JP4568623B2 - Short detection device - Google Patents

Description

  The present invention relates to a short detection device that detects the position of a short portion between a pair of opposed flat plate electrodes.

As this type of short detection device, the present inventor has already proposed a short detection device described in Japanese Patent Laid-Open No. 2003-215190. In this short detection device, the current supply section supplies a current between a predetermined portion of one flat plate electrode and a predetermined portion of the other flat plate electrode of a pair of flat plate electrodes arranged to face each other. In the state, the voltage measuring unit measures and detects each potential difference between a plurality of measurement positions defined on one plate electrode and one reference point defined on one plate electrode in a predetermined pattern. The unit calculates each voltage gradient between each measurement position and another measurement position adjacent in a predetermined direction based on each potential difference measured by the voltage measurement unit. Based on this, the measurement position that becomes the voltage minimum point is detected as the position of the shorted portion between the pair of plate electrodes. Therefore, in this short detection device, even if there are a plurality of short portions between a pair of flat plate electrodes, it is possible to detect the positions of the plurality of short portions only by measuring the potential difference once at a plurality of measurement positions. It is possible.
JP 2003-215190 A (page 4-7, FIG. 1)

  By the way, there is a request to further improve the measurement accuracy of the position of the shorted portion, and in order to satisfy the request, each voltage gradient between each measurement position and another measurement position adjacent in a predetermined direction is set. There is a need for more accurate measurements. For this reason, it is necessary to measure each potential difference between a plurality of measurement positions and one reference point more accurately. In this case, when the potentials at a plurality of measurement positions and reference points are in a steady state (a state that does not change), each potential difference between the plurality of measurement positions and one reference point can be measured more accurately. As the electric charges are accumulated between the pair of plate electrodes, each potential first rises rapidly in the first period T1, and then slowly increases while the increase rate decreases little by little in the subsequent period T2. And rise. For this reason, even if it is period T2 with few changes, it will not be in a steady state. Even in such a situation, if all potential differences between a plurality of measurement positions and one reference point can be measured in a very short time, measurement can be performed in a state where each potential does not change (steady state). Therefore, each potential difference can be measured more accurately.

  However, when measuring each potential difference, the voltage measurement unit specifies a measurement position one by one from a plurality of measurement positions according to a predetermined order, and specifies the specified measurement position and one reference point. Measure the potential difference between. For this reason, a certain amount of time is required for the voltage measuring unit to measure all the potential differences between the plurality of measurement positions and one reference point. That is, it is difficult to measure each potential difference between a plurality of measurement positions and one reference point in a very short time. Therefore, it is difficult to measure all potentials at a plurality of measurement positions and one reference point in a steady state (or a state substantially equivalent to the steady state). It is difficult to more accurately measure each potential difference. As a result, there is a problem that it is difficult to further improve the measurement accuracy of the position of the short portion.

  The present invention has been made to solve such a problem, and a main object of the present invention is to provide a short detection device capable of detecting the position of a short portion more accurately.

  In order to achieve the above object, a short detection device according to claim 1 is a short detection device for detecting a position of a short portion between a pair of opposed flat plate electrodes, the short detection device comprising: A current supply section for supplying a current between a predetermined portion of one flat plate electrode and a predetermined portion of the other flat plate electrode; a plurality of measurement positions defined on the one flat plate electrode in a predetermined pattern; A first order preset for each measurement position and a second order opposite to the first order for each potential difference from one reference point defined on one plate electrode A voltage measuring unit for measuring each according to the two orders, and calculating an average value of the potential differences for the measurement positions respectively measured according to the two orders, and calculating the average value based on the calculated average value. And a detector for detecting the measurement position to be over preparative point.

  The short detection device according to claim 2 is the short detection device according to claim 1, wherein the detection unit calculates each voltage gradient between each measurement position and another measurement position adjacent in a predetermined direction. The measurement position which is calculated based on the calculated average value and becomes a voltage minimum point based on the calculated voltage gradient is detected as the position of the short portion.

  According to the short detection device of claim 1, the detection unit detects a measurement position that becomes a short point based on an average value of each potential difference for each measurement position measured according to the first and second orders. Thus, since the average value at each measurement position can be calculated as a value that does not depend on the order of measurement, the short position between the pair of plate electrodes can be detected more accurately.

