JP5474467B2 - Resistive touch panel inspection / evaluation equipment - Google Patents
Resistive touch panel inspection / evaluation equipment Download PDFInfo
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- JP5474467B2 JP5474467B2 JP2009216567A JP2009216567A JP5474467B2 JP 5474467 B2 JP5474467 B2 JP 5474467B2 JP 2009216567 A JP2009216567 A JP 2009216567A JP 2009216567 A JP2009216567 A JP 2009216567A JP 5474467 B2 JP5474467 B2 JP 5474467B2
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- 238000007689 inspection Methods 0.000 title claims description 58
- 238000011156 evaluation Methods 0.000 title claims description 26
- 238000012360 testing method Methods 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 5
- 239000000463 material Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000003054 catalyst Substances 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000003100 immobilizing effect Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
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Description
本発明は、抵抗膜式タッチパネルの検査・評価装置に関する。さらに詳しくは、抵抗膜式タッチパネルの特性を、極めて高速でつまり短時間で検査し評価するための装置に関する。 The present invention relates to a resistance film type touch panel inspection / evaluation apparatus. More specifically, the present invention relates to an apparatus for inspecting and evaluating the characteristics of a resistive touch panel at an extremely high speed, that is, in a short time.
抵抗膜式タッチパネル（以下、単に“タッチパネル”と略称することがある。）は、構造が簡単でかつ安価であり、指入力が可能であるため、その生産量が年々増大している。その生産量の拡大に伴い、その品質を確保するための検査方法および手段の改良にせまられている。
タッチパネルの検査・評価の１つとして、ペン入力に対する応答特性試験がある。具体的な検査方法は、所定の位置をペン（触圧棒）で触圧し、それにより検出された電気的位置信号をコンピューターに入力して、算出によりリニアリティーなどを調べることである。
Resistive touch panels (hereinafter sometimes simply referred to as “touch panels”) have a simple structure, are inexpensive, and allow finger input, so that their production is increasing year by year. Along with the expansion of the production volume, the inspection methods and means for ensuring the quality are being improved.
One of touch panel inspection and evaluation is a response characteristic test for pen input. A specific inspection method is to touch a predetermined position with a pen (contact pressure bar), input an electrical position signal detected thereby to a computer, and examine linearity and the like by calculation.
タッチパネルの応答特性試験を効率よく、しかも確実に実施するためには、タッチ面の全体に亘って検査すること、触圧棒の往復運動を高速で行うこと、被検査試料の設置と検査を素早く行うことおよび検査機自体が安定して長時間作動することなどが必要となる。
タッチパネルを高速で検査・評価するための装置として特許文献１が提案されている。この装置は、往復運動するシリンダ部材と一体に連動し、被検査試料の平面を所定の間隔で打点する触圧棒と、その触圧ペンが二次元的にマトリックス状に複数個配列されている評価装置である。この評価装置は、被検査試料が固定支持台上に固定され、シリンダ部材を駆動させながら、触圧ペンで試料表面を打点させる方式であり、可成の高速で試験をすることが可能である。
この装置は、シリンダ部材の駆動とシリンダ部材と一体化して連動する触圧ペンの駆動の２つの駆動部分を有し、評価すべき全面を検査するためには、一定の時間を要する。
In order to perform the response characteristic test of the touch panel efficiently and reliably, the entire touch surface is inspected, the reciprocating motion of the pressure bar is performed at high speed, and the specimen to be inspected is installed and inspected quickly. It is necessary that the inspection machine itself be operated stably for a long time.
Patent Document 1 has been proposed as an apparatus for inspecting and evaluating a touch panel at high speed. This device is integrally linked with a reciprocating cylinder member, and a plurality of contact pressure bars for hitting the plane of the sample to be inspected at predetermined intervals and a plurality of the contact pressure pens are arranged in a two-dimensional matrix. Evaluation device. This evaluation apparatus is a method in which a sample to be inspected is fixed on a fixed support base, and the surface of the sample is hit with a pressure pen while driving a cylinder member. .
