JP6435249B2 - Contact input control device - Google Patents

Description

  The present invention relates to a contact input control device used in, for example, an electronic interlocking system for railway signal security control.

  In the field of railways, in order to operate trains safely and efficiently, electronic interlocking devices are used that provide a certain order and restrictions on the handling of traffic lights and switchboards. For this electronic interlocking device, an input control device disclosed in Patent Document 1 is used in order to capture the operating state of field devices such as traffic lights and switchboards via a relay.

  In the input control device of Patent Document 1, whether or not a failure has occurred in the contact signal input unit or the failure inspection unit, regardless of whether the input contact is in an open state (off) or a closed state (on). Can be detected.

JP 2011-51539 A

  However, since the input control device of Patent Document 1 uses a pulse transformer as an electromagnetic component, there is a problem that it is difficult to reduce the size of the circuit, reduce the cost, and the like. In addition, when the control logic section has only a contact input signal as the response signal for the two types of output signals, it is difficult to determine whether a failure has occurred in the contact signal input section or the fault inspection section. There is.

  The object of the present invention is to solve the above-mentioned problems, determine the closed state / open state of the input contact, and if the input contact is in the closed state or in the open state, the main body has failed. It is an object of the present invention to provide a contact input control device that can correctly determine whether or not to improve reliability and reduce the size and cost.

  In order to achieve the above object, a contact input control device according to the present invention comprises a contact input unit, an inspection voltage application unit, and a control unit, and the contact input unit connects an input contact with a positive side of an external DC power supply. A contact voltage input terminal connected to the negative power source, a negative input terminal connected to the negative side of the DC power supply, a test voltage input terminal connected to the test voltage application unit, and a contact input signal to the control unit. A first output terminal and a first input terminal for inputting an input control signal from the control unit; the inspection voltage application unit is connected to the inspection voltage input terminal of the contact input unit; An inspection voltage output terminal for applying an inspection voltage to the input unit, a DC power input terminal branched from between the positive side of the DC power source and the input contact, and an inspection control answer signal to the control unit Output 2 output terminals and a second input terminal for inputting an inspection control signal from the control unit, the control unit including the contact input signal and the inspection corresponding to the input control signal and the inspection control signal. Based on the output data of the control answer signal and the input / output logic data at the time of normal operation of the open / closed state of the input contact stored in advance, the contact input open / closed state and failure in the main body It is characterized by determining.

  The contact input control device according to the present invention receives the contact input signal and the inspection control answer signal after changing the H level side and the L level side of the input control signal and the inspection control signal with time. In addition to determining the closed / open state of the input contact, it is possible to determine whether or not a failure has occurred in the main body regardless of whether the input contact is open or closed. It is.

  Therefore, the reliability can be improved and the pulse transformer, which is an electromagnetic component, is not used, so that the size can be reduced and the cost can be reduced.

It is a block circuit block diagram of a contact input control device. It is a circuit block diagram of a contact input part and a test voltage application part. It is an operation time chart figure at the time of a normal operation in the state where an input contact is open. It is an operation time chart figure at the time of normal operation in the state where an input contact is closed. It is an input / output logic table with input contacts open. It is an input / output logic table with the input contact closed. It is a flowchart figure which performs the determination of the open state / closed state of an input contact, and the failure state of a contact input control apparatus. FIG. 6 is an operation time chart when the input contact is open and the phototransistor T4 of the photocoupler P4 of the inspection voltage application unit fails on the conduction side. 9 is an input / output logic table of the control unit 4 in the case of FIG.

The present invention will be described in detail based on the embodiments shown in the drawings.
FIG. 1 is a block circuit configuration diagram of the contact input control device 1. The contact input control device 1 includes a contact input unit 2, an inspection voltage application unit 3, and a control unit 4, and a DC power source E is connected to one side of the contact input control device 1. An input contact N indicating an operation state of a ground device such as a traffic light or a switch is arranged on the plus side of the DC power source E, and an electronic interlocking device 5 which is a host device is connected to the other side of the contact input control device 1. Has been.

  In response to a status information request from the electronic interlocking device 5 such as polling, the contact input control device 1 opens / closes information on the input contact N, that is, operation status information on ground devices such as traffic lights and switchboards. Response of failure information that has occurred. Alternatively, information on the open / closed state of the input contact N and failure information are returned to the electronic interlocking device 5 at predetermined time intervals.

