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JP4262178B2 - Electric tin plating method - Google Patents
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JP4262178B2 - Electric tin plating method - Google Patents

Electric tin plating method Download PDF

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JP4262178B2
JP4262178B2 JP2004273807A JP2004273807A JP4262178B2 JP 4262178 B2 JP4262178 B2 JP 4262178B2 JP 2004273807 A JP2004273807 A JP 2004273807A JP 2004273807 A JP2004273807 A JP 2004273807A JP 4262178 B2 JP4262178 B2 JP 4262178B2
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plating solution
plating
solution circulation
ion concentration
tin
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照章 中川
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Nippon Steel Corp
Nippon Steel Engineering Co Ltd
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Description

本発明は、不溶性電極を用いた電気錫メッキ方法に関するものである。   The present invention relates to an electrotin plating method using an insoluble electrode.

不溶性電極システムにおける電気錫メッキは、金属錫溶解槽とメッキ液循環槽との間で酸素を溶存させたメッキ液を循環させながら金属錫を溶解する。また、メッキ液循環槽と電解メッキ槽との間でメッキ液を循環して不溶性電極を用いて電気錫メッキする。不溶性電極システムは、溶性電極システムと比較して陽極電極が溶解しないため、陰極のストリップと陽極電極との間隔が一定であるため、メッキ品質が均一であり、かつメッキ用電極を交換する頻度が低いため、要員削減等のメリットがある。   Electrotin plating in an insoluble electrode system dissolves metal tin while circulating a plating solution in which oxygen is dissolved between a metal tin dissolution vessel and a plating solution circulation vessel. Further, the plating solution is circulated between the plating solution circulation tank and the electrolytic plating tank, and electrotin plating is performed using an insoluble electrode. The insoluble electrode system does not dissolve the anode electrode compared to the soluble electrode system, so the distance between the cathode strip and the anode electrode is constant, the plating quality is uniform, and the frequency of replacing the plating electrode is low. Since it is low, there are advantages such as personnel reduction.

一方、不溶性電極システムでは、メッキ液濃度は電流密度、メッキ液温度とともにメッキ成品の光沢と密接な関係があるため、メッキ液中の金属イオン濃度を一定の範囲内に制御する必要がある。特に電気錫メッキの場合は、電気亜鉛メッキと比べて金属イオン濃度管理値が約1/2と狭く、その制御は難しい。   On the other hand, in the insoluble electrode system, the plating solution concentration is closely related to the gloss of the plated product as well as the current density and the plating solution temperature. Therefore, it is necessary to control the metal ion concentration in the plating solution within a certain range. In particular, in the case of electrotin plating, the metal ion concentration management value is as narrow as about 1/2 compared to electrogalvanization, and it is difficult to control.

従来、メッキ液の金属イオン濃度制御方法としては、フィードバック制御により金属イオン濃度を制御する方法が知られている。例えば、特許文献1には、メッキ電流実績値とメッキ時間実績値との積により求まる金属イオン消費実績を補う基準供給流量を求め、メッキ液循環槽の金属イオン濃度の目標値と実績値との差異を補う補正供給流量と合わせたものを、メッキ液循環槽へのメッキ液の供給流量とする技術が開示されている。また、特許文献2には、メッキ液循環槽の金属イオン濃度の目標値と実績値との差異より補給すべき金属イオン量を求め、金属錫溶解槽とメッキ液循環槽との間の循環ラインのメッキ液循環槽への供給流量を前記循環ラインのメッキ液循環槽へ供給されるメッキ液内金属イオン濃度に基づいて決定する技術が開示されている。
特公昭53−24897号公報 特許第2836670号公報
Conventionally, as a method of controlling the metal ion concentration of a plating solution, a method of controlling the metal ion concentration by feedback control is known. For example, in Patent Document 1, a reference supply flow rate that compensates for the metal ion consumption result obtained by the product of the actual plating current value and the actual plating time value is obtained, and the target value and the actual value of the metal ion concentration in the plating solution circulation tank are obtained. A technique is disclosed in which a combined supply flow rate that compensates for the difference is used as a supply flow rate of the plating solution to the plating solution circulation tank. In Patent Document 2, the amount of metal ions to be replenished is determined from the difference between the target value and the actual value of the metal ion concentration in the plating solution circulation tank, and a circulation line between the metal tin dissolution tank and the plating solution circulation tank is obtained. Discloses a technique for determining the supply flow rate to the plating solution circulation tank based on the concentration of metal ions in the plating solution supplied to the plating solution circulation tank of the circulation line.
Japanese Patent Publication No.53-24897 Japanese Patent No. 2836670

