JP6765658B2 - A pressed molded product containing particles of a metal composite anion compound and its use, and a method for producing the pressed molded product. - Google Patents
A pressed molded product containing particles of a metal composite anion compound and its use, and a method for producing the pressed molded product. Download PDFInfo
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Description
本発明は、金属複合アニオン化合物の粒子を含有する押圧成形物及びその使用、並びに当該押圧成形物の製造方法に関する。なお、当該押圧成形物は、例えば、太陽光エネルギーを電気エネルギーや化学エネルギーに変換する用途、具体的には、水を光分解することにより化学エネルギーとして水素を得る光触媒や光電極、太陽光エネルギーを電気エネルギーに変換する光電極(太陽電池、光センサー等)等を構成する材料として有用である。 The present invention relates to a pressed molded product containing particles of a metal composite anion compound, its use, and a method for producing the pressed molded product. The pressed molded product is used, for example, for converting solar energy into electrical energy or chemical energy, specifically, a photocatalyst, a photoelectrode, or solar energy that obtains hydrogen as chemical energy by photodecomposing water. It is useful as a material for constituting an optical electrode (solar cell, optical sensor, etc.) that converts the energy into electric energy.
ビスマス複合アニオン化合物(BiXY(X=第16族元素アニオン、Y=第17族元素アニオン))に代表される典型金属化合物は、
(1)可視光に応答できるバンドギャップを有する、
(2)材料を構成するハロゲン組成によってバンドギャップを調整できる、
(3)優れた半導体特性を有する可能性がある、
等の理由から有望な光エネルギー変換用光電極材料などとして注目されている。
Typical metal compounds represented by bismuth composite anion compounds (BiXY (X = Group 16 element anion, Y = Group 17 element anion)) are
(1) It has a band gap that can respond to visible light.
(2) The band gap can be adjusted by the halogen composition constituting the material.
(3) May have excellent semiconductor properties,
For these reasons, it is attracting attention as a promising photoelectrode material for photoenergy conversion.
ビスマス複合アニオン化合物からなる緻密薄膜は、原料溶液などから直接形成(形成と同時に基材上に固定する態様を含む)する場合は、結晶化のために必要な加熱温度が当該材料の分解温度と非常に近いことなどから容易ではない。 When a dense thin film made of a bismuth composite anion compound is formed directly from a raw material solution (including a mode of fixing it on a substrate at the same time as formation), the heating temperature required for crystallization is the decomposition temperature of the material. It is not easy because it is very close.
一方で、当該材料の粒子であれば比較的容易に調製が可能であり、しかも粒子を基材上に固定する場合は高い形態自由度を持たせることも可能である。 On the other hand, the particles of the material can be prepared relatively easily, and when the particles are fixed on the base material, it is possible to have a high degree of freedom in morphology.
しかしながら、非特許文献1に示唆されている通り、典型金属化合物の粒子を原料として形成した薄膜では、薄膜中の粒子間の粒界抵抗が大きく電荷移動効率が低下して、電極などの性能向上の妨げとなることが課題となっている。 However, as suggested in Non-Patent Document 1, in a thin film formed from particles of a typical metal compound as a raw material, the intergranular resistance between the particles in the thin film is large and the charge transfer efficiency is lowered, so that the performance of electrodes and the like is improved. The problem is that it interferes with the above.
そのため、比較的容易に調製が可能であり、しかも基材上に固定する際に高い形態自由度を持たせることが可能な、粒子を原料とした成形体の粒界抵抗を減少させる方策の開発が望まれている。 Therefore, development of a measure for reducing the grain boundary resistance of a molded product made from particles, which can be prepared relatively easily and has a high degree of morphological freedom when fixed on a substrate. Is desired.
本発明は、従来技術の課題を解決するために完成されたものであり、典型金属化合物の粒子を原料として成形体を形成した場合に、粒子間の粒界抵抗を減少させる方策を提供することを主な目的とする。 The present invention has been completed in order to solve the problems of the prior art, and provides a measure for reducing the grain boundary resistance between particles when a molded product is formed from particles of a typical metal compound as a raw material. The main purpose is.
本発明者らは、上記目的を達成すべく鋭意研究を重ねた結果、特定の金属複合アニオン化合物の粒子を含有する被押圧原料を押圧成形することにより押圧成形物を製造する場合においては粒子間の結着が促進され、粒子間の粒界抵抗を効果的に減少させることができることを見出し、本発明を完成するに至った。 As a result of diligent research to achieve the above object, the present inventors have conducted press-molding of a pressed raw material containing particles of a specific metal composite anion compound to produce a pressed molded product between particles. We have found that the binding between particles can be promoted and the intergranular resistance between particles can be effectively reduced, and the present invention has been completed.
即ち、本発明は、下記の金属複合アニオン化合物の粒子を含有する押圧成形物及びその使用、並びに当該押圧成形物の製造方法に関する。
1.カチオンA、アニオンX及びアニオンYから構成される下記一般式(1):
AXY (1)
で示される金属複合アニオン化合物の粒子を含有する押圧成形物であって、
(1)前記カチオンAのうち96〜100モル%が第15族元素カチオンであり、
(2)前記アニオンXは第16族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(3)前記アニオンYは第17族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(4)前記粒子の結晶子径が28nm以上であり、
(5)前記押圧成形物の押圧方向の断面における、幅10μmの範囲の厚さの差が1μm以内である、
ことを特徴とする押圧成形物。
2.前記カチオンAのうち有機分子カチオンの量が4モル%未満である、上記項1に記載の押圧成形物。
3.前記カチオンAのうち98〜100モル%が第15族元素カチオンである、上記項1又は2に記載の押圧成形物。
4.前記第15族元素カチオンがビスマスカチオンである、上記項1〜3のいずれかに記載の押圧成形物。
5.前記アニオンXの量がアニオンの総量のうち40〜60モル%である、上記項1〜4のいずれかに記載の押圧成形物。
6.前記第16族元素アニオンが周期表第3周期以降の元素のアニオンである、上記項1〜5のいずれかに記載の押圧成形物。
7.前記第16族元素アニオンが硫黄アニオンである、上記項1〜6のいずれかに記載の押圧成形物。
8.前記アニオンYの量がアニオンの総量のうち40〜60モル%である、上記項1〜7のいずれかに記載の押圧成形物。
9.前記第17族元素アニオンが周期表第4周期以降の元素のアニオンである、上記項1〜8のいずれかに記載の押圧成形物。
10.前記第17族元素アニオンが、臭素アニオン又はヨウ素アニオンである、上記項1〜9のいずれかに記載の押圧成形物。
11.前記金属複合アニオン化合物がBiOIである、上記項1〜5、8〜10のいずれかに記載の押圧成形物。
12.前記金属複合アニオン化合物がBiSBr又はBiSIである、上記項1〜10のいずれかに記載の押圧成形物。
13.前記粒子の結晶構造が斜方晶である、上記項1〜12のいずれかに記載の押圧成形物。
14.前記粒子の結晶構造がPDF:00−043−0652である、上記項12に記載の押圧成形物。
15.前記金属複合アニオン化合物の(110)結晶面と(002)結晶面との配向比(110)/(002)が2.0以上である、上記項14に記載の押圧成形物。
16.前記粒子の結晶構造がPDF:01−075−1811である、上記項12に記載の押圧成形物。
17.前記金属複合アニオン化合物の(110)結晶面と(121)結晶面との配向比(110)/(121)が1.0以上である、上記項16に記載の押圧成形物。
18.前記粒子の結晶構造がPDF:00−010−0445である、上記項11に記載の押圧成形物。
19.前記金属複合アニオン化合物の(110)結晶面と(200)結晶面との配向比(110)/(200)が15以上である、上記項18に記載の押圧成形物。
20.前記粒子の結晶相が単一結晶相である、上記項1〜19のいずれかに記載の押圧成形物。
21.薄膜の形態である、上記項1〜20のいずれかに記載の押圧成形物。
22.前記薄膜の膜厚が0.5〜10.0μmである、上記項21に記載の押圧成形物。
23.n型半導体である、上記項1〜22のいずれかに記載の押圧成形物。
24.導電性材料と接触している、上記項1〜23のいずれかに記載の押圧成形物。
25.前記導電性材料が金属である、上記項24に記載の押圧成形物。
26.前記導電性材料が銅又はモリブデンである、上記項25に記載の押圧成形物。
27.p型半導体と接触している、上記項1〜23のいずれかに記載の押圧成形物。
28.前記p型半導体が無機材料である、上記項27に記載の押圧成形物。
29.前記p型半導体がハロゲン化銅、硫化銅、酸化銅又は酸化モリブデンである、上記項27に記載の押圧成形物。
30.前記p型半導体が有機半導体である、上記項27に記載の押圧成形物。
31.上記項1〜30のいずれかに記載の押圧成形物の、半導体材料としての使用。
32.上記項1〜30のいずれかに記載の押圧成形物の、太陽電池材料としての使用。
33.上記項1〜30のいずれかに記載の押圧成形物の、太陽電池の光吸収層としての使用。
34.上記項1〜30のいずれかに記載の押圧成形物の、光センサーとしての使用。
35.上記項1〜30のいずれかに記載の押圧成形物の、発光材料としての使用。
36.カチオンA、アニオンX及びアニオンYから構成される下記一般式(1):
AXY (1)
で示される金属複合アニオン化合物の粒子を含有する被押圧原料を押圧成形することにより押圧成形物を製造する方法であって、
(1)前記カチオンAのうち96〜100モル%が第15族元素カチオンであり、
(2)前記アニオンXは第16族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(3)前記アニオンYは第17族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(4)0〜300℃の温度条件下、0.01Pa〜2MPaの雰囲気圧力中、0.1MPa〜20MPaの押圧圧力を1秒〜20時間印加することにより前記押圧成形を行う、
ことを特徴とする押圧成形物の製造方法。
37.上記項1〜30のいずれかに記載の押圧成形物の製造方法である、上記項36に記載の製造方法。
38.前記押圧成形は、前記被押圧原料を無機系板材で挟持した状態で行う、上記項36又は37に記載の製造方法。
39.前記温度条件が20〜200℃である、上記項36〜38のいずれかに記載の製造方法。
40.前記押圧圧力が0.6MPa〜10MPaである、上記項36〜39のいずれかに記載の製造方法。
41.前記押圧圧力を印加する時間が10秒〜10時間である、上記項36〜40のいずれかに記載の製造方法。
42.薄膜の形態となるように前記押圧成形を行う、上記項36〜41のいずれかに記載の製造方法。
That is, the present invention relates to a pressed molded product containing particles of the following metal composite anion compound, its use, and a method for producing the pressed molded product.
1. 1. The following general formula (1) composed of cation A, anion X and anion Y:
AXY (1)
A pressed molded product containing particles of a metal composite anion compound represented by.
(1) 96 to 100 mol% of the cation A is a Group 15 elemental cation.
(2) The anion X is a group 16 element anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(3) The anion Y is a Group 17 elemental anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(4) The crystallite diameter of the particles is 28 nm or more,
(5) The difference in thickness in the width range of 10 μm in the cross section of the pressed molded product in the pressing direction is within 1 μm.
A pressed molded product characterized by this.
2. Item 2. The pressure-molded article according to Item 1, wherein the amount of the organic molecular cation in the cation A is less than 4 mol%.
3. 3. Item 3. The pressed molded product according to Item 1 or 2, wherein 98 to 100 mol% of the cation A is a Group 15 elemental cation.
4. Item 3. The pressed molded product according to any one of Items 1 to 3, wherein the Group 15 elemental cation is a bismuth cation.
5. Item 2. The pressed molded product according to any one of Items 1 to 4, wherein the amount of the anion X is 40 to 60 mol% of the total amount of the anion.
6. Item 2. The pressed molded product according to any one of Items 1 to 5, wherein the Group 16 element anion is an anion of an element from the third period of the periodic table.
7. Item 2. The pressed molded product according to any one of Items 1 to 6, wherein the Group 16 element anion is a sulfur anion.
