JP5638020B2 - Test management device for distributed control system - Google Patents

Description

  The present invention relates to a test management device for a distributed control system that manages test execution of a plurality of control target devices in a distributed control system that controls a plurality of control target devices with a plurality of control devices, and in particular, to improve the efficiency of the test. The present invention relates to such a test management apparatus.

  In a test of a general control system, there are many cases in which a test is performed without using an actual device to be controlled (called an actual machine). This is because, for example, the test before the actual machine is manufactured, the cost of preparing the actual machine is insufficient, or the space for installation is insufficient. Therefore, a test is generally performed by introducing a simulation device (hereinafter referred to as an input / output simulation device) that performs the same input / output operation instead of the actual device to be controlled. A general-purpose microcomputer or personal computer (hereinafter referred to as a PC) is used as the input / output simulation device, and software (hereinafter referred to as input / output simulation software) for simulating the input / output of the device is operated on the device. Often realized.

In a distributed control system, a larger number of control target devices are controlled, so that a large number of input / output simulation devices are required.
In order to monitor the input / output contents of these multiple input / output simulation devices and control the timing and input / output values of the input / output operations according to the contents to be tested, another test control device (PC) is prepared. Then, it is connected to the input / output simulation device via a network and controlled.
For example, in Patent Document 1, a simulation device for testing for simulating the operating environment of the input / output device is connected so that the unsteady operation of the control system can be evaluated.

JP 2008-77560 A

  In the test execution environment as shown in Patent Document 1, it is assumed that all the input / output simulation devices are operating normally. However, in a large-scale distributed control system, the number of input / output simulation devices (that is, PCs) increases, and the problem of introduction cost and the problem of installation space occur like the actual machine. Therefore, in order to reduce the number of PCs, a method is employed in which a test is performed by operating a plurality of input / output simulation software on the PC.

  In this case, input / output simulation software to be operated is assigned to each PC in accordance with the content of the test (also called a test scenario), and the test control device (PC) controls this. In this case, instead of simulating all the control devices, a technique may be employed in which a test scenario is created so as to simulate only some control devices related to the test.

  However, there is a possibility that the PC cannot be used due to a failure during the execution of the test, or the operation performance is lowered due to the failure. This is because in a distributed control system having a large number of devices, the number of input / output simulation devices (PCs) increases, and the probability of a PC failure necessarily increases. In such a case, the input / output value of the input / output device simulated during the test may be different from the scenario (worst case, no input / output operation is performed). It is regarded as infeasible or infeasible, and it is necessary to perform a retest by repairing or replacing the PC or manually changing the test scenario. As a result, human labor is involved in the execution of the test, which causes a problem that the efficiency of the test decreases.

  The present invention has been made to solve the above-described problems, and an object of the present invention is to provide a test management apparatus for a distributed control system that can improve the efficiency of tests in the distributed control system.

A test management device for a distributed control system according to the present invention is a test management device for a distributed control system that manages test execution of a plurality of control target devices in a distributed control system in which a plurality of control target devices are controlled by a plurality of control devices. A plurality of input / output simulation devices and a test execution management device for simulating a plurality of control target devices, wherein the input / output simulation device includes input / output simulation means for performing simulation processing of the control target devices, and input / output simulation. A processing capability measuring means for measuring the processing capability of the apparatus itself, and the input / output simulation means can be activated by any input / output simulation device among a plurality of input / output simulation devices. Test item storage means having an input / output value in an input / output simulation means that is a test procedure indicating a control procedure in the input / output simulation means and a test result pass / fail judgment for each test item An input / output simulation device control means for causing the input / output simulation means to execute a test according to a test procedure; an input / output result obtained by executing the test of the input / output simulation means; Test result judging means for judging whether or not they match, and which input / output simulation device of the input / output simulation device is started by the input / output simulation device when executing the test, Device configuration storage means for storing a first configuration table indicating a correspondence relationship with the input / output simulation device and a second configuration table indicating which control device the input / output simulation device is connected to via the network; The result of measuring the processing capability of the input / output simulation device associated with the input / output simulation unit that has executed the test is the result of the input / output simulation by the determination result of the test result determination unit being inconsistent. Equipment treatment If the capacity upper limit value is close to a certain value or more, the second configuration table is used to redefine the first configuration table so that the association is changed to another input / output simulation device existing in the same network. Device configuration redefining means, and the device configuration storage means has a third configuration table indicating the priority of the input / output simulation device when redefinition is performed, and the device configuration redefinition means includes the first configuration When redefining the table, the input / output simulation device is changed to a higher priority based on the third configuration table .