しかし、上記特許文献1、2に開示されているメッキ液循環槽の金属イオン濃度制御方法では、フィードバック制御のみに依存し制御している。そのため、金属イオン濃度測定のためのサンプリング時間、流量制御バルブ動作時間、金属イオン濃度測定点からメッキ液循環槽までの配管距離などにより、制御遅れが発生する。   However, the metal ion concentration control method for the plating solution circulation tank disclosed in Patent Documents 1 and 2 is controlled only by feedback control. Therefore, a control delay occurs due to the sampling time for measuring the metal ion concentration, the flow control valve operating time, the piping distance from the metal ion concentration measurement point to the plating solution circulation tank, and the like.

また、オペレータが錫イオン消費量を予測して酸素吹込み量およびメッキ液循環量を調整する方法では、細かな設定変更ができないこともあり、金属イオン濃度を適正範囲に収めることができないのは言うまでもない。   In addition, the method in which the operator predicts the amount of tin ion consumption and adjusts the oxygen blowing amount and the plating solution circulation amount may not allow fine setting changes, and the metal ion concentration cannot be kept within an appropriate range. Needless to say.

本発明が解決しようとする課題は、不溶性電極を用いた電気錫メッキ方法において、錫イオン濃度を精度よく制御する方法を提供することにある。   The problem to be solved by the present invention is to provide a method for accurately controlling the tin ion concentration in an electrotin plating method using an insoluble electrode.

本発明の要旨とするところは、メッキ液循環槽に供給するメッキ液流量を、生産スケジュールより求める一定時間後の錫イオン予定消費速度に基づいて計算するフィードフォワード制御流量と、このフィードフォワード制御流量の計算時点でメッキ液循環槽から電解メッキ槽に供給されるメッキ液の錫イオン濃度の実績値と目標値との差異に基づいて計算するフィードバック制御流量を用いて制御することにある。   The gist of the present invention is that the flow rate of the plating solution supplied to the plating solution circulation tank is calculated based on the expected consumption rate of tin ions after a predetermined time determined from the production schedule, and this feedforward control flow rate. Is controlled using a feedback control flow rate calculated based on the difference between the actual value and the target value of the tin ion concentration of the plating solution supplied from the plating solution circulation tank to the electrolytic plating tank.

すなわち、本発明は、金属錫溶解槽とメッキ液循環槽との間の第1のメッキ液循環ラインで酸素を溶存させたメッキ液にて金属錫を溶解し、メッキ液循環槽と電解メッキ槽との間の第2のメッキ液循環ラインで不溶性電極を用いて電気錫メッキする電気錫メッキ方法において、第1のメッキ液循環ラインでメッキ液循環槽に供給するメッキ液流量を、(1)第1のメッキ液循環ラインでメッキ液循環槽に供給するメッキ液の錫イオン濃度とメッキ液循環槽より電解メッキ槽へ供給するメッキ液の錫イオン濃度目標値と一定時間後の錫イオン予定消費速度とにより決まるフィードフォワード供給流量と、(2)メッキ液循環槽より電解メッキ槽へ供給するメッキ液の錫イオン濃度目標値と錫イオン濃度実績値と循環槽内のメッキ液量と錫イオン濃度の目標値と実績値との差異を何分かけて補正するかという設定値であるメッキ液の錫イオン濃度補正時間とにより決まるフィードバック供給流量と、の和により決定することを特徴とする。 That is, the present invention dissolves metal tin with a plating solution in which oxygen is dissolved in a first plating solution circulation line between the metal tin dissolution vessel and the plating solution circulation vessel, and the plating solution circulation vessel and the electrolytic plating vessel. In the electrotin plating method of electrotin plating using an insoluble electrode in the second plating solution circulation line between the plating solution and the plating solution flow rate supplied to the plating solution circulation tank in the first plating solution circulation line, (1) The tin ion concentration of the plating solution supplied to the plating solution circulation tank in the first plating solution circulation line, the target value of the tin ion concentration of the plating solution supplied from the plating solution circulation tank to the electrolytic plating tank, and the expected consumption of tin ions after a certain time feedforward supply flow rate determined by the speed, (2) plating solution of the plating solution circulating tank from the circulation tank and the tin ion density target value and tin ion concentrations actual value of supplied plating solution into the electrolytic plating bath and tin ions And determining the difference sum of the feedback supply flow rate, determined by the tin ion concentration correction time of the plating solution and a set value of one number of minutes over to correct the target value and the actual value of the degree.

