JP3926780B2 - Ferrite thin film manufacturing method - Google Patents
Ferrite thin film manufacturing method Download PDFInfo
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- JP3926780B2 JP3926780B2 JP2003320692A JP2003320692A JP3926780B2 JP 3926780 B2 JP3926780 B2 JP 3926780B2 JP 2003320692 A JP2003320692 A JP 2003320692A JP 2003320692 A JP2003320692 A JP 2003320692A JP 3926780 B2 JP3926780 B2 JP 3926780B2
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- 229910000859 α-Fe Inorganic materials 0.000 title claims description 56
- 239000010409 thin film Substances 0.000 title claims description 45
- 238000004519 manufacturing process Methods 0.000 title claims description 22
- 239000000758 substrate Substances 0.000 claims description 64
- 238000005192 partition Methods 0.000 claims description 18
- 238000006243 chemical reaction Methods 0.000 claims description 17
- 230000001590 oxidative effect Effects 0.000 claims description 13
- 238000000034 method Methods 0.000 claims description 7
- 239000007800 oxidant agent Substances 0.000 claims description 6
- -1 iron ions Chemical class 0.000 claims description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims 1
- 229910052742 iron Inorganic materials 0.000 claims 1
- 239000000243 solution Substances 0.000 description 29
- 239000010408 film Substances 0.000 description 20
- 239000007787 solid Substances 0.000 description 11
- 239000013078 crystal Substances 0.000 description 10
- 238000007747 plating Methods 0.000 description 9
- 229910000000 metal hydroxide Inorganic materials 0.000 description 7
- CWYNVVGOOAEACU-UHFFFAOYSA-N Fe2+ Chemical compound [Fe+2] CWYNVVGOOAEACU-UHFFFAOYSA-N 0.000 description 6
- 229910001448 ferrous ion Inorganic materials 0.000 description 6
- 150000004692 metal hydroxides Chemical class 0.000 description 6
- 230000003647 oxidation Effects 0.000 description 6
- 238000007254 oxidation reaction Methods 0.000 description 6
- 239000007864 aqueous solution Substances 0.000 description 5
- 239000010419 fine particle Substances 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- WKPSFPXMYGFAQW-UHFFFAOYSA-N iron;hydrate Chemical compound O.[Fe] WKPSFPXMYGFAQW-UHFFFAOYSA-N 0.000 description 4
- 239000012295 chemical reaction liquid Substances 0.000 description 3
- 238000000265 homogenisation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002401 inhibitory effect Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 229910052596 spinel Inorganic materials 0.000 description 1
- 239000011029 spinel Substances 0.000 description 1
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- Compounds Of Iron (AREA)
- Thin Magnetic Films (AREA)
Description
本発明は、磁気記録媒体、光磁気記録媒体、磁気ヘッド、磁気光学素子、マイクロ波素子、磁歪素子、磁気音響素子、及び高周波領域において不要電磁波の干渉によって生じる電磁障害を抑制するために用いられる電磁干渉抑制体などに広く応用されている、スピネル型フェライト薄膜に関する。 The present invention is used to suppress electromagnetic interference caused by interference of unwanted electromagnetic waves in a magnetic recording medium, magneto-optical recording medium, magnetic head, magneto-optical element, microwave element, magnetostrictive element, magnetoacoustic element, and high-frequency region. The present invention relates to a spinel ferrite thin film that is widely applied to electromagnetic interference suppressors and the like.
フェライトめっきとは、例えば、特許文献1に示されているように、固体表面に、金属イオンとして少なくとも第1鉄イオンを含む水溶液を接触させ、固体表面にFeOH+またはこれと他の水酸化金属イオンを吸着させ、続いて吸着したFeOH+を酸化させることによりFeOH2+を得、これが水溶液中の水酸化金属イオンとの間でフェライト結晶化反応を起こし、これによって固体表面にフェライト薄膜を形成することをいう。 For example, as disclosed in Patent Document 1, ferrite plating is performed by bringing a solid surface into contact with an aqueous solution containing at least ferrous ions as metal ions, and contacting the solid surface with FeOH + or another metal hydroxide. FeOH 2+ is obtained by adsorbing ions and subsequently oxidizing the adsorbed FeOH + , which causes ferrite crystallization reaction with metal hydroxide ions in aqueous solution, thereby forming a ferrite thin film on the solid surface To do.