8. Item 2. The pressed molded product according to any one of Items 1 to 7, wherein the amount of the anion Y is 40 to 60 mol% of the total amount of the anion.
9. Item 2. The pressed molded product according to any one of Items 1 to 8, wherein the group 17 element anion is an anion of an element from the 4th period of the periodic table.
10. Item 2. The pressed molded product according to any one of Items 1 to 9, wherein the Group 17 element anion is a bromine anion or an iodine anion.
11. Item 2. The pressed molded product according to any one of Items 1 to 5, 8 to 10, wherein the metal composite anion compound is BiOI.
12. Item 2. The pressed molded product according to any one of Items 1 to 10, wherein the metal composite anion compound is BiSBr or BiSI.
13. Item 2. The pressed molded product according to any one of Items 1 to 12, wherein the crystal structure of the particles is orthorhombic.
14. Item 12. The pressed molded product according to Item 12, wherein the crystal structure of the particles is PDF: 00-043-0652.
15. Item 12. The pressed molded product according to Item 14, wherein the orientation ratio (110) / (002) between the (110) crystal plane and the (002) crystal plane of the metal composite anion compound is 2.0 or more.
16. Item 12. The pressed molded product according to Item 12, wherein the crystal structure of the particles is PDF: 01-075-1811.
17. Item 16. The pressed molded product according to Item 16, wherein the orientation ratio (110) / (121) of the (110) crystal plane to the (121) crystal plane of the metal composite anion compound is 1.0 or more.
18. Item 2. The pressed molded product according to Item 11, wherein the crystal structure of the particles is PDF: 00-010-0445.
19. Item 2. The pressed molded product according to Item 18, wherein the orientation ratio (110) / (200) between the (110) crystal plane and the (200) crystal plane of the metal composite anion compound is 15 or more.
20. Item 2. The pressed molded product according to any one of Items 1 to 19, wherein the crystal phase of the particles is a single crystal phase.
21. The pressed molded product according to any one of Items 1 to 20, which is in the form of a thin film.
22. Item 2. The pressed molded product according to Item 21, wherein the thin film has a film thickness of 0.5 to 10.0 μm.
23. The pressed molded product according to any one of Items 1 to 22, which is an n-type semiconductor.
24. Item 2. The pressed molded product according to any one of Items 1 to 23 above, which is in contact with a conductive material.
25. Item 2. The pressure-molded article according to Item 24, wherein the conductive material is a metal.
26. Item 2. The pressure-molded article according to Item 25, wherein the conductive material is copper or molybdenum.
27. Item 2. The pressed molded product according to any one of Items 1 to 23 above, which is in contact with a p-type semiconductor.
28. Item 2. The pressed molded product according to Item 27, wherein the p-type semiconductor is an inorganic material.
29. Item 27. The press-molded product according to Item 27, wherein the p-type semiconductor is copper halide, copper sulfide, copper oxide or molybdenum oxide.
30. Item 2. The pressed molded product according to Item 27, wherein the p-type semiconductor is an organic semiconductor.
31. Use of the pressed molded product according to any one of Items 1 to 30 above as a semiconductor material.
32. Use of the pressed molded product according to any one of Items 1 to 30 above as a solar cell material.
33. Use of the pressed molded product according to any one of Items 1 to 30 above as a light absorption layer of a solar cell.
34. Use of the pressed molded product according to any one of Items 1 to 30 above as an optical sensor.
35. Use of the pressed molded product according to any one of Items 1 to 30 above as a light emitting material.
36. The following general formula (1) composed of cation A, anion X and anion Y:
AXY (1)
A method for producing a pressed molded product by press molding a pressed raw material containing particles of a metal composite anion compound represented by.
(1) 96 to 100 mol% of the cation A is a Group 15 elemental cation.
(2) The anion X is a group 16 element anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(3) The anion Y is a Group 17 elemental anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(4) The pressing molding is performed by applying a pressing pressure of 0.1 MPa to 20 MPa for 1 second to 20 hours in an atmospheric pressure of 0.01 Pa to 2 MPa under a temperature condition of 0 to 300 ° C.
A method for producing a pressed molded product.
37. Item 3. The production method according to Item 36, which is the method for producing a pressed molded product according to any one of Items 1 to 30.
38. Item 3. The manufacturing method according to Item 36 or 37, wherein the pressing molding is performed in a state where the pressed raw material is sandwiched between inorganic plate materials.
39. The production method according to any one of Items 36 to 38 above, wherein the temperature condition is 20 to 200 ° C.
40. Item 6. The production method according to any one of Items 36 to 39, wherein the pressing pressure is 0.6 MPa to 10 MPa.
41. The production method according to any one of Items 36 to 40 above, wherein the time for applying the pressing pressure is 10 seconds to 10 hours.
42. The production method according to any one of Items 36 to 41 above, wherein the pressure molding is performed so as to form a thin film.
本発明の押圧成形物は、特定の金属複合アニオン化合物の粒子を含有する被押圧原料の押圧成形物であり、原料粒子が調製容易であることに加えて、押圧成形物は粒子間の結着が促進されているため、押圧成形物中に含まれる粒子間の粒界抵抗が効果的に減少されている。粒子間の粒界抵抗の減少は、例えば、押圧成形物を半導体材料として用いる場合に光励起電子の移動特性の向上、光電気化学特性の向上等をもたらす。 The pressed molded product of the present invention is a pressed molded product of a pressed raw material containing particles of a specific metal composite anion compound, and in addition to being easy to prepare the raw material particles, the pressed molded product is bonded between the particles. Is promoted, so that the intergranular resistance between the particles contained in the pressed molded product is effectively reduced. The reduction of the intergranular resistance between the particles brings about, for example, an improvement in the transfer characteristics of photoexcited electrons and an improvement in photoelectrochemical characteristics when the pressed molded product is used as a semiconductor material.
このような本発明の押圧成形物は、例えば、薄膜の形態であり、必要に応じて導電性材料、p型半導体等と接触する態様で、太陽光エネルギーを電気エネルギーや化学エネルギーに変換する用途、具体的には、水を光分解することにより化学エネルギーとして水素を得る光触媒や光電極、太陽光エネルギーを電気エネルギーに変換する光電極(太陽電池、光センサー等)等を構成する材料として有用である。その他、磁性材料、光学材料にも適用することができる。 Such a pressed molded product of the present invention is, for example, in the form of a thin film, and is used for converting solar energy into electrical energy or chemical energy in a mode of contacting with a conductive material, a p-type semiconductor, or the like, if necessary. Specifically, it is useful as a material for constituting photocatalysts and photoelectrodes that obtain hydrogen as chemical energy by photodecomposing water, and photoelectrodes (solar cells, optical sensors, etc.) that convert solar energy into electrical energy. Is. In addition, it can be applied to magnetic materials and optical materials.
1.本発明の押圧成形物
本発明の押圧成形物は、カチオンA、アニオンX及びアニオンYから構成される下記一般式(1):
AXY (1)
で示される金属複合アニオン化合物の粒子を含有する押圧成形物であって、
(1)前記カチオンAのうち96〜100モル%が第15族元素カチオンであり、
(2)前記アニオンXは第16族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(3)前記アニオンYは第17族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(4)前記粒子の結晶子径が28nm以上であり、
(5)前記押圧成形物の押圧方向の断面における、幅10μmの範囲の厚さの差が1μm以内である、
ことを特徴とする。
1. 1. Press-molded article of the present invention The press-molded article of the present invention is composed of the following general formula (1): anion A, anion X and anion Y:
AXY (1)
A pressed molded product containing particles of a metal composite anion compound represented by.
(1) 96 to 100 mol% of the cation A is a Group 15 elemental cation.
(2) The anion X is a group 16 elemental anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(3) The anion Y is a Group 17 elemental anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(4) The crystallite diameter of the particles is 28 nm or more,
(5) The difference in thickness in the width range of 10 μm in the cross section of the pressed molded product in the pressing direction is within 1 μm.
It is characterized by that.
上記特徴を有する本発明の押圧成形物は、特定の金属複合アニオン化合物の粒子を含有する被押圧原料の押圧成形物であり、原料粒子が調製容易であることに加えて、押圧成形物は粒子間の結着が促進されているため、押圧成形物中に含まれる粒子間の粒界抵抗が効果的に減少されている。粒子間の粒界抵抗の減少は、例えば、押圧成形物を半導体材料として用いる場合に光励起電子の移動特性の向上、光電気化学特性の向上等をもたらす。 The pressed molded product of the present invention having the above characteristics is a pressed molded product of a pressed raw material containing particles of a specific metal composite anion compound. In addition to being easy to prepare the raw material particles, the pressed molded product is a particle. Since the binding between the particles is promoted, the intergranular resistance between the particles contained in the pressed compact is effectively reduced. The reduction of the intergranular resistance between the particles brings about, for example, an improvement in the transfer characteristics of photoexcited electrons and an improvement in photoelectrochemical characteristics when the pressed molded product is used as a semiconductor material.
なお、上記「光電気化学特性の向上」とは、例えば、後述の電解液中での電位−電流曲線における光照射時の光電流密度の増加などにより評価できる。また、「光励起電子の移動特性の向上」とは、例えば、後述の押圧成形物を透明電極上に固定し、この透明電極側から光照射した場合と押圧成形物側から光照射した場合との光電気化学特性の比較などから評価できる。光電気化学特性、又は光励起電子の移動特性の向上から粒界抵抗の減少が観測されることが好ましく、光電気化学特性、及び光励起電子の移動特性の向上から粒界抵抗の減少が観測されることがさらに好ましい。また、上記「粒子間の粒界抵抗の減少」とは、例えば、薄膜から構成される電極の場合、基板近傍から対岸の材料表面へのマクロスケール範囲の効果と、主に基板近傍で観測されるミクロスケールのものとの両方などを意味する。 The above-mentioned "improvement of photoelectrochemical properties" can be evaluated by, for example, an increase in the photocurrent density at the time of light irradiation in the potential-current curve in the electrolytic solution described later. Further, "improvement of transfer characteristics of photoexcited electrons" means, for example, a case where a pressed molded product described later is fixed on a transparent electrode and light is irradiated from the transparent electrode side and a case where light is irradiated from the pressed molded product side. It can be evaluated from the comparison of photoelectrochemical properties. It is preferable to observe a decrease in grain boundary resistance from the improvement of photoelectrochemical properties or transfer characteristics of photoexcited electrons, and a decrease in grain boundary resistance is observed from the improvement of photoelectrochemical properties and transfer characteristics of photoexcited electrons. Is even more preferable. Further, the above-mentioned "reduction of grain boundary resistance between particles" is observed, for example, in the case of an electrode composed of a thin film, the effect of the macroscale range from the vicinity of the substrate to the surface of the material on the opposite bank and the effect mainly in the vicinity of the substrate. It means both micro-scale and so on.
発明者らは、特段に理論に拘束されることを欲さないが、上記「粒界抵抗の減少」は、例えば下記のようなメカニズムにより生じると推測する。 Although the inventors do not want to be bound by theory, it is presumed that the above-mentioned "decrease in grain boundary resistance" is caused by, for example, the following mechanism.
つまり、AXY(カチオンAのうち96〜100モル%が第15族元素カチオン、アニオンXは第16族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%、アニオンYは第17族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%)で示される金属複合アニオン化合物の粒子を含有する被押圧原料を押圧成形することによって、押圧成形物中の粒子のパッキング(例えば、単位体積中の粒子の密度など)の向上、粒子の結晶構造の変化(例えば、結晶配向の変化など)等が生じ、その結果、粒子間の粒界抵抗が減少すると推測する。 That is, AXY (96 to 100 mol% of cation A is a group 15 element cation, anion X is a group 16 element anion, the amount is 35 to 65 mol% of the total amount of anions, and anion Y is the 17th. Packing of particles in a press-molded product by press-molding a pressed raw material containing particles of a metal composite anion compound represented by a group element anion, the amount of which is 35 to 65 mol% of the total amount of anions). It is presumed that (for example, the density of particles in a unit volume) is improved, the crystal structure of the particles is changed (for example, the crystal orientation is changed), and the like, and as a result, the intergranular resistance between the particles is reduced.
