JP5474658B2 - Insulation inspection equipment - Google Patents

Description

  The present invention is an insulation inspection apparatus for inspecting an insulation state between wiring patterns formed on a circuit board, and in particular, can detect whether or not a spark (discharge) has occurred between wiring patterns during an insulation inspection. The present invention relates to an insulation inspection apparatus.

  As this type of insulation inspection apparatus, the present applicant has already proposed the insulation inspection apparatus disclosed in Patent Document 1 below. The insulation inspection apparatus includes a voltage supply unit that has a constant voltage source and supplies an inspection voltage to a predetermined part of an inspection object via an inspection probe, and an inspection voltage having a predetermined voltage value is supplied to the predetermined part. An inspection unit that inspects the insulation state of the inspection object in a state in which the inspection object is in contact, a detection unit that detects the occurrence of sparks in the inspection object based on the voltage value of the inspection voltage, and a voltage supply unit that controls the predetermined part. In the state where the inspection voltage is supplied, the inspection unit is controlled to perform the inspection process for inspecting the insulation state of the object to be inspected, and the predetermined process is performed when the detection unit detects the occurrence of sparks. And a voltage supply unit configured to supply a test voltage via a resistor connected between the constant voltage source and the output unit.

  Specifically, in this insulation inspection apparatus, a probe mechanism including a pair of inspection probes and a moving mechanism moves the inspection probes to contact with a pair of conductor patterns as inspection objects, and supplies a voltage supply unit. However, an inspection voltage is supplied between the pair of conductor patterns via each inspection probe. In this state, a current measuring unit that measures the current flowing between the pair of conductor patterns by supplying a voltage for inspection and outputs measurement data indicating the current value, and is generated between the pair of conductor patterns when the current flows. The voltage measuring unit that measures the voltage to be output and outputs the measurement data indicating the voltage value is configured, and the measuring unit that functions as the inspection unit and the detection unit in combination with the control unit is a pair of conductors. The current flowing between the patterns and the voltage between the pair of conductor patterns are detected and each measurement data is output, and the control unit detects the occurrence of the spark based on the measurement data indicating the voltage value of each measurement data. Then, the resistance value between the pair of conductor patterns is calculated based on both measurement data, and the insulation test is executed.

JP 2010-66050 A (page 5-6, FIG. 1)

  However, the following problems exist in the insulation inspection apparatus. That is, in the conventional insulation inspection apparatus, since the probe mechanism and the measurement unit are configured separately and disposed at different locations, the inspection probe included in the probe mechanism and the measurement unit are provided. It is necessary to connect with a plurality of wires (cables). For this reason, in the conventional insulation inspection device, the voltage waveform generated in the inspection probe due to the occurrence of sparks is measured through the wiring due to the presence of stray capacitance between the wirings. There is a problem that there is a possibility that a change in the voltage level cannot be measured in the measuring unit as a result of the voltage level being lowered until the voltage reaches the unit.

  This invention is made | formed in view of this subject, and it aims at providing the insulation test | inspection apparatus which can detect reliably the spark which generate | occur | produces between a pair of wiring patterns.

In order to achieve the above object, an insulation inspection apparatus according to claim 1, wherein a first probe brought into contact with one wiring pattern of a pair of wiring patterns to be subjected to insulation inspection, A second probe brought into contact with the other wiring pattern; a test voltage generating unit that generates a DC test voltage to be applied between the pair of wiring patterns via the first probe and the second probe; and the DC test voltage A voltage measuring unit for measuring an inter-pattern voltage generated between the pair of wiring patterns when the voltage is applied via the first probe and the second probe, and when the DC test voltage is applied A current measuring unit for measuring a current flowing between the pair of wiring patterns; and a pair of wiring patterns when the DC inspection voltage is applied. A spark detector that detects whether or not a spark has occurred, and the pair of wiring patterns in which the occurrence of the spark has been detected by the spark detector is determined to be defective, and the occurrence of the spark by the spark detector Insulation for inspecting the insulation state of the pair of wiring patterns based on the inter-pattern voltage measured by the voltage measurement unit and the current measured by the current measurement unit for the pair of wiring patterns in which no detection is detected An insulation inspection apparatus including a processing unit that executes an inspection process, wherein the spark detection unit is configured to output a trigger signal when the occurrence of the spark is detected, and the first probe and the second probe A moving arm in which one of the probes is fixed and driven by the probe driving unit. Disposed, said one of the probes is defined such that the low pressure side upon application of the DC test voltage, while being disposed in the moving arm, which is predefined when you enter the trigger signal pulse A pulse generator that outputs a pulse current having a width; and a current that is disposed between the one probe and the current measuring unit and disposed between the probe and the current measuring unit, and flows between the pair of wiring patterns. A signal injection unit that injects the pulse current into the current flowing between the pair of wiring patterns and outputs the current to the current measurement unit when the pulse current is output by the pulse generation unit. ing.