本発明において、前記一定時間は、第1のメッキ液循環ラインで錫イオン濃度を計側後、この錫イオン濃度のメッキ液がメッキ液循環槽へ供給されるまでの時間とすることができる。   In the present invention, the predetermined time may be a time from when the tin ion concentration is measured in the first plating solution circulation line until the plating solution having this tin ion concentration is supplied to the plating solution circulation tank.

本発明による電気錫メッキ方法によれば、錫イオン予定消費速度に応じて錫イオンをメッキ液循環槽に供給(フィードフォワード制御)するとともに、メッキ液循環槽から電解メッキ槽に供給されるメッキ液の錫イオン濃度実績値に応じて錫イオン濃度が目標値になるようにメッキ液循環槽に錫イオンを補給(フィードバック制御)するため、メッキ液循環槽内の錫イオン濃度が安定する。その結果、メッキ条件変更(メッキ厚み変更、板幅変更等)時においても、錫イオン濃度が管理値を外れることによる光沢不良を発生することがない。   According to the electrotin plating method of the present invention, the tin ions are supplied to the plating solution circulation tank according to the expected consumption rate of tin ions (feedforward control), and the plating solution supplied from the plating solution circulation tank to the electrolytic plating tank Since the tin ion is replenished (feedback control) to the plating solution circulation tank so that the tin ion concentration becomes the target value according to the actual value of tin ion concentration, the tin ion concentration in the plating solution circulation tank is stabilized. As a result, even when the plating conditions are changed (plating thickness change, plate width change, etc.), a gloss failure due to the tin ion concentration deviating from the control value does not occur.

以下、本発明について図面を参照して詳細に説明する。   Hereinafter, the present invention will be described in detail with reference to the drawings.

図1は、本発明の電気錫メッキ方法に使用するメッキ装置の例を示す構成図である。同図に示すように、不溶性電極システムにおける電気錫メッキでは、金属錫供給装置2から開閉弁7を介して金属錫粒子3を金属錫溶解槽1に供給し、メッキ液循環槽4との間でメッキ液を循環させながら、酸素吹込みパイプ11から酸素を吹込み、金属錫粒子3を溶解する。溶解した錫イオンは金属錫溶解槽1から沈殿槽14を介してメッキ液循環槽4に供給される(この循環ラインを以下「第1のメッキ液循環ライン8」と称す)。   FIG. 1 is a configuration diagram showing an example of a plating apparatus used in the electrotin plating method of the present invention. As shown in the figure, in the electrotin plating in the insoluble electrode system, the metal tin particles 3 are supplied from the metal tin supply device 2 to the metal tin dissolution tank 1 via the on-off valve 7, and between the plating solution circulation tank 4. Then, while circulating the plating solution, oxygen is blown from the oxygen blowing pipe 11 to dissolve the metal tin particles 3. The dissolved tin ions are supplied from the metal tin dissolution tank 1 to the plating solution circulation tank 4 through the precipitation tank 14 (this circulation line is hereinafter referred to as “first plating solution circulation line 8”).

一方、電解メッキ槽5とメッキ液循環槽4との間ではメッキ液を循環させながら、不溶性電極9を用いてストリップ10に電気錫メッキを行うように構成されている(この循環ラインを以下「第2のメッキ液循環ライン19」と称す)。また、メッキ液循環槽4と電解メッキ槽5との間、メッキ液循環槽4と金属錫溶解槽1との間、金属錫溶解槽1と沈殿槽14との間、沈殿槽14とメッキ液循環槽4との間は、ポンプ6あるいは開閉弁7を介して接続され、メッキ液循環ラインを形成している。   On the other hand, while the plating solution is circulated between the electrolytic plating tank 5 and the plating solution circulation vessel 4, the strip 10 is electroplated with the insoluble electrode 9 (this circulation line is referred to as “ 2nd plating solution circulation line 19 "). Also, between the plating solution circulation tank 4 and the electrolytic plating tank 5, between the plating solution circulation tank 4 and the metal tin dissolution tank 1, between the metal tin dissolution tank 1 and the precipitation tank 14, and the precipitation tank 14 and the plating solution. The circulation tank 4 is connected via a pump 6 or an on-off valve 7 to form a plating solution circulation line.