This device has two drive parts, ie, a cylinder member drive and a stylus pen drive that is integrated with the cylinder member, and it takes a certain time to inspect the entire surface to be evaluated.
段落番号０００５の内容
本発明者は、抵抗膜式タッチパネルの生産拡大に伴い応答特性試験をより高速で行なう
ことができる装置の開発について研究を進めた。また可動部分が少なくかつ故障の少な
い検査・評価装置の開発について研究を進めた。
従来の検査装置では、固定支持板上に被検査試料（タッチパネル）を検査面を上にして
固定し、その検査面上に触圧棒を移動させながら、検査位置を制御していた。この従
来の方式とは異なり、固定支持板上に複数の触圧棒を上方に向けて一定の配列状態で
配置すると共に、この配列された触圧棒群の上に被検査試料の検査面が対向し接触する
ように配置した装置は、可動部分が各触圧棒の上下運動のみであり、故障が少なく極
めて短時間で検査・評価を実施できることが見出された。
Contents of Paragraph No. 0005 The present inventor conducted research on the development of a device capable of performing a response characteristic test at a higher speed with the expansion of production of resistive touch panels. We also conducted research on the development of inspection and evaluation equipment with few moving parts and few failures.
In a conventional inspection apparatus, a sample to be inspected (touch panel) is fixed on a fixed support plate with the inspection surface facing upward, and the inspection position is controlled while moving the pressure bar on the inspection surface. Unlike this conventional method, a plurality of contact rods are arranged in a fixed arrangement on the fixed support plate in an upward direction, and the inspection surface of the sample to be inspected is placed on the arranged contact rods. It was found that the device placed so that they face each other and contact each other has only a vertical movement of each contact rod, and there are few failures and inspection and evaluation can be performed in a very short time.
段落番号０００６の内容
本発明は、かかる知見に基づいて達成されたものであり、本発明によれば下記（１）〜
（５）のタッチパネルの高速検査・評価装置が提供される。
（１）
（ａ）検査支持基板上に、多数の触圧棒が一列に直線状に配置された触圧棒配列かつ、
この触圧棒配列が多段に配置された触圧棒多段配列を有し、前記触圧棒配列は、各触
圧棒が一定の等間隔で配置され、前記触圧棒多段配列は、被検査試料の検査面の全面を
覆い、そして前記触圧棒多段配列は、各触圧棒配列が一定の等間隔で配置され、
（ｂ）各触圧棒は、触圧棒多段配列の上部に設置された、プレート板の孔を通して、
検査面に下方から上方に向けて突出するように支持基板上に設置され、
（ｃ）被検査試料の検査面が下方に向けて、触圧棒と対向するように配置しうる試料
配置手段を有し、
（ｄ）各触圧棒は、所定の間隔で打点するようにした制御手段および
（ｅ）各触圧棒の接触位置と検査結果とを判定する判断手段
を有する抵抗膜式タッチパネルの高速検査・評価装置。
Contents of Paragraph No. 0006 The present invention has been achieved based on this finding. According to the present invention, the following (1) to (1)
( 5 ) A touch panel high-speed inspection / evaluation apparatus is provided.
(1)
(A) on a test support base plate, pressure rod sequence and tactile arranged linearly in a number of touch pressure rod is one row,
This contact rod arrangement has a multi-stage contact rod arrangement in which the contact rod arrangement is arranged in multiple stages.
The pressure rods are arranged at regular intervals, and the contact rod multistage arrangement covers the entire inspection surface of the sample to be inspected.
Covering, and the contact rod multi-stage array, each contact rod array is arranged at regular intervals,
(B) Each contact rod is placed through the hole in the plate plate installed at the top of the contact rod multi-stage array.
Placed from below on the inspection surface on the support board as that protrudes upward,
(C) having a sample arrangement means that can be arranged so that the inspection surface of the sample to be inspected faces downward and faces the contact rod;
(D) Each contact pressure bar has a control means that is made to hit at predetermined intervals, and (e) a judgment means for determining a contact position and an inspection result of each contact pressure bar. Evaluation device.