  The test management device of the distributed control system according to the present invention has the processing capability of the input / output simulation device associated with the input / output simulation device that is inconsistent with the determination result of the test result determination device and that has executed the test. If the value is close to a certain value above the upper limit of the capacity, the first configuration table is redefined, so the number of retests can be reduced and the test efficiency can be improved. .

It is a block diagram which shows the distributed system which the test management apparatus of the distributed control system by Embodiment 1 of this invention makes object. 1 is a configuration diagram of a distributed system including a test management apparatus for a distributed control system according to Embodiment 1 of the present invention. FIG. It is a block diagram which shows the test management apparatus of the distributed control system by Embodiment 1 of this invention. It is explanatory drawing which shows an example of the test procedure which the test item storage means of the test management apparatus of the distributed control system by Embodiment 1 of this invention hold | maintains. It is explanatory drawing which shows an example of the apparatus structure (1st structure table) which the apparatus structure storage means of the test management apparatus of the distributed control system by Embodiment 1 of this invention hold | maintains. It is explanatory drawing which shows an example of the apparatus structure (2nd structure table) which the apparatus structure storage means of the test management apparatus of the distributed control system by Embodiment 1 of this invention hold | maintains. It is explanatory drawing which shows an example of the test result which the test result storage means of the test management apparatus of the distributed control system by Embodiment 1 of this invention hold | maintains. It is a flowchart which shows the operation | movement procedure of the test management apparatus of the distributed control system by Embodiment 1 of this invention. It is a flowchart which shows the operation | movement procedure of redefinition of the test management apparatus of the distributed control system by Embodiment 1 of this invention. It is explanatory drawing which shows an example of the priority (3rd structure table) of the apparatus which the apparatus structure storage means of the test management apparatus of the distributed control system by Embodiment 2 of this invention hold | maintains.

Embodiment 1 FIG.
FIG. 1 is a block diagram illustrating a configuration of a distributed control system to which a test management apparatus for a distributed control system according to the present invention is applied. In FIG. 1, a distributed control system 1 to be tested includes a plurality of control devices 20 a to 20 b connected by a control network 10, and communicate with each other through the control network 10 to perform a cooperative operation. The plurality of control devices 20a to 20b have input / output means 21a to 21b, respectively, and control the control target devices 40a to 40d via the control networks 30a to 30b, respectively. Note that the number of the control devices 20a to 20b and the number of the control target devices 40a to 40d are appropriately determined according to operation conditions, environments, and the like.

  FIG. 2 is a block diagram showing a configuration when the test management apparatus of the present invention is used in the distributed control system shown in FIG. In FIG. 2, the configuration of the test system in the distributed control system 1 is connected to input / output simulation devices 50 a to 50 d instead of the control target devices 40 a to 40 d as compared to FIG. 1. A test execution management device 70 is connected to the input / output simulation devices 50 a to 50 d via the test execution management network 60. The input / output simulation devices 50a to 50d simulate the input / output of the control target devices 40a to 40d, and behave as if the control target devices 40a to 40d are connected to the distributed control system 1. Further, the input / output simulation devices 50 a to 50 d are controlled in behavior from the test execution management device 70 via the test execution management network 60.

  FIG. 3 is a block diagram showing the configuration of the input / output simulation device 50 and the test execution management device 70 for realizing the test management device of the distributed control system according to the present invention. In FIG. 3, an input / output simulation device 50 is representative of the configuration of the input / output simulation devices 50a to 50d of FIG. 2, and includes an input / output simulation means 51, an activation means 52, and a processing capacity measurement means 53. Yes.

