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JP4290833B2 - Package for storing semiconductor elements - Google Patents
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JP4290833B2 - Package for storing semiconductor elements - Google Patents

Package for storing semiconductor elements Download PDF

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Publication number
JP4290833B2
JP4290833B2 JP32745699A JP32745699A JP4290833B2 JP 4290833 B2 JP4290833 B2 JP 4290833B2 JP 32745699 A JP32745699 A JP 32745699A JP 32745699 A JP32745699 A JP 32745699A JP 4290833 B2 JP4290833 B2 JP 4290833B2
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JP
Japan
Prior art keywords
external lead
lead terminals
semiconductor element
insulating base
package
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP32745699A
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Japanese (ja)
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JP2001144219A (en
Inventor
幸夫 日高
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
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Kyocera Corp
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Publication date
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Priority to JP32745699A priority Critical patent/JP4290833B2/en
Publication of JP2001144219A publication Critical patent/JP2001144219A/en
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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL

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  • Lead Frames For Integrated Circuits (AREA)

Description

【0001】
【発明の属する技術分野】
本発明は、半導体素子を収容するための半導体素子収納用パッケージに関するものである。
【0002】
【従来の技術】
従来より、半導体集積回路素子等の半導体素子を収容するための半導体素子収納用パッケージとして、ジグザグインライン型の半導体素子収納用パッケージが知られている。
【0003】
このような従来のジグザグインライン型の半導体素子収納用パッケージを図3に断面図で、図4に斜視図で示す。
【0004】
従来のジグザグインライン型の半導体素子収納用パッケージは、図3に示すように、酸化アルミニウム質焼結体等のセラミックスから成る略四角平板で一方の主面に半導体素子Sを収容するための凹部11aを有するとともに、この凹部11a内から一側面近傍の両主面に導出する複数のメタライズ配線導体12が配設された絶縁基体11と、メタライズ配線導体12で絶縁基体11の両主面に導出した部位に銀ろう等のろう材を介してろう付けされ、前記一側面から外部に突出する複数の外部リード端子13と、絶縁基体11の凹部11a側の主面に凹部11aを覆うように取着される蓋体14とから構成されており、凹部11a内に半導体素子Sを収納固定するとともに、この半導体素子Sの各電極をボンディングワイヤWを介してメタライズ配線導体12に電気的に接続し、しかる後、絶縁基体11の凹部11a側主面に蓋体14をろう材や半田・樹脂・ガラス等の封止材を介して取着し、絶縁基体11と蓋体14とから成る容器内部に半導体素子Sを気密に収容することによって製品としての半導体装置となる。
【0005】
