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JP5450156B2 - Measuring instrument for contact characteristics of differential connectors - Google Patents
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JP5450156B2 - Measuring instrument for contact characteristics of differential connectors - Google Patents

Measuring instrument for contact characteristics of differential connectors Download PDF

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JP5450156B2
JP5450156B2 JP2010038315A JP2010038315A JP5450156B2 JP 5450156 B2 JP5450156 B2 JP 5450156B2 JP 2010038315 A JP2010038315 A JP 2010038315A JP 2010038315 A JP2010038315 A JP 2010038315A JP 5450156 B2 JP5450156 B2 JP 5450156B2
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substrate
pair
differential
contact
connector
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JP2011174781A (en
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喜久男 森
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Yazaki Corp
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Description

本発明は、差動コネクタの接触部特性測定器に係り、互いにコネクタ接続される一対の差動コネクタを構成する端子同士の接触部の電気特性を測定するための差動コネクタの接触部特性測定器に関するものである。   The present invention relates to a contact portion characteristic measuring instrument for a differential connector, and measures the contact portion characteristic of a differential connector for measuring the electrical characteristics of the contact portion between terminals constituting a pair of differential connectors connected to each other. It is about a vessel.

従来、自動車などの分野においては、互いにコネクタ接続される一対の差動コネクタ101、102として図8〜図10に示したものが知られている。上記差動コネクタ101は、雄型のコネクタであり、ツイストペアケーブルの端末に接続されている。また、上記差動コネクタ102は、雌型のコネクタであり、基板に取り付けられ、基板上の配線に接続されている。   2. Description of the Related Art Conventionally, in the field of automobiles and the like, a pair of differential connectors 101 and 102 that are connected to each other are known as shown in FIGS. The differential connector 101 is a male connector and is connected to a terminal of a twisted pair cable. The differential connector 102 is a female connector, is attached to a substrate, and is connected to wiring on the substrate.

図8に示すように、雄型の差動コネクタ101は、筒状の金属製の雄型ハウジング101aと、雄型ハウジング101a内に挿入される端子101bと、この端子101bを雄型ハウジング101a内に保持する樹脂製の保持部101cと、を備えている。上記端子101bは、例えば図中水平方向に複数並べられた端子列が上下に2列配置されるように保持部101cによって保持されている。そして、この端子101bの差動コネクタ102側とは反対側の端部には、図示しないツイストペアケーブルが半田などで接続されている。   As shown in FIG. 8, the male differential connector 101 includes a cylindrical metal male housing 101a, a terminal 101b inserted into the male housing 101a, and the terminal 101b in the male housing 101a. And a resin-made holding part 101c. The terminal 101b is held by the holding unit 101c so that, for example, a plurality of terminal rows arranged in the horizontal direction in the figure are arranged in two rows vertically. A twisted pair cable (not shown) is connected to the end of the terminal 101b opposite to the differential connector 102 by soldering or the like.

上記保持部101cは、ハウジング101a内に挿入され、その内部に端子101bが挿入される。上記保持部101cの差動コネクタ102側の端部中央には、凹部101dが設けられていて、この凹部101dの図面上側の内側面上に上列の端子101bが配置されると共に、凹部101dの図面下側の内側面上に下列の端子101bが配置される。   The holding portion 101c is inserted into the housing 101a, and the terminal 101b is inserted therein. A concave portion 101d is provided in the center of the end of the holding portion 101c on the differential connector 102 side, and an upper row of terminals 101b is disposed on the inner surface of the concave portion 101d on the upper side of the drawing, and the concave portion 101d A lower row of terminals 101b is arranged on the inner surface on the lower side of the drawing.

これに対して、図9に示すように、雌型の差動コネクタ102は、筒状の金属製の雌型ハウジング102aと、雌型ハウジング102a内に挿入される端子102bと、この端子102bを雌型ハウジング102a内に保持する樹脂製の保持部102cと、を備えている。上記端子102bは、その差動コネクタ101側の端部に図中上下方向に撓むバネ片102eが設けられている。   On the other hand, as shown in FIG. 9, a female differential connector 102 includes a cylindrical metal female housing 102a, a terminal 102b inserted into the female housing 102a, and the terminal 102b. And a resin-made holding portion 102c held in the female housing 102a. The terminal 102b is provided with a spring piece 102e that bends in the vertical direction in the figure at the end of the differential connector 101 side.

また、上記端子102bは、上述した端子101bと同様に例えば図中水平方向に複数並べた端子列が上下に2列配置されるように保持部102cによって保持されている。そして、この端子102bの差動コネクタ101とは反対側の端部には、図示しない基板上に形成された配線が半田などで接続されている。   Further, the terminal 102b is held by the holding portion 102c so that, for example, a plurality of terminal rows arranged in the horizontal direction in the figure are arranged vertically in the same manner as the terminal 101b described above. A wiring formed on a substrate (not shown) is connected to the end of the terminal 102b opposite to the differential connector 101 by soldering or the like.

上記保持部102cは、雌型ハウジング102a内に挿入され、その内部には端子102bが挿入される。上記保持部102cの差動コネクタ101側の端部中央には、平板状の凸部102dが設けられていて、この凸部102dの上面上に上列の端子102bが配置され、凸部102dの下面上に下列の端子102bが配置されている。   The holding portion 102c is inserted into the female housing 102a, and a terminal 102b is inserted therein. A flat plate-like convex portion 102d is provided at the center of the end portion of the holding portion 102c on the differential connector 101 side, and an upper row of terminals 102b is disposed on the upper surface of the convex portion 102d. Lower row terminals 102b are arranged on the lower surface.

