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JP4657154B2 - Electromagnetic induction type inspection method and electromagnetic induction type inspection device - Google Patents
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JP4657154B2 - Electromagnetic induction type inspection method and electromagnetic induction type inspection device - Google Patents

Electromagnetic induction type inspection method and electromagnetic induction type inspection device Download PDF

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JP4657154B2
JP4657154B2 JP2006160918A JP2006160918A JP4657154B2 JP 4657154 B2 JP4657154 B2 JP 4657154B2 JP 2006160918 A JP2006160918 A JP 2006160918A JP 2006160918 A JP2006160918 A JP 2006160918A JP 4657154 B2 JP4657154 B2 JP 4657154B2
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JP2007327905A (en
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文男 畑田
道雄 栗原
眞 植平
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Tsubakimoto Chain Co
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Description

本発明は、検査すべき物品が磁界を通過することによる磁束の変化を検出し、その検出結果に基づいて物品の良否を検査する電磁誘導型検査方法及び電磁誘導型検査装置に関する。   The present invention relates to an electromagnetic induction inspection method and an electromagnetic induction inspection apparatus that detect a change in magnetic flux caused by an article to be inspected passing through a magnetic field and inspect the quality of the article based on the detection result.

交流磁界中に物品を置くか通過させるかした場合、交流磁界中の物品によって磁束に変化が生じ、その交流磁界中に置かれたコイルに誘導される起電圧(誘導電圧)の値が変化する。このような現象を利用した電磁誘導式の物品検査装置(電磁誘導型検査装置)が数多く提案されている(特許文献1〜5参照)。電磁誘導型検査装置では、コイルでの誘導電圧を表す検出信号に基づいて、物品の検査を行うことによって、物品の形状または材質の異常、物品に混入した金属、物品表面の傷などを検知している。   When an article is placed in or passed through an AC magnetic field, the magnetic flux changes due to the article in the AC magnetic field, and the value of the electromotive voltage (induced voltage) induced in the coil placed in the AC magnetic field changes. . Many electromagnetic induction type article inspection apparatuses (electromagnetic induction type inspection apparatuses) using such a phenomenon have been proposed (see Patent Documents 1 to 5). An electromagnetic induction inspection device detects an abnormality in the shape or material of an article, metal mixed in the article, scratches on the article surface, etc. by inspecting the article based on a detection signal representing an induced voltage in a coil. ing.

図5は、このような電磁誘導型検査装置21の基本構成を示すブロック図である。励磁コイル22aは、励磁回路部23によって所定の周波数(励磁周波数)の高周波電圧を印加されて磁界を発生させる。検出コイル22bは、検査すべき物品(以下、ワークという)が励磁コイル22aによって発生した磁界を通過することによる磁束の変化に応じた誘導電圧を生じ、検出部24は、検出コイル22bに生じた誘導電圧に対応するアナログ信号(検出信号)を出力する。   FIG. 5 is a block diagram showing the basic configuration of such an electromagnetic induction type inspection apparatus 21. The excitation coil 22a is applied with a high frequency voltage of a predetermined frequency (excitation frequency) by the excitation circuit unit 23 to generate a magnetic field. The detection coil 22b generates an induced voltage corresponding to a change in magnetic flux caused by an article to be inspected (hereinafter referred to as a workpiece) passing through the magnetic field generated by the excitation coil 22a, and the detection unit 24 is generated in the detection coil 22b. An analog signal (detection signal) corresponding to the induced voltage is output.

位相検波部25は、検出部24が出力した検出信号を用い、励磁回路部23の交流電圧に対応するアナログ信号(交流電圧信号)に同期して位相検波を行い、位相検波後の信号を検査部26ヘ出力する。検査部26は、位相検波部25からの出力信号に基づいてワークの検査を行う。   The phase detection unit 25 uses the detection signal output from the detection unit 24 to perform phase detection in synchronization with an analog signal (AC voltage signal) corresponding to the AC voltage of the excitation circuit unit 23, and inspects the signal after phase detection To the unit 26. The inspection unit 26 inspects the workpiece based on the output signal from the phase detection unit 25.

例えば、検出コイル22bを励磁コイル22aの内側に配置して、検出コイル22bと励磁コイル22aとを同軸的に一体化した構成をなす磁気センサを用いる場合には、励磁コイル22aによる励起磁束の全てに検出コイル22bが鎖交するので、極めて高い効率で検出コイル22bに相互インダクタンスが起こり、大きな誘導電圧が発生する。そして、複数のワークを順次検査する際には、検査対象の各ワークを一つずつ検出コイル22bの内側を通過させ、通過中の位相検波部25からの出力信号のピーク値またはボトム値に応じて、検査部26にてワークの良否を検査する。
特許第3140105号公報 特開平6−201653号公報 特開昭60−78378号公報 特開昭59−138946号公報 特許第3625911号公報
For example, when using a magnetic sensor in which the detection coil 22b is disposed inside the excitation coil 22a and the detection coil 22b and the excitation coil 22a are integrated coaxially, all of the excitation magnetic flux generated by the excitation coil 22a is used. Since the detection coil 22b is linked to each other, mutual inductance occurs in the detection coil 22b with extremely high efficiency, and a large induced voltage is generated. Then, when sequentially inspecting a plurality of workpieces, each workpiece to be inspected is passed through the inside of the detection coil 22b one by one, and according to the peak value or bottom value of the output signal from the phase detector 25 that is passing through Then, the inspection unit 26 inspects the quality of the workpiece.
Japanese Patent No. 3140105 JP-A-6-201653 JP-A-60-78378 JP 59-138946 A Japanese Patent No. 3625911