従来、この技術を基にフェライト薄膜の均質化、反応速度の向上を図ったもの特許文献2、固体表面に界面活性を付与して種々の固体にフェライト薄膜を形成しようとするもの特許文献3、フェライト薄膜の形成速度の向上に関するもの特許文献4、特許文献5、及び特許文献6がある。
Conventionally, based on this technology, a ferrite thin film has been homogenized and the reaction rate has been improved.
フェライトめっきは、膜を形成しようとする固体が前述した水溶液に対して耐性があれば何でも良い。更に、水溶液を介した反応であるため、温度が比較的低温(常温〜水溶液の沸点以下)でスピネル型フェライト薄膜を形成できるという特徴がある。そのため、他のフェライト薄膜の作製技術に比べて、基板の限定範囲が小さい。 The ferrite plating may be anything as long as the solid to form a film is resistant to the aqueous solution described above. Furthermore, since the reaction is via an aqueous solution, the spinel-type ferrite thin film can be formed at a relatively low temperature (from room temperature to the boiling point of the aqueous solution). Therefore, the limited range of the substrate is small compared to other ferrite thin film manufacturing techniques.
前述したように、これまで膜の均質化および成膜速度の向上に対して種々の改善が提案されているが、インダクタンス素子、インピーダンス素子、磁気ヘッド、マイクロ波素子、磁歪素子、及び高周波領域における電磁干渉抑制体等への応用という観点からみると軟磁気特性、膜の均質化、成膜速度がまだ不十分であり、そのため、各種電子部品等への応用に関して、大きな課題があった。 As described above, various improvements have been proposed for the homogenization of the film and the improvement of the film forming speed. However, in the inductance element, the impedance element, the magnetic head, the microwave element, the magnetostrictive element, and the high frequency region. From the viewpoint of application to an electromagnetic interference suppressor and the like, soft magnetic characteristics, film homogenization, and film formation speed are still insufficient, and therefore there have been major problems with respect to application to various electronic components and the like.
フェライトめっきによるフェライト薄膜は、前述のように固体表面を基点とした結晶成長によって形成される。従来は、固体表面以外で副次的に生成されたフェライトの微粒子あるいは金属水酸化物等が完全に除去されずに基板表面上に付着し、フェライト薄膜の結晶成長を阻害することによって、また固体表面に吸着するFeOH+の不均一性を引き起こすことによって、膜全体にわたって均質で、かつ優れた軟磁気特性を有するフェライト薄膜を得ることが困難であった。 The ferrite thin film by ferrite plating is formed by crystal growth based on the solid surface as described above. Conventionally, ferrite fine particles or metal hydroxides, etc., which are produced secondary to other than the solid surface, adhere to the substrate surface without being completely removed, and inhibit the crystal growth of the ferrite thin film. By causing non-uniformity of FeOH + adsorbed on the surface, it has been difficult to obtain a ferrite thin film that is homogeneous throughout the film and has excellent soft magnetic properties.
本発明の目的は、懸かる従来の欠点を解消し、生産性を向上し、極めて均質で優れた軟磁気特性を有するフェライト薄膜及びその製造方法を提供することである。 An object of the present invention is to provide a ferrite thin film having a very homogeneous and excellent soft magnetic property, and a method for producing the same, which eliminates the conventional shortcomings and improves productivity.
本発明者等は、種々検討の結果、少なくとも第一鉄イオンを含む反応液を基板に接触させる工程と、反応液を基板から除去する工程と、少なくとも酸化剤を含む酸化液を基板に接触させる工程、および酸化液を基板から除去する工程を繰り返して製膜する際に、基板を回転台に設置した基板ホルダーに載せる、または基板の前方および側面に仕切り板を設けることによって、成膜速度が向上して工業的な生産性が増し、膜を構成する個々の結晶粒が均一な柱状結晶から構成される極めて均質なフェライト薄膜が得られることを見出した。 As a result of various studies, the present inventors have brought a reaction solution containing at least ferrous ions into contact with the substrate, a step of removing the reaction solution from the substrate, and an oxidation solution containing at least an oxidizing agent in contact with the substrate. When the film is formed by repeating the process and the step of removing the oxidizing solution from the substrate, the film formation speed can be increased by placing the substrate on a substrate holder installed on a turntable or by providing partition plates on the front and side surfaces of the substrate. As a result, it was found that industrial productivity was increased, and an extremely homogeneous ferrite thin film in which individual crystal grains constituting the film were composed of uniform columnar crystals was obtained.