前述のように不溶性電極システムでは、メッキ液濃度は電流密度、メッキ液温度とともにメッキ成品の光沢の良否と密接な関係があるため、メッキ液中の金属イオン濃度を一定の範囲内に制御する必要がある。特に電気錫メッキの場合は、電気亜鉛メッキと比べて金属イオン濃度管理値が約1/2と狭く、その制御は難しい。   As described above, in the insoluble electrode system, the plating solution concentration is closely related to the current density and plating solution temperature as well as the gloss of the plated product, so the metal ion concentration in the plating solution must be controlled within a certain range. There is. In particular, in the case of electrotin plating, the metal ion concentration management value is as narrow as about 1/2 compared to electrogalvanization, and it is difficult to control.

そこで本発明では、錫イオン供給量を制御する制御装置15を用いて、プロセスコンピュータ等の上位計算機16から生産スケジュールを受け、錫イオン消費予定速度を計算する。そして、錫イオン消費予定速度に見合った錫イオンをメッキ液循環槽4へ供給するため、以下の式(1)にて、まずフィードフォワード制御流量(F0)を決定する。
F0=S/(CA−CB) ・・・(1)
ここで、
F0:フィードフォワード制御流量(第1のメッキ循環ライン8におけるメッキ液循環槽
4への基準流量)(m/min)
S :Td(min)後の錫イオン予定消費速度(kg/min)
生産スケジュール(錫メッキ厚み、板幅、通板速度)により決まる
CA:第1のメッキ液循環ライン8においてメッキ液循環槽4へ供給されるメッキ液の錫
イオン濃度(kg/m
錫イオン濃度計12の実績値
CB:第2のメッキ液循環ライン19においてメッキ液循環槽4から供給されるメッキ液
の錫イオン濃度目標値(kg/m
Td:錫イオン濃度計12にて測定した濃度のメッキ液が、メッキ液循環タンク4へ供給
されるまでの時間(min)
上記の式(1)は、メッキ液循環槽4に出入りするメッキ液の錫イオン濃度差にて錫イオン消費予定速度に見合った錫イオンを補給することを表現したものであり、CA>CBである。
Therefore, in the present invention, using the control device 15 that controls the supply amount of tin ions, the production schedule is received from the host computer 16 such as a process computer and the expected consumption rate of tin ions is calculated. And in order to supply the tin ion suitable for a tin ion consumption scheduled speed to the plating solution circulation tank 4, the feedforward control flow rate (F0) is first determined by the following formula (1).
F0 = S / (CA-CB) (1)
here,
F0: Feed forward control flow rate (reference flow rate to the plating solution circulation tank 4 in the first plating circulation line 8) (m 3 / min)
S: Expected consumption rate of tin ions after Td (min) (kg / min)
CA determined by production schedule (tin plating thickness, plate width, plate passing speed): tin ion concentration (kg / m 3 ) of the plating solution supplied to the plating solution circulation tank 4 in the first plating solution circulation line 8
Actual value CB of tin ion concentration meter 12: Tin ion concentration target value (kg / m 3 ) of the plating solution supplied from the plating solution circulation tank 4 in the second plating solution circulation line 19
Td: Time until the plating solution having the concentration measured by the tin ion concentration meter 12 is supplied to the plating solution circulation tank 4 (min)
The above formula (1) expresses that tin ions corresponding to the expected rate of consumption of tin ions are replenished by the difference in tin ion concentration of the plating solution entering and exiting the plating solution circulation tank 4, and CA> CB is there.

