JP5564804B2 - Pseudo fault generator - Google Patents

Description

  The present invention relates to a pseudo failure generating apparatus that generates a pseudo failure in an electronic apparatus including a plurality of units.

  A pseudo-fault generating device that is applied to an electronic device (for example, a communication device) having a unit (a part having a specific function, such as a control circuit unit and a connection interface unit), and generates a pseudo-fault in the unit It has been known.

  As one example of this type of pseudo-failure generating device, the pseudo-failure generating device described in Patent Document 1 accepts a set value that represents an elapsed time. The pseudo-failure generating device sets the value stored in the register included in the unit to a predetermined value indicating the occurrence of the failure when the elapsed time has elapsed from the time when the set value is received. Cause a pseudo failure.

  According to this, it is possible to reproduce (simulate) the situation in which the electronic device detects that a failure has occurred in one unit. As a result, for example, when a failure occurs in the unit, it is possible to test (inspect) the operation of the electronic device configured to perform processing according to the failure.

Japanese Patent Laid-Open No. 3-184134

  By the way, for example, a first unit and a second unit that transmit / receive signals to / from each other are provided, and when the second unit cannot transmit / receive signals to / from the first unit, it is detected that a failure has occurred in the second unit. Thus, an electronic device may be configured.

  In this case, when a failure occurs in the first unit, the electronic device first detects that a failure has occurred in the first unit. Thereafter, when the electronic device detects that the second unit cannot transmit / receive a signal to / from the first unit, the electronic device detects that a failure has also occurred in the second unit. That is, this electronic device detects that a failure has occurred in the first unit when a failure has occurred in the first unit, and then detects that a failure has also occurred in the second unit.

  By the way, according to the pseudo failure generating apparatus, it is not possible to set a timing for generating a pseudo failure for each unit. Therefore, even if the pseudo-failure generating device is applied to an electronic device having a plurality of units, the situation in which the electronic device detects that a failure has occurred in a plurality of units at different timings as described above. There was a problem that could not.

  For this reason, the object of the present invention is to solve the above-described problem “cannot reproduce the situation in which an electronic device detects that a plurality of units have failed at different timings”. The object is to provide a pseudo-failure generator.

  In order to achieve such an object, a pseudo-fault generator according to one embodiment of the present invention is applied to an electronic device including a plurality of units.

Furthermore, the pseudo-fault generator is
The failure occurrence information including the unit identification information for identifying the unit and the timing information indicating the timing at which the failure is generated is received, and at the timing indicated by the timing information included in the received failure occurrence information, Pseudo failure generating means for generating a pseudo failure in the unit specified by the unit specifying information included in the failure occurrence information is provided.

  Further, a simulated fault occurrence system according to another aspect of the present invention includes an electronic device including a plurality of units, and a simulated fault generation device applied to the electronic device.

Furthermore, the pseudo-fault generator is
The failure occurrence information including the unit identification information for identifying the unit and the timing information indicating the timing at which the failure is generated is received, and at the timing indicated by the timing information included in the received failure occurrence information, Pseudo failure generating means for generating a pseudo failure in the unit specified by the unit specifying information included in the failure occurrence information is provided.

  In addition, a pseudo failure generation method according to another embodiment of the present invention is applied to an electronic device including a plurality of units.

Furthermore, the above pseudo failure generation method is:
The failure occurrence information including the unit identification information for identifying the unit and the timing information indicating the timing at which the failure is generated is received, and at the timing indicated by the timing information included in the received failure occurrence information, A pseudo failure generating step of generating a pseudo failure in the unit specified by the unit specifying information included in the failure occurrence information.

Moreover, the program which is the other form of this invention is:
In a pseudo-failure generator applied to an electronic device including a plurality of units,
The failure occurrence information including the unit identification information for identifying the unit and the timing information indicating the timing at which the failure is generated is received, and at the timing indicated by the timing information included in the received failure occurrence information, This is a program for realizing a pseudo failure generating means for generating a pseudo failure in a unit specified by unit specifying information included in the failure occurrence information.

  The present invention is configured as described above, and can reproduce a situation in which an electronic device detects that a failure has occurred in a plurality of units at an arbitrary timing.

