing glass frit thereon. In the method of manufacturing a thick film circuit board using the copper conductor paste, the copper conductor paste is printed, and after forming at least one dried layer, the film is baked to form a thick copper film. Thickness that does not swell because the glass frit exists and adheres well at the interface between the ceramic substrate and the copper film and the surface layer does not contain glass frit in order to dry and fire each time the conductor paste is printed. A copper film of the film is obtained.
[0008]
The invention according to
[0009]
In the invention of
[0010]
The invention according to claim 4 of the present application is a method for manufacturing a thick film circuit board using a copper conductor paste in which the electroless plating layer is a nickel plating layer.
[0011]
In the invention according to claim 5 of the present application, the copper conductor paste containing glass frit is a copper fine powder or primary average particle composed of copper, copper oxide, or a mixture thereof having a primary average particle diameter of 0.01 to 0.3 μm. Two or more types of copper powder having a diameter of 0.5 to 5 μm, a binder resin, and at least a SiO 2 —B 2 O 3 —ZnO system and a SiO 2 —B 2 O 3 —Bi 2 O 3 system having a softening point of 500 to 600 ° C. A thick film circuit board manufacturing method using a copper conductor paste containing a glass frit containing a glass component and an organic solvent.
[0012]
In the invention according to claim 6 of the present application, the copper conductor paste containing no glass frit is copper fine powder composed of copper, copper oxide, or a mixture thereof having a primary average particle diameter of 0.01 to 0.3 μm, or primary average particles. It is in the manufacturing method of the thick film circuit board using the copper conductor paste which mix | blended the copper powder of diameter 0.5-5 micrometers, binder resin, and the organic solvent.
[0013]
The invention according to claim 7 of the present application resides in a method of manufacturing a thick film circuit board using a copper conductor paste having 2 to 4 copper conductor paste layers not containing glass frit.
[0014]
DETAILED DESCRIPTION OF THE INVENTION
In the present invention, the first layer copper conductor paste is a copper conductor paste containing glass frit, specifically, copper, copper oxide having a primary average particle diameter of 0.01 to 0.3 μm, or a mixture thereof. Copper powder having a primary average particle size of 0.5 to 5 μm, binder resin, at least SiO 2 —B 2 O 3 —ZnO system having a softening point of 500 to 600 ° C. and SiO 2 —B 2 O 3 —Bi 2. A glass frit containing two or more glass components of O 3 type and an organic solvent are blended.
[0015]
Further, the copper conductor paste of the second and subsequent layers is a copper conductor paste containing no glass frit, and copper fine powder made of copper having a primary average particle diameter of 0.01 to 0.3 μm, or a mixture thereof, A copper powder having a primary average particle size of 0.5 to 5 μm, a binder resin, and an organic solvent are blended.
[0016]
Copper fine powder comprising copper, copper oxide or a mixture thereof constituting the copper conductor paste is obtained, for example, by a method called a precipitation method, that is, a method in which metal fine particles are directly precipitated from a metal salt solution using a reducing agent. A copper fine powder can be obtained by adding a reducing agent such as formalin, hydrazine, sodium hypophosphite, borohydride, etc. to an aqueous solution containing copper ions under appropriate conditions. The copper fine powder is surface-treated with an organic fatty acid or a coupling agent in order to improve oxidation resistance, dispersibility, and the like.
[0017]
The primary average particle diameter of the copper fine powder is in the range of 0.01 to 0.3 μm. Preferably, it exists in the range of 0.01-0.2 micrometer, if it is this range, aggregation of a copper fine powder will lose | eliminate, a dense copper film will be formed, and the electrical resistance value will also become small.
[0018]
Moreover, the copper powder which comprises a copper conductor paste is based on the copper powder in the range of a primary average particle diameter of 0.5-5 micrometers, and 1-3 types of copper powders in which the powder diameter in this range differs These are added. The specific copper powder is a base copper powder having the largest particle diameter in the range of primary average particle diameter of 2 to 5 μm, and a first auxiliary copper powder having the next largest particle diameter in the range of primary average particle diameter of 1 to 2 μm. And when it is comprised from the three-stage particle diameter range of the 2nd auxiliary copper powder with the smallest particle diameter in the range of primary average particle diameter 0.5-1 micrometer, or the range of primary average particle diameter 0.5-1 micrometer The base copper powder and the auxiliary copper powder in the range of the primary average particle diameter of 0.1 to 0.5 μm.
