JP6421150B2 - Test power supply - Google Patents

Description

  The present invention relates to a test power supply device, and more particularly to an improvement of a test power supply device that supplies power to a device to be inspected that is supplied with an AC power supply having a fundamental frequency.

  Examples of power devices that are supplied with AC power at a fundamental frequency from a commercial power source include PCS (Power Conditioning System) that performs output conversion of solar cells and fuel cells. This type of power device is required to meet a tolerance test against a voltage fluctuation of a commercial power source. For example, the EMC (Electro-Magnetic Compatibility) test standard requires immunity (electromagnetic resistance) to a composite wave in which voltage waveforms of various frequencies are superimposed as interference waves on the voltage waveform of the fundamental frequency. . In the tolerance test, it is determined whether or not the power device operates normally even if the voltage waveform supplied from the power supply device is distorted.

  A test power supply for performing the above-described resistance test is called an AC simulator, and a linear amplifier type power supply is known. The power supply device of the linear amplifier system is a device that adds a harmonic signal generated by a signal generator to a signal of a fundamental frequency and performs power amplification using the amplification action of an active element, and its rated output is several kVA at most. ~ About several tens of kVA. For this reason, there existed a problem that it was not suitable for the tolerance test of large capacity PCS.

  Therefore, it is conceivable to perform a resistance test using an inverter type power supply device. An inverter type power supply device is a device that generates a composite wave by operating an inverter composed of a plurality of switching elements at a predetermined switching frequency, and can easily increase the capacity. For example, since the fundamental frequency is 50 Hz or 60 Hz, a switching frequency of about several kHz to several tens of kHz is used. However, in the EMC test standard described above, it is necessary to generate a higher-order harmonic such as 40 times the fundamental frequency. When high-order harmonics are generated at a switching frequency of about several kHz to several tens of kHz, there is a problem that the voltage waveform is distorted due to insufficient resolution.

  On the other hand, by increasing the switching frequency, it is possible to prevent distortion from occurring in the higher-order harmonic waveform. However, if the switching frequency is increased, there is a problem that power loss due to switching increases.

  The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a test power supply device that can easily increase the capacity and can generate higher-order harmonic waveforms. In particular, it is an object of the present invention to provide a test power supply apparatus that can prevent distortion in a higher-order harmonic waveform while suppressing an increase in power loss due to a switching operation.

  A test power supply apparatus according to the first aspect of the present invention is a test power supply apparatus having a fundamental frequency, and a low-band inverter that generates a voltage waveform of the fundamental frequency as a fundamental wave, and switching higher than the low-band inverter. A high-band inverter that operates at a frequency and generates a voltage waveform of a high-band test frequency equal to or higher than a first threshold frequency that is predetermined as a frequency higher than the basic frequency as an interference wave, the low-band inverter, and the high-band inverter Is connected to the primary coil and the secondary coil, respectively, and includes a transformer coupling circuit that superimposes the interference wave on the fundamental wave, and a test frequency designating unit that designates the high-band test frequency.

  According to such a configuration, since power amplification is performed by the switching operation of the low-band inverter and the high-band inverter, the capacity can be easily increased. Further, since the interference wave is generated by the high-band inverter that operates at a higher switching frequency than that of the low-band inverter, it is possible to prevent distortion of the higher-order harmonic waveform. Further, since the transformer coupling circuit superimposes the interference wave on the fundamental wave, an increase in power loss due to the switching operation can be suppressed as compared with the case where power amplification is performed by one inverter.

  In addition to the above-described configuration, the test power supply apparatus according to the second aspect of the present invention is configured such that the low-band inverter includes a low band less than a second threshold frequency that is predetermined as a frequency equal to or higher than the first threshold frequency in the fundamental A composite wave on which the voltage waveform of the test frequency is superimposed is generated, and the test frequency specifying means is configured to specify the low-band test frequency. According to such a configuration, it is possible to generate a synthesized wave in which the voltage waveform of the low-band test frequency is superimposed on the fundamental wave as an interference wave.

  In addition to the above-described configuration, the test power supply apparatus according to the third aspect of the present invention is configured such that the low-band inverter is superimposed with harmonics that are integer multiples of the fundamental frequency or non-integer multiples of the fundamental frequency. The synthesized wave is generated, and the inter-order harmonics are configured to include a voltage waveform less than 1 times the fundamental frequency.