  According to the short detection device of claim 2, the pair of flat plate electrodes is detected by detecting the measurement position as the voltage minimum point based on the voltage gradient calculated based on the potential difference obtained by the detection unit as the short position. Even if there are a plurality of short portions between them, the positions of the plurality of short portions (short positions) can be reliably detected by measuring the potential difference once for each measurement position.

  Hereinafter, the best mode of a short detection device according to the present invention will be described with reference to the accompanying drawings.

  First, the configuration of the short detection device 1 will be described with reference to FIGS.

  As shown in FIG. 1, the short detection device 1 includes a current supply unit 2, a voltage measurement unit 3, a drive mechanism 4, an arithmetic control unit (detection unit in the present invention) 5, a display unit 6, a plurality of probes (voltage detection). Terminals) 7, 7... And a support plate 8, and when a short-circuit portion exists between the pair of flat plate electrodes EL 1 and EL 2 disposed in the fuel cell, it is within the plane of the pair of flat plate electrodes EL 1 and EL 2. The position of the short portion (hereinafter also referred to as “short position”) can be detected. In this example, it is assumed that the plate electrodes EL1 and EL2 are formed in rectangular shapes having the same size as an example. The electrolyte membrane ELF interposed between the flat plate electrodes EL1 and EL2 is electrically conductive when it is actually disposed in the fuel cell, but is dry and insulative in the state of the short position detection object. ing.

  The current supply unit 2 is a predetermined portion (current supply point) A in one plate electrode EL1 of the pair of plate electrodes EL1 and EL2 arranged to face each other with the electrolyte membrane ELF interposed therebetween under the control of the arithmetic control unit 5. A constant DC current is supplied between the first flat electrode EL2 and a predetermined portion (current supply point) B of the other plate electrode EL2. In this embodiment, the current supply points A and B are respectively set at one opposing corner of the plate electrodes EL1 and EL2 (as an example, the lower left corner in FIG. 2).

  The voltage measuring unit 3 measures each potential difference between a predetermined part (for example, the current supply point A) of the flat plate electrode EL1 as a reference point and each part where each probe 7 is brought into contact with each other, thereby obtaining voltage data. Output as Dv. In this case, as shown in FIG. 2, the measurement positions MP with which the probe 7 is brought into contact are, as an example of the predetermined pattern in the present invention, a total of 121 (MP ( i, j): i = 1, 2, 3,..., 9, a, b, j = 1, 2, 3,..., 9, a, b. "It is also referred to as"). Correspondingly, the same number of probes 7 as the number of intersection positions are arranged in parallel with the plate electrode EL1 in a matrix on the same plane so as to correspond to each intersection position. It is attached to the support plate 8. In addition, the voltage measurement unit 3 calculates each potential difference from the reference point (current supply point A) of each measurement position MP defined in a matrix in a state where each probe 7 is in contact with each corresponding measurement position MP. The measurement is performed in either one of the first order and the second order that are determined in advance. In this case, the first order refers to MP (1, 1), MP (1, 2),..., MP (1, a), MP (in the horizontal direction (row direction) in FIG. 1, b), MP (2, 1),..., MP (b, a), MP (b, b), the order from MP (1, 1) to MP (b, b). . On the other hand, the second order is an order that reverses the first order, and MP (b, b), MP (b, a),..., MP (b, 2), MP (b, 1), MP (a, b),..., MP (1, 2), MP (1, 1) The order of reaching MP (1, 1) from MP (b, b).

  The drive mechanism 4 includes an arm 4a for supporting a support plate 8 to which a plurality of probes 7 are attached. By moving the arm 4a up and down to move the support plate 8 to and away from the plate electrode EL1, All probes 7 are simultaneously brought into contact with corresponding measurement positions MP on the plate electrode EL1.

  The arithmetic control unit 5 controls the current supply unit 2, the voltage measurement unit 3, and the drive mechanism 4. In addition, the arithmetic control unit 5 performs first and second short position detection processing based on the voltage data Dv output from the voltage measurement unit 3 to detect a short position between the plate electrodes EL1 and EL2. . In addition, the calculation control unit 5 causes the display unit 6 to display the result of short position detection by the calculation control unit 5.

  Next, short detection processing between the pair of flat plate electrodes EL1 and EL2 by the short detection device 1 will be described with reference to FIGS. As an example, a short position detection processing operation when there is a short at the measurement position MP (6, 8) indicated by a black circle in FIG. 2 will be described. It is assumed that the pair of flat plate electrodes EL1 and EL2 disposed so as to face each other with the electrolyte membrane ELF interposed therebetween is previously disposed at the position (measurement position) shown in FIG.