段落番号０００７の内容
（２）各触圧棒は、各触圧棒配列において、一端から他端へ順次突出するように制御
されている前記（１）記載の検査・評価装置。
（３）各触圧棒配列において、触圧棒はソレノイド方式により上下に作動する前記（１）
記載の検査・評価装置。
（４）各触圧棒配列において、触圧棒はピエゾ方式により上下に作動する前記（１）記
載の検査・評価装置。
（５）各触圧棒配列において、各触圧棒は、３〜１５ｍｍの間隔で配置されている前記
（１）記載の検査・評価装置。
The contents of paragraph numbers 0007 (2) pressure rod each catalyst, at each touch pressure rod array, said is controlled so that sequentially projecting from one end to the other (1) inspection and evaluation apparatus as claimed.
( 3 ) In each contact rod arrangement, the contact rod operates up and down by a solenoid system (1)
Inspection / evaluation equipment described.
( 4 ) The inspection / evaluation apparatus according to (1), wherein in each contact rod arrangement, the contact rods are moved up and down by a piezo method.
( 5 ) The inspection / evaluation device according to (1), wherein in each contact rod arrangement, each contact rod is arranged at an interval of 3 to 15 mm.
段落番号０００８の内容
本発明の検査・評価装置は、固定支持板上に多数の触圧棒が配置された触圧棒多段配
列が設置され、その上に被検査試料（タッチパネル）が検査面を下方に向けて配置さ
れる構造であり、作動部分は事実上各触圧棒の上下往復運動の部分のみである。本発
明の装置では、前記触圧棒多段配列の上に被検査試料が配置されると、コンピューター
により制御された順序に従って触圧棒が所定の間隔で検査面を触圧する。前記触圧棒
多段配列は、検査面のほぼ全体を覆うことが望ましく、そうすることによって触圧棒や
その配列を検査面に沿って移動する必要はない。例えば被検査試料の応答等特性試験の
場合、１０秒以下の短い時間で検査をすることが可能である。しかも可動部分が触圧
棒の上下運動のみであるから、故障が少なく消費電力は僅かである。
Contents of Paragraph No. 0008 In the inspection / evaluation apparatus of the present invention, a multi-stage arrangement of contact rods in which a large number of contact rods are arranged on a fixed support plate , and a specimen (touch panel) to be inspected on the inspection surface The operation part is practically only the part of the vertical reciprocation of each contact rod. In the apparatus of the present invention, when the sample to be inspected is arranged on the multi-stage arrangement of the pressure rods, the pressure rods contact the test surface at predetermined intervals according to the order controlled by the computer. It is desirable that the multi-stage contact rods cover almost the entire test surface, so that it is not necessary to move the contact rods or the array along the test surface. For example, in the case of a characteristic test such as a response of a sample to be inspected, it is possible to inspect in a short time of 10 seconds or less. Moreover, since the movable part is only the vertical movement of the pressure bar, there are few failures and little power consumption.
段落番号０００９の内容
段落番号００１０の内容
本発明の抵抗膜式タッチパネルの検査・評価装置を図面により説明する。図１は支持基
板１に固定して配置された触圧棒多段配列の上部に設置されたプレート板２を模式的に
示した平面図である。本発明の検査・評価装置は、支持基板１上に触圧棒多段配列が固
定され、この触圧棒多段配列は、触圧棒配列が多段で配列されている。
本発明において、触圧棒多段配列とは、多数の触圧棒が一列に直線状に配列された触圧
棒配列が、多段で重ねられた状態で配列されたものを言う。触圧棒多段配列は、図１で
はプレート板２と支持基板１との間に配置されており、そのため図面上は示されていな
い。プレート板２の多数の孔３に対応して触圧棒が配置されている。図１では、説明を
簡単にするために、支持基板１、プレート板２およびプレート板２に設けられた孔の
平面図が示されている。図１のプレート板２の多数の孔３の配置の状態から理解される
ように、図１の場合、１０個の触圧棒が一列（左右横方向）に直線状に配置された触圧
棒配列が６段（上下縦方向）で配置されていることを示している。
Contents of Paragraph No. 0010 The resistance film type touch panel inspection / evaluation apparatus of the present invention will be described with reference to the drawings. Figure 1 shows the support base
FIG. 3 is a plan view schematically showing a plate plate 2 installed on the upper part of a multi-stage contact rod arranged fixed to the plate 1. Inspection and evaluation apparatus of the present invention is the fixed pressure rod multistage sequence touch on the supporting base plate 1, the touch pressure rod multistage sequence, pressure rod arrangement touch are arranged in multiple stages.