  According to such a configuration, not only a composite wave in which a harmonic of an integral multiple of the fundamental frequency is superimposed as an interference wave, but also a composite wave in which an inter-order harmonic of a non-integer multiple of the fundamental frequency is superimposed as an interference wave Can be generated.

  In addition to the above configuration, the test power supply apparatus according to the fourth aspect of the present invention has the basic frequency of 50 Hz or 60 Hz, the low-band inverter operates at a switching frequency of 20 kHz or less, and the test frequency designation means The low-band test frequency and the high-band test frequency are designated with a predetermined frequency within a range of 12 times or less of the basic frequency as the first threshold frequency and the second threshold frequency.

  According to such a configuration, it is possible to suppress distortion in the combined waveform generated by the low-band inverter and to suppress an increase in switching loss in the high-band inverter.

  In addition to the above-described configuration, the test power supply apparatus according to the fifth aspect of the present invention is configured such that the high-band inverter has a smaller output than the low-band inverter. According to such a configuration, an increase in power loss due to the switching operation can be suppressed.

  A test power supply apparatus according to a sixth aspect of the present invention includes a capacitor connected in parallel to the primary coil of the transformer coupling circuit in addition to the above configuration, and the leakage inductance of the primary coil and the capacitor are The high band inverter is configured to form a carrier removal filter.

  According to such a configuration, it is possible to remove the switching frequency component from the output of the high-band inverter while suppressing an increase in the number of parts as compared with the case where the coil for the carrier removal filter is provided separately from the transformer coupling circuit. it can.

  A test power supply apparatus according to a seventh aspect of the present invention includes a converter that generates a DC voltage using a commercial power supply in addition to the above-described configuration, and the low-band inverter and the high-band inverter are common to the converter. A voltage waveform is generated using the supplied DC voltage. According to such a configuration, the apparatus can be reduced in size as compared with the case where a converter is provided for each inverter.

  In addition to the above configuration, the test power supply apparatus according to the eighth aspect of the present invention is configured such that the high-band inverter includes a field effect transistor using silicon carbide. According to such a configuration, the power loss in the high-band inverter can be reduced as compared with the case where the high-band inverter is composed of an insulated gate bipolar transistor using silicon.

  According to the present invention, it is possible to provide a test power supply device that is easy to increase in capacity and can prevent distortion in a high-order harmonic waveform. In particular, it is possible to prevent distortion from occurring in higher-order harmonic waveforms while suppressing an increase in power loss due to the switching operation.

1 is a system diagram showing a configuration example of a test power supply device 1 according to an embodiment of the present invention. It is the figure which showed the example of a structure of the power generation unit 12 of FIG. FIG. 3 is a diagram showing details of a high-band inverter 123 and a transformer coupling circuit 124 of FIG. FIG. 3 is a block diagram illustrating a configuration example of an inverter control circuit 129 in FIG. 2. FIG. 3 is a diagram illustrating an operation example of a power generation unit 12 in FIG. 2.

<Test power supply 1>
FIG. 1 is a system diagram showing a configuration example of a test power supply device 1 according to an embodiment of the present invention. In the figure, a test power supply device 1 connected to a PCS (Power Conditioning System) 2 to be inspected is shown. The PCS 2 is a power conversion device that converts DC power generated by a solar cell or a fuel cell into AC power and outputs the AC power to a power system at a stable voltage and frequency.

  The test power supply device 1 is an AC simulator that supplies power to a device to be inspected that is supplied with AC power at a fundamental frequency f0, and voltage waveforms of various frequencies are superimposed as interference waves on the voltage waveform at the fundamental frequency f0. Generated synthesized waves and perform various resistance tests. The test power supply device 1 generates a composite wave based on an information processing terminal 11 that specifies a basic frequency f0 and a test frequency for an endurance test, and a test frequency instruction from the information processing terminal 11, and supplies power to the PCS 2 And a power generation unit 12 to be applied.