  First, as shown in FIG. 4, the arithmetic control unit 5 controls the drive mechanism 4 to bring each probe 7 attached to the support plate 8 into contact with each measurement position MP on the surface of the corresponding plate electrode EL1 ( Step 31). Subsequently, the arithmetic control unit 5 operates the discharge circuit (not shown) to discharge the charges charged in the plate electrodes EL1 and EL2 (step 32).

  Next, the arithmetic control unit 5 executes a short position detection process (step 33). In this processing, as shown in FIG. 5, the arithmetic control unit 5 operates the current supply unit 2 at a constant current, so that the current supply point A between the plate electrode EL1 and the current supply point B of the plate electrode EL2 is operated. Supply of DC constant current is started (step 41). Next, the arithmetic control unit 5 scans the voltage measuring unit 3 by scanning the voltage measuring unit 3 in the first half of the period T4 after the predetermined time T3 has elapsed from the start of the supply of the DC constant current by the current supplying unit 2 (see FIG. 3). Measurement of first voltage data Dv1 (hereinafter also referred to as “voltage data Dv1”) for each measurement position MP on the surface of the electrode EL1 is executed (step 42). Specifically, the voltage measurement unit 3 sequentially scans each probe 7 at a predetermined time interval T11 in accordance with the first order, and the potential difference between the reference point (current supply point A) and each measurement position MP. (Voltage at each measurement position MP with reference to the potential at the reference point) is measured, and the measured potential difference at each measurement position MP is output to the arithmetic control unit 5 as voltage data Dv1. The arithmetic control unit 5 sequentially captures the voltage data Dv1, and stores the captured voltage data Dv1 in the internal memory in association with the position of the measurement position MP.

  Subsequently, in the second half of the period T4 (see FIG. 3), the arithmetic control unit 5 scans the voltage measuring unit 3 to perform second voltage data Dv2 (hereinafter, “voltage” for each measurement position MP on the surface of the plate electrode EL1. Measurement of data Dv2 "is also executed (step 43). Specifically, the voltage measuring unit 3 sequentially scans each probe 7 at the interval of the above time T11 in accordance with the second order to determine the potential difference between the reference point (current supply point A) and each measurement position MP. The measured potential difference at each measurement position MP is output to the arithmetic control unit 5 as voltage data Dv2. The arithmetic control unit 5 sequentially captures the voltage data Dv2, and stores the captured voltage data Dv2 in the internal memory in association with the position of the measurement position MP.

  Next, the arithmetic control unit 5 calculates the voltage distribution on the surface of the plate electrode EL1 based on the voltage data Dv1 and Dv2 stored in the internal memory (step 44). Specifically, the arithmetic control unit 5 reads the voltage data Dv1, Dv2 for each measurement position MP from the internal memory, and calculates the average value Dave of the voltage data Dv1, Dv2. Further, the arithmetic control unit 5 sequentially stores the calculated average value Dave as the final potential difference at each measurement position MP in association with the position of the measurement position MP in the internal memory. As an example, the average value Dave is stored in the internal memory in a matrix format corresponding to the measurement position MP (i, j) (in this example, a matrix format of 11 rows and 11 columns). Further, the arithmetic control unit 5 stores the average value Dave for all the measurement positions MP in the internal memory, and then stops the constant current operation of the current supply unit 2 and operates the discharge circuit (not shown). The charges charged in the plate electrodes EL1 and EL2 are discharged.

In calculating the average value Dave (final potential difference at each measurement position MP), the potential V (V) at one point on the surface of the plate electrode EL1 is expressed by the following formula (1) in the period T2 shown in FIG. It is expressed as a linear function.
V = F + Gt (1)
Here, F and G are constants and are different for each position on the surface of the plate electrode EL1. Further, t means an elapsed time (sec) from the start of the supply of the DC constant current by the current supply unit 2. Therefore, for example, when the time required to measure the voltage data Dv1 (Dv2) for one measurement position MP is Δt, this measurement when measuring the voltage data Dv1 for the Nth measurement position MP in the first order is performed. The potential V (= V _N ) at the position MP is represented by the following formula (2).
V _N = F _N + G _N × N × Δt (2)
Further, the potential V (= V _A ) at the reference point (current supply point A) at this time is expressed by the following formula (3).
V _A = F _A + G _A × N × Δt (3)
Therefore, the voltage data Dv1 for the Nth measurement position MP is expressed by the following equation (4) by subtracting the above equation (3) from the above equation (2).
Dv1 = V _N −V _A
= F _N + G _N × N × Δt− (F _A + G _A × N × Δt) (4)