  According to the insulation inspection apparatus of the first aspect, since one of the first probe and the second probe is fixed, the spark detection unit is disposed on the moving arm driven by the probe driving unit. The spark generated between the pair of wiring patterns due to the application of the DC voltage can be detected very close to one probe to which the DC voltage is applied, so that the spark can be detected more reliably.

In addition, according to this insulation inspection apparatus, the spark detection unit, the pulse generation unit, and the pulse injection unit are disposed on the moving arm to which one of the probes defined so as to be on the low voltage side when a DC voltage is applied is fixed. At the same time, the spark detection unit is configured to output a trigger signal when the occurrence of a spark is detected, the pulse generation unit outputs a pulse current having a predetermined pulse width when the trigger signal is input, and the signal injection unit By outputting the current flowing between the pair of wiring patterns to the current measuring unit and when the pulse generating unit outputs the pulse current, the pulse current is injected into the current flowing between the pair of wiring patterns and output to the current measuring unit. , A pulse current as a signal for transmitting the occurrence of a spark to the processing unit on one wiring common to the current flowing between the pair of wiring patterns Since it is Succoth, in comparison with separately provided constituting the wiring for transmitting the signal to convey the occurrence of the spark in the processing unit, to reduce the number of wires.

1 is a configuration diagram showing a configuration of an insulation inspection device 1. It is a block diagram which shows the structure of 1 A of insulation test apparatuses.

  Hereinafter, embodiments of an insulation inspection apparatus will be described with reference to the accompanying drawings.

  First, the configuration of the insulation inspection apparatus 1 will be described with reference to the drawings. As an example, an example in which an insulation state between the wiring patterns 3 and 3 formed on the circuit board 2 is inspected will be described.

  An insulation inspection apparatus 1 shown in FIG. 1 is an insulation inspection apparatus that inspects an insulation state (insulation state between adjacent wiring patterns) of a plurality of wiring patterns 3 formed on a circuit board 2 as an example. The first probe 11, the second probe 12, the third probe 13, the fourth probe 14, the probe driving units 15 and 16, the spark detection unit 17, the pulse generation unit 18, the signal injection unit 19, the inspection voltage generation unit 23, A voltage measuring unit 24, a current measuring unit 25, a connection switching unit 26, a probe drive control unit 27, and a processing unit 28 are provided.

  As shown in FIG. 1, the first probe 11 and the third probe 13 are fixed to a moving arm 15 a connected to the probe driving unit 15 while being electrically insulated from each other. The second probe 12 and the fourth probe 14 are fixed to a moving arm 16 a connected to the probe driving unit 16 in a state where they are electrically insulated from each other.

  The probe drive units 15 and 16 are controlled by the probe drive control unit 27 so that the movable arms 15a and 16a fixed on the surface side of the circuit board 2 on which the wiring pattern 3 to be inspected is formed are respectively fixed. It is configured to be movable in three dimensions. With this configuration, the probe drive unit 15 causes the tips of the first probe 11 and the third probe 13 attached to the moving arm 15a to be connected to the pair of wiring patterns 3 to be inspected selected from the plurality of wiring patterns 3. 3 is configured to be able to contact one of the wiring patterns 3 simultaneously. Further, the probe driving unit 16 causes the tips of the second probe 12 and the fourth probe 14 attached to the moving arm 16 a to simultaneously contact the other wiring pattern 3 of the pair of wiring patterns 3 and 3. It is configured to be possible.