そして、図10に示すように、差動コネクタ102の雌型ハウジング102a内に差動コネクタ101の雄型ハウジング101aを嵌め込むと、差動コネクタ101の凹部101d内に差動コネクタ102の凸部102dが挿入され、差動コネクタ102の上列の端子102bのバネ片102eが差動コネクタ101の上列の端子102bにバネ接触すると共に差動コネクタ102の下列の端子102bのバネ片102eが差動コネクタ101の下列の端子102bにバネ接触する。これにより、差動コネクタ101の端子101bと差動コネクタ102の端子102bとが接続される。   As shown in FIG. 10, when the male housing 101 a of the differential connector 101 is fitted into the female housing 102 a of the differential connector 102, the convex portion of the differential connector 102 is inserted into the concave portion 101 d of the differential connector 101. 102d is inserted, the spring piece 102e of the upper row terminal 102b of the differential connector 102 is in spring contact with the upper row terminal 102b of the differential connector 101, and the spring piece 102e of the lower row terminal 102b of the differential connector 102 is different. The spring contacts the terminal 102b in the lower row of the moving connector 101. Thereby, the terminal 101b of the differential connector 101 and the terminal 102b of the differential connector 102 are connected.

上述した構成の差動コネクタ101、102において、性能向上のために互いにコネクタ接続される一対の差動コネクタ101、102を構成する端子101b、102b同士の接触部の接触抵抗、表面酸化膜生成などによる高周波特性への影響を把握することが求められている。このため、従来は製品となる一対の差動コネクタ101、102同士をコネクタ接続して、スペクトルアナライザなどを用いて高周波電気特性の測定を行っていた。   In the differential connectors 101 and 102 having the above-described configuration, the contact resistance of the contact portion between the terminals 101b and 102b constituting the pair of differential connectors 101 and 102 that are connected to each other for performance improvement, surface oxide film generation, and the like It is required to grasp the influence on the high-frequency characteristics by. For this reason, conventionally, a pair of differential connectors 101 and 102, which are products, are connected to each other and high frequency electrical characteristics are measured using a spectrum analyzer or the like.

しかしながら、上述した製品となる差動コネクタ101には、ツイストペアケーブルが接続されている。このツイストペアケーブルは、互いに撚られた一対の電線から成り、差動コネクタ101の端子101bに接続するために、互いに撚られた一対の電線の端部を撚り戻して差動コネクタ101の端子101bに接続する必要がある。この撚り戻し量などにより高周波特性が大きく変動してしまうため、端子101b、102b同士の接触部のみによる高周波特性への影響を把握することが困難であった。   However, a twisted pair cable is connected to the differential connector 101 which is the product described above. This twisted pair cable is composed of a pair of electric wires twisted with each other. In order to connect to the terminal 101b of the differential connector 101, the ends of the pair of electric wires twisted together are twisted back to the terminal 101b of the differential connector 101. Need to connect. Since the high-frequency characteristics greatly vary depending on the amount of untwisting and the like, it is difficult to grasp the influence on the high-frequency characteristics due to only the contact portion between the terminals 101b and 102b.

また、上述した高周波電気特性の測定の一例としては、例えば端子101b、102bの接触抵抗に対する高周波電気特性を測定することが挙げられる。この端子101b、102b同士の接触抵抗は端子101b、102b同士の接触荷重によって決まる。このため、端子101b、102bの接触荷重、即ち接触抵抗を正確に把握しておく必要がある。   Moreover, as an example of the measurement of the high frequency electrical characteristics described above, for example, the high frequency electrical characteristics with respect to the contact resistance of the terminals 101b and 102b can be measured. The contact resistance between the terminals 101b and 102b is determined by the contact load between the terminals 101b and 102b. For this reason, it is necessary to accurately grasp the contact load of the terminals 101b and 102b, that is, the contact resistance.

従来のような製品となる一対の差動コネクタ101、102同士をコネクタ接続して高周波特性を測定する方法では、接触荷重を直接測定することができないため、雌型の差動コネクタ102内への雄型の差動コネクタ101の挿入力を接触荷重として測定していた。しかしながら、上述した挿入力には、端子101b、102b同士の接触荷重の他に端子101b、102b同士の摺動力も加わっているため正確な接触荷重を把握することができず、正確に接触抵抗と高周波との関係を測定することができなかった。また、差動コネクタ101、102の高周波特性を測定する測定器としては、例えば特許文献1〜3に記載されたものが挙げられる。   In the conventional method of connecting a pair of differential connectors 101 and 102 as a product and measuring the high frequency characteristics, the contact load cannot be directly measured. The insertion force of the male-type differential connector 101 was measured as a contact load. However, since the insertion force described above includes the sliding force between the terminals 101b and 102b in addition to the contact load between the terminals 101b and 102b, an accurate contact load cannot be grasped, and the contact resistance and The relationship with high frequency could not be measured. Moreover, as a measuring device which measures the high frequency characteristic of the differential connectors 101 and 102, what was described in patent documents 1-3 is mentioned, for example.

特開2008−203273号公報JP 2008-203273 A 特開2001−85118号公報JP 2001-85118 A 特開平6−224659号公報JP-A-6-224659

そこで、本発明は、一対の差動コネクタを構成する端子同士の接触部のみの電気特性を精度良く測定できる差動コネクタの接触部測定器を提供することを課題とする。   Then, this invention makes it a subject to provide the contact part measuring device of the differential connector which can measure accurately the electrical property of only the contact part of the terminals which comprise a pair of differential connector.