[0019]
In the case where the copper powder is configured from a three-stage particle size range, the first auxiliary copper powder is 1 to 19% by weight and the second auxiliary copper powder is 1 to 19% by weight with respect to 80 to 98% by weight of the base copper powder. 1 to 19% by weight. Especially about auxiliary copper powder, you may use the 3rd auxiliary copper powder below these primary average particle diameter ranges, without being limited to this.
[0020]
Each copper powder of the auxiliary copper powder is preferably a relatively spherical one. This is because each copper powder is arranged with fewer voids. When copper powder with different primary average particle diameter is used, auxiliary copper powder with a small primary average particle diameter fills the gaps and voids that occur when the base copper powder with the largest primary average particle diameter is arranged. This film has few internal defects and is effective in improving the shrinkage.
[0021]
When the primary average particle size of the base copper powder exceeds 5 μm, the firing conditions are not easily affected by the oxidation, but the sintering conditions are widened at low temperatures. Power is reduced. In addition, the copper powder may be crushed in the ink roll process to form a copper foil, and mesh clogging may occur during screen printing. On the other hand, if the primary average particle diameter of the base copper powder is less than 0.5 μm, the total particle area of the copper powder becomes too large, the influence of oxidation becomes large, and the electrical resistance value becomes high. In addition, since the bulk density is large, the shrinkage is deteriorated.
[0022]
If the added amount of the base copper powder exceeds 98% by weight, it will not sinter sufficiently at a low temperature, resulting in insufficient shrinkage, resulting in a decrease in the adhesive strength between the copper film and the substrate. The total particle area of the powder becomes too large, and the same problem as described above occurs.
The auxiliary copper powder is added to fill gaps and voids generated when the base copper powder is arranged, and the primary average particle diameter and the amount added are greatly influenced by those of the base copper powder.
[0023]
The binder resin constituting the copper conductor paste includes, for example, acrylics such as polybutyl methacrylate and polymethyl methacrylate, celluloses such as nitrocellulose, ethyl cellulose, cellulose acetate, butyl cellulose, and methyl cellulose, polyethers such as polyoxymethylene, and polybutadiene. , Polyvinyls such as polyisoprene, and polyamides such as nylon 6, nylon 6.6, and nylon 11, which are not particularly limited, but need to be decomposed during firing.
[0024]
As the binder resin, it is preferable to include at least two kinds of resins having different thermal decomposition temperatures. Even when baked, the binder resin does not thermally decompose at a time and decomposes according to the environmental temperature, so that it does not remain in the copper film.
[0025]
Examples of organic solvents that dissolve the binder resin include carbitol, carbitol acetate, terpineol (terpineol), metacresol, dimethylimidazolidinone, dimethylformamide, terpinol, diacetone alcohol, triethylene glycol, paraxylene, ethyl lactate, isophorone. It is an organic solvent with a high boiling point such as 2 or more types.
[0026]
The glass frit used in the present invention is one having a softening point lower than the sintering temperature of copper fine powder or copper powder made of copper, copper oxide, or a mixture thereof, and higher than the thermal decomposition temperature of the binder resin. The In particular, the glass frit softened during the firing process of the copper conductor paste flows in the direction of the substrate, and at the same time, the copper fine powder and copper powder are moved in the direction of the substrate, smoothing the film after firing, and soldering to the copper film This is important in improving the adhesion and improving the adhesion between the substrate and the copper film and suppressing the increase in the electrical resistance value.
[0027]
This glass frit includes at least a SiO 2 —B 2 O 3 —ZnO system and a SiO 2 —B 2 O 3 —Bi 2 O 3 system, and has a primary average particle diameter of 1 to 10 μm and a temperature of 500 to 600 ° C. Has a low softening point. Specifically, SiO 2 —B 2 O 3 —ZnO, SiO 2 —B 2 O 3 —Bi 2 O 3 , SiO 2 —B 2 O 3 —TiO 2 , SiO 2 —B 2 O 3 — A ZrO system or the like is added.