1 is a diagram illustrating a schematic configuration of a simulated fault occurrence system according to an embodiment of the present invention. It is a figure showing the schematic structure of the pseudo-fault generating apparatus which concerns on the modification of embodiment of this invention.

  A pseudo-failure generating apparatus according to one embodiment of the present invention is applied to an electronic device including a plurality of units.

Furthermore, the pseudo-fault generator is
The failure occurrence information including the unit identification information for identifying the unit and the timing information indicating the timing at which the failure is generated is received, and at the timing indicated by the timing information included in the received failure occurrence information, Pseudo failure generating means for generating a pseudo failure in the unit specified by the unit specifying information included in the failure occurrence information is provided.

  According to this, the pseudo fault generating device can set the timing for generating a pseudo fault for each unit. As a result, it is possible to reproduce a situation in which the electronic device detects that a failure has occurred in a plurality of units at an arbitrary timing.

  In this case, the pseudo fault occurrence means sets the value stored in the register included in the unit to a predetermined fault detection value indicating that a fault has occurred, thereby pseudo-faulting the unit. It is preferable to be configured to generate

  According to this, it is possible to easily realize a pseudo failure in the unit.

In this case, the timing information is information representing elapsed time,
The pseudo-failure generating means is
It includes time measuring means for measuring the time elapsed since the time when the failure occurrence information was received, and the time measured by the time measurement means reaches the elapsed time represented by the timing information included in the received failure occurrence information. At this point, it is preferable that the unit specified by the unit specifying information included in the failure occurrence information is caused to generate a pseudo failure.

  In this case, the unit is configured to output a failure occurrence notification indicating that a failure has occurred in the unit when the value stored in the register included in the unit is the failure detection value. It is preferred that

  In this case, the electronic device receives the output failure occurrence notification, and stores the received failure occurrence notification and notification reception time point information indicating the time when the failure occurrence notification is received in association with each other. It is preferable to provide storage means.

  According to this, the electronic device can identify the unit in which the failure actually occurred based on the stored failure occurrence notification and notification reception time point information. Thereby, the electronic device can perform an appropriate process according to the failure.

  Further, a simulated fault occurrence system according to another aspect of the present invention includes an electronic device including a plurality of units, and a simulated fault generation device applied to the electronic device.

Furthermore, the pseudo-fault generator is
The failure occurrence information including the unit identification information for identifying the unit and the timing information indicating the timing at which the failure is generated is received, and at the timing indicated by the timing information included in the received failure occurrence information, Pseudo failure generating means for generating a pseudo failure in the unit specified by the unit specifying information included in the failure occurrence information is provided.

  In this case, the pseudo fault occurrence means sets the value stored in the register included in the unit to a predetermined fault detection value indicating that a fault has occurred, thereby pseudo-faulting the unit. It is preferable to be configured to generate

In this case, the timing information is information representing elapsed time,
The pseudo-failure generating means is
It includes time measuring means for measuring the time elapsed since the time when the failure occurrence information was received, and the time measured by the time measurement means reaches the elapsed time represented by the timing information included in the received failure occurrence information. At this point, it is preferable that the unit specified by the unit specifying information included in the failure occurrence information is caused to generate a pseudo failure.

  In addition, a pseudo failure generation method according to another embodiment of the present invention is applied to an electronic device including a plurality of units.

Furthermore, the above pseudo failure generation method is:
The failure occurrence information including the unit identification information for identifying the unit and the timing information indicating the timing at which the failure is generated is received, and at the timing indicated by the timing information included in the received failure occurrence information, A pseudo failure generating step of generating a pseudo failure in the unit specified by the unit specifying information included in the failure occurrence information.

  In this case, the pseudo fault occurrence step sets the value stored in the register included in the unit to a predetermined fault detection value indicating that a fault has occurred, thereby causing a pseudo fault to the unit. It is preferable to be configured to generate

In this case, the timing information is information representing elapsed time,
The pseudo-fault occurrence process is
While measuring the time elapsed since the time when the failure occurrence information was received, the failure occurrence information when the measured time reached the elapsed time represented by the timing information included in the received failure occurrence information. It is preferable that the unit specified by the unit specifying information included in the is configured to cause a pseudo failure.