例えば、押圧成形物中の粒子のパッキングの変化は、結晶配向の変化や、押圧前後の成形体の形態の変化により観測される。前記成形体の形態の変化は、具体的には、押圧成形処理を施した表面の平坦化、成形体の断面図などであり、電子顕微鏡(例えば、SEMなど)などで観測することもできる。また、結晶構造の変化は、XRDなどにより評価することができ、特定の配向面((001)面、(200)面等)についての回折ピークの比から、配向性の変化を評価することができる。 For example, a change in the packing of particles in a pressed molded product is observed by a change in crystal orientation and a change in the morphology of the molded product before and after pressing. Specifically, the change in the form of the molded product is a flattening of the surface subjected to the pressure molding treatment, a cross-sectional view of the molded product, or the like, and can be observed with an electron microscope (for example, SEM or the like). Further, the change in the crystal structure can be evaluated by XRD or the like, and the change in the orientation can be evaluated from the ratio of the diffraction peaks on a specific orientation plane ((001) plane, (200) plane, etc.). it can.
このような本発明の押圧成形物は、例えば、薄膜の形態であり、必要に応じて導電性材料、p型半導体等と接触する態様で、太陽光エネルギーを電気エネルギーや化学エネルギーに変換する用途、具体的には、水を光分解することにより化学エネルギーとして水素を得る光触媒や光電極、太陽光エネルギーを電気エネルギーに変換する光電極(太陽電池、光センサー等)等を構成する材料として有用である。その他、磁性材料、光学材料にも適用することができる。 Such a pressed molded product of the present invention is, for example, in the form of a thin film, and is used for converting solar energy into electrical energy or chemical energy in a mode of contacting with a conductive material, a p-type semiconductor, or the like, if necessary. Specifically, it is useful as a material for constituting photocatalysts and photoelectrodes that obtain hydrogen as chemical energy by photodecomposing water, and photoelectrodes (solar cells, optical sensors, etc.) that convert solar energy into electrical energy. Is. In addition, it can be applied to magnetic materials and optical materials.
本発明の押圧成形物に含まれる金属複合アニオン化合物の粒子は、カチオンA、アニオンX及びアニオンYから構成される下記一般式(1):
AXY (1)
で示される化合物である。
The particles of the metal composite anion compound contained in the pressed molded product of the present invention are composed of the following general formula (1): anion A, anion X and anion Y:
AXY (1)
It is a compound indicated by.
上記カチオンAは、その96〜100モル%が第15族元素カチオンであり、その中でも第15族元素カチオンの含有量は98〜100モル%が好ましく、99〜100モル%がより好ましい。第15族元素カチオンとしては限定的ではないが、例えば、ビスマス(Bi)カチオン、アンチモン(Sb)カチオン等が挙げられ、この中でもビスマスカチオンが好ましい。ビスマスカチオンは、第15族元素カチオンの中でも低融点、低硬度であるため押圧成形により粒子間の結着を促進し易く、粒子間の粒界抵抗を減少させ易いと考えられ、特に人体への害が少ない観点からも好ましい。 96 to 100 mol% of the cation A is a Group 15 elemental cation, and the content of the Group 15 elemental cation is preferably 98 to 100 mol%, more preferably 99 to 100 mol%. The Group 15 element cation is not limited, and examples thereof include bismuth (Bi) cation and antimony (Sb) cation, and bismuth cation is preferable among them. Since the bismuth cation has a low melting point and low hardness among the group 15 element cations, it is considered that the bismuth cation easily promotes the binding between particles by pressure molding and easily reduces the intergranular resistance between the particles, especially to the human body. It is also preferable from the viewpoint of less harm.
上記カチオンAは、第15族元素カチオン以外に有機分子カチオンを含有していてもよいが、耐熱性などの安定性の観点から、有機分子カチオンの含有量は4モル%未満であることが好ましく、その中でも3モル%以下が好ましく、1モル%以下がより好ましく、0.1モル%以下がさらに好ましく、0.01モル%以下が最も好ましい。有機分子カチオン含有量は、例えばTG−MASなどにより測定することができる。 The cation A may contain an organic molecular cation in addition to the group 15 elemental cation, but the content of the organic molecular cation is preferably less than 4 mol% from the viewpoint of stability such as heat resistance. Among them, 3 mol% or less is preferable, 1 mol% or less is more preferable, 0.1 mol% or less is further preferable, and 0.01 mol% or less is most preferable. The organic molecular cation content can be measured by, for example, TG-MAS.
上記アニオンXは第16族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%である。その中でも、アニオンXの量はアニオンの総量のうち40〜60モル%であることが好ましい。 The anion X is a group 16 elemental anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion. Among them, the amount of anion X is preferably 40 to 60 mol% of the total amount of anions.
第16族元素アニオンとしては限定的ではなく、酸素(O)アニオン、硫黄(S)アニオン、セレン(Se)アニオン、テルル(Te)アニオン等が挙げられる。この中でも共有結合性が高く、且つ比較的大きなイオン半径を有するため押圧成形により粒子間の結着を促進し易く、粒子間の粒界抵抗を減少させ易い観点から、新IUPACの周期表における第3周期以降の元素のアニオンであることが好ましい。例えば、硫黄アニオン、セレンアニオン、テルルアニオン等が好ましく、この中でも、人体への害が少ない観点から、硫黄アニオン、セレンアニオンがより好ましく、硫黄アニオンが最も好ましい。 The group 16 element anion is not limited, and examples thereof include an oxygen (O) anion, a sulfur (S) anion, a selenium (Se) anion, and a tellurium (Te) anion. Among these, since it has a high covalent bond and has a relatively large ionic radius, it is easy to promote the binding between particles by pressure molding, and it is easy to reduce the intergranular resistance between particles. It is preferably an anion of the element after 3 cycles. For example, sulfur anion, selenium anion, tellurium anion and the like are preferable, and among them, sulfur anion and selenium anion are more preferable, and sulfur anion is most preferable from the viewpoint of less harm to the human body.
上記アニオンYは第17族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%である。その中でも、アニオンYの量はアニオンの総量のうち40〜60モル%であることが好ましい。 The anion Y is a group 17 elemental anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion. Among them, the amount of anion Y is preferably 40 to 60 mol% of the total amount of anions.
第17族元素アニオンとしては限定的ではないが、新IUPACの周期表における第4周期以降の元素のアニオンであることが好ましく、例えば、臭素(Br)アニオン、ヨウ素(I)アニオン等が挙げられ、この中でもヨウ素アニオンがより好ましい。 The group 17 element anion is not limited, but is preferably an anion of an element from the 4th period onward in the periodic table of the new IUPAC, and examples thereof include a bromine (Br) anion and an iodine (I) anion. Of these, iodine anion is more preferable.
上記金属複合アニオン化合物の粒子の結晶子径は28nm以上であればよい。押出成形体の欠陥を少なくすることに有利である観点から、上記金属複合アニオン化合物の粒子の結晶子径は40nm以上であることが好ましい。また、緻密に押出成形体を形成することに有利である観点から、1μm以下であることが好ましく、500nm以下であることがより好ましい。 The crystallite diameter of the particles of the metal composite anion compound may be 28 nm or more. From the viewpoint of being advantageous in reducing defects in the extruded product, the crystallite diameter of the particles of the metal composite anion compound is preferably 40 nm or more. Further, from the viewpoint of being advantageous in forming an extruded molded product precisely, it is preferably 1 μm or less, and more preferably 500 nm or less.
また、粒子の結晶構造は斜方晶であることが好ましく、PDF:00−043−0652、01−075−1811、00−010−0445のいずれかであることが好ましい。更に、粒子の結晶相は単一結晶相であることが好ましい。 The crystal structure of the particles is preferably orthorhombic, and is preferably any of PDF: 00-043-0652, 01-075-1811, 00-010-0445. Further, the crystal phase of the particles is preferably a single crystal phase.
より詳細には、粒子の結晶構造が上記PDF:00−043−0652の場合には、金属複合アニオン化合物の(110)結晶面と(002)結晶面との配向比(110)/(002)が2.0以上であることが好ましく、2.2以上であることがより好ましく、2.4以上であることがさらに好ましい。上記PDF:01−075−1811の場合には、金属複合アニオン化合物の(110)結晶面と(121)結晶面との配向比(110)/(121)が1.0以上であることが好ましい。また、上記PDF:00−010−0445の場合には、金属複合アニオン化合物の(110)結晶面と(200)結晶面との配向比(110)/(200)が15以上であることが好ましく、18以上であることがより好ましく、20以上であることがさらに好ましい。なお、PDF:00−043−0652の場合にはBiSIが、PDF:01−075−1811の場合にはBiSBrが、PDF:00−010−0445の場合にはBiOIがそれぞれ代表的なものとして該当するが、これらに限定されるものではない。 More specifically, when the crystal structure of the particles is PDF: 00-043-0652, the orientation ratio of the (110) crystal plane to the (002) crystal plane of the metal composite anion compound (110) / (002). Is preferably 2.0 or more, more preferably 2.2 or more, and even more preferably 2.4 or more. In the case of the above PDF: 01-075-1811, the orientation ratio (110) / (121) of the metal composite anion compound between the (110) crystal plane and the (121) crystal plane is preferably 1.0 or more. .. Further, in the case of the above PDF: 00-010-0445, the orientation ratio (110) / (200) between the (110) crystal plane and the (200) crystal plane of the metal composite anion compound is preferably 15 or more. , 18 or more is more preferable, and 20 or more is further preferable. In the case of PDF: 00-043-0652, BiSI is representative, in the case of PDF: 01-075-1811, BiSBr is applicable, and in the case of PDF: 00-010-0445, BiOI is representative. However, it is not limited to these.
押圧成形によりa−b軸配向性が強くなることが有利である観点では、上記の中でもPDF:00−043−0652又は01−075−1811が好ましい。a−b軸配向性が強くなることによって、例えば、導電性材料と本発明の押圧成形物が接触している場合に、押圧成形物中のAカチオンと第16族元素アニオンとのユニットによる導電性材料への接続が形成し易くなり、Bi−第16族元素アニオンユニットからハロゲンアニオンへの電子の移動よりも、Bi−第16族元素アニオンユニット内での電子移動の方が有利である可能性があるため、電子や正孔の導電性材料への拡散が有利になり、粒子間の粒界抵抗を減少、及び/又は電子の取り出し効率が向上する効果を奏する。具体的には、光電気化学特性を向上できる、及び/又は、光励起電子の移動特性を向上できるなどの効果を奏する。 Among the above, PDF: 00-043-0652 or 01-075-1811 is preferable from the viewpoint that it is advantageous that the ab-axis orientation is strengthened by pressure molding. By increasing the ab-axis orientation, for example, when the conductive material and the pressed molded product of the present invention are in contact with each other, the conductivity of the A cation and the group 16 element anion in the pressed molded product by the unit. It is easier to form connections to the sex material, and electron transfer within the Bi-16 group element anion unit may be more advantageous than electron transfer from the Bi-16 group element anion unit to the halogen anion. Due to the property, the diffusion of electrons and holes into the conductive material becomes advantageous, the grain boundary resistance between the particles is reduced, and / or the efficiency of taking out electrons is improved. Specifically, it has the effect of improving the photoelectrochemical properties and / or the transfer characteristics of photoexcited electrons.
押圧成形によりc軸配向性が強くなることが有利である観点では、上記の中でもPDF:00−010−0445が好ましい。PDF:00−010−0445材料のc軸配向性が強くなることは、押圧成形物のパッキングをより密にすることに有利になるため、光励起電子の移動特性を向上させることに有利になる。また、基材上に押圧成形物が設けられている場合に、押圧成形物中のAカチオンとXアニオンとのユニットが基材と水平方向に連続して存在し易くなるため、基材との水平方向への電子及び/又は正孔の拡散に有利となる。そのため、電子及び/又は正孔の閉じ込めに優れるようになり、発光材料などに好適に利用できる。 Among the above, PDF: 00-010-0445 is preferable from the viewpoint that it is advantageous that the c-axis orientation is strengthened by press molding. The stronger c-axis orientation of the PDF: 00-010-0445 material is advantageous for making the packing of the pressed compact more dense, and thus is advantageous for improving the movement characteristics of photoexcited electrons. Further, when the pressed molded product is provided on the base material, the units of the A cation and the X anion in the pressed molded product are likely to be continuously present in the horizontal direction with the base material, so that the unit with the base material is easily present. It is advantageous for the diffusion of electrons and / or holes in the horizontal direction. Therefore, it becomes excellent in confinement of electrons and / or holes, and can be suitably used as a light emitting material or the like.
