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JP4966751B2 - Method and apparatus for removing conductive metal oxide thin film - Google Patents
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JP4966751B2 - Method and apparatus for removing conductive metal oxide thin film - Google Patents

Method and apparatus for removing conductive metal oxide thin film Download PDF

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JP4966751B2
JP4966751B2 JP2007150628A JP2007150628A JP4966751B2 JP 4966751 B2 JP4966751 B2 JP 4966751B2 JP 2007150628 A JP2007150628 A JP 2007150628A JP 2007150628 A JP2007150628 A JP 2007150628A JP 4966751 B2 JP4966751 B2 JP 4966751B2
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positive electrode
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JP2008305910A (en
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剛 杉生
和之 砂山
孝信 椙本
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Kanadevia Corp
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Hitachi Zosen Corp
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Description

本発明は、例えばスパッタ蒸着などにより基材に形成された導電性金属酸化物薄膜を、再利用が可能なように除去する方法及びその方法を実施する装置に関するものである。   The present invention relates to a method for removing a conductive metal oxide thin film formed on a substrate by, for example, sputter deposition so that it can be reused, and an apparatus for carrying out the method.

例えばITO(インジウムとスズの酸化物で、透明導電性を有する膜)を形成した高機能ガラス基板は、光学的性能(透過率等)や機械的性能(平坦度等)に優れており、例えばフラットパネルディスプレイに用いられる。しかしながら、この高機能ガラス基板は高価であるため、その表面に形成するITOが品質管理基準を満足しない場合には、そのITOを除去して再利用することで、コストの低減を図っている。   For example, a high-performance glass substrate on which ITO (a film having transparent conductivity with an oxide of indium and tin) is excellent in optical performance (such as transmittance) and mechanical performance (such as flatness). Used for flat panel displays. However, since this high-performance glass substrate is expensive, when the ITO formed on the surface does not satisfy the quality control standard, the ITO is removed and reused to reduce the cost.

このITOなどの導電性金属酸化物薄膜を除去する方法として、機械的擦過により除去する方法や、化学エッチングにより除去する方法がある。このうち前者の方法は、図7に示すように、被加工物1の表面に形成した導電性金属酸化物薄膜1aを研摩ブラシ2により擦過することで除去するものである。   As a method of removing the conductive metal oxide thin film such as ITO, there are a method of removing by mechanical abrasion and a method of removing by chemical etching. Among these, the former method is to remove the conductive metal oxide thin film 1 a formed on the surface of the workpiece 1 by rubbing with a polishing brush 2 as shown in FIG. 7.

また、後者の方法は、図8に示すように、導電性金属酸化物薄膜1aを化学反応的に溶解させる化学液3に被加工物1を浸漬することで、その表面に形成した導電性金属酸化物薄膜1aを除去するものである(例えば特許文献1,2)。
特開平6−321581号公報 特開平9−86968号公報
In the latter method, as shown in FIG. 8, the conductive metal formed on the surface of the workpiece 1 is immersed in a chemical solution 3 for chemically dissolving the conductive metal oxide thin film 1a. The oxide thin film 1a is removed (for example, Patent Documents 1 and 2).
JP-A-6-321581 JP-A-9-86968

しかしながら、機械的擦過によって除去する方法は、研摩ブラシを擦りつけることから、被加工物の表面に擦過痕(疵)や応力変形を生じさせる場合がある。擦過痕が生じた場合、板のままでのガラス基材の再利用ができなくなる。また、対象とする被加工物がフラットパネルディスプレイの場合、ガラス基板のガラス厚みが0.5mm程度であるため、接触方式の機械的擦過では破損する可能性がある。従って、微妙なブラシの圧力調整が必要で、完全に剥離するためには長時間を要する。   However, since the method of removing by mechanical rubbing rubs the polishing brush, there are cases where rubbing marks (wrinkles) and stress deformation occur on the surface of the workpiece. When scratch marks are generated, it becomes impossible to reuse the glass substrate as it is. Moreover, when the object to be processed is a flat panel display, the glass thickness of the glass substrate is about 0.5 mm. Therefore, delicate pressure adjustment of the brush is necessary, and it takes a long time to completely peel off.

一方、化学エッチングによって除去する方法は、強酸や強アルカリの化学液を使用するので、基板表面に化学的応力が発生し、基板表面に変質層を生じさせる場合がある。また、取扱いに十分な注意を払う必要があり、作業性が悪くなるばかりでなく、使用後の電解液を廃液処理する必要がある。また、希少金属の回収には、別途抽出作業を必要とするために非常に不経済である。   On the other hand, the method of removing by chemical etching uses a strong acid or strong alkali chemical solution, so that chemical stress is generated on the surface of the substrate and an altered layer may be formed on the surface of the substrate. In addition, it is necessary to pay sufficient attention to handling, not only the workability is deteriorated, but also the electrolytic solution after use needs to be treated as a waste solution. Also, the collection of rare metals is very uneconomical because it requires a separate extraction operation.

本発明が解決しようとする問題点は、機械的擦過による方法では、擦過痕や応力変形が生じて基材を再利用できなくなり、またブラシの微妙な圧力調整が必要で完全剥離に長時間を要するという点である。一方、化学エッチングによる方法では、基板表面に変質層を生じさせる場合があり、また作業性が悪くなるばかりか、使用後の電解液を廃液処理する必要があり、しかも希少金属の回収に別途抽出作業が必要で、不経済であるという点である。   The problem to be solved by the present invention is that the method by mechanical abrasion causes scratch marks and stress deformation, and the substrate cannot be reused, and fine pressure adjustment of the brush is necessary, and a long time is required for complete peeling. It is necessary. On the other hand, the chemical etching method may cause a deteriorated layer on the surface of the substrate, and the workability is deteriorated. In addition, the used electrolytic solution needs to be treated as a waste solution, and is separately extracted for collecting rare metals. The work is necessary and uneconomical.

