JP6393165B2 - Deposit measurement system - Google Patents

Description

  The present invention relates to a deposit measurement system for measuring deposits remaining on a cleaned object to be cleaned.

  Conventionally, for example, the following measurement method has been generally used when measuring deposits remaining after cleaning of an object to be cleaned such as a machined part.

  The object to be cleaned after washing is washed away with the cleaning liquid, and the collected liquid is sucked into another container through the filter using a suction pump, and the deposits of the object to be cleaned remain on the filter. After the filter with deposits is dried with a dryer, the weight of the filter is measured with a gravimetric instrument. The total weight of the deposit is obtained by subtracting the weight of the filter itself from the weight of the filter with the deposit. In addition, the deposit on the filter is observed with a microscope, the size of the deposit is classified according to a certain standard, and the number of each reference size is written out to obtain statistics. The size means, for example, the maximum diameter.

  In addition, a measuring apparatus is disclosed that determines the cleanliness of an object to be cleaned by automating the above-described procedure using image analysis or the like, and measuring the size, area, weight, etc. of the deposit (for example, Patent Document 1) reference).

In addition to the size, area, and weight of the deposit, a deposit measuring device that determines the material of the deposit is disclosed (see, for example, Patent Document 2).
Japanese Patent No. 3967813 Japanese Patent No. 5095440

  However, the conventional measuring method described above takes time for measurement because all operations are performed manually. In addition, it depends largely on the intuition and experience of the operator, and the measurement results may vary. In addition, a weight measuring device, a dryer, a suction device for a collected liquid, a microscope, and the like must be prepared individually, which is complicated and requires a large space.

  In addition, since the measuring devices of Patent Literature 1 and Patent Literature 2 are both stand-alone, when introducing measuring devices to a plurality of factories or the like, the entire devices must be introduced one by one. Further, since parameter setting is essential for the measuring apparatus, different parameters may be set even when parts of the same model are manufactured in individual factories. If it does so, even if it is the same type of part, there is a possibility that the measurement results differ from factory to factory, and there is a possibility that management with a stable and unified cleanliness may not be possible.

  In addition, there is a possibility that problems such as long measurement processing time or inability to perform advanced arithmetic processing may occur when the performance of a computer that performs image processing of each measurement device is low or when the OS is old. ing.

  The present invention has been made in view of the above points, and an object of the present invention is to provide a measurement method and a measurement apparatus for residual deposits that can determine the material of each residual deposit on the surface of a processed part or processed product. Yes.

  In order to solve the above problems, the deposit measurement system according to the present invention is configured to wash away residual deposits adhered to the surface of an object to be cleaned with a cleaning liquid, pass the collected liquid through a filter, and deposits remaining on the filter. A deposit measuring system for measuring deposits, a measuring device for measuring deposits, a server computer connected to the measuring device, a terminal connected to the server computer via a network line, and connected to the terminal An image acquisition device capable of imaging or scanning an object, wherein the image acquisition device includes the filter and a camera that images or scans deposits on the filter, and the terminal acquires the image A memory for storing image data acquired by the apparatus, and means for outputting the image data to the server computer, A memory for storing the image data; means for outputting the image data to the measurement device; and means for inputting measurement result data from the measurement device. The measurement device stores the image data. A memory, means for pixel-analyzing the image data and reading it as the number of pixels, and calculating at least one of a size and an area based on a planar shape of each deposit using pixel information of each deposit; Means for outputting at least one of size data and area data to the terminal.

  Here, the terminal refers to a terminal capable of transmitting and receiving data to and from a server computer such as a client computer, a tablet, or a smart phone. The image acquisition device refers to, for example, a digital camera, a scanner, a microscope, and a magnifying glass. Further, the terminal may be a terminal in which the image acquisition device is connected inside the terminal and the image acquisition device is integrated. In addition, the measuring apparatus may be one in which a server computer is arranged inside the measuring apparatus and the measuring apparatus and the server computer are integrated. The size of the deposit means the maximum length or maximum diameter of the deposit.