上述した課題を解決するための請求項1記載の発明は、互いにコネクタ接続される一対の差動コネクタを構成する端子同士の接触部の電気特性を測定するための差動コネクタの接触部特性測定器であって、表面に一対の第1差動伝送路が設けられた第1基板と、表面に一対の第2差動伝送路が設けられた第2基板と、前記第1基板に取り付けられると共に前記一対の第1差動伝送路の一端に各々接続される一対の第1同軸コネクタと、前記第2基板に取り付けられると共に前記一対の第2差動伝送路の一端に各々接続される一対の第2同軸コネクタと、前記一対の第2差動伝送路の他端に各々設けられた一対のバネ片と、を備え、前記一対のバネ片が前記第1基板上に設けられた前記一対の第1差動伝送路の他端に各々接触するように、前記第1基板と前記第2基板とを重ねたことを特徴とする差動コネクタの接触部特性測定器に存する。   The invention according to claim 1 for solving the above-described problem is a measurement of contact portion characteristics of a differential connector for measuring electrical characteristics of contact portions of terminals constituting a pair of differential connectors connected to each other. A first board having a pair of first differential transmission lines on the surface, a second board having a pair of second differential transmission lines on the surface, and the first board. And a pair of first coaxial connectors respectively connected to one end of the pair of first differential transmission paths, and a pair attached to the second substrate and connected to one end of the pair of second differential transmission paths. And the pair of spring pieces respectively provided at the other ends of the pair of second differential transmission lines, and the pair of spring pieces provided on the first substrate. The first differential transmission line is in contact with the other end of the first differential transmission line. Consists in the contact portion characteristic measuring apparatus of a differential connector, characterized in that overlapping the first substrate and the second substrate.

請求項2記載の発明は、前記一対のバネ片が各々、前記第2基板の縁部に設けられると共に当該設けられた縁部側の端面と直交する方向に撓むように設けられ、前記第1基板と前記第2基板とを互いに直交するように重ねたことを特徴とする請求項1に記載の差動コネクタの接触部特性測定器に存する。   According to a second aspect of the present invention, each of the pair of spring pieces is provided at an edge portion of the second substrate, and is provided so as to bend in a direction perpendicular to an end surface on the provided edge portion side. The contact part characteristic measuring instrument for a differential connector according to claim 1, wherein the second board and the second board are stacked so as to be orthogonal to each other.

請求項3記載の発明は、前記第1基板の前記一対のバネ片の並び方向の両端側に各々配置されると共に前記第1基板の表面よりも前記第2基板側に配置された前記第1基板に取り付けられる一対の第1ガイド部と、前記一対の第1ガイド部に挟まれる前記第2基板に取り付けられる第2ガイド部と、前記第1ガイド部及び前記第2ガイド部の一方には、前記第1基板と平行方向かつ前記第2基板と直交する方向に延在するスライド溝が設けられ、前記第1ガイド部及び前記第2ガイド部の他方には、前記スライド溝にその延在方向にスライド可能に嵌合するスライド凸部が設けられていることを特徴とする請求項2に記載の差動コネクタの接触部特性測定器に存する。   According to a third aspect of the present invention, the first substrate is disposed on both ends of the first substrate in the arrangement direction of the pair of spring pieces, and is disposed closer to the second substrate than the surface of the first substrate. A pair of first guide portions attached to the substrate, a second guide portion attached to the second substrate sandwiched between the pair of first guide portions, and one of the first guide portion and the second guide portion A slide groove extending in a direction parallel to the first substrate and perpendicular to the second substrate is provided, and the other of the first guide portion and the second guide portion extends in the slide groove. 3. A contact characteristic measuring apparatus for a differential connector according to claim 2, further comprising a slide protrusion that is slidably fitted in a direction.

以上説明したように請求項1記載の発明によれば、第1差動伝送路及び第2差動伝送路の他端(接触部側の端部)を製品で用いられる端子の接触部側の端部とほぼ同一形状にして、第1同軸コネクタ及び第2同軸コネクタに同軸ケーブルの一端に設けたコネクタを接続して、その同軸ケーブルの他端に設けたコネクタをスペクトルアナライザなどの電気特性を測定するための機器に接続すれば、ツイストリペアを撚り戻して第1差動伝送路及び第2差動伝送路の一端に接続しなくてもよくなり、ツイストリペアの撚り戻しの影響がない差動コネクタの端子同士の接触部のみの電気特性を精度良く測定できる。また、第1差動伝送路及び第2差動伝送路の形状を変更すれば様々な種類の差動コネクタの端子の接触部の電気特性を測定できる。   As described above, according to the first aspect of the present invention, the other end of the first differential transmission path and the second differential transmission path (the end on the contact section side) is on the contact section side of the terminal used in the product. Connect the connector provided at one end of the coaxial cable to the first coaxial connector and the second coaxial connector, and connect the connector provided at the other end of the coaxial cable to the electrical characteristics of a spectrum analyzer, etc. If connected to the device for measurement, the twisted pair is not twisted back and connected to one end of the first differential transmission line and the second differential transmission line, and there is no effect of twisting back of the twisted pair. It is possible to accurately measure the electrical characteristics of only the contact portion between the terminals of the moving connector. Further, if the shapes of the first differential transmission path and the second differential transmission path are changed, the electrical characteristics of the contact portions of the terminals of various types of differential connectors can be measured.

請求項2記載の発明によれば、第1基板と第2基板とを互いに直交するように重ねることにより、第1基板の表面に第2基板の端面を突き当ててバネ片と第1差動伝送路との位置を固定させた状態でバネ片と第1差動伝送路とを接触させるので、正確な接触荷重を把握して、正確に接触抵抗と高周波との関係を測定することができる。   According to the second aspect of the present invention, the first substrate and the second substrate are overlapped so as to be orthogonal to each other, so that the end surface of the second substrate abuts against the surface of the first substrate, and the spring piece and the first differential Since the spring piece and the first differential transmission line are brought into contact with each other while the position with respect to the transmission line is fixed, it is possible to grasp the accurate contact load and accurately measure the relationship between the contact resistance and the high frequency. .