  The input / output simulation means 51 is a means for simulating the input / output behavior of the input / output simulation devices 50a to 50d of FIG. 2 according to the test items in accordance with instructions from the test execution management device 70 via the test execution management network 60. That is, it is means for simulating the input / output of any of the control target devices 40a to 40d in FIG. 1, and is realized by emulator software on a general-purpose computer such as a PC and hardware such as a CPU or memory that executes the emulator software. Further, a plurality of input / output simulation means 51 exist in the input / output simulation device 50, and can be configured to simulate the input / output of the plurality of control target devices 40a to 40d.

  The starting means 52 is means for starting and ending the input / output simulation means 51 in the apparatus in accordance with an instruction from the test execution management apparatus 70 via the test execution management network 60. The processing capacity measuring unit 53 is a unit that measures the usage rate of the CPU in the apparatus and acquires the execution time of each process in the real-time operating system, and is mainly based on a part of the functions of the operating system. Realized. That is, the processing capacity measuring means 53 is a means for measuring the processing capacity of the input / output simulation device 50 itself.

  The test execution management device 70 includes an input / output simulation device control unit 71, a processing capability measurement result acquisition unit 72, a test item storage unit 73, a device configuration storage unit 74, a test result determination unit 75, a test result storage unit 76, and a device configuration reconfiguration unit. Definition means 77 is provided. The test execution management apparatus 70 is configured using a computer, and each unit is realized by software corresponding to each function and hardware such as a CPU and a memory for executing the software, and a test item storage unit 73. The apparatus configuration storage means 74 and the test result storage means 76 are realized as one area on the storage device.

  The input / output simulation device control means 71 acquires the test items stored in the test item storage means 73 and the device configuration stored in the device configuration storage means 74, and passes through the test execution management network 60 according to the description. The input / output simulation means 51 is activated or terminated by transmitting an instruction to the activation means 52 of the plurality of input / output simulation devices 50, and the control information is transmitted to the activated input / output simulation means 51 to change the input / output behavior. It is a means to control. The processing capability measurement result acquisition unit 72 is a unit that acquires the processing capability measurement result measured by the processing capability measurement unit 53 of the plurality of input / output simulation devices 50 via the test execution management network 60.

  The test item storage means 73 is means for storing each test item according to a prescribed format. The device configuration storage means 74 includes a plurality of input / output simulation devices 50, which input / output simulation means 51 is activated by which input / output simulation device 50, and which input / output simulation devices 50 a have which control networks 30 a to 30. It is means for storing data such as whether it is connected to 30b in accordance with a prescribed format. The test result judging means 75 describes the input / output data of the plurality of input / output simulation devices 50 obtained by the input / output simulation device control means 71 for each test item, and the corresponding test items stored in the test item storage means 73. This is a means for comparing the expected value and determining the test result (match / mismatch).

  The test result storage means 76 combines the results of each test determined by the test result determination means 75 and the processing capability measurement results from the processing capability measurement means 53 acquired by the processing capability measurement result acquisition means 72 according to a prescribed format. Means for storing. The device configuration redefinition means 77 is a test acquired from the test result storage means 76 that indicates which control target device is simulated, which is acquired by the input / output simulation device control means 71 from the device configuration storage means 74. A means to redefine using results.

Next, in the test management apparatus of the distributed control system according to the first embodiment, operations when executing test items will be described with reference to FIGS.
FIG. 4 shows an example of a test item format, which is data stored in the test item storage means 73. The test item is composed of “test item identification number”, “input / output simulation device control procedure”, and “expected result”. The “input / output simulation device control procedure” includes “time”, “target input / output simulation means”, “data type”, and “value”. Here, “time” refers to the elapsed time from the start of the test. “Data type” is an identifier indicating which one or a plurality of data should be held in each input / output simulation means 51, and “value” should be substituted for that data. Points to the value. It is also possible to describe a periodic change in value by indicating a period at “time” and an increase / decrease value at “value”. The “expected result” also includes “time”, “target input / output simulation means”, “data type”, and “value”. A description in which “time” has a time width and a description in which “value” has a numerical width are also possible.