このような構成の電磁誘導型検査装置21にあっては、周囲の温度変化などによって、励磁回路部23における出力特性の変動、検出部24における検出特性の変動が起こり、検査部26での検査結果も変動して正確な結果が得られなくなり、ワークの良否の誤判定が生じるという問題がある。   In the electromagnetic induction type inspection apparatus 21 having such a configuration, a change in output characteristics in the excitation circuit unit 23 and a change in detection characteristics in the detection unit 24 occur due to a change in ambient temperature. The result also fluctuates, so that an accurate result cannot be obtained, and there is a problem that an erroneous determination of the quality of the work occurs.

特許文献5に開示された磁性金属検出器では、複数個のコイル間の差分信号により、温度変化などによる通過物品の位置の誤検出を防止している。しかしながら、複数のコイルを使用するため、構成が複雑となってコスト高になるという問題がある。   In the magnetic metal detector disclosed in Patent Document 5, erroneous detection of the position of a passing article due to a temperature change or the like is prevented by a difference signal between a plurality of coils. However, since a plurality of coils are used, there is a problem that the configuration becomes complicated and the cost is increased.

本発明は斯かる事情に鑑みてなされたものであり、簡単で低コストの構成であっても、周囲の温度変化などによる励磁出力特性の変動、検出特性の変動の影響を少なくして、物品の正確な良否検査を行える電磁誘導型検査方法及び電磁誘導型検査装置を提供することを目的とする。   The present invention has been made in view of such circumstances, and even with a simple and low-cost configuration, the effects of fluctuations in excitation output characteristics and detection characteristics due to changes in ambient temperature and the like are reduced, and the article It is an object of the present invention to provide an electromagnetic induction type inspection method and an electromagnetic induction type inspection device capable of performing an accurate pass / fail inspection.

本発明に係る電磁誘導型検査方法は、励磁コイルへの交流電圧の印加によって磁界を生成し、生成した磁界中を間欠的に送られる被検査物品が通過することによる磁束の変化を検出コイルで検出し、得られる検出結果に応じて前記被検査物品の良否を検査する電磁誘導型検査方法において、前記被検査物品の搬送路近傍で前記励磁コイル及び検出コイルに対して搬送方向上流及び下流に設置された前記被検査物品の通過を検知する検知器により、1つの被検査物品が通過するタイミングを検知し、検知した被検査物品通過時間間隔内で検出した前記磁束の変化を示す検出信号の最大値と最小値との差を求め、求めた差と所定基準との比較結果に基づいて前記被検査物品の良否を検査することを特徴とする。 The electromagnetic induction type inspection method according to the present invention generates a magnetic field by applying an alternating voltage to an excitation coil, and a change in magnetic flux caused by passing an article to be inspected that is intermittently sent through the generated magnetic field is detected by a detection coil. In the electromagnetic induction type inspection method of detecting and inspecting the quality of the inspected article according to the detection result obtained, upstream and downstream in the transport direction with respect to the excitation coil and the detection coil in the vicinity of the transport path of the inspected article A detector that detects the passage of the inspected article that is installed detects the timing at which one inspected article passes, and a detection signal that indicates a change in the magnetic flux detected within the detected inspected article passage time interval. A difference between a maximum value and a minimum value is obtained, and the quality of the inspected article is inspected based on a comparison result between the obtained difference and a predetermined standard.

本発明に係る電磁誘導型検査装置は、励磁コイルへの交流電圧の印加によって磁界を生成し、生成した磁界中を間欠的に送られる被検査物品が通過することによる磁束の変化を検出コイルで検出し、得られる検出結果に応じて前記被検査物品の良否を検査する電磁誘導型検査装置において、前記被検査物品の搬送路近傍で前記励磁コイル及び検出コイルに対して搬送方向上流及び下流に設置され、1つの被検査物品が通過するタイミングを検知する検知手段と、該検知手段が検知した被検査物品通過時間間隔内で前記検出コイルにて検出した前記磁束の変化を示す検出信号の最大値と最小値との差を求める差検出手段と、求めた差と所定基準との比較結果に基づいて前記被検査物品の良否を検査する検査手段とを備えることを特徴とする。 The electromagnetic induction type inspection apparatus according to the present invention generates a magnetic field by applying an alternating voltage to an exciting coil, and a detection coil detects a change in magnetic flux caused by passing an article to be inspected that is sent intermittently in the generated magnetic field. In an electromagnetic induction type inspection apparatus that detects and checks the quality of the inspected article according to the detection result obtained, upstream and downstream in the transport direction with respect to the excitation coil and the detection coil in the vicinity of the transport path of the inspected article A detecting means for detecting a timing at which one inspected article is installed , and a maximum of a detection signal indicating a change in the magnetic flux detected by the detection coil within an inspected article passage time interval detected by the detecting means; And a difference detecting means for obtaining a difference between the value and the minimum value, and an inspection means for inspecting the quality of the article to be inspected based on a comparison result between the obtained difference and a predetermined reference.

