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JP3859774B2 - Rotating substrate holder - Google Patents
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JP3859774B2 - Rotating substrate holder - Google Patents

Rotating substrate holder Download PDF

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Publication number
JP3859774B2
JP3859774B2 JP19610596A JP19610596A JP3859774B2 JP 3859774 B2 JP3859774 B2 JP 3859774B2 JP 19610596 A JP19610596 A JP 19610596A JP 19610596 A JP19610596 A JP 19610596A JP 3859774 B2 JP3859774 B2 JP 3859774B2
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JP
Japan
Prior art keywords
substrate
substrate holder
recess
rotating
rotating substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP19610596A
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Japanese (ja)
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JPH1036965A5 (en
JPH1036965A (en
Inventor
宗憲 石見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibaura Mechatronics Corp
Original Assignee
Shibaura Mechatronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shibaura Mechatronics Corp filed Critical Shibaura Mechatronics Corp
Priority to JP19610596A priority Critical patent/JP3859774B2/en
Publication of JPH1036965A publication Critical patent/JPH1036965A/en
Publication of JPH1036965A5 publication Critical patent/JPH1036965A5/ja
Application granted granted Critical
Publication of JP3859774B2 publication Critical patent/JP3859774B2/en
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Expired - Fee Related legal-status Critical Current