In FIG. 4, as an input / output simulation device control procedure in test item 1, input / output simulation means Ea substitutes (outputs) value Va for data type Da between times T1 and T2, and input / output simulation means after time T3. Eb assigns the value Vb to the data type Db, and indicates that the input / output simulation means Ec assigns the value Vc to the data type Dc from the test start time to time T4. As an expected result, the time point at time T5 is shown. This indicates that the value Ve is assigned (input) to the data type De of the input / output simulation means Ee.
In the example of test item 1, there are a plurality of input / output simulation device control procedures and one expected result, but any number of input / output simulation device control procedures can be used, and any number of expected results can be used. .

  FIG. 5 is a format showing the correspondence between the input / output simulation means 51 and the input / output simulation device 50 and is stored in the device configuration storage means 74. This format will be referred to as a device means correspondence table (first configuration table). In FIG. 5, the input / output simulation means Ea and Eb operate on the input / output simulation device Pa, the input / output simulation means Ec, Ed and Ee operate on the input / output simulation device Pb, and the input / output simulation means Ef inputs / outputs. It shows operating on the simulation device Pc.

  FIG. 6 is a format showing the network to which the input / output simulation devices 50a to 50d are connected, that is, the control network 30a, 30b,... Shown in FIG. Stored in the means 74. This format will be referred to as a device connection network table (second configuration table). In FIG. 6, the input / output simulation devices Pa and Pb are connected to the control network 30a, and the input / output simulation device Pc is connected to the control network 30b.

  FIG. 7 shows an example of a test result format, which is stored in the test result storage means 76. In FIG. 7, the test result (comparison with the expected result) of each test item and the CPU usage rate of each input / output simulation device in each time interval are described. Here, the time interval is the “time” of the “input / output simulation device control procedure” in the test item in the test, and the time of “expected result” in time series order, that is, the time is rearranged in ascending order, Refers to the time between them. In each time interval, the CPU usage rate acquired by the processing capability measurement result acquisition unit 72 from the processing capability measurement unit 53 of each input / output simulation device 50 is stored. When the CPU usage rate fluctuates in a certain time interval, the average value in the time interval is stored.

  In FIG. 7, in the test item 1, the test result is “match”, and the “time” of the “input / output simulation device control procedure” shown in the test item 1 of FIG. The indicated values T1, T2, T3, T4, T5,... Are rearranged in chronological order to be T6, T7, T8,..., Each time interval, that is, T6 to T7, T7 to The CPU usage rate of the input / output simulation devices Pa, Pb... At T8... Is described as 50%, 60%. This CPU usage rate is 0% for the input / output simulation devices 50a to 50d that were not used in the test (in all time intervals), although it was supposed to be used in the “input / output simulation device control procedure”. The input / output simulation devices 50a to 50d that could not be used due to reasons such as failure or failure were described as 101% (all time intervals), that is, a value exceeding the processing capacity upper limit. .

FIG. 8 is a flowchart showing a test procedure executed by the input / output simulation device 50 and the test execution management device 70 according to the first embodiment. An example of the procedure when executing the test items will be described with reference to this drawing.
When test execution is instructed by the user, the redistribution destination table is initialized in step ST1. The redistribution destination table is a table used in step ST12 of FIG. 9 described later. This will be described in detail in step ST12. Next, in step ST <b> 2, the input / output simulation device control unit 71 takes out the test item instructed from the test item storage unit 73.

  Next, in step ST3, the input / output simulation device control means 71 inputs (one or more) input devices to the activation means 52 of the (one or more) input / output simulation devices 50 used for the test item. An instruction to activate the output simulation means 51 is transmitted. Here, the correspondence relationship between the input / output simulation device 50 and the input / output simulation means 51 is as shown in the device means correspondence table (see FIG. 5). The input / output simulation device 50 that has received the instruction returns a response. For the activation means 52 that has not received a response, the CPU of the test item is used for the input / output simulation device 50 that has the activation means 52. The rate is set to 101% (all time intervals) and stored in the test result storage means 76. For the activation means 52 of the input / output simulation device 50 that is not used for the test item, the CPU usage rate of the test item is set to 0% (all time intervals), and the test result storage means 76 is used. To store.