なお、この従来の半導体素子収納用パッケージは、図4に示すように、各外部リード端子13が絶縁基体11の一側面近傍の両主面に互いにジグザグの配置となるように二列の並びでろう付けされており、この外部リード端子13の先端部を外部電気回路基板につき立てて実装することにより、半導体装置の外部電気回路基板への高密度実装を可能としている。
【0006】
【発明が解決しようとする課題】
しかしながら、この従来の半導体素子収納用パッケージによると、外部リード端子13が絶縁基体11の一側面近傍の両主面にろう付けされているため、凹部11a側の主面に蓋体14を取着するための領域と外部リード端子13をろう付けするための領域とを両方共に設ける必要があり、その分、絶縁基体11の高さが高いものとなり、半導体装置の実装高さを低くすることが困難であるという問題点を有していた。
【0007】
本発明は、かかる従来技術の問題点に鑑み案出されたものであり、その目的は、絶縁基体の高さを低いものとして、それにより半導体装置の実装高さを低いものとすることが可能な半導体素子収納用パッケージを提供することにある。
【0008】
【課題を解決するための手段】
本発明の半導体素子収納用パッケージは、一方の主面に半導体素子を収容するための凹部が形成されて成る略四角平板状の絶縁基体と、この絶縁基体の前記一方の主面側にろう付けされた第1列の外部リード端子と、絶縁基体の他方の主面側にろう付けされた第2列の外部リード端子と、絶縁基体の前記一方の主面に凹部を覆うように取着される蓋体とを備え、前記第1列の外部リード端子が前記絶縁基体の一側面にろう付けされるとともに前記一側面から突出するように配設され、前記第2列の外部リード端子が前記一側面側の前記他方の主面にろう付けされるとともに前記一側面から突出するように配設されていることを特徴とするものである。
【0009】
本発明の半導体素子収納用パッケージによれば、凹部側の並びの外部リード端子は絶縁基体の一側面にろう付けされていることから、蓋体が取着される凹部側主面に外部リード端子をろう付けするための領域を設ける必要がなく、その分、絶縁基体の高さを低いものとすることができる。
【0010】
【発明の実施の形態】
次に、本発明を添付の図面に基づき詳細に説明する。
【0011】
図1は、本発明の半導体素子収納用パッケージの実施形態の一例を示す断面図であり、1は絶縁基体、2は外部リード端子、3は蓋体である。そして、これらで半導体素子収納用パッケージが構成されている。また、図2は、図1に示す半導体素子収納用パッケージの絶縁基体1および外部リード端子2を示す斜視図である。
【0012】
絶縁基体1は、酸化アルミニウム質焼結体・窒化アルミニウム質焼結体・ムライト質焼結体・炭化珪素質焼結体・窒化珪素質焼結体・ガラスセラミックス等のセラミック材料から成る略四角平板状であり、その一方の主面に半導体素子Sを収容するための凹部1aが形成されており、この凹部1a内には半導体素子Sがろう材・樹脂・ガラス等の接着剤を介して収納固定される。
【0013】
また、絶縁基体1には、凹部1aの内側からそれぞれ絶縁基体1の一側面およびこの一側面近傍で凹部1aと反対側の主面に導出する複数のメタライズ配線導体4が配設されている。
【0014】
メタライズ配線導体4は、タングステンやモリブデン・銅・銀等の金属粉末メタライズから成り、凹部1a内に搭載される半導体素子Sの各電極を外部リード端子2に電気的に接続する導電路として機能する。そして、このメタライズ配線導体4で絶縁基体1の一側面およびこの一側面近傍で凹部1aと反対側の主面に導出した部位には複数の外部リード端子2が銀ろう等のろう材を介して二列の並びでろう付けされており、凹部1a内側部位には凹部1a内に収納される半導体素子Sの各電極がボンディングワイヤWを介して電気的に接続される。
【0015】
なお、このような絶縁基体1は、複数枚のセラミックグリーンシートに適当な打ち抜き加工を施すとともにメタライズ配線導体4となる金属ペーストを所定のパターンに印刷塗布し、次にこれらのセラミックグリーンシートを上下に積層するとともに適当な寸法に切断して絶縁基体1となる生セラミック成形体を得、しかる後、この生セラミック成形体を還元雰囲気中、約1600℃の温度で焼成することによって製作される。
【0016】
また、メタライズ配線導体4で絶縁基体1の一側面およびこの一側面近傍で凹部1aと反対側の主面に導出した部位に二列の並びでろう付けされた外部リード端子2は、鉄−ニッケル合金や鉄−ニッケル−コバルト合金等の金属から成り、それぞれ絶縁基体1の両主面側において、絶縁基体1の一側面から外部に向けて突出するように配設されている。
【0017】
この外部リード端子2は、凹部1a内に収納される半導体素子Sの各電極を外部電気回路に電気的に接続するための接続端子として機能し、その突出した側の先端部を外部電気回路基板の配線導体に半田等を介して接続することにより半導体素子Sの各電極が外部電気回路に電気的に接続されることとなる。
【0018】
なお、このような外部リード端子2は、鉄−ニッケル合金の板材に打ち抜き加工を施すとともに、凹部1a側の並びの外部リード端子2の場合には更に折り曲げ加工を施すことによって所定の形状に形成される。
【0019】