本発明の導電性金属酸化物薄膜の除去方法は、
精密な位置制御を必要とすることなく、ほぼ全域に亘って導電性金属酸化物薄膜を効率良く除去するために、
基材の表面に形成された導電性金属酸化物薄膜に対向すべく、基材との相対移動方向に、絶縁体を介在させて正電極と負電極を順に配置すると共に、このうちの負電極を基材表面の導電性金属酸化物薄膜と接触させ、
かつ前記正電極及び負電極と、基材表面の導電性金属酸化物薄膜間に電解液を介在させた状態で、前記正電極と負電極に電圧を印加して、前記正電極及び負電極と、基材を相対移動させることで、前記基材表面の導電性金属酸化物薄膜を還元反応により除去する導電性金属酸化物薄膜の除去方法において、
前記正電極を多孔体で形成し、
この正電極から負電極へ向く方向と反対方向に電解液を供給することで、前記還元反応により発生した基材表面の気泡を除去すると共に、正電極表面及び電解液中、または正電極表面又は電解液中の気泡を、前記正電極の背面側から吸引することを最も主要な特徴としている。
The method for removing the conductive metal oxide thin film of the present invention comprises:
In order to efficiently remove the conductive metal oxide thin film over almost the entire area without requiring precise position control,
In order to face the conductive metal oxide thin film formed on the surface of the base material, a positive electrode and a negative electrode are arranged in this order with an insulator interposed in the relative movement direction with respect to the base material. In contact with the conductive metal oxide thin film on the substrate surface,
And in the state which made electrolyte solution interpose between the said positive electrode and a negative electrode, and the electroconductive metal oxide thin film of the base-material surface, a voltage is applied to the said positive electrode and a negative electrode, The said positive electrode and a negative electrode, In the method for removing a conductive metal oxide thin film by removing the conductive metal oxide thin film on the surface of the base material by a reduction reaction by relatively moving the base material,
Forming the positive electrode with a porous body;
By supplying the electrolyte solution in a direction opposite to the direction from the positive electrode to the negative electrode, bubbles on the substrate surface generated by the reduction reaction are removed, and the positive electrode surface and the electrolyte solution, or the positive electrode surface or The main feature is that air bubbles in the electrolyte are sucked from the back side of the positive electrode.

本発明の導電性金属酸化物薄膜の除去方法では、基材表面の導電性金属酸化物に負電極を接触させることで、正電極直下の導電性金属酸化物表面を負電極化し、その負電極と正電極間の電解液を電気分解することによって、正電極の表面にOH、導電性金属酸化物表面にHを発生させ、発生したHによって導電性酸化物表面を還元させる。 In the method for removing a conductive metal oxide thin film of the present invention, a negative electrode is brought into contact with the conductive metal oxide on the surface of the base material, thereby converting the surface of the conductive metal oxide immediately below the positive electrode into a negative electrode. Electrolysis of the electrolyte solution between the positive electrode and the positive electrode generates OH − on the surface of the positive electrode and H + on the surface of the conductive metal oxide, and the conductive oxide surface is reduced by the generated H + .

その際、発生したHが電解液によって未加工の基材上に流され、これから還元される導電性金属酸化物薄膜を部分的に還元してしまうことで、導電性を阻害し、導電性金属酸化物が綺麗に還元されないことがある。 At that time, the generated H + is flowed on the raw substrate by the electrolytic solution, and the conductive metal oxide thin film to be reduced is partially reduced, thereby inhibiting the conductivity and the conductivity. Metal oxide may not be reduced cleanly.

しかしながら、本発明では、正電極から負電極へ向く方向と反対方向に電解液を供給することで、発生したH等の気泡を積極的に還元が完了した基材側に排除するのと共に、正電極表面や電解液中の気泡を正電極の背面側から吸引するので、前記の問題は発生しない。 However, in the present invention, by supplying the electrolyte in the direction opposite to the direction from the positive electrode to the negative electrode, the generated bubbles such as H + are positively excluded to the substrate side where the reduction has been completed, Since the bubbles on the surface of the positive electrode and the electrolyte are sucked from the back side of the positive electrode, the above problem does not occur.

本発明において、前記正電極を、多孔体で形成することに代えて、回動自在な円筒状に形成し、正電極表面及び電解液中、または正電極表面又は電解液中の気泡を、正電極の背面側から吸引することに代えて、円筒状に形成した正電極の回動により、正電極から負電極へ向く方向と反対方向に排出するようにしても良い。これが第2の本発明の導電性金属酸化物薄膜の除去方法である。   In the present invention, instead of forming the positive electrode with a porous body, the positive electrode is formed in a rotatable cylindrical shape, and bubbles on the positive electrode surface and the electrolyte solution, or on the positive electrode surface or the electrolyte solution, Instead of suction from the back side of the electrode, the positive electrode formed in a cylindrical shape may be rotated in a direction opposite to the direction from the positive electrode to the negative electrode. This is the second method for removing a conductive metal oxide thin film of the present invention.

この第2の本発明において、前記円筒状に形成した正電極を多孔体で形成し、内部から気泡或いは気泡及び電解液を吸引し、正電極の表面に気泡を付着させるようにすれば、正電極に接着しないような微小な気泡も正電極の表面に付着させることができる。これが第3の本発明の導電性金属酸化物薄膜の除去方法である。   In the second aspect of the present invention, if the positive electrode formed in the cylindrical shape is formed of a porous body, bubbles or bubbles and electrolyte are sucked from the inside, and the bubbles are attached to the surface of the positive electrode, Small bubbles that do not adhere to the electrode can also be attached to the surface of the positive electrode. This is the third method for removing a conductive metal oxide thin film of the present invention.

これら本発明の導電性金属酸化物薄膜の除去方法において、正電極から負電極へ向く方向と反対の方向に向けた電解液の供給は、正電極と負電極間より行なうことが望ましい。   In these methods for removing a conductive metal oxide thin film of the present invention, it is desirable to supply the electrolyte solution in the direction opposite to the direction from the positive electrode to the negative electrode from between the positive electrode and the negative electrode.