  Preferably, the deposit measurement system includes a plurality of the terminal and the image acquisition device, the filters placed on the image acquisition device have the same size, and the measurement device acquires image data acquired from the terminal. Is further converted to a predetermined number of pixels. According to this configuration, since image data captured or scanned using different image acquisition devices is converted into image data of substantially uniform pixels and measured, stable measurement accuracy can be obtained.

  Preferably, in the deposit measurement system, the measurement device detects an edge of the filter in the image data to obtain an outer shape of the filter, a number of pixels in the outer shape of the filter, And a means for calculating a resolution for one pixel from the size. Here, the resolution refers to the size of one pixel, which is the minimum unit of image data, and specifically refers to the length of one pixel in the X direction and Y direction (for example, OOμ / 1 pixel).

  According to this configuration, the size of one pixel can be calculated even when the size of the reflection of the filter in the image data differs depending on the magnification, magnification, and focal length of the lens of each image acquisition device. The size and area of the attached matter can be calculated, and stable measurement accuracy can be obtained.

  Preferably, means for detecting an edge of the filter in the image data and obtaining an outer shape of the filter includes means for detecting the edge of the filter in the X direction and the Y direction of the image data, and coordinates of the edge Means for calculating center coordinates from the center coordinates and detecting an edge from the center coordinates to calculate an equivalent circle.

  The adhering matter measurement system includes a plurality of the terminal and the image acquisition device, and the filter used for the plurality of the image acquisition devices has a size of a predetermined size or more. Means for converting the image data acquired from the terminal into a predetermined number of pixels, and when the dimensional data of the filter acquired from the terminal is larger than the predetermined size, And a means for cutting out the image data of the minute filter. According to this configuration, stable measurement accuracy can be obtained even when filters having different sizes are used when imaging is performed using different image acquisition devices.

  Preferably, in the deposit measurement system, the measurement device detects an edge of the filter in the image data to obtain an outer shape of the filter, a number of pixels in the outer shape of the filter, and the filter Means for calculating a resolution for one pixel from the dimension data. According to this configuration, when the size of the filter is different, even when the size of the reflection of the filter in the image data differs depending on the magnification, magnification, and focal length of the lens of each image acquisition device, Since the size can be calculated, the size and area of the deposit on the filter can be calculated, and stable measurement accuracy can be obtained.

  Preferably, in the deposit measurement system, the camera of the image acquisition device is a color camera, and the measurement device stores at least color tone data of a predetermined deposit preset in the memory according to the object to be cleaned. And a means for smoothing the image data of each deposit and cutting out the image data of each deposit having a predetermined size or more from the image data of each deposit in the processed image data. The pixel area is normalized for each image data of each attached substance, the luminance value and the appearance frequency of RGB are histogram-processed for each normalized image data, and the appearance frequency is low by leveling at a predetermined appearance frequency value. After the luminance value component is cut, the luminance value of each RGB center of gravity or each central position is set as the representative luminance value, and the image data of each deposit Means for converting each representative luminance of RGB into H (hue), S (saturation), and V (brightness), image data of each deposit and the database on the coordinate system of HV correlation or HSV correlation, Means for determining the material of each deposit by calculating the pattern matching degree. According to this configuration, in addition to the size of the deposit, the material of the deposit can be determined.

  As described above, according to the deposit measurement system according to the present invention, stable measurement accuracy can be obtained.

It is a figure which shows schematic structure of the deposit | attachment measuring system which concerns on one Embodiment of this invention. It is a figure which shows schematic structure of the measuring apparatus which concerns on one Embodiment of this invention. It is a flowchart of the deposit | attachment measurement which concerns on one Embodiment of this invention. It is a figure which shows the state which binarized the image data of the deposit | attachment. It is a figure which shows the state which carried out the labeling process of the image data of a deposit | attachment. It is a figure which shows the state which cut out and normalized each deposit | attachment. It is the figure which processed the histogram of the image data of each deposit | attachment by RGB luminance value and appearance frequency. It is the HV correlation diagram which plotted the pigment | dye data (H, V) of the deposit | attachment piece of each material. It is explanatory drawing which calculates the pattern matching degree of a deposit | attachment. It is explanatory drawing 1 of pixel number conversion of the image data in the deposit | attachment measurement which concerns on one Embodiment of this invention. It is explanatory drawing 2 of pixel number conversion of the image data in the deposit | attachment measurement which concerns on one Embodiment of this invention. It is explanatory drawing which calculates the resolution | decomposability of the image data in the deposit | attachment measurement which concerns on one Embodiment of this invention.