Moreover, the program which is the other form of this invention is:
In a pseudo-failure generator applied to an electronic device including a plurality of units,
The failure occurrence information including the unit identification information for identifying the unit and the timing information indicating the timing at which the failure is generated is received, and at the timing indicated by the timing information included in the received failure occurrence information, This is a program for realizing a pseudo failure generating means for generating a pseudo failure in a unit specified by unit specifying information included in the failure occurrence information.

  In this case, the pseudo fault occurrence means sets the value stored in the register included in the unit to a predetermined fault detection value indicating that a fault has occurred, thereby pseudo-faulting the unit. It is preferable to be configured to generate

In this case, the timing information is information representing elapsed time,
The pseudo-failure generating means is
It includes time measuring means for measuring the time elapsed since the time when the failure occurrence information was received, and the time measured by the time measurement means reaches the elapsed time represented by the timing information included in the received failure occurrence information. At this point, it is preferable that the unit specified by the unit specifying information included in the failure occurrence information is caused to generate a pseudo failure.

  Even the invention of the pseudo-failure occurrence system, the pseudo-failure occurrence method, or the program having the above-described configuration achieves the above-described object of the present invention because it has the same operation as the pseudo-failure occurrence device. be able to.

  DESCRIPTION OF EMBODIMENTS Hereinafter, embodiments of a pseudo failure generating device, a pseudo failure generating system, a pseudo failure generating method, and a program according to the present invention will be described with reference to FIGS.

<Embodiment>
(Constitution)
As shown in FIG. 1, the simulated fault occurrence system 1 according to the embodiment includes an electronic device and a simulated fault generation device applied to the electronic device. In this example, the electronic device is a communication device that transmits information received from one of a plurality of connected external devices to another external device.

  The electronic device includes a control unit (pseudo-fault generating means) 11, an error processing unit 12, a LAN (Local Area Network) controller unit 13 as a unit, an L2SW (Layer 2 Switch) unit 14 as a unit, and a unit. The first interface unit 15 and the second interface unit 16 as a unit are provided. That is, it can be said that the electronic apparatus includes a plurality of units.

  The control unit 11, the error processing unit 12, the LAN controller unit 13, the L2SW unit 14, the first interface unit 15, and the second interface unit 16 are connected to be communicable with each other via a bus. .

  A first external device (for example, an information processing device or a communication device) is connected to the first interface unit 15. The first interface unit 15 includes a register 15a that stores a failure detectability value. The failure detectability value is set to a value indicating that no failure has occurred, or a value (failure detection value) indicating that a failure has occurred. When the failure detectability value stored in the register 15a is a failure detection value, the first interface unit 15 outputs a failure occurrence notification indicating that a failure has occurred in the first interface unit 15. .

  The second interface unit 16 has the same configuration as the first interface unit 15. A second external device (for example, an information processing device or a communication device) is connected to the second interface unit 16.

  The second interface unit 16 includes a register 16a similar to the register 15a. Similarly to the first interface unit 15, the second interface unit 16 indicates that a failure has occurred in the second interface unit 16 when the failure detection availability value stored in the register 16 a is a failure detection value. A failure notification indicating that there is a problem is output.

  The L2SW unit 14 sets the state of the electronic device so that the first interface unit 15 and the second interface unit 16 can transmit and receive information to and from each other. The L2SW unit 14 includes a register 14a similar to the register 15a. Similarly to the first interface unit 15, the L2SW unit 14 indicates that a failure has occurred in the L2SW unit 14 when the failure detection availability value stored in the register 14a is a failure detection value. Output a notification.

  The LAN controller unit 13 uses the information received from the external device (first external device or second external device) by the interface unit (first interface unit 15 or second interface unit 16). The interface unit for transmitting the message is specified. The LAN controller unit 13 outputs the received information to the specified interface unit.

  The LAN controller unit 13 includes a register 13a similar to the register 15a. Similar to the first interface unit 15, the LAN controller unit 13 indicates that a failure has occurred in the LAN controller unit 13 when the failure detection availability value stored in the register 13 a is a failure detection value. Outputs a failure notification.

  The control unit 11 includes a central processing unit (CPU) (not shown) and a storage device (memory). The control part 11 is comprised so that the following function may be implement | achieved when CPU runs the program memorize | stored in the memory | storage device. In the present specification, the control unit 11 is also called a failure generating device.