請求項3記載の発明によれば、第1ガイド部及び第2ガイド部の一方に設けたスライド溝に第1ガイド部及び第2ガイド部の他方に設けたスライド凸部を挿入してスライドさせることにより、簡単に第1基板と第2基板とを互いに直交するように重ねて、その状態を保持することができる。   According to the third aspect of the present invention, the slide convex portion provided in the other of the first guide portion and the second guide portion is inserted and slid into the slide groove provided in one of the first guide portion and the second guide portion. Thus, the first substrate and the second substrate can be easily stacked so as to be orthogonal to each other, and the state can be maintained.

本発明の差動コネクタの接触部特性測定器の一実施形態を示す斜視図である。It is a perspective view which shows one Embodiment of the contact part characteristic measuring device of the differential connector of this invention. 図1に示す差動コネクタの接触部特性測定器の分解斜視図である。It is a disassembled perspective view of the contact part characteristic measuring device of the differential connector shown in FIG. 図2のP2矢視図である。FIG. 3 is a view taken in the direction of arrow P2 in FIG. 2. 図1のP1矢視図である。It is a P1 arrow view of FIG. 図1に示すバネ片付近の部分拡大図である。It is the elements on larger scale near the spring piece shown in FIG. 図5のI−I線断面図である。It is the II sectional view taken on the line of FIG. 図1に示す差動コネクタの接触部特性測定器を用いた高周波電気特性の測定について説明するための説明図である。It is explanatory drawing for demonstrating the measurement of the high frequency electrical property using the contact part property measuring device of the differential connector shown in FIG. (A)は雄型の差動コネクタの一例を示す正面図であり、(B)は(A)のII−II線断面図である。(A) is a front view which shows an example of a male-type differential connector, (B) is the II-II sectional view taken on the line of (A). (A)は雌型の差動コネクタの一例を示す正面図であり、(B)は(A)のIII−III線断面図である。(A) is a front view which shows an example of a female-type differential connector, (B) is the III-III sectional view taken on the line of (A). 図8に示す差動コネクタと図9に示す差動コネクタとをコネクタ接続したときの断面図である。FIG. 10 is a cross-sectional view when the differential connector shown in FIG. 8 and the differential connector shown in FIG. 9 are connected by a connector.

以下、本発明の差動コネクタの接触部特性測定器を図1〜図6に基づいて説明する。本発明の差動コネクタの接触部特性測定器1(以下単に接触部特性測定器1と略記する。)は、互いにコネクタ接続された図10に示すような一対の差動コネクタ101、102を構成する一対の端子101b、102b同士の接触部の高周波電気特性を測定するための測定器である。   Hereinafter, the contact part property measuring instrument of the differential connector of this invention is demonstrated based on FIGS. The differential connector contact measuring instrument 1 of the present invention (hereinafter simply referred to as the contact probe characteristic measuring instrument 1) comprises a pair of differential connectors 101 and 102 connected to each other as shown in FIG. It is a measuring instrument for measuring the high frequency electrical characteristic of the contact part of a pair of terminals 101b and 102b.

同図に示すように、接触部特性測定器1は、表面に一対の第1差動伝送路2a、2bが設けられた第1基板B1と、表面に一対の第2差動伝送路3a、3bが設けられた第2基板B2と、第1基板B1に取り付けられると共に一対の第1差動伝送路2a、2bの一端に各々接続される一対の第1同軸コネクタ4a、4bと、第2基板B2に取り付けられると共に一対の第2差動伝送路3a、3bの一端に各々接続される一対の第2同軸コネクタ5a、5bと、一対の第2差動伝送路3a、3bの他端に各々設けられた一対のバネ片6a、6bと、を備えている。 As shown in the figure, the contact part characteristic measuring instrument 1 includes a first substrate B 1 having a pair of first differential transmission paths 2a and 2b on the surface, and a pair of second differential transmission paths 3a on the surface. , a second substrate B 2 which 3b is provided, the first substrate B the pair of first differential transmission line 2a with attached to 1, 2b pair of first coaxial connector 4a which are respectively connected to one end of, and 4b A pair of second coaxial connectors 5a and 5b attached to the second substrate B 2 and connected to one end of each of the pair of second differential transmission lines 3a and 3b, and a pair of second differential transmission lines 3a and 3b And a pair of spring pieces 6a and 6b respectively provided at the other end.

上記第1基板B1は、平面視が線対称のホームベース型に設けられている。この第1基板B1の表面に設けられた上記一対の第1差動伝送路2a、2bは各々、線状に設けられていて、その一端が第1基板B1表面においてホームベース型の対称軸上に位置する頂点を成す一対の縁部に各々設けられ、その他端が第1基板B1の表面中央に設けられている。この第1差動伝送路2a、2bの他端は、差動コネクタ101を構成する端子101bの接触部と同じ材料で同形状(即ち同じ幅、同じ厚さ)に設けられている。 The first substrate B 1 is provided in a home base type that is axisymmetric in plan view. The first substrate B 1 of provided on the surface of the pair of first differential transmission line 2a, 2b are each provided in linear, the one end of the home base type in the first substrate B 1 surface symmetry each provided a pair of edge portions forming the vertices located on the axis, the other end is provided on the first surface center of the substrate B 1. The other ends of the first differential transmission paths 2 a and 2 b are provided in the same shape (that is, the same width and the same thickness) with the same material as the contact portion of the terminal 101 b constituting the differential connector 101.