本発明にあっては、検査対象の物品が励磁コイル/検出コイルを通過するタイミングを検知し、その検知した被検査物品通過時間間隔内での検出コイルの誘導電圧を表す検出信号の最大値と最小値との差を求め、求めた差を所定基準と比較することによって物品の良否を検査する。検出信号の最大値は、励磁コイル/検出コイルの中央位置を物品が通過するタイミングに該当し、検出信号の最小値は、物品が励磁コイル/検出コイルを通過し終えたタイミングに該当する。   In the present invention, the maximum value of the detection signal representing the induction voltage of the detection coil within the detected article passing time interval is detected by detecting the timing at which the article to be inspected passes through the excitation coil / detection coil. A difference from the minimum value is obtained, and the quality of the article is inspected by comparing the obtained difference with a predetermined standard. The maximum value of the detection signal corresponds to the timing at which the article passes through the center position of the excitation coil / detection coil, and the minimum value of the detection signal corresponds to the timing at which the article has passed through the excitation coil / detection coil.

周囲の温度変化に応じて励磁出力特性、検出特性は変動するが、物品が中央位置を通過するタイミングと、物品が通過し終えたタイミングとで同じ変動を受けるため、それぞれの検出信号の差を求めることにより、これらの変動は相殺される。したがって、検出信号の最大値と最小値との差に基づいて物品の良否を検査することにより、これらの変動の影響を少なくできる。この結果、周囲の温度が変化しても物品の正確な良否検査結果が得られる。   Excitation output characteristics and detection characteristics vary according to the ambient temperature change, but the same fluctuation occurs at the timing when the article passes through the center position and the timing when the article finishes passing. By seeking, these fluctuations are offset. Therefore, the influence of these fluctuations can be reduced by inspecting the quality of the article based on the difference between the maximum value and the minimum value of the detection signal. As a result, an accurate quality inspection result of the article can be obtained even if the ambient temperature changes.

また、1組の励磁コイル/検出コイルにて温度変化の影響を防げるため、小型で低コストな構成により実現可能である。
本発明に係る電磁誘導型検査装置は、前記差検出手段は、前記検出信号のsin成分の最大値Asin 及びcos成分の最大値Acos とsin成分の最小値Bsin 及びcos成分の最小値Bcos との差であるx=Asin −Bsin ,y=Acos −Bcos を演算し、前記検査手段は、演算した(x,y)が所定の楕円領域内に入るか否かに基づいて前記被検査物品の良否を検査するように構成したことを特徴とする。
In addition, since the influence of the temperature change can be prevented with one set of excitation coil / detection coil, it can be realized with a small and low-cost configuration.
In the electromagnetic induction type inspection apparatus according to the present invention, the difference detecting means includes a maximum value Asin of the sin component and a maximum value Acos of the cos component, a minimum value Bsin of the sin component, and a minimum value Bcos of the cos component of the detection signal. The difference x = Asin−Bsin and y = Acos−Bcos are calculated, and the inspection means determines whether the inspected article is good based on whether the calculated (x, y) falls within a predetermined elliptical area. It is characterized by having comprised so that it may test | inspect.

本発明では、1つの被検査物品が交流磁界中を通過するタイミングを検知し、検知した被検査物品通過時間間隔内で検出した磁束の変化を示す検出信号の最大値と最小値との差を求め、求めた差と所定基準との比較結果に基づいて被検査物品の良否を検査するようにしたので、小型で低コストな構成であっても、周囲の温度変化の影響を低減することができ、温度環境にかかわらず常に正確な良否結果を得ることが可能となるとともに、被検査物品の搬送路近傍で励磁コイル及び検出コイルに対して搬送方向上流及び下流に設置された検知器(検知手段)にて、被検査物品が通過するタイミングを検知するようにしたので、被検査物品通過時間内に2個以上の被検査物品が励磁コイル及び検出コイル内に存在しているか否かを確認できるため、検査の信頼性の向上を図ることができる。 In the present invention, the timing at which one article to be inspected passes through the alternating magnetic field is detected, and the difference between the maximum value and the minimum value of the detection signal indicating the change in magnetic flux detected within the detected inspected article passage time interval is determined. Since the quality of the article to be inspected is inspected based on the obtained difference and the comparison result with the predetermined standard, it is possible to reduce the influence of ambient temperature change even in a small and low-cost configuration. can both if it is possible to always obtain a correct quality results regardless of the temperature environment, the installed detector in the conveying direction upstream and downstream with respect to the excitation coil and the detection coil in the transport path proximal of the test article (detection Means) to detect the timing at which the article to be inspected passes, so it is confirmed whether or not two or more inspected articles are present in the excitation coil and the detection coil within the inspected article passage time. Because you can It is possible to improve the reliability of the inspection.