上記金属複合アニオン化合物としては、具体的に、BiOI、BiSI、BiSeI、BiOBr、BiSBr、BiSeBr、BiOCl、BiSCl、BiSeCl等の少なくとも一種が挙げられる。これらの中でも、BiOI、BiSI、BiOBr、BiSBr等の少なくとも一種が好ましく、BiSI及びBiSBrの少なくとも一種が最も好ましい。これらの金属複合アニオン化合物の粒子は、例えば、公知のスプレーパイロリシス法、気相成長法、水溶媒又は有機溶媒中でのソルボサーマル法等により合成することができる。 Specific examples of the metal composite anion compound include at least one such as BiOI, BiSI, BiSeI, BiOBr, BiSBr, BiSeBr, BiOCl, BiSCl, and BiSeCl. Among these, at least one of BiOI, BiSI, BiOBr, BiSBr and the like is preferable, and at least one of BiSI and BiSBr is most preferable. The particles of these metal composite anion compounds can be synthesized, for example, by a known spray pyrolysis method, vapor phase growth method, solvothermal method in an aqueous solvent or an organic solvent, or the like.
また、上記金属複合アニオン化合物の粒子の大きさは限定的ではないが、平均粒子径は0.01〜10μmが好ましく、0.1〜1μmがより好ましい。なお、本明細書における平均粒子径は、SEMによる観察により測定した値である。 The particle size of the metal composite anion compound is not limited, but the average particle size is preferably 0.01 to 10 μm, more preferably 0.1 to 1 μm. The average particle size in the present specification is a value measured by observation by SEM.
本発明の押圧成形物は、その表面が平坦化されていることが好ましく、押圧成形物の押圧方向の断面における、幅10μmの範囲の厚さの差が1μm以内である。この中でも当該厚さの差は500nm以内が好ましく、200nm以内がより好ましく、100nm以内が更に好ましい。なお、本明細書における当該厚さの差は、SEM観察により測定した値である。 The surface of the pressed molded product of the present invention is preferably flattened, and the difference in thickness in the width range of 10 μm in the cross section of the pressed molded product in the pressing direction is within 1 μm. Among these, the difference in thickness is preferably 500 nm or less, more preferably 200 nm or less, and even more preferably 100 nm or less. The difference in thickness in the present specification is a value measured by SEM observation.
本発明の押圧成形物は、所定の金属複合アニオン化合物の粒子を含有する原料(被押圧原料)を押圧成形したものであれば形態は限定的ではないが、光電極などの各用途に適用することを考慮すると薄膜の形態であることが好ましい。薄膜の膜厚は、0.5〜10.0μmが好ましく、その中でも0.9〜8.0μmがより好ましい。なお、本明細書における薄膜の膜厚は断面SEM観察により測定した値である。 The form of the press-molded product of the present invention is not limited as long as it is obtained by press-molding a raw material (pressed raw material) containing particles of a predetermined metal composite anion compound, but it is applied to various uses such as a photoelectrode. Considering this, the form of a thin film is preferable. The film thickness of the thin film is preferably 0.5 to 10.0 μm, and more preferably 0.9 to 8.0 μm. The film thickness of the thin film in the present specification is a value measured by cross-sectional SEM observation.
本発明の押圧成形物は、押圧成形によりa−b軸配向性が強くなることに有利である観点では、特に金属複合アニオン化合物の粒子がBiSI又はBiSBrであることが好ましい。a−b軸配向性が強くなることによって、例えば、導電性材料と本発明の押圧成形物が接触している場合に、押圧成形物中のビスマスカチオンと硫黄アニオンとのユニットによる導電性材料への接続が形成し易くなり、Bi−第16族元素アニオンユニットからハロゲンアニオンへの電子の移動よりも、Bi−第16族元素アニオンユニット内での電子移動の方が有利である可能性があり、電子や正孔の基板方向への拡散が有利になり、粒子間の粒界抵抗を減少、及び/又は電子の取り出し効率が向上する効果を奏する。具体的には、光電気化学特性を向上できる、及び/又は、光励起電子の移動特性を向上できるなどの効果を奏する。 In the pressed molded product of the present invention, it is particularly preferable that the particles of the metal composite anion compound are BiSI or BiSBr from the viewpoint that it is advantageous that the ab axis orientation is strengthened by the pressed molding. By increasing the ab-axis orientation, for example, when the conductive material and the pressed compact of the present invention are in contact with each other, the conductive material is formed by a unit of a bismuth cation and a sulfur anion in the pressed compact. It is possible that the electron transfer within the Bi-16 group element anion unit is more advantageous than the electron transfer from the Bi-16 group element anion unit to the halogen anion. , The diffusion of electrons and holes toward the substrate becomes advantageous, the grain boundary resistance between particles is reduced, and / or the efficiency of taking out electrons is improved. Specifically, it has the effect of improving the photoelectrochemical properties and / or the transfer characteristics of photoexcited electrons.
押圧成形によりc軸配向性が強くなることに有利である観点では、BiOIが好ましい。BiOI材料のc軸配向が強くなることは、押圧成形物のパッキングをより密にすることに有利になるため、光励起電子の移動特性の向上させることに有利になる。また、基材上に押圧成形物が設けられている場合に、押圧成形物中のビスマスカチオンと酸素アニオンとのユニットが基材と水平方向に連続して存在し易くなるため、基材との水平方向への電子又は正孔の拡散に有利となる。 BiOI is preferable from the viewpoint that it is advantageous to increase the c-axis orientation by pressing molding. The stronger c-axis orientation of the BiOI material is advantageous for making the packing of the pressed compact more dense, and thus is advantageous for improving the movement characteristics of photoexcited electrons. Further, when the pressure-molded product is provided on the base material, the unit of the bismuth cation and the oxygen anion in the pressure-molded product tends to be continuously present in the horizontal direction with the base material. It is advantageous for the diffusion of electrons or holes in the horizontal direction.
本発明の押圧成形物の用途は限定的ではないが、押圧成形物において金属複合アニオン化合物の粒子間の結着が促進されているため、押圧成形物中に含まれる粒子間の粒界抵抗が効果的に減少されている。よって、半導体材料(n型半導体)として利用することが好ましい。なお、半導体材料とは、価電子帯上端と伝導帯下端とのエネルギー差を有する材料などが挙げられる。 The application of the pressed molded product of the present invention is not limited, but since the binding of the metal composite anion compound between the particles is promoted in the pressed molded product, the intergranular resistance between the particles contained in the pressed molded product is increased. It has been effectively reduced. Therefore, it is preferable to use it as a semiconductor material (n-type semiconductor). Examples of the semiconductor material include a material having an energy difference between the upper end of the valence band and the lower end of the conduction band.
本発明の押圧成形物は、他の用途に用いることもできる。具体的には、電子又は正孔又はイオンを伝導する材料や、光吸収による光励起キャリアの生成を利用する材料、及びその再結合による発光を利用する材料などであり、より具体的には、太陽電池材料用、太陽電池の光吸収層用、光センサー用、光触媒用等の材料、更に発光材料、イオン伝導材料、導電性材料、圧電素子、パワーデバイスなどである。なお、イオンとは、各材料を構成するカチオン又はアニオンのことを指す。これらの用途の中でも、本発明の押圧成形物は、太陽光に含まれる光子のエネルギーを利用できる観点から、太陽電池の光吸収層用の化合物であることが好ましい。さらに、特定波長の光を利用できる観点から、光センサーとして利用することが好ましい。 The pressed molded product of the present invention can also be used for other purposes. Specifically, it is a material that conducts electrons, holes, or ions, a material that utilizes the generation of photoexcited carriers by light absorption, a material that utilizes light emission due to its recombination, and the like, and more specifically, the sun. Materials for battery materials, light absorption layers of solar cells, photosensors, photocatalysts, etc., as well as light emitting materials, ion conductive materials, conductive materials, piezoelectric elements, power devices and the like. The ion refers to a cation or anion constituting each material. Among these uses, the pressed molded product of the present invention is preferably a compound for the light absorption layer of a solar cell from the viewpoint that the energy of photons contained in sunlight can be utilized. Further, from the viewpoint that light of a specific wavelength can be used, it is preferable to use it as an optical sensor.
本発明の押圧成形物は、優れた光吸収特性を有するため、太陽電池セル(特に光吸収層に本発明の押圧成形物を用いた太陽電池セル)として適用することが好ましく、更に、光電流密度、開放電圧、フィルファクターの少なくとも一つを向上させることで、より太陽光変換効率を向上させることができる。 Since the pressed molded product of the present invention has excellent light absorption characteristics, it is preferable to apply it as a solar cell (particularly, a solar cell using the pressed molded product of the present invention in the light absorption layer), and further, a photocurrent By improving at least one of the density, open circuit voltage, and fill factor, the solar conversion efficiency can be further improved.
本発明の押圧成形物は、キャリア移動の異方性に優れる観点から、電子輸送材(いわゆる導電性材料)と接触していることが好ましい。ここでいう電子輸送材とは、電子の有効質量の方が、正孔のものよりも小さい半導体などであり、電子の輸送に有利な材料などである。本発明の押圧成形物が薄膜のとき、接触面積を大きくすることで電子の移動に有利となる観点から、接触している電子輸送材も薄膜であることが好ましい。 The pressed molded product of the present invention is preferably in contact with an electron transporting material (so-called conductive material) from the viewpoint of excellent anisotropy of carrier movement. The electron transporting material referred to here is a semiconductor or the like in which the effective mass of electrons is smaller than that of holes, and is a material or the like that is advantageous for transporting electrons. When the pressed molded product of the present invention is a thin film, it is preferable that the electron transporting material in contact is also a thin film from the viewpoint that increasing the contact area is advantageous for the movement of electrons.
電子輸送材には、有機物や無機物を含む態様が挙げられるが、強度が高いことで、本発明の押圧成形物と合わせた強度が高くなる観点から、電子輸送材は無機物を含むことが好ましく、物性の調整が比較的容易である観点から、金属化合物であることがより好ましい。大気中で比較的容易に製造、及び保存できる観点から、電子輸送材は金属酸化物であることがさらに好ましい。 Examples of the electron transport material include an organic substance and an inorganic substance. However, the electron transport material preferably contains an inorganic substance from the viewpoint of increasing the strength combined with the pressed molded product of the present invention due to its high strength. From the viewpoint that the physical properties can be adjusted relatively easily, the metal compound is more preferable. From the viewpoint of being relatively easy to manufacture and store in the atmosphere, the electron transport material is more preferably a metal oxide.
金属酸化物の具体例としては、以下に限定されないが、酸化チタン、酸化ニオブ、酸化タングステン、酸化錫、酸化アルミニウム、酸化ケイ素、酸化マグネシウム、酸化銅、酸化モリブデンなどを挙げることができ、電子の有効質量が小さい観点から、酸化チタン及び酸化ニオブが好ましく、材料が豊富で安価である観点から、酸化チタンが好ましく、金属複合アニオン化合物に対し緻密に積層できる観点から、酸化銅、酸化モリブデンが好ましい。電子輸送材のピンホールなどの欠陥を少なくする観点から、電子輸送材に、前駆体材料を吸着、反応させる処理を施すことが好ましい。具体的には、塩化チタン種を電子輸送材に吸着後、加水分解させ酸化チタンを結着させる処理(TiCl4処理)を施すことが好ましい。 Specific examples of the metal oxide include, but are not limited to, titanium oxide, niobium oxide, tungsten oxide, tin oxide, aluminum oxide, silicon oxide, magnesium oxide, copper oxide, molybdenum oxide, and the like. Titanium oxide and niobium oxide are preferable from the viewpoint of small effective mass, titanium oxide is preferable from the viewpoint of abundant materials and low cost, and copper oxide and molybdenum oxide are preferable from the viewpoint of being able to be densely laminated with a metal composite anion compound. .. From the viewpoint of reducing defects such as pinholes in the electron transport material, it is preferable that the electron transport material is subjected to a treatment of adsorbing and reacting the precursor material. Specifically, it is preferable to perform a treatment (TiCl 4 treatment) of adsorbing the titanium chloride species on the electron transport material and then hydrolyzing it to bind titanium oxide.