  Hereinafter, although the embodiment concerning the present invention is described based on a drawing, the present invention is not limited to the following embodiment. In particular, the types and number of terminals, image acquisition devices, and the like in the following embodiments are examples, and the present invention is not limited to the following embodiments.

<Embodiment>
[1. Structure of deposit measurement system]
FIG. 1 is a diagram showing a schematic configuration of a deposit measurement system according to an embodiment of the present invention. As shown in FIG. 1, the deposit measurement system 1 includes a server computer 2, a measurement device 3, a plurality of client computers 4 and an image acquisition device 5.

  The server computer 2 is connected to the measuring device 3. Each of the plurality of client computers 4 is connected to the image acquisition device 5. The server computer 2 is connected to a plurality of client computers 4 via a network line 100. The network line 100 of the present embodiment is an Internet line as an example, but may be an intranet line or a combination of an Internet line and an intranet line.

  The server computer 2 includes a CPU 21, a memory 22, and a data input / output interface 23. The measuring device 3 includes a CPU 31, a memory 32, and a data input / output interface 33. The memory 22 or the memory 32 stores application data for measurement processing, image data, measurement result data, a deposit database, and the like. Various data may be stored in both the memory 22 and the memory 32, or may be stored in any one of them depending on the type of each data.

  The CPU 31 analyzes the image data and reads it as the number of pixels, calculates the size based on the planar shape of each deposit using the pixel information of each deposit, and calculates the image data as a predetermined pixel. An operation for converting the image data into a pixel, and analyzing the image data as a pixel number, calculating an area based on a planar shape of each deposit using pixel information of each deposit, and each cut out deposit The pixel area is normalized for each image data, and the luminance value and appearance frequency of RGB are histogram-processed for each normalized image data, and the luminance value component with low appearance frequency is obtained by leveling at a predetermined appearance frequency value. After cutting, the luminance value at each center of gravity or each central position of RGB is set to the respective representative luminance value, and the above-mentioned representative luminance of RGB is set for the image data of each deposit Calculating the degree of pattern matching between the image data of each deposit and the database on the coordinate system of H (hue), S (saturation), V (brightness), HV correlation or HSV correlation. The calculation of determining the material of each deposit is performed. Further, these calculations may be performed by the CPU 21, or the CPU 31 may perform a calculation together with the CPU 21.

  Next, the detailed configuration of the measuring apparatus 3 used in this embodiment will be described. As shown in the schematic configuration diagram of the measurement apparatus 3 in FIG. 2, the measurement apparatus 3 includes a casing 34, a measurement table 35 on which the filter F is placed in the casing 34, and a camera 36. The camera 36 is disposed above the measurement table 35 and facing downward. The measuring device 3 further includes a display 37 and a keyboard 38.

  As an example, the camera 36 is a line sensor color having a CCD color image element. Further, a moving mechanism (not shown) is arranged below the measuring table 35, and the measuring table 35 is installed on the scanning unit of the moving mechanism. The moving mechanism includes a ball screw that is rotated by a servo motor (not shown), and the measuring table 35 moves through the ball screw by the rotation of the servo motor. As a result, the measurement object on the measurement table 35 can be imaged while scanning the camera 36 in a specific direction. The servo motor may be a control motor such as a stepping motor. In addition, an LED illuminator (not shown) is disposed above the measurement table 35 in order to irradiate the measurement object on the measurement table 35. In addition, it is good also as a structure which the camera 36 moves and scans a measuring object instead of the structure to which the measurement stand 35 moves.

  Further, as shown in FIG. 1, an adhering matter collecting device 6 for collecting adhering matter on the filter F is disposed near the measuring device 3. The deposit collecting device 6 includes a container 61 for injecting the cleaning liquid after cleaning, a tank 62 connected to the container 61 below, and a suction pump 63 further below. The container 61 includes an upper opening for injecting the cleaning liquid and a lower opening for setting the filter F. With this configuration, when the cleaning liquid after cleaning is injected from the upper opening of the container 61 and the suction pump 63 is operated, the cleaning liquid in the container 61 is discharged to the tank 62 through the filter F, and the filter F contains the cleaning liquid in the cleaning liquid. Deposits are collected.