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Description

【0001】
【発明の属する技術分野】
本発明は回転基板ホルダーに関し、特に被処理物を載置する凹部の形状に改良を施した回転基板ホルダーに関する。
【0002】
【従来の技術】
従来、基板を回転させながら被処理物としての基板上に被膜を形成する場合、図1に示すような回転基板ホルダー1が用いられている。ここで、回転基板ホルダー1は、回転駆動部(図示せず)に回転軸2を介して連結されている。前記回転基板ホルダー1の表面部には、回転によって基板3が移動しないように基板3とほぼ同一形状で基板3の厚み(T)より深い深さ(D)の凹部4が設けられている。
【0003】
【発明が解決しようとする課題】
しかしながら、従来の回転基板ホルダー1においては、基板3上に被膜5を形成する際、被膜5は基板3上のみならず、凹部4側面にも形成され、凹部4の内径寸法が減少する。そして、ついには、凹部4の内径寸法が基板3の外径寸法より小さくなり、被膜5を形成した基板3を回転基板ホルダー1から取り出すことができなくなり、あるいは挿入載置できなくなる。また、被膜5の強度が弱い場合、基板3の挿入載置あるいは取り出しの際、凹部4側面の被膜5を破壊し、基板3を汚染するという問題がある。
【0004】
本発明はこうした事情を考慮してなされたもので、凹部を少なくとも2段の階段形状とすることにより、凹部の寸法が繰り返し堆積する被膜によって変化したり、あるいは基板が汚染するのを回避しえる回転基板ホルダーを提供することを目的とする。
【0005】
【課題を解決するための手段】
本発明は、被処理物を載置する,該被処理物と略同形状の凹部を有し、回転させながら前記被処理物上に被膜を形成する回転基板ホルダーにおいて、前記凹部が少なくとも2段の階段形状であることを特徴とする回転基板ホルダーである。
【0006】
本発明において、前記凹部は2段の階段形状でかつその段差部の高さは被処理物の厚みより小さいことが好ましい。図2を例にとって説明すれば、凹部の底面から段差14bまでの高さをH基板13の厚みを とすれば,H>Hであることが好ましい。しかし、H>Hの場合であっても、H,Hの値の差が小さい場合は、被膜形成後の基板を凹部から取り出す際、基板が被膜により汚染される恐れがあるので、Hを(1/3)H〜(1/2)H程度にすることがより好ましい。
【0007】
本発明において、被膜は回転基板ホルダー上面,回転基板ホルダー側面,回転基板ホルダー階段部,基板に同一厚さで形成される。しかるに、凹部が例えば図2に示すように2段の階段形状である場合、基板を載置する凹部14の底面から段差14bまでの高さH は基板13の厚みH より低く、かつ側面には基板が接しているため、基板載置部には被膜は形成されない。したがって、被膜の形成を繰り返し行なっても基板を載置する凹部の内径寸法は変化しない。一方、段差14aは、回転基板ホルダー11の回転による遠心力によって基板が段差14bを越え基板ホルダーから離脱するのを防止するために設けたものである。
【0008】
【発明の実施の形態】
以下、本発明の一実施例を図2を参照して説明する。
図中の符番11は、回転軸12を介して回転駆動部(図示せず)に連結したステンレス製の回転基板ホルダーである。この回転基板ホルダー11の上面部には、回転によって被処理物としての基板13が移動しないように該基板13とほぼ同一形状の階段状の凹部14が設けられている。前記凹部14は段差14aとこの段差14aの内側に設けられた階段形状の段差14bにより構成されており、基板13は段差14bの内側に挿入載置される。
ここで、段差14aは、回転基板ホルダー11の回転による遠心力によって基板13が段差14bを越えて回転基板ホルダー11から離脱するのを防止するために設けたものであり、その高さは基板13の上面位置より高く設定してある。他方の段差14bの高さ(凹部14の底面から段差14b上面までの高さ は基板13の厚みH よりも低く、段差14bの側面に基板13が接するように載置される。上記H及びHの寸法は、例えばH=0.3mm、H=0.6mmである。
【0009】
このように、上記実施例に係る回転基板ホルダーによれば、段差14aと階段形状の段差14bからなる凹部14を設けた構成となっているため、以下に述べる効果を有する。
【0010】
(1)被膜15は基板13及び回転基板ホルダー11の上面に形成されるが、段差14bの側面には基板13が接している為、被膜15が形成されることはない。
また、段差14b上面にも被膜15が形成されるが、段差14bの高さが基板13の厚みより低いため、前記被膜15が段差14bの内側の基板載置部に形成されることはなく、段差14bの内径寸法は維持される。
【0011】
(2)回転基板ホルダー11の回転による遠心力によって基板13が段差14bから離脱しようと傾いた場合、基板13の傾きが段差14aによって制限されるため、段差14aの凹部から基板13が離脱することがない。
【0012】
なお、上記実施例では、回転基板ホルダーの凹部が2段の階段形状である場合について述べたが、これに限らず、3段以上の階段形状でも実施例と同様な効果が期待できる。
【0013】
また、上記実施例では、回転基板ホルダーに1つの凹部が設けられている場合について述べたが、これに限らず、複数の凹部を設ける場合についても同様に適用できる。
【0014】
以上詳述した如くこの発明によれば、凹部を少なくとも2段の階段形状とすることにより、凹部の寸法が繰り返し堆積する被膜によって変化したり、あるいは基板が汚染するのを回避しえる回転基板ホルダーを提供できる。
【図面の簡単な説明】
【図1】 従来の回転基板ホルダーの断面図。
【図2】 本発明の一実施例に係る回転基板ホルダーの断面図。
【符号の説明】
11…回転基板ホルダー、 12…回転軸、 13…基板、
14…凹部、 14a,14b…段差、 15…被膜
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a rotating substrate holder, and more particularly to a rotating substrate holder in which the shape of a recess for placing an object to be processed is improved.
[0002]
[Prior art]
Conventionally, when a film is formed on a substrate as an object to be processed while rotating the substrate, a rotating substrate holder 1 as shown in FIG. 1 is used. Here, the rotary substrate holder 1 is connected to a rotary drive unit (not shown) via a rotary shaft 2. The surface portion of the rotating substrate holder 1 is provided with a recess 4 having substantially the same shape as the substrate 3 and a depth (D) deeper than the thickness (T) of the substrate 3 so that the substrate 3 does not move by rotation.
[0003]
[Problems to be solved by the invention]
However, in the conventional rotating substrate holder 1 , when the coating 5 is formed on the substrate 3, the coating 5 is formed not only on the substrate 3 but also on the side surface of the recess 4, and the inner diameter of the recess 4 is reduced. And, finally, the inner diameter of the recess 4 is smaller than the outer diameter dimension of the substrate 3, it can not be taken out of the substrate 3 to form a coating film 5 from rotating substrate holder 1, or can not insert placed. In addition, when the strength of the coating 5 is weak, there is a problem that the coating 5 on the side surface of the recess 4 is destroyed and the substrate 3 is contaminated when the substrate 3 is inserted or placed .
[0004]
The present invention has been made in consideration of such circumstances. By forming the recesses in at least two steps, it is possible to avoid the dimensions of the recesses being changed by the repeatedly deposited film or contamination of the substrate. An object is to provide a rotating substrate holder.
[0005]
[Means for Solving the Problems]
The present invention provides a rotating substrate holder on which an object to be processed is placed, which has a recess having substantially the same shape as the object to be processed, and forms a film on the object to be processed while being rotated. The rotating substrate holder is characterized by a stepped shape.
[0006]