以下、本発明をその実施の形態を示す図面を参照して具体的に説明する。なお、本発明は、以下の実施の形態に限定されるものではない。   Hereinafter, the present invention will be described in detail with reference to the drawings showing embodiments thereof. Note that the present invention is not limited to the following embodiments.

図1は、本発明による電磁誘導型検査装置1の一例を示す構成図である。図1において、10は検査対象の物品(被検査ワークW)が矢符方向(図1の上下方向)に間欠的に搬送される搬送路であり、搬送路10の周囲に電磁誘導型検査装置1が設けられている。電磁誘導型検査装置1は、磁気センサ2と、励磁回路部3と、検出部4と、位相検波部5と、検査部6と、表示部7と、第1通過検知器8と、第2通過検知器9とを備えている。   FIG. 1 is a configuration diagram showing an example of an electromagnetic induction inspection apparatus 1 according to the present invention. In FIG. 1, reference numeral 10 denotes a conveyance path in which an article to be inspected (workpiece W to be inspected) is intermittently conveyed in the arrow direction (vertical direction in FIG. 1). 1 is provided. The electromagnetic induction type inspection apparatus 1 includes a magnetic sensor 2, an excitation circuit unit 3, a detection unit 4, a phase detection unit 5, an inspection unit 6, a display unit 7, a first passage detector 8, a second And a passage detector 9.

磁気センサ2は、交流磁界を生じる励磁コイル2aと、磁束の変化に応じた誘導電圧を生じる検出コイル2bとを含み、励磁コイル2a及び検出コイル2bは、各コイル2a,2bの軸方向を搬送路10の長手方向(搬送方向)にして、その長手方向の略同じ位置に、励磁コイル2aを外側、検出コイル2bを内側にして搬送路10を取り囲む態様で同心円状に配置されている。   The magnetic sensor 2 includes an excitation coil 2a that generates an alternating magnetic field and a detection coil 2b that generates an induced voltage corresponding to a change in magnetic flux. The excitation coil 2a and the detection coil 2b carry the axial direction of the coils 2a and 2b. In the longitudinal direction (conveying direction) of the path 10, they are arranged concentrically at substantially the same position in the longitudinal direction so as to surround the conveying path 10 with the excitation coil 2 a outside and the detection coil 2 b inside.

励磁コイル2aは、励磁回路部3によって高周波電圧を印加され、交流磁界を生じる。被検査ワークWは、検出コイル2bの内側を通過することによって励磁コイル2aが発生した交流磁界中を通過する。検出コイル2bは、励磁コイル2aが発生した交流磁界中を被検査ワークWが通過することによる磁束の変化に応じた誘導電圧を生じる。生じた誘導電圧は、検出部4に入力される。   The excitation coil 2a is applied with a high frequency voltage by the excitation circuit unit 3 to generate an alternating magnetic field. The workpiece W to be inspected passes through the alternating magnetic field generated by the exciting coil 2a by passing through the inside of the detection coil 2b. The detection coil 2b generates an induced voltage corresponding to a change in magnetic flux caused by the work W to be inspected passing through the AC magnetic field generated by the excitation coil 2a. The generated induced voltage is input to the detection unit 4.

励磁回路部3は、励磁周波数の高周波電圧を励磁コイル2aに印加して交流磁界を発生させ、また、励磁コイル2aに印加される高周波電圧に対応するアナログ信号を交流電圧信号として位相検波部5へ出力する。検出部4は、検出コイル2bから入力された誘導電圧に対応する信号を検出信号として位相検波部5へ出力する。   The excitation circuit unit 3 applies a high-frequency voltage having an excitation frequency to the excitation coil 2a to generate an AC magnetic field, and an analog signal corresponding to the high-frequency voltage applied to the excitation coil 2a is used as an AC voltage signal for the phase detection unit 5 Output to. The detection unit 4 outputs a signal corresponding to the induced voltage input from the detection coil 2b as a detection signal to the phase detection unit 5.

励磁回路部3から交流電圧信号を、検出部4から検出信号を、夫々入力された位相検波部5は、検出信号から交流電圧信号の周波数成分のみを抽出し、抽出した信号を検査部6ヘ出力する。   The phase detector 5 that receives the AC voltage signal from the excitation circuit 3 and the detection signal from the detector 4 extracts only the frequency component of the AC voltage signal from the detection signal, and sends the extracted signal to the inspection unit 6. Output.