In the present invention, the contact rod multi-stage arrangement refers to an arrangement in which a plurality of contact rods are arranged in a straight line and arranged in a multi-tiered manner. Pressure rod multistage sequence touch is in Figure 1 is disposed between the plate plate 2 and the support base plate 1, therefore the drawing is not a have been shown. Corresponding pressure rods are arranged corresponding to the numerous holes 3 of the plate plate 2. In Figure 1, for simplicity of explanation, plan view of the support base plate 1, provided on the plate board 2 and the plate plate 2 holes are shown. As can be understood from the arrangement of the multiple holes 3 in the plate plate 2 in FIG. 1, in the case of FIG. 1, the ten pressure rods are arranged in a straight line (in the horizontal direction). It shows that the arrangement is arranged in six stages (vertical and vertical directions).
触圧棒多段配列の上面にプレート板２が設けられ、そのプレート板２に開けられた孔３を介して触圧棒の先端部が突出されているようになっている。つまり、プレート板２には触圧棒多段配列に存在する触圧棒の数と同じ数の孔が開けられている（図１では６×１０の６０個である）。
次にプレート板２について説明する。プレート板２の上面には、被検査試料（タッチパネル）の検査面が密着した状態で設置される。プレート板２のそれぞれの孔３から触圧棒が突出し検査面を押圧する。そのためプレート板２の孔３は、触圧棒が貫通することができるに充分な孔径を有しており、通常は、径が０．７ｍｍ〜１．５ｍｍ好ましくは０．８ｍｍ〜１．２ｍｍが適当である。
因みに、触圧棒の直径は、一般に０．９ｍｍ〜１．１ｍｍ程度であり、触圧棒の形状は円柱状であって、その最先端（頂部）はフラットでもよく、また半円形乃至ドーム形であってもよい。プレート板２に設けられている孔の位置は、検査面の位置を決める役割を負っている。そのため、プレート板２の孔３の配列位置は、触圧棒多段配列の位置に合致している。プレート板２はタッチパネルのリニアリティーの検査・評価のために、孔３が直線状でかつ等間隔で配置され、また多段配列においても同じ間隔となるように孔が設けられていることが望ましい。最も好ましくは、検査面の全体が覆われるようにかつ縦と横が同じ間隔となるように孔の位置を配列する。隣接する孔の間隔（ピッチ間隔）は３ｍｍ〜１５ｍｍ、好ましくは４ｍｍ〜１３ｍｍであるのが有利である。このように孔の配列が直線状であり、縦方向および横方向の間隔が一定であるように配列することによって、触圧棒で触圧することにより発生する電気的信号から被検査試料の判別を容易に行うことができる。
A plate plate 2 is provided on the upper surface of the multi-stage contact rod, and the tip of the contact rod protrudes through a hole 3 formed in the plate plate 2. In other words, the plate plate 2 has the same number of holes as the number of the contact rods present in the contact rod multi-stage array (in FIG. 1, 60 holes of 6 × 10).
Next, the plate plate 2 will be described. On the upper surface of the plate plate 2, the inspection surface of the sample to be inspected (touch panel) is placed in close contact. The contact rod protrudes from each hole 3 of the plate plate 2 and presses the inspection surface. Therefore, the hole 3 of the plate plate 2 has a hole diameter sufficient to allow the contact rod to pass through. Usually, the diameter is 0.7 mm to 1.5 mm, preferably 0.8 mm to 1.2 mm. Is appropriate.