  The information processing terminal 11 is, for example, a personal computer that operates based on a resistance test application program. The information processing terminal 11 generates a test frequency instruction for designating a low-band test frequency f1 less than the threshold frequency fts1, or for designating a high-band test frequency f2 that is greater than or equal to the threshold frequency fts2, and supplies the power generation unit 12 Output.

  The threshold frequencies fts1 and fts2 are both fixed values of frequencies higher than the basic frequency f0 and are determined in advance. The threshold frequency fts1 is equal to or higher than the threshold frequency fts2. The low-band test frequency f1 and the high-band test frequency f2 are specified based on a user operation, or are automatically specified according to a predetermined test schedule.

  The basic frequency f0 corresponds to the frequency of the commercial power supply 3, and is, for example, f0 = 50 Hz. The information processing terminal 11 designates the low-band test frequency f1 and the high-band test frequency f2 with threshold frequencies fts1 and fts2 set in advance within a range of 12 times or less of the basic frequency f0. The threshold frequencies fts1 and fts2 are, for example, fts1 = fts2, and 9 times the basic frequency f0, that is, fts1, fts2 = 450 Hz is used.

  The low-band test frequency f1 is specified within a range of 0.33 times or more and less than 9 times the basic frequency f0. On the other hand, the high-band test frequency f2 is specified within a range of 9 to 40 times the basic frequency f0. By adopting such a configuration, various resistance tests defined in the EMC test standards can be performed.

  For example, individual harmonic tests, interharmonic harmonic tests, and frequency sweep tests can be performed. The individual harmonic test is a tolerance test in which harmonics from the second order to the 40th order are sequentially superimposed. The interharmonic test is a tolerance test in which a voltage waveform that is a non-integer multiple of the fundamental frequency f0 is called an interharmonic harmonic and this interharmonic harmonic is superimposed. The frequency sweep test is a tolerance test in which harmonics from the 0.33rd order to the 40th order are superimposed stepwise or continuously. If the basic frequency f0 is f0 = 60 Hz, fts = 540 Hz is used as the threshold frequency fts.

  The power generation unit 12 is an inverter unit that generates a desired AC voltage as a power source using the power supplied from the commercial power source 3. The commercial power supply 3 supplies, for example, AC power having a three-phase three-wire system with a frequency of 50 Hz and a voltage effective value of 420 V to the power generation unit 12.

<Power generation unit 12>
FIG. 2 is a diagram illustrating a configuration example of the power generation unit 12 of FIG. The power generation unit 12 includes a converter 121, a low-band inverter 122, a high-band inverter 123, a transformer coupling circuit 124, a switch 125, an output terminal 126, a converter control circuit 127, and inverter control circuits 128 and 129.

  The converter 121 is a converter that generates a DC voltage using a commercial power source, and includes a plurality of switching elements, for example, an IGBT (Insulated Gate Bipolar Transistor). The converter 121 converts an AC voltage input from a commercial power source into a DC voltage and outputs the DC voltage to the low-band inverter 122 and the high-band inverter 123. Each switching element of the converter 121 is switched by the gate drive signal GS. The DC voltage output from the converter 121 is, for example, 650V.

  The low-band inverter 122 is a switching-type converter that converts the DC voltage input from the converter 121 into a low-band AC voltage and outputs the converted voltage from the output terminal 126 via the transformer coupling circuit 124 or the switch 125. Switching elements, for example, IGBTs. Each switching element of the low-band inverter 122 is switched by the gate drive signal GS1.

  The low-band inverter 122 operates at a predetermined switching frequency fs1, for example, fs1 = 7 kHz, and generates a voltage waveform of the fundamental frequency f0 as a fundamental wave, or a voltage waveform of the low-band test frequency f1 is generated in the fundamental wave. A composite wave superimposed as an interference wave is generated. The voltage level of the interference wave superimposed on the fundamental wave by the low-band inverter 122 is about 0 to 10% of the voltage level of the fundamental wave. Note that the switching frequency fs1 may be a frequency exceeding several kHz, for example, a dozen kHz, specifically, 16 kHz to 18 kHz.

  In addition, the low-band inverter 122 generates a composite wave in which harmonics that are integer multiples of the fundamental frequency f0 are superimposed as interference waves, or harmonics that are non-integer multiples of the fundamental frequency f0 are superimposed as interference waves. . The inter-order harmonic includes a voltage waveform less than one time the fundamental frequency f0.