上記第2基板B2は、第1基板B1と同様に線対称のホームベース型に設けられている。この第2基板B2の表面に設けられた上記一対の第2差動伝送路3a、3bは各々、線状に設けられていて、その一端が第2基板B2表面においてホームベース型の対称軸上に位置する頂点を成す一対の縁部に各々設けられ、その他端が第2基板B2表面において対称軸と直交する縁部に設けられている。この第2差動伝送路3a、3bの他端は、差動コネクタ102を構成する端子102bの接触部側と同じ材料で同じ幅、同じ厚さに設けられている。即ち、第2差動伝送路3a、3bの他端は、差動コネクタ102を構成する端子102bの接触部とほぼ同形状に設けられている。 The second substrate B 2 is provided in a line-symmetric home base type like the first substrate B 1 . The second substrate B of the pair provided on the second surface a second differential transmission lines 3a, 3b are each provided in linear, the one end of the home base type in the second substrate B 2 surface symmetrical each provided a pair of edge portions forming the vertices located on the axis, the other end is provided on the edge perpendicular to the axis of symmetry at the second substrate B 2 surface. The other ends of the second differential transmission paths 3 a and 3 b are provided with the same width and thickness as the same material as the contact portion side of the terminal 102 b constituting the differential connector 102. In other words, the other ends of the second differential transmission paths 3 a and 3 b are provided in substantially the same shape as the contact portions of the terminals 102 b constituting the differential connector 102.

上記第1同軸コネクタ4a、4b、第2同軸コネクタ5a、5bは、内導体と、内導体を覆う筒状の誘電体と、この誘電体を覆う外導体と、から成る同軸構造に設けられている。上記第1同軸コネクタ4a、4bは、一対の第1差動伝送路2a、2bの一端が設けられた縁部側の端面に各々取り付けられていて、その内導体が第1差動伝送路2a、2bの一端上に重ねられて接続されている。上記第2同軸コネクタ5a、5bは、一対の第2差動伝送路3a、3bの一端が設けられた縁部側の端面に各々取り付けられていて、その内導体が第2差動伝送路3a、3bの一端上に重ねられて接続されている。   The first coaxial connectors 4a and 4b and the second coaxial connectors 5a and 5b are provided in a coaxial structure including an inner conductor, a cylindrical dielectric covering the inner conductor, and an outer conductor covering the dielectric. Yes. The first coaxial connectors 4a and 4b are respectively attached to the end faces on the edge side where one ends of the pair of first differential transmission paths 2a and 2b are provided, and the inner conductor thereof is the first differential transmission path 2a. 2b is overlapped and connected to one end of 2b. The second coaxial connectors 5a and 5b are respectively attached to end faces on the edge side where one ends of the pair of second differential transmission paths 3a and 3b are provided, and the inner conductor thereof is the second differential transmission path 3a. 3b are overlapped and connected on one end of 3b.

上記バネ片6aは、図5に示すように、その一端が第2差動伝送路3aの他端上に重ねて設けられ、その他端が第2基板B2の表面から離れる方向に向かって90度に折り曲げて設けられている。これにより、バネ片6aが設けられている第2基板B2の縁部側の端面と直交する方向にバネ片6aの他端が撓む。また、上記バネ片6bは、その一端が第2差動伝送路3bの他端上に重ねて設けられ、その他端が第2基板B2の表面から離れる方向に向かって90度折り曲げられた後にさらに180度折り返されて設けられている。これにより、バネ片6bが設けられている第2基板B2の縁部側の端面と直交する方向にバネ片6bの他端が撓む。 As shown in FIG. 5, one end of the spring piece 6 a is provided on the other end of the second differential transmission path 3 a, and the other end is 90 in a direction away from the surface of the second substrate B 2. It is bent at every degree. Thus, the other end of the spring piece 6a is bent in a direction perpendicular to the end face of the second edge of the substrate B 2 of spring pieces 6a. Further, the spring piece 6b, after the one end is provided superimposed on the other end of the second differential transmission line 3b, the other end is bent 90 degrees in a direction away from the second surface of the substrate B 2 Furthermore, it is folded back 180 degrees. Thus, the other end of the spring piece 6b is bent in a direction perpendicular to the end face of the second edge of the substrate B 2 of spring pieces 6b is provided.

上述した第1基板B1と第2基板B2とは、上記一対のバネ片6a、6bが第1基板B1上に設けられた第1差動伝送路2a、2bの他端に各々接触するように、互いに直交して重ねられている。詳しくは、第1基板B1は、水平方向に平行に配置され、第2基板B2は、鉛直方向に平行に配置される。 The first substrate B 1 and the second substrate B 2 described above are in contact with the other ends of the first differential transmission lines 2 a and 2 b in which the pair of spring pieces 6 a and 6 b are provided on the first substrate B 1. As shown, they are stacked perpendicular to each other. Specifically, the first substrate B 1 is disposed in parallel with the horizontal direction, and the second substrate B 2 is disposed in parallel with the vertical direction.