The voltage data Dv2 for the measurement position MP at which the voltage data Dv1 is measured Nth in the first order is the first voltage data Dv1 when the total number of measurement positions MP is M (121 in this example). The (2 × M−N + 1) th measurement is performed. Therefore, the potential V (= V _N ) at the measurement position MP when measuring the voltage data Dv2 for the Nth measurement position MP in the first order is expressed by the following equation (5).
V _N = F _N + G _N × (2 × M−N + 1) × Δt (5)
Further, the potential V (= V _A ) at the reference point (current supply point A) at this time is expressed by the following formula (6).
V _A = F _A + G _A × (2 × M−N + 1) × Δt (6)
Accordingly, the voltage data Dv2 for the Nth measurement position MP is expressed by the following equation (7) by subtracting the above equation (6) from the above equation (5).
Dv2 = V _N −V _{A
= F N + G N × (} 2 × M-N + 1) × Δt- (F A + G A × (2 × M-N + 1) × Δt) ··· (7)

The average value Dave for the measurement position MP at which the voltage data Dv1 is measured Nth in the first order is expressed by the following equation (8) using the above equations (4) and (7). expressed.
Dave = (Dv1 + Dv2) / 2
= (F _N + G _N × N × Δt− (F _A + G _A × N × Δt) + F _N
+ G _N × (2 × M−N + 1) × Δt− (F _A + G _A × (2 × M−N + 1) × Δt)) / 2
= (2 × F _N + 2 × G _N × (M + 1) × Δt− (2 × F _A + 2 × G _A × (M + 1) × Δt)) / 2
= F _N + G _N × (M + 1) × Δt− (F _A + G _A × (M + 1) × Δt) (8)
Therefore, as is clear from the above equation (8), the average value Dave does not include N which is a parameter indicating the order. For this reason, the final potential difference (average value Dave) at each measurement position MP is calculated as a value that does not depend on the order of measurement. That is, the final potential difference (average value Dave) at each measurement position MP is equivalently measured in a steady state in which each potential difference between the plurality of measurement positions MP and the reference point does not change according to the order. It will be.

  After completing the calculation of the average value Dave for all the measurement positions MP, the arithmetic control unit 5 calculates the voltage gradient Vs (Vs1, Vs2) between the adjacent measurement positions MP, MP (step 45). Specifically, first, the arithmetic control unit 5 searches for the maximum value (value in which the absolute value is the maximum) among all the average values Dave, and sets the average value for which the searched maximum value is −100 for each average. The normalized data Ds is obtained by executing it on the value Dave, and the obtained normalized data Ds is set in a matrix format corresponding to the measurement position MP (i, j) in the same manner as the average value Dave (11 rows in this example). 11-column matrix form) is stored in the internal memory. Next, the arithmetic control unit 5 determines the voltage between the adjacent measurement positions MP and MP based on the difference between the normalized data Ds between the measurement positions MP and MP adjacent in the predetermined direction and the distance L between them. The gradient Vs is calculated. As an example, the arithmetic control unit 5 firstly standardizes data of the measurement position MP in which the voltage gradient Vs1 between the measurement positions MP adjacent to each other along the horizontal direction (row direction) in FIG. Calculation is based on Ds. Specifically, the arithmetic control unit 5 calculates the voltage gradient Vs1 with reference to the normalized data Ds of the measurement position MP positioned in the left direction. That is, the arithmetic control unit 5 subtracts the normalized data Ds of the measurement position MP (i, j) on the left side from the normalized data Ds of the measurement position MP (i, j + 1), and divides this subtracted value by the distance L. Thus, the voltage gradient Vs1 is obtained and stored in the internal memory in a matrix format (in this example, a matrix format of 10 rows and 10 columns corresponding to the values (i, j)). Further, the arithmetic control unit 5 uses the standardized data Ds of the measurement position MP positioned in a predetermined direction as the voltage gradient Vs2 between the measurement positions MP adjacent to each other along the vertical direction (column direction) in FIG. Calculate as Specifically, the arithmetic control unit 5 calculates the voltage gradient Vs2 with reference to the normalized data Ds of the measurement position MP located in the downward direction. That is, the arithmetic control unit 5 subtracts the normalized data Ds of the lower measurement position MP (i, j) from the normalized data Ds of the measurement position MP (i + 1, j), and divides this subtraction value by the distance L. Thus, the voltage gradient Vs2 is obtained and stored in the internal memory in a matrix format (in this example, a matrix format of 10 rows and 10 columns corresponding to the values (i, j)).