  The high-band inverter 123 is a switching converter that converts the DC voltage input from the converter 121 into a high-band AC voltage and outputs the high-band AC voltage to the transformer coupling circuit 124, and includes a plurality of switching elements. Each switching element of the high-band inverter 123 is switched by the gate drive signal GS2.

  The high-band inverter 123 operates at a switching frequency fs2 higher than that of the low-band inverter 122, for example, fs2 = 42 kHz, and generates a voltage waveform of the high-band test frequency f2 as an interference wave. The high band inverter 123 has a smaller output than the low band inverter 122. For example, the output of the low-band inverter 122 is about 800 kVA, whereas the output of the high-band inverter 123 is about 150 kVA, which is 1/5 or less of the low-band inverter 122.

  The transformer coupling circuit 124 is a transformer circuit for superimposing the interference wave generated by the high-band inverter 123 on the fundamental wave generated by the low-band inverter 122. The low-band inverter 122 and the high-band inverter 123 Each is connected to a primary coil and a secondary coil. The voltage level of the interference wave superimposed on the fundamental wave by the transformer coupling circuit 124 is about 0 to 10% of the voltage level of the fundamental wave.

  The switch 125 is an electromagnetic switching type switch that is turned on when the power source of the low-band test frequency f1 is output and is cut off when the power source of the high-band test frequency f2 is output, and is connected in parallel to the transformer coupling circuit 124. Is done.

  The ammeter 131 is a current detector for detecting the output current Iout of the low band inverter 122, and is arranged between the low band inverter 122 and the transformer coupling circuit 124. The output current Iout is a load current that flows through a load connected to the output terminal 126. The ammeter 132 is a current detector for detecting the output current Iinv of the high band inverter 123, and is arranged between the high band inverter 123 and the transformer coupling circuit 124.

  The voltmeter 133 is disposed between the ammeter 131 and the transformer coupling circuit 124, and the output voltage Vout of the low-band inverter 122 is detected. In the voltmeter 133, the primary coil and the secondary coil are each delta-connected to the AC phases. The voltmeter 134 is arranged in parallel with the primary coil of the transformer coupling circuit 124 and detects the output voltage Vinv of the high-band inverter 123. In the voltmeter 134, the primary coil is star-connected to each AC phase, and the secondary coil is delta-connected to each AC phase.

  Converter control circuit 127 is a control circuit for controlling converter 121, generates gate drive signal GS, and outputs it to converter 121. The inverter control circuit 128 is a control circuit that controls the low-band inverter 122 based on the test frequency instruction from the information processing terminal 11, generates the gate drive signal GS1 with reference to the output current Iout and the output voltage Vout, Output to the low-band inverter 122.

  The inverter control circuit 129 is a control circuit that controls the high-band inverter 123 based on a test frequency instruction from the information processing terminal 11, and refers to the output current Iout, the output current Iinv, and the output voltage Vinv, and the gate drive signal GS2 Is output to the high-band inverter 123.

  The inverter control circuit 129 switches the switch 125 to the closed state (on state) when the power source of the low-band test frequency f1 is output, thereby energizing the bypass coupling path to the transformer coupling circuit 124, The band inverter 123 is stopped. On the other hand, the inverter control circuit 129 operates the high-band inverter 123 and then switches the switch 125 to the open state (off state) when outputting the power source of the high-band test frequency f2, thereby transforming the transformer coupling circuit 124. And the inverter control circuit 128 is instructed to select the fundamental wave.

  FIG. 3 is a diagram showing details of the high-band inverter 123 and the transformer coupling circuit 124 of FIG. The high-band inverter 123 includes six switching elements 4 and six free-wheeling diodes 5 and converts a DC input from the converter 121 into a three-phase three-wire AC voltage. The effective value of the voltage is, for example, 360V.

  As the switching element 4, a transistor with low power loss due to a switching operation, for example, an FET (Field Effect Transistor) using silicon carbide is used.

  The free-wheeling diode 5 is a semiconductor element for protecting the switching element 4, and is connected in parallel between the source terminal and the drain terminal of the switching element 4. A gate drive signal GS2 from the inverter control circuit 129 is input to the gate terminal of the switching element 4.