また、外部リード端子2を絶縁基体1にろう付けするには、メタライズ配線導体4で絶縁基体1の一側面およびこの一側面近傍で凹部1aと反対側の主面に導出した部位に外部リード端子2の一端部をメタライズ配線導体4との間に例えば箔状のろう材を挟んで当接させるとともに、これらをろう材の融点以上の温度に加熱することによりメタライズ配線導体4と外部リード端子2とをろう付けする方法が採用される。なお、このようなろう付けの際には、各外部リード端子2のろう付け部と反対側の端部を図示しないタイバーにより各列毎に一体的に連結しておくことが望ましい。外部リード端子2を各列毎にタイバーで連結しておくことによって、各外部リード端子2を一定の間隔で保持して絶縁基体1に対して正確にろう付けするこが容易となる。なお、そのようなタイバーはパッケージの内部に半導体素子Sを収納して半導体装置となした後に切断除去すればよい。
【0020】
そして、本発明においては、これらの二列の並びの外部リード端子2のうち、凹部1a側の並びの外部リード端子2が絶縁基体1の一側面にろう付けされており、凹部1aと反対側の並びの外部リード端子2が凹部1aと反対側の主面にろう付けされていることが重要である。凹部1a側の並びの外部リード端子2が絶縁基体1の一側面にろう付けされていることから、絶縁基体1の凹部1a側の主面には外部リード端子2をろう付けするための領域を設ける必要がなく、その分、絶縁基体1の高さを低いものとなすことができる。その結果、この半導体素子収納用パッケージを使用した半導体装置の実装高さを低いものとなすことができる。また、凹部1aと反対側の並びの外部リード端子2は、凹部1aと反対側の主面にろう付けされていることから、凹部1a側の並びの外部リード端子2を絶縁基体1の一側面にろう付けするのに対して障害となることがない。
【0021】
なお、絶縁基体1の両主面と外部リード端子2が突出する側の側面との間の角部に0.1 〜1mm程度の大きさの面取り加工を施すとともに、この面取り部にそれぞれ対応する側のメタライズ配線導体4の一部が延在するようにしておくと、面取り部と外部リード端子2との間にろう材の溜まりが形成されて外部リード端子2の絶縁基体1に対するろう付け強度を大きなものとすることができる。従って、絶縁基体1の両主面と外部リード端子2が突出する側の側面との間の角部には0.1 〜1mm程度の面取り加工を施すとともに、この面取り部にそれぞれ対応する側のメタライズ配線導体4の一部を延在させておくことが好ましい。さらにこの場合、凹部1a側の面取り部に延在させるメタライズ配線導体4は、蓋体3や封止材によるメタライズ配線導体4間の電気的な短絡等を防止するために凹部1a側主面から0.05mm以上離した位置まで延在させることが好ましい。また、凹部1aと反対側の面取り部に延在させるメタライズ層4は、外部リード端子2の絶縁基体1に対する被着強度を更に強固とするために、絶縁基体1の側面で凹部1a側の並びのメタライズ配線導体4から0.05mm以上離間した位置でまで延出させてもよい。
【0022】
かくして、本発明の半導体素子収納用パッケージによれば、凹部1a側の並びの外部リード端子2が絶縁基体1の一側面にろう付けされており、凹部1aと反対側の並びの外部リード端子2が凹部1aと反対側の主面にろう付けされていることで、絶縁基体1の高さが低いものとなり、その結果、半導体装置の外部電気回路基板に対する実装高さを低いものとすることができる。
【0023】
【発明の効果】
本発明の半導体素子収納用パッケージによれば、凹部側の並びの外部リード端子は絶縁基体の一側面にろう付けされていることから、蓋体が取着される凹部側主面に外部リード端子をろう付けするための領域を設ける必要がなく、その分、絶縁基体の高さを低いものとすることができ、その結果、半導体装置の外部電気回路基板に対する実装高さを低いものとすることができる。
【図面の簡単な説明】
【図1】本発明の半導体素子収納用パッケージの実施形態の一例を示す断面図である。
【図2】図1に示す半導体素子収納用パッケージの絶縁基体および外部リード端子の斜視図である。
【図3】従来の半導体素子収納用パッケージの断面図である。
【図4】図3に示す半導体素子収納用パッケージの絶縁基体および外部リード端子の斜視図である。
【符号の説明】
1・・・・・・絶縁基体
1a・・・・・・凹部
2・・・・・・外部リード端子
3・・・・・・蓋体
4・・・・・・メタライズ配線導体
S・・・・・・半導体素子
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a package for housing a semiconductor element for housing a semiconductor element.
[0002]
[Prior art]
2. Description of the Related Art Conventionally, a zigzag inline type semiconductor element housing package is known as a semiconductor element housing package for housing a semiconductor element such as a semiconductor integrated circuit element.
[0003]
Such a conventional zigzag inline type semiconductor element housing package is shown in a sectional view in FIG. 3 and in a perspective view in FIG.