  Next, the arithmetic control unit 5 detects the measurement position MP (short position) that is the voltage minimum point based on the voltage gradients Vs1 and Vs2 (step 46). Specifically, the arithmetic control unit 5 sequentially searches, for example, from the left direction to the right direction for each row with respect to the voltage gradient Vs1 stored in the matrix format, and the measurement position where the polarity of the voltage gradient Vs1 is inverted. While detecting MP (measurement position MP which becomes a voltage minimum point), the voltage gradient Vs2 stored in the matrix format is sequentially searched, for example, from the lower direction to the upper direction for each column, and the polarity of the voltage gradient Vs2 Is detected, and the measurement position MP detected as a short position in both the horizontal and vertical search is specified as the final short position.

  In this case, when the potential at the current supply point A is higher than the potential at the current supply point B, the current supplied from the current supply point A flows from the current supply point A to the short position on the plate electrode EL1. For this reason, the normalized data Ds of the specific measurement position MP closest to the short position is the smallest among the voltage data Dv for the plurality of measurement positions MP located around the short position. Therefore, it is calculated based on the difference obtained by subtracting the normalized data Ds of the measurement position MP located on the left side of the specific measurement position MP from the normalized data Ds of the specific measurement position MP and the distance L. The polarity of the voltage gradient Vs1 is always negative, and the difference and distance obtained by subtracting the standardized data Ds of the specific measurement position MP from the standardized data Ds of the measurement position MP located immediately to the right of the specific measurement position MP. The polarity of the voltage gradient Vs1 calculated based on L is always positive. Similarly, calculation is performed based on the difference obtained by subtracting the normalized data Ds of the measurement position MP located immediately below the specific measurement position MP from the normalized data Ds of the specific measurement position MP and the distance L. The polarity of the applied voltage gradient Vs1 is always negative, and the difference obtained by subtracting the normalized data Ds of the specific measurement position MP from the normalized data Ds of the measurement position MP located immediately above the specific measurement position MP. The polarity of the voltage gradient Vs1 calculated based on the distance L is always positive. Therefore, when the potential at the current supply point A is higher than the potential at the current supply point B, the arithmetic control unit 5 sequentially searches for the voltage gradient Vs1 from the left direction to the right direction for each row. A measurement position MP at which the polarity of the voltage gradient Vs1 changes from negative polarity to positive polarity is detected. Further, the voltage gradient Vs2 is sequentially searched from the lower direction to the upper direction for each column, and the measurement position MP where the polarity of the voltage gradient Vs2 changes from the negative polarity to the positive polarity is detected.

  On the other hand, when the potential at the current supply point A is lower than the potential at the current supply point B, conversely, current flows into the plate electrode EL1 from the plate electrode EL2 side through the short position. For this reason, among the voltage data Dv of the plurality of measurement positions MP located around the short position on the plate electrode EL1, the standardized data Ds of the specific measurement position MP closest to the short position is the largest. As a result, the polarities of the voltage gradients Vs1 and Vs2 between the four measurement positions MP adjacent to the specific measurement position MP in the left-right direction and the vertical direction and the specific measurement position MP are as follows. The polarity is opposite to that when the potential is higher than the potential at the supply point B. Therefore, when the potential at the current supply point A is lower than the potential at the current supply point B, the arithmetic control unit 5 sequentially searches for the voltage gradient Vs1 from the left direction to the right direction for each row. Then, the measurement position MP where the polarity of the voltage gradient Vs1 changes from the positive polarity to the negative polarity is detected. Further, for the voltage gradient Vs2, for example, the search is sequentially performed from the lower direction to the upper direction for each column, and the measurement position MP where the polarity of the voltage gradient Vs2 changes from the positive polarity to the negative polarity is detected. In this case, since the potential at the current supply point A is higher than the potential at the current supply point B, the arithmetic control unit 5 detects the measurement position MP that changes from the negative polarity to the positive polarity with respect to the voltage gradients Vs1 and Vs2. To do.