  The first probe 11 is connected to one terminal Tp1 in the probe-side terminal group Tp in the connection switching unit 26 via the wiring W1. The third probe 13 is connected to another one terminal Tp3 in the probe-side terminal group Tp in the connection switching unit 26 via the wiring W3.

  On the other hand, the movable arm to which the second probe 12 (one probe defined to be on the low voltage side) is attached to the first probe 11 side (high voltage side) to which the DC inspection voltage Vex is applied. As shown in FIG. 1, a spark detection unit 17, a pulse generation unit 18, and a signal injection unit 19 are attached to 16a (installed). In this case, the members in the region surrounded by the one-dot chain line in the figure are assumed to move together with the moving arm 16a. The second probe 12 is connected to the first input terminal a of the signal injection unit 19. The fourth probe 14 is connected to one terminal Tp4 in the probe-side terminal group Tp in the connection switching unit 26 via the wiring W4.

  As an example, the spark detection unit 17 samples a voltage signal indicating the voltage generated in the second probe 12 at a predetermined sampling period, converts the voltage signal into voltage data, and outputs the voltage data. And the amount of displacement of this voltage data (as an example, the amount of displacement between the latest voltage data and the previous voltage data) is calculated, and the amount of displacement is more than a predetermined reference amount. An arithmetic circuit (not shown) that sometimes outputs a trigger signal St is provided.

  In the insulation inspection apparatus 1, as will be described later, the first probe 11 is connected to the inspection voltage generation unit 23 via the connection switching unit 26, and the second probe 12 connects the signal injection unit 19 and the connection switching unit 26. The DC test voltage Vex output from the test voltage generator 23 is applied between the pair of wiring patterns 3 and 3 while being connected to the current measuring unit 25 via the DC voltage. For this reason, when a portion having a small insulation resistance (for example, a whisker-like conductor pattern having a very small cross-sectional area) exists locally between the pair of wiring patterns 3 and 3, this is achieved by applying the DC inspection voltage Vex. When a spark is generated at a site, the DC probe voltage Vex applied to the first probe 11 is suddenly reduced due to a temporary increase in current generated at the time of sparking, and the second probe A sharp drop occurs in the voltage of 12. With the above configuration, the spark detection unit 17 detects a sudden voltage drop generated in the voltage of the second probe 12 and outputs a trigger signal St.

  As an example, the pulse generation unit 18 includes a one-shot multivibrator (not shown) and a current generation circuit, and is defined in advance when the one-shot multivibrator inputs the trigger signal St from the spark detection unit 17. A pulse signal having a predetermined pulse width is generated by generating a pulse signal having a predetermined pulse width and outputting the pulse signal to a current generation circuit. The current generation circuit generates a current during a period in which the pulse signal is input. To do. The pulse width is defined as a pulse width that can reliably detect the pulse current Ip in the current measuring unit 25. The signal injection unit 19 has a function of outputting the current input from the first input terminal a from the output terminal c, and also to the current Im input from the first input terminal a when the pulse current Ip is input from the second input terminal b. A function of injecting (superimposing) the pulse current Ip and outputting the current (Im + Ip) from the output terminal c is also provided. With this configuration, when the signal injection unit 19 outputs the current Im input from the first input terminal a from the output terminal c and inputs the pulse current Ip from the second input terminal b, the signal injection unit 19 inputs the pulse current Ip. The current (Im + Ip) is output from the output terminal c only for the period. The output terminal c of the signal injection unit 19 is connected to another one terminal Tp2 in the probe-side terminal group Tp in the connection switching unit 26 via the wiring W2.

  The inspection voltage generation unit 23 is controlled by the processing unit 28 to generate a DC inspection voltage Vex having a predetermined voltage value and output the DC inspection voltage Vex between the output terminal and the reference potential G. In this example, the output terminal of the test voltage generation unit 23 is connected to one terminal Ts1 in the processing unit side terminal group Ts in the connection switching unit 26. The voltage measuring unit 24 has a pair of input terminals connected to the pair of terminals Ts2 and Ts3 in the processing unit side terminal group Ts in the connection switching unit 26, and a voltage Vm generated between the pair of terminals Ts2 and Ts3. The value is measured and voltage data Dv indicating the voltage value is output to the processing unit 28. In this example, the voltage measuring unit 24 is connected to the third probe 13 and the fourth probe 14 via the connection switching unit 26 and the wirings W3 and W4, as will be described later. As a result, an inter-pattern voltage generated between the pair of wiring patterns 3 and 3 is generated as the voltage Vm between the pair of terminals Ts2 and Ts3. Therefore, the voltage measuring unit 24 measures the voltage Vm, thereby Measure the voltage between.