  Next, in step ST4, the input / output simulation device control means 71 instructs each input / output simulation means 51 of each input / output simulation device 50 to simulate input / output using the input / output simulation device control procedure (see FIG. 4). To do. Next, in step ST5, the test result determination means 75 acquires data necessary for the test determination from the input / output simulation device control means 71, compares it with the “expected result” of the test item from the test item storage means 73, The result (match / mismatch) is determined and stored in the test result storage means 76 as the “test result” of the test item.

  Next, in step ST6, the processing capability measurement result acquisition unit 72 acquires the processing capability measurement result measured by the processing capability measurement unit 53 of each input / output simulation device 50 during the test execution, and the test item in the test result storage unit 76. In contrast, the CPU usage rate of each time interval is stored. Next, in step ST7, the input / output simulation device control means 71 refers to the test result stored in the test result storage means 76, and if “match”, proceeds to step ST8. If it does not match, the process proceeds to step ST7a.

  In step ST7a, the input / output simulation device control means 71 refers to the test result stored in the test result storage means 76, and the CPU usage rate in each time interval of each input / output simulation device 50 is equal to or greater than a predetermined value. It is evaluated whether or not. Here, the specified value is a value (such as “95%”) that can be determined that the CPU usage rate is very high (less than 100% and relatively close to 100%). It is assumed that the value is defined individually for 50 (this definition may be tabulated and stored in the device configuration storage means 74). If there is no time interval that is equal to or greater than the specified value, the process proceeds to step ST8. If even one exists, the process proceeds to step ST7b.

  In step ST7b, the input / output simulation device control unit 71 instructs the device configuration redefinition unit 77 to redefine the correspondence between the device configurations. FIG. 9 is a flowchart showing the redefinition procedure. Hereinafter, the redefinition procedure will be described with reference to FIG.

  In step ST11, all the input / output simulation devices 50 in which at least one CPU usage rate is equal to or greater than a predetermined value in each time interval are listed. Next, in step ST12, the redistribution destination table flag is set for the input / output simulation device 50 listed in step ST11. Here, the redistribution destination table is a flag prepared for each of the input / output simulation devices 50, and all the flags are cleared in step ST1 of the flowchart of FIG. The flag setting in step ST11 is to set a flag corresponding to the listed input / output simulation device 50. In this step, the already set flag is not cleared.

  From step ST13, the processes after step ST14 are repeated for each input / output simulation device 50 listed in step ST11. The end of the repetition is step ST18. In this repetition step, the target input / output simulation device 50 is referred to as an input / output simulation device Px.

  In step ST14, a time interval in which the CPU usage rate of the input / output simulation device Px in the test result is equal to or greater than a specified value is acquired. When there are a plurality of such time intervals, the interval with the highest CPU usage rate is selected. If there are a plurality of time intervals having the highest CPU usage rate, the first time interval is selected. This time interval is called Tx. In step ST14, all of the input / output simulation devices 50 belong to the same control network as the input / output simulation device Px (this can be obtained from the device connection network table shown in FIG. 6) and are redistributed. A search is made for an input / output simulation device 50 in which the flag is not set in the previous table and the CPU usage rate at the time interval Tx is minimum. Such an input / output simulation device 50 is referred to as an input / output simulation device Py. In the next step ST15, if the input / output simulation device Py exists, the process proceeds to step ST16. If not, the process proceeds to step ST15a.

  In step ST15a, the redefinition is set to “impossible” (in the flowchart of FIG. 9), and the process ends (that is, the process proceeds to step ST7c in the flowchart of FIG. 8). In step ST16, the CPU usage rate of the input / output simulation device Px at Tx is referred to as the time interval, and if it is 101%, the process proceeds to step ST17a. If it is 100% or less, the process proceeds to step ST17b.

  In step ST17a, all the input / output simulation devices described as the input / output simulation device Px in the device means correspondence table (see FIG. 5) are rewritten to the input / output simulation device Py. An example using the table of FIG. 5 means that if the input / output simulation device Px = Pa and the input / output simulation device Py = Pb, all Pa in the table is rewritten with Pb. Here, the device unit correspondence table to be rewritten is not stored in the device configuration storage unit 74, but is acquired by the input / output simulation device control unit 71 from the device configuration storage unit 74 and held for reference. It is a means correspondence table.

