JP3778638B2 - Metal thin film type magnetic recording medium - Google Patents
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- JP3778638B2 JP3778638B2 JP31946296A JP31946296A JP3778638B2 JP 3778638 B2 JP3778638 B2 JP 3778638B2 JP 31946296 A JP31946296 A JP 31946296A JP 31946296 A JP31946296 A JP 31946296A JP 3778638 B2 JP3778638 B2 JP 3778638B2
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- 239000002184 metal Substances 0.000 title claims description 19
- 229910052751 metal Inorganic materials 0.000 title claims description 19
- 239000010409 thin film Substances 0.000 title claims description 19
- 239000000758 substrate Substances 0.000 claims description 31
- 239000010408 film Substances 0.000 claims description 9
- 230000001681 protective effect Effects 0.000 claims description 9
- 229910052804 chromium Inorganic materials 0.000 claims description 4
- 229910052715 tantalum Inorganic materials 0.000 claims description 4
- 229910052750 molybdenum Inorganic materials 0.000 claims description 2
- 229910052758 niobium Inorganic materials 0.000 claims description 2
- 229910052721 tungsten Inorganic materials 0.000 claims description 2
- 239000013078 crystal Substances 0.000 description 17
- 229910000531 Co alloy Inorganic materials 0.000 description 7
- 239000000203 mixture Substances 0.000 description 6
- 238000004544 sputter deposition Methods 0.000 description 5
- 230000006872 improvement Effects 0.000 description 4
- 229910000838 Al alloy Inorganic materials 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 230000003746 surface roughness Effects 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 239000006061 abrasive grain Substances 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
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Description
【0001】
【発明の属する技術分野】
本発明は、ハードディスク等の磁気ディスク装置に使用される磁気記録媒体に関し、より具体的には、磁気特性及び記録再生特性に優れた金属薄膜型磁気記録媒体に関するものである。
【0002】
【従来の技術】
ハードディスクに用いられる金属薄膜型磁気記録媒体(1)は、図4に示す如く、一般的には、Al合金からなる非磁性のサブストレート(21)上に非晶質のNiP層(22)が形成された媒体基板(2)に、実質的にCrからなる下地層(4)、Co合金等からなる磁性層(5)、カーボン等の保護膜(6)を順に積層成膜して形成されている。図4では、NiP層(22)、下地層(4)、磁性層(5)及び保護膜(6)を、サブストレート(21)の両面に設けている。
金属薄膜型磁気記録媒体には、記録密度、即ち線記録密度とトラック密度の向上と、記録分解能の向上が望まれており、これらを高めるために、磁気特性の向上(特に高保磁力化)と、記録再生特性の向上(特に低ノイズ化)が要請されている。
