JP4682516B2 - Electro-optical device substrate, electro-optical device, and electronic apparatus - Google Patents

Description

  The present invention includes, for example, an electro-optical device used in a mobile phone, a portable information terminal, etc., a substrate for an electro-optical device used in the electro-optical device, an inspection device used in the inspection of the electro-optical device, and the electro-optical device. The present invention relates to an electronic apparatus, an inspection method for the electro-optical device, and a manufacturing method for the electro-optical device.

In the step of forming an electro-optical device such as a liquid crystal device mounted on a mobile phone or a portable information terminal, for example, a short inspection of an electrode or the like formed on the display unit of the electro-optical device is performed (see, for example, Patent Document 1). .) For this reason, terminals for short inspection are arranged in the electro-optical device, and the inspection terminals are connected to connection terminals of electrodes to be inspected by wiring or the like.
Japanese Patent Laid-Open No. 10-253980

  However, when the pitch between the connection terminal and the inspection terminal is different, the length of the wiring formed between the connection terminal and the inspection terminal becomes long, and depending on the width between the connection terminal and the inspection terminal, the wiring Therefore, there is a problem that the electrical resistance value of the wiring becomes large.

  In view of the above circumstances, the present invention suppresses an increase in the electrical resistance value of the wiring connecting the connection terminal group and the inspection terminal group even when the pitch between the connection terminal and the inspection terminal is different. , An electro-optical device substrate used in the electro-optical device, an inspection device used in the electro-optical device, an electronic apparatus equipped with the electro-optical device, and the electro-optical device It is an object of the present invention to provide an inspection method and a method for manufacturing the electro-optical device.

To achieve the above object, a substrate for an electro-optical device according to main aspect of the present invention comprises a first connecting terminal groups made are arranged in a predetermined regular pitch, arranged at a narrow regular pitch than said predetermined equal pitch The second connection terminal group, a plurality of first inspection terminals connected to the first connection terminal group by wiring, the wiring connected to the second connection terminal group, and the first connection terminal group. A plurality of second inspection terminals arranged side by side with the inspection terminals, and an inspection terminal group disposed in a region where the inspection terminal groups are arranged, and the first and second connections Unconnected terminals not connected to any of the terminal groups, the inspection terminal group and the unconnected terminals are arranged at an equal pitch, and the plurality of first inspection terminals are the divided into a plurality of groups by unconnected terminals, said plurality of guru In flop, said first equal number of terminals for inspection, in the plurality of groups, and wherein the mode of wiring for connecting the first connecting terminal and said first terminals for inspection are the same To do.
In the inspection terminal group, the inspection terminals are arranged at the same pitch as the connection terminals of the second connection terminal group.
In the inspection terminal group, the inspection terminals are arranged at a pitch smaller than the pitch of the connection terminals of the first and second connection terminal groups, and also in the region between the second inspection terminals. The unconnected terminals are arranged.
In addition, the inspection terminal group is formed by repeatedly arranging a group including a plurality of inspection member terminals to which different voltages are applied, and is provided corresponding to the inspection member terminal group to be brought into contact with the inspection terminal group, When the number of inspection member terminals in the group is A and the natural number is N, the unconnected terminals are not arranged in a row (A × N−1).
Further, the first connection terminal group arranged at a predetermined pitch, the second connection terminal group arranged at a pitch narrower than the predetermined pitch, and the first connection terminal group are connected to each other by wiring. A plurality of first inspection terminals, and a plurality of second inspection terminals that are connected to the second connection terminal group by wiring and arranged side by side with the first inspection terminals. A terminal group for inspection and an unconnected terminal arranged in a region where the inspection terminal group is arranged and not connected to any of the first and second connection terminal groups. The group and the unconnected terminals are arranged at an equal pitch, and a group including a plurality of test member terminals to which different voltages are applied are repeatedly arranged, and the test member terminals are brought into contact with the test terminal group A group corresponding to the group When the number of test elements terminals of flop A, the natural number N, the terminal of the unconnected, characterized in that not arranged in the continuous (A × N-1).
Further, the first connection terminal group arranged at a predetermined interval, the second connection terminal group arranged at an interval smaller than the predetermined interval, and the connection terminals of the second connection terminal group are the same. A test terminal group arranged at intervals and connected to the first and second connection terminal groups, wherein the test terminal group is one of the first and second connection terminal groups. It has the 1st test | inspection terminal connected, and the 2nd test | inspection terminal not connected to the said 1st and 2nd connection terminal group, It is characterized by the above-mentioned.

  According to the present invention, the inspection terminal group is connected to the first inspection terminal connected to one of the first and second connection terminal groups, and to the first and second connection terminal groups. Since there is no second inspection terminal, the length of the wiring formed between the first and second connection terminal groups and the first inspection terminal can be suppressed. As a result, even when the pitches of the connection terminal group and the inspection terminal group are different, the electrical resistance value of the wiring connecting the connection terminal group and the inspection terminal group is prevented from increasing, and the wiring is easily formed. can do.

  According to one aspect of the present invention, the inspection terminal groups are arranged at regular intervals, and groups including a plurality of inspection member terminals to which different voltages are applied are repeatedly arranged, and the inspection terminal group The second inspection terminals are (A × N−1) continuous when the number of inspection member terminals in the group is A and the natural number is N. It is characterized by not being arranged by. The first inspection terminal is connected to the first and second connection terminal groups without leakage. When the second inspection terminals are arranged in a row (A × N−1), the first inspection terminals arranged adjacent to both ends of the second inspection terminal array are the same. It will be in contact with the inspection member terminals of the group. The inspection member terminal group is formed such that inspection member terminals of the same group are connected to each other. If the inspection member terminals are connected to each other, even if a short circuit occurs in the electrodes connected to the first and second connection terminal groups, it cannot be detected. According to the present invention, since the inspection terminal group is arranged so that the second inspection terminals are not arranged in a continuous manner (A × N−1), adjacent to both ends of the arrangement of the second inspection terminals. Thus, the respective first inspection terminals arranged in this manner do not come into contact with the inspection group terminals of the same group. Thereby, when a voltage is applied by bringing the inspection member terminal group into contact with the inspection terminal group, it is possible to detect without leakage even if the electrode or the like is short-circuited.