本発明の押圧成形物は、キャリア移動の異方性に優れる観点から、正孔輸送材(いわゆるp型半導体)と接触していることが好ましい。ここでいう正孔輸送材とは、正孔の有効質量の方が電子のものよりも小さい半導体などであり、正孔の輸送に有利な材料などである。本発明の押圧成形物が薄膜のとき、接触面積を大きくすることで電子の移動に有利となる観点から、接触している正孔輸送材も薄膜であることが好ましい。正孔輸送材は、有機物や無機物を含むことが挙げられるが、材料が柔らかいことで、曲りによる膜の欠陥を形成しにくくなる観点から、正孔輸送材は有機物を含むことが好ましく、有機物の具体例としては、有機分子の集合体や、有機高分子が挙げられる。より具体的には、Spiro−OMeTAD、P3HT、PTAA、TPD、NPD、TCTAなどが挙げられ、キャリア密度を高くでき、正孔の輸送に有利とできることや、起電圧を大きくできる観点から、Spiro−OMeTADが好ましい。Spiro−OMeTADはLiTFSIや酸化材を混合するなどして、ドープ処理を施したものが、導電性に優れる観点から好ましい。 The pressed molded product of the present invention is preferably in contact with a hole transport material (so-called p-type semiconductor) from the viewpoint of excellent anisotropy of carrier movement. The hole transporting material referred to here is a semiconductor or the like in which the effective mass of holes is smaller than that of electrons, and is a material or the like that is advantageous for transporting holes. When the pressed molded product of the present invention is a thin film, it is preferable that the hole transporting material in contact is also a thin film from the viewpoint that increasing the contact area is advantageous for the movement of electrons. The hole transport material may contain an organic substance or an inorganic substance. However, from the viewpoint that the soft material makes it difficult to form film defects due to bending, the hole transport material preferably contains an organic substance, and is an organic substance. Specific examples include aggregates of organic molecules and organic polymers. More specifically, Spiro-OMeTAD, P3HT, PTAA, TPD, NPD, TCTA, etc. can be mentioned, and Spiro- can be increased in carrier density, can be advantageous for hole transport, and can increase electromotive voltage. OMeTAD is preferred. As the Spiro-OMeTAD, one that has been doped by mixing LiTFSI or an oxidizing material is preferable from the viewpoint of excellent conductivity.
2.本発明の押圧成形物の製造方法
本発明の押圧成形物の製造方法は、カチオンA、アニオンX及びアニオンYから構成される下記一般式(1):
AXY (1)
で示される金属複合アニオン化合物の粒子を含有する被押圧原料を押圧成形することにより押圧成形物を製造する方法であって、
(1)前記カチオンAのうち96〜100モル%が第15族元素カチオンであり、
(2)前記アニオンXは第16族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(3)前記アニオンYは第17族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(4)0〜300℃の温度条件下、0.01Pa〜2MPaの雰囲気圧力中、0.1MPa〜20MPaの押圧圧力を1秒〜20時間印加することにより前記押圧成形を行う、
ことを特徴とする。
2. Method for Producing Pressed Mold of the Present Invention The method for producing a pressed molded product of the present invention is composed of the following general formula (1):
AXY (1)
A method for producing a pressed molded product by press molding a pressed raw material containing particles of a metal composite anion compound represented by.
(1) 96 to 100 mol% of the cation A is a Group 15 elemental cation.
(2) The anion X is a group 16 element anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(3) The anion Y is a Group 17 elemental anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(4) The pressing molding is performed by applying a pressing pressure of 0.1 MPa to 20 MPa for 1 second to 20 hours in an atmospheric pressure of 0.01 Pa to 2 MPa under a temperature condition of 0 to 300 ° C.
It is characterized by that.
上記本発明の押圧成形物の製造方法は、前述した一般式(1)で示される金属複合アニオン化合物の粒子を原料(被押圧原料)として使用し、それを上記(4)に規定する特定の押圧条件下で押圧成形することを特徴とする。金属複合アニオン化合物の粒子の説明については前述と同じであるためここでは省略する。 In the method for producing a pressed molded product of the present invention, particles of the metal composite anion compound represented by the above-mentioned general formula (1) are used as a raw material (pressed raw material), and the specific particles specified in (4) above are used. It is characterized in that it is pressed and molded under pressing conditions. Since the description of the particles of the metal composite anion compound is the same as described above, it is omitted here.
本発明の押圧成形物の製造方法における押圧条件は、0〜300℃の温度条件下、0.01Pa〜2MPaの雰囲気圧力中、0.1MPa〜20MPaの押圧圧力を1秒〜20時間印加することにより被押圧原料を押圧成形するものであればよい。 The pressing condition in the method for producing a pressed molded product of the present invention is to apply a pressing pressure of 0.1 MPa to 20 MPa for 1 second to 20 hours in an atmospheric pressure of 0.01 Pa to 2 MPa under a temperature condition of 0 to 300 ° C. Any material may be used as long as the material to be pressed is pressed and molded.
その中でも、温度条件は20〜200℃が好ましく、雰囲気圧力条件は0.1Pa〜1MPaが好ましく、大気圧がより好ましい。また、押圧圧力条件は0.6〜10MPaが好ましく、2〜8MPaがより好ましい。押圧圧力を印加する時間条件は10秒〜10時間が好ましく、1分以上5時間以内がより好ましい。なお、上記雰囲気圧力は、絶対圧として記載されている。本発明では特に温度条件は0〜300℃の範囲から比較的低温(50℃程度まで)の条件を採用することもできるため、プラスチック基材などの高温処理を回避すべき可撓性基材上に押圧成形物を形成する用途にも適用することができる。 Among them, the temperature condition is preferably 20 to 200 ° C., the atmospheric pressure condition is preferably 0.1 Pa to 1 MPa, and the atmospheric pressure is more preferable. The pressing pressure condition is preferably 0.6 to 10 MPa, more preferably 2 to 8 MPa. The time condition for applying the pressing pressure is preferably 10 seconds to 10 hours, more preferably 1 minute or more and 5 hours or less. The atmospheric pressure is described as an absolute pressure. In the present invention, the temperature condition can be particularly low from 0 to 300 ° C. to a relatively low temperature (up to about 50 ° C.), so that on a flexible base material such as a plastic base material, which should avoid high temperature treatment It can also be applied to the application of forming a pressure molded product.
なお、押圧成形は公知のプレス機(例えば、公知のホットプレス機)を用いて行うことができるが、被押圧原料を無機系板材で挟持した状態で押圧成形することが好ましい。例えば、電極などを作製する場合には、FTO基材のような無機系板材に被押圧原料を電気泳動法、ペースト(スラリー)塗付乾燥法、スクリーン印刷法等の公知の方法により堆積させ、その上に更に石英板などの無機系板材を置いて被押圧原料を無機系板材で挟持した状態で押圧成形する態様が挙げられる。 Although the press molding can be performed using a known press machine (for example, a known hot press machine), it is preferable to perform the press molding with the material to be pressed sandwiched between the inorganic plate materials. For example, in the case of producing electrodes and the like, the pressed raw material is deposited on an inorganic plate material such as an FTO base material by a known method such as an electrophoresis method, a paste (slurry) coating drying method, or a screen printing method. An embodiment in which an inorganic plate material such as a quartz plate is further placed on the plate material and the pressed raw material is sandwiched between the inorganic plate materials is press-molded.
なお、押圧成形する際に、上記のようにFTO基材上に押圧成形物を形成する場合は、石英板などの無機系板材を置いて被押圧原料を押圧成形すればよいが、被押圧原料と石英板との間に銅板(酸化銅を含んでもよい)、モリブデン板(酸化モリブデンを含んでもよい)等の特定の金属板(導電性材料となり得る金属板)を挟みこんで共に押圧処理する、又は石英板などを設置せずに、無機系板材として銅板(酸化銅を含んでもよい)、モリブデン板(酸化モリブデンを含んでもよい)等の特定の金属板(導電性材料となり得る金属板)を被押圧原料に接触させることにより押圧成形物を当該金属板の方に転写させて、本発明の押圧成形物と導電性材料との積層体を押圧成形及び転写により同時に作製することができる。よって、本明細書における無機系板材には、石英板などの押圧手段のみとしての無機系板材と、押圧手段且つ導電性材料となり得る、押圧時に転写により押圧成形物との積層体を同時に作製可能な金属板(銅板、モリブデン板等)の両方が包含されている。 In addition, in the case of forming the pressure-molded product on the FTO base material at the time of pressure-molding, an inorganic plate material such as a quartz plate may be placed and the pressure-molded raw material may be pressure-molded. A specific metal plate (a metal plate that can be a conductive material) such as a copper plate (which may contain copper oxide) or a molybdenum plate (which may contain molybdenum oxide) is sandwiched between the metal plate and the quartz plate and pressed together. , Or a specific metal plate (a metal plate that can be a conductive material) such as a copper plate (which may contain copper oxide) or a molybdenum plate (which may contain molybdenum oxide) as an inorganic plate material without installing a quartz plate or the like. The pressed molded product can be transferred to the metal plate by contacting the pressed raw material, and a laminate of the pressed molded product of the present invention and the conductive material can be simultaneously produced by pressure molding and transfer. Therefore, as the inorganic plate material in the present specification, it is possible to simultaneously produce a laminate of an inorganic plate material such as a quartz plate as a pressing means only and a pressed molded product by transfer during pressing, which can be a pressing means and a conductive material. Both metal plates (copper plate, molybdenum plate, etc.) are included.
また、前記転写時に押圧成形物に緻密に接触した、半導体材料、例えば、p型半導体材料などの酸化銅、硫化銅、又は酸化モリブデンを形成することができ、ヘテロ接合による電荷分離に有利とすることができる。押圧成形物を緻密に転写できる観点から、銅板(酸化銅を含んでもよい)、モリブデン板(酸化モリブデンを含んでもよい)が好ましく、銅板(酸化銅を含んでもよい)が最も好ましい。また、この転写は、緻密に転写できる観点から、金属複合アニオン化合物はBiSI,BiSBr,BiOIが好ましく、BiSI,BiSBrがより好ましく、BiSIが最も好ましい。 Further, it is possible to form a semiconductor material, for example, copper oxide, copper sulfide, or molybdenum oxide such as a p-type semiconductor material, which is in close contact with the pressed molded product during the transfer, which is advantageous for charge separation by heterojunction. be able to. From the viewpoint of being able to transfer the pressed molded product precisely, a copper plate (which may contain copper oxide) and a molybdenum plate (which may contain molybdenum oxide) are preferable, and a copper plate (which may contain copper oxide) is most preferable. Further, in this transfer, from the viewpoint of being able to transfer precisely, the metal composite anion compound is preferably BiSI, BiSBr, BiOI, more preferably BiSI, BiSBr, and most preferably BiSI.