  In this example, since the plate electrodes EL1 and EL2 are short-circuited at the measurement position MP (6, 8), the sixth row (i = 10) in the 10 × 10 matrix format with respect to the voltage gradient Vs1. 6), the voltage gradient Vs1 in the seventh column (voltage gradient Vs1 between the seventh column and the eighth column in FIG. 2) has a negative polarity, and the voltage gradient Vs1 in the eighth column (the eighth column in FIG. 2). And the voltage gradient Vs1) between the 9th column becomes positive polarity. Therefore, the calculation control unit 5 detects the measurement position MP (6, 8) as a voltage minimum point related to the voltage gradient Vs1, and sets the measurement position MP (6, 8) as a short position candidate. For the voltage gradient Vs2, in the eighth column (j = 8) in the 10 × 10 matrix format, the voltage gradient Vs2 in the fifth row (between the fifth and sixth rows in FIG. 2). The voltage gradient Vs2) has a negative polarity, and the voltage gradient Vs2 of the sixth row (the voltage gradient Vs2 between the sixth and seventh rows in FIG. 2) has a positive polarity. Therefore, the arithmetic control unit 5 detects the measurement position MP (6, 8) as a voltage minimum point related to the voltage gradient Vs2, and sets the measurement position MP (6, 8) as a short position candidate. The arithmetic control unit 5 compares the detection result of the voltage minimum point (short position) along two different directions (right and left direction and vertical direction perpendicular to each other), and the measurement position MP (6, 8) is searched in both directions. Since both are detected as a short position, this measurement position MP (6, 8) is specified as the final short position.

  Next, the calculation control unit 5 displays information (position and number information) on the measurement position MP (6, 8) that is the detected voltage minimum point on the display unit 6 (step 47), and ends the short position detection process. To do. Although the measurement position MP itself that is the voltage minimum point is not necessarily a short position because of the resolution of the measurement position, at least the measurement position MP that is the voltage minimum point is an actual short circuit among all the measurement positions MP. Closest to the location. Therefore, by specifying the measurement position MP detected as the short position in both directions of search as the short position, the actual short position that is present in the immediate vicinity of the measurement position MP is substantially specified.

  Finally, as shown in FIG. 4, the arithmetic control unit 5 controls the drive mechanism 4 in step 34 to separate each probe 7 from the flat plate electrode EL1. This completes all short inspections.

  Thus, according to the short detection device 1, a predetermined time is required for the measurement of the voltage data Dv1 and Dv2 for each measurement position MP, and the potentials of the measurement positions MP and the reference point (current supply point A). Even when V fluctuates with the elapsed time as shown in FIG. 3, the voltage measurement unit 3 uses the first voltage data Dv1 (potential difference) for each measurement position MP set in advance for each measurement position MP. The measurement position is measured in order and the voltage data Dv2 (potential difference) for each measurement position MP is measured in the second order, and the measurement control unit 5 measures each measurement position according to the first order and the second order. By calculating the average value Dave of the voltage data Dv1 and Dv2 for MP as the final potential difference, the final potential difference (average value Dave) at each measurement position MP is calculated. It can be calculated as being influenced by values not in constant order. That is, the final potential difference (average value Dave) at each measurement position MP is measured in a state where there is equivalently no shift in measurement time (equivalently at the same time), that is, in a steady state that does not change according to the order. It will be. Therefore, the arithmetic control unit 5 can more accurately detect the short position between the plate electrodes EL1 and EL2 based on the final potential difference (average value Dave) at each measurement position MP.

  Further, according to the short detection device 1, the measurement position MP that becomes the voltage minimum point based on the voltage gradients Vs1 and Vs2 calculated based on the final potential difference (average value Dave) at each measurement position MP is set as the short position. By detecting, even if there are a plurality of short locations between the plate electrodes EL1 and EL2, the positions of the plurality of short locations (short positions) can be assured by measuring the potential difference once for each measurement position MP. Can be detected.