  An electro-optical device substrate according to another aspect of the present invention includes a first connection terminal group arranged at a predetermined interval, and a second connection terminal group arranged at an interval smaller than the predetermined interval. A first inspection terminal group connected to the first connection terminal group and arranged at equal intervals, and a second inspection connected to the second connection terminal group and arranged at equal intervals And the first inspection terminal group is arranged at an interval that is an integral multiple of the interval between the inspection terminals of the second inspection terminal group.

  According to the present invention, the first inspection terminal group is connected to the first connection terminal group, the second inspection terminal group is connected to the second connection terminal group, and the first and second connection terminals. Since dummy terminals that are not connected to both groups are not arranged, the space of the electro-optical device substrate can be used effectively. Thereby, wiring can be easily formed between the first and second inspection terminal groups and the first and second connection terminal groups. Further, since the interval between the inspection terminals of the first inspection terminal group is an integral multiple of the interval between the inspection terminals of the second inspection terminal group, for example, when performing the inspection, The inspection member terminal group to be brought into contact with the second inspection terminal group can be used in common.

  An electro-optical device according to another aspect of the present invention includes first and second substrates sandwiching an electro-optical material, first and second connection terminal groups provided on the first substrate, First and second electronic components mounted on the first substrate and having a third connection terminal group connected to the first and second connection terminal groups on a mounting surface, and the first substrate A first inspection terminal connected to the first or second connection terminal group in the region where at least one of the first and second electronic components is mounted and the first and second connection terminals; And an inspection terminal group in which second inspection terminals not connected to the two connection terminal groups are regularly arranged.

  According to the present invention, the first connected to the first or second connection terminal group is provided on the first substrate and in the region where at least one of the first and second electronic components is mounted. Since the inspection terminal and the first and second connection terminal groups are provided with the inspection terminal group in which the second inspection terminals that are not connected are regularly arranged, the first and second connection terminal groups And the length of the wiring formed between the first inspection terminals. As a result, even when the pitches of the connection terminal group and the inspection terminal group are different, the electrical resistance value of the wiring connecting the connection terminal group and the inspection terminal group is prevented from increasing, and the wiring is easily formed. can do.

  Here, “regularly arranged” means, for example, arranging depending on the number of wires of the inspection member terminal group brought into contact with the inspection terminal group at the time of short inspection. In the inspection apparatus provided with the inspection member terminal group, wiring connected to each inspection member terminal of the inspection member terminal group is provided. This wiring is branched into a plurality of pieces, and each of them is connected so as to fly, for example, one, two, or three inspection member terminals in the inspection member terminal group. In addition, for other inspection member terminals, other branched wirings are connected in such a way that the inspection member terminals are blown one by one, two or three at a time, and adjacent inspection member terminals are connected to different wirings. It has come to be. In the short inspection, the adjacent inspection member terminals are brought into contact with the adjacent first or second inspection terminals. Here, for example, the short inspection is performed by, for example, applying a predetermined voltage between the wirings and confirming the presence or absence of a current, so that the inspection terminals that are in contact with the inspection member terminals connected to the same wiring are connected. A short cannot be detected. The short inspection is mainly performed to detect a short circuit of an electrode or the like connected to the first inspection terminal. Depending on the arrangement of the first and second inspection terminals, the first inspection terminals connected to the adjacent first or second connection terminal group contact the inspection member terminals connected to the same wiring, respectively. There is a case. For example, when the second inspection terminals are arranged in succession and the inspection terminal group is arranged so that the first connection terminals are arranged on both sides thereof, the wiring branches so that two inspection member terminals are skipped by two. When the short inspection is performed using the inspection device connected in this manner, the inspection member terminal that is not connected to the wiring is brought into contact with the second inspection terminal, and the first inspection is performed on both sides of the second inspection terminal. The inspection member terminal connected to the same wiring comes into contact with the inspection terminal. For this reason, it is impossible to detect a short circuit between the electrodes connected to the first inspection terminal. Therefore, when there are two wires connected to the inspection member terminal group, for example, if two second inspection terminals are arranged so as to be sandwiched between the first inspection terminals, the first inspection is performed. It is possible to detect a short circuit between the electrodes without contacting the inspection member terminal connected to the same wiring to the terminal for use. Thus, by arranging the first and second inspection terminals regularly, it is possible to reliably detect a short circuit when the inspection member terminals are brought into contact with the first and second inspection terminals.

  According to an aspect of the present invention, the first connection terminal group is arranged at a first pitch, and the second connection terminal group is arranged at a second pitch different from the first pitch. It is characterized by being. Thereby, it is possible to easily form a wiring for connecting the first and second connection terminals and the electrodes connected to the first and second connection terminals, and at the same time, the pitch between the connection terminals and the inspection terminals is increased. Even if they are different, wiring for connecting the connection terminal group and the inspection terminal group can be easily formed.

  According to an aspect of the present invention, the inspection terminal group is characterized in that each inspection terminal is arranged at the same pitch as the smaller one of the first and second pitches. As a result, the wiring between the first connection terminal and the second connection terminal and the inspection terminal can be easily routed, and the wiring can be connected short.

  According to an aspect of the present invention, the inspection terminal group is characterized in that the inspection terminals are arranged at a third pitch smaller than the first and second pitches. As a result, it is easy to share the inspection member terminals used in other electro-optical devices, and the formation of the inspection terminal group is facilitated.