  The deposit collecting device 6 may be integrated with the measuring device 3. Further, in the deposit measurement system 1 of the present embodiment, the deposit collection device 6 is arranged in each image acquisition device 5 of each client computer 4. As a result, the method for collecting deposits becomes constant, and the deposit measurement is stabilized.

  The client computer 4 includes a CPU 41, a memory 42, and a data input / output interface 43. The memory 42 stores image data captured or scanned by the image acquisition device 5. The client computer 4 is an example of a terminal, and is not limited thereto, and a tablet, a smart phone, or the like may be used.

  The image acquisition device 5 of the present embodiment includes, as an example, a digital camera 51 and a mounting table 52 on which a filter F is mounted, a microscope 53, and a scanner 54. Hereinafter, the image acquisition device 5 will be described as including a mounting table 52 on which the digital camera 51 and the filter F are mounted. The filter F is mounted on the mounting table 52 and image data is acquired by the digital camera 51. Note that the image acquisition device 5 may use a magnifying glass in addition to the above examples.

[2. Adhesion measurement using the adhering matter measurement system]
FIG. 3 is a flowchart of the deposit measurement using the deposit measurement system. Based on FIG. 3, the flow of deposit measurement will be described. The following flow is a measurement procedure including the material determination of the deposit. The procedure for creating the database for determining the material quality of the deposit will be described separately from the measurement procedure. In addition, the deposit | attachment measuring system 1 of this embodiment measures about the material determination of each deposit | attachment, a magnitude | size, an area, and the total number of deposit | attachments as an example. The procedure performed on the server computer 2 side is the server side, and the procedure performed on the client computer 4 side is the client side. In FIG. 3, the server side is displayed as (S) and the client side is displayed as (C).

(1. Server side)
As a measurement pretreatment, a database of each deposit is created in advance. Details will be described later (A).

(2. Client side)
The cleaning liquid after cleaning the parts and the like is put in the container 61 of the deposit collecting device 6 and the filter F is set in a predetermined suction port 63, and then the suction pump 8 is operated to filter the collected liquid. In the present embodiment, the filter F is unified with a φ47 mm filter.

(3. Client side)
After the deposits collected on the filter F by filtration and the filter F are dried by a drying device such as a heater, the filter F is mounted on the mounting table 52 of the image acquisition device 5. And image or scan the deposit.

(4. Client side)
The image data acquired by the image acquisition device 5 is sent to the client computer 4, and the image data is transmitted from the client computer 4 to the server computer 2 via the network line 100.

(5. Server side)
The server computer 2 receives the image data transmitted from the client computer 4 and transmits the image data to the measuring device 3.

(6. Server side)
The measuring device 3 converts the received image data into a predetermined number of pixels. Details of the pixel number conversion process will be described later (B).

(7. Server side)
The measuring device 3 binarizes the image data that has undergone pixel number conversion based on a preset luminance value (see FIG. 4).

(8. Server side)
The binarized image data is subjected to a labeling process with a range where pixels of the same color (for example, black) are continuous as one block (see FIG. 5), and an image is extracted for each attached object. At this time, with respect to the image for each attached substance, when, for example, white portions are scattered inside the image specified by the labeling process, a process of painting these in black is performed.

(9. Server side (size and area measurement))
About the image for every deposit | attachment, a magnitude | size (maximum length or maximum diameter) and an area are measured based on the number of pixels. Moreover, the size of each deposit | attachment is compared as needed, and measurement data is arranged in order of the magnitude | size of a deposit | attachment. Thereby, the number of deposits contained in the cleaning liquid, the size and area of each deposit can be measured. Further, the cleanliness of the cleaned object is determined based on these data. An example of the determination of cleanliness will be described later (C).

(10. Server side (material judgment))
Further, after the labeling process of the image data described above, the image data of each deposit is smoothed. As a result, it is possible to remove color unevenness, sharpness, and the like of the image data, reduce variations in RGB luminance values as color information, and improve determination accuracy.