The control unit 11 includes a timer (time measuring means) 11a.
The timer 11a measures the time that has elapsed since the control unit 11 received the failure occurrence information. Here, the failure occurrence information is unit identification information for identifying the units 13 to 16 (in this example, information indicating addresses of failure detection availability values stored in the registers 13a to 16a included in the units 13 to 16). And timing information representing the timing at which the failure is generated. The timing information is information representing elapsed time.

  The control unit 11 stores failure occurrence information preset by the user in the storage device. The controller 11 receives the read failure occurrence information by reading the stored failure occurrence information. Note that the control unit 11 may be configured to accept failure occurrence information input by the user.

  The control unit 11 causes a pseudo failure to occur in the units 13 to 16 specified by the unit specifying information included in the failure occurrence information at the timing indicated by the timing information included in the received failure occurrence information.

  Specifically, when the time measured by the timer 11a reaches the elapsed time represented by the timing information included in the received failure occurrence information, the control unit 11 includes the unit specifying information included in the failure occurrence information. The failure detection enable / disable value stored in the registers 13a to 16a included in the units 13 to 16 specified by is set as the failure detection value. Thereby, a pseudo failure is generated in the units 13 to 16.

  The error processing unit 12 is configured by a programmable logic device (in this example, a field programmable gate array (FPGA)) that is an integrated circuit capable of changing a logic circuit.

  The error processing unit 12 includes a register (notification storage unit) 12a for storing information. The error processing unit 12 receives the failure occurrence notification output from each of the units 13-16. The error processing unit 12 stores the received failure occurrence notification and the notification reception time point information indicating the time point when the failure occurrence notification is received in association with each other in the register 12a.

  The error processing unit 12 identifies a unit in which a failure has actually occurred based on the failure occurrence notification and notification reception time point information stored in the register 12a. Then, the error processing unit 12 performs a failure handling process set in advance according to the identified unit. When the execution of the failure handling processing is completed, the error processing unit 12 transmits a failure processing completion notification indicating that to the control unit 11.

  When receiving the failure processing completion notification from the error processing unit 12, the control unit 11 reads out the failure occurrence notification and the notification reception time information stored in the register 12a, reads the failure occurrence notification and the notification reception time information, and the failure The expected value set in advance according to the occurrence information is collated. And the control part 11 outputs the information showing the collation result.

(Operation)
Next, the operation of the simulated fault occurrence system 1 configured as described above will be specifically described.

  Now, the description will be continued assuming that two pieces of failure occurrence information including the first failure occurrence information and the second failure occurrence information are stored in the storage device of the control unit 11. The first failure occurrence information includes unit specifying information for specifying the L2SW 14 and timing information indicating 0 milliseconds as the elapsed time. The second failure occurrence information includes unit specifying information for specifying the first interface unit 15 and timing information representing 50 milliseconds as an elapsed time.

  In this case, in response to a user instruction, the control unit 11 reads the failure occurrence information stored in the storage device, thereby accepting the read failure occurrence information.

  Next, the control unit 11 causes the timer 11a to measure the time that has elapsed since the failure occurrence information was received. Then, the control unit 11 waits until the time measured by the timer 11a reaches the elapsed time represented by the timing information included in the received failure occurrence information.

  According to the above assumption, when the failure occurrence information is received, the time measured by the timer 11a has reached the elapsed time (0 milliseconds) represented by the timing information included in the first failure occurrence information. . Therefore, the control unit 11 sets the failure detection value stored in the register 14a included in the unit (L2SW unit 14) specified by the unit specification information included in the first failure occurrence information as the failure detection value ( Simulated failure generation process). This causes a pseudo failure in the L2SW unit 14.

  As a result, the L2SW unit 14 outputs a failure occurrence notification indicating that a failure has occurred in the L2SW unit 14. Thereby, the error processing unit 12 receives the failure occurrence notification output from the L2SW unit 14. The error processing unit 12 stores the received failure occurrence notification and the notification reception time point information indicating the time point when the failure occurrence notification is received in association with each other in the register 12a.

  Further, when 50 milliseconds have passed, the time measured by the timer 11a reaches the elapsed time (50 milliseconds) represented by the timing information included in the second failure occurrence information. Therefore, the control unit 11 uses the failure detection availability value stored in the register 15a included in the unit (first interface unit 15) specified by the unit specification information included in the second failure occurrence information as the failure detection value. Set (pseudo failure generation process). As a result, a pseudo failure is generated in the first interface unit 15.