  The transformer coupling circuit 124 includes three transformers 6, an open star connection unit that connects the primary coil of the transformer 6, the AC input from the low-band inverter 122, and the output terminal 126, and the secondary coil of the transformer 6 and the high coil It is comprised by the delta connection part which connects the band inverter 123 mutually. The AC input from the low-band inverter 122 is a three-phase three-wire AC voltage, and the effective value is, for example, 420V.

  The configuration of the open star connection part and the delta connection part is as follows. One end of the primary coil is connected to the first phase of the AC input, and the other end of the secondary coil of the transformer 6 connected to the first phase output terminal 126 is connected to the first phase of the high-band inverter 123. And the other end is connected to the second phase. In addition, the secondary coil of the transformer 6 having one end of the primary coil connected to the second phase of the AC input and the other end connected to the output terminal 126 of the second phase is connected to the second phase of the high-band inverter 123. And the other end is connected to the third phase. In addition, the secondary coil of the transformer 6 having one end of the primary coil connected to the third phase of the AC input and the other end connected to the output terminal 126 of the third phase is connected to the third phase of the high-band inverter 123. And the other end is connected to the first phase.

  In this transformer coupling circuit 124, a capacitor 130 is connected in parallel with the primary coil. The capacitor 130 is a capacitive element for forming a carrier removal filter of the high-band inverter 123 by the capacitor 130 and the leakage inductance of the primary coil. The capacitor 130 is provided for each transformer 6 and is connected in parallel to the primary coil of the transformer 6.

  The switch 125 is connected in parallel to the primary coil of the transformer coupling circuit 124 and forms a bypass path for the transformer coupling circuit 124 in the closed state. The switch 125 is provided for each transformer 6 and is connected in parallel to the primary coil of the transformer 6.

<Inverter control circuit 129>
FIG. 4 is a block diagram showing a configuration example of the inverter control circuit 129 of FIG. The inverter control circuit 129 includes an effective value command generation unit 21, an effective value calculation unit 22, an effective value voltage control unit 23, an instantaneous voltage waveform control unit 24, a phase matching unit 25, an adder 26, a peak cut limiter 27, an instantaneous current. The waveform control unit 28 and the gate drive signal generation unit 29 are configured.

  The effective value command generation unit 21 generates an effective value command for determining the effective value of the output voltage Vinv. The effective value calculator 22 calculates an effective value from the output voltage Vinv detected by the voltmeter 134. The effective value voltage control unit 23 is a control unit that performs feedback control so that the effective value of the output voltage Vinv is constant, and includes a subtractor 231 and a waveform command generation unit 232.

  The subtracter 231 subtracts the effective value obtained by the effective value calculation unit 22 from the effective value command generated by the effective value command generation unit 21 to generate an error of the effective value command, and the waveform command generation unit 232. Output to. The waveform command generation unit 232 generates a waveform command for determining the voltage waveform of the output voltage Vinv based on the test frequency instruction from the information processing terminal 11 and the error in the effective value command from the subtractor 231. The waveform command generation unit 232 includes, for example, an error amplification unit and a sine wave generation unit, and generates a waveform command from the amplified error and the sine wave.

  The instantaneous voltage waveform control unit 24 is a control unit that feedback-controls the instantaneous value of the output voltage Vinv, and includes an adder 241 and an inverter voltage PI control unit 242. The adder 241 adds an output voltage Vinv detected by the voltmeter 134 with an opposite phase to the waveform command generated by the waveform command generation unit 232 to generate an error of the waveform command, and the inverter voltage PI control unit 242 Output to. Inverter voltage PI control unit 242 generates a waveform command for determining the current waveform of output current Iinv based on the error in the waveform command from adder 241. The inverter voltage PI control is a feedback control in which the output is controlled as a linear function of an error between the waveform command and the detected value of the output voltage Vinv, and the output is changed according to the integration of the error.

  The phase matching unit 25 matches the waveform command of the inverter voltage PI control unit 242 by shifting the phase of the output current Iout detected by the ammeter 131 by a certain amount. The phase matching unit 25 is a phase shifter that matches the detected value of the output current Iout with the phase on the secondary coil side of the transformer coupling circuit 124, and delays the phase of the detected value by 30 °. The phase shift of 30 ° corresponds to the phase difference between the star connection on the primary coil side and the delta connection on the secondary coil side.