  In this embodiment, one input contact N is connected, but a plurality of input contacts N can be used. In this case, the same number of contact input units 2 and test voltage application units 3 are required according to the number of input contacts N, and the plurality of contact input units 2 and test voltage application units 3 are controlled by one. Connect to part 4. As for the power source, the DC power source E branches in parallel and is connected to a plurality of input contacts N.

  The contact input unit 2 includes a contact voltage input terminal 2 a that connects the positive side of the DC power source E via the input contact N, a negative input terminal 2 b that connects the negative side of the DC power source E, and the inspection voltage application unit 3. An inspection voltage input terminal 2c for inputting a detection voltage signal, an output terminal 2d for outputting a contact input signal S1 to the control unit 4, and an input terminal 2e for inputting an input control signal S2 from the control unit 4 are provided. ing.

  The inspection voltage application unit 3 is connected to the inspection voltage input terminal 2 c of the contact input unit 2, the inspection voltage output terminal 3 a that applies the inspection voltage to the contact input unit 2, the positive side of the DC power supply E, and the input contact N A DC power supply input terminal 3b that is branched and connected to the control unit 4, an output terminal 3c that outputs the inspection control answer signal S3 to the control unit 4, and an input terminal 3d that inputs the inspection control signal S4 from the control unit 4. doing.

  The control unit 4 has an input terminal 4a for inputting the contact input signal S1 from the output terminal 2d of the contact input unit 2, an output terminal 4b for outputting the input control signal S2 to the input terminal 2e of the contact input unit 2, and an inspection voltage application. It has an input terminal 4c for inputting the inspection control answer signal S3 from the output terminal 3c of the unit 3, and an output terminal 4d for outputting the inspection control signal S4 to the input terminal 3d of the inspection voltage application unit 3.

  FIG. 2 is a circuit configuration diagram showing details of the contact input unit 2 and the inspection voltage application unit 3 in the block circuit of the contact input control device 1. The contact input unit 2 connects in series a photocoupler P1 including a light emitting diode D1 and a phototransistor T1, and a photocoupler P2 including a light emitting diode D2 and a phototransistor T2. The positive side of the DC power source E from the contact voltage input terminal 2a and the inspection voltage input terminal 2c connected to the input contact N is connected to the negative side of the DC power source E from the negative input terminal 2b via the photocouplers P1 and P2. doing.

  The contact voltage input terminal 2a is connected to the anode of the light emitting diode D1 of the photocoupler P1 of the contact input unit 2 via the resistor R1 and the resistor R2, and the cathode is connected to the collector of the phototransistor T2 of the photocoupler P2. The emitter of the phototransistor T2 is connected to the negative input terminal 2b, and a resistor R3 is connected between the connection point between the resistors R1 and R2 and the negative input terminal 2b.

  A diode D5 for bypassing the reverse current is connected in parallel to the light emitting diode D1 of the photocoupler P1 and the phototransistor T2 of the photocoupler P2. Furthermore, the connection point between the cathode side of the diode D5 and the resistor R2 is connected to the inspection voltage input terminal 2c.

  The collector of the phototransistor T1 of the photocoupler P1 is connected to the output terminal 2d via the inverting element IC1, and a power supply voltage e of, for example, 5 V is connected between the collector of the phototransistor T1 and the inverting element IC1 via the resistor R4. Applied. The emitter of the phototransistor T1 is connected to 0V.

  A power supply voltage e of, for example, 5V is applied to the anode of the light emitting diode D2 of the photocoupler P2 via the resistor R5, and the cathode of the light emitting diode D2 is connected to the input terminal 2e via the inverting element IC2.

  The inspection voltage application unit 3 connects a photocoupler P3 including a light emitting diode D3 and a phototransistor T3 and a photocoupler P4 including a light emitting diode D4 and a phototransistor T4 in series. A DC power supply input terminal 3b branched from an external DC power supply E is connected to an inspection voltage output terminal 3a via photocouplers P3 and P4.

  The inspection voltage output terminal 3a is connected to the cathode of the light emitting diode D3 of the photocoupler P3 via the resistor R6, and the emitter of the phototransistor T4 of the photocoupler P4 is connected to the anode.

  The collector of the phototransistor T4 is connected to the DC power supply input terminal 3b, and a diode for bypassing the reverse current connected in parallel to the light emitting diode D3 of the photocoupler P3 and the phototransistor T4 of the photocoupler P4. D6 is connected.