In the present invention, it is preferable that the concave portion has a two-step shape and the height of the step portion is smaller than the thickness of the object to be processed. To describe 2 as an example, the height H 1 from the bottom surface of the recess up to the step 14b, if the thickness of the substrate 13 and H 2, it is preferable that H 2> H 1. However, even if H 2 > H 1 , if the difference between the values of H 2 and H 1 is small, the substrate may be contaminated by the coating when the substrate after forming the coating is taken out from the recess. , H 1 is more preferably about (1/3) H 2 to (1/2) H 2 .
[0007]
In the present invention, the coating is formed with the same thickness on the upper surface of the rotating substrate holder, the side surface of the rotating substrate holder, the stepped portion of the rotating substrate holder , and the substrate. However, when the recess has, for example, a two-step staircase shape as shown in FIG. 2, the height H 1 from the bottom surface of the recess 14 on which the substrate is placed to the step 14b is lower than the thickness H 2 of the substrate 13 and the side surface. Since the substrate is in contact with the substrate, no film is formed on the substrate mounting portion . Therefore, the inner diameter dimension of the concave portion on which the substrate is placed does not change even when the coating is repeatedly formed . On the other hand, the step 14 a is provided to prevent the substrate from exceeding the step 14 b and being detached from the substrate holder due to the centrifugal force generated by the rotation of the rotating substrate holder 11 .
[0008]
DETAILED DESCRIPTION OF THE INVENTION
An embodiment of the present invention will be described below with reference to FIG.
Reference numeral 11 in the drawing denotes a stainless steel rotating substrate holder connected to a rotation driving unit (not shown) via a rotating shaft 12. On the upper surface portion of the rotating substrate holder 11, a stepped recess 14 having substantially the same shape as that of the substrate 13 is provided so that the substrate 13 as an object to be processed does not move by rotation. The recess 14 includes a step 14a and a stepped step 14b provided inside the step 14a , and the substrate 13 is inserted and placed inside the step 14b.
Here, the step 14 a is provided in order to prevent the substrate 13 from separating from the rotating substrate holder 11 beyond the step 14 b due to the centrifugal force caused by the rotation of the rotating substrate holder 11. It is set higher than the upper surface position. The height of the other of the step 14b (height from the bottom surface of the recess 14 up to the step 14b upper surface) H 1 is lower than the thickness of H 2 substrate 13 is placed such that the substrate 13 is in contact with the side surface of the step 14b. The dimensions of H 1 and H 2 are, for example, H 1 = 0.3 mm and H 2 = 0.6 mm.
[0009]
Thus, according to the rotating substrate holder according to the above embodiment, since the concave portion 14 including the step 14a and the stepped step 14b is provided, the following effects are obtained.
[0010]
(1) Although the coating 15 is formed on the top surfaces of the substrate 13 and the rotating substrate holder 11, the coating 15 is not formed because the substrate 13 is in contact with the side surface of the step 14b.
Further, the coating film 15 is also formed on the upper surface of the step 14b, but since the height of the step 14b is lower than the thickness of the substrate 13, the coating film 15 is not formed on the substrate mounting portion inside the step 14b. The inner diameter of the step 14b is maintained.
[0011]
(2) When the substrate 13 is inclined attempts disengaged from the step 14b by the centrifugal force generated by the rotation of the rotating substrate holder 11, since the inclination of the substrate 13 is limited by a step 14a, the substrate 13 is disengaged from the recess of the step 14a There is no.
[0012]
In the above-described embodiment, the case where the concave portion of the rotating substrate holder has a two-step staircase shape is described. However, the present invention is not limited to this, and the same effect as that of the embodiment can be expected even with a three-step staircase shape.
[0013]
Further, in the above-described embodiment, the case where one concave portion is provided in the rotating substrate holder has been described.
[0014]
As described above in detail, according to the present invention, the concave portion has a stepped shape having at least two steps, so that the size of the concave portion can be prevented from changing due to the repeatedly deposited film or the substrate can be prevented from being contaminated. Can provide.
[Brief description of the drawings]
FIG. 1 is a cross-sectional view of a conventional rotating substrate holder.
FIG. 2 is a cross-sectional view of a rotating substrate holder according to an embodiment of the present invention.
[Explanation of symbols]
11 ... Rotary substrate holder, 12 ... Rotating shaft, 13 ... Substrate,
14 ... concave, 14a, 14b ... step, 15 ... coating .