本発明の導電性金属酸化物薄膜の除去方法は、
基材の表面に形成された導電性金属酸化物薄膜に対向し、かつ負電極のみが基板と接触するように、間に絶縁体を介して、基材との相対移動方向に順に配置された多孔体で形成した正電極、及び負電極と、
これら正電極及び負電極と、基材表面の導電性金属酸化物薄膜間に電解液を介在させるべく、前記正電極から負電極へ向く方向と反対の方向に向けて電解液を供給する電解液供給手段と、
前記正電極と負電極に電圧を印加する電源と、
前記正電極及び負電極と、基材との相対移動手段と、
前記正電極に連結された吸引手段を備え、
前記供給された電解液により、前記還元反応によって発生した基材表面の気泡を除去すると共に、前記吸引手段により、正電極表面及び電解液中、または正電極表面又は電解液中の気泡を、正電極の背面側から吸引するようにした本発明の導電性金属酸化物薄膜の除去装置を使用することによって実施できる。
The method for removing the conductive metal oxide thin film of the present invention comprises:
Opposite to the conductive metal oxide thin film formed on the surface of the base material, and arranged in order in the direction of relative movement with the base material via an insulator so that only the negative electrode is in contact with the substrate A positive electrode and a negative electrode formed of a porous body;
An electrolytic solution for supplying an electrolytic solution in a direction opposite to the direction from the positive electrode to the negative electrode so that the electrolytic solution is interposed between the positive electrode and the negative electrode and the conductive metal oxide thin film on the surface of the base material. Supply means;
A power source for applying a voltage to the positive electrode and the negative electrode;
Means for relative movement of the positive and negative electrodes and the substrate;
Comprising suction means connected to the positive electrode;
The supplied electrolyte solution removes bubbles on the surface of the base material generated by the reduction reaction, and the suction means causes the positive electrode surface and the electrolyte solution, or the positive electrode surface or the bubbles in the electrolyte solution to be positive. This can be carried out by using the conductive metal oxide thin film removing apparatus of the present invention in which suction is performed from the back side of the electrode.

また第2の本発明の導電性金属酸化物薄膜の除去方法は、
前記正電極を、多孔体で形成することに代えて、回動自在な円筒状に形成すると共に、前記吸引手段に代えて、正電極の回動手段を備えさせ、
正電極表面及び電解液中、または正電極表面又は電解液中の気泡を、正電極の背面側から吸引することに代えて、円筒状に形成した正電極を回動させることにより、正電極から負電極へ向く方向と反対方向に排出するようにした第2の本発明の導電性金属酸化物薄膜の除去装置を使用することによって実施できる。
Moreover, the removal method of the electroconductive metal oxide thin film of 2nd this invention is the following.
Instead of forming the positive electrode with a porous body, it is formed in a rotatable cylindrical shape, and instead of the suction means, a positive electrode rotating means is provided,
Instead of sucking the positive electrode surface and the electrolyte solution, or bubbles in the positive electrode surface or the electrolyte solution from the back side of the positive electrode, by rotating the positive electrode formed in a cylindrical shape, This can be carried out by using the conductive metal oxide thin film removing apparatus according to the second aspect of the present invention, which discharges in the direction opposite to the direction toward the negative electrode.

また第3の本発明の導電性金属酸化物薄膜の除去方法は、
前記第2の本発明の導電性金属酸化物薄膜の除去装置を構成する正電極を多孔体で形成し、この正電極の内部に連結した吸引手段をさらに設けた第3の本発明の導電性金属酸化物薄膜の除去装置を使用することによって実施できる。
Moreover, the removal method of the conductive metal oxide thin film of the third aspect of the present invention is as follows.
The electroconductive metal oxide film according to the third aspect of the present invention, wherein the positive electrode constituting the electroconductive metal oxide thin film removing device of the second aspect of the present invention is formed of a porous body, and further provided with suction means connected to the inside of the positive electrode. This can be done by using a metal oxide thin film removal apparatus.

これら本発明の導電性金属酸化物薄膜の除去装置における電解液供給手段は、正電極と負電極間に電解液供給ノズルを設けたものが望ましい。   It is desirable that the electrolytic solution supply means in the conductive metal oxide thin film removing apparatus of the present invention is provided with an electrolytic solution supply nozzle between the positive electrode and the negative electrode.

本発明の導電性金属酸化物薄膜の除去装置において、前記絶縁体及び負電極を、基材との相対移動方向に対して傾けて配置した場合には、より広範囲にわたって導電性金属酸化物薄膜を除去することができる。   In the apparatus for removing a conductive metal oxide thin film of the present invention, when the insulator and the negative electrode are disposed to be inclined with respect to the relative movement direction with respect to the base material, the conductive metal oxide thin film is spread over a wider range. Can be removed.

本発明では、正電極から負電極へ向く方向と反対の方向に向けて電解液を供給して還元反応により発生した基材表面の気泡を除去するので、正電極と負電極との設置間隔を短くでき、基材の後端部に未還元のまま残留する導電性金属酸化物薄膜を減少できる。また、加工速度を速くすることもできる。   In the present invention, the electrolyte solution is supplied in the direction opposite to the direction from the positive electrode to the negative electrode to remove the bubbles on the substrate surface generated by the reduction reaction, so that the installation interval between the positive electrode and the negative electrode is increased. The conductive metal oxide thin film remaining unreduced at the rear end portion of the substrate can be reduced. In addition, the processing speed can be increased.

また、正電極表面や電解液中の気泡を、正電極の背面側から吸引したり、正電極を回動させることにより正電極から負電極へ向く方向と反対方向に排出したりするので、前記未還元のまま残留する導電性金属酸化物薄膜をより減少できる。   In addition, the air in the positive electrode surface and the electrolyte solution is sucked from the back side of the positive electrode or discharged in the direction opposite to the direction from the positive electrode to the negative electrode by rotating the positive electrode. The conductive metal oxide thin film remaining unreduced can be further reduced.

また、強酸や強アルカリの化学液を使用しないので、環境負荷も低減でき、基材を始めとする希少金属などの資源サイクルも可能になって、経済的にも有利である。   Further, since no strong acid or strong alkali chemical solution is used, the environmental load can be reduced, and resource cycles such as rare metals such as base materials can be realized, which is economically advantageous.

以下、本発明の基本原理を、図1を用いて説明した後、本発明を実施するための最良の形態と共に各種の形態を図2〜図6を用いて詳細に説明する。
本発明は、できるだけ基材への疵や応力変形などを残さない加工法で、かつ、強酸や強アルカリを使用しない導電性金属酸化物薄膜の除去方法である。
Hereinafter, the basic principle of the present invention will be described with reference to FIG. 1, and various embodiments will be described in detail with reference to FIGS. 2 to 6 together with the best mode for carrying out the present invention.
The present invention is a processing method that leaves as little wrinkles and stress deformation on a substrate as possible, and a method for removing a conductive metal oxide thin film that does not use strong acid or strong alkali.