このように無機系板材で挟持した状態で押圧成形することにより、粒子間の結着を促進し粒子間の粒界抵抗を効果的に減少させることができ、押圧成形物を例えば半導体材料として用いる場合には光励起電子の移動特性の向上、光電気化学特性の向上等の効果が得られる。他方、金属複合アニオン化合物によりも硬度の小さいテフロン(登録商標)シートのような樹脂シートで挟持した状態で押圧成形する場合には、押圧成形後に樹脂シートを除去する際に同時に金属複合アニオン化合物の粒子が剥離するおそれがあるため好ましくない。よって、上記無機系板材は、金属複合アニオン化合物によりも硬度の大きいそれ自体が可撓性を有さない板材であることが好ましい。また、本発明では石英板などで押圧成形することにより、例えばFTO基材などに電気泳動法などにより金属複合アニオン化合物の粒子を堆積した場合と比較して、粒子とFTO基材などとの密着性を高めることもできる。 By press-molding while sandwiched between inorganic plate materials in this way, binding between particles can be promoted and grain boundary resistance between particles can be effectively reduced, and the press-molded product is used as, for example, a semiconductor material. In this case, effects such as improvement of the transfer characteristics of photoexcited electrons and improvement of photoelectrochemical characteristics can be obtained. On the other hand, in the case of press molding while sandwiched between resin sheets such as Teflon (registered trademark) sheet, which has a lower hardness than the metal composite anion compound, the metal composite anion compound is simultaneously removed when the resin sheet is removed after the press molding. It is not preferable because the particles may peel off. Therefore, it is preferable that the inorganic plate material has a hardness higher than that of the metal composite anion compound and is not flexible in itself. Further, in the present invention, by press-molding with a quartz plate or the like, the particles adhere to the FTO base material or the like as compared with the case where the particles of the metal composite anion compound are deposited on the FTO base material or the like by electrophoresis or the like. It can also enhance sex.
押圧成形は、押圧成形により得られる押圧成形物の形態に応じて、押圧成形条件を適宜調整すればよく、最終的な押圧成形物に高い形態自由度を持たせることができる。例えば、押圧成形物を電極などの用途に適用する場合は、薄膜の形態となるように押圧成形を行うことが好ましい。その場合には、押圧成形物(薄膜)の膜厚が0.5〜10.0μm程度、特に0.9〜8.0μmとなるように押圧成形すればよい。 In the press molding, the press molding conditions may be appropriately adjusted according to the form of the press molded product obtained by the press molding, and the final press molding can have a high degree of freedom in form. For example, when the pressed molded product is applied to an application such as an electrode, it is preferable to perform the pressed molding so as to form a thin film. In that case, the pressure-molded product (thin film) may be pressure-molded so that the film thickness is about 0.5 to 10.0 μm, particularly 0.9 to 8.0 μm.
以下、試験例を示して本発明を具体的に説明するが、本発明は試験例に限定されない。 Hereinafter, the present invention will be specifically described with reference to test examples, but the present invention is not limited to the test examples.
実施例で用いる金属複合アニオン化合物(BiOI粒子、BiSBr粒子及びBiSI粒子)は以下の手順により調製した。
<BiOI粒子>
3mmolのBi(NO3)・5H2Oを2.5mLのCH3COOHに溶解した。
The metal composite anion compound (BiOI particles, BiSBr particles and BiSI particles) used in the examples was prepared by the following procedure.
<BiOI particles>
3 mmol of Bi (NO 3 ) · 5H 2 O was dissolved in 2.5 mL of CH 3 COOH.
また、3mmolのNaIと6mmolのCH3COONaとを37.5mLのH2Oに溶解した。次いで、両溶液を混合して20分撹拌した。 Was also dissolved and CH 3 COONa of NaI and 6mmol of 3mmol of H 2 O 37.5 mL. Both solutions were then mixed and stirred for 20 minutes.
次いで、遠心分離による溶媒除去及び水洗を3回繰り返した。 Then, solvent removal by centrifugation and washing with water were repeated three times.
これにより、単一相のBiOI粒子を調製した。XRDにより、このBiOI粒子の平均粒子径は0.2μmであり、粒子の結晶子径は56nmであった。
<BiSI粒子>
上記BiOI粒子に対して60mL/分のH2S気流下で150℃、1時間かけて硫化を行った。これにより、単一相のBiSI粒子を調製した。このBiSI粒子の平均粒子径は0.2μmであり、粒子の結晶子径は70nmであった。
<BiSBr粒子>
3mmolのBi(NO3)・5H2Oを2.5mLのCH3COOHに溶解した。
As a result, single-phase BiOI particles were prepared. According to XRD, the average particle diameter of the BiOI particles was 0.2 μm, and the crystallite diameter of the particles was 56 nm.
<BiSI particles>
0.99 ° C. In H 2 S stream of 60 mL / min for the BiOI particles were sulfide over 1 hour. As a result, single-phase BiSI particles were prepared. The average particle size of the BiSI particles was 0.2 μm, and the crystallite diameter of the particles was 70 nm.
<BiSBr particles>
3 mmol of Bi (NO 3 ) · 5H 2 O was dissolved in 2.5 mL of CH 3 COOH.
また、3mmolのNaBrと6mmolのCH3COONaとを37.5mLのH2Oに溶解した。次いで、両溶液を混合して20分撹拌した。 Further, 3 mmol of NaBr and 6 mmol of CH 3 COONa were dissolved in 37.5 mL of H 2 O. Both solutions were then mixed and stirred for 20 minutes.
次いで、遠心分離による溶媒除去及び水洗を3回繰り返した。これにより、BiOBr粒子を調製した。 Then, solvent removal by centrifugation and washing with water were repeated three times. As a result, BiOBr particles were prepared.
上記BiOBr粒子に対して60mL/分のH2S気流下で150℃、1時間かけて硫化を行った。これにより単一相のBiSBr粒子を調製した。このBiSBr粒子の平均粒子径は0.2μmであり、粒子の結晶子径は78nmであった。 0.99 ° C. In H 2 S stream of 60 mL / min for the BiOBr particles were sulfide over 1 hour. As a result, single-phase BiSBr particles were prepared. The average particle size of the BiSBr particles was 0.2 μm, and the crystallite diameter of the particles was 78 nm.
試験例1(BiSI/FTO電極の作製とその特性評価)
(BiSI/FTO電極(ホットプレス(HP)処理前)の作製)
旭硝子製FTO基板(25mm×25mm×2mm)を準備した。
Test Example 1 (Preparation of BiSI / FTO electrode and evaluation of its characteristics)
(Preparation of BiSI / FTO electrode (before hot press (HP) treatment))
An Asahi Glass FTO substrate (25 mm × 25 mm × 2 mm) was prepared.
次いで10mg/mlのBiSI粒子の2−プロパノール溶液を超音波処理により懸濁させた懸濁液を準備した。 Then, a suspension in which a 2-propanol solution of 10 mg / ml BiSI particles was suspended by sonication was prepared.
次いで、上記懸濁液200mlをFTO基板に滴下して乾燥させた。この滴下及び乾燥処理は3回繰り返した。 Then, 200 ml of the above suspension was added dropwise to the FTO substrate and dried. This dropping and drying treatment was repeated 3 times.
次いで、FTO基板の露出部分を確保するために乾燥綿棒で粒子を除去した(9mm×25mm)。また、粒子を除去した部分を薄塩酸付綿棒でふき取った。 The particles were then removed with a dry cotton swab to ensure an exposed portion of the FTO substrate (9 mm x 25 mm). In addition, the portion from which the particles had been removed was wiped off with a cotton swab containing dilute hydrochloric acid.
次いで、50℃のホットプレートで20分加熱することにより、BiSI/FTO電極(HP処理前)を作製した。 Next, a BiSI / FTO electrode (before HP treatment) was prepared by heating on a hot plate at 50 ° C. for 20 minutes.
BiSI/FTO電極(HP処理前)の上面SEM像を図1に示す。また、同電極の断面SEM像を図2に示す。
(BiSI/FTO電極(HP処理後)の作製)
次いで、BiSI/FTO電極(HP処理前)上に石英板(25mm×25mm×2mm)を設置し、ホットプレス装置(SINTO製)にて温度50℃、雰囲気圧力大気圧、押圧圧力5MPa、押圧時間20分の条件で押圧成形した。これにより、BiSI/FTO電極(HP処理後)を作製した。
The upper surface SEM image of the BiSI / FTO electrode (before HP treatment) is shown in FIG. A cross-sectional SEM image of the electrode is shown in FIG.
(Preparation of BiSI / FTO electrode (after HP treatment))
Next, a quartz plate (25 mm × 25 mm × 2 mm) was placed on the BiSI / FTO electrode (before HP treatment), and the temperature was 50 ° C., atmospheric pressure atmospheric pressure, pressing pressure 5 MPa, and pressing time using a hot press device (manufactured by SINTO). Press molding was performed under the condition of 20 minutes. As a result, a BiSI / FTO electrode (after HP treatment) was produced.
BiSI/FTO電極(HP処理後)の上面SEM像を図3に示す。また、同電極の断面SEM像を図4に示す。
(BiSI/FTO電極(HP処理前後)の結晶構造)
HP処理前及び処理後の電極のXRD測定の結果、BiSIの結晶子径は、粒子のものと同じ70nmであった。また、この(110)面/(002)面の回折ピーク比は、HP処理により、1.9から2.4に増加し、a−b軸配向になったことが示された。
(BiSI/FTO電極(HP処理前後)の光電気化学特性)
次いで、BiSI/FTO電極(HP処理前後)について、下記に示す条件下で光電気化学特性を調べた。
・電解液:0.1M NaI/アセトニトリル
・走査速度:50mV/s
・電極面積:4cm2
・光源:ソーラーシミュレータ(100mW/cm2)1秒毎に間欠照射
光電気化学特性の測定結果を図5に示す。
(BiSI/FTO電極(HP処理前後)の光電気化学特性の光照射方向依存性)
光電気化学特性を調べるに際して、図15に模式的に示される通り、光が照射された側の近傍で多く光が吸収されるため、BiSI側から光照射する場合(Front Side)は基板側から光照射する場合(Back Side)と比べて、生成する多くの光励起電子の基板までの拡散距離が増加する。つまり、Front Sideから光照射する場合には光電気化学特性が低下する。
The upper surface SEM image of the BiSI / FTO electrode (after HP treatment) is shown in FIG. A cross-sectional SEM image of the electrode is shown in FIG.
(Crystal structure of BiSI / FTO electrode (before and after HP treatment))
As a result of XRD measurement of the electrodes before and after the HP treatment, the crystallite diameter of BiSI was 70 nm, which was the same as that of the particles. Further, it was shown that the diffraction peak ratio of the (110) plane / (002) plane was increased from 1.9 to 2.4 by the HP treatment, and the orientation was ab-axis.
(Photoelectrochemical characteristics of BiSI / FTO electrodes (before and after HP treatment))
Next, the photoelectrochemical properties of the BiSI / FTO electrodes (before and after HP treatment) were examined under the conditions shown below.
-Electrolytic solution: 0.1 M NaI / acetonitrile-Scanning speed: 50 mV / s
・ Electrode area: 4 cm 2
-Light source: Solar simulator (100 mW / cm 2 ) Intermittent irradiation every second The measurement results of photoelectrochemical characteristics are shown in FIG.
(Dependence of photoelectrochemical properties of BiSI / FTO electrodes (before and after HP treatment) on the light irradiation direction)
When investigating the photoelectrochemical properties, as schematically shown in FIG. 15, a large amount of light is absorbed in the vicinity of the side irradiated with light. Therefore, when light is irradiated from the BiSI side (Front Side), the light is emitted from the substrate side. Compared with the case of light irradiation (Back Side), the diffusion distance of many photoexcited electrons generated to the substrate is increased. That is, when light is irradiated from the Front Side, the photoelectrochemical properties are deteriorated.
そのため、HP処理後における上記低下率を比較することにより、光励起電子の移動特性について、HP処理による効果を評価することができる。つまり、HP処理前後で上記低下率が減少していれば、材料中でより効率的に電子の移動が行われていることを示しており、HP処理によって光励起電子の移動特性が向上していると評価することができる。 Therefore, by comparing the reduction rates after the HP treatment, it is possible to evaluate the effect of the HP treatment on the movement characteristics of the photoexcited electrons. That is, if the reduction rate decreases before and after the HP treatment, it means that the electrons are transferred more efficiently in the material, and the movement characteristics of the photoexcited electrons are improved by the HP treatment. Can be evaluated as.