Claims (1)

被処理物を載置する該被処理物と略同形状の凹部を有し、回転させながら前記被処理物上に被膜を形成する回転基板ホルダーにおいて、
前記凹部は、第1の段差と、この第1の段差の内側に設けられた階段形状の第2の段差を少なくとも有し、
前記第1の段差の高さは前記凹部に載置された前記被処理物の上面位置より高く、
前記第2の段差の前記凹部底面からの高さは前記被処理物の厚みより低くなるようにそれぞれ設定され、
前記被処理物が前記第2の段差側面に接するようにして載置されるように構成されてなることを特徴とする回転基板ホルダー。
In the rotating substrate holder on which the object to be processed is placed , having a concave portion having substantially the same shape as the object to be processed, and forming a film on the object to be processed while being rotated,
The recess has at least a first step and a step-shaped second step provided inside the first step,
The height of the first step is higher than the upper surface position of the object to be processed placed in the recess,
The height of the second step from the bottom surface of the recess is set to be lower than the thickness of the workpiece,
A rotating substrate holder, wherein the workpiece is placed so as to be in contact with the second step side surface.
JP19610596A 1996-07-25 1996-07-25 Rotating substrate holder Expired - Fee Related JP3859774B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19610596A JP3859774B2 (en) 1996-07-25 1996-07-25 Rotating substrate holder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19610596A JP3859774B2 (en) 1996-07-25 1996-07-25 Rotating substrate holder

Publications (3)

Publication Number Publication Date
JPH1036965A JPH1036965A (en) 1998-02-10
JPH1036965A5 JPH1036965A5 (en) 2004-08-05
JP3859774B2 true JP3859774B2 (en) 2006-12-20

Family

ID=16352324

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19610596A Expired - Fee Related JP3859774B2 (en) 1996-07-25 1996-07-25 Rotating substrate holder

Country Status (1)

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JP (1) JP3859774B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6447853B1 (en) 1998-11-30 2002-09-10 Kawasaki Microelectronics, Inc. Method and apparatus for processing semiconductor substrates
CN109183001A (en) * 2018-11-27 2019-01-11 中山德华芯片技术有限公司 A kind of graphite plate applied to epitaxial growth of semiconductor material growth

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JPH1036965A (en) 1998-02-10

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