Incidentally, the diameter of the pressure rod is generally about 0.9 mm to 1.1 mm, the shape of the pressure rod is cylindrical, and the tip (top) thereof may be flat, or semicircular or dome-shaped. It may be. The positions of the holes provided in the plate plate 2 have a role of determining the position of the inspection surface. Therefore, the arrangement position of the holes 3 in the plate plate 2 matches the position of the contact rod multistage arrangement. In order to inspect and evaluate the linearity of the touch panel, the plate plate 2 is preferably provided with holes 3 so that the holes 3 are arranged in a straight line and at equal intervals, and the same interval is provided in a multistage arrangement. Most preferably, the positions of the holes are arranged so that the entire inspection surface is covered and the vertical and horizontal intervals are the same. The spacing between adjacent holes (pitch spacing) is advantageously 3 mm to 15 mm, preferably 4 mm to 13 mm. In this way, the holes are arranged in a straight line, and the vertical and horizontal intervals are constant, so that the specimen to be inspected can be discriminated from the electrical signal generated by contact with the pressure bar. It can be done easily.
プレート板２は、平坦で表面が平滑なものが好ましく、プラスチック板または金属板（好ましくはアルミ板）が使用でき、その厚さは１ｍｍ〜５ｍｍ、好ましくは２ｍｍ〜４ｍｍが望ましい。
図２は、触圧棒配列の部分断面拡大図を示す。
図２では、触圧棒配列における隣り合う２つの触圧棒の部分拡大図を示す。
プレート板２の下部には、触圧棒が上下運動し検査面の表面を押圧できるアクチュエーターが設置されている。触圧棒を上下運動させるアクチュエーターは、例えばソレノイド方式（電磁式）やピエゾ素子方式（圧電素子方式）を採用することができる。図２ではソレノイド方式で、触圧棒５を上下運動する態様が示されている。図２では触圧棒５に対応して、ソレノイド６が横方向に配列した状態が示されている。
The plate plate 2 is preferably flat and has a smooth surface, and a plastic plate or a metal plate (preferably an aluminum plate) can be used, and the thickness is desirably 1 mm to 5 mm, preferably 2 mm to 4 mm.
FIG. 2 shows an enlarged partial cross-sectional view of the contact rod arrangement.
FIG. 2 shows a partially enlarged view of two adjacent pressure rods in the pressure rod arrangement.
An actuator that can move the pressure bar up and down and press the surface of the inspection surface is installed below the plate plate 2. For example, a solenoid system (electromagnetic system) or a piezo element system (piezoelectric element system) can be adopted as the actuator that moves the contact rod up and down. FIG. 2 shows a mode in which the contact rod 5 is moved up and down by a solenoid system. FIG. 2 shows a state in which the solenoids 6 are arranged in the horizontal direction corresponding to the contact rods 5.
触圧棒５は、検査面へ接触するとき、その接圧が約３０ｇ〜２５０ｇとなるように設定される。被検査試料（タッチパネル）の検査面とプレート板２の表面とは密着し検査時に移動しないように固定すべきである。被検査試料とプレート板との固定化手段は後で説明する。
１個の触圧棒が検査面に押圧した時の接圧時間は、約０．１秒であれば充分である。従って本発明の装置において、1列が１０個の触圧棒配列の場合、１列の検査に要する時間は約１秒である。図１のように６段に配列した場合６０個の触圧棒を連続して作動させると約６秒で全面を検査できることになる。仮に１００個の触圧棒を設置した場合、約１０秒で検査をすることができる。かくして本発明の検査・評価装置は、製品の機能が適格に作動するか否かの判別には極めて短時間で完了することになる。
The contact pressure bar 5 is set so that the contact pressure is about 30 to 250 g when contacting the inspection surface. The inspection surface of the sample to be inspected (touch panel) and the surface of the plate plate 2 should be in close contact and fixed so as not to move during inspection. The means for immobilizing the sample to be inspected and the plate will be described later.
The contact time when one contact rod is pressed against the inspection surface is sufficient if it is about 0.1 seconds. Therefore, in the apparatus of the present invention, when one row has ten contact rod arrays, the time required for one row inspection is about 1 second. As shown in FIG. 1, when sixty contact rods are continuously operated, the entire surface can be inspected in about 6 seconds. If 100 contact rods are installed, the inspection can be performed in about 10 seconds. Thus, the inspection / evaluation apparatus of the present invention can be completed in a very short time to determine whether the function of the product operates properly.