図1において、14は厚さが1〜20mm程度の金属製の正電極、15は厚さが0.1〜10mm程度の金属製の負電極である。これらの電極14,15は絶縁物や導電物などの基材(例えばガラス)11の表面に形成した導電性金属酸化物薄膜(例えばITO)12と対向すべく配置され、直流電圧電源16によって印加されている。なお、17は負電極15の正電極14側に設置された絶縁体(例えば厚みが0.2〜10mm程度のゴムや樹脂)である。   In FIG. 1, 14 is a metal positive electrode having a thickness of about 1 to 20 mm, and 15 is a metal negative electrode having a thickness of about 0.1 to 10 mm. These electrodes 14 and 15 are arranged to face a conductive metal oxide thin film (for example, ITO) 12 formed on the surface of a base material (for example, glass) 11 such as an insulator or a conductive material, and are applied by a DC voltage power supply 16. Has been. Reference numeral 17 denotes an insulator (for example, rubber or resin having a thickness of about 0.2 to 10 mm) installed on the positive electrode 14 side of the negative electrode 15.

そして、正電極14と負電極15の一部を電解液13に浸漬し、かつ負電極15を基材11表面の導電性金属酸化物薄膜12に接触させる。このようにすることで、正電極14の直下1〜3mmの距離に位置する導電性金属酸化物薄膜12の表面を負電極化し、その負電極と正電極14間の電解液13を電気分解して、正電極14の表面にOH、導電性金属酸化物薄膜12の表面にHを発生させる。そして、この発生したHによって導電性金属酸化物薄膜12の表面が還元されて除去される。 Then, a part of the positive electrode 14 and the negative electrode 15 is immersed in the electrolytic solution 13, and the negative electrode 15 is brought into contact with the conductive metal oxide thin film 12 on the surface of the substrate 11. In this way, the surface of the conductive metal oxide thin film 12 located at a distance of 1 to 3 mm immediately below the positive electrode 14 is converted into a negative electrode, and the electrolytic solution 13 between the negative electrode and the positive electrode 14 is electrolyzed. Thus, OH is generated on the surface of the positive electrode 14, and H + is generated on the surface of the conductive metal oxide thin film 12. Then, the surface of the conductive metal oxide thin film 12 is reduced and removed by the generated H + .

しかしながら、このような除去方法では、基材11の移動に伴い、発生したHが電解液13によって未加工の基材11上に流され、これから還元される導電性金属酸化物薄膜12を部分的に還元してしまうので、導電性が阻害され、導電性金属酸化物薄膜12が綺麗に還元されない場合がある。 However, in such a removal method, the generated H + is caused to flow on the raw substrate 11 by the electrolytic solution 13 along with the movement of the substrate 11, and the conductive metal oxide thin film 12 to be reduced is partially removed. Therefore, there is a case where the conductivity is hindered and the conductive metal oxide thin film 12 is not reduced cleanly.

そこで、本発明では、正電極14から負電極15に向かう方向と反対の方向に電解液13を供給することで、前記還元反応により導電性金属酸化物薄膜12の表面に発生した前記気泡を、還元が完了した側に押し流して積極的に排除するのである。   Therefore, in the present invention, by supplying the electrolytic solution 13 in a direction opposite to the direction from the positive electrode 14 toward the negative electrode 15, the bubbles generated on the surface of the conductive metal oxide thin film 12 by the reduction reaction are It is pushed away to the side where the reduction is completed and actively eliminated.

この正電極14から負電極15と反対の方向に向けて電解液13を供給する手段として、図2に示す第1の例では、側面から見て数度〜数十度傾けた負電極15の上面に、絶縁体17を介して箱状の電解液供給ノズル18を設置し、ホース19を介して供給した電解液13が正電極14の下方に均一に流れるものを示している。   As means for supplying the electrolyte solution 13 from the positive electrode 14 in the direction opposite to the negative electrode 15, in the first example shown in FIG. 2, the negative electrode 15 tilted several degrees to several tens of degrees as viewed from the side. A box-shaped electrolyte supply nozzle 18 is installed on the upper surface via an insulator 17, and the electrolyte 13 supplied via a hose 19 flows uniformly below the positive electrode 14.

このような構成を採用することで、前記電解液供給ノズル18から供給された電解液13は、負電極15から正電極14に向けて流れ(基材11の移動方向と同方向)、前記還元反応により導電性金属酸化物薄膜12の表面に発生した気泡を、還元が完了した側に押し流す。従って、負電極15と正電極14の間に位置する導電性金属酸化物薄膜12を部分的に還元することがない。   By adopting such a configuration, the electrolytic solution 13 supplied from the electrolytic solution supply nozzle 18 flows from the negative electrode 15 toward the positive electrode 14 (the same direction as the movement direction of the base material 11), and the reduction Bubbles generated on the surface of the conductive metal oxide thin film 12 by the reaction are pushed away to the side where the reduction is completed. Therefore, the conductive metal oxide thin film 12 positioned between the negative electrode 15 and the positive electrode 14 is not partially reduced.

なお、正電極14と負電極15の最接近部分の距離は、印加される電圧値等の条件にもよるが、0.5〜20mm程度とする。   In addition, although the distance of the closest part of the positive electrode 14 and the negative electrode 15 is based also on conditions, such as an applied voltage value, it shall be about 0.5-20 mm.

従って、基材11の移動方向後端部に未還元のまま残留する導電性金属酸化物薄膜12が減少し、ほぼ全域に亘って導電性金属酸化物薄膜12を除去することができる。そしてその際、精密な位置制御を必要とすることも無い。   Accordingly, the conductive metal oxide thin film 12 remaining unreduced at the rear end portion in the moving direction of the base material 11 is reduced, and the conductive metal oxide thin film 12 can be removed over almost the entire region. At that time, precise position control is not required.