光電気化学特性の光照射方向依存性の測定結果を図16及び下記表1に示す。
(考 察)
図1と図3との結果から明らかな通り、HP処理前ではBiSI粒子はその粒子形状を保ったままFTO電極上に堆積されているが、HP処理後は堆積物(被押圧原料)の一部が平坦化し、平坦化部分ではSEM像で粒子の粒界が見えない程度にBiSI粒子どうしが結着していた。なお、EDX測定により平坦化部分は平坦化する前と比べて組成変化がないことを確認した。また、図2と図4との結果から明らかな通り、HP処理前はBiSI粒子はFTO基板上に粗く堆積(堆積層の膜厚は5〜10μm)しているが、HP処理後は堆積層が平坦化して膜厚が3〜4μmに減少していた。図4からは、押圧成形物の押圧方向の断面における、幅10μmの範囲の厚さの差が1μm以内であることが分かった。また、XRDの結果により、HP処理によって、a−b軸配向になり、BiSI中のBi−Sユニットが基板へ接合しやすくなるように配向したことが示された。
The measurement results of the light irradiation direction dependence of the photoelectrochemical properties are shown in FIG. 16 and Table 1 below.
(Consideration)
As is clear from the results of FIGS. 1 and 3, BiSI particles are deposited on the FTO electrode while maintaining their particle shape before the HP treatment, but after the HP treatment, one of the deposits (pressed raw material). The part was flattened, and in the flattened part, BiSI particles were bound to each other to the extent that the grain boundaries of the particles could not be seen in the SEM image. In addition, it was confirmed by EDX measurement that the composition of the flattened portion did not change as compared with that before flattening. Further, as is clear from the results of FIGS. 2 and 4, BiSI particles are coarsely deposited on the FTO substrate before the HP treatment (the film thickness of the sedimentary layer is 5 to 10 μm), but after the HP treatment, the sedimentary layer is deposited. Flattened and the film thickness decreased to 3 to 4 μm. From FIG. 4, it was found that the difference in thickness in the width range of 10 μm in the cross section of the pressed molded product in the pressing direction was within 1 μm. In addition, the results of XRD showed that the HP treatment resulted in ab-axis orientation, and the Bi-S unit in BiSI was oriented so as to be easily bonded to the substrate.
図5のHP処理前後の電極に基板側から光照射した際の光電気化学特性の測定結果から明らかな通り、BiSI/FTO電極(HP処理後)は、BiSI/FTO電極(HP処理前)と比較して、光アノード電流が増大(例えば、0.3V vs.Ag/AgClにおいて約3〜4倍)することが明確に示されており、HP処理により粒子間の結着を促進しながら平坦化でき、粒子間の粒界抵抗を効果的に減少させることができたことが分かった。 As is clear from the measurement results of the photoelectrochemical properties when the electrodes before and after the HP treatment in FIG. 5 are irradiated with light from the substrate side, the BiSI / FTO electrodes (after the HP treatment) are the same as the BiSI / FTO electrodes (before the HP treatment). In comparison, it has been clearly shown that the photoanode current increases (eg, about 3-4 times at 0.3 V vs. Ag / AgCl) and is flattened while promoting the binding between particles by HP treatment. It was found that the intergranular resistance between particles could be effectively reduced.
また、図16の光電気化学特性の光照射方向依存性の測定結果によれば、下記表1に示されるようにHP処理前後において光電流密度比率が約2倍に増大しており、HP処理により光励起電子の移動特性が向上したことが分かった。 Further, according to the measurement result of the light irradiation direction dependence of the photoelectrochemical characteristics of FIG. 16, as shown in Table 1 below, the photocurrent density ratio increased about twice before and after the HP treatment, and the HP treatment It was found that the movement characteristics of the photoexcited electrons were improved.
試験例2(BiSBr/FTO電極の作製とその特性評価)
試験例1において、BiSI粒子をBiSBr粒子に換えた以外は試験例1と同様にしてBiSBr/FTO電極(HP処理前)及びBiSBr/FTO電極(HP処理後)を作製した。
Test Example 2 (Preparation of BiSBr / FTO electrode and evaluation of its characteristics)
In Test Example 1, a BiSBr / FTO electrode (before HP treatment) and a BiSBr / FTO electrode (after HP treatment) were prepared in the same manner as in Test Example 1 except that the BiSI particles were replaced with BiSBr particles.
HP処理前及び処理後の電極のXRD測定の結果、BiSBrの結晶子径は、粒子のものと同じ78nmであった。また、この(110)面/(121)面の回折ピーク比は、HP処理により、0.9から1.0に増加し、a−b軸配向になったことが示された。 As a result of XRD measurement of the electrodes before and after the HP treatment, the crystallite diameter of BiSBr was 78 nm, which was the same as that of the particles. Further, it was shown that the diffraction peak ratio of the (110) plane / (121) plane was increased from 0.9 to 1.0 by the HP treatment, and the orientation was ab-axis.
BiSBr/FTO電極(HP処理前)の上面SEM像を図6に示す。また、同電極の断面SEM像を図7に示す。 The upper surface SEM image of the BiSBr / FTO electrode (before HP treatment) is shown in FIG. A cross-sectional SEM image of the electrode is shown in FIG.
BiSBr/FTO電極(HP処理後)の上面SEM像を図8に示す。また、同電極の断面SEM像を図9に示す。 The upper surface SEM image of the BiSBr / FTO electrode (after HP treatment) is shown in FIG. A cross-sectional SEM image of the electrode is shown in FIG.
また、試験例1と同様に、BiSBr/FTO電極(HP処理前後)の光電気化学特性を調べた。その測定結果を図10に示す。 In addition, the photoelectrochemical properties of the BiSBr / FTO electrode (before and after HP treatment) were examined in the same manner as in Test Example 1. The measurement result is shown in FIG.
また、試験例1と同様に、BiSBr/FTO電極(HP処理前後)の光電気化学特性の光照射方向依存性を調べた。その測定結果を図17及び下記表2に示す。
(考 察)
図6と図8との結果から明らかな通り、HP処理前ではBiSBr粒子はその粒子形状を保ったままFTO電極上に堆積されているが、HP処理後は堆積物(被押圧原料)の一部が平坦化し、平坦化部分ではSEM像で粒子の粒界が見えない程度にBiSBr粒子どうしが結着していた。なお、EDX測定により平坦化部分は平坦化する前と比べて組成変化がないことを確認した。また、図7と図9との結果から明らかな通り、HP処理前はBiSBr粒子はFTO基板上に粗く堆積(堆積層の膜厚は4〜6μm)しているが、HP処理後は堆積層が平坦化して膜厚が2〜3μmに減少していた。図9からは、押圧成形物の押圧方向の断面における、幅10μmの範囲の厚さの差が1μm以内であることが分かった。また、XRDの結果により、HP処理によって、a−b軸配向になり、BiSBr中のBi−Sユニットが基板へ接合しやすくなるように配向したことが示された。
Further, as in Test Example 1, the dependence of the photoelectrochemical properties of the BiSBr / FTO electrode (before and after HP treatment) on the light irradiation direction was investigated. The measurement results are shown in FIG. 17 and Table 2 below.
(Consideration)
As is clear from the results of FIGS. 6 and 8, BiSBr particles are deposited on the FTO electrode while maintaining their particle shape before the HP treatment, but after the HP treatment, one of the deposits (material to be pressed). The portion was flattened, and in the flattened portion, BiSBr particles were bound to each other to the extent that the grain boundaries of the particles could not be seen in the SEM image. In addition, it was confirmed by EDX measurement that the composition of the flattened portion did not change as compared with that before flattening. Further, as is clear from the results of FIGS. 7 and 9, BiSBr particles are coarsely deposited on the FTO substrate before the HP treatment (the film thickness of the deposited layer is 4 to 6 μm), but after the HP treatment, the deposited layer is deposited. Flattened and the film thickness decreased to 2 to 3 μm. From FIG. 9, it was found that the difference in thickness in the width range of 10 μm in the cross section of the pressed molded product in the pressing direction was within 1 μm. In addition, the XRD results showed that the HP treatment resulted in ab-axis orientation, and the Bi-S unit in BiSBr was oriented so that it could be easily bonded to the substrate.
図10のHP処理前後の電極に基板側から光照射した際の光電気化学特性の測定結果から明らかな通り、BiSBr/FTO電極(HP処理後)は、BiSBr/FTO電極(HP処理前)と比較して、光アノード電流が増大(例えば、0.3V vs.Ag/AgClにおいて約2倍)することが明確に示されており、HP処理により粒子間の結着を促進しながら平坦化でき、粒子間の粒界抵抗を効果的に減少させることができたことが分かった。 As is clear from the measurement results of the photoelectrochemical properties when the electrodes before and after the HP treatment in FIG. 10 are irradiated with light from the substrate side, the BiSBr / FTO electrodes (after the HP treatment) are the BiSBr / FTO electrodes (before the HP treatment). In comparison, it has been clearly shown that the photoanode current increases (eg, about twice at 0.3 V vs. Ag / AgCl) and can be flattened while promoting the binding between particles by HP treatment. It was found that the intergranular resistance between particles could be effectively reduced.
また、図17の光電気化学特性の光照射方向依存性の測定結果によれば、下記表2に示されるようにHP処理前後において光電流密度比率が約2倍に増大しており、HP処理により光励起電子の移動特性が向上したことが分かった。 Further, according to the measurement result of the light irradiation direction dependence of the photoelectrochemical characteristics of FIG. 17, as shown in Table 2 below, the photocurrent density ratio increased about twice before and after the HP treatment, and the HP treatment It was found that the movement characteristics of the photoexcited electrons were improved.
試験例3(BiOI/FTO電極の作製とその特性評価)
試験例1において、BiSI粒子をBiOI粒子に換えた以外は試験例1と同様にしてBiOI/FTO電極(HP処理前)及びBiOI/FTO電極(HP処理後)を作製した。
Test Example 3 (Preparation of BiOI / FTO electrode and evaluation of its characteristics)
In Test Example 1, a BiOI / FTO electrode (before HP treatment) and a BiOI / FTO electrode (after HP treatment) were produced in the same manner as in Test Example 1 except that the BiSI particles were replaced with BiOI particles.
HP処理前及び処理後の電極のXRD測定の結果、BiOIの結晶子径は、粒子のものと同じ56nmであった。また、この(001)面/(200)面の回折ピーク比は、HP処理により、11から21に増加し、c軸配向になったことが示された。 As a result of XRD measurement of the electrodes before and after the HP treatment, the crystallite diameter of BiOI was 56 nm, which was the same as that of the particles. Further, it was shown that the diffraction peak ratio of the (001) plane / (200) plane was increased from 11 to 21 by the HP treatment, and the c-axis orientation was obtained.
BiOI/FTO電極(HP処理前)の上面SEM像を図11に示す。また、同電極の断面SEM像を図12に示す。 The upper surface SEM image of the BiOI / FTO electrode (before HP treatment) is shown in FIG. A cross-sectional SEM image of the electrode is shown in FIG.
BiOI/FTO電極(HP処理後)の上面SEM像を図13に示す。また、同電極の断面SEM像を図14に示す。 The upper surface SEM image of the BiOI / FTO electrode (after HP treatment) is shown in FIG. A cross-sectional SEM image of the electrode is shown in FIG.
また、試験例1と同様に、BiOI/FTO電極(HP処理前後)の光電気化学特性を調べた(図なし)。 Moreover, the photoelectrochemical characteristics of the BiOI / FTO electrode (before and after HP treatment) were examined in the same manner as in Test Example 1 (not shown).