[0004]
As shown in FIG. 3, the conventional zigzag inline type semiconductor element housing package is a substantially rectangular flat plate made of ceramics such as an aluminum oxide sintered body and has a recess 11a for housing the semiconductor element S on one main surface. And an insulating base 11 provided with a plurality of metallized wiring conductors 12 led out to both main surfaces near one side surface from the inside of the recess 11a, and the metalized wiring conductors 12 led out to both main surfaces of the insulating base 11. A plurality of external lead terminals 13 that are brazed to a part via a brazing material such as silver brazing and are projected so as to cover the concave portion 11a on the main surface of the insulating base 11 on the concave portion 11a side. The semiconductor element S is housed and fixed in the recess 11a, and each electrode of the semiconductor element S is electrically connected to the metallized wiring conductor 12 via bonding wires W. Thereafter, the lid 14 is attached to the main surface of the insulating base 11 on the recess 11a side through a sealing material such as brazing material, solder, resin, glass, etc., and the inside of the container composed of the insulating base 11 and the lid 14 is placed. By housing the semiconductor element S in an airtight manner, a semiconductor device as a product is obtained.
[0005]
In this conventional semiconductor element storage package, as shown in FIG. 4, the external lead terminals 13 are arranged in two rows so that they are arranged in a zigzag manner on both main surfaces near one side surface of the insulating base 11. The semiconductor device is mounted on the external electric circuit board with high density by brazing and mounting the tip of the external lead terminal 13 upright on the external electric circuit board.
[0006]
[Problems to be solved by the invention]
However, according to this conventional package for housing semiconductor elements, the external lead terminals 13 are brazed to both main surfaces near one side surface of the insulating base 11, so that the lid 14 is attached to the main surface on the concave portion 11a side. It is necessary to provide both a region for soldering and a region for brazing the external lead terminal 13, and accordingly, the height of the insulating base 11 is high, which can reduce the mounting height of the semiconductor device. It had the problem of being difficult.
[0007]
The present invention has been devised in view of the problems of the prior art, and its purpose is to reduce the height of the insulating substrate, thereby reducing the mounting height of the semiconductor device. Another object is to provide a package for housing a semiconductor element.
[0008]
[Means for Solving the Problems]
The package for housing a semiconductor element according to the present invention includes a substantially rectangular flat plate-like insulating base formed with a recess for receiving a semiconductor element on one main surface, and brazing the one main surface side of the insulating base. The first row of external lead terminals, the second row of external lead terminals brazed to the other main surface side of the insulating base, and the one main surface of the insulating base are attached so as to cover the recesses. And the first row of external lead terminals are brazed to one side surface of the insulating base and disposed so as to protrude from the one side surface, and the second row of external lead terminals are disposed on the side surfaces of the insulating base. It is characterized in that it is brazed to the other main surface on one side and is disposed so as to protrude from the one side .
[0009]
According to the semiconductor element storage package of the present invention, the external lead terminals arranged on the concave side are brazed to one side surface of the insulating base, so that the external lead terminals are provided on the concave side main surface to which the lid is attached. There is no need to provide a region for brazing, and the height of the insulating base can be reduced accordingly.
[0010]
DETAILED DESCRIPTION OF THE INVENTION
Next, the present invention will be described in detail with reference to the accompanying drawings.
[0011]
FIG. 1 is a cross-sectional view showing an example of an embodiment of a package for housing a semiconductor element of the present invention, wherein 1 is an insulating substrate, 2 is an external lead terminal, and 3 is a lid. These constitute a semiconductor element storage package. FIG. 2 is a perspective view showing the insulating base 1 and the external lead terminals 2 of the semiconductor element storage package shown in FIG.
[0012]
The insulating substrate 1 is a substantially rectangular flat plate made of a ceramic material such as an aluminum oxide sintered body, an aluminum nitride sintered body, a mullite sintered body, a silicon carbide sintered body, a silicon nitride sintered body, or a glass ceramic. A concave portion 1a for accommodating the semiconductor element S is formed on one main surface thereof, and the semiconductor element S is accommodated in the concave portion 1a via an adhesive such as a brazing material, resin, or glass. Fixed.
[0013]
The insulating base 1 is provided with a plurality of metallized wiring conductors 4 led out from the inside of the recess 1a to one side surface of the insulating base 1 and the main surface opposite to the recess 1a in the vicinity of the one side surface.