被検査ワークWの通過を検知する第1通過検知器8は、搬送路10の近傍で磁気センサ2に対して搬送方向下流側に設けられている。また、被検査ワークWの通過を検知する第2通過検知器9は、搬送路10の近傍で磁気センサ2に対して搬送方向上流側に設けられている。これらの第1通過検知器8及び第2通過検知器9はそれぞれ、被検査ワークWの通過の有無(タイミング)を表す検知信号を検査部6ヘ出力する。   The first passage detector 8 that detects the passage of the workpiece W to be inspected is provided in the vicinity of the transport path 10 on the downstream side in the transport direction with respect to the magnetic sensor 2. Further, the second passage detector 9 that detects the passage of the workpiece W to be inspected is provided on the upstream side in the transport direction with respect to the magnetic sensor 2 in the vicinity of the transport path 10. Each of the first passage detector 8 and the second passage detector 9 outputs a detection signal indicating the presence or absence (timing) of the passage of the workpiece W to be inspected to the inspection unit 6.

図2(a)は、第1通過検知器8の検知信号を示す図であり、被検査ワークWの通過を検知したタイミングでレベルが高くなる。また、図2(b)は、位相検波部5から検査部6ヘの出力信号を示す図であり、図2(a)と同期を取って表している。被検査ワークWは間欠的に搬送路10を搬送されるため、図2(a)において隣り合う高レベル間は、1つの被検査ワークWが通過する時間(ワーク通過時間)を表すことになる。このワーク通過時間内にあって、位相検波部5の出力信号は、図2(b)に示すように、最初低レベルであるが、被検査ワークWが磁気センサ2を通過する際、単調増加した後に単調減少するレベル変化を呈し、その後最初の低レベルに戻る。   FIG. 2A is a diagram illustrating a detection signal of the first passage detector 8, and the level increases at the timing when passage of the workpiece W to be inspected is detected. FIG. 2B is a diagram showing an output signal from the phase detection unit 5 to the inspection unit 6 and is shown in synchronization with FIG. Since the workpiece W to be inspected is intermittently conveyed on the conveyance path 10, the time between the adjacent high levels in FIG. 2A represents the time during which one workpiece W passes (work passage time). . Within this workpiece passage time, the output signal of the phase detector 5 is initially at a low level as shown in FIG. 2B, but increases monotonically when the workpiece W to be inspected passes through the magnetic sensor 2. After that, it exhibits a monotonically decreasing level change and then returns to the first low level.

検査部6は、1つの被検査ワークWに対応したワーク通過時間内での図2(b)に示すような出力信号(検出信号)における最大値(最大レベル)Aと最小値(最小レベル)Bとを求め、求めた最大値Aと最小値Bとの差を算出する。そして、検査部6は、算出した差と、内部のメモリ6aに予め格納されている所定基準(所定領域または所定閾値)とを比較し、その比較結果に基づいて、被検査ワークWの良否を検査する。   The inspection unit 6 has a maximum value (maximum level) A and a minimum value (minimum level) in the output signal (detection signal) as shown in FIG. 2B within the workpiece passage time corresponding to one workpiece W to be inspected. B is obtained, and the difference between the obtained maximum value A and minimum value B is calculated. Then, the inspection unit 6 compares the calculated difference with a predetermined reference (predetermined region or predetermined threshold) stored in advance in the internal memory 6a, and determines whether the inspection workpiece W is acceptable based on the comparison result. inspect.

被検査ワークWに関する良否の検査結果は、検査部6から表示部7ヘ出力され、表示部7は、その検査結果を液晶画面などに表示する。   The inspection result of quality on the workpiece W to be inspected is output from the inspection unit 6 to the display unit 7, and the display unit 7 displays the inspection result on a liquid crystal screen or the like.

次に、このような構成をなす電磁誘導型検査装置1の動作について説明する。図3は、本発明による電磁誘導型検査方法の手順(検査部6の動作手順)を示すフローチャートである。なお、検査部6のメモリ6aには、被検査ワークWの良否を判定するための所定基準となる図4に示すような所定の楕円領域(x,y)の情報が予め格納されている。   Next, the operation of the electromagnetic induction inspection apparatus 1 having such a configuration will be described. FIG. 3 is a flowchart showing the procedure of the electromagnetic induction type inspection method according to the present invention (the operation procedure of the inspection unit 6). The memory 6a of the inspection unit 6 stores in advance information on a predetermined elliptical area (x, y) as shown in FIG. 4 as a predetermined reference for determining the quality of the workpiece W to be inspected.

励磁回路部3により、励磁コイル2aヘ高周波電圧を印加して、交流磁界を生じさせる。そして、複数の被検査ワークWを搬送路10に沿って矢符方向に1個ずつ間欠的に搬送させる。搬送された各被検査ワークWは、検出コイル2bの内側を通過することによって励磁コイル2aが発生した交流磁界中を通過する。検出コイル2bには、励磁コイル2aが発生した交流磁界中を被検査ワークWが通過することによる磁束の変化に応じた誘導電圧が生じる。   The excitation circuit unit 3 applies a high frequency voltage to the excitation coil 2a to generate an alternating magnetic field. Then, a plurality of workpieces W to be inspected are intermittently conveyed one by one along the conveyance path 10 in the arrow direction. Each of the workpieces W to be inspected passes through the alternating magnetic field generated by the exciting coil 2a by passing through the inside of the detection coil 2b. In the detection coil 2b, an induced voltage is generated according to a change in magnetic flux caused by the work W to be inspected passing through the AC magnetic field generated by the exciting coil 2a.