段落番号００１４の内容
図３は、被検査試料（タッチパネル）を、検査・評価装置に配置した状態における断面
図を示す。支持基板１上に触圧棒多段配列９が固定して載置されている。この触圧棒多
段配列９はその上面にプレート板２が固定化されている。図３には、触圧棒多段配列９
における触圧棒およびプレート板２における孔は、図面上省略されている。触圧棒は、
プレート板２の孔を通して、その先端が被検査試料の検査面へ押圧されるようになって
いる。プレート板２の上面には、被検査試料がその検査面が密着した状態で重ねられて
いる。
被検査試料８は、支持基板の端部に設けられた固定台のヒンジ１１を介して上下に（矢
印方向に）開閉できる試料保持アーム１０内に収納されている。図３は、検査・評価装
置に、被検査試料８が配置されている状態を示し、被検査試料８は、検査面とプレート
板２が密着した状態で水平に設置されている。
Contents of Paragraph No. 0014 FIG. 3 shows a cross-sectional view of a sample to be inspected (touch panel) placed in an inspection / evaluation apparatus. Pressure rod multistage sequence 9 touch on the supporting base plate 1 is mounted and fixed. The plate 2 is fixed to the upper surface of the contact rod multi-stage array 9. FIG. 3 shows a contact rod multi-stage arrangement 9
The contact rod and the hole in the plate plate 2 are omitted in the drawing. The contact rod is
Through the hole of the plate plate 2, the tip is pressed against the inspection surface of the sample to be inspected. On the upper surface of the plate plate 2, a sample to be inspected is overlaid with its inspection surface in close contact.
A sample to be inspected 8, (in the arrow direction) up and down through a fixing base of the hinge 11 provided on an end portion of the support base plate are accommodated in that open specimen holding arm 10. FIG. 3 shows a state in which the inspected sample 8 is arranged in the inspection / evaluation apparatus, and the inspected sample 8 is horizontally installed with the inspection surface and the plate plate 2 being in close contact with each other.
本発明の検査・評価装置は、図３に示すように、被検査試料が固定して設置されると、機械的に可動する部分は触圧棒の上下運動のみであり、触圧棒多段配列９や被検査試料８は固定されたままである。検査が終了すると試料保持アーム１０を矢印方向に開いて被検査試料８を取り出し新しい試料を再び設置すればよい。
図２は、触圧棒配列の部分断面拡大図を示す。図２では隣り合う２つの触圧棒配列とプレート板との位置関係が示されている。図２の触圧棒配列においては触圧棒の上下運動にソレノイド方式（電磁式）を使用した例が示されている。各触圧棒は、それぞれのソレノイドにより電磁的に上下する。触圧棒の上端部はプレート板が配置されそのプレート板の孔を通して触圧棒がプレート板の上面へ突出し、被検査試料の検査面を押圧する構造となっている。前述したように、試料の検査面はプレート板の上面と密接して設置されるが、図２では被検査試料は示されていない。
本発明の検査・評価装置を用いて、被検査試料（タッチパネル）を試験するに当たっては、プレート板２に設けられた孔の位置に対応してX軸およびY軸に基づいて、触圧棒を一端部から他端部へ、また一段目から多段へ連続的に押圧し、得られた電気的位置信号の結果をコンピューターによって算出し、所定の基準値と対比して判別することによって、リニアリティーの適否を評価することができる。
In the inspection / evaluation apparatus of the present invention, as shown in FIG. 3, when the sample to be inspected is fixed and installed, the mechanically movable part is only the vertical movement of the pressure bar, and the pressure bar multi-stage arrangement 9 and the sample 8 to be inspected remain fixed. When the inspection is completed, the sample holding arm 10 is opened in the direction of the arrow, the sample 8 to be inspected is taken out, and a new sample may be set again.