[0014]
The metallized wiring conductor 4 is made of metal powder metallized such as tungsten, molybdenum, copper, or silver, and functions as a conductive path that electrically connects each electrode of the semiconductor element S mounted in the recess 1a to the external lead terminal 2. . A plurality of external lead terminals 2 are connected to a side surface of the insulating substrate 1 by the metallized wiring conductor 4 and a main surface opposite to the concave portion 1a in the vicinity of the one side surface through a brazing material such as silver brazing. The electrodes of the semiconductor element S housed in the recess 1a are electrically connected to the inner portion of the recess 1a via bonding wires W.
[0015]
In addition, such an insulating substrate 1 is obtained by performing a suitable punching process on a plurality of ceramic green sheets and printing and applying a metal paste to be a metallized wiring conductor 4 in a predetermined pattern. The green ceramic molded body to be the insulating base 1 is obtained by laminating the ceramic ceramic and the green ceramic molded body, and then the green ceramic molded body is fired at a temperature of about 1600 ° C. in a reducing atmosphere.
[0016]
Further, the external lead terminals 2 brazed in two rows to the portion led out to one side surface of the insulating base 1 by the metallized wiring conductor 4 and the main surface opposite to the concave portion 1a in the vicinity of the one side surface are made of iron-nickel. It consists of metals, such as an alloy and an iron-nickel-cobalt alloy, and is arrange | positioned so that it may protrude toward the exterior from the one side surface of the insulation base | substrate 1 in the both main surface sides of the insulation base | substrate 1, respectively.
[0017]
The external lead terminal 2 functions as a connection terminal for electrically connecting each electrode of the semiconductor element S accommodated in the recess 1a to an external electric circuit, and the tip portion on the protruding side is an external electric circuit board. Each electrode of the semiconductor element S is electrically connected to an external electric circuit by being connected to the wiring conductor via solder or the like.
[0018]
Such external lead terminals 2 are formed into a predetermined shape by punching an iron-nickel alloy plate material and further bending the external lead terminals 2 arranged on the recess 1a side. Is done.
[0019]
Further, in order to braze the external lead terminal 2 to the insulating base 1, the external lead terminal is connected to a portion led out to one side of the insulating base 1 by the metallized wiring conductor 4 and the main surface opposite to the recess 1a in the vicinity of the one side. For example, a foil brazing material is sandwiched between and abutted between the metallized wiring conductor 4 and heated to a temperature equal to or higher than the melting point of the brazing material. The method of brazing is adopted. In such brazing, it is desirable that the end of each external lead terminal 2 opposite to the brazed portion is integrally connected to each row by a tie bar (not shown). By connecting the external lead terminals 2 with tie bars for each row, it becomes easy to accurately braze the external lead terminals 2 to the insulating substrate 1 while holding the external lead terminals 2 at a constant interval. Such a tie bar may be cut and removed after the semiconductor element S is accommodated in the package to form a semiconductor device.
[0020]
In the present invention, of these two rows of external lead terminals 2, the external lead terminals 2 arranged on the concave portion 1a side are brazed to one side surface of the insulating base 1, and are opposite to the concave portion 1a. It is important that the external lead terminals 2 arranged in the above are brazed to the main surface opposite to the concave portion 1a. Since the external lead terminals 2 arranged side by side on the concave portion 1a are brazed to one side surface of the insulating base 1, a region for brazing the external lead terminals 2 on the main surface on the concave portion 1a side of the insulating base 1 is provided. There is no need to provide it, and the height of the insulating substrate 1 can be reduced accordingly. As a result, the mounting height of the semiconductor device using the semiconductor element housing package can be reduced. Further, since the external lead terminals 2 arranged on the side opposite to the concave portion 1a are brazed to the main surface on the side opposite to the concave portion 1a, the external lead terminals 2 arranged on the side opposite to the concave portion 1a are connected to one side surface of the insulating base 1. There is no obstacle to brazing.