【0003】
【発明が解決しようとする課題】
磁気記録媒体の線記録密度を向上させると、線形等価によって除去できない非線形な波形干渉が生じ、記録分解能の劣化の原因となる。この非線形波形干渉は、円周方向の磁気的異方性が大きくなるほど増大する傾向にある。
トラック密度の向上には、トラック全体に占めるトラックエッジでの媒体ノイズ低減が非常に重要となる。トラックエッジでの媒体ノイズの増加は、円周方向の磁気的異方性に起因する。
また、磁気記録媒体に構造的な工夫をこらすことにより保磁力を向上させる手段として、媒体基板の表面にテクスチャが施されることがある。このテクスチャは、ラッピングテープや遊離砥粒により、NiP層の円周方向にRa50〜100Åの面粗度の微小な凹凸を形成するものである。NiP層にテクスチャが施されると、Co合金磁性層の周方向の磁気的異方性を高めることができるため、保磁力の向上に有効である。しかしながら、円周方向の磁気的異方性の向上は、上述のとおり、トラックエッジでの媒体ノイズの増加に繋がる。
テクスチャによる微小な凹凸は、磁気記録媒体と磁気ヘッドとの摩擦の軽減にも有効である。しかしながら、テクスチャ処理により媒体基板表面に異常突起が形成されたり、媒体基板の平坦度が悪化することがあり、ヘッドと磁気記録媒体との接触を避けるためにヘッドの浮上量を大きくせねばならず、グライド特性が悪化し、記録密度の低下を招くことがある。また、テクスチャ処理によりスクラッチ等が形成されて、エラー発生の原因となることがある。
このため最近では、要求される面粗度は小さくなる傾向にあり、基板に起因するエラー欠陥の減少、低浮上域でのヘッドの安定的走行、及び媒体基板の平坦度を向上させるために、媒体基板にスーパーフィニッシュ加工を施した超平滑媒体基板の要請もある。しかしながら、テクスチャの形成を省略すると、磁性層の円周方向の磁気的異方性はなくなるが、所望の保磁力を得られない不都合がある。保磁力の向上には、磁性層のCo合金にPtを添加することが有効であるが、Ptの添加はスパッタリング装置のターゲットが高価になること、さらに媒体ノイズが大きくなる問題がある。
【0004】
本発明の目的は、磁気特性と記録再生特性に優れた金属薄膜型磁気記録媒体を提供することである。
【0005】
【課題を解決するための手段】
上記課題を解決するために、本発明の金属薄膜型磁気記録媒体は、媒体基板(2)とCr下地層(4)との間に、結晶質のプリレイヤー(3)を形成するものである。
結晶質のプリレイヤー(3)の構成成分として、原子%にて、Co:32〜48%、残部実質的にCrからなる組成を挙げることができる。
また、結晶質のプリレイヤー(3)の構成成分として、Co:32〜48%、W、Mo、Ta、Nbのうち少なくとも一種を合計量で0.5〜3%、残部実質的にCrからなる組成を挙げることができる。
【0006】
【作用】
基板(2)とCr下地層(4)との間に上記組成の結晶質のプリレイヤー(3)を設けることにより、プリレイヤー(3)の上に成膜されるCr下地層(4)の主たる結晶配向である(211)配向が向上し、ひいては該Cr下地層の上に成膜されるCo合金磁性層の主たる結晶配向である(100)配向が向上する。また、Cr下地層の結晶が微細化され、ひいてはCo合金磁性層の結晶が微細化される。
磁性層の結晶配向の向上と、結晶の微細化により、磁気記録媒体の高保磁力化と媒体ノイズの低減化を同時に達成することができる。
【0007】
【発明の実施の形態】
図1は、本発明の金属薄膜型磁気記録媒体(1)の部分断面図を示しており、Al合金またはガラスからなるサブストレート(21)にNiP層(22)を形成した媒体基板(2)上に、プリレイヤー(3)、下地層(4)、磁性層(5)及び保護膜(6)を、この順序で積層成膜している。
図1では、NiP層(22)、プリレイヤー(3)、下地層(4)、磁性層(5)及び保護膜(6)がサブストレート(21)に関して対称に成膜している。
NiP層(22)を形成した媒体基板(2)では、ヘッドと媒体との間の摩擦を軽減するために、円周方向にテクスチャを施してもよい。一方、ヘッドの低浮上化のために磁気記録媒体(1)に平坦度が要求される場合には、スーパーフィニッシュ加工を施して表面を超平滑化させることができる。
【0008】
なお、媒体基板(2)のサブストレート(21)の材料としてガラスを使用する場合、ガラスは剛性に優れることから、NiP層(22)の形成が省略されることもある。この場合、プリレイヤー(3)はサブストレート(21)の上に直接形成すればよい。
【0009】
プリレイヤー(3)は、希ガス(Arガス等)の雰囲気下で、スパッタリングにより形成することができる。
【0010】
プリレイヤー(3)の上に成膜されるCr下地層(4)の厚さは、200〜1000Åが望ましく、400〜800Åがより望ましい。これは、Cr下地層(4)の層厚を約800Åより厚くしても、磁気記録媒体(1)の保磁力のさらなる向上は期待できないためであり、1000Åよりも厚くすると、その上に形成されるCo合金磁性層(5)の粒子の粗大化を招き、ノイズが増大するおそれがあるためである。