生じた誘導電圧は検出部4に入力され、その誘導電圧に対応した検出信号が検出部4から位相検波部5へ出力される。位相検波部5において、励磁回路部3からの交流電圧信号に応じて、励磁電流(交流電圧信号)の周波数成分のみが、入力された検出信号から抽出され、抽出された信号は検査部6ヘ出力される。   The generated induced voltage is input to the detection unit 4, and a detection signal corresponding to the induced voltage is output from the detection unit 4 to the phase detection unit 5. In the phase detection unit 5, only the frequency component of the excitation current (AC voltage signal) is extracted from the input detection signal according to the AC voltage signal from the excitation circuit unit 3, and the extracted signal is sent to the inspection unit 6. Is output.

一方、被検査ワークWの通過の有無(タイミング)を表す検知信号が、第1通過検知器8及び第2通過検知器9それぞれから検査部6ヘ出力される。検査部6は、第1通過検知器8の検知信号に基づいて各被検査ワークWについてワーク通過時間を知ることができる。そして、検査部6は、このワーク通過時間内における位相検波部5からの出力信号に基づいて、各被検査ワークWの良否を判定する。   On the other hand, detection signals indicating the presence / absence (timing) of the passage of the workpiece W to be inspected are output from the first passage detector 8 and the second passage detector 9 to the inspection unit 6. The inspection unit 6 can know the workpiece passage time for each workpiece W based on the detection signal of the first passage detector 8. Then, the inspection unit 6 determines pass / fail of each workpiece W to be inspected based on the output signal from the phase detection unit 5 within the workpiece passage time.

この各被検査ワークWの良否の判定処理について、図3のフローチャートを参照して詳細に説明する。   The quality determination process for each workpiece W to be inspected will be described in detail with reference to the flowchart of FIG.

検査部6は、第1通過検知器8から、被検査ワークWの通過を示す信号(図2(a)における高レベル)を入力したか否かを判断する(ステップS1)。入力していない場合(S1:NO)、検査部6は、位相検波部5からの出力信号における最大値(具体的にはsin成分の最大値Asin 及びcos成分の最大値Acos )と最小値(具体的にはsin成分の最小値Bsin 及びcos成分の最小値Bcos )とを検出して(ステップS2)、動作がS1に戻る。被検査ワークWの通過を示す信号(図2(a)における高レベル)を入力した場合(S1:YES)、検査部6は、検出した最大値と最小値とを確定する(ステップS3)。このようにして検査部6は、各被検査ワークWに関してワーク通過時間内での位相検波部5からの出力信号(検出信号)の最大値と最小値とを得ることができる。この際、第1通過検知器8での検知信号が、最大値及び最小値の確定タイミングの決定に寄与する。   The inspection unit 6 determines whether or not a signal indicating the passage of the workpiece W to be inspected (high level in FIG. 2A) is input from the first passage detector 8 (step S1). When the signal is not input (S1: NO), the inspection unit 6 determines the maximum value (specifically, the maximum value Asin of the sin component and the maximum value Acos of the cos component) and the minimum value in the output signal from the phase detection unit 5 ( Specifically, the minimum value Bsin of the sin component and the minimum value Bcos of the cos component) are detected (step S2), and the operation returns to S1. When a signal indicating the passage of the workpiece W to be inspected (high level in FIG. 2A) is input (S1: YES), the inspection unit 6 determines the detected maximum value and minimum value (step S3). In this way, the inspection unit 6 can obtain the maximum value and the minimum value of the output signal (detection signal) from the phase detection unit 5 within the workpiece passage time for each workpiece W to be inspected. At this time, the detection signal in the first passage detector 8 contributes to the determination of the determination timing of the maximum value and the minimum value.

次に、検査部6は、最大値と最小値との差、具体的にはx=Asin −Bsin ,y=Acos −Bcos を演算する(ステップS4)。そして、検査部6は、演算した(x,y)がメモリ6aに格納されている所定の楕円領域R(図4参照)内に入るか否かを判断する(ステップS5)。   Next, the inspection unit 6 calculates the difference between the maximum value and the minimum value, specifically, x = Asin−Bsin, y = Acos−Bcos (step S4). Then, the inspection unit 6 determines whether or not the calculated (x, y) falls within a predetermined elliptical region R (see FIG. 4) stored in the memory 6a (step S5).