  In the current measuring unit 25, one of the pair of input terminals is connected to the other one terminal Ts4 in the processing unit side terminal group Ts in the connection switching unit 26, and the other of the pair of input terminals is Connected to the reference potential G and disposed (intervened) between the terminal Ts4 and the reference potential G. The current measuring unit 25 measures the current value of the current In flowing from the terminal Ts4 to the reference potential G and outputs current data Di indicating the measured current value to the processing unit 28. In addition, the current measuring unit 25 samples and converts the measured current value of the current In into data by sampling at a predetermined sampling period in the same manner as the spark detecting unit 17 as an example. (As an example, the displacement amount between the latest data and the previous data is calculated), and when the displacement amount is displaced beyond a predetermined reference amount, the pulse current Ip is included in the current In. And the detection signal Ssp is output to the processing unit 28.

  As an example, the connection switching unit 26 has a plurality of (four in this example) vertical wires (not shown) connected at one end side to the respective terminals Ts1, Ts2, Ts3, and Ts4 of the processing unit side terminal group Ts, and one end side thereof. A plurality of (four in this example) horizontal wires (not shown) connected to the terminals Tp1, Tp2, Tp3, Tp4 of the probe side terminal group Tp and arranged to intersect the vertical wires, and the vertical wires And a plurality of switches (not shown) for short-circuiting or opening the horizontal wirings and a pair of vertical wirings and horizontal wirings that are arranged at each crossing position of the horizontal wirings and intersect at each crossing position. The short circuit / open state of each switch is controlled by the processing unit 28. With this configuration, the connection switching unit 26 can be connected to any terminal of the probe-side terminal group Tp with each terminal of the processing-unit side terminal group Ts by being controlled by the processing unit 28. ing.

  The probe drive control unit 27 is configured by a programmable logic controller as an example, and target position data of a set of the first probe 11 and the third probe 13 input from the processing unit 28, and the second probe 12 and the fourth probe 14. Based on the position data Dpo including a set of target position data, the movement control for the probe driving units 15 and 16 is executed to move the movement arms 15a and 16a, thereby allowing the first probe 11 and the third probe 13 to move. The set is moved to the target position, and the second probe 12 and the fourth probe 14 are moved to the target position. The processing unit 28 includes a CPU and a memory (both not shown) as an example, and executes control processing for the test voltage generation unit 23, the connection switching unit 26, and the probe drive control unit 27 and performs insulation test processing. To do. The memory includes a reference resistance value (resistance value for determining whether the insulation resistance is good or bad) used in the insulation inspection process, and positions of inspection points defined in advance on each wiring pattern 3 formed on the circuit board 2. Data Dpo is stored in advance.

  Next, the operation of the insulation inspection apparatus 1 will be described with reference to the drawings. It is assumed that the circuit board 2 to be subjected to the insulation test is held by a board holding unit (not shown) and arranged at a predetermined test position.

  In this state, in the insulation inspection apparatus 1, the processing unit 28 performs an insulation inspection process. In this insulation inspection process, the processing unit 28 performs an inspection of the insulation state between the pair of wiring patterns 3 and 3 and whether or not a spark has occurred between the pair of wiring patterns 3 and 3 during this inspection. Perform detection.

  Specifically, the processing unit 28 first executes control on the connection switching unit 26 to change the terminal Ts1 of the processing unit side terminal group Ts to the terminal Tp1 of the probe side terminal group Tp and the processing unit side terminal group Ts. Are connected to the terminal Tp2 of the probe side terminal group Tp, and the terminals Ts2 and Ts3 of the processing unit side terminal group Ts are connected to the terminals Tp3 and Tp4 of the probe side terminal group Tp, respectively. Thereby, the test voltage generation unit 23 is connected to the first probe 11 via the connection switching unit 26 and the wiring W1, and the current measurement unit 25 is connected via the connection switching unit 26, the wiring W2 and the signal injection unit 19. Connected to the second probe 12. For this reason, by applying the DC inspection voltage Vex to the first probe 11, the DC voltage can be applied between the first probe 11 and the second probe 12.