下地層(4)は、公知のごとく、Crから形成する。
磁性層(5)は、Coを主成分とする公知のCo合金から形成する。
【0011】
NiP層(22)、下地層(4)、磁性層(5)及び保護膜(6)の形成は、公知の如く、DCスパッタリング法、メッキ法又は真空蒸着法等の方法により行なうことができる。
【0012】
Cr下地層(4)をプリレイヤー(3)の上に成膜する際、Cr下地層を所望の結晶配向にするために、基板(2)を赤外線ヒータによって約250〜300℃の温度に加熱した状態で実施してもよい。
【0013】
【実施例】
実施例1
基板(2)と下地層(4)との間に、結晶質のプリレイヤー(3)を形成した本発明の金属薄膜型磁気記録媒体No.1〜No.4と、プリレイヤー(3)を形成していない金属薄膜型磁気記録媒体No.11を作製し、記録再生特性及びOR(orientation ratio)を測定した。
供試磁気記録媒体の作製条件は、次の通りである。
・媒体基板
サブストレート:Al合金製(3.5inch−31.5mil)
NiP層 :厚さ10μm
表面処理 :円周方向の機械的テクスチャ
粗さ :Ra=28Å
・プリレイヤー、下地層、磁性層及び保護膜
組成 :表1参照(原子%)
厚さ :表1のカッコ内参照
スパッタ装置 :DCスパッタリング装置
基板温度 :260℃
プリレイヤー成膜雰囲気:Arガス
下地層及び磁性層成膜時のバイアス電圧:−200
【0014】
【表1】
【0015】
得られた供試磁気記録媒体No.1〜No.4及びNo.11について、記録再生特性及びORを測定した。なお、磁気特性が異なると記録再生特性も異なるため、各磁気記録媒体の保磁力Hcと残留磁束密度Brdを夫々、2100Oe、240Guとなるように調整して測定を行なった。
記録再生特性の測定は、Silmag社製のPHSヘッドを用いて、線記録密度120kFCI(k flux change per inch)て行なった。
結果を表2に示す。
表2中、SNmは媒体のノイズと信号強度の比、Nmは媒体のノイズを示している。また、表2中、NLTSは、Non Linear Transition Shiftの略語で、既に書き込まれた記録パターン上の漏洩磁場がヘッドの記録磁界に影響を及ぼした結果、次にディスクに書き込まれる磁化遷移領域の位置がずれる量を表わしている。
なお、ORとは、金属薄膜型磁気記録媒体の円周方向の保磁力と半径方向の保磁力の比(円周方向の保磁力/半径方向の保磁力)を表わし、ORが1に近いほど、周方向への磁気的異方性の影響は制御されていることを意味し、磁気記録媒体のサイドフリンジは小さく、また媒体ノイズも小さくなる。
【0016】
【表2】
【0017】
表2を参照すると、上記各組成の結晶質のプリレイヤー(3)を形成した本発明の磁気記録媒体No.1〜No.4は、何れも、プリレイヤー(3)を具えていない磁気記録媒体No.11よりも低ノイズ、低NLTSであり、記録再生特性にすぐれることがわかる。
また、ORについても、磁気記録媒体No.11が1.42であるのに対し、磁気記録媒体No.1〜No.4は、1.1前後にORが調整されており、周方向への磁気的異方性の影響が制御され、サイドフリンジを抑え、媒体ノイズも小さくできることがわかる。
【0018】
実施例2
実施例1の供試磁気記録媒体No.1、No.3及びNo.11について、磁性層(5)の厚さを100Å〜500Åの範囲で変えて成膜し、保磁力Hcを測定した。結果を図2に示す。
図2を参照すると、結晶質のプリレイヤー(3)を形成した本発明の磁気記録媒体No.1及びNo.3は、プリレイヤー(3)を具えていない磁気記録媒体No.11よりも高保磁力であることがわかる。
このように、高保磁力化が図れたのは、磁気記録媒体No.1及びNo.3は、結晶質のプリレイヤー(3)によって、プリレイヤー(3)上に形成されるCr下地層(4)の主たる結晶配向を(211)配向とすることができ、ひいてはCo磁性層の主たる結晶配向を、後述する実施例3で示すように、(100)配向とすることができるためであり、また、基板(2)と下地層(4)との間に、結晶質のプリレイヤー(3)を形成することにより、Cr下地層(4)、ひいてはCr下地層(4)上に形成されるCo磁性層(5)の微細化を図ることができたためと考えられる。
【0019】
実施例3
実施例2で示したとおり、実施例1で得られた供試磁気記録媒体No.1の下地層(4)と磁性層(5)の結晶配向が、夫々(211)配向、(100)配向となっていることを、X線回折により調べた。結果を図3に示す。
図3に示すごとく、Cr下地層(4)の結晶配向であるCr(211)と、Co磁性層(5)の結晶配向であるCo(100)のピークが現われていることが確認された。
【0020】
【効果】
上記組成の結晶質のプリレイヤー(3)を、基板(2)と下地層(4)との間に形成することにより、その上に成膜される下地層(4)の主たる結晶配向が(211)配向となり、さらにその上に成膜される磁性層の主たる結晶配向が(100)配向となる。また、下地層(4)及び磁性層(5)の結晶が微細化される。