本発明によれば、フェライト薄膜の製造方法であって、前記フェライト薄膜を形成させる基板を回転台上面から高さ0.5mm以上の基板ホルダーに載せ、前記回転台の回転軸を挟んで配置されたノズルより少なくとも第一鉄イオンを含む反応液と少なくとも酸化剤を含む酸化液とを前記基板に供給しながら前記回転台を回転させることを特徴とするフェライト薄膜の製造方法が得られる。 According to the present invention, there is provided a method for producing a ferrite thin film, wherein a substrate on which the ferrite thin film is to be formed is placed on a substrate holder having a height of 0.5 mm or more from the upper surface of the turntable, and is arranged with the rotation shaft of the turntable interposed therebetween. A method for producing a ferrite thin film is provided in which the turntable is rotated while supplying a reaction solution containing at least ferrous ions and an oxidizing solution containing at least an oxidizing agent from the nozzle to the substrate .
前記基板の側面にL字型の仕切り板を設け、前記仕切り板のL字型の方向を前記回転台の回転方向に向け、前記仕切り板の高さを0.5mm以上としてもよい。 An L-shaped partition plate may be provided on a side surface of the substrate, the L-shaped direction of the partition plate may be directed to the rotation direction of the turntable, and the height of the partition plate may be 0.5 mm or more .
本発明によれば、少なくとも第一鉄イオンを含む反応液を基板に接触させる工程、反応液を基板から除去する工程、少なくとも酸化剤を含む酸化液を基板に接触させる工程、酸化液を基板から除去する工程を繰り返してフェライトめっき膜を生成する際、基板を回転台上面に設置した基板ホルダーに載せる、または基板の前方および側面に仕切り板を設けることによって、副次的に生成されたフェライト微粒子あるいは金属水酸化物等が、基板表面に付着し均質な結晶成長を阻害することを防ぎ、生成速度を向上して工業的な生産性を増し、均質な柱状結晶の集合体であるフェライト薄膜を得るための製造方法が得られ、工業的な利用価値は大である。 According to the present invention, the step of bringing the reaction solution containing at least ferrous ions into contact with the substrate, the step of removing the reaction solution from the substrate, the step of bringing the oxidation solution containing at least an oxidizing agent into contact with the substrate, and the oxidation solution from the substrate When producing the ferrite plating film by repeating the removing step, ferrite fine particles generated as a result of placing the substrate on a substrate holder placed on the upper surface of the turntable or providing partition plates on the front and side surfaces of the substrate Alternatively, it prevents metal hydroxides from adhering to the substrate surface and hinders homogeneous crystal growth, improves the production rate and increases industrial productivity, and produces a ferrite thin film that is an aggregate of homogeneous columnar crystals. The manufacturing method for obtaining is obtained, and industrial utility value is great.
本発明によれば、生成速度を向上して工業的な生産性を増し、極めて均質で優れた軟磁気特性を有するフェライト薄膜及びその製造方法を提供できる。 ADVANTAGE OF THE INVENTION According to this invention, the production | generation speed | rate can be improved, industrial productivity can be increased, and the ferrite thin film which has a very homogeneous and excellent soft magnetic characteristic, and its manufacturing method can be provided.
本発明のフェライト薄膜及びその製造方法について、以下に説明する。 The ferrite thin film of the present invention and the manufacturing method thereof will be described below.
本発明のフェライト薄膜及びその製造方法は、少なくとも第一鉄イオンを含む反応液を基板に接触させる工程と、反応液を基板から除去する工程と、少なくとも酸化剤を含む酸化液を基板に接触させる工程、および酸化液を基板から除去する工程を繰り返して成膜する際に、基板を回転台上面に設置した基板ホルダーに載せる、または基板の前方および側面に仕切り板を設けるフェライト薄膜の製造方法である。これによって、フェライト薄膜の成膜速度が向上して工業的な生産性が増し、フェライト薄膜を構成する個々の結晶粒が均一な柱状結晶から構成される均質なフェライト薄膜が得られる。 The ferrite thin film and the method for producing the same of the present invention include a step of bringing a reaction liquid containing at least ferrous ions into contact with a substrate, a step of removing the reaction liquid from the substrate, and an oxidation liquid containing at least an oxidizing agent in contact with the substrate. In the method for producing a ferrite thin film, the substrate is placed on a substrate holder installed on the upper surface of the turntable or a partition plate is provided on the front and side surfaces of the substrate when the film is formed by repeating the steps and the step of removing the oxidizing solution from the substrate. is there. As a result, the deposition rate of the ferrite thin film is improved, industrial productivity is increased, and a homogeneous ferrite thin film in which the individual crystal grains constituting the ferrite thin film are composed of uniform columnar crystals can be obtained.