  According to an aspect of the present invention, the inspection terminal group is characterized in that the inspection terminals are arranged at an equal pitch. Thereby, since the inspection terminal groups are arranged at an equal pitch, the formation of the inspection terminals is facilitated. For example, if the inspection member terminals are arranged in accordance with the pitch, different electro-optical devices can be used. The inspection member terminal can be used in common.

  According to one aspect of the present invention, the inspection terminal groups are arranged at regular intervals, and groups including a plurality of inspection member terminals to which different voltages are applied are repeatedly arranged, and the inspection terminal group The second inspection terminals are (A × N−1) continuous when the number of inspection member terminals in the group is A and the natural number is N. It is characterized by not being arranged by. According to the present invention, since the inspection terminal group is arranged so that the second inspection terminals are not arranged in a continuous manner (A × N−1), adjacent to both ends of the arrangement of the second inspection terminals. Thus, the respective first inspection terminals arranged in this manner do not come into contact with the inspection group terminals of the same group. Thereby, when a voltage is applied by bringing the inspection member terminal group into contact with the inspection terminal group, it is possible to detect without leakage even if the electrode or the like is short-circuited.

  An electronic apparatus according to another aspect of the invention includes the above-described electro-optical device (including an electro-optical device using an electro-optical device substrate).

  An inspection apparatus according to another aspect of the present invention is an inspection member arranged at the same pitch as the inspection terminal group of the electro-optical device (including an electro-optical device using an electro-optical device substrate). A terminal group is provided.

  According to the present invention, since the inspection member terminal group is arranged at the same pitch as the inspection terminal group of the electro-optical device, the inspection member terminal group is securely connected to all inspection terminal groups. In addition, a common inspection member terminal can be used in each electro-optical device during inspection. Thereby, the effort and cost which arrange | position an inspection member terminal according to the space | interval of the terminal group for an inspection about every inspection apparatus can be reduced.

  An inspection method according to another aspect of the present invention is an inspection method for an electro-optical device including a pair of substrates, wherein one of the substrates is arranged at a predetermined interval; A second connection terminal group arranged at an interval narrower than a predetermined interval, and an arrangement at the same interval as the connection terminals of the second connection terminal group, and one of the first and second connection terminal groups A test terminal group having a first test terminal connected and a second test terminal not connected to the first and second connection terminal groups, and a test member terminal group. And a step of contacting the inspection terminal group and a step of applying a predetermined voltage to the inspection member terminal group.

  According to the present invention, since the inspection terminals of the inspection terminal group are arranged at equal intervals at the same interval as the connection terminals of the second connection terminal group, the inspection member terminal group can be reliably brought into contact. it can. In addition, the inspection member terminal connected to the same wiring does not come into contact with the first inspection terminal, for example, a short circuit such as an electrode formed on the first substrate or the like and connected to the first and second connection terminals. Can be detected.

  An inspection method according to another aspect of the present invention includes first and second substrates that sandwich an electro-optic material, first and second connection terminal groups provided on the first substrate, A first inspection terminal connected to the first or second connection terminal group and on the first substrate in a region provided on the first substrate and mounting at least the first and second electronic components. The inspection terminal group of the electro-optic panel, the inspection terminal group regularly arranged with the second inspection terminals that are provided in the first connection terminal group and are not connected to the first or second connection terminal group, A step of aligning with the inspection member terminal group arranged at the same pitch as the pitch of the inspection terminal group, a step of bringing the inspection member terminal group into contact with the inspection terminal group, and the inspection member terminal group A step of detecting electrical quality by applying a predetermined voltage to Characterized in that it Bei.

  Here, the electro-optical panel refers to an electro-optical panel in a state where electronic components are not mounted.

  According to the present invention, the inspection terminal group of the electro-optical panel connected to the first and second connection terminal groups, and the inspection member terminal group arranged at the same pitch as the pitch of the inspection terminal group A step of aligning, a step of bringing the inspection member terminal group into contact with the inspection terminal group, and a step of detecting electrical quality by applying a predetermined voltage to the inspection member terminal group. Detecting a short circuit such as an electrode formed on an electro-optical panel and connected to the first and second connection terminals without contacting an inspection member terminal connected to the same wiring with one inspection terminal Can do.

  According to an aspect of the present invention, the inspection terminal group is arranged depending on the number of wirings connected to the inspection member terminal group.

  An electro-optical device manufacturing method according to another aspect of the present invention is an electro-optical device manufacturing method in which an electro-optical material is sandwiched between a first substrate and a second substrate, and the electro-optical device is formed on the first substrate. A step of forming first and second connection terminal groups; and at least one of first and second electronic components having a third connection terminal group connected to the first and second connection terminal groups on a mounting surface In a region where one is mounted, a first inspection terminal connected to the first or second connection terminal group, and a second inspection terminal not connected to the first and second connection terminal groups, Are formed on the first substrate, and the inspection member terminal group arranged at the same pitch as the inspection terminal group is used as the inspection terminal group. A step of performing an electrical inspection by contacting the first electronic component and the first electronic component; Characterized by comprising the step of mounting the.

  According to the present invention, in the region where at least one of the first and second electronic components having the third connection terminal group connected to the first and second connection terminal groups on the mounting surface is mounted. Inspection terminals in which first inspection terminals connected to one or the second connection terminal group and second inspection terminals not connected to the first and second connection terminal groups are regularly arranged. Forming a group on the first substrate, and performing an electrical inspection by bringing the inspection member terminal group arranged at the same pitch as the inspection terminal group into contact with the inspection terminal group. Therefore, even when the pitch between the connection terminal and the inspection terminal is different, it is possible to suppress an increase in the electrical resistance value, and when the inspection member terminal is brought into contact with the first and second inspection terminals. Short detection can be performed reliably.