また、試験例1と同様に、BiOI/FTO電極(HP処理前後)の光電気化学特性の光照射方向依存性を調べた。その測定結果を図18及び下記表3に示す。
(考 察)
図11と図13との結果から明らかな通り、HP処理前ではBiOI粒子はその粒子形状を保ったままFTO電極上に堆積されているが、HP処理後は堆積物(被押圧原料)の一部が平坦化し、平坦化部分ではSEM像で粒子の粒界が見えない程度にBiOI粒子どうしが結着していた。なお、EDX測定により平坦化部分は平坦化する前と比べて組成変化がないことを確認した。また、図12と図14との結果から明らかな通り、HP処理前はBiOI粒子はFTO基板上に粗く堆積(堆積層の膜厚は4〜7μm)しているが、HP処理後は堆積層が平坦化して膜厚が4〜5μmに減少していた。図14からは、押圧成形物の押圧方向の断面における、幅10μmの範囲の厚さの差が1μm以内であることが分かった。また、XRDの結果により、HP処理によって、c軸配向になり、BiSBr中のBi−Oユニットが基板に水平に広がりやすくなるように配向したことが示された。
Further, as in Test Example 1, the dependence of the photoelectrochemical properties of the BiOI / FTO electrode (before and after HP treatment) on the light irradiation direction was investigated. The measurement results are shown in FIG. 18 and Table 3 below.
(Consideration)
As is clear from the results of FIGS. 11 and 13, the BiOI particles are deposited on the FTO electrode while maintaining their particle shape before the HP treatment, but after the HP treatment, one of the deposits (pressed raw material). The part was flattened, and in the flattened part, the BiOI particles were bound to the extent that the grain boundaries of the particles could not be seen in the SEM image. In addition, it was confirmed by EDX measurement that the composition of the flattened portion did not change as compared with that before flattening. Further, as is clear from the results of FIGS. 12 and 14, the BiOI particles are coarsely deposited on the FTO substrate before the HP treatment (the film thickness of the deposited layer is 4 to 7 μm), but after the HP treatment, the deposited layer is deposited. Flattened and the film thickness decreased to 4 to 5 μm. From FIG. 14, it was found that the difference in thickness in the width range of 10 μm in the cross section of the pressed molded product in the pressing direction was within 1 μm. In addition, the XRD results showed that the HP treatment resulted in a c-axis orientation, and the Bi-O unit in BiSBr was oriented so that it could easily spread horizontally on the substrate.
BiOI/FTO電極(HP処理前後)の光電気化学特性を調べたが、HP処理前後で優位差が認められなかった(図なし)。しかしながら、図18の光電気化学特性の光照射方向依存性の測定結果によれば、下記表3に示されるようにHP処理前後において光電流密度比率が約2倍に増大しており、HP処理により光励起電子の移動特性が向上したことが分かった。 The photoelectrochemical properties of the BiOI / FTO electrodes (before and after HP treatment) were examined, but no significant difference was observed before and after HP treatment (not shown). However, according to the measurement result of the light irradiation direction dependence of the photoelectrochemical characteristics in FIG. 18, as shown in Table 3 below, the photocurrent density ratio increased about twice before and after the HP treatment, and the HP treatment It was found that the movement characteristics of the photoexcited electrons were improved.
(試験例1〜3の比較と考察)
試験例における粒界抵抗の減少は、光電気化学特性の向上、及び/又は光励起電子の移動特性の向上などから評価できるため、試験例1〜3は全て粒界抵抗の減少の効果を示している。その中でも、試験例1,2のBiSI、BiSBrでは、光電気化学特性の向上、及び光励起電子の移動特性の向上が観測されたが、試験例3のBiOIでは、光励起電子の移動特性の向上のみが顕著に観測された。
(Comparison and consideration of Test Examples 1 to 3)
Since the decrease in grain boundary resistance in the test examples can be evaluated from the improvement in the photoelectrochemical properties and / or the transfer characteristics of the photoexcited electrons, all of Test Examples 1 to 3 show the effect of reducing the grain boundary resistance. There is. Among them, in BiSI and BiSBr of Test Examples 1 and 2, improvement in photoelectrochemical characteristics and improvement in transfer characteristics of photoexcited electrons were observed, but in BiOI of Test Example 3, only improvement in transfer characteristics of photoexcited electrons was observed. Was noticeably observed.
試験例における光励起電子の移動特性の評価は、電極中を構成する薄膜の、基板近傍から対岸の材料表面までのマクロスケールの光励起電子の移動特性を主に反映すると考える。そのため、試験例1〜3では、SEMなどからも観測されるように、粒子のパッキングなどが向上されたために、マクロスケールの光励起電子の移動特性が向上し、これが観測されたと考えられる。 It is considered that the evaluation of the transfer characteristics of photoexcited electrons in the test example mainly reflects the transfer characteristics of macroscale photoexcited electrons from the vicinity of the substrate to the surface of the material on the opposite bank of the thin film constituting the electrode. Therefore, in Test Examples 1 to 3, it is considered that the movement characteristics of the macroscale photoexcited electrons were improved because the packing of the particles was improved, as observed from SEM and the like, and this was observed.
一方、光電気化学特性の評価は、基板側から光照射を行っているために、多くの光子がそれぞれの金属複合アニオン化合物の基板近傍で吸収され、基板近傍の比較的ミクロスケールの物性が反映されることが考えられる。そして、この比較的ミクロスケールの特性は、材料の緻密な結着や、材料の配向などに大きく影響を受ける可能性がある。試験例1,2では、HP処理により材料の緻密な結着がみられ、ミクロスケールでの電子移動がより有利になったことがわかり、これにより光電気化学特性の向上がみられたことが理由の一つとして考えられる。また、材料の配向の観点からは、試験例1,2では、HP処理によりa−b軸配向になり、Bi−第16族元素アニオンユニットが基板に接合を形成しやすくなるように配向し、一方、試験例3では、c軸配向になり、Bi−第16族元素アニオンが基板に水平になりやすく配向した。Bi−第16族元素アニオンユニットからハロゲンアニオンへの電子の移動よりも、Bi−第16族元素アニオンユニット内での電子移動の方が有利である可能性があり、このため、HP処理を施すことでa−b軸配向となった試験例1,2では、光電気化学特性の向上が観測されたと考えられる。参考のため、図19にBiOX(但し、図19のXは第17族元素アニオンを示す)の結晶構造を示す。また、この際、c軸配向となった試験例3では、電子及び/正孔の閉じ込めに有利となり、発光材料に好適に利用できることが示唆される。 On the other hand, in the evaluation of photoelectrochemical properties, since light is irradiated from the substrate side, many photons are absorbed near the substrate of each metal composite anion compound, reflecting the relatively microscale physical properties near the substrate. It is possible that it will be done. And, this relatively microscale property may be greatly influenced by the tight binding of the material, the orientation of the material, and the like. In Test Examples 1 and 2, it was found that the materials were tightly bound by the HP treatment, and the electron transfer on the microscale became more advantageous, which improved the photoelectrochemical properties. It can be considered as one of the reasons. From the viewpoint of material orientation, in Test Examples 1 and 2, the ab-axis orientation was obtained by the HP treatment, and the Bi-16 group element anion unit was oriented so as to easily form a bond on the substrate. On the other hand, in Test Example 3, the orientation was c-axis, and the Bi-16 group element anion was easily oriented horizontally on the substrate. Electron transfer within the Bi-16 group elemental anion unit may be more advantageous than electron transfer from the Bi-16 group element anion unit to the halogen anion, and therefore HP treatment is performed. Therefore, it is considered that the improvement of photoelectrochemical properties was observed in Test Examples 1 and 2 in which the orientation was ab-axis. For reference, FIG. 19 shows the crystal structure of BiOX (where X in FIG. 19 indicates a Group 17 elemental anion). Further, at this time, in Test Example 3 having a c-axis orientation, it is advantageous to confine electrons and / holes, and it is suggested that it can be suitably used as a light emitting material.
試験例4(BiSI押圧成形物を光吸収層とした太陽電池セルの作製とその特性評価)
旭硝子製FTO基板(25mm×25mm×2mm)を準備した。
Test Example 4 (Production of a solar cell using a BiSI pressed molded product as a light absorption layer and evaluation of its characteristics)
An Asahi Glass FTO substrate (25 mm × 25 mm × 2 mm) was prepared.
次いで10mg/mlのBiSI粒子の2−プロパノール溶液を超音波処理により懸濁させた懸濁液を準備した。 Then, a suspension in which a 2-propanol solution of 10 mg / ml BiSI particles was suspended by sonication was prepared.
次いで、上記懸濁液200mlをFTO基板に滴下して乾燥させた。この滴下及び乾燥処理は3回繰り返した。これによりBiSI堆積層を形成した。 Then, 200 ml of the above suspension was added dropwise to the FTO substrate and dried. This dropping and drying treatment was repeated 3 times. As a result, a BiSI sedimentary layer was formed.
次いで、50℃のホットプレートで20分加熱した後、BiSI堆積層に石英板(25mm×25mm×2mm)を設置し、ホットプレス装置(SINTO製)にて温度120℃、雰囲気圧力大気圧、押圧圧力5MPa、押圧時間20分の条件で押圧成形した。これにより、FTO基板上にBiSI押圧成形物からなる光吸収層(厚さ3〜4μm)を形成した。 Next, after heating with a hot plate at 50 ° C. for 20 minutes, a quartz plate (25 mm × 25 mm × 2 mm) was placed on the BiSI deposition layer, and the temperature was 120 ° C., atmospheric pressure atmospheric pressure, and pressing with a hot press device (manufactured by SINTO). Press molding was performed under the conditions of a pressure of 5 MPa and a pressing time of 20 minutes. As a result, a light absorption layer (thickness 3 to 4 μm) made of a BiSI pressed molded product was formed on the FTO substrate.
次いで、光吸収層上に正孔輸送層(厚さ0.2μm)として有機高分子(Spiro−OMeTAD)をスピンコートにより形成し、次いで正孔輸送層上に蒸着によりAu電極(厚さ0.1μm)を形成することにより太陽電池セルを作製した。 Next, an organic polymer (Spiro-OMeTAD) was formed on the light absorption layer as a hole transport layer (thickness 0.2 μm) by spin coating, and then an Au electrode (thickness 0.) was deposited on the hole transport layer. A solar cell was produced by forming 1 μm).
作製した太陽電池セルについて、下記に示す条件下で太陽光変換効率を調べた。
・照射光強度:ソーラーシミュレータ(100mW/cm2)
・電極面積:0.12cm2
太陽光変換効率は、約1×10−4%(J=0.13mAcm−2,Voc=0.002V,FF=0.25)であった。
The solar cell produced was examined for solar conversion efficiency under the conditions shown below.
・ Irradiation light intensity: Solar simulator (100mW / cm 2 )
・ Electrode area: 0.12 cm 2
The solar conversion efficiency was about 1 × 10 -4 % (J = 0.13mAcm- 2 , Voc = 0.002V, FF = 0.25).
よって、本実施形態における押圧成形物は太陽電池材料、特に太陽電池セルの光吸収層として機能し、太陽光変換材料として適用できることが分かる。 Therefore, it can be seen that the pressed molded product in the present embodiment functions as a light absorbing layer of a solar cell material, particularly a solar cell, and can be applied as a solar conversion material.
試験例5(HP処理によるBiSI押圧成形物の金属板への転写)
(試験例5−1.銅板への転写)
試験例1の手順によりBiSI/FTO電極(HP処理前)を作製した。
Test Example 5 (Transfer of BiSI pressed molded product by HP treatment to metal plate)
(Test Example 5-1. Transfer to copper plate)
A BiSI / FTO electrode (before HP treatment) was prepared according to the procedure of Test Example 1.
次いで、BiSI/FTO電極(HP処理前)上に銅板(25mm×25mm×0.3mm)を挟みこんだ後で石英板(25mm×25mm×2mm)を設置し、ホットプレス装置(SINTO製)にて温度50℃、雰囲気圧力大気圧、押圧圧力5MPa、押圧時間20分の条件で押圧成形(HP処理)した。 Next, after sandwiching a copper plate (25 mm × 25 mm × 0.3 mm) on the BiSI / FTO electrode (before HP treatment), a quartz plate (25 mm × 25 mm × 2 mm) is installed and placed in a hot press device (manufactured by SINTO). Press molding (HP treatment) was performed under the conditions of a temperature of 50 ° C., an atmospheric pressure of atmospheric pressure, a pressing pressure of 5 MPa, and a pressing time of 20 minutes.
HP処理後に銅板を剥離した。