  The collector of the phototransistor T3 of the photocoupler P3 is connected to the output terminal 3c via the inverting element IC3, and a power supply voltage e of, for example, 5V is connected between the collector of the phototransistor T3 and the inverting element IC3 via the resistor R7. Applied. The emitter of the phototransistor T3 is connected to 0V.

  A power supply voltage e of, for example, 5V is applied to the anode of the light emitting diode D4 of the photocoupler P4 via the resistor R8, and the cathode of the light emitting diode D4 is connected to the input terminal 3d via the inverting element IC4.

  FIG. 3 shows an operation time chart when the input contact N is in an open state, that is, when the input contact N is in an OFF state, and the contact input unit 2 and the inspection voltage application unit 3 are in normal operation. Is a closed state, that is, the input contact N is in an ON state, and the contact input unit 2 and the inspection voltage application unit 3 are operating time charts during normal operation.

  3 and 4 with these time axes as horizontal axes, t1, t3, t5, t7, and t9 indicate the output timing of the control unit 4, and t2, t4, t6, t8, and t10 are The input timing of the control unit 4 is shown. s1 to s5 represent steps of contact input processing of the control unit 4, and d in the figure represents an operation delay of the circuit.

  The output processing of the H (High) level / L (Low) level of the input control signal S2 and the inspection control signal S4 performed at the output timings t1, t3, t5, t7, and t9 from the control unit 4 in FIGS. Output data consisting of the input control signal S2 and the inspection control signal S4 set according to each output timing is output.

  Then, the control unit 4 stores the contact input signal S1 and the inspection control answer signal S3, which are input at the input timings t2, t4, t6, t8, and t10, and the H level / L level input data, and FIGS. The open / closed state of the input contact N and the failure of the main body can be determined by comparing the input / output logic during normal operation shown in FIG.

  FIG. 3 is an operation timing chart when the input contact N is in an open open state and the contact input unit 2 and the inspection voltage application unit 3 are in normal operation.

  At the output timing t1 of step s1, the control unit 4 outputs both the input control signal S2 of the contact input unit 2 and the inspection control signal S4 of the inspection voltage application unit 3 as L level output data. At the input timing t2, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.

  When an L level signal is input to the input terminal 2e of the contact input unit 2 and the input terminal 3d of the inspection voltage application unit 3 as output data of the control unit 4, the inverting elements IC2 and IC4 invert the outputs to H level signals. At this time, since no current flows from each power supply voltage e to the contact input unit 2 and the inspection voltage application unit 3, the photocouplers P2 and P4 remain off.

  When the photocouplers P2 and P4 are in an off state, no current flows through the phototransistors T2 and T4, so that the light emitting diodes D1 and D3 do not emit light, and the photocouplers P1 and P3 remain off. .

  Accordingly, at the input timing t2, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the L level signal of the contact input signal S1 and the inspection control answer signal S3 is used as the control unit 4. Will be output.

  At the output timing t3 of step s2, the control unit 4 outputs only the input control signal S2 from the L level signal to the H level signal to the input terminal 2e of the contact input unit 2, and then checks the contact input signal S1 at the input timing t4. The control answer signal S3 is read and used as input data.

  When the control unit 4 outputs an H level signal using only the input control signal S2 as output data and inputs this H level signal to the input terminal 2e of the contact input unit 2, the inverting element IC2 outputs the output of the H level signal to the L level signal. Invert. By making the output of the inverting element IC2 an L level signal, a current flows from the power supply voltage e and the light emitting diode D2 emits light.

  However, since the input contact N is in the off state and the photocouplers P3 and P4 are also in the off state, no current flows through the phototransistor T2 of the photocoupler P2. Therefore, at the output timing t3, the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3 are not inverted, and the L level is obtained as the contact input signal S1 and the inspection control answer signal S3. The signal is output to the control unit 4.

  At the output timing t5 of step s3, the control unit 4 outputs output data in which the input control signal S2 and the inspection control signal S4 are H level signals to the contact input unit 2 and the inspection voltage application unit 3. Thereafter, the control unit 4 reads the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 at the input timing t6 and uses them as input data.

  The control unit 4 outputs an H level signal using the inspection control signal S4 as output data. When the H level signal is input to the input terminal 3d of the inspection voltage application unit 3, the inverting element IC4 outputs the output of the H level signal to the L level signal. Invert. By making the output of the inverting element IC4 an L level signal, a current flows from the power supply voltage e and the light emitting diode D4 emits light.