  As described above, according to the present invention, even when the pitch between the connection terminal and the inspection terminal is different, the electrical resistance value of the wiring connecting the connection terminal group and the inspection terminal group is prevented from increasing. Wiring can be easily formed.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  FIG. 1 is a perspective view showing a configuration of a liquid crystal device 1 according to the present invention.

  The liquid crystal device 1 is sealed in a gap between the substrate 2 and the substrate 3 as the first substrate and the substrate 3 as the second substrate, which are bonded to face each other with the sealant 4 therebetween. Liquid crystal (not shown). A lighting device such as a backlight and other incidental devices are attached as necessary (not shown). Here, the liquid crystal device 1 may be any of a TFT (Thin Film Transistor) active matrix type, a passive matrix type, a TFD (Thin Film Diode) active matrix type liquid crystal device, and the like. Is applicable not only to liquid crystal devices but also to other electro-optical devices such as inorganic or organic electroluminescence devices, plasma display devices, electrophoretic display devices, and devices using electron-emitting devices.

  Hereinafter, a TFD active matrix type will be described as an example of the liquid crystal device 1.

  The substrate 2 and the substrate 3 are plate-like members made of a light-transmitting material such as glass or synthetic resin. A signal electrode 5 is formed in the X direction on the inner (liquid crystal side) surface of the substrate 2, and a pixel electrode (not shown) is formed for each pixel. On the other hand, a scanning electrode 6 is formed on the inner surface of the substrate 3 in the Y direction. For example, as shown in FIG. 1, the scanning electrode 6 is formed such that the upper half is drawn to the left side and the lower half is drawn to the right side. The signal electrode 5 and the scanning electrode 6 are formed of a transparent conductive material such as ITO (Indium Tin Oxide). In addition, a thin film diode D connected to the signal electrode 5 and the pixel electrode is provided for each pixel.

  In addition, the substrate 2 has a region (hereinafter referred to as “projected portion”) 2 a that projects from the outer peripheral edge of the substrate 3. On the surface of the projecting portion 2a, an output terminal group 7 as a first connection terminal group, output terminal groups 8 and 9 as a second connection terminal group, input terminal groups 10, 11, 12 and the like are formed, An LCD driver X driver IC 13 and Y driver ICs 14 and 15 are mounted as first and second electronic components. The signal electrode 5 extends and is connected to the output terminal group 7, and the scanning electrode 6 extends and is connected to the output terminal groups 8 and 9.

  FIG. 2 is an enlarged plan view of the protruding portion 2 a of the liquid crystal device 1. For convenience of explanation, the X driver IC 13 and the Y driver ICs 14 and 15 are indicated by broken lines.

  The X driver IC 13 and the Y driver ICs 14 and 15 are output terminal groups 7, 8 and 9 and input terminal groups 10 and 11 through bump electrode groups (13 a to 15 a and 13 b to 15 b) as third connection terminal groups. 12 is connected. The output terminal group 7 is arranged at an interval d1, for example, so that adjacent output terminals have an equal pitch on the projecting portion 2a. The output terminal groups 8 and 9 are arranged at an equal pitch so that the distance between adjacent output terminals is a distance d2 that is narrower than the distance d1 between the output terminals of the output terminal group 7. The inspection terminal group 16 is formed, for example, in a strip shape, and each inspection terminal is formed of, for example, a layer of tantalum on the substrate 2 as a base layer, and on that is made of chromium as a main body of the inspection terminal. It has a structure in which layers are stacked and further covered with an ITO layer. By forming the tantalum layer, the chromium layer can be formed more stably, and by covering with the ITO layer, the contact of the probe terminal for inspection can be improved and the chromium layer can be prevented from being damaged. it can. Of course, the inspection terminal group 16 is not limited to this configuration.

  The inspection terminal groups 16 are arranged at an equal pitch so that the interval between the adjacent inspection terminals is equal to the interval d2 between the output terminals of the output terminal groups 8 and 9, and the output terminal group 7 is connected by the wiring 17 respectively. , 8 and 9. In the region where the X driver IC 13 is mounted, for example, three inspection terminals 16a as first inspection terminals connected to the output terminal group 7 by the wiring 17 are arranged side by side, and next to the output terminal group 7 For example, one inspection terminal 16b as a second inspection terminal that is not connected to is arranged. In this way, the inspection terminals 16b are arranged in a jumping manner between the inspection terminals 16a. In the area where the Y driver ICs 14 and 15 are mounted, the output terminals of the output terminal groups 8 and 9 and the inspection terminals of the inspection terminal group 16 are arranged so as to be connected to the wiring 17 on a one-to-one basis.

  FIG. 3 is a schematic diagram of the inspection device 19.

  The inspection device 19 is for inspecting whether or not an electrical short circuit (short) has occurred between the wirings of the liquid crystal device 1 such as the output terminal group 7 and the signal electrode 5. And a probe terminal group 21 as a terminal group. The main body 20 includes a circuit board (not shown) for supplying a driving signal for inspection, and a lamp (not shown) that is turned on when there is an electrical short circuit between the wiring such as the output terminal group 7 and the signal electrode 5. Etc.) are provided. The probe terminal group 21 is formed in a pin shape from a conductive material such as tungsten, and one end thereof is connected to the circuit board. The probe terminal group 21 is arranged so as to have the same pitch d2 as the pitch of the inspection terminal group 16.

  FIG. 4 is a diagram schematically showing the wiring of the inspection device 19.

  For example, the wiring F1 is branched and connected to the probe terminal E5, the probe terminal E9, and the like by skipping the probe terminal E1 at the left end in the figure and the three probe terminals E2, E3, and E4. The wiring F2 is branched and connected to the probe terminals E2, E6 and the like. The wiring F3 is branched and connected to probe terminals E3 and E7. The wiring F4 is branched and connected to probe terminals E4 and E8. The wirings F1 to F4 are connected to a voltage application unit 23 that applies a predetermined voltage to the wirings. The control unit 24 determines electrical quality (in this case, the presence / absence of a short circuit) based on the presence / absence of a current flowing through the wiring.

