JP4551164B2 - 測定装置 - Google Patents
測定装置 Download PDFInfo
- Publication number
- JP4551164B2 JP4551164B2 JP2004261844A JP2004261844A JP4551164B2 JP 4551164 B2 JP4551164 B2 JP 4551164B2 JP 2004261844 A JP2004261844 A JP 2004261844A JP 2004261844 A JP2004261844 A JP 2004261844A JP 4551164 B2 JP4551164 B2 JP 4551164B2
- Authority
- JP
- Japan
- Prior art keywords
- measurement point
- measurement
- heads
- axis
- head
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02049—Interferometers characterised by particular mechanical design details
- G01B9/0205—Interferometers characterised by particular mechanical design details of probe head
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/025—Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0181—Memory or computer-assisted visual determination
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Geometry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Quality & Reliability (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Description
12 X軸用フレーム
14 Y軸用フレーム
16 基台
18 測定テーブル
20、22 ヘッド
24 X軸駆動部
26 Y軸駆動部
28 Z軸駆動部
30、32 PC
42 フラットパネル
44 液晶モニタ
54 カメラ
60、62 Z軸サーボモータ
74、76 Y軸サーボモータ
Claims (1)
- 2つのヘッドの移動領域に配置された被測定物に対する複数の測定ポイントの位置情報を機械座標に変換する座標変換手段と、前記座標変換手段により座標変換された各測定ポイントの座標を基に、複数の測定ポイントの中から原点に最も近い測定ポイントを1番目の測定ポイントに決定し、以下順次未測定の測定ポイントの中から1つ前の測定ポイントに最も近い測定ポイントを前記2つのヘッドのうちの一方のヘッドの測定ポイントとして決定して測定順序を設定する第1の測定ポイント設定手段と、前記第1の測定ポイント設定手段により設定された各測定ポイントごとに、前記複数の測定ポイントの中から、前記2つのヘッドのうちの他方のヘッドの最大駆動範囲内に存在し、かつ、前記第1の測定ポイント設定手段により設定された各測定ポイントからの距離が、前記第1の測定ポイント設定手段により設定された各測定ポイントへの前記他方のヘッドの近接を許容する最小距離よりも遠い位置に存在する測定ポイントを1つ抽出し、該抽出された測定ポイントを前記第1の測定ポイント手段により設定された各測定ポイントと対応づけて前記他方のヘッドの測定ポイントとして設定する第2の測定ポイント設定手段とを備える測定装置。
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004261844A JP4551164B2 (ja) | 2004-09-09 | 2004-09-09 | 測定装置 |
| KR1020040094529A KR101186420B1 (ko) | 2004-09-09 | 2004-11-18 | 측정장치의 제어방법 |
| CNB2005100042804A CN100498214C (zh) | 2004-09-09 | 2005-01-05 | 测量装置的控制方法 |
| TW094100318A TWI335416B (en) | 2004-09-09 | 2005-01-06 | Control method of measuring apparatus and recording medium for recording measurement point distribution program |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004261844A JP4551164B2 (ja) | 2004-09-09 | 2004-09-09 | 測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2006078303A JP2006078303A (ja) | 2006-03-23 |
| JP4551164B2 true JP4551164B2 (ja) | 2010-09-22 |
Family
ID=36157893
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004261844A Expired - Fee Related JP4551164B2 (ja) | 2004-09-09 | 2004-09-09 | 測定装置 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP4551164B2 (ja) |
| KR (1) | KR101186420B1 (ja) |
| CN (1) | CN100498214C (ja) |
| TW (1) | TWI335416B (ja) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4875900B2 (ja) * | 2006-02-06 | 2012-02-15 | オリンパス株式会社 | 複数ヘッド顕微鏡装置および複数ヘッド顕微鏡装置の制御方法 |
| JP5319063B2 (ja) * | 2006-11-30 | 2013-10-16 | 株式会社日立国際電気 | 線幅測定装置 |
| JP2008209295A (ja) * | 2007-02-27 | 2008-09-11 | Hitachi Kokusai Electric Inc | 寸法測定装置 |
| KR101007861B1 (ko) * | 2008-09-26 | 2011-01-18 | 조영신 | 열 영상 촬영장치 및 촬영방법 |
| JP5349122B2 (ja) * | 2009-04-14 | 2013-11-20 | 株式会社ミツトヨ | 同期移動装置および画像測定装置 |
| JP2011099812A (ja) * | 2009-11-09 | 2011-05-19 | Sokkia Fine System:Kk | 二次元座標測定機 |
| KR101225805B1 (ko) * | 2012-02-28 | 2013-01-23 | 주식회사 커미조아 | 토크 피드백을 이용하여 겐트리 장치의 틸트를 보정하는 방법 및 이를 이용한 겐트리 장치 |
| US9600089B2 (en) * | 2014-10-03 | 2017-03-21 | Adobe Systems Incorporated | Optical digital ruler |
| CN111089538A (zh) * | 2020-01-03 | 2020-05-01 | 博众精工科技股份有限公司 | 用于铆接的铆钉视觉检测装置及方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62165106A (ja) * | 1986-01-17 | 1987-07-21 | Kobe Steel Ltd | 形状測定装置 |
| JP2533101B2 (ja) * | 1987-01-20 | 1996-09-11 | 株式会社 ヒューテック | 寸法測定装置 |
| JP2889083B2 (ja) * | 1993-06-25 | 1999-05-10 | 株式会社ソキア | 二次元座標測定機 |
| JPH07174519A (ja) * | 1993-12-21 | 1995-07-14 | Toyota Motor Corp | 基板の電子部品実装状態検査装置における撮像カメラ制御装置 |
| JP3442163B2 (ja) * | 1994-10-11 | 2003-09-02 | 富士通株式会社 | 位置合わせ方法および装置 |
| JPH09101115A (ja) * | 1995-10-04 | 1997-04-15 | Nikon Corp | 画像測定装置 |
| JPH1047940A (ja) | 1996-08-05 | 1998-02-20 | Saginomiya Seisakusho Inc | 測定プレート、ホイールアラインメント測定装置及びホイールアラインメント測定方法 |
| JPH10170223A (ja) * | 1996-12-14 | 1998-06-26 | Ricoh Co Ltd | 位置決めシステム及び位置決め方法 |
| JPH10213423A (ja) | 1997-01-27 | 1998-08-11 | Suzuki Motor Corp | 三次元形状の計測装置及び計測方法 |
| US20040086166A1 (en) * | 2002-11-01 | 2004-05-06 | Photon Dynamics, Inc. | Method and apparatus for flat patterned media inspection |
-
2004
- 2004-09-09 JP JP2004261844A patent/JP4551164B2/ja not_active Expired - Fee Related
- 2004-11-18 KR KR1020040094529A patent/KR101186420B1/ko not_active Expired - Fee Related
-
2005
- 2005-01-05 CN CNB2005100042804A patent/CN100498214C/zh not_active Expired - Lifetime
- 2005-01-06 TW TW094100318A patent/TWI335416B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR20060023505A (ko) | 2006-03-14 |
| TW200609494A (en) | 2006-03-16 |
| CN1746612A (zh) | 2006-03-15 |
| JP2006078303A (ja) | 2006-03-23 |
| KR101186420B1 (ko) | 2012-09-27 |
| CN100498214C (zh) | 2009-06-10 |
| TWI335416B (en) | 2011-01-01 |
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