  The adder 26 adds the detected value of the output current Iout from the phase matching unit 25 in the same phase as the current command to the waveform command generated by the inverter voltage PI control unit 242, and outputs it to the peak cut limiter 27. The peak cut limiter 27 is a circuit for preventing an overcurrent when the load is short-circuited. The instantaneous current waveform control unit 28 is a control unit that feedback controls the instantaneous value of the output current Iinv, and includes adders 281 and 283 and an inverter current PI control unit 282.

  Since the output current Iout is a load current that actually flows through the load connected to the output terminal 126, the detected value of the output current Iout is added in the same phase as the waveform command of the output current Iinv, and an instantaneous current waveform command By setting the value, feedforward control is performed to operate the high-band inverter 123 in a constant current operation state.

  When switching from the power source of the low-band test frequency f1 to the power source of the high-band test frequency f2, the bypass path of the transformer coupling circuit 124 is blocked by switching the switch 125 to the open state. At that time, since the voltage is applied to both ends of the primary coil of the transformer coupling circuit 124 so that the load current before interruption is maintained by the feedforward control of the high-band inverter 123, the low-band test frequency f1 to the high band The power supply can be continuously switched to the test frequency f2.

  The adder 281 adds an output current Iinv detected by the ammeter 132 with an opposite phase to the waveform command from the peak cut limiter 27 to generate an error in the waveform command, and outputs the error to the inverter current PI control unit 282. . The inverter current PI control unit 282 generates a waveform command value of the output voltage Vinv based on the error of the waveform command from the adder 281. The adder 283 adds the waveform command generated by the waveform command generation unit 232 in the same phase to the waveform command value generated by the inverter current PI control unit 282, and outputs it to the gate drive signal generation unit 29.

  Based on the waveform command value from the adder 283, the gate drive signal generation unit 29 generates the gate drive signal GS2 and outputs it to the high-band inverter 123. The gate drive signal generation unit 29 includes a PWM (pulse width modulation) type drive circuit, and generates a pulsed gate drive signal GS2. The gate drive signal generation unit 29 includes, for example, a signal oscillator that generates a triangular wave signal and a comparator that compares the waveform command value with the triangular wave signal. The frequency of the triangular wave signal, that is, the carrier frequency is fs2 = 42 kHz.

  Similarly to the inverter control circuit 129, the inverter control circuit 128 also generates the gate drive signal GS <b> 1 based on the output current Iout detected by the ammeter 131 and the output voltage Vout detected by the voltmeter 133.

  FIG. 5 is a diagram illustrating an operation example of the power generation unit 12 of FIG. 2, and illustrates how the gate drive signal GS <b> 2 is generated from the waveform command value 7 and the triangular wave signal 8. The waveform command value 7 is a command value when f2 = 2.4 kHz is designated as the highest-order (40th-order) high-band test frequency f2 when the basic frequency f0 is 60 Hz. The carrier frequency of the triangular wave signal 8 is 42 kHz.

  The gate drive signal GS2 is a rectangular wave whose voltage level is switched between high and low at the intersection of the sinusoidal waveform command value 7 and the triangular wave signal 8. Even at such a high-order high-band test frequency f2, since the carrier frequency is high, sufficient resolution can be obtained and distortion in the harmonic waveform can be prevented.

  According to the present embodiment, since power amplification is performed by the switching operation of the low-band inverter 122 and the high-band inverter 123, it is easy to increase the capacity. Further, since a high-order interference wave is generated by the high-band inverter 123 that operates at a switching frequency fs2 higher than that of the low-band inverter 122, it is possible to prevent the distortion of the high-order harmonic waveform. In addition, since the transformer coupling circuit 124 superimposes a higher-order interference wave on the fundamental wave, an increase in power loss due to the switching operation can be suppressed as compared with a case where power amplification is performed by one inverter.

  In addition, since the leakage inductance of the transformer coupling circuit 124 and the capacitor 130 form a carrier removal filter of the high-band inverter 123, the number of parts can be reduced compared to the case where the coil for the carrier removal filter is provided separately from the transformer coupling circuit 124. While suppressing the increase, the switching frequency component can be removed from the output of the high-band inverter 123.