  In step ST17b, one of the terms described as the input / output simulation device Px in the device means correspondence table (see FIG. 5) is selected and rewritten to the input / output simulation device Py. The corresponding input / output simulation means 51 is selected from those used for the test item. The selection method is arbitrary, but here it is assumed that it is described at the top of the table. If an example is shown using the table of FIG. 5, if the input / output simulation device Px = Pa and the input / output simulation device Py = Pb, the input / output simulation means corresponding to the input / output simulation device Pa are Ea and Eb. However, if the input / output simulation means Ea is used in the test item, Pa written next to it is rewritten to Pb. Also, if the input / output simulation means Ea is not used in the test item and the input / output simulation means Eb is used, the Pa described next to it is rewritten to Pb. Here, the device means correspondence table to be rewritten is the device means correspondence table acquired by the input / output simulation device control means 71 from the device configuration storage means 74 and held for reference, as in step ST17a.

  Step ST18 is the end of the iterative process from step ST13. If the iteration for the listed input / output simulation device 50 has not been completed, the process returns to step ST13, and if the repetition has been completed, the process proceeds to step ST19. In step ST19, the redefinition is set to “completed” (in this flowchart), and the process ends (that is, the process proceeds to step ST7c in the flowchart in FIG. 8).

  Returning to the flowchart of FIG. 8, step ST7c receives the result of step ST7b (that is, whether redefinition is completed or not), and if redefinition is completed, it returns to step ST3. If redefinition is impossible, it will progress to step ST8. Here, when returning to step ST3, based on the device means correspondence table rewritten in step ST7b (in step ST17a or step ST17b therein), the input / output simulation device control means 71 uses the starting means 52, The input / output simulation means 51 is activated or terminated as appropriate. That is, the input / output simulation means 51 that is newly used by rewriting the device means correspondence table is activated, and the input / output simulation means 51 that is no longer used is terminated. Then re-execute the test items. In step ST8, the input / output simulation device control means 71 uses the activation means 52 to end all the activated input / output simulation means 51 and finishes the process.

  As described above, when the number of PCs that operate the input / output simulation software is insufficient during the execution of the distributed control system test, the input / output simulation software that operates for other PCs existing at that time is Since the test is re-executed by appropriately allocating it while considering the CPU usage rate, the efficiency of the test can be improved.

  As described above, according to the test management device of the distributed control system of the first embodiment, the test execution of the plurality of control target devices in the distributed control system in which the plurality of control target devices are controlled by the plurality of control devices is managed. A test management device for a distributed control system, comprising a plurality of input / output simulation devices and a test execution management device for simulating a plurality of control target devices, and the input / output simulation device performs simulation processing of the control target devices Input / output simulation means and processing capability measurement means for measuring the processing capability of the input / output simulation device itself are provided, and the input / output simulation means is activated by any one of the input / output simulation devices. The test execution management device enables the test procedure indicating the control procedure in the input / output simulation means and the input / output in the input / output simulation means as a criterion for pass / fail judgment of the test results for each test item of the test. Test item storage means, input / output simulation device control means for causing the input / output simulation means to execute a test according to the test procedure, input / output results obtained by the test execution of the input / output simulation means, and criteria for pass / fail judgment A test result judging means for comparing a predetermined input / output value to determine whether or not they match, and when executing the test, the input / output simulation means is activated by any of the input / output simulation devices. A first configuration table indicating the correspondence between the input / output simulation means and the input / output simulation device, and a second configuration table indicating which control device the input / output simulation device is connected to via the network. The processing capability measuring unit measures the processing capability of the input / output simulation device associated with the input / output simulation unit that has executed the test when the determination result of the device configuration storage unit and the test result determination unit do not match. did If the result is close to a certain value or more to the upper limit of the processing capability of the input / output simulation device, the correspondence is changed to another input / output simulation device existing in the same network using the second configuration table. Since the apparatus configuration redefinition means for redefining the first configuration table is provided, the number of retests can be reduced, and the test efficiency can be improved.