[0028]
The softening point of the glass frit needs to be not less than the temperature at which the polymer content of the binder resin is decomposed and not more than the temperature at which the copper fine powder is sintered, and it is effective to add two or more kinds between these temperature differences. This is because decomposition of the polymer occurs, and the SiO 2 —B 2 O 3 —Bi 2 O 3 glass powder having a small softening point is softened, followed by the SiO 2 —B 2 O 3 —ZnO system having a large softening point. Can soften and keep the particle size of the copper fine powder small.
[0029]
The addition amount is 0.5-4 mass% with respect to the total amount of copper fine powder and copper powder. If it exceeds 4% by mass, the glass frit remains in the fired copper film, so that the electrical resistance value of the copper film tends to increase, and a glass layer is formed at the interface between the copper film and the substrate. It is easy to cause distortion due to expansion, and thermal shock resistance is weakened. On the other hand, if the amount is less than 0.5% by mass, improvement in cracking and baking of the copper film cannot be expected.
[0030]
And the viscosity of the copper conductor paste is adjusted so that the organic content of the binder resin and the organic solvent is in the range of 2 to 16% by mass. When the organic content is less than 2% by mass, the viscosity of the copper conductor paste is high, and when the organic content exceeds 14% by mass, the viscosity is low and the printability is poor.
[0031]
Moreover, all the copper fine powder and copper powder which are contained exist in the range of 84-98 mass%. If it exceeds 98% by mass, the paste becomes highly viscous and insufficiently baked, resulting in a decrease in the adhesive strength between the copper film and the substrate. On the other hand, if it is less than 84% by mass, the paste shrinks due to firing, so the same problem as described above. Happens.
[0032]
The ceramic substrate used in the present invention is alumina, aluminum nitride, silicon carbide, silicon nitride, sialon, barium titanate, PBZT, or the like.
[0033]
Thus, a method for manufacturing a thick film circuit board according to the present invention will be described below with reference to FIG.
(1) A copper conductor paste containing glass frit is applied onto the ceramic substrate 1 by screen printing or the like. In the screen printing procedure, a substrate is placed under a horizontally placed screen (for example, stainless plain fabric, 300 mesh) with a spacing of 0.1 to 2 millimeters. After the copper conductor paste is placed on the screen, it is spread over the entire screen using a squeegee. At this time, the screen and the ceramic substrate are spaced apart. Subsequently, the screen is pressed by a squeegee so that the screen comes into contact with the ceramic substrate, and printing is performed. This is repeated thereafter.
[0034]
(2) The substrate 1 is sufficiently dried in an oven at 150 to 220 ° C. for 15 to 30 minutes to form the
[0035]
(3) Subsequently, a copper conductor paste not containing glass frit is applied onto the
[0036]
(4) Similarly, the substrate 1 is sufficiently dried in an oven at 150 to 220 ° C. for 15 to 30 minutes to form a
(5) The above steps (3) and (4) are repeated to form the
(6) Subsequently, the substrate 1 is placed in a belt furnace, fired in nitrogen at a temperature of 600 to 1000 ° C. for a firing time of 20 to 60 minutes, a peak holding time of 4 to 12 minutes, and a cooling time of 9 to 27. The firing process is completed in minutes, and the copper powder is sintered and reacted and bonded to the substrate to produce a copper film 4 having a predetermined thickness. During this firing step, a predetermined amount of oxygen is fed into the furnace, increasing the adhesion between the copper film and the substrate and reducing the electrical resistance value of the copper film.
(7) Then, when this ceramic substrate 1 is immersed in an electroless metal plating solution, the plating layer 5 is formed in the region where the copper on the surface of the ceramic substrate 1 is dispersed and bonded. At this time, since copper is dispersed substantially uniformly, the plating layer 5 is less likely to be dispersed, and the plating layer 5 having a uniform film thickness can be formed. Moreover, since the copper is bonded onto the ceramic substrate 1 as described above, it is high between the plating layer 5 and the ceramic substrate 1 by the reactive bonding with copper even if the ceramic substrate 1 is not roughened. Adhesion is imparted.
[0037]
As the electroless plating treatment, an electroless copper plating treatment, an electroless nickel plating treatment, or the like can be performed.
[0038]
【Example】
Next, the present invention will be described in more detail with reference to specific examples.