  One input terminal of the voltage measuring unit 24 is connected to the third probe 13 via the connection switching unit 26 and the wiring W3, and the other input terminal of the voltage measuring unit 24 is connected to the connection switching unit 26 and the wiring W4. To the fourth probe 14. Therefore, the voltage measuring unit 24 can measure the inter-pattern voltage generated between the pair of wiring patterns 3 and 3 as the voltage Vm.

  Subsequently, the processing unit 28 controls the inspection voltage generation unit 23 to output the DC inspection voltage Vex from the inspection voltage generation unit 23 for a predetermined time, and then stops it. As a result, the DC inspection voltage Vex is temporarily applied to the first probe 11 via the terminal Ts1, the terminal Tp1 of the connection switching unit 26 and the wiring W1. As a result, since a DC voltage is applied between the pair of wiring patterns 3 and 3, the inspection voltage generator 23, the terminals Ts1 and Tp1 of the connection switching unit 26, the wiring W1, Via the first probe 11, one wiring pattern 3, the other wiring pattern 3, the second probe 12, the signal injection unit 19, the wiring W 2, the terminals Tp 2 and Ts 4 of the connection switching unit 26, and the current measurement unit 25. A current Im flows through a path that reaches the reference potential G, and an inter-pattern voltage is generated between the wiring patterns 3 and 3 due to the current Im flowing between the pair of wiring patterns 3 and 3.

  The voltage measuring unit 24 inputs the inter-pattern voltage as the voltage Vm during the application period of the DC inspection voltage Vex, measures the voltage value of the voltage Vm, and outputs voltage data Dv indicating the voltage value to the processing unit 28. Output to. The current measuring unit 25 also inputs the current Im flowing through the path as the current In during the application period of the DC inspection voltage Vex, measures the current value of the current In (current Im), and calculates the current value. The indicated current data Di is output to the processing unit 28. The processing unit 28 receives the voltage data Dv and the current data Di, and also calculates a voltage value (voltage value of the voltage Vm) between the pair of wiring patterns 3 and 3 calculated based on the voltage data Dv, and the current data Di. The insulation resistance value between the pair of wiring patterns 3 and 3 is calculated based on the current value flowing between the pair of wiring patterns 3 and 3 calculated based on (current value of the current Im). In addition, the processing unit 28 compares the calculated insulation resistance value with the reference resistance value stored in the memory, and when the calculated insulation resistance value is equal to or greater than the reference resistance value, the processing unit 28 is connected between the pair of wiring patterns 3 and 3. When the calculated insulation resistance value is less than the reference resistance value, it is determined that the insulation state between the pair of wiring patterns 3 and 3 is defective, and this determination result is used as an inspection target. The pair of wiring patterns 3 and 3 is stored in the memory in correspondence with the above.

  On the other hand, when a portion having a small insulation resistance (for example, a whisker-like conductor pattern) exists locally between the pair of wiring patterns 3 and 3, a DC voltage is applied between the pair of wiring patterns 3 and 3. As a result, sparks may occur at this site. Due to the occurrence of this spark, the current value of the current Im itself temporarily increases (only for a short time) and changes in a pulse shape. In the insulation inspection apparatus 1 having a long configuration of the wires W1 to W4, the wires W1 Due to the stray capacitance existing between ˜W4, the current value change (current waveform) of the current Im gradually becomes gradual and the level decreases, and the current measurement unit 25 cannot change this change. Occur.