また、電解液13が基材11の移動方向と同方向に向けて流れ、前記還元反応によって導電性金属酸化物薄膜12の表面に発生した気泡を、還元が完了した側に押し流すので、基材11の移動速度を速くしても、前記Hが未還元の基材11上に流されることはない。 In addition, since the electrolytic solution 13 flows in the same direction as the movement direction of the base material 11, the bubbles generated on the surface of the conductive metal oxide thin film 12 by the reduction reaction are pushed to the side where the reduction is completed. Even if the moving speed of 11 is increased, the H + is not flowed onto the unreduced substrate 11.

加えて、図2に示す第1の例では、正電極14を、例えば数μmの多数の孔を設けたパンチングメタルを重ね合わせた多孔体で形成し、この多孔体で形成した正電極(基材11の進行方向における長さは1〜10cm)14の背面に吸引装置20を連結し、正電極14の表面や電解液13中の気泡を、吸引できるようにしている。従って、未還元のまま残留する導電性金属酸化物薄膜12をより減少することができる。   In addition, in the first example shown in FIG. 2, the positive electrode 14 is formed of a porous body in which punching metal having a large number of holes of, for example, several μm are stacked, and the positive electrode (base) formed by this porous body is formed. The suction device 20 is connected to the back surface of the material 11 in the advancing direction of the material 11 so that the surface of the positive electrode 14 and bubbles in the electrolyte 13 can be sucked. Therefore, the conductive metal oxide thin film 12 remaining unreduced can be further reduced.

図3は、前記正電極14を円筒状に形成したもので、この円筒状に形成した正電極14を回動することにより、正電極14の表面や電解液13中の気泡を積極的に基材11の進行方向に排出するようにしたものである。   In FIG. 3, the positive electrode 14 is formed in a cylindrical shape. By rotating the positive electrode 14 formed in the cylindrical shape, the surface of the positive electrode 14 and bubbles in the electrolytic solution 13 are actively based. The material 11 is discharged in the traveling direction.

この場合、円筒状の正電極14の半径方向や幅方向の形状を均一に保つことができれば、特に厚みは限定されないが、厚みを増すと重量が大きくなるので、数mm程度とすることが望ましい。   In this case, the thickness is not particularly limited as long as the shape of the cylindrical positive electrode 14 in the radial direction and the width direction can be kept uniform, but the thickness increases as the thickness increases. .

また円筒状の正電極14の外径も特に限定されないが、気泡の除去効率と装置の大型化によるコストを考慮すると、数十mm程度とすることが望ましい。
図3に示した例では、Hの気泡と正電極14が接触し易いように、正電極14と導電性金属酸化物薄膜12との距離を1〜2mm程度とすることで、気泡の排除が効率良く行えるようになる。さらに正電極14と導電性金属酸化物薄膜12との距離が短くなったことで電気が流れ易くなることから、省電力での運転が可能になる。
Further, the outer diameter of the cylindrical positive electrode 14 is not particularly limited, but is preferably about several tens of mm in consideration of the efficiency of removing bubbles and the cost due to the enlargement of the apparatus.
In the example shown in FIG. 3, the distance between the positive electrode 14 and the conductive metal oxide thin film 12 is set to about 1 to 2 mm so that the H + bubble and the positive electrode 14 can easily contact each other, thereby eliminating the bubble. Can be performed efficiently. Further, since the distance between the positive electrode 14 and the conductive metal oxide thin film 12 is shortened, it becomes easier for electricity to flow, so that it is possible to operate with less power.

図4は、図3に示した円筒状の回動自在な正電極14を多孔体で形成し、この正電極14の内部と吸引装置20を連結したものである。この図4に示した第3の例では、気泡或いは電解液13と気泡を内部から吸引することで、正電極14に接触しないような微小な気泡も、正電極14の表面に付着させることができるので、図3に示した第2の例よりもさらに効率良く気泡を排除することができる。   FIG. 4 shows the cylindrical rotatable positive electrode 14 shown in FIG. 3 formed of a porous body, and the inside of the positive electrode 14 and the suction device 20 are connected. In the third example shown in FIG. 4, by sucking bubbles or the electrolyte 13 and the bubbles from the inside, minute bubbles that do not come into contact with the positive electrode 14 can be attached to the surface of the positive electrode 14. Therefore, bubbles can be eliminated more efficiently than the second example shown in FIG.

この第3の例では、気泡や電解液13を正電極14内に吸引するのではなく、正電極14の表面に付着させることが目的であるため、孔の直径は数μm程度の小さなものでよい。   In this third example, the object is not to suck bubbles or electrolyte 13 into the positive electrode 14, but to adhere to the surface of the positive electrode 14, so the diameter of the hole is as small as several μm. Good.

前記第2,3の例においては、図示省略したが、固定ブラシを回動する正電極14の表面に押し当て、正電極14の表面に付着する異物等を除去して綺麗に保つことで、常に良い還元状態を維持することができる。   In the second and third examples, although not shown, by pressing the fixed brush against the surface of the rotating positive electrode 14 and removing the foreign matter adhering to the surface of the positive electrode 14 to keep it clean, A good reduction state can always be maintained.

また第3の例のように正電極14の内部より吸引して気泡を付着させる場合、吸引力は正負電極14,15による導電性金属酸化物薄膜12の還元除去に支障のでない程度に調整することが必要である。   When bubbles are attached by suction from inside the positive electrode 14 as in the third example, the suction force is adjusted so as not to hinder the reduction and removal of the conductive metal oxide thin film 12 by the positive and negative electrodes 14 and 15. It is necessary.

その場合、図5に示すように、正電極14の内部に、正電極14が電解液13に浸漬している間の吸引作用を阻止する遮蔽部材21を設けておけば、この吸引による支障を容易に防止することができる。なお、この遮蔽部材21は、正電極14の回動に関係なく、正電極14が電解液13に浸漬する位置を保つように構成されている。   In this case, as shown in FIG. 5, if a shielding member 21 that prevents the suction action while the positive electrode 14 is immersed in the electrolytic solution 13 is provided inside the positive electrode 14, this suction trouble may be prevented. It can be easily prevented. The shielding member 21 is configured to keep the position where the positive electrode 14 is immersed in the electrolytic solution 13 regardless of the rotation of the positive electrode 14.