Examples 1-3, Comparative Examples 1-8
(Preparation of copper conductor paste)
As shown in Table 1, copper fine powder having a predetermined particle size, copper powder, and a predetermined amount of glass frit, a binder resin, and an organic solvent were mixed. Three types consisting of a base copper powder and two types of auxiliary copper powder were used as the copper powder. Moreover, what melt | dissolved acrylic resin with carbitol and terpineol was prepared. These were mixed and further mixed uniformly with an ink roll to prepare a brown copper conductor paste.
[0039]
[Table 1]
[0040]
(Preparation of copper film)
The glass frit-containing copper conductor paste was printed on an alumina substrate in a range of 2 × 2 mm using a stainless screen # 250. This alumina substrate was placed in a belt furnace and dried at 180 ° C. for 30 minutes to form a first layer film.
[0041]
Subsequently, a copper conductor paste not containing glass frit is screen-printed on the first layer film in the same manner and conditions, and then dried to produce a second layer film. A layer film and a layer 4 film were laminated.
[0042]
The alumina substrate is directly placed in a belt furnace, an oxygen concentration of 50 ppm or less in nitrogen, a firing temperature of 900 ° C., a predetermined firing time at a belt speed of 40 mm / min, a predetermined peak holding time at 900 ° C., and a predetermined A thick film circuit board was produced after finishing the firing process in the cooling time.
[0043]
Subsequently, the substrate was immersed in an acidic detergent (ACL-007, manufactured by Uemura Kogyo Co., Ltd.) at a temperature of 40 ° C. for 180 seconds, and then immersed in 100 g / l sulfuric acid for 60 seconds to remove the surface treatment and oxides. In order to adhere palladium to the copper film as a catalyst for the electroless nickel plating deposition, it is immersed in a palladium activator (MSR-28, manufactured by Uemura Kogyo Co., Ltd.), and this is electroless nickel plating solution (NPR-4, A thick film circuit board having a plating layer attached thereto was prepared by dipping in Uemura Kogyo Co., Ltd. for 7 minutes and then drying at 150 ° C. for 20 seconds.
[0044]
The surface appearance (whether swelling), film thickness, initial adhesion, and adhesion after nickel plating of the produced thick film circuit board were measured by the following methods. The results are shown in Table 2 (Examples) and Table 3 (Comparative Examples).
[0045]
1. The appearance of the surface of the thick film circuit board before the nickel plating before firing was observed with the naked eye.
[0046]
2. Film thickness The film thickness of the copper film of the thick film circuit board before nickel plating was measured with a stylus type film thickness meter (Tencor AS500, manufactured by Tenko).
[0047]
3. Initial adhesion (L-type peel strength)
The adhesion force between the substrate and the copper film in the thick film circuit board before nickel plating is measured. Solder and fix a tin-plated copper wire with a diameter of 0.8 mm bent to an L shape onto the surface of a copper film fired to a size of 2 mm x 2 mm, and measure the adhesion of the copper wire bent vertically using a spring gauge The adhesion between the substrate and the copper film was determined.
[0048]
4). Adhesion After Nickel Plating The adhesion between the substrate and the copper film in the thick film circuit board after nickel plating was measured by the
[0049]
[Table 2]
[0050]
[Table 3]
[0051]
As a result, in this example, a copper conductor paste containing a predetermined amount of glass frit is printed on the layer that becomes the bonding surface between the substrate and the copper film, and a copper conductor paste not containing glass frit is printed and dried on the second and subsequent layers. Since the decomposition of the binder resin was promoted to perform sufficient drying each time printing was performed, when this was baked, glass frit was present at the interface between the substrate and the copper film, and the surface layer portion was made of glass. Since the frit was not included, a thick copper film without swelling was obtained on the thick film circuit board before nickel plating.
[0052]
However, in Comparative Example 1 and Comparative Example 2, when only a copper conductor paste containing glass frit is printed and dried repeatedly and baked to form a thick film copper conductor circuit, the glass frit and binder resin are decomposed. The generated gas swelled in the copper film, and the conductor properties deteriorated. In Comparative Example 3, when only a copper conductor paste containing no glass frit was printed and dried repeatedly and baked to form a thick film copper conductor circuit, no blistering occurred, but the copper and the substrate reacted. Sufficient adhesion could not be obtained.