  When the light emitting diode D4 emits light, a current flows from the DC power supply E to the phototransistor T4 via the DC power supply input terminal 3b, and the light emitting diode D3 of the photocoupler P3 connected in series emits light.

  When the light emitting diode D3 of the photocoupler P3 emits light, a current flows from the power supply voltage e connected through the resistor R7 to the phototransistor T3, and the inverting element IC3 is inverted from the L level signal to the H level signal and inspected from the output terminal 3c. The H level signal of the control answer signal S3 is output to the control unit 4 after being delayed by d from the output timing t5.

  Thus, when the inspection voltage application unit 3 receives the H level signal of the inspection control signal S4, the photocouplers P3 and P4 are also turned on, and a current is supplied from the inspection voltage input terminal 2c to the contact input unit 2. Flows in.

  Further, when the H level signal of the input control signal S2 is output from the control unit 4 to the contact input unit 2, the light emitting diode D2 emits light as described above. When the light emitting diode D2 emits light, a current flows from the inspection voltage applying unit 3 to the phototransistor T2, and the light emitting diode D1 of the photocoupler P1 connected in series emits light.

  When the light emitting diode D1 of the photocoupler P1 emits light, a current flows through the phototransistor T1, and the inverting element IC1 is inverted from the L level signal to the H level signal. Therefore, at the input timing t6, the H level signal of the contact input signal S1 and the H level signal of the inspection control answer signal S3 are controlled as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3. To be output to the unit 4.

  At the output timing t7 in step s4, the control unit 4 sets the input control signal S2 as an H level signal and outputs output data in which the inspection control signal S4 is switched from the H level signal to the L level signal. When the inspection control signal S4 is switched to the L level signal and output, the photocouplers P3 and P4 are turned off, and the current flowing from the inspection voltage input terminal 2c to the contact input unit 2 is stopped.

  At the same time that the input contact N is in the open open state, the photocouplers P3 and P4 are also in the off state, so that the current flowing through the photocouplers P1 and P2 is also stopped. Then, the output of the H level signal of the contact input signal S1 is switched to the L level signal with a delay of d from the output timing t7. At the input timing t8, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the contact input signal S1 and the L level signal of the inspection control answer signal S3 are output to the control unit 4. It will be.

  At the output timing t9 of step s5, the control unit 4 returns the input control signal S2 from the H level signal to the L level signal to the contact input unit 2, and outputs the output data using the inspection control signal S4 as the L level signal. At the input timing t10, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.

  FIG. 4 shows an operation timing chart when the input contact N is closed and the contact input unit 2 and the inspection voltage application unit 3 are in normal operation. Since the input contact N is on, current always flows from the contact voltage input terminal 2a.

  At the output timing t1 of step s1, the control unit 4 outputs both the input control signal S2 to the contact input unit 2 and the inspection control signal S4 to the inspection voltage application unit 3 as output data that is an L level signal. Then, at the input timing t2, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the L level signal of the contact input signal S1 and the inspection control answer signal S3 is sent to the control unit 4. Will be output.

  At the output timing t3 of step s2, the control unit 4 outputs only the input control signal S2 from the L level signal to the H level signal and outputs it to the input terminal 2e of the contact input unit 2, and then at the input timing t4, the contact input signal S1 and The inspection control answer signal S3 is read and used as input data.

  The control unit 4 outputs only the input control signal S2 as an H level signal. When this H level signal is input to the input terminal 2e of the contact input unit 2, the inverting element IC2 is inverted to an L level signal. By making the output of the inverting element IC2 an L level signal, a current flows from the power supply voltage e and the light emitting diode D2 emits light.

  At this time, since the input contact N is in an ON state, a current flows from the contact voltage input terminal 2a to the phototransistor T2 of the photocoupler P2 and the light emitting diode D1 of the photocoupler P1 in series, and the light emitting diode D1 emits light.

  When the light emitting diode D1 of the photocoupler P1 emits light, a current flows through the phototransistor T1, and the inverting element IC1 inverts the L level signal to the H level signal. The contact input signal S1 that is the output of the inverting element IC1 is switched from the L level signal to the H level signal with a delay of d from the output.