所定の楕円領域内に入る場合(S5:YES)、検査部6は、この被検査ワークWが良品であると判定してその判定結果を表示部7へ出力する(ステップS6)。一方、所定の楕円領域内に入らない場合(S5:NO)、検査部6は、この被検査ワークWが不良品であると判定してその判定結果を表示部7へ出力する(ステップS7)。   When entering the predetermined elliptical area (S5: YES), the inspection unit 6 determines that the workpiece W to be inspected is a non-defective product and outputs the determination result to the display unit 7 (step S6). On the other hand, when it does not fall within the predetermined elliptical area (S5: NO), the inspection unit 6 determines that the workpiece W to be inspected is a defective product and outputs the determination result to the display unit 7 (step S7). .

検査部6は、取り込んだ最大値及び最小値をクリアして(ステップS8)、動作がリターンとなり、次の被検査ワークWについて同様の動作手順が実行される。   The inspection unit 6 clears the acquired maximum value and minimum value (step S8), the operation returns, and the same operation procedure is executed for the next workpiece W to be inspected.

周囲の温度変化に伴い、励磁回路部3の出力電圧、検出コイル2bの抵抗などが変動して、位相検波部5からの出力信号(検出信号)も変動することになるが、この変動は、被検査ワークWが磁気センサ2を通過するときと被検査ワークWが磁気センサ2内に存在しないときとで同じである。したがって、上述したように、ワーク通過時間内での位相検波部5からの出力信号(検出信号)の最大値と最小値との差を求めることにより、このような温度変化に伴う変動の影響を小さくすることができる。そして、この差に基づいて、被検査ワークWの良否を判定するようにしたので、温度変化の影響を受けずに正確な良否の判定結果を得ることができ、温度環境に依存しないで各被検査ワークWを常に正しく検査することが可能となる。また、このような温度変化の影響の防止を1個の磁気センサ2にて実現できるため、構造の大型化、コストの上昇を招くことがない。   As the ambient temperature changes, the output voltage of the excitation circuit unit 3, the resistance of the detection coil 2b, etc. fluctuate, and the output signal (detection signal) from the phase detection unit 5 also fluctuates. The same applies when the workpiece W passes through the magnetic sensor 2 and when the workpiece W does not exist in the magnetic sensor 2. Therefore, as described above, by obtaining the difference between the maximum value and the minimum value of the output signal (detection signal) from the phase detection unit 5 within the workpiece passage time, the influence of such variation due to temperature change can be obtained. Can be small. Since the quality of the workpiece W to be inspected is determined based on this difference, an accurate quality determination result can be obtained without being affected by the temperature change, and each of the objects to be tested can be obtained without depending on the temperature environment. The inspection workpiece W can always be correctly inspected. Moreover, since the prevention of the influence of such a temperature change can be realized by one magnetic sensor 2, the structure is not increased in size and the cost is not increased.

ところで、第2通過検知器9での検知信号は、第1通過検知器8での検知信号と組み合わされて、ワーク通過時間内に2個以上の被検査ワークWが磁気センサ2内に存在していないかを確認するために必要なものであり、検査の信頼性の向上を図ることができる。   By the way, the detection signal from the second passage detector 9 is combined with the detection signal from the first passage detector 8, and two or more workpieces W to be inspected exist in the magnetic sensor 2 within the workpiece passage time. This is necessary for confirming whether or not the inspection has been performed, and the reliability of the inspection can be improved.

上述した例では、所定基準として、2次元の所定領域を用いる場合について説明したが、最大値及び最小値の差を所定閾値と比較し、その比較結果に基づいて被検査ワークWの良否を検査するようにしても良い。   In the example described above, the case where a two-dimensional predetermined region is used as the predetermined reference has been described. However, the difference between the maximum value and the minimum value is compared with a predetermined threshold, and the quality of the workpiece W to be inspected is inspected based on the comparison result. You may make it do.

前回までの最小値の検出結果と今回検出した最小値との移動平均を求めていくようにすれば、ノイズなどの突発的な影響を避けることができる。また、前回までの最小値の移動平均と今回検出した最小値とを比較して、両者に所定以上の差がある場合には、ノイズなどによる検出値異常であると判断するようにすれば、誤検出を防止することができる。   If a moving average between the detection result of the minimum value until the previous time and the minimum value detected this time is obtained, sudden effects such as noise can be avoided. Also, comparing the moving average of the minimum value up to the previous time and the minimum value detected this time, if there is a difference of more than a predetermined value, if it is determined that the detected value is abnormal due to noise, False detection can be prevented.

本発明による電磁誘導型検査装置の一例を示す構成図である。It is a block diagram which shows an example of the electromagnetic induction type inspection apparatus by this invention. 第1通過検知器の検知信号及び位相検波部の出力信号を示す図である。It is a figure which shows the detection signal of a 1st passage detector, and the output signal of a phase detection part. 本発明による電磁誘導型検査方法の手順(検査部の動作手順)を示すフローチャートである。It is a flowchart which shows the procedure (operation | movement procedure of a test | inspection part) of the electromagnetic induction type inspection method by this invention. 被検査ワークWの良否を判定するための所定領域(所定基準)の一例を示す図である。It is a figure which shows an example of the predetermined area | region (predetermined reference | standard) for determining the quality of the to-be-inspected workpiece | work W. 電磁誘導型検査装置の基本構成を示すブロック図である。It is a block diagram which shows the basic composition of an electromagnetic induction type inspection apparatus.