本発明のフェライト薄膜が得られた理由は、以下の通りと考えられる。従来は、固体表面以外で副次的に形成されたフェライトの微粒子あるいは金属水酸化物等が完全に除去されずに基板表面上に付着し、フェライト薄膜の結晶成長を阻害することによって膜全体として均質なフェライト薄膜を得るのが困難であった。 The reason why the ferrite thin film of the present invention was obtained is considered as follows. Conventionally, ferrite fine particles or metal hydroxides, which are formed as a secondary material other than on the solid surface, adhere to the substrate surface without being completely removed, thereby inhibiting the crystal growth of the ferrite thin film as a whole film. It was difficult to obtain a homogeneous ferrite thin film.
本発明のフェライト薄膜の製造方法によれば、上記フェライト薄膜の生成工程において基板を回転台上面に設置した基板ホルダーに載せることにより、あるいは基板の前方および側面に仕切り板を設けることにより、固体表面以外で副次的に形成されたフェライトの微粒子あるいは金属水酸化物等が基板に付着するのを防ぎ、極めて均質なフェライト薄膜を製造できたと考えられる。その際、基板ホルダー及び仕切り板の高さは0.5mm以上とすることによって、固体表面以外で副次的に形成されたフェライトの微粒子あるいは金属水酸化物等の基板への付着を極めて少なくできた。また、仕切り板は回転軸から見て基板前方および回転方向側の基板側面に設置すれば、反応液および酸化液の除去が妨げられない。 According to the method for producing a ferrite thin film of the present invention, a solid surface can be obtained by placing the substrate on a substrate holder installed on the upper surface of the turntable in the production step of the ferrite thin film or by providing partition plates on the front and side surfaces of the substrate. It is considered that the ferrite fine particles or metal hydroxides, etc., which are formed as secondary materials, are prevented from adhering to the substrate, and an extremely homogeneous ferrite thin film can be produced. At that time, by setting the height of the substrate holder and the partition plate to 0.5 mm or more, it is possible to extremely reduce the adhesion of ferrite fine particles or metal hydroxides formed on the substrate other than the solid surface to the substrate. It was. Further, if the partition plate is installed on the front side of the substrate and the side surface of the substrate on the rotation direction side when viewed from the rotation axis, removal of the reaction solution and the oxidizing solution is not hindered.
本発明のフェライト薄膜の形成方法の基本的な部分は、概ね公知の方法と同じである。しかし、本発明では、少なくとも第一鉄イオンを含む反応液を基板に接触させる工程、反応液を基板から除去する工程、少なくとも酸化剤を含む酸化液を基板に接触させる工程、酸化液を基板から除去する工程を繰り返してフェライトめっき膜を生成する際、基板を0.5mm以上の基板ホルダーの上に載せる、あるいは高さ0.5mm以上の仕切り板を設けることによって、生成速度を向上して工業的な生産性を増し、均質な柱状結晶の集合体であるフェライト薄膜が得られる。 The basic part of the method for forming a ferrite thin film of the present invention is almost the same as a known method. However, in the present invention, the step of bringing the reaction solution containing at least ferrous ions into contact with the substrate, the step of removing the reaction solution from the substrate, the step of bringing the oxidation solution containing at least an oxidizing agent into contact with the substrate, and the oxidation solution from the substrate When producing the ferrite plating film by repeating the removing process, the production speed is improved by placing the substrate on a substrate holder of 0.5 mm or more, or providing a partition plate of 0.5 mm or more in height. Thus, a ferrite thin film that is an aggregate of homogeneous columnar crystals can be obtained.
図1は、本発明のフェライト薄膜の概略図である。1は反応液を供給するノズル、2は酸化液を供給するノズルである。また、3は回転台、4は高さ15mmの基板ホルダー、5はフェライト薄膜を形成する基板である。5は基板、6は反応液、酸化液を入れるタンクである。 FIG. 1 is a schematic view of a ferrite thin film of the present invention. Reference numeral 1 denotes a nozzle for supplying a reaction solution, and 2 is a nozzle for supplying an oxidizing solution. 3 is a turntable, 4 is a substrate holder having a height of 15 mm, and 5 is a substrate on which a ferrite thin film is formed. 5 is a substrate, and 6 is a tank for containing a reaction solution and an oxidizing solution.