  Since the inspection control signal S4 from the control unit 4 continues to be an L level signal and is output to the input terminal 3d of the inspection voltage application unit 3, the phototransistors T3 and T4 remain off, and the inspection control answer signal In S3, the output of the L level signal is continued. Therefore, at the input timing t4, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the H level signal of the contact input signal S1 and the L level of the inspection control answer signal S3 are used. The signal is output to the control unit 4.

  At the output timing t5 of step s3, the control unit 4 outputs output data in which the input control signal S2 to the contact input unit 2 and the inspection control signal S4 to the inspection voltage application unit 3 are H level signals. Thereafter, at the input timing t6, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.

  When the H level signal of the input control signal S2 from the control unit 4 is continuously input to the input terminal 2e of the contact input unit 2, the contact input signal S1 continues to output the H level signal as described above. When the H level signal of the inspection control signal S4 is input to the input terminal 3d of the inspection voltage application unit 3, the inverting element IC4 inverts the H level signal to the L level signal, and the phototransistor T3 and the phototransistor T4 are turned on. .

  When the phototransistor T3 is turned on, the inverting element IC3 inverts the L level signal to the H level signal, and delays the H level signal of the inspection control answer signal S3 from the output terminal 3c by d from the output timing t5. 4 will be output. Therefore, the contact input signal S1 and the H level signal of the inspection control answer signal S3 are output to the control unit 4 as output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3 at the input timing t6. To do.

  At the output timing t7 in step s4, the control unit 4 sets the input control signal S2 as an H level signal, and outputs output data in which the inspection control signal S4 is switched from the H level signal to the L level signal. Thereafter, at the input timing t8, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.

  When the inspection control signal S4 is switched to the L level signal at the output timing t7 in step s4, the photocouplers P3 and P4 are turned off. However, since the input contact N is in the closed state, a current flows to the photocouplers P1 and P2 via the contact voltage input terminal 2a in response to the continuous input of the H level signal of the input control signal S2. The state will be maintained.

  Accordingly, at the input timing t8, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the inspection voltage application unit 3, the contact input signal S1 is an H level signal and the inspection control answer signal S3 is an L level. The signal is output to the control unit 4.

  At the output timing t9 in step s5, the control unit 4 outputs output data obtained by returning the output of the H level signal of the inspection control signal S4 to the L level signal to the inspection voltage applying unit 3. Thereafter, at the input timing t10, the contact input signal S1 from the contact input unit 2 and the inspection control answer signal S3 from the inspection voltage application unit 3 are read and used as input data.

  The controller 4 switches the H level signal of the input control signal S2 to the L level signal at the output timing t9, and outputs the L level signal of the inspection control signal S4, similarly to the output at the output timing t1 in step s1.

  By inputting output data in which the input control signal S2 is an L level signal to the input terminal 2e, the photocouplers P1 and P2 are turned off, and the H level signal of the contact input signal S1 is set to L with a delay of d from the output timing t9. Switch to level signal and output. Therefore, at the input timing t10, as the output data from the output terminal 2d of the contact input unit 2 and the output terminal 3c of the test voltage application unit 3, the L level signal of the contact input signal S1 and the test control answer signal S3 is sent to the control unit 4. Will be output.

  Thus, based on the operation time charts of the open state of the input contact N turned off and the closed state of the on state, the normal operation of the open contact state of the input contact N of FIG. 5 and FIG. 6 and the closed state of the on state of FIG. I / O logical table can be created.

  Input timings t2, t4, t6, and output timings t1, t3, t5, t7, and t9 from the control unit 4 to the H level / L level output data of the inspection control signal S4. The H level / L level input data of the contact input signal S1 and the inspection control answer signal S3 at t8 and t10 are compared with the input / output logic during the normal operation in the open / closed state shown in FIGS. Thus, it can be determined whether the input contact N is in an open open state or in an on closed state, or whether the contact input control device 1 is in failure.

  FIG. 7 is a flowchart for determining the open / closed state of the input contact N and the failure state of the contact input control device 1. In the flow f1, the contact input signals at the input timings t2, t4, t6, t8, and t10. Input data of S1 and inspection control answer signal S3 are collected. In the flow f2, these input data and the input data in the open state in FIG. 5 are compared, and if they match, it is determined that the input contact N is in the open state.

  If the input data does not match the input data in the open state, the flow proceeds to flow f3 and is compared with the input data in the closed state in FIG. If they match, it is determined that the input contact N is in a closed state, and if it does not match, it is determined that the contact input control device 1 is in failure.