符号の説明Explanation of symbols

1 電磁誘導型検査装置
2 磁気センサ
2a 励磁コイル
2b 検出コイル
3 励磁回路部
4 検出部
5 位相検波部
6 検査部
7 表示部
8 第1通過検知器
9 第2通過検知器
10 搬送路
W 被検査ワーク
DESCRIPTION OF SYMBOLS 1 Electromagnetic induction type inspection apparatus 2 Magnetic sensor 2a Excitation coil 2b Detection coil 3 Excitation circuit part
4 detection unit 5 phase detection unit 6 inspection unit 7 display unit 8 first passage detector 9 second passage detector 10 transport path W work to be inspected

Claims (3)

励磁コイルへの交流電圧の印加によって磁界を生成し、生成した磁界中を間欠的に送られる被検査物品が通過することによる磁束の変化を検出コイルで検出し、得られる検出結果に応じて前記被検査物品の良否を検査する電磁誘導型検査方法において、
前記被検査物品の搬送路近傍で前記励磁コイル及び検出コイルに対して搬送方向上流及び下流に設置された前記被検査物品の通過を検知する検知器により、1つの被検査物品が通過するタイミングを検知し、検知した被検査物品通過時間間隔内で検出した前記磁束の変化を示す検出信号の最大値と最小値との差を求め、求めた差と所定基準との比較結果に基づいて前記被検査物品の良否を検査することを特徴とする電磁誘導型検査方法。
A magnetic field is generated by applying an alternating voltage to the excitation coil, and a change in magnetic flux due to the passage of an article to be inspected that is intermittently sent through the generated magnetic field is detected by the detection coil, and according to the obtained detection result, In the electromagnetic induction type inspection method for inspecting the quality of the inspected article,
The timing at which one inspection article passes is detected by a detector that detects the passage of the inspection article upstream and downstream of the excitation coil and the detection coil in the vicinity of the conveyance path of the inspection article. A difference between a maximum value and a minimum value of the detection signal indicating a change in the magnetic flux detected and detected within the detected article passage time interval is obtained, and the difference is determined based on a comparison result between the obtained difference and a predetermined reference. An electromagnetic induction inspection method characterized by inspecting the quality of an inspection article.
励磁コイルへの交流電圧の印加によって磁界を生成し、生成した磁界中を間欠的に送られる被検査物品が通過することによる磁束の変化を検出コイルで検出し、得られる検出結果に応じて前記被検査物品の良否を検査する電磁誘導型検査装置において、
前記被検査物品の搬送路近傍で前記励磁コイル及び検出コイルに対して搬送方向上流及び下流に設置され、1つの被検査物品が通過するタイミングを検知する検知手段と、
該検知手段が検知した被検査物品通過時間間隔内で前記検出コイルにて検出した前記磁束の変化を示す検出信号の最大値と最小値との差を求める差検出手段と、
求めた差と所定基準との比較結果に基づいて前記被検査物品の良否を検査する検査手段と
を備えることを特徴とする電磁誘導型検査装置。
A magnetic field is generated by applying an alternating voltage to the excitation coil, and a change in magnetic flux due to the passage of an article to be inspected that is intermittently sent through the generated magnetic field is detected by the detection coil, and according to the obtained detection result, In an electromagnetic induction type inspection device that inspects the quality of an article to be inspected,
A detection means that is installed upstream and downstream in the conveyance direction with respect to the excitation coil and the detection coil in the vicinity of the conveyance path of the article to be inspected;
A difference detection means for obtaining a difference between a maximum value and a minimum value of a detection signal indicating a change in the magnetic flux detected by the detection coil within an inspection article passage time interval detected by the detection means;
An electromagnetic induction type inspection apparatus comprising: inspection means for inspecting the quality of the inspected article based on a comparison result between the obtained difference and a predetermined reference.
前記差検出手段は、前記検出信号のsin成分の最大値Asin 及びcos成分の最大値Acos とsin成分の最小値Bsin 及びcos成分の最小値Bcos との差であるx=Asin −Bsin ,y=Acos −Bcos を演算し、前記検査手段は、演算した(x,y)が所定の楕円領域内に入るか否かに基づいて前記被検査物品の良否を検査するように構成したことを特徴とする請求項2記載の電磁誘導型検査装置。The difference detection means is a difference between the maximum value Asin of the sine component and the maximum value Cos of the cos component and the minimum value Bsin of the sine component and the minimum value Bcos of the cos component x = Asin−Bsin, y = Acos−Bcos is calculated, and the inspection means is configured to inspect the quality of the inspected article based on whether or not the calculated (x, y) falls within a predetermined elliptical area. The electromagnetic induction type inspection apparatus according to claim 2.
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