以上の本発明では、導電性金属酸化物薄膜12は電解還元処理した後は、金属固体として微粒子化(0.1μm以下)しているので、たとえば図6に示すように、水流ジェット22により還元金属を剥離すれば良い。なお、図6では、補助として柔軟性材23による機械的剥離を併用するものを示している。   In the present invention described above, the conductive metal oxide thin film 12 is finely divided (0.1 μm or less) as a metal solid after the electrolytic reduction treatment. Therefore, for example, as shown in FIG. What is necessary is just to peel a metal. In addition, in FIG. 6, what uses together mechanical peeling by the flexible material 23 as assistance is shown.

そして、その後は、電解液13とともに除去した還元金属を、電解液捕集パン24を介して回収タンク25に溜め、マイクロバブル発生器26によってマイクロバブルを混入する。これにより、マイクロバブルが核となって金属微粒子がクラスタ化し、フィルタで回収できるようになるので、フィルタ27を通して還元金属を回収する。なお、図6中の28はポンプを示す。   After that, the reduced metal removed together with the electrolytic solution 13 is accumulated in the recovery tank 25 via the electrolytic solution collecting pan 24, and microbubbles are mixed by the microbubble generator 26. As a result, the metal bubbles are clustered using the microbubbles as nuclei and can be collected by the filter, and the reduced metal is collected through the filter 27. In addition, 28 in FIG. 6 shows a pump.

以上の説明のように、本発明は、一般に行われている、被加工物に正電圧を印加する電解溶出除去反応ではなく、被加工物に負の電圧を印加する特徴的な加工法である。
なお、ここでの電解反応は導電性金属酸化物薄膜界面のごく微量な領域にH2の発生を生じさせるもので良いため、電流はほとんど必要としない。
As described above, the present invention is a characteristic processing method for applying a negative voltage to a workpiece, not a general electrolytic elution removal reaction for applying a positive voltage to the workpiece, as described above. .
Note that since the electrolytic reaction here may generate H 2 in a very small region at the interface of the conductive metal oxide thin film, little current is required.

従って、使用する電解液13は、一般に用いられる中性塩溶液、または水道水や河川水等に中性塩溶液を混合したものが利用可能であるが、好ましくは、抵抗率が102Ω・cmから106Ω・cm、より好ましくは103Ω・cmから104Ω・cmに調整されたものが良い。 Accordingly, as the electrolytic solution 13 to be used, a generally used neutral salt solution or a mixture of a neutral salt solution in tap water, river water, or the like can be used. Preferably, the resistivity is 10 2 Ω · Those adjusted from cm to 10 6 Ω · cm, more preferably from 10 3 Ω · cm to 10 4 Ω · cm are preferable.

つまり、本発明における電解液13の抵抗率は、正電極14と負電極15間の電解液13の抵抗値と負電極15〜導電性金属酸化物薄膜12〜正電極14間の抵抗値が同程度である必要があり、その範囲は、導電性金属酸化物薄膜12の種類や、正電極14の高さ、正電極14と負電極15間の距離を考慮して、102Ω・cmから106Ω・cmである。 That is, the resistivity of the electrolytic solution 13 in the present invention is equal to the resistance value of the electrolytic solution 13 between the positive electrode 14 and the negative electrode 15 and the resistance value between the negative electrode 15 to the conductive metal oxide thin film 12 to the positive electrode 14. The range is from 10 2 Ω · cm in consideration of the type of the conductive metal oxide thin film 12, the height of the positive electrode 14, and the distance between the positive electrode 14 and the negative electrode 15. 10 6 Ω · cm.

電解液13の抵抗率が102Ω・cmより小さいと、導電性金属酸化物薄膜12を通さず、電解液13を通じて正電極14、負電極15間が導通状態になるため、導電性金属酸化物薄膜12における酸化物の還元がほとんど起こらなくなる。また、106Ω・cmより大きいと、導電性が低下し、高電圧を印加しないと酸化物の還元が完全に行われなくなり、経済的に好ましくない。 When the resistivity of the electrolytic solution 13 is smaller than 10 2 Ω · cm, the conductive metal oxide thin film 12 is not passed through, and the positive electrode 14 and the negative electrode 15 are brought into conduction through the electrolytic solution 13. The reduction of the oxide in the physical thin film 12 hardly occurs. On the other hand, if it is larger than 10 6 Ω · cm, the conductivity is lowered, and unless a high voltage is applied, the oxide cannot be completely reduced, which is economically undesirable.

このように本発明では、抵抗率の比較的高い電解液13が適していることから、従来、電解液13としては好ましくなかった、水道水や河川水等を用いることができ、経済性及び安全性の面においても優れている。   Thus, in the present invention, since the electrolytic solution 13 having a relatively high resistivity is suitable, it is possible to use tap water, river water, etc., which is not preferable as the electrolytic solution 13 conventionally, and is economical and safe. Also excellent in terms of sex.

厚さが0.7mm、大きさが370mm×470mmのガラス基板上の全面に形成した、膜厚が1500×10−10mのITOを、先に説明した図2に示す本発明装置(負電極:厚み0.1mm、正電極:厚み1mm、ガラス基板の進行方向長さ1cm、絶縁体:厚み0.2mm、正電極と負電極の最接近部分における距離:0.9mm、正電極とITO間の距離:1mm)を用いた本発明方法によって除去した。 The ITO of the present invention (negative electrode) shown in FIG. 2 described above is formed of ITO having a thickness of 1500 × 10 −10 m formed on the entire surface of a glass substrate having a thickness of 0.7 mm and a size of 370 mm × 470 mm. : Thickness 0.1 mm, Positive electrode: Thickness 1 mm, Length 1 cm in the traveling direction of the glass substrate, Insulator: Thickness 0.2 mm, Distance at the closest part of the positive electrode and negative electrode: 0.9 mm, Between positive electrode and ITO The distance was removed by the method of the present invention using 1 mm).