(11. Server side)
Based on the image data and labels of each attached object after the smoothing process, the image data of each attached object is cut out, and the pixel area is normalized by performing, for example, a filling process for each attached image data. (See FIG. 6).

(12. Server side)
Histogram processing is performed for each normalized image data of the attached matter based on the RGB luminance value (X axis) and its appearance frequency (Y axis). Here, the appearance frequency refers to the ratio of the area (number of pixels) occupied by a pixel having a predetermined RGB luminance value to the total area (total number of pixels) of the deposit.

(13. Server side)
For each RGB color element, the level is cut at a predetermined appearance frequency (for example, adjusted at 20 to 50%), and the luminance value component with a low appearance frequency is cut (see FIG. 7).

(14. Server side)
The level of R, G, B at the center of gravity or the center position of the effective luminance component after level cutting for each RGB color element is used as the representative value (representative value) of the pigment data (R, G, B) of each residual deposit. (Brightness value).

(15. Server side)
The representative luminance value for each extracted pigment data (R, G, B) is converted into pigment data (H, S, V) of the HSV color system using Equation 1 below.

(16. Server side)
From the extracted pigment data (H, S, V) of each deposit, (H, V) is extracted, and the coordinates of the HV correlation in which pigment data (H, V) for each material described later is plotted in advance. The dye data (H, V) of the deposit is plotted on a system, for example, a bitmap graph (see FIG. 8). Then, on the coordinate system of the HV correlation, the adhering piece sample data closest to the dye data (H, V) of each adhering matter is calculated, and the distance divided by the threshold value S is set to 100. The multiplied value (%) is stored in the memory as an evaluation value for pattern matching of each deposit.

(17. Server side)
Note that the evaluation value of the pattern matching degree is calculated by the following formula 2. When this value is within 100%, the material is specified, and when the value is greater than 100%, it is determined that the material is unknown (FIG. 9). reference). Further, the image data, the size, the area, the pattern matching degree evaluation value, and the measured data such as the discriminated material name obtained as described above can be displayed on the display 37 for confirmation.

(18. Server side)
Measurement data such as the image data, size, area and pattern matching degree evaluation values and the discriminated material name of each deposit obtained by the above steps are transmitted to the server computer 2. The server computer 2 receives and stores the measurement data, and transmits it to the client computer 4 via the network line 100.

(19. Client side)
The client computer 4 stores the measurement data received from the server computer 2 and displays the measurement data on the display of the client computer 4. Thereby, the operator of the client computer 4 can confirm the number of deposits adhered to the object to be cleaned after cleaning, the data of each deposit, and the cleanliness. That is, even if the client computer 4 is located away from the server computer 2 and the measuring device 3, these data can be acquired with stable accuracy.

  In addition, when determination of a material is unnecessary, it is good also as a process except said process 10-17. On the other hand, when only the determination of the material is required, the step 9 may be excluded.

(A. Creation of deposit sample data)
(1) In order to create sample data of each deposit on the measuring device 3, a plurality of deposit pieces are placed on the filter F and placed on the measurement table 35. Then, the image data, the measurement data, and the dye data (H, V) of each attached piece are extracted by the same procedure as the above-described Step 7 to Step 17.

(2) The extracted pigment data (H, V) of each attached piece is plotted on the coordinate system of the HV correlation (see FIG. 10), and the material name is input for each piece of attached piece color data. . These steps are repeated until sample data of the necessary number of deposit pieces is obtained. Since this corresponds to the variation for each deposit, a plurality of measurement data is acquired for one type of deposit and sample data is created.

(3) Statistical processing (normal distribution) is performed on the sample data of the adhered pieces for each material plotted on the HV correlation coordinate system, and the degree of dispersion (standard deviation) σ is calculated to obtain a threshold value. From these, sample data is created for each material. Note that the sample data for each material draws a circle having a radius as a threshold with the sample data of a plurality of adhered pieces as the center. If the color data of the deposit is in these circles, the material at the center of the circle is determined as the deposit material (see FIG. 9).