また、接触部特性測定器1にはさらに、第1基板B1の一対のバネ片6a、6bの並び方向両端側に各々配置されると共に第1基板B1の表面よりも第2基板B2側に配置された第1基板B1に取り付けられる樹脂製の一対の第1ガイド部7a、7bと、一対の第1ガイド部7a、7bに挟まれた第2基板B2に取り付けられる一対の第2ガイド部8a、8bと、を備えている。上記一対の第1ガイド部7a、7bは、第1基板B1に取り付けられる取付部9に固定されていて、これにより第1基板B1に取り付けられる。 Further, the contact portion characteristic measuring instrument 1 is further disposed on both ends of the pair of spring pieces 6a and 6b of the first substrate B 1 in the arrangement direction, and the second substrate B 2 rather than the surface of the first substrate B 1. the first pair of resin attached to the substrate B 1 first guide portion 7a disposed on the side, 7b, a pair of first guide portions 7a, a pair attached to the second substrate B 2 sandwiched 7b 2nd guide part 8a, 8b. The pair of first guide portions 7a, 7b is fixed at the mounting portion 9 attached to the first substrate B 1, it is thereby attached to the first substrate B 1.

取付部9は、第1基板B1の裏面側に設けられた底壁部9aと、この底壁部9aから立設された第1基板B1バネ片6a、6bの並び方向の両端面を挟む一対の立壁部9bと、一対の立壁部9bに突設された底壁部9aとの間に第1基板B1を挟む一対の凸部9cと、を備えている。上記一対のガイド部7a、7bは、上記一対の立壁部9bに突出して設けられている。この一対のガイド部7a、7bには各々、第1基板B1と平行方向かつ第2基板B2と直交する方向に延在するスライド溝10が設けられている。 Mounting portion 9 includes a bottom wall portion 9a provided in the first back side of the substrate B 1, first substrate B 1 spring pieces 6a erected from the bottom wall 9a, the both end faces of the arrangement direction of 6b It includes a pair of vertical wall portions 9b, and a pair of convex portions 9c which first sandwiching the substrate B 1 between the bottom wall portion 9a protruding from the pair of vertical wall portions 9b sandwiching. The pair of guide portions 7a and 7b are provided so as to protrude from the pair of standing wall portions 9b. The pair of guide portions 7a, each to 7b, the slide groove 10 is provided extending in the first direction perpendicular to the substrate B 1 parallel direction and the second substrate B 2.

また、上記一対の第2ガイド部8a、8bは、バネ片6a、6bの並び方向に互いに離間して配置され、第2基板B2の背面に接着された平板部11の背面に固定されている。これにより平板部11が第2基板B2に接着されると第2ガイド部8a、8bが第2基板B2に取り付けられる。一対の第2ガイド部8a、8bには、上記スライド溝10にその延在方向にスライド可能に嵌合するスライド凸部12が設けられている。また、上記一対の第2ガイド部8a、8bの端部は、連結部13により連結されている。 Further, the pair of second guide portions 8a, 8b are spring pieces 6a, are disposed separated from each other in the direction of arrangement of 6b, fixed to the rear surface of the second flat plate portion 11 which is adhered to the back surface of the substrate B 2 Yes. When Thus the flat plate portion 11 is bonded to the second substrate B 2 second guide portion 8a, 8b is attached to the second substrate B 2. The pair of second guide portions 8a and 8b is provided with a slide convex portion 12 that fits in the slide groove 10 so as to be slidable in the extending direction. The ends of the pair of second guide portions 8 a and 8 b are connected by a connecting portion 13.

次に、上述した構成の接触部特性測定器1の第1基板B1に対する第2基板B2の組み付け手順について説明する。上述した構成によれば、スライド溝10の第2基板B2側の開口からスライド凸部12を挿入して嵌め込む。嵌め込むと第2基板B2のバネ片6a、6bが設けられた側の端面が第1基板B1の表面に重ねられて、第1基板B1と第2基板B2とが互いに直交するように重ねられる。その後、第1基板B1の表面に第2基板B2の端面を重ねた状態でスライド溝10内に沿ってバネ片6a、6bが第1差動伝送路2a、2bの他端と接触する位置まで第2基板B2をスライドさせて第1基板B1と第2基板B2とを組み付けることができる。 Next, a procedure for assembling the second substrate B 2 to the first substrate B 1 of the contact part property measuring instrument 1 having the above-described configuration will be described. According to the configuration described above, the slide convex portion 12 is inserted and fitted from the opening on the second substrate B 2 side of the slide groove 10. Fitted when the second substrate B 2 of the spring piece 6a, the end face of 6b are provided side is superposed on the first surface of the substrate B 1, first substrate B 1 and the second substrate B 2 are perpendicular to each other Are overlaid. Thereafter, the first substrate B 1 of the surface to a second spring piece 6a in a state in which overlapping the end faces of the substrate B 2 along the slide groove 10, 6b are in contact with the other end of the first differential transmission line 2a, 2b The first substrate B 1 and the second substrate B 2 can be assembled by sliding the second substrate B 2 to the position.

次に、上述した接触部特性測定器1を用いた高周波特性の測定の一例について図7を参照して説明する。同図に示すように、接触部特性測定器1とスペクトルアナライザ14とを接続する。具体的には、一対の同軸ケーブルである測定ケーブル15a、15bの一端に取り付けられたコネクタをそれぞれ、接触部特性測定器1の一対の第1同軸コネクタ4a、4bにコネクタ接続すると共に、一対の測定ケーブル15a、15bの他端に取り付けられたコネクタをスペクトルアナライザ14に接続する。また、一対の測定ケーブル16a、16bの一端に取り付けられたコネクタをそれぞれ、接触部特性測定器1の一対の第2同軸コネクタ5a、5bにコネクタ接続すると共に、一対の同軸ケーブルである測定ケーブル16a、16bの他端に取り付けられたコネクタをスペクトルアナライザ14に接続する。このスペクトルアナライザ14により周波数解析した結果をパーソナルコンピュータ(PC)17を用いて高周波特性を測定する。   Next, an example of the measurement of the high frequency characteristic using the contact part characteristic measuring instrument 1 mentioned above is demonstrated with reference to FIG. As shown in the figure, the contact portion property measuring instrument 1 and the spectrum analyzer 14 are connected. Specifically, the connectors attached to one ends of the measurement cables 15a and 15b, which are a pair of coaxial cables, are connected to the pair of first coaxial connectors 4a and 4b of the contact portion characteristic measuring instrument 1, respectively, A connector attached to the other end of the measurement cables 15 a and 15 b is connected to the spectrum analyzer 14. The connectors attached to one end of the pair of measurement cables 16a and 16b are connected to the pair of second coaxial connectors 5a and 5b of the contact portion characteristic measuring instrument 1, respectively, and the measurement cable 16a which is a pair of coaxial cables. The connector attached to the other end of 16b is connected to the spectrum analyzer 14. A frequency analysis result of the spectrum analyzer 14 is used to measure high frequency characteristics using a personal computer (PC) 17.