このように、磁性層の結晶配向が向上し、結晶が微細化されることにより、金属薄膜型磁気記録媒体の保磁力の向上と、ORの低減、さらに媒体ノイズの低減による記録再生特性の向上を図ることができる。
【図面の簡単な説明】
【図1】本発明のプリレイヤーを形成した金属薄膜型磁気記録媒体の部分断面図である。
【図2】磁性層の厚さと保磁力Hcとの関係を示すグラフである。
【図3】本発明のプリレイヤーを形成した金属薄膜型磁気記録媒体のX線回折結果を示すグラフである。
【図4】従来の金属薄膜型磁気記録媒体の部分断面図である。
【符号の説明】
(1) 金属薄膜型磁気記録媒体
(2) 媒体基板
(3) プリレイヤー
(4) 下地層
(5) 磁性層
(6) 保護膜[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a magnetic recording medium used in a magnetic disk device such as a hard disk, and more specifically to a metal thin film type magnetic recording medium excellent in magnetic characteristics and recording / reproducing characteristics.
[0002]
[Prior art]
As shown in FIG. 4, a metal thin film magnetic recording medium (1) used for a hard disk generally has an amorphous NiP layer (22) on a nonmagnetic substrate (21) made of an Al alloy. The formed medium substrate (2) is formed by sequentially laminating a base layer (4) substantially made of Cr, a magnetic layer (5) made of a Co alloy, etc., and a protective film (6) made of carbon, etc. ing. In FIG. 4, the NiP layer (22), the underlayer (4), the magnetic layer (5), and the protective film (6) are provided on both surfaces of the substrate (21).
Metal thin-film magnetic recording media are desired to improve recording density, that is, linear recording density and track density, and to improve recording resolution.In order to increase these, improvement of magnetic properties (particularly high coercivity) and Therefore, improvement of recording / reproduction characteristics (particularly noise reduction) is demanded.
[0003]
[Problems to be solved by the invention]
When the linear recording density of the magnetic recording medium is improved, non-linear waveform interference that cannot be removed by linear equivalence occurs, causing deterioration in recording resolution. This nonlinear waveform interference tends to increase as the magnetic anisotropy in the circumferential direction increases.
In order to improve the track density, it is very important to reduce the medium noise at the track edge in the entire track. The increase in medium noise at the track edge is due to the magnetic anisotropy in the circumferential direction.