  The threshold value S for each material is set by multiplying the degree of dispersion σ by a predetermined constant. In addition, when the number of adhering pieces for each material is small and sufficient dispersion σ cannot be obtained, it is possible to manually set a threshold value manually.

(B. Pixel number conversion process)
(1) In the step 6, the case where the number of pixels of the image data acquired by the image acquisition device 5 is 2 million pixels and the predetermined number of pixels in the measurement device 3 is 8 million pixels will be described as an example. The measuring device 3 receives and stores the image data of 2 million pixels, and then divides the pixel in units of one pixel into four crosses. At this time, the color data of the divided pixels is, for example, an average value of the color data of surrounding pixels (see FIG. 10A). Specifically, the color data of the divided pixel A is the average value of the surrounding eight pixels B. Instead of this, the color data of one pixel before division can be used as it is for the color data of one pixel after division.

  In the above step 6, the following procedure is performed when the number of pixels of the image data acquired by the image acquisition device 5 is 32 million pixels and the predetermined number of pixels in the measurement device 3 is 8 million pixels. The measuring device 3 receives and stores the image data of 32 million pixels, and then integrates four pixels in units of one pixel. At this time, the color data of the integrated pixels is, for example, an average value of the color data of the four pixels C (see FIG. 10B).

(2) Further, in order to calculate the size and area of the attached matter, it is necessary to calculate the XY two-dimensional resolution (XX / pixel) of the pixel in units of one pixel. This is because the image of the filter F by the image acquisition device 5 may have different subject distances depending on the optical system that performs imaging or scanning. That is, the size of the reflection of the subject of a single image differs depending on the magnification, magnification, and focal length of the lens even for the same subject.

  In the present embodiment, as an example, the size of the filter F is standardized at φ47 mm, so the resolution is calculated by the following method. First, two edges of the filter F in the X direction and Y direction of the image data are detected. When the center coordinate is calculated from the coordinates of each two points and the edge of the filter F is traced from the center coordinate, an equivalent circle is detected. This equivalent circle coincides with the filter F having a diameter of 47 mm (see FIG. 11).

  Thereby, since the number of pixels of the equivalent circle becomes the number of pixels of the filter F of φ47 mm, the resolution for one pixel can be calculated, and thereby the size and area of the deposit on the filter F can be calculated.

(C. Determination of cleanliness)
(1) An example of the determination of the cleanliness based on the measurement data such as the size, area, and material of each deposit is described above. First, for example, data (for example, □□ or less deposits having a size of OOmm or more) as the acceptance criteria for cleanliness of an object to be cleaned such as a machined part are input to the measuring device 3. Then, after the machined part is cleaned by a dedicated cleaning machine, the cleaning liquid is collected and measured, and it is determined whether or not the pass standard value of the cleanliness is cleared. Thereby, the cleanliness of the object to be cleaned can be determined immediately. If the acceptance criteria for cleanliness are not cleared, the object to be cleaned is cleaned until it is determined to be cleared.

(2) It is also possible to set the acceptance criteria for cleanliness by adding material data to the acceptance criteria data for cleanliness such as the size and number of deposits. Thereby, it is possible to determine the cleanliness with higher accuracy. Specifically, for example, the number of iron deposits having a size of ◯ mm or more is □□ or less, and the number of copper deposits having a size of ΔΔmm or more is ☆☆ or less. In this way, when incorporating precision machine parts under the conventional cleanliness standards, the size may meet the acceptance standards, but there may be cases where high-hardness metal pieces interfere and damage the precision machined parts. It is possible to avoid such a case by setting the material of the deposit as a cleanliness requirement standard.

<Other embodiments>
As described above, the embodiments of the present invention have been described with reference to the drawings, but various additions, modifications, or deletions can be made without departing from the spirit of the present invention. For example, the terminal is not limited to a client computer, and may be a tablet or a smart phone. In addition, the image acquisition device is not limited to a digital camera, and may be a scanner, a microscope, a magnifying glass, or the like.

  Further, the terminal may be one in which the image acquisition device is connected inside the terminal and the terminal and the image acquisition device are integrated. In addition, the measuring apparatus may be one in which a server computer is arranged inside the measuring apparatus and the measuring apparatus and the server computer are integrated. In addition, the types and number of terminals, image acquisition devices, and the like in the above embodiment are merely examples, and the present invention is not limited thereto. Therefore, such a thing is also included in the scope of the present invention.