[0053]
In Comparative Example 4, even when only a copper conductor paste with a small amount of glass frit added was printed and dried, and this was fired to form a thick film copper conductor circuit, blistering occurred as in Comparative Example 1. It was. In Comparative Example 5, when only a copper conductor paste with a large amount of glass frit added was printed and dried repeatedly, and this was fired to form a thick film copper conductor circuit, blistering occurred as in Comparative Example 1. It was.
[0054]
In Comparative Example 6, when the copper conductor paste C containing no glass frit in the first layer and the copper conductor paste A containing glass frit in the second and subsequent layers were used, the fired film did not adhere to the substrate. In Comparative Example 7, even when a copper conductor pace E containing 0.5% by mass of glass frit in the first layer was used, swelling was generated in the fired film. In Comparative Example 8, even when a copper conductor pace E containing 10% by mass of glass frit in the first layer was used, the fired film was swollen.
[0055]
【The invention's effect】
As described above, in the invention described in the claims of the present application, a copper conductor paste containing a predetermined amount of glass frit is printed on a ceramic substrate to form a dried first layer, and then glass frit is formed thereon. There is a method of manufacturing a thick film circuit board using a copper conductor paste which is formed by printing and drying at least one layer of a copper conductor paste not containing copper, and then firing to form a thick copper film. Thick film copper that does not swell because the glass frit exists and adheres well at the interface between the ceramic substrate and the copper film, and the surface layer does not contain glass frit. There is an effect that a film is obtained.
[Brief description of the drawings]
FIG. 1 is a cross-sectional view of a thick film circuit board obtained by a manufacturing method according to the present invention.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1
Claims (7)
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| Application Number | Priority Date | Filing Date | Title |
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| JP2002036240A JP3753989B2 (en) | 2002-02-14 | 2002-02-14 | Method for manufacturing thick film circuit board using copper conductor paste |
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| JP2002036240A JP3753989B2 (en) | 2002-02-14 | 2002-02-14 | Method for manufacturing thick film circuit board using copper conductor paste |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP4651319B2 (en) * | 2004-07-07 | 2011-03-16 | 旭化成イーマテリアルズ株式会社 | Method for manufacturing printed circuit board |
| JP4413096B2 (en) * | 2004-07-13 | 2010-02-10 | 信越ポリマー株式会社 | Photosensitive conductive paste |
| JP2007201346A (en) * | 2006-01-30 | 2007-08-09 | Mitsuboshi Belting Ltd | Ceramic circuit board and manufacturing method thereof |
| WO2013061727A1 (en) | 2011-10-28 | 2013-05-02 | 京セラ株式会社 | Circuit board and electronic apparatus provided with same |
| JP5840945B2 (en) * | 2011-12-26 | 2016-01-06 | 京セラ株式会社 | Circuit board and electronic device having the same |
| JP5819751B2 (en) * | 2012-02-29 | 2015-11-24 | 三ツ星ベルト株式会社 | Conductive laminate, manufacturing method and precursor thereof |
| CN102760934B (en) * | 2012-07-26 | 2015-08-05 | 深圳市圣龙特电子有限公司 | Thick film circuit conductor paste, the thick film circuit board applying this slurry and manufacture method thereof |
| JP2013038431A (en) * | 2012-09-05 | 2013-02-21 | Sakamoto Jun | Printed matter |
| JP6199778B2 (en) * | 2014-03-19 | 2017-09-20 | 株式会社ノリタケカンパニーリミテド | Circuit board and conductor paste for circuit board |
| JP6346518B2 (en) * | 2014-07-28 | 2018-06-20 | 株式会社ノリタケカンパニーリミテド | Heat dissipation board |
| JP6307009B2 (en) * | 2014-10-31 | 2018-04-04 | 株式会社ノリタケカンパニーリミテド | Circuit board and conductor paste for circuit board |
| KR102105906B1 (en) * | 2018-09-18 | 2020-04-29 | (주)창성 | Cu paste for high-temperature sintering and manufacturing method for metal bonded ceramic substrates therewith |
| WO2022107590A1 (en) * | 2020-11-18 | 2022-05-27 | 京セラ株式会社 | Wiring board and display device |
| WO2023089804A1 (en) * | 2021-11-22 | 2023-05-25 | 三菱電機株式会社 | Magnetic ceramic substrate, substrate manufacturing method, and circulator |
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