  The probe terminal for inspection is not limited to the pin shape as described above. For example, as shown in FIG. 5, the same pitch as the inspection terminal group 16 on the flexible substrate F is used. The wiring 30 may be formed so as to be d2, and the probe terminal bump group 31 as the probe terminal may be formed thereon. An insulating layer 32 made of, for example, polyimide is formed between one wiring and probe terminal bump and the adjacent wiring and probe terminal bump. It is also possible to perform an electrical inspection by bringing the probe terminal bump group 31 into contact with the inspection terminal group 16. For example, when the inspection terminal group 16 is finely formed, the probe terminal bump group 31 also needs to be finely formed. In particular, by forming the probe terminal bump group 31 on the flexible substrate F2, it is easy and Can be manufactured at low cost.

  Here, the rules for the arrangement of the inspection terminals 16a and the inspection terminals 16b will be described. For example, when the inspection terminal 16a and the inspection terminal 16b have A wirings 21a, when (A × N-1) inspection terminals 16b are continuously arranged (N is a natural number), the same wiring 21a is used. Since the probe terminal branched and connected comes into contact with the inspection terminal connected to the adjacent output terminal, a short circuit between the signal electrode 5 or the scanning electrode 6 connected to the output terminal is detected. I can't.

  A specific description will be given with reference to FIG. In FIG. 6, a terminal indicated by a solid line represents the inspection terminal 16a, and a terminal indicated by a broken line represents the inspection terminal 16b.

  FIG. 6A shows a case where there are two wirings 21a. Probe terminals H1 to H8 are in contact with the inspection terminals G1 to G8, respectively. The wiring J1 is branched and connected to the probe terminals H1, H3, H5, and H7, and the wiring J2 is branched and connected to the probe terminals H2, H4, H6, and H8.

  For example, when (2 × N−1) test terminals 16b are arranged between the test terminals 16a, for example, one by one (G4 is the test terminal 16b, the other is the test terminal 16a), the test is performed. Inspection terminals G3 and G5 arranged across the terminal G4 are connected to adjacent output terminals. Since the probe terminals H3 and H5 that are in contact with the inspection terminals G3 and G5 are connected to the same wiring J1, when the probe terminals H1 to H8 are brought into contact with the inspection terminals G1 to G8, the inspection terminals G3 and A short circuit of the signal electrode 5 and the scanning electrode 6 connected to G5 cannot be detected. Similarly, for example, when three inspection terminals 16b are continuously arranged between the inspection terminals 16a (G4, G5, and G6 are inspection terminals 16b, and others are inspection terminals 16a), the inspection terminal G4 , G5 and G6, inspection terminals G3 and G7 arranged respectively are connected to adjacent output terminals. Since the probe terminals H3 and H7 that are in contact with the inspection terminals G3 and G7 are connected to the same wiring J1, even if the probe terminals H1 to H8 are brought into contact with the inspection terminals G1 to G8, the inspection terminal G3. In addition, it is impossible to detect a short circuit of the signal electrode 5 and the scanning electrode 6 connected to G7.

  When two inspection terminals 16b are continuously arranged (G4 and G5 are inspection terminals 16b, and the other are inspection terminals 16a), the inspection terminals G3 and G6 are connected to adjacent output terminals, respectively. Since the probe terminal H3 that is in contact with the inspection terminal G3 is connected to the wiring J1, and the probe terminal H6 that is in contact with the inspection terminal G6 is connected to the wiring J2, the probe terminals H1 to H8 are connected to the inspection terminal. When brought into contact with G1 to G8, it is possible to detect a short circuit of the signal electrode 5 and the scanning electrode 6 connected to the inspection terminals G3 and G6. Similarly, when four inspection terminals 16b are arranged in succession (G4, G5, G6, and G7 are inspection terminals 16b, and others are inspection terminals 16a), the inspection terminals G3 and G8 are respectively connected to adjacent output terminals. Connected. The probe terminal H3 that is in contact with the inspection terminal G3 is connected to the wiring J1, and the probe terminal H8 that is in contact with the inspection terminal G8 is connected to the wiring J2. Therefore, the probe terminals H1 to H8 are connected to the inspection terminals G1 to G8. , It is possible to detect a short circuit of the signal electrode 5 and the scanning electrode 6 connected to the inspection terminals G3 and G8.

  FIG. 6B shows a case where there are three wirings 21a. Probe terminals H1 to H9 are in contact with the inspection terminals G1 to G9, respectively. The wiring J1 is branched and connected to the probe terminals H1, H4, and H7, the wiring J2 is branched and connected to the probe terminals H2, H5, and H8, and the wiring J3 is branched to the probe terminals H3, H6, and H9. Connected.

  For example, when (3 × N−1) test terminals 16b are arranged between the test terminals 16a, for example, two consecutive terminals are arranged (G4 and G5 are test terminals 16b, and the other test terminals are 16a. ), Inspection terminals G3 and G6 arranged across inspection terminals G4 and G5 are connected to adjacent output terminals, respectively. Since the probe terminals H3 and H6 that are in contact with the inspection terminals G3 and G6 are connected to the same wiring J3, even if the probe terminals H1 to H8 are brought into contact with the inspection terminals G1 to G8, the inspection terminal G3. In addition, it is impossible to detect a short circuit between the signal electrode 5 and the scanning electrode 6 connected to G6.