純水1リットルに対してFeCl2・4H2Oを3.3g、NiCl2・6H2Oを1.25g、ZnCl2を0.025gそれぞれ溶解した反応液を作製した。別の溶液として、純水1リットルに対してNaNO2を0.3g、CH3COONH4を5g溶解した酸化液を作製した。 A reaction solution was prepared by dissolving 3.3 g of FeCl 2 .4H 2 O, 1.25 g of NiCl 2 .6H 2 O, and 0.025 g of ZnCl 2 in 1 liter of pure water. As another solution, an oxidizing solution was prepared by dissolving 0.3 g of NaNO 2 and 5 g of CH 3 COONH 4 in 1 liter of pure water.
フェライト薄膜の作製は、以下の手順で行った。まず、反応液、酸化液の流量を30ml/minに調整した。その後、めっき膜を形成する基板の温度を、ヒータを用いて90℃に調節した。また、めっき装置には窒素ガスを1.5l/minで供給して、非酸化性雰囲気を得た。 The ferrite thin film was produced according to the following procedure. First, the flow rates of the reaction solution and the oxidizing solution were adjusted to 30 ml / min. Then, the temperature of the board | substrate which forms a plating film was adjusted to 90 degreeC using the heater. Further, nitrogen gas was supplied to the plating apparatus at 1.5 l / min to obtain a non-oxidizing atmosphere.
めっき膜の形成は、反応液、酸化液を上記流量にて基板に供給しながら、回転台3を150rpmで回転させながら行った。図中の矢印の方向が回転方向である。めっき膜の形成は、回転台3が1回転することを1サイクルとし、10000サイクル行った。表1に、基板ホルダーを用いていない従来品と基板ホルダーを用いた発明品の特性を示す。 The plating film was formed while rotating the turntable 3 at 150 rpm while supplying the reaction solution and the oxidizing solution to the substrate at the above flow rates. The direction of the arrow in the figure is the direction of rotation. Formation of the plating film was performed for 10,000 cycles, with one rotation of the turntable 3 as one cycle. Table 1 shows the characteristics of a conventional product that does not use a substrate holder and an inventive product that uses the substrate holder.
表1より、発明品が従来品よりも高周波軟磁気特性が優れていることが分かる。 From Table 1, it can be seen that the inventive product is superior in high-frequency soft magnetic properties than the conventional product.
図2は、本発明のフェライト薄膜の製造装置の回転板の上面図である。また、図3は、図2の斜視図である。なお、ノズル及びタンクの構成は実施例1と同じであるため、図には省略した。13はフェライト薄膜を形成する基板であり、回転台11上面に直接載せられているが、回転台の回転軸から見て基板前方および回転方向側の基板側面に高さ15mmの仕切り板12が設けてある。図中の矢印の方向が回転台の回転方向である。表2に、仕切り板を用いていない従来品と仕切り板を用いた発明品の特性を示す。
FIG. 2 is a top view of the rotating plate of the ferrite thin film manufacturing apparatus of the present invention. FIG. 3 is a perspective view of FIG. In addition, since the structure of a nozzle and a tank is the same as Example 1, it abbreviate | omitted to the figure.
表2より、発明品が従来品よりも高周波軟磁気特性が優れていることが分かる。 From Table 2, it can be seen that the inventive product has better high frequency soft magnetic properties than the conventional product.
図1に示すような装置で、基板ホルダー及び仕切り板を用いずに製膜した。その後、取り出した基板の板上には膜が形成されており、SEMを用いた組織観察の結果、膜厚の均一性が著しく劣化していた。また、上記実施例の発明品に示すような優れた高周波軟磁気特性を有する膜は得られなかった。 With the apparatus as shown in FIG. 1, the film was formed without using the substrate holder and the partition plate. Thereafter, a film was formed on the board of the substrate taken out, and as a result of the structure observation using SEM, the uniformity of the film thickness was remarkably deteriorated. In addition, a film having excellent high-frequency soft magnetic characteristics as shown in the inventive products of the above-mentioned examples could not be obtained.
1,2 ノズル
3 回転台
4 基板ホルダー
5 基板
6,7 反応液、酸化液タンク
11 回転台
12 仕切り板
13 基板
1, 2 Nozzle 3 Turntable 4 Substrate holder 5
12 Partition plate
13 Substrate
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| JP2003320692A JP3926780B2 (en) | 2003-09-12 | 2003-09-12 | Ferrite thin film manufacturing method |
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| JP2003320692A JP3926780B2 (en) | 2003-09-12 | 2003-09-12 | Ferrite thin film manufacturing method |
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| Publication Number | Publication Date |
|---|---|
| JP2005093471A JP2005093471A (en) | 2005-04-07 |
| JP3926780B2 true JP3926780B2 (en) | 2007-06-06 |
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| JP2005093471A (en) | 2005-04-07 |
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