Embodiment 2. FIG.
The second embodiment is an example in which, when the device configuration redefining means 77 performs redefinition, the association is performed according to the priority given to the input / output simulation device 50 given in advance. Since the structure on the drawing is the same as that of FIG. 3 shown in the first embodiment, it will be described with reference to FIG.

  The device configuration storage means 74 of the second embodiment stores a third configuration table indicating the priority of each input / output simulation device 50. FIG. 10 shows this table, and shows the priority for each input / output simulation device 50. In FIG. 10, the priority of the input / output simulation device Pa is set to 1, the priority of the input / output simulation device Pb is set to 2, and the priority of the input / output simulation device Pc is set to 3. Here, the priority indicates that a smaller number is higher. Any method may be used for determining the priority of each input / output simulation device 50. Here, it is assumed that the priority is determined in descending order of the CPU usage rate of each input / output simulation device 50. This is because, by moving the input / output simulation means 51 to the other input / output simulation device 50 in descending order of the CPU usage rate, the CPU usage rates of each input / output simulation device 50 can be easily averaged.

  Further, the device configuration redefinition unit 77 of the second embodiment changes the input / output simulation device 50 to a higher priority based on the third configuration table when redefining the first configuration table. It is configured. That is, in step ST17b of FIG. 9 in the first embodiment, the device configuration redefining means 77 is replaced with one of the items described as the input / output simulation device Px in the device means correspondence table (see FIG. 5). Refer to this priority when selecting. The corresponding input / output simulation device 50 is used for the test item, and the term of the input / output simulation device 50 having the highest priority is selected, and the input / output simulation device 50 is rewritten to Py. .

  As a result, the selection order of the input / output simulation device 50 at the time of redefinition is made in the order of low CPU usage rate, so that it becomes easy to average the CPU usage rate in each input / output simulation device 50 and the retest is less repeated. It is possible to improve the efficiency of the test.

  As described above, according to the test management apparatus of the distributed control system of the second embodiment, the apparatus configuration storage means has the third configuration table indicating the priority of the input / output simulation apparatus when performing redefinition. Then, when redefining the first configuration table, the device configuration redefinition means changes to a high-priority input / output simulation device based on the third configuration table. Can be reduced.

Embodiment 3 FIG.
In the first embodiment or the second embodiment, the input / output simulation device control unit 71 instructs the device configuration redefinition unit 77 to redefine the device unit correspondence table (first configuration table), and the redefinition is completed. When the test item is re-executed and the test result is “match” or the test result is “mismatch” and the CPU usage rate of all the input / output simulation devices 50 is less than the specified value (that is, In FIG. 8, after step ST7c is passed once or a plurality of times, the process proceeds from step ST7 to step ST8, or from step ST7 to step ST8 via step ST7a). The table is configured to be stored in the apparatus configuration storage means 74 in association with the test item. Further, the device device correspondence table linked is configured so that the device configuration redefining unit 77 can acquire the table.

  When the test item is executed at another opportunity and the process reaches step ST7c, the device configuration redefinition unit 77 is associated with the test item from the device configuration storage unit 74 (redefined). And using this, the device configuration correspondence table held by the device configuration redefinition unit 77 is rewritten.

  In particular, referring to the CPU usage rate in both test results, this is the case when the input / output simulation device 50 with the CPU usage rate of 0% is the same and the input / output simulation device 50 with the specified value or more is also the same. When rewriting is performed, there is a high possibility that a test will be performed under an appropriate device configuration and an appropriate CPU load, and therefore, the effect of reducing the number of retests is generated, and the efficiency of the test is improved. Can do.

  As described above, according to the test management apparatus of the distributed control system of the third embodiment, the input / output simulation apparatus control means associates the first configuration table redefined by the apparatus configuration redefinition means with the test item. The device configuration redefinition unit stores the first configuration table redefined from the device configuration storage unit when the test item is executed and a new redefinition of the first configuration table is performed. Since it was acquired and used for new redefinition, it is possible to reduce the repetition of retesting.

Embodiment 4 FIG.
In the third embodiment, when the test item is executed and the process reaches step ST7c, the device configuration redefining unit 77 is linked (redefined) with another test item from the device configuration storage unit 74. A correspondence table is acquired and used to rewrite the device means correspondence table held by the device configuration redefinition means 77.