In addition, as a means for improving the coercive force by devising structural features on the magnetic recording medium, the surface of the medium substrate may be textured. This texture is formed by wrapping tape or loose abrasive grains to form minute irregularities with a surface roughness of Ra 50-100 mm in the circumferential direction of the NiP layer. When the NiP layer is textured, the magnetic anisotropy in the circumferential direction of the Co alloy magnetic layer can be increased, which is effective in improving the coercive force. However, improvement of the magnetic anisotropy in the circumferential direction leads to an increase in medium noise at the track edge as described above.
The minute unevenness due to the texture is also effective in reducing friction between the magnetic recording medium and the magnetic head. However, abnormal protrusions may be formed on the surface of the medium substrate due to texture processing, or the flatness of the medium substrate may deteriorate, and the flying height of the head must be increased to avoid contact between the head and the magnetic recording medium. In addition, the glide characteristics may be deteriorated and the recording density may be reduced. In addition, scratches and the like may be formed by texture processing, which may cause an error.
For this reason, recently, the required surface roughness tends to be small, in order to reduce error defects caused by the substrate, stable running of the head in a low flying area, and improve the flatness of the medium substrate. There is also a demand for an ultra-smooth medium substrate obtained by super-finishing a medium substrate. However, if the formation of the texture is omitted, the magnetic anisotropy in the circumferential direction of the magnetic layer is eliminated, but there is a disadvantage that a desired coercive force cannot be obtained. In order to improve the coercive force, it is effective to add Pt to the Co alloy of the magnetic layer. However, the addition of Pt has a problem that the target of the sputtering apparatus becomes expensive and the medium noise increases.
[0004]
An object of the present invention is to provide a metal thin film type magnetic recording medium excellent in magnetic characteristics and recording / reproducing characteristics.
[0005]
[Means for Solving the Problems]
In order to solve the above problems, the metal thin film type magnetic recording medium of the present invention forms a crystalline prelayer (3) between a medium substrate (2) and a Cr underlayer (4). .
As a constituent component of the crystalline prelayer (3), there can be mentioned a composition consisting of Co: 32 to 48% and the balance substantially consisting of Cr in atomic%.
Further, as a constituent of the crystalline prelayer (3), Co: 32 to 48%, at least one of W, Mo, Ta, and Nb is 0.5 to 3% in total amount, and the balance is substantially made of Cr. The composition which becomes can be mentioned.
[0006]
[Action]
By providing a crystalline prelayer (3) having the above composition between the substrate (2) and the Cr underlayer (4), the Cr underlayer (4) formed on the prelayer (3) The (211) orientation, which is the main crystal orientation, is improved, and consequently, the (100) orientation, which is the main crystal orientation of the Co alloy magnetic layer formed on the Cr underlayer, is improved. Further, the crystal of the Cr underlayer is miniaturized, and consequently the crystal of the Co alloy magnetic layer is miniaturized.
By improving the crystal orientation of the magnetic layer and miniaturizing the crystal, it is possible to simultaneously achieve a high coercive force and a reduction in medium noise of the magnetic recording medium.
[0007]
DETAILED DESCRIPTION OF THE INVENTION
FIG. 1 is a partial cross-sectional view of a metal thin film type magnetic recording medium (1) of the present invention. A medium substrate (2) in which a NiP layer (22) is formed on a substrate (21) made of an Al alloy or glass. On top, a pre-layer (3), an underlayer (4), a magnetic layer (5), and a protective film (6) are laminated in this order.
In FIG. 1, the NiP layer (22), the pre-layer (3), the underlayer (4), the magnetic layer (5), and the protective film (6) are formed symmetrically with respect to the substrate (21).
The medium substrate (2) on which the NiP layer (22) is formed may be textured in the circumferential direction in order to reduce the friction between the head and the medium. On the other hand, when the magnetic recording medium (1) is required to have a flatness in order to reduce the flying height of the head, the surface can be super-smoothed by super finishing.