  Further, when the inspection terminals 16b are arranged and arranged one by one between the inspection terminals 16a (G4 is the inspection terminal 16b, the other is the inspection terminal 16a), and when three are arranged and arranged (G4) , G5 and G6 are inspection terminals 16b, and others are inspection terminals 16a), and are arranged in a row (G4, G5, G6 and G7 are inspection terminals 16b, and others are inspection terminals 16a). Each of the two inspection terminals 16a arranged with the inspection terminal 16b interposed therebetween is connected to the adjacent output terminal. Since the probe terminals of the probe terminal group 21 that are in contact with the two inspection terminals 16a are connected to different wirings 21a, when the probe terminal group 21 is brought into contact with the inspection terminal group 16, two inspection terminals are used. A short circuit of the signal electrode 5 and the scanning electrode 6 connected to the terminal 16a can be detected.

  FIG. 6C shows the case where there are four wirings 21a. Probe terminals H1 to H12 are in contact with the inspection terminals G1 to G12, respectively. The wiring J1 is branched and connected to the probe terminals H1, H5, and H9, the wiring J2 is branched and connected to the probe terminals H2, H6, and H10, and the wiring J3 is branched to the probe terminals H3, H7, and H11. The wiring J4 is branched and connected to the probe terminals H4, H8, and H12.

  For example, when (4 × N−1), for example, three inspection terminals 16b are arranged between the inspection terminals 16a and arranged (G4, G5, and G6 are inspection terminals 16b, and others are inspection terminals 16a). ), Inspection terminals G3 and G7 arranged across the inspection terminals G4, G5 and G6 are connected to adjacent output terminals, respectively. Since the probe terminals H3 and H7 that are in contact with the inspection terminals G3 and G7 are connected to the same wiring J3, the inspection terminal G3 even if the probe terminals H1 to H12 are in contact with the inspection terminals G1 to G12. In addition, it is impossible to detect a short circuit of the signal electrode 5 and the scanning electrode 6 connected to G7.

  Further, when the inspection terminals 16b are arranged and arranged one by one between the inspection terminals 16a (G4 is the inspection terminal 16b, the other are the inspection terminals 16a), and when two are arranged and arranged (G4) And G5 are inspection terminals 16b and others are inspection terminals 16a), and when arranged in a row (G4, G5, G6 and G7 are inspection terminals 16b, others are inspection terminals 16a), Two inspection terminals 16a arranged with the inspection terminal 16b interposed therebetween are respectively connected to adjacent output terminals. Since the probe terminals of the probe terminal group 21 that are in contact with the two inspection terminals 16a are connected to different wirings 21a, when the probe terminal group 21 is brought into contact with the inspection terminal group 16, two inspection terminals are used. A short circuit of the signal electrode 5 and the scanning electrode 6 connected to the terminal 16a can be detected.

  In this way, the inspection terminals 16a and the inspection terminals 16b are arranged so that the inspection terminals 16b are not continuously arranged (A × N−1). For example, in the case of FIG. 2, since the inspection terminals 16b are arranged one by one, the use of the inspection device 19 having two wirings 21a corresponds to the case of one in FIG. Cannot be detected. For this reason, at the time of inspection, for example, the inspection is performed using the inspection device 19 having three or four wirings 21a. Thereby, short-circuit detection can be reliably performed when the probe terminal group 21 is brought into contact with the inspection terminal group 16.

  FIG. 7 is a flowchart showing a manufacturing process of the liquid crystal device 1 including a short inspection process using the inspection apparatus 19.

  The manufacturing process of the liquid crystal device 1 includes a step of forming an electro-optical panel (step 701), a step of aligning the inspection terminal group 16 and the probe terminal group 21 (step 702), and the probe terminal group 21 as an inspection terminal. A step of contacting the group 16 (step 703), a step of determining the presence or absence of a short circuit (step 704), and a step of mounting a driving driver on the electro-optical panel (step 705).

  In step 701, the signal electrode 5, the output terminal groups 7, 8, 9, the input terminal groups 10, 11, 12 and the inspection terminal group 16 are formed on the substrate 2, and the scan electrode 6 is formed on the substrate 3. Then, spacers are dispersed on the substrate 2, and the substrates 2 and 3 are bonded together via the seal material 4 to form an electro-optical panel. Here, the electro-optical panel refers to an electro-optical panel in a state where the X driver IC 13 and the Y driver ICs 14 and 15 are not mounted.

  Steps 702 to 704 are inspection processes. Positioning is performed so that the positions of the probe terminal group 21 and the inspection terminal group 16 correspond to each other. Then, as shown in FIG. 8, each of the probe terminal groups 21 is brought into contact with the inspection terminal group 16. In this state, a predetermined voltage is applied to the probe terminal group 21 to detect whether or not the lamp described above is lit. For example, when a predetermined voltage is applied between F1 and F2, and the signal electrode 5 and the like are short-circuited between the inspection terminals that are in contact with the probe terminals E1 and E2, a current flows and the voltage application unit 23 The information is transmitted to the control unit 24. The control unit 24 determines electrical quality (in this case, the presence / absence of a short circuit) based on the information or the like, and displays it on, for example, the above-described lamp (not shown). For example, when K1 to K3, K5 to K7, K9 and K10 are inspection terminals 16a and K4 and K8 are inspection terminals 16b, K3 and K5, K7 and K9 are connected to adjacent output terminals, respectively. However, since the probe terminals E3 and E5 that contact K3 and K5 are connected to F3 and F1, respectively, and the probe terminals E7 and E9 that contact K7 and K9 are connected to F3 and F1, respectively, K3, K5 , K7 and K9 can detect a short circuit between the signal electrode 5, the scanning electrode 6 and the like.

  In step 705, the X driver IC 13 and the Y driver ICs 14 and 15 are thermocompression-bonded to predetermined positions on the overhanging portion 2a via, for example, an ACF (not shown).

  Thereafter, an illuminating device such as a backlight and other auxiliary devices are attached as necessary, and the liquid crystal device 1 is completed.