上述した接触部特性測定器1によれば、第1差動伝送路2a、2b及び第2差動伝送路3a、3bの他端(接触部側の端部)を製品で用いられる端子の接触部側の端部とほぼ同一形状にして、第1同軸コネクタ4a、4b及び第2同軸コネクタ5a、5bに同軸ケーブルの一端に設けたコネクタを接続して、その同軸ケーブルの他端に設けたコネクタをスペクトルアナライザなどの電気特性を測定するための機器に接続すれば、ツイストリペアを撚り戻して第1差動伝送路2a、2b及び第2差動伝送路3a、3bの一端に接続しなくてもよくなり、ツイストリペアの撚り戻しの影響がない差動コネクタの端子同士の接触部のみの電気特性を精度良く測定できる。また、第1差動伝送路2a、2b及び第2差動伝送路3a、3bの形状を変更すれば様々な種類の差動コネクタの端子の接触部の電気特性を測定できる。   According to the contact part property measuring instrument 1 described above, the other ends (ends on the contact part side) of the first differential transmission lines 2a and 2b and the second differential transmission lines 3a and 3b are in contact with terminals used in the product. A connector provided at one end of the coaxial cable is connected to the first coaxial connectors 4a, 4b and the second coaxial connectors 5a, 5b, and is provided at the other end of the coaxial cable. If the connector is connected to a device for measuring electrical characteristics such as a spectrum analyzer, the twisted pair is twisted back so that it is not connected to one end of the first differential transmission path 2a, 2b and the second differential transmission path 3a, 3b. Therefore, it is possible to accurately measure the electrical characteristics of only the contact portion between the terminals of the differential connector which is not affected by the twisted-back twisting. Further, if the shapes of the first differential transmission lines 2a and 2b and the second differential transmission lines 3a and 3b are changed, the electrical characteristics of the contact portions of the terminals of various types of differential connectors can be measured.

また、上述した接触部特性測定器1によれば、第1基板B1と第2基板B2とを互いに直交するように重ねることにより、第1基板B1の表面に第2基板B2の端面を突き当ててバネ片6a、6bと第1差動伝送路2a、2bとの位置を固定させた状態でバネ片6a、6bと第1差動伝送路2a、2bとを接触させるので、正確な接触荷重を把握して、正確に接触抵抗と高周波との関係を測定することができる。 Further, according to the contact part property measuring instrument 1 described above, the first substrate B 1 and the second substrate B 2 are stacked so as to be orthogonal to each other, whereby the second substrate B 2 is formed on the surface of the first substrate B 1 . Since the spring pieces 6a, 6b and the first differential transmission paths 2a, 2b are brought into contact with each other while the end faces are abutted and the positions of the spring pieces 6a, 6b and the first differential transmission paths 2a, 2b are fixed, It is possible to accurately grasp the contact load and accurately measure the relationship between the contact resistance and the high frequency.

また、上述した接触部特性測定器1によれば、第1ガイド部7a、7bに設けたスライド溝10に第2ガイド部8a、8bに設けたスライド凸部12を挿入してスライドさせることにより、簡単に第1基板B1と第2基板B2とを互いに直交するように重ねて、その状態を保持することができる。 Moreover, according to the contact part characteristic measuring instrument 1 mentioned above, by inserting and sliding the slide convex part 12 provided in the 2nd guide part 8a, 8b in the slide groove 10 provided in the 1st guide part 7a, 7b. The first substrate B 1 and the second substrate B 2 can be easily stacked so as to be orthogonal to each other, and the state can be maintained.

なお、上述した実施形態によれば、接触荷重を正確に把握するために第1基板B1、第2基板B2とを互いに直交して重ねていたが、本発明はこれに限ったものではない。例えば、接触荷重を正確に把握する必要がなければ、例えば、第1基板B1と第2基板B2とを互いに平行に重ねるようにしてもよい。 Note that, according to the above-described embodiment, the first substrate B 1 and the second substrate B 2 are stacked perpendicular to each other in order to accurately grasp the contact load, but the present invention is not limited to this. Absent. For example, if it is not necessary to accurately grasp the contact load, for example, the first substrate B 1 and the second substrate B 2 may be stacked in parallel with each other.

また、上述した実施形態によれば、スライド溝10を第1ガイド部7a、7bに設け、スライド溝10を第2ガイド部8a、8bに設けていたが、本発明はこれに限ったものではない。例えば、スライド溝10を第2ガイド部8a、8bに設け、スライド凸部12を第1ガイド部7a、7bに設けるようにしてもよい。   Further, according to the above-described embodiment, the slide groove 10 is provided in the first guide portions 7a and 7b and the slide groove 10 is provided in the second guide portions 8a and 8b. However, the present invention is not limited to this. Absent. For example, the slide groove 10 may be provided in the second guide portions 8a and 8b, and the slide convex portion 12 may be provided in the first guide portions 7a and 7b.