1 Adhesive Measurement System 2 Server Computer 21 CPU
22 Memory 23 Data Input / Output Interface 3 Measuring Device 31 CPU
32 Memory 33 Data input / output interface 34 Casing 35 Measuring stand 36 Camera 37 Display 38 Keyboard 4 Client computer 41 CPU
42 Memory 43 Data input / output interface 5 Image acquisition device 51 Digital camera 52 Mounting table 53 Microscope 54 Scanner 6 Deposit collecting device 61 Container 62 Tank 63 Suction pump 100 Network line F Filter

Claims (7)

A deposit measurement system for washing residual deposits adhering to the surface of an object to be cleaned with a cleaning liquid, passing the collected liquid through a filter, and measuring the deposits remaining on the filter,
Measuring device for measuring deposits, server computer connected to the measuring device, terminal connected to the server computer via a network line, and image acquisition device connected to the terminal for imaging or scanning an object And comprising
The image acquisition device includes:
A camera that images or scans the filter and deposits on the filter,
The terminal
A memory for storing image data acquired by the image acquisition device; and a means for outputting the image data to the server computer,
The server computer
A memory for storing the image data; means for outputting the image data to the measuring device; and means for inputting measurement result data from the measuring device;
The measuring device is
Memory for storing the image data, means for pixel-analyzing the image data and reading it as the number of pixels, and calculating at least one of size and area based on the planar shape of each deposit using pixel information of each deposit And means for outputting at least one of size data and area data of each deposit to the terminal,
Deposit measurement system. A plurality of the terminal and the image acquisition device;
The filters used for a plurality of the image acquisition devices have the same size,
The measuring device is
Further comprising means for converting the image data acquired from the terminal into a predetermined number of pixels;
The deposit measurement system according to claim 1. The measuring device is
Means for detecting an edge of the filter in the image data and obtaining an outer shape of the filter;
Means for calculating the resolution of one pixel from the number of pixels in the outer shape of the filter and the size of the filter;
The deposit measurement system according to claim 2. Means for detecting an edge of the filter in the image data and obtaining an outer shape of the filter,
Means for detecting an edge of the filter in the X and Y directions of the image data;
Obtaining center coordinates from the coordinates of the edges, and detecting an edge from the center coordinates to calculate an equivalent circle, and
The deposit measurement system according to claim 3. A plurality of the terminal and the image acquisition device;
The filter used for a plurality of the image acquisition devices has a size of a predetermined size or more;
The terminal further comprises means for outputting dimension data of the filter,
The measuring device is
Means for converting the image data acquired from the terminal into a predetermined number of pixels, and means for cutting out image data of the filter for the predetermined size when the dimension data of the filter acquired from the terminal is larger than a predetermined size, In addition,
The deposit measurement system according to claim 1. The measuring device is
Means for detecting an edge of the filter in the image data and obtaining an outer shape of the filter;
Means for calculating the resolution of one pixel from the number of pixels in the outer shape of the filter and the dimension data of the filter;
The deposit measurement system according to claim 5. The camera of the image acquisition device is a color camera;
The measuring device is
A database in which at least color tone data of a predetermined deposit set in advance according to the object to be cleaned is stored in the memory;
Means for smoothing the image data of each deposit and cutting out the image data of each deposit of a predetermined size or more from the image data of each deposit in the processed image data;
Normalize the pixel area for each piece of image data of each attached object, histogram process the RGB luminance values and appearance frequency for each normalized image data, and cut the level at a predetermined appearance frequency value. After the low luminance value component is cut, the luminance value at each RGB center of gravity or each central position is set as the representative luminance value, and the image data of each deposit is determined from the representative luminance of RGB to H (hue). Means for converting to S (saturation) and V (lightness);
Means for determining the material of each deposit by calculating the pattern matching degree between the image data of each deposit and the database on the coordinate system of HV correlation or HSV correlation,
The adhesion degree measuring system according to any one of claims 1 to 6.

Images