  Thus, according to the present embodiment, the inspection terminal 16a connected to the output terminal group 7 and the output terminal group 7 are not connected in the region provided on the substrate 2 and mounted at least with the X driver IC 13. Since the inspection terminal group 16 in which the inspection terminals 16b are regularly arranged is provided, the length of the wiring formed between the output terminal group 7 and the inspection terminal 16a can be suppressed. Conventionally, as shown in FIG. 9, when the pitch between the output terminal group 7 and the inspection terminal group 16 is different, the length of the wiring 17 formed between the output terminal group 7 and the inspection terminal group 16 is long. Depending on the size of the output terminal group 7 and the inspection terminal group 16, the wiring 17 needs to be formed thin. Then, there arises a problem that the electric resistance value of the wiring 17 becomes large. With the configuration of the present embodiment, for example, even if the pitches of the output terminal group 7 and the inspection terminal group 16 are different, the electricity of the wiring 17 that connects the output terminal group 7 and the inspection terminal group 16 is used. The wiring 17 can be easily formed while suppressing an increase in the resistance value.

  (Second Embodiment)

  FIG. 10 is a diagram showing a liquid crystal device according to the second embodiment of the present invention.

  In the present embodiment, the distance d2 between the output terminals of the output terminal groups 8 and 9 is wider than the distance d1 between the output terminals of the output terminal group 7. In the region where the X driver IC 13 is mounted, the output terminals of the output terminal group 7 and the inspection terminals of the inspection terminal group 16 are arranged so as to be connected to the wiring 17 on a one-to-one basis. In the area where the Y driver ICs 14 and 15 are mounted, for example, three test terminals 16a connected to the output terminal groups 8 and 9 by the wiring 17 are arranged side by side, and next to the output terminal groups 8 and 9 are For example, one inspection terminal 16b that is not connected is arranged.

  Even in the configuration of the present embodiment, the inspection terminal 16a connected to the output terminal groups 8 and 9 in the region where the Y driver ICs 14 and 15 are mounted at least on the substrate 2, and the output terminal group 8 and 9 includes the inspection terminal group 16 in which inspection terminals 16b that are not connected are regularly arranged. Therefore, the length of the wiring 17 formed between the output terminal groups 8 and 9 and the inspection terminals is reduced. Can be suppressed. Thereby, it is possible to suppress an increase in the electrical resistance value of the wiring 17 connecting the output terminal groups 8 and 9 and the inspection terminal group 16, and for example, the output terminal groups 8 and 9 and the inspection terminal group 16. Even if the pitches are different, the wiring 17 connecting the output terminal groups 8 and 9 and the inspection terminal group 16 can be easily routed, and the wiring 17 can be connected short.

  (Third embodiment)

  FIG. 11 is a diagram showing a liquid crystal device according to the third embodiment of the present invention.

  In the present embodiment, the pitch d3 of the inspection terminal group 16 is narrower than any of the pitch d1 of the output terminal group 7 and the pitch d2 of the output terminals 8 and 9. Further, in the region where the X driver IC 13 is mounted, for example, three inspection terminals 16a connected to the output terminal group 7 by the wiring 17 are arranged side by side, and adjacent to the output terminal group 7 are for inspection. For example, two terminals 16b are arranged. In the area where the Y driver ICs 14 and 15 are mounted, for example, four inspection terminals 16a connected to the output terminal groups 8 and 9 by the wiring 17 are arranged side by side, and next to the output terminal groups 8 and 9 are For example, two inspection terminals 16b that are not connected are arranged.

  In this case, since the number of inspection terminals 16b is two in both the mounting region of the X driver IC 13 and the mounting region of the Y driver ICs 14 and 15, assuming that the number of wirings 21a of the inspection device 19 is three, FIG. This corresponds to the case of b), and a short cannot be detected. For this reason, the inspection is performed by using, for example, two or four inspection devices 19 for the wiring 21a.

  Even in the configuration of this embodiment, the inspection terminals 16a connected to the output terminal groups 7, 8, and 9 are provided on the substrate 2 and at least in the region where the X driver IC 13 and the Y driver ICs 14 and 15 are mounted. Since the inspection terminal group 16 in which inspection terminals 16b not connected to the output terminal groups 7, 8, and 9 are regularly arranged is provided, the probe terminal group 21 used for the other liquid crystal device 1 can be shared. In addition, the inspection terminal group 16 can be easily formed.

  Further, since the inspection terminals of the inspection terminal group 16 are arranged at a pitch d3 narrower than any one of the pitch d1 of the output terminal group 7 and the pitch d2 of the output terminals 8 and 9, the probe terminal group 17 The pitch need not match the pitch of the output terminals 7, 8, 9, and may match the pitch d 3 of the inspection terminal group 16. This makes it easier to share the probe terminal group 17.

  The present invention is not limited to the embodiment described above, and various modifications are possible.

  For example, as shown in FIG. 12, in the projecting portion 2a, an output terminal group 7 arranged so that each interval is D1, and an output terminal arranged so that each interval is D2 narrower than D1. The groups 8 and 9 are connected to the output terminal group 7 and are connected to the inspection terminal group 16a as the first inspection terminal group and the output terminal groups 8 and 9, respectively, arranged at equal intervals d1. The inspection terminal group 16c is formed as a second inspection terminal group arranged at equal intervals d2. Here, the interval d1 between the inspection terminals of the inspection terminal group 16a is an integral multiple (here, twice) the interval d2 between the inspection terminals of the inspection terminal group 16c. Between the inspection terminal groups 16a and 16c and the output terminal groups 7, 8, and 9, the inspection terminal group 16a and the output terminal group 7 are connected, and the inspection terminal group 16c and the output terminal groups 8 and 9 are connected. Then, the wiring 17 is formed.