  In particular, referring to the CPU usage rate in both test results, the input / output simulation device with the CPU usage rate of 0% is the same, and the input / output simulation device 50 with the specified value or more is also the same and is used. If the rewriting is performed when the output simulation means 51 is the same, even if the device configuration is rewritten according to the result of a different test, the test is performed with an appropriate device configuration and an appropriate CPU load. The possibility increases, and therefore, the effect of reducing the repetition of the retest occurs, and the efficiency of the test can be improved.

  As described above, according to the test management apparatus of the distributed control system of the fourth embodiment, the input / output simulation apparatus control means associates the first configuration table redefined by the apparatus configuration redefinition means with the test item. In addition to storing in the device configuration storage means, the device configuration redefinition means is redefined from the device configuration storage means when a test item different from the test item is executed and a new redefinition of the first configuration table is performed. Since the first configuration table is acquired and used for new redefinition, it is possible to reduce the number of retests.

  In the present invention, within the scope of the invention, any combination of the embodiments, or any modification of any component in each embodiment, or omission of any component in each embodiment is possible. .

  DESCRIPTION OF SYMBOLS 1 Distributed control system 10,30a-30b Control network, 40a-40d Control object apparatus, 50,50a-50d, Input / output simulation apparatus, 60 Test execution management network, 70 Test execution management apparatus, 71 Input / output simulation apparatus control means 72 processing capacity measurement result acquisition means, 73 test item storage means, 74 device configuration storage means, 75 test result determination means, 76 test result storage means, 77 device configuration redefinition means.

Claims (3)

A test management device for a distributed control system that manages test execution of the plurality of control target devices in a distributed control system that controls a plurality of control target devices with a plurality of control devices,
A plurality of input / output simulation devices and a test execution management device for simulating the plurality of control target devices,
The input / output simulator is
An input / output simulation means for simulating the control target device; and a processing capability measurement means for measuring the processing capability of the input / output simulation device itself; and the input / output simulation means includes the plurality of input / output simulation devices. Can be started with any input / output simulation device
The test execution management device includes:
For each test item of the test, a test item storage unit having a test procedure indicating a control procedure in the input / output simulation unit and an input / output value in the input / output simulation unit serving as a criterion for pass / fail determination of the test result;
Input / output simulation device control means for causing the input / output simulation means to execute a test according to the test procedure;
A test result determination means for comparing the input / output result obtained by the test execution of the input / output simulation means and a predetermined input / output value as a criterion for the pass / fail determination to determine a match or mismatch;
When the test is executed, the input / output simulation unit is activated by which input / output simulation unit, and a correspondence relationship between the input / output simulation unit and the input / output simulation unit is shown. Device configuration storage means for storing a configuration table of 1 and a second configuration table indicating which control device the input / output simulation device is connected to via a network;
The determination result of the test result determination unit is inconsistent, and the processing capability measurement unit measures the processing capability of the input / output simulation device associated with the input / output simulation unit that executed the test. If the input / output simulation device is close to the processing capability upper limit value by a certain value or more, the second configuration table is used to change the association to another input / output simulation device existing in the same network. Device configuration redefinition means for redefining the first configuration table,
The device configuration storage means has a third configuration table indicating the priority of the input / output simulation device when redefinition is performed,
The device configuration redefinition means, when redefining the first configuration table, changes to a high-priority input / output simulation device based on the third configuration table . Test management device. Together with the device configuration redefinition means redefined first configuration table the output simulator control means in association with the test item is stored in the device configuration storage means,
The device configuration redefinition means obtains the redefined first configuration table from the device configuration storage means when the test item is executed and a new redefinition of the first configuration table is performed. , the test management apparatus according to claim 1 Symbol placement distributed control system, characterized by using in the new redefinition. Together with the device configuration redefinition means redefined first configuration table the output simulator control means in association with the test item is stored in the device configuration storage means,
The device configuration redefinition means, when a test item different from the test item is executed and a new redefinition of the first configuration table is performed, the reconfigured first configuration from the device configuration storage means Table acquire, test management apparatus according to claim 1 Symbol placement distributed control system, characterized by using in the new redefinition.

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