  FIG. 8 is an operation time chart when the contact input control device 1 is in a failure state, for example, when the input transistor N is in an open open state and the phototransistor T4 of the photocoupler P4 of the inspection voltage application unit 3 fails on the conduction side. FIG. 9 shows an input / output logic table at the time of this failure.

  If the phototransistor T4 of the photocoupler P4 fails on the conduction side and current continues to flow from the DC power source E to the test voltage input terminal 2c of the contact input unit 2 via the resistor R6, the H level / L from the test control signal S4. The inspection control answer signal S3 is output as an H level signal regardless of the level input signal.

  In FIG. 9, the portion surrounded by a circle is a portion that does not match any of the output logic tables in FIGS. 5 and 6, and therefore, it is determined as a mismatch error in the flow f3 in FIG. It is determined that this has occurred.

  In this case, since a mismatch is found in the inspection control answer signal S3, it can be seen that the inspection voltage application unit 3 is out of order. Similar to the inspection voltage application unit 3, the contact input unit 2 including a pair of photocouplers P1 and P2 may have a failure as shown in FIGS. In this case, the contact input signal S1 is inconsistent with the output logic tables of FIGS. 5 and 6, so that it can be determined that the contact input unit 2 has failed.

  Further, in order to prevent erroneous detection of failure due to mismatch in the flow f3 of FIG. 7 due to temporary circuit contact failure, etc., the process of FIG. 7 is executed at predetermined time intervals, and the mismatch continues for a predetermined number of times. In such a case, it may be determined that a failure has occurred in the main body.

  In this way, the circuit size can be reduced by adopting a pair of photocouplers P3 and P4 in the same manner as the contact input unit 2 in place of the pulse transformer for the inspection voltage application unit 3 having the conventional pulse transformer. It becomes possible to reduce the cost.

  Moreover, in the control part 4, by obtaining the input signal of the inspection control answer signal S3 from the inspection voltage application part 3, either the contact input part 2 or the inspection voltage application part 3 in the contact input control device 1 is abnormal. Can be easily determined.

DESCRIPTION OF SYMBOLS 1 Contact input control apparatus 2 Contact input part 2a Contact voltage input terminal 2b Minus input terminal 2c Inspection voltage input terminal 2d, 3c Output terminal 2e, 3d Input terminal 3 Inspection voltage application part 3a Inspection voltage output terminal 3b DC power supply input terminal 4 Control Part E DC power supply N Input contact P1 to P4 Photocoupler

Claims (6)

Consists of a contact input unit, an inspection voltage application unit, and a control unit,
The contact input unit includes a contact voltage input terminal connected to the positive side of an external DC power source via an input contact, a negative input terminal connected to the negative side of the DC power source, and an inspection connected to the inspection voltage application unit. A voltage input terminal; a first output terminal that outputs a contact input signal to the control unit; and a first input terminal that inputs an input control signal from the control unit;
The inspection voltage application unit is connected to the inspection voltage input terminal of the contact input unit, applies an inspection voltage to the contact input unit, a positive side of the DC power source, and the input contact A DC power supply input terminal branched from between, a second output terminal for outputting an inspection control answer signal to the control unit, and a second input terminal for inputting an inspection control signal from the control unit. And
The control unit is configured to output the contact input signal and the inspection control answer signal corresponding to the input control signal and the inspection control signal, and the pre-stored open state / closed state of the input contact during normal operation. A contact input control device characterized by determining an open / closed state of the contact input and a failure in the main body based on input / output logic data.   The contact input unit includes a first photocoupler connected to the first output terminal and a second photocoupler connected to the first input terminal, and the first and second photocouplers are connected in series. The contact input control device according to claim 1, wherein the contact input control device is connected.   The positive side of the DC power source from the contact voltage input terminal and the inspection voltage input terminal is connected to the negative side of the DC power source from the negative input terminal via the first and second photocouplers. The contact input control device according to claim 2.   The inspection voltage application unit includes a third photocoupler connected to the second output terminal and a fourth photocoupler connected to the second input terminal, and the third and fourth photocouplers are: The contact input control device according to claim 1, wherein the contact input control device is connected in series.   5. The contact input control device according to claim 4, wherein the DC power supply input terminal is connected to the inspection voltage output terminal via the third and fourth photocouplers.   6. The contact input according to claim 1, wherein the determination of a failure in the main body is a failure of either the contact input unit or the inspection voltage application unit. Control device.

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