  According to such a configuration, all of the inspection terminal groups 16a are connected to the output terminal group 7, and all of the inspection terminal groups 16c are connected to the output terminal groups 8 and 9, and any of the output terminal groups 7, 8, 9 Since the dummy inspection terminals not connected to are not arranged, the space of the projecting portion 2a can be used effectively. Thereby, the wiring 17 can be easily formed between the inspection terminal groups 16a and 16c and the output terminal groups 7, 8, and 9. Further, since the interval between the inspection terminals of the inspection terminal group 16a is an integral multiple of the interval between the inspection terminals of the inspection terminal group 16c, for example, when performing inspection, the inspection terminal groups 16a, 16c For example, a group of probe terminals that are in contact with each other can be used in common for each liquid crystal device 1.

  (Electronics)

  FIG. 13 shows a mobile phone which is an embodiment of the electronic apparatus according to the present invention. The mobile phone 600 includes an operation unit 601 and a display unit 602. A plurality of operation buttons are arranged on the front surface of the operation unit 601, and a microphone is built in the transmitter unit. In addition, a speaker is disposed inside the receiver unit of the display unit 602.

  In the display unit 602, the liquid crystal device 1 described above is mounted inside the case body 603. The liquid crystal device 1 installed in the case body 603 is configured so that the display surface can be viewed through the display window 60A.

  Other electronic devices to which the liquid crystal device according to the present invention can be applied include a liquid crystal television, a viewfinder type / monitor direct view type video tape recorder, a car navigation device, a pager, an electronic notebook, a calculator, a word processor, a workstation, A video phone, a POS terminal, a digital still camera, etc. are mentioned.

1 is a schematic perspective view showing an overall configuration of an embodiment of a liquid crystal device according to the present invention. It is a schematic plan view which shows the overhang | projection part of the liquid crystal device which concerns on this embodiment. It is a schematic plan view which shows the structure of the inspection apparatus which concerns on this embodiment. It is a schematic sectional drawing which shows the structure of the inspection apparatus which concerns on this embodiment. It is a schematic sectional drawing which shows the structure of the other test | inspection apparatus which concerns on this embodiment. It is explanatory drawing of the wiring of the inspection apparatus which concerns on this embodiment. It is a flowchart which shows the manufacturing process of a liquid crystal device. It is a schematic side view which shows a mode that the probe terminal was made to contact the terminal for a test | inspection. It is a schematic plan view which shows the overhang | projection part of the conventional liquid crystal device. It is a schematic side view of the liquid crystal device and inspection device concerning another embodiment of the present invention. It is a schematic plan view of the liquid crystal device and inspection device concerning another embodiment of the present invention. It is a schematic plan view which shows the modification about the liquid crystal device which concerns on this invention. It is a schematic perspective view which shows the whole structure of the electronic device which concerns on this invention.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 ... Liquid crystal device 5 ... Signal electrode 6 ... Scanning electrode 7, 8, 9 ... Output terminal group 16 ... Inspection terminal group 17 ... Wiring 19 ... Inspection apparatus 21 ... Probe terminal group 21a ... Wiring 600 ... Cell-phone

Claims (7)

A first connection terminal group arranged at a predetermined equal pitch;
A second connection terminal group composed are arranged at a narrow regular pitch than the predetermined constant pitch,
A plurality of first inspection terminals connected to the first connection terminal group by wiring, and a plurality of terminals connected to the second connection terminal group by wiring and arranged side by side with the first inspection terminal. A second inspection terminal group, and an inspection terminal group including:
An unconnected terminal that is disposed in an area where the inspection terminal group is arranged and is not connected to any of the first and second connection terminal groups,
The inspection terminal group and the unconnected terminals are arranged at an equal pitch,
The plurality of first inspection terminals are divided into a plurality of groups by the unconnected terminals,
In the plurality of groups, the number of the first inspection terminals is equal,
The substrate for an electro-optical device , wherein the plurality of groups have the same wiring pattern for connecting the first connection terminal and the first inspection terminal.   2. The electro-optical device substrate according to claim 1, wherein each of the inspection terminals is arranged at the same pitch as the connection terminals of the second connection terminal group. The inspection terminal group, terminals for inspection are arranged with a pitch smaller than the pitch of the connection terminals of the first and second connecting terminal groups, the non-even in a region between said second inspection terminal The electro-optical device substrate according to claim 1, wherein a connection terminal is disposed. The inspection terminal group includes:
A group including a plurality of inspection member terminals to which different voltages are applied is repeatedly arranged, and provided corresponding to the inspection member terminal group to be brought into contact with the inspection terminal group,
When the number of inspection member terminals of the group is A and the natural number is N,
4. The electro-optical device substrate according to claim 1, wherein the unconnected terminals are not arranged in a continuous manner (A × N−1). 5. A first connection terminal group arranged at a predetermined pitch;
A second connection terminal group arranged at a pitch narrower than the predetermined pitch;
A plurality of first inspection terminals connected to the first connection terminal group by wiring, and a plurality of terminals connected to the second connection terminal group by wiring and arranged side by side with the first inspection terminal. A second inspection terminal group, and an inspection terminal group including:
An unconnected terminal that is disposed in an area where the inspection terminal group is arranged and is not connected to any of the first and second connection terminal groups,
The inspection terminal group and the non-connected terminals are arranged at an equal pitch, and a group including a plurality of inspection member terminals to which different voltages are applied is repeatedly arranged, and contact the inspection terminal group Provided corresponding to the inspection member terminal group to be made,
When the number of inspection member terminals of the group is A and the natural number is N,
The substrate for an electro-optical device, wherein the unconnected terminals are not continuously arranged (A × N−1). 6. The electro-optical device substrate according to claim 1, wherein the electro-optical device substrate is a first substrate, and the electro-optical material is sandwiched between the first substrate and the first substrate. A second substrate that,
First and second electronic components mounted on the first substrate and having a third connection terminal group connected to the first and second connection terminal groups on a mounting surface. Electro-optical device characterized.   An electronic apparatus comprising the electro-optical device using the electro-optical device substrate according to claim 1 or the electro-optical device according to claim 6 mounted thereon.

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