ITOの除去に際し、電解液として水道水を使用し、正電極と負電極(電極幅は共に600mm)の間に90Vの直流電圧を印加し(電流:2A)、被加工材を2m/分で移動させたところ、正負電極間に発生する気泡による還元むらのない良好な結果が得られた。   When removing ITO, tap water is used as the electrolyte, a DC voltage of 90 V is applied between the positive electrode and the negative electrode (both electrode widths are 600 mm) (current: 2 A), and the workpiece is processed at 2 m / min. When moved, good results were obtained with no reduction unevenness due to bubbles generated between the positive and negative electrodes.

また、ガラス基板の進行方向後端部に未還元のまま残留するITOの面積も、従来の365mm2に対して1.75mm2に低減した。 The area of ITO remaining remains unreduced in the traveling direction back end portion of the glass substrate was reduced to 1.75 mm 2 with respect to a conventional 365 mm 2.

実施例1と同じガラス基板上のITOを、先に説明した図3に示す本発明装置(正電極:外径80mm、厚み2mm、その他は実施例1と同じ)を用いた本発明方法によって除去した。   The ITO on the same glass substrate as in Example 1 is removed by the method of the present invention using the device of the present invention (positive electrode: outer diameter 80 mm, thickness 2 mm, others are the same as in Example 1) shown in FIG. did.

ITOの除去に際し、電解液として水道水を使用し、正電極と負電極(電極幅は共に600mm)の間に60Vの直流電圧を印加し(電流:2A)、被加工材を2m/分で移動させたところ、正負電極間に発生する気泡による還元むらのない良好な結果が得られた。またガラス基板の後端部に未還元のまま残留するITOの面積の低減量の同様であった。   When removing ITO, tap water is used as the electrolyte, a 60V DC voltage is applied between the positive and negative electrodes (both electrode widths are 600 mm) (current: 2A), and the workpiece is processed at 2 m / min. When moved, good results were obtained with no reduction unevenness due to bubbles generated between the positive and negative electrodes. Moreover, the reduction amount of the area of ITO which remained unreduced in the rear-end part of a glass substrate was the same.

本発明は、各請求項に記載の技術的思想の範疇において、適宜実施の形態を変更しても良いことは言うまでもない。   Needless to say, the embodiments of the present invention may be changed as appropriate within the scope of the technical idea described in each claim.

例えば第1の例におけるH+の気泡の吸引は、吸引装置を設けるだけでなく、正電極14の背面側を負圧にする方法でも良い。
また、箱状の電解液供給ノズル18は、電解液13の流れを幅方向に均一となすように、箱内部に必要に応じて邪魔板等を設置しても良い。
For example, the suction of H + bubbles in the first example may be performed not only by providing a suction device but also by applying a negative pressure to the back side of the positive electrode 14.
The box-shaped electrolyte supply nozzle 18 may be provided with a baffle or the like inside the box as necessary so that the flow of the electrolyte 13 is uniform in the width direction.

本発明の基本原理を説明する図である。It is a figure explaining the basic principle of this invention. 本発明の第1の例を説明する概略図で側面から見た図である。It is the figure seen from the side in the schematic diagram explaining the 1st example of this invention. 本発明の第2の例を説明する概略図で側面から見た図である。It is the figure seen from the side in the schematic diagram explaining the 2nd example of this invention. 本発明の第3の例を説明する概略図で側面から見た図である。It is the figure seen from the side in the schematic diagram explaining the 3rd example of this invention. 本発明の第4の例を説明する概略図で側面から見た図である。It is the figure seen from the side in the schematic diagram explaining the 4th example of the present invention. 本発明により導電性金属酸化物薄膜を電解還元処理した後の回収装置の一例を示した図である。It is the figure which showed an example of the collection | recovery apparatus after carrying out the electrolytic reduction process of the electroconductive metal oxide thin film by this invention. 機械的擦過により金属薄膜を除去する方法について説明する図である。It is a figure explaining the method of removing a metal thin film by mechanical abrasion. 化学エッチングにより金属薄膜を除去する方法について説明する図である。It is a figure explaining the method of removing a metal thin film by chemical etching.

符号の説明Explanation of symbols

11 基材
12 導電性金属酸化物薄膜
13 電解液
14 正電極
15 負電極
16 直流電圧電源
17 絶縁体
18 電解液供給ノズル
20 吸引装置
DESCRIPTION OF SYMBOLS 11 Base material 12 Conductive metal oxide thin film 13 Electrolyte 14 Positive electrode 15 Negative electrode 16 DC voltage power supply 17 Insulator 18 Electrolyte supply nozzle 20 Suction device

Claims (9)