次に、本発明では、上記の式(1)によるフィードフォワード制御流量の計算時点で第2のメッキ液循環ライン19においてメッキ液循環槽4から電解メッキ槽5へ供給するメッキ液の錫イオン濃度実績値と目標値との差異をみて、第1のメッキ液循環ライン8におけるメッキ液循環槽4へのメッキ液供給流量の補正値、すなわちフィードバック制御流量(ΔF)を以下の式(2)〜(4)にて決定する。
ΔC=CB−C ・・・(2)
ΔS=ΔC×V ・・・(3)
ΔF=ΔS/CA/t ・・・(4)
ここで、
ΔC:錫イオン濃度補正値(kg/m
C :第2のメッキ液循環ライン19においてメッキ液循環槽4から供給されるメッキ液
錫イオン濃度(kg/m
錫イオン濃度計18の実績値
ΔS:錫イオン補正量(kg)
V :メッキ液循環槽4内のメッキ液量実績値(m
レベル計13の出力値により求める
ΔF:フィードバック制御流量(第1のメッキ液循環ライン8におけるメッキ液循環槽4
への補正流量)(m/min)
t :補正時間(錫イオン濃度の目標値と実績値との差異を何分かけて、補正するかとい
う設定値)(min)
Next, in the present invention, the tin ion concentration of the plating solution supplied from the plating solution circulation tank 4 to the electrolytic plating tank 5 in the second plating solution circulation line 19 at the time of calculating the feedforward control flow rate according to the above equation (1). Considering the difference between the actual value and the target value, the correction value of the plating solution supply flow rate to the plating solution circulation tank 4 in the first plating solution circulation line 8, that is, the feedback control flow rate (ΔF) is expressed by the following equations (2) to Determine in (4).
ΔC = CB−C (2)
ΔS = ΔC × V (3)
ΔF = ΔS / CA / t (4)
here,
ΔC: Tin ion concentration correction value (kg / m 3 )
C: Plating solution tin ion concentration (kg / m 3 ) supplied from the plating solution circulation tank 4 in the second plating solution circulation line 19
Actual value ΔS of tin ion concentration meter 18: Tin ion correction amount (kg)
V: Actual amount of plating solution in the plating solution circulation tank 4 (m 3 )
ΔF obtained from the output value of the level meter 13: feedback control flow rate (plating solution circulation tank 4 in the first plating solution circulation line 8
Correction flow rate) (m 3 / min)
t: Correction time (set value for how many minutes the difference between the target value and actual value of tin ion concentration is corrected) (min)

次に、本発明では、以下の式(5)のとおり、第1のメッキ液循環ライン8におけるメッキ液循環槽4へのフィードフォワード制御流量(F0)とフィードバック制御流量(ΔF)を加え、メッキ液循環槽4に供給するメッキ液流量(F)を決定し、制御装置15により流量調整弁17を操作して、決定されたメッキ液流量(F)となるように設定する。
F=F0+ΔF ・・・(5)
ここで、
F:第1のメッキ液循環ライン8におけるメッキ液循環槽4への供給流量(メッキ液流量)(m/min)
Next, in the present invention, as shown in the following formula (5), the feed forward control flow rate (F0) and the feedback control flow rate (ΔF) to the plating solution circulation tank 4 in the first plating solution circulation line 8 are added, and plating is performed. The plating solution flow rate (F) to be supplied to the liquid circulation tank 4 is determined, and the control device 15 operates the flow rate adjustment valve 17 to set the determined plating solution flow rate (F).
F = F0 + ΔF (5)
here,
F: Supply flow rate (plating solution flow rate) to the plating solution circulation tank 4 in the first plating solution circulation line 8 (m 3 / min)

以上説明したように、本発明では、プロセスコンピュータ等の上位計算機16より生産スケジュール(錫メッキ厚み、板幅、通板速度)を制御装置15が受け取り、制御装置15にて生産スケジュールより一定時間後の錫イオン予定消費速度を求める。そして、錫イオン予定消費速度に応じて錫イオンをメッキ液循環槽4に供給するメッキ液基準流量を決定(フィードフォワード制御)するとともに、メッキ液循環槽4から電解メッキ槽5に供給されるメッキ液の錫イオン濃度実績値が目標値になるようにメッキ液循環槽4に供給する基準流量を補正(フィードバック制御)する。このため、メッキ液循環槽4内の錫イオン濃度が安定した操業が可能となった。その結果、メッキ条件変更(メッキ厚み変更、板幅変更等)時においても、錫イオン濃度が管理値を外れることによる光沢不良を発生することがない。   As described above, in the present invention, the control device 15 receives the production schedule (tin plating thickness, plate width, plate passing speed) from the host computer 16 such as a process computer, and the control device 15 receives a certain time after the production schedule. Determine the expected consumption rate of tin ions. Then, the plating solution reference flow rate for supplying tin ions to the plating solution circulation tank 4 is determined (feedforward control) according to the expected consumption rate of tin ions, and the plating supplied from the plating solution circulation tank 4 to the electrolytic plating tank 5 is performed. The reference flow rate supplied to the plating solution circulation tank 4 is corrected (feedback control) so that the actual value of tin ion concentration of the solution becomes the target value. For this reason, the operation where the tin ion concentration in the plating solution circulation tank 4 was stabilized became possible. As a result, even when the plating conditions are changed (plating thickness change, plate width change, etc.), a gloss failure due to the tin ion concentration deviating from the control value does not occur.