  In this regard, in this insulation inspection apparatus 1, the spark detection unit 17 disposed on the second probe 12 side, which is the low voltage side with respect to the first probe 11 side (the high voltage side) to which the DC test voltage Vex is applied, The pulse generation unit 18 and the signal injection unit 19 operate when a spark is generated, and inject a pulse current Ip having a predetermined pulse width into a current Im flowing between the pair of wiring patterns 3 and 3 ( Overlapping) and outputting the current (Im + Ip) to the wiring W2. In this case, the pulse width of the pulse current Ip is defined as a constant pulse width that can reliably detect the pulse current Ip in the current measuring unit 25 regardless of the pulse-like change time generated in the current Im itself. . Therefore, in the insulation inspection apparatus 1, when the current measuring unit 25 detects whether or not the pulse current Ip is included in the current In and inputs the current (Im + Ip) as the current In, it is superimposed on the current Im. The detected pulse current Ip is detected and a detection signal Ssp is output to the processing unit 28. Further, when the detection signal Ssp is input, the processing unit 28 determines that a spark has occurred between the pair of wiring patterns 3 and 3 and, for example, a pair of wirings whose inspection target is a flag indicating the occurrence of the spark Corresponding to patterns 3 and 3 is stored in the memory. Thus, the insulation inspection process for one pair of wiring patterns 3 and 3 is completed.

  The processing unit 28 reads out each position data Dpo of the inspection point for the pair of wiring patterns 3 and 3 for newly executing the insulation inspection while sequentially reading out the above processing from the memory. This is repeated until all the insulation inspections for the wiring patterns 3 and 3 are completed. As a result, the memory stores the determination result in the insulation test and the flag indicating the presence or absence of the spark in association with each of the wiring patterns 3 and 3.

  As described above, according to the insulation inspection apparatus 1, the spark detection unit 17 is disposed on the moving arm 16a that is driven by the probe driving unit 16 and to which the second probe 12 is attached. As a result, the spark generated between the pair of wiring patterns 3 and 3 can be detected very close to the second probe 12 to which the DC voltage is applied. As a result, the spark can be detected more reliably.

  Further, according to the insulation inspection apparatus 1, the second probe 12, which is defined to be on the low voltage side when the DC voltage is applied, is fixed out of the first probe 11 and the second probe 12, and is fixed by the probe driving unit 16. A spark detection unit 17, a pulse generation unit 18, and a signal injection unit 19 are disposed on the driven moving arm 16a, and when the spark detection unit 17 detects the occurrence of a spark, a trigger signal St is output, and the pulse generation unit When a trigger signal St is input to 18, a pulse current Ip having a predetermined pulse width is output, and a signal injection unit 19 interposed between the second probe 12 and the current measurement unit 25 is connected to a pair of wirings. When the current Im flowing between the patterns 3 and 3 is output to the current measurement unit 25 and the pulse current Ip is output by the pulse generation unit 18, the current Im By injecting the pulse current Ip and outputting it to the current measuring unit 25, the pulse current Ip as a signal for transmitting the occurrence of spark to the processing unit 28 can be caused to flow through one wiring W2 that is common to the current Im. Therefore, the number of wirings can be reduced as compared with a configuration in which wiring for transmitting a signal for transmitting the occurrence of spark to the processing unit 28 is separately provided.

  In the insulation inspection apparatus 1, as described above, the DC voltage of the first probe 11 and the second probe 12 is used to suppress the number of wires from the probes 11 to 14 to the processing unit 28 side. A spark detection unit 17 is provided on the probe drive unit 16 side that drives the second probe 12 that is on the low voltage side during application of a pulse, and a pulse current Ip indicating the occurrence of spark is injected into the current Im (that is, common to the current Im) However, if the number of wirings may be increased, a trigger signal St indicating the occurrence of a spark as in the insulation inspection apparatus 1A shown in FIG. Can be directly sent to the processing unit 28 via another wiring Ws. In this configuration, the processing unit 28 determines that a spark has occurred between the pair of wiring patterns 3 and 3 when the trigger signal St is input. In addition, about the component which has the same function as the above-mentioned insulation test | inspection apparatus 1, the same code | symbol is attached | subjected and the overlapping description is abbreviate | omitted.

  According to this insulation inspection apparatus 1A, although the number of wires from the probes 11 to 14 to the processing unit 28 increases, the arrangement of the pulse generation unit 18 and the signal injection unit 19 can be omitted. The current measuring unit 25A in which the function of detecting the pulse current Ip is omitted can be used, and the device configuration can be simplified. In addition, when adopting a configuration in which the trigger signal St output from the spark detection unit 17 is output to the processing unit 28 as in the insulation inspection apparatus 1A, although not illustrated, the low-voltage side moving arm 16a is connected to the processing unit 28. Instead of the arrangement, or together with the arrangement on the low-pressure side moving arm 16a, the spark detection unit 17 is arranged on the high-pressure side moving arm 15a, and the trigger signal St is output from the probe driving unit 15 side to the processing unit 28. A configuration can also be adopted.