また、上述した実施形態によれば、第2ガイド部8a、8bは離間して一対設けられていたが本発明はこれに限ったものではない。第2ガイド部8a、8bは、第1ガイド部7a、7bに挟まれていればよく、一つであってもよい。   Moreover, according to embodiment mentioned above, 2nd guide part 8a, 8b was spaced apart and one pair was provided, but this invention is not limited to this. The 2nd guide parts 8a and 8b should just be pinched | interposed into the 1st guide parts 7a and 7b, and may be one.

また、前述した実施形態は本発明の代表的な形態を示したに過ぎず、本発明は、実施形態に限定されるものではない。即ち、本発明の骨子を逸脱しない範囲で種々変形して実施することができる。   Further, the above-described embodiments are merely representative forms of the present invention, and the present invention is not limited to the embodiments. That is, various modifications can be made without departing from the scope of the present invention.

1 接触部特性測定器
2a、2b 第1差動伝送路
3a、3b 第2差動伝送路
4a、4b 第1同軸コネクタ
5a、5b 第2同軸コネクタ
6a、6b バネ片
7a、7b 第1ガイド部
8a、8b 第2ガイド部
10 スライド溝
12 スライド凸部
1 第1基板
2 第2基板
DESCRIPTION OF SYMBOLS 1 Contact part characteristic measuring device 2a, 2b 1st differential transmission path 3a, 3b 2nd differential transmission path 4a, 4b 1st coaxial connector 5a, 5b 2nd coaxial connector 6a, 6b Spring piece 7a, 7b 1st guide part 8a, 8b 2nd guide part 10 Slide groove 12 Slide convex part B 1 1st board | substrate B 2 2nd board | substrate

Claims (3)

互いにコネクタ接続される一対の差動コネクタを構成する端子同士の接触部の電気特性を測定するための差動コネクタの接触部特性測定器であって、
表面に一対の第1差動伝送路が設けられた第1基板と、
表面に一対の第2差動伝送路が設けられた第2基板と、
前記第1基板に取り付けられると共に前記一対の第1差動伝送路の一端に各々接続される一対の第1同軸コネクタと、
前記第2基板に取り付けられると共に前記一対の第2差動伝送路の一端に各々接続される一対の第2同軸コネクタと、
前記一対の第2差動伝送路の他端に各々設けられた一対のバネ片と、を備え、
前記一対のバネ片が前記第1基板上に設けられた前記一対の第1差動伝送路の他端に各々接触するように、前記第1基板と前記第2基板とを重ねた
ことを特徴とする差動コネクタの接触部特性測定器。
A contact characteristic measurement device for a differential connector for measuring electrical characteristics of a contact portion between terminals constituting a pair of differential connectors connected to each other,
A first substrate having a pair of first differential transmission lines provided on the surface;
A second substrate having a pair of second differential transmission lines provided on the surface;
A pair of first coaxial connectors attached to the first substrate and connected to one end of the pair of first differential transmission lines;
A pair of second coaxial connectors attached to the second substrate and respectively connected to one ends of the pair of second differential transmission lines;
A pair of spring pieces respectively provided at the other ends of the pair of second differential transmission lines,
The first substrate and the second substrate are overlapped so that the pair of spring pieces are in contact with the other ends of the pair of first differential transmission lines provided on the first substrate, respectively. The contact part characteristic measuring instrument of the differential connector.
前記一対のバネ片が各々、前記第2基板の縁部に設けられると共に当該設けられた縁部側の端面と直交する方向に撓むように設けられ、
前記第1基板と前記第2基板とを互いに直交するように重ねた
ことを特徴とする請求項1に記載の差動コネクタの接触部特性測定器。
Each of the pair of spring pieces is provided at an edge portion of the second substrate and is provided so as to bend in a direction orthogonal to an end surface on the provided edge portion side,
The contact portion characteristic measuring instrument for a differential connector according to claim 1, wherein the first substrate and the second substrate are stacked so as to be orthogonal to each other.
前記第1基板の前記一対のバネ片の並び方向の両端側に各々配置されると共に前記第1基板の表面よりも前記第2基板側に配置された前記第1基板に取り付けられる一対の第1ガイド部と、
前記一対の第1ガイド部に挟まれる前記第2基板に取り付けられる第2ガイド部と、
前記第1ガイド部及び前記第2ガイド部の一方には、前記第1基板と平行方向かつ前記第2基板と直交する方向に延在するスライド溝が設けられ、
前記第1ガイド部及び前記第2ガイド部の他方には、前記スライド溝にその延在方向にスライド可能に嵌合するスライド凸部が設けられている
ことを特徴とする請求項2に記載の差動コネクタの接触部特性測定器。
A pair of first elements disposed on both ends of the first substrate in the arrangement direction of the pair of spring pieces and attached to the first substrate disposed on the second substrate side relative to the surface of the first substrate. A guide part;
A second guide part attached to the second substrate sandwiched between the pair of first guide parts;
One of the first guide part and the second guide part is provided with a slide groove extending in a direction parallel to the first substrate and perpendicular to the second substrate,
The slide convex part which fits the slide groove so that it can slide in the extension direction is provided in the other of the 1st guide part and the 2nd guide part. Measuring device for contact characteristics of differential connectors.
JP2010038315A 2010-02-24 2010-02-24 Measuring instrument for contact characteristics of differential connectors Expired - Fee Related JP5450156B2 (en)

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CN115801628A (en) * 2022-11-22 2023-03-14 湖北三江航天万峰科技发展有限公司 A network path testing device and method based on 8# crimping differential contacts

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