基材の表面に形成された導電性金属酸化物薄膜に対向すべく、基材との相対移動方向に、絶縁体を介在させて正電極と負電極を順に配置すると共に、このうちの負電極を基材表面の導電性金属酸化物薄膜と接触させ、
かつ前記正電極及び負電極と、基材表面の導電性金属酸化物薄膜間に電解液を介在させた状態で、前記正電極と負電極に電圧を印加して、前記正電極及び負電極と、基材を相対移動させることで、前記基材表面の導電性金属酸化物薄膜を還元反応により除去する導電性金属酸化物薄膜の除去方法において、
前記正電極を多孔体で形成し、
この正電極から負電極へ向く方向と反対方向に電解液を供給することで、前記還元反応により発生した基材表面の気泡を除去すると共に、正電極表面及び電解液中、または正電極表面又は電解液中の気泡を、前記正電極の背面側から吸引することを特徴とする導電性金属酸化物薄膜の除去方法。
In order to face the conductive metal oxide thin film formed on the surface of the base material, a positive electrode and a negative electrode are arranged in this order with an insulator interposed in the relative movement direction with respect to the base material. In contact with the conductive metal oxide thin film on the substrate surface,
And in the state which made electrolyte solution interpose between the said positive electrode and a negative electrode, and the electroconductive metal oxide thin film of the base-material surface, a voltage is applied to the said positive electrode and a negative electrode, The said positive electrode and a negative electrode, In the method for removing a conductive metal oxide thin film by removing the conductive metal oxide thin film on the surface of the base material by a reduction reaction by relatively moving the base material,
Forming the positive electrode with a porous body;
By supplying the electrolyte solution in a direction opposite to the direction from the positive electrode to the negative electrode, bubbles on the substrate surface generated by the reduction reaction are removed, and the positive electrode surface and the electrolyte solution, or the positive electrode surface or A method for removing a conductive metal oxide thin film, wherein air bubbles in the electrolyte are sucked from the back side of the positive electrode.
前記正電極を、多孔体で形成することに代えて、回動自在な円筒状に形成し、
正電極表面及び電解液中、または正電極表面又は電解液中の気泡を、正電極の背面側から吸引することに代えて、前記正電極の回動により、正電極から負電極へ向く方向と反対方向に排出することを特徴とする請求項1に記載の導電性金属酸化物薄膜の除去方法。
Instead of forming the positive electrode with a porous body, it is formed in a rotatable cylindrical shape,
Instead of suctioning the positive electrode surface and the electrolyte solution, or bubbles in the positive electrode surface or the electrolyte solution from the back side of the positive electrode, by rotating the positive electrode, the direction from the positive electrode to the negative electrode and 2. The method for removing a conductive metal oxide thin film according to claim 1, wherein the conductive metal oxide thin film is discharged in the opposite direction.
前記円筒状に形成した正電極を多孔体で形成し、内部から気泡或いは気泡及び電解液を吸引し、正電極の表面に気泡を付着させることを特徴とする請求項2に記載の導電性金属酸化物薄膜の除去方法。   3. The conductive metal according to claim 2, wherein the cylindrical positive electrode is formed of a porous body, and bubbles or bubbles and an electrolytic solution are sucked from the inside to attach the bubbles to the surface of the positive electrode. Removal method of oxide thin film. 前記正電極から負電極へ向く方向と反対の方向に向けた電解液の供給を、正電極と負電極間より行なうことを特徴とする請求項1〜3の何れかに記載の導電性金属酸化物薄膜の除去方法。   4. The conductive metal oxide according to claim 1, wherein the electrolyte solution is supplied in a direction opposite to the direction from the positive electrode to the negative electrode from between the positive electrode and the negative electrode. 5. Method for removing physical thin film. 請求項1に記載の導電性金属酸化物薄膜の除去方法を実施する装置であって、
基材の表面に形成された導電性金属酸化物薄膜に対向し、かつ負電極のみが基板と接触するように、間に絶縁体を介して、基材との相対移動方向に順に配置された多孔体で形成した正電極、及び負電極と、
これら正電極及び負電極と、基材表面の導電性金属酸化物薄膜間に電解液を介在させるべく、前記正電極から負電極へ向く方向と反対の方向に向けて電解液を供給する電解液供給手段と、
前記正電極と負電極に電圧を印加する電源と、
前記正電極及び負電極と、基材との相対移動手段と、
前記正電極に連結された吸引手段を備え、
前記供給された電解液により、前記還元反応によって発生した基材表面の気泡を除去すると共に、前記吸引手段により、正電極表面及び電解液中、または正電極表面又は電解液中の気泡を、正電極の背面側から吸引するようにしたことを特徴とする導電性金属酸化物薄膜の除去装置。
An apparatus for performing the method for removing a conductive metal oxide thin film according to claim 1,
Opposite to the conductive metal oxide thin film formed on the surface of the base material, and arranged in order in the direction of relative movement with the base material via an insulator so that only the negative electrode is in contact with the substrate A positive electrode and a negative electrode formed of a porous body;
An electrolytic solution for supplying an electrolytic solution in a direction opposite to the direction from the positive electrode to the negative electrode so that the electrolytic solution is interposed between the positive electrode and the negative electrode and the conductive metal oxide thin film on the surface of the base material. Supply means;
A power source for applying a voltage to the positive electrode and the negative electrode;
Means for relative movement of the positive and negative electrodes and the substrate;
Comprising suction means connected to the positive electrode;
The supplied electrolyte solution removes bubbles on the surface of the base material generated by the reduction reaction, and the suction means causes the positive electrode surface and the electrolyte solution, or the positive electrode surface or the bubbles in the electrolyte solution to be positive. An apparatus for removing a conductive metal oxide thin film, wherein suction is performed from the back side of the electrode.
前記正電極を、多孔体で形成することに代えて、回動自在な円筒状に形成すると共に、前記吸引手段に代えて、正電極の回動手段を備えさせ、
正電極表面及び電解液中、または正電極表面又は電解液中の気泡を、正電極の背面側から吸引することに代えて、円筒状に形成した正電極を回動させることにより、正電極から負電極へ向く方向と反対方向に排出するようにしたことを特徴とする請求項5に記載の導電性金属酸化物薄膜の除去装置。
Instead of forming the positive electrode with a porous body, it is formed in a rotatable cylindrical shape, and instead of the suction means, a positive electrode rotating means is provided,
Instead of sucking the positive electrode surface and the electrolyte solution, or bubbles in the positive electrode surface or the electrolyte solution from the back side of the positive electrode, by rotating the positive electrode formed in a cylindrical shape, 6. The apparatus for removing a conductive metal oxide thin film according to claim 5, wherein discharge is performed in a direction opposite to the direction toward the negative electrode.
前記正電極を多孔体で形成し、この正電極の内部に連結した吸引手段をさらに設けたことを特徴とする請求項6に記載の導電性金属酸化物薄膜の除去装置。   7. The apparatus for removing a conductive metal oxide thin film according to claim 6, further comprising a suction means formed of a porous body and connected to the inside of the positive electrode. 前記正電極と負電極間に電解液供給ノズルを設け、
前記正電極から負電極へ向く方向と反対方向への電解液の供給を、前記電解液供給ノズルによって行なうように構成したことを特徴とする請求項5〜7の何れかに記載の導電性金属酸化物薄膜の除去装置。
An electrolyte supply nozzle is provided between the positive electrode and the negative electrode,
The conductive metal according to claim 5, wherein the electrolyte solution is supplied in a direction opposite to the direction from the positive electrode to the negative electrode by the electrolyte solution supply nozzle. Equipment for removing oxide thin films.
前記絶縁体及び負電極を、基材との相対移動方向に対して傾けて配置したことを特徴とする請求項5〜8の何れかに記載の導電性金属酸化物薄膜の除去装置。   The apparatus for removing a conductive metal oxide thin film according to any one of claims 5 to 8, wherein the insulator and the negative electrode are disposed to be inclined with respect to a relative movement direction with respect to the base material.
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