[0008]
When glass is used as the material for the substrate (21) of the medium substrate (2), the glass is excellent in rigidity, so the formation of the NiP layer (22) may be omitted. In this case, the pre-layer (3) may be formed directly on the substrate (21).
[0009]
The pre-layer (3) can be formed by sputtering in an atmosphere of a rare gas (Ar gas or the like).
[0010]
The thickness of the Cr underlayer (4) formed on the pre-layer (3) is preferably 200 to 1000 mm, and more preferably 400 to 800 mm. This is because even if the thickness of the Cr underlayer (4) is thicker than about 800 mm, further improvement in the coercive force of the magnetic recording medium (1) cannot be expected. This is because the Co alloy magnetic layer (5) may be coarsened and the noise may increase.
The underlayer (4) is formed of Cr as is well known.
The magnetic layer (5) is formed from a known Co alloy containing Co as a main component.
[0011]
The NiP layer (22), the underlayer (4), the magnetic layer (5), and the protective film (6) can be formed by a method such as a DC sputtering method, a plating method, or a vacuum evaporation method, as is well known.
[0012]
When the Cr underlayer (4) is formed on the prelayer (3), the substrate (2) is heated to a temperature of about 250 to 300 ° C. by an infrared heater in order to make the Cr underlayer a desired crystal orientation. You may carry out in the state which carried out.
[0013]
【Example】
Example 1
Metal thin-film magnetic recording media No. 1 to No. 4 of the present invention in which a crystalline pre-layer (3) is formed between a substrate (2) and an underlayer (4), and the pre-layer (3) An unformed metal thin film magnetic recording medium No. 11 was produced, and recording / reproduction characteristics and OR (orientation ratio) were measured.
The production conditions of the test magnetic recording medium are as follows.
・ Media substrate substrate: Al alloy (3.5inch-31.5mil)
NiP layer: 10 μm thick
Surface treatment: Circumferential mechanical texture roughness: Ra = 28 mm
-Pre-layer, underlayer, magnetic layer and protective film composition: see Table 1 (atomic%)
Thickness: Sputtering device in parentheses in Table 1: DC sputtering device Substrate temperature: 260 ° C
Pre-layer deposition atmosphere: Ar gas underlayer and magnetic layer bias voltage: -200
[0014]
[Table 1]
[0015]
For the obtained test magnetic recording media No. 1 to No. 4 and No. 11, recording / reproduction characteristics and OR were measured. Since the recording / reproducing characteristics are different when the magnetic characteristics are different, the coercive force Hc and the residual magnetic flux density Brd of each magnetic recording medium are adjusted to 2100 Oe and 240 Gu, respectively.
The recording / reproduction characteristics were measured with a linear recording density of 120 kFCI (k flux change per inch) using a PHS head manufactured by Silmag.
The results are shown in Table 2.
In Table 2, SNm represents the ratio of medium noise to signal intensity, and Nm represents medium noise. In Table 2, NLTS is an abbreviation for Non Linear Transition Shift. As a result of the leakage magnetic field on the already written recording pattern affecting the recording magnetic field of the head, the position of the magnetization transition region to be written next to the disk This represents the amount of deviation.
Note that OR represents the ratio of the coercive force in the circumferential direction to the coercive force in the radial direction (coercivity in the circumferential direction / coercive force in the radial direction) of the metal thin film type magnetic recording medium. This means that the influence of the magnetic anisotropy in the circumferential direction is controlled, and the side fringe of the magnetic recording medium is small and the medium noise is also small.
[0016]
[Table 2]
[0017]
Referring to Table 2, none of the magnetic recording media No. 1 to No. 4 of the present invention on which the crystalline pre-layer (3) having the above-mentioned composition is formed has the pre-layer (3). It can be seen that the noise and the NLTS are lower than that of the medium No. 11, and the recording / reproducing characteristics are excellent.
Also, with respect to the OR, the magnetic recording medium No. 11 is 1.42, whereas the OR of the magnetic recording media No. 1 to No. 4 is adjusted around 1.1, so that It can be seen that the influence of magnetic anisotropy is controlled, side fringing can be suppressed, and medium noise can be reduced.