FIG. 2 shows an enlarged partial cross-sectional view of the contact rod arrangement. FIG. 2 shows a positional relationship between two adjacent contact rod arrangements and plate plates. In the contact rod arrangement of FIG. 2, an example is shown in which a solenoid system (electromagnetic system) is used for the vertical motion of the contact rod. Each contact rod is moved up and down electromagnetically by a respective solenoid. A plate plate is disposed at the upper end of the contact rod, and the contact rod protrudes to the upper surface of the plate plate through a hole in the plate plate to press the inspection surface of the sample to be inspected. As described above, the inspection surface of the sample is placed in close contact with the upper surface of the plate plate, but FIG. 2 does not show the inspection sample.
When testing a sample to be inspected (touch panel) using the inspection / evaluation apparatus of the present invention, a contact rod is used based on the X-axis and Y-axis corresponding to the position of the hole provided in the plate plate 2. By pressing continuously from one end to the other end and from the first stage to multiple stages, the result of the electrical position signal obtained is calculated by a computer and discriminated against a predetermined reference value. Appropriateness can be evaluated.
段落番号００１６の内容
１ 支持基板
２ プレート板
３ 孔
４ 触圧棒配列
５ 触圧棒
６ ソレノイド
７ ソレノイド支持体
８ 被検査試料
９ 触圧棒多段配列
１０ 試料保持アーム
１１ ヒンジ
Numbering 0016 Contents 1 supporting base plate 2 plate plate 3 hole 4 tactile pressure rod arrangement 5 tactile pressure rod 6 solenoid 7 pressure rod multistage sequence 10 sample holding arm 11 hinged haptic solenoid support 8 inspected sample 9
Claims (5)
この触圧棒配列が多段に配置された触圧棒多段配列を有し、前記触圧棒配列は、各触
圧棒が一定の等間隔で配置され、前記触圧棒多段配列は、被検査試料の検査面の全
面を覆い、そして前記触圧棒多段配列は、各触圧棒配列が一定の等間隔で配置され、
（ｂ）各触圧棒は、触圧棒多段配列の上部に設置された、プレート板の孔を通して、検
査面に下方から上方に向けて突出するように支持基板上に設置され、
（ｃ）被検査資料の検査面が下方に向けて、触圧棒と対向するように配置しうる試料
配置手段を有し、
（ｄ）各触圧棒は、所定の間隔で打点するようにした制御手段および
（ｅ）各触圧棒の接触位置と検査結果とを判定する判断手段
を有する抵抗膜式タッチパネルの高速検査・評価装置。 (A) on a test support base plate, pressure rod sequence and tactile arranged linearly in a number of touch pressure rod is one row,
This contact rod arrangement has a multi-stage contact rod arrangement in which the contact rod arrangement is arranged at regular intervals, and the contact rod arrangement is arranged at a constant interval. Covering the entire inspection surface of the sample , and the contact rod multi-stage arrangement, each contact rod arrangement is arranged at regular intervals,
(B) Each contact rod is installed on the support substrate so as to project upward from below to the inspection surface through a hole in the plate plate, which is installed at the top of the contact rod multi-stage array,
(C) having sample placement means that can be placed so that the inspection surface of the material to be inspected faces downward and faces the contact rod;
(D) Each contact pressure bar has a control means adapted to strike at predetermined intervals, and (e) a high-speed inspection of a resistive touch panel having a determination means for determining a contact position and an inspection result of each contact pressure bar Evaluation device.
いる請求項１記載の検査・評価装置。 2. The inspection / evaluation apparatus according to claim 1, wherein each contact rod is controlled so as to sequentially protrude from one end to the other end in each contact rod array.
載の検査・評価装置。 2. The inspection / evaluation apparatus according to claim 1, wherein in each of the contact rod arrangements, the contact rods are operated up and down by a solenoid system.
載の検査・評価装置。 2. The inspection / evaluation apparatus according to claim 1, wherein in each of the contact rod arrangements, the contact rods are moved up and down by a piezo element method.
１記載の検査・評価装置。 2. The inspection / evaluation apparatus according to claim 1, wherein in each of the contact rod arrangements, the contact rods are arranged at intervals of 3 to 15 mm.
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