  As a result, the first interface unit 15 outputs a failure occurrence notification indicating that a failure has occurred in the first interface unit 15. As a result, the error processing unit 12 receives the failure occurrence notification output from the first interface unit 15. The error processing unit 12 stores the received failure occurrence notification and the notification reception time point information indicating the time point when the failure occurrence notification is received in association with each other in the register 12a.

  Thereafter, the error processing unit 12 identifies a unit in which a failure has actually occurred based on the failure occurrence notification and notification reception time point information stored in the register 12a. Here, the error processing unit 12 identifies the L2SW unit 14 as a unit in which a failure has occurred. Then, the error processing unit 12 performs a failure handling process set in advance according to the identified unit 14. When the execution of the failure handling processing is completed, the error processing unit 12 transmits a failure processing completion notification indicating that to the control unit 11.

  Then, when receiving the failure processing completion notification from the error processing unit 12, the control unit 11 reads the failure occurrence notification and notification reception time information stored in the register 12a, and reads the read failure occurrence notification and notification reception time information; The expected value set in advance according to the failure occurrence information is collated. And the control part 11 outputs the information showing the collation result.

  As described above, according to the embodiment of the simulated fault occurrence system according to the present invention, the control unit 11 as the simulated fault generation apparatus can set the timing for generating a simulated fault for each unit. As a result, it is possible to reproduce a situation in which the electronic device detects that a failure has occurred in a plurality of units at an arbitrary timing.

Moreover, in the said embodiment, the control part 11 sets pseudo | simulation to the said units 13-16 by setting the failure detection availability value memorize | stored in the registers 13a-16a with which the units 13-16 are provided to a failure detection value. Is configured to cause a failure.
According to this, it is possible to easily realize a pseudo failure in the units 13 to 16.

  Furthermore, in the above-described embodiment, the error processing unit 12 receives the failure occurrence notification output by the units 13 to 16, and the received failure occurrence notification and notification reception time point information indicating the time when the failure occurrence notification is received. Are stored in association with each other.

  According to this, the electronic device can identify the unit in which the failure actually occurred based on the stored failure occurrence notification and notification reception time point information. Thereby, the electronic device can perform an appropriate process according to the failure.

  In addition, this invention is not limited to the said embodiment, A various modification can be employ | adopted within the scope of the present invention. For example, in the above-described embodiment, the number of units provided in the electronic device is four, but may be two or three, or may be five or more.

  Further, as shown in FIG. 2, the simulated fault generator 110 according to the modification of the above embodiment is applied to an electronic device 100 including a plurality of units 101, 102,.

The pseudo failure generating apparatus 110 receives failure occurrence information including unit specifying information for specifying the units 101, 102,... And timing information indicating the timing at which a failure is generated.
The pseudo failure generating device 110 causes a pseudo failure to occur in the unit specified by the unit specifying information included in the failure occurrence information at the timing indicated by the timing information included in the received failure occurrence information.

  Also according to this modification, it is possible to reproduce the situation in which the electronic apparatus 100 detects that a failure has occurred in the plurality of units 101, 102,...

  In the above embodiment, each function of the pseudo-failure generating device is realized by the CPU executing a program (software), but may be realized by hardware such as a circuit.

  In addition, as another modified example of the above-described embodiment, any combination of the above-described embodiments and modified examples may be employed.

  The present invention can be applied to a pseudo-failure generating apparatus that causes a pseudo failure in an electronic apparatus including a plurality of units, a test apparatus for testing an electronic apparatus including a plurality of units, and the like.

1 Pseudo fault occurrence system 11 Control unit 11a Timer 12 Error processing unit 12a Register 13 LAN controller unit 14 L2SW
DESCRIPTION OF SYMBOLS 15 1st interface part 16 2nd interface part 13a-16a Register 100 Electronic device 101,102, ... Unit 110 Pseudo fault generating apparatus

Claims (10)