  In addition, since the low-band inverter 122 and the high-band inverter 123 generate a voltage waveform using the DC voltage supplied from the common converter 121, the apparatus can be downsized compared to the case where a converter is provided for each inverter. Can do. Furthermore, since the high-band inverter 123 is made of FET using silicon carbide, the power loss of the high-band inverter 123 can be reduced as compared with the case where the high-band inverter 123 is made of IGBT using silicon.

  In the present embodiment, an example in which the high-band inverter 123 is made of an FET using silicon carbide has been described. However, the present invention does not limit the configuration of the high-band inverter 123. For example, the high-band inverter 123 may be configured by an FET or IGBT.

  Further, in the present embodiment, an example in which the power generation unit 12 of the test power supply device 1 is configured by two inverter circuits has been described. However, in the present invention, the power generation unit 12 is configured by three or more inverter circuits. It is applicable to what constitutes. For example, the output may be increased by connecting two low-band inverters 122 in parallel.

  Further, in the present embodiment, an example in which the threshold frequency fts1 and the threshold frequency fts2 are made to coincide with each other and the low-band test frequency f1 and the high-band test frequency f2 do not overlap has been described. However, the present invention may be configured such that the adjustment range of the low-band test frequency f1 overlaps the adjustment range of the high-band test frequency f2 by setting the frequency above the threshold frequency fts2 as the threshold frequency fts1.

DESCRIPTION OF SYMBOLS 1 Test power supply device 11 Information processing terminal 12 Power generation unit 121 Converter 122 Low band inverter 123 High band inverter 124 Transformer coupling circuit 125 Switch 126 Output terminal 127 Converter control circuit 128, 129 Inverter control circuit 130 Capacitors 131, 132 Ammeter 133,134 Voltmeter 2 PCS
3 Commercial Power Supply 4 Switching Element 5 Freewheeling Diode 6 Transformer 7 Waveform Command Value 8 Triangular Wave Signal

Claims (7)

In a test power supply that generates a test power supply at a fundamental frequency,
A low-band inverter that generates the fundamental frequency voltage waveform as a fundamental wave;
A high-band inverter that operates at a higher switching frequency than the low-band inverter and generates a voltage waveform of a high-band jamming wave based on a specified test frequency;
The low-band inverter and the high-band inverter are respectively connected to a primary coil and a secondary coil, and includes a transformer coupling circuit that superimposes the high-band disturbance wave on the fundamental wave,
The low-band inverter generates a composite wave in which a voltage waveform of a low-band jamming wave is superimposed on the fundamental wave based on the test frequency,
A test power supply apparatus that generates, as the test power supply, a waveform in which the low-band jamming wave or the high-band jamming wave is superimposed on the fundamental wave. The high-band jamming wave has a frequency equal to or higher than a first threshold frequency that is predetermined as a frequency higher than the fundamental frequency,
2. The test power supply apparatus according to claim 1, wherein the low-band interference wave has a frequency lower than a second threshold frequency that is predetermined as a frequency that is equal to or higher than the first threshold frequency.   The low-band interfering wave is a harmonic that is an integral multiple of the fundamental frequency or an inter-order harmonic that is a non-integer multiple of the fundamental frequency. The power supply for testing according to claim 1 or 2, wherein what is included is included. 2. A switch connected in parallel to the primary coil of the transformer coupling circuit and forming a bypass path to the transformer coupling circuit for the low-band inverter when closed. The power supply for test according to any one of to 3 . A capacitor connected in parallel to the primary coil of the transformer coupling circuit;
Test power supply device according to any one of claims 1 to 4, the leakage inductance and the capacitor of the primary coil and forming a carrier removing filter of the high-band inverter. It has a converter that generates a DC voltage using commercial power,
The low band inverter and the high band inverter, the test power supply according to any one of claims 1 to 5, characterized in that to generate the voltage waveform by using the DC voltage supplied from a common said converter apparatus. The power supply for testing according to any one of claims 1 to 6 , wherein the high-band inverter comprises a field effect transistor using silicon carbide.

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