本発明の電気錫メッキ方法に使用するメッキ装置の例を示す構成図である。It is a block diagram which shows the example of the plating apparatus used for the electrotin plating method of this invention.

符号の説明Explanation of symbols

1 金属錫溶解槽
2 金属錫供給装置
3 金属錫粒子
4 メッキ液循環槽
5 電解メッキ槽
6 ポンプ
7 開閉弁
8 第1のメッキ液循環ライン
9 不溶性電極
10 ストリップ
11 酸素吹込みパイプ
12 錫イオン濃度計
13 レベル計
14 沈殿槽
15 制御装置
16 上位計算機
17 流量調整弁
18 錫イオン濃度計
19 第2のメッキ液循環ライン
DESCRIPTION OF SYMBOLS 1 Metal tin dissolution tank 2 Metal tin supply apparatus 3 Metal tin particle 4 Plating solution circulation tank 5 Electrolytic plating tank 6 Pump 7 On-off valve 8 First plating solution circulation line 9 Insoluble electrode 10 Strip 11 Oxygen blowing pipe 12 Tin ion concentration Total 13 Level meter 14 Sedimentation tank 15 Control device 16 Host computer 17 Flow control valve 18 Tin ion concentration meter 19 Second plating solution circulation line

Claims (2)

金属錫溶解槽とメッキ液循環槽との間の第1のメッキ液循環ラインで酸素を溶存させたメッキ液にて金属錫を溶解し、メッキ液循環槽と電解メッキ槽との間の第2のメッキ液循環ラインで不溶性電極を用いて電気錫メッキする電気錫メッキ方法において、
第1のメッキ液循環ラインでメッキ液循環槽に供給するメッキ液流量を、
第1のメッキ液循環ラインでメッキ液循環槽に供給するメッキ液の錫イオン濃度とメッキ液循環槽より電解メッキ槽へ供給するメッキ液の錫イオン濃度目標値と一定時間後の錫イオン予定消費速度とにより決まるフィードフォワード供給流量と、
メッキ液循環槽より電解メッキ槽へ供給するメッキ液の錫イオン濃度目標値と錫イオン濃度実績値とメッキ液循環槽内のメッキ液量と錫イオン濃度の目標値と実績値との差異を何分かけて補正するかという設定値であるメッキ液の錫イオン濃度補正時間とにより決まるフィードバック供給流量と、
の和により決定することを特徴とする電気錫メッキ方法。
Metal tin is dissolved in a plating solution in which oxygen is dissolved in a first plating solution circulation line between the metal tin dissolution vessel and the plating solution circulation vessel, and a second between the plating solution circulation vessel and the electrolytic plating vessel. In the electrotin plating method of electrotin plating using an insoluble electrode in the plating solution circulation line,
The plating solution flow rate supplied to the plating solution circulation tank in the first plating solution circulation line is
The tin ion concentration of the plating solution supplied to the plating solution circulation tank in the first plating solution circulation line, the target value of the tin ion concentration of the plating solution supplied from the plating solution circulation tank to the electrolytic plating tank, and the expected consumption of tin ions after a certain time The feedforward supply flow rate determined by the speed,
What is the difference between the target value and actual value of tin ion concentration in the plating solution circulation tank and the target value and actual value of the amount of plating solution and tin ion concentration in the plating solution circulation tank supplied to the electrolytic plating tank from the plating solution circulation tank ? A feedback supply flow rate determined by the tin ion concentration correction time of the plating solution, which is a setting value of whether to correct over a minute ,
The method of electrotin plating, characterized in that it is determined by the sum of
前記一定時間を、第1のメッキ液循環ラインで錫イオン濃度を計側後、この錫イオン濃度のメッキ液がメッキ液循環槽へ供給されるまでの時間に設定することを特徴とする請求項1記載の電気錫メッキ方法。   The predetermined time is set to a time until the plating solution having this tin ion concentration is supplied to the plating solution circulation tank after measuring the tin ion concentration in the first plating solution circulation line. 1. The method for electroplating according to 1.
JP2004273807A 2004-09-21 2004-09-21 Electric tin plating method Expired - Fee Related JP4262178B2 (en)

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