[0021]
A chamfering process having a size of about 0.1 to 1 mm is applied to the corners between both main surfaces of the insulating substrate 1 and the side surface on the side from which the external lead terminal 2 protrudes, and the chamfered portions corresponding to the chamfered portions are respectively provided. If a part of the metallized wiring conductor 4 is extended, a brazing material pool is formed between the chamfered portion and the external lead terminal 2 to increase the brazing strength of the external lead terminal 2 to the insulating substrate 1. Can be. Accordingly, chamfering of about 0.1 to 1 mm is performed on the corners between both main surfaces of the insulating base 1 and the side surfaces from which the external lead terminals 2 protrude, and the metallized wiring on the side corresponding to each of the chamfered portions. It is preferable to extend a part of the conductor 4. Further, in this case, the metallized wiring conductor 4 extending to the chamfered portion on the concave portion 1a side is separated from the main surface of the concave portion 1a side in order to prevent an electrical short circuit between the metalized wiring conductors 4 due to the lid 3 or the sealing material. It is preferable to extend to a position separated by 0.05 mm or more. Further, the metallized layer 4 extending to the chamfered portion on the side opposite to the concave portion 1a is arranged on the side surface of the insulating substrate 1 on the side of the concave portion 1a in order to further strengthen the adhesion strength of the external lead terminals 2 to the insulating substrate 1. The metallized wiring conductor 4 may be extended to a position separated by 0.05 mm or more.
[0022]
Thus, according to the package for housing semiconductor elements of the present invention, the external lead terminals 2 arranged on the recess 1a side are brazed to one side surface of the insulating base 1, and the external lead terminals 2 arranged on the opposite side to the recess 1a. Is brazed to the main surface on the side opposite to the recess 1a, the height of the insulating base 1 becomes low, and as a result, the mounting height of the semiconductor device relative to the external electric circuit board may be lowered. it can.
[0023]
【The invention's effect】
According to the semiconductor element storage package of the present invention, the external lead terminals arranged on the concave side are brazed to one side surface of the insulating base, so that the external lead terminals are provided on the concave side main surface to which the lid is attached. Therefore, it is not necessary to provide a region for brazing, and accordingly, the height of the insulating base can be reduced, and as a result, the mounting height of the semiconductor device with respect to the external electric circuit board can be reduced. Can do.
[Brief description of the drawings]
FIG. 1 is a cross-sectional view showing an example of an embodiment of a package for housing a semiconductor element of the present invention.
2 is a perspective view of an insulating base and external lead terminals of the package for housing a semiconductor element shown in FIG. 1. FIG.
FIG. 3 is a cross-sectional view of a conventional package for housing semiconductor elements.
4 is a perspective view of an insulating base and external lead terminals of the package for housing a semiconductor element shown in FIG. 3. FIG.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ... Insulation base | substrate 1a ... Recessed part 2 ... External lead terminal 3 ... Lid body 4 ... Metallized wiring conductor S ... ... Semiconductor elements

Claims (1)

一方の主面に半導体素子を収容するための凹部が形成されて成る略四角平板状の絶縁基体と、該絶縁基体の前記一方の主面側にろう付けされた第1列の外部リード端子と、前記絶縁基体の他方の主面側にろう付けされた第2列の外部リード端子と、前記絶縁基体の前記一方の主面に前記凹部を覆うように取着される蓋体とを備え、前記第1列の外部リード端子が前記絶縁基体の一側面にろう付けされるとともに前記一側面から突出するように配設され、前記第2列の外部リード端子が前記一側面側の前記他方の主面にろう付けされるとともに前記一側面から突出するように配設されていることを特徴とする半導体素子収納用パッケージ。And one major surface recess for housing a semiconductor element on the formation which are substantially rectangular flat plate-like insulating substrate comprising, brazed first row outer leads of the main surface side of the front SL one of the insulating substrate terminal and the second column external lead terminals of brazed to the other main surface side of the insulating substrate, wherein the lid which the are attached so as to cover the recess on one main surface of the insulating substrate The first row of external lead terminals are brazed to one side surface of the insulating base and are disposed so as to protrude from the one side surface, and the second row external lead terminals are disposed on the one side surface side. A package for housing a semiconductor element, characterized in that it is brazed to the other main surface and disposed so as to protrude from the one side surface .
JP32745699A 1999-11-17 1999-11-17 Package for storing semiconductor elements Expired - Fee Related JP4290833B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32745699A JP4290833B2 (en) 1999-11-17 1999-11-17 Package for storing semiconductor elements

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Application Number Priority Date Filing Date Title
JP32745699A JP4290833B2 (en) 1999-11-17 1999-11-17 Package for storing semiconductor elements

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JP2001144219A JP2001144219A (en) 2001-05-25
JP4290833B2 true JP4290833B2 (en) 2009-07-08

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