Applied to electronic devices with multiple units,
A plurality of pieces of failure occurrence information each including unit specifying information for specifying the unit and timing information indicating a timing at which a failure is generated are received, and each timing information included in each received failure occurrence information represents at timing, e Bei pseudo fault generating means for generating a pseudo-fault unit specified by the unit specific information contained in the failure information,
The timing information is information representing elapsed time,
The pseudo-failure generating means is
A time measurement unit that measures a time elapsed from the time when each failure occurrence information is received, and a time represented by each timing information included in each received failure occurrence information, the time measured by the time measurement unit When each time has been reached, a pseudo failure is generated in the unit specified by the unit specifying information included in the failure occurrence information that has reached the elapsed time represented by the timing information.
Pseudo fault generator. The pseudo-failure generator according to claim 1,
The pseudo fault generation means sets a value stored in a register included in the unit to a predetermined fault detection value indicating that a fault has occurred, thereby causing the unit to generate a pseudo fault A pseudo-failure generator configured as described above. The pseudo-failure generator according to claim 2 ,
The unit is configured to output a failure occurrence notification indicating that a failure has occurred in the unit when the value stored in the register included in the unit is the failure detection value. Fault generator. The pseudo-fault generating device according to claim 3 ,
The electronic device receives the output failure occurrence notification, and stores a notification storage means for storing the received failure occurrence notification and notification reception time point information indicating a time point when the failure occurrence notification is received in association with each other. A pseudo-failure generating device provided. Including an electronic device including a plurality of units, and a pseudo-failure generator applied to the electronic device,
The pseudo-failure generator is
A plurality of pieces of failure occurrence information each including unit specifying information for specifying the unit and timing information indicating a timing at which a failure is generated are received, and each timing information included in each received failure occurrence information represents at timing, e Bei pseudo fault generating means for generating a pseudo-fault unit specified by the unit specific information contained in the failure information,
The timing information is information representing elapsed time,
The pseudo-failure generating means is
A time measurement unit that measures a time elapsed from the time when each failure occurrence information is received, and a time represented by each timing information included in each received failure occurrence information, the time measured by the time measurement unit When each time has been reached, a pseudo failure is generated in the unit specified by the unit specifying information included in the failure occurrence information that has reached the elapsed time represented by the timing information.
Pseudo failure system. The pseudo-failure occurrence system according to claim 5 ,
The pseudo fault generation means sets a value stored in a register included in the unit to a predetermined fault detection value indicating that a fault has occurred, thereby causing the unit to generate a pseudo fault A pseudo-failure system configured as follows. Control unit provided in the electronic apparatus having a plurality of units, pre SL and the unit specific information for identifying the unit, and timing information indicating a timing for generating a fault, with the accept multiple failure information including respectively , at a timing the timing information included in the respective fault information received represents a pseudo manner to fault in the unit specified by the unit specific information contained in the fault information, including a pseudo fault occurrence process See
The timing information is information representing elapsed time,
In the pseudo-failure occurrence step, the control unit measures time elapsed from the time when each piece of failure occurrence information is received, and each piece of timing information included in each piece of received failure occurrence information. When each of the elapsed times represented by is reached, the unit identified by the unit identification information included in the failure occurrence information that has reached the elapsed time represented by the timing information is caused to cause a pseudo failure.
A pseudo-failure generation method. The pseudo-failure generation method according to claim 7 ,
In the pseudo fault occurrence step, the control unit sets a value stored in a register included in the unit to a predetermined fault detection value indicating that a fault has occurred, thereby causing the unit to pseudo A pseudo-fault generation method configured to cause a fault. In a pseudo-failure generator applied to an electronic device including a plurality of units,
A plurality of pieces of failure occurrence information each including unit specifying information for specifying the unit and timing information indicating a timing at which a failure is generated are received, and each timing information included in each received failure occurrence information represents It is a program for realizing a pseudo failure generating means for generating a pseudo failure in a unit specified by unit specifying information included in the failure occurrence information at a timing ,
The timing information is information representing elapsed time,
The pseudo-failure generating means is
A time measurement unit that measures a time elapsed from the time when each failure occurrence information is received, and a time represented by each timing information included in each received failure occurrence information, the time measured by the time measurement unit A program configured to cause a pseudo failure to occur in a unit specified by unit specifying information included in failure occurrence information that has reached an elapsed time represented by the timing information when each time is reached . The program according to claim 9 , wherein
The pseudo fault generation means sets a value stored in a register included in the unit to a predetermined fault detection value indicating that a fault has occurred, thereby causing the unit to generate a pseudo fault Program configured as follows.

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