  In addition, this invention is not limited to said structure, It can change suitably. For example, the short detection device 1 described above employs a configuration in which a plurality of probes 7 are arranged corresponding to a plurality of measurement positions MP, but each measurement position MP is sequentially brought into contact with each measurement position MP. A configuration for measuring the potential difference at the position MP can also be adopted. According to this configuration, although the time until the short position is specified becomes long, the configuration of the short detection device 1 can be simplified, and as a result, the device cost can be reduced. Further, in the short detection device 1, the voltage minimum point is detected based on the voltage gradients Vs1 and Vs2 along the left, right, and upper and lower directions, and the short position is specified, but based on the voltage gradient along the oblique direction. It is also possible to adopt a configuration in which the short position is specified by detecting the voltage minimum point. Further, it is also possible to adopt a configuration in which the short position is detected based on both the left and right, upper and lower voltage gradients Vs1, Vs2 and the diagonal voltage gradient. According to this configuration, the detection accuracy of the short position can be further increased.

  The short detection device 1 employs a configuration in which the short position is detected based on the voltage gradients Vs1 and Vs2 along two different directions to improve the detection accuracy. However, when priority is given to the detection speed over the detection accuracy. The short position can also be detected based only on the voltage gradient Vs along one direction. The short detection device 1 employs a configuration that calculates the voltage gradients Vs1 and Vs2 based on the normalized data Ds obtained by standardizing the voltage data Dv measured by the voltage measuring unit 3. It is also possible to adopt a configuration that directly calculates the voltage gradients Vs1 and Vs2 from the voltage data Dv.

  Further, in the short detection device 1, a plurality of measurement positions MP, MP,... With which the probe 7 is brought into contact are defined on the plate electrode EL1 in a matrix pattern as shown in FIG. It is also possible to arrange each measurement position MP on a regular pattern by arranging polygons such as parallelograms and regular hexagons adjacent to each other and making each measurement position MP correspond to the vertex of each polygon. . Further, the short detection device 1 employs a configuration in which the reference point at the time of measurement of the voltage data Dv by the voltage measurement unit 3 is set to the current supply point A in the plate electrode EL1, but this reference point is used as the current supply point A. It can also be set to any point different from. The short detection device 1 detects the short position based on the presence or absence of the minimum point, but instead of the presence or absence of the minimum point, the measurement position MP having the lowest voltage data Dv (or standardized data Ds) is short-circuited. A configuration for detecting the position can also be adopted.

  Moreover, although the example which detects the short position between flat electrode EL1, EL2 in a fuel cell was demonstrated, this invention can be applied effectively also to the short position detection with respect to between a pair of flat plate electrodes in another field | area. The short detection device 1 employs a configuration in which the current supply unit 2 and the voltage measurement unit 3 are provided separately. For example, the current supply unit 2 is arranged as a DC constant current source in the voltage measurement unit 3. And connecting the current supply unit 2 and the current supply point B in the voltage measurement unit 3 as shown by a one-dot chain line, and one of the plurality of probes 7 is used for current supply to the current supply unit 2. By connecting, it is also possible to adopt a configuration in which a DC constant current is supplied from the voltage measuring unit 3 between the plate electrodes EL1, EL2.

1 is a configuration diagram showing a configuration of a short detection device 1. FIG. It is a top view of the support plate 8 in the state where the some probe 7 was attached. FIG. 6 is a characteristic diagram showing temporal changes in potentials V at a plurality of measurement positions MP and a reference point (current supply point A). 3 is a flowchart of a short detection process in the short detection device 1. It is a flowchart of the short position detection process shown in FIG.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Short detection apparatus 2 Current supply part 3 Voltage measurement part 4 Drive mechanism 5 Calculation control part (detection part in this invention)
7 Probe A, B Current supply point (predetermined part in the plate electrodes EL1, EL2)
Dave average value EL1, EL2 Plate electrode MP Measurement position

Claims (2)

A short detection device for detecting a position of a short portion between a pair of opposed flat plate electrodes,
A current supply section for supplying a current between a predetermined portion of one of the pair of flat plate electrodes and a predetermined portion of the other flat plate electrode;
Each potential difference between a plurality of measurement positions defined on the one plate electrode in a predetermined pattern and one reference point defined on the one plate electrode is set in advance for each measurement position. A voltage measuring unit for measuring according to both the first order and the second order opposite to the first order,
A detection unit that calculates an average value of the potential differences for the measurement positions that are respectively measured according to the two orders and detects the measurement position that is the shorted portion based on the calculated average value. Short detection device.   The detection unit calculates each voltage gradient between each measurement position and another measurement position adjacent in a predetermined direction based on the calculated average value, and based on the calculated voltage gradient. The short detection device according to claim 1, wherein the measurement position that is a voltage minimum point is detected as the position of the short portion.

Images