[0018]
Example 2
The test magnetic recording media No. 1, No. 3 and No. 11 of Example 1 were formed by changing the thickness of the magnetic layer (5) in the range of 100 to 500 mm, and the coercive force Hc was measured. The results are shown in FIG.
Referring to FIG. 2, the magnetic recording media No. 1 and No. 3 of the present invention in which the crystalline pre-layer (3) is formed have a higher retention than the magnetic recording media No. 11 having no pre-layer (3). It turns out that it is a magnetic force.
Thus, the high coercive force was achieved because the magnetic recording media No. 1 and No. 3 were made of a Cr underlayer (4) formed on the prelayer (3) by the crystalline prelayer (3). This is because the main crystal orientation of () can be set to (211) orientation, and thus the main crystal orientation of the Co magnetic layer can be set to (100) orientation as shown in Example 3 described later. By forming a crystalline pre-layer (3) between the substrate (2) and the underlayer (4), Co is formed on the Cr underlayer (4) and thus on the Cr underlayer (4). This is probably because the magnetic layer (5) can be miniaturized.
[0019]
Example 3
As shown in Example 2, the crystal orientations of the underlayer (4) and magnetic layer (5) of the test magnetic recording medium No. 1 obtained in Example 1 are (211) orientation and (100) orientation, respectively. This was examined by X-ray diffraction. The results are shown in FIG.
As shown in FIG. 3, it was confirmed that peaks of Cr (211) which is the crystal orientation of the Cr underlayer (4) and Co (100) which is the crystal orientation of the Co magnetic layer (5) appeared.
[0020]
【effect】
By forming the crystalline pre-layer (3) having the above composition between the substrate (2) and the base layer (4), the main crystal orientation of the base layer (4) formed thereon is ( 211) orientation, and the main crystal orientation of the magnetic layer formed thereon is the (100) orientation. Further, the crystals of the underlayer (4) and the magnetic layer (5) are miniaturized.
Thus, by improving the crystal orientation of the magnetic layer and making the crystal finer, the coercive force of the metal thin film type magnetic recording medium is improved, the OR is reduced, and the recording / reproducing characteristics are improved by reducing the medium noise. Can be achieved.
[Brief description of the drawings]
FIG. 1 is a partial cross-sectional view of a metal thin film type magnetic recording medium on which a prelayer of the present invention is formed.
FIG. 2 is a graph showing the relationship between the thickness of a magnetic layer and the coercive force Hc.
FIG. 3 is a graph showing an X-ray diffraction result of a metal thin film magnetic recording medium on which a prelayer of the present invention is formed.
FIG. 4 is a partial cross-sectional view of a conventional metal thin film type magnetic recording medium.
[Explanation of symbols]
(1) Metal thin film type magnetic recording media
(2) Media substrate
(3) Pre-layer
(4) Underlayer
(5) Magnetic layer
(6) Protective film
Claims (2)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31946296A JP3778638B2 (en) | 1996-11-29 | 1996-11-29 | Metal thin film type magnetic recording medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31946296A JP3778638B2 (en) | 1996-11-29 | 1996-11-29 | Metal thin film type magnetic recording medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH10162340A JPH10162340A (en) | 1998-06-19 |
| JP3778638B2 true JP3778638B2 (en) | 2006-05-24 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP31946296A Expired - Fee Related JP3778638B2 (en) | 1996-11-29 | 1996-11-29 | Metal thin film type magnetic recording medium |
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| Country | Link |
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| JP (1) | JP3778638B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007220285A (en) * | 2007-02-26 | 2007-08-30 | Fujitsu Ltd | Magnetic recording medium and magnetic recording apparatus |
-
1996
- 1996-11-29 JP JP31946296A patent/JP3778638B2/en not_active Expired - Fee Related
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| Publication number | Publication date |
|---|---|
| JPH10162340A (en) | 1998-06-19 |
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