  Further, the configuration including the two probe driving units 15 and 16 has been described above. However, the configuration is not limited to two. The number of terminals Ts of the processing unit side terminal group Ts in the connection switching unit 26 and the probe side terminal group Tp By increasing the number of terminals Tp, the number can be any number of three or more. Further, as an example, the wiring pattern 3 to be inspected has been described with reference to an example in which the wiring pattern 3 is formed only on one surface side of the circuit board 2. Therefore, in the above-described insulation inspection apparatuses 1 and 1A, Although only the movable arms 15a and 16a can be moved three-dimensionally, they are not shown, but they correspond to the circuit board 2 on which the wiring pattern 3 to be inspected is formed also on the other surface side. Thus, it is possible to adopt a configuration in which the moving arms 15a and 16a can be moved three-dimensionally on one surface side and the other surface side, or the moving arms 15a and 16a that can move only on one surface side. In addition, it is also possible to adopt a configuration including another moving arm (moving arm on which a circuit equivalent to the moving arms 15a and 16a is mounted) that can move three-dimensionally on the other surface side. That.

  Further, in the above-described insulation inspection apparatuses 1 and 1A, the four-terminal method is adopted when the voltage measuring unit 24 detects the inter-pattern voltage generated between the pair of wiring patterns 3 and 3, but the two-terminal method is adopted. It can also be configured. In the configuration employing this two-terminal method, although not shown, the third probe 13, the fourth probe 14, the wiring W3 and the wiring W4 are omitted in FIGS. Can be realized by connecting the terminals Ts2 and Ts3 of the connection switching unit 26 to which the terminals are connected to the terminals Tp1 and Tp2.

DESCRIPTION OF SYMBOLS 1 Insulation inspection apparatus 3 Wiring pattern 11 1st probe 12 2nd probe 13 3rd probe 14 4th probe 17 Spark detection part 23 Inspection voltage generation part 24 Voltage measurement part 25 Current measurement part 26 Connection switching part 28 Processing part Vex DC test Voltage

Claims (1)

A first probe brought into contact with one of the pair of wiring patterns to be subjected to insulation inspection;
A second probe brought into contact with the other wiring pattern of the pair of wiring patterns;
An inspection voltage generator that generates a DC inspection voltage to be applied between the pair of wiring patterns via the first probe and the second probe;
A voltage measuring unit that measures an inter-pattern voltage generated between the pair of wiring patterns when the DC inspection voltage is applied via the first probe and the second probe;
A current measuring unit for measuring a current flowing between the pair of wiring patterns when the DC inspection voltage is applied;
A spark detector that detects whether a spark has occurred between the pair of wiring patterns when the DC inspection voltage is applied;
The pair of wiring patterns in which the occurrence of the spark is detected by the spark detection unit is determined to be defective, and the voltage measurement unit is used for the pair of wiring patterns in which the occurrence of the spark is not detected by the spark detection unit. And a processing unit that performs an insulation inspection process for inspecting an insulation state of the pair of wiring patterns based on the inter-pattern voltage measured by the current measurement unit and the current measured by the current measurement unit. And
The spark detector is configured to output a trigger signal when the occurrence of the spark is detected, and one of the first probe and the second probe is fixed and driven by a probe driver. Arranged on the moving arm ,
The one probe is defined to be a low voltage side when the DC inspection voltage is applied,
A pulse generating unit that is disposed on the moving arm and outputs a pulse current having a predetermined pulse width when the trigger signal is input;
It is disposed on the moving arm and is interposed between the one probe and the current measuring unit, and outputs a current flowing between the pair of wiring patterns to the current measuring unit and the pulse generating unit An insulation inspection apparatus comprising: a signal injection unit that injects the pulse current into the current flowing between the pair of wiring patterns and outputs the current to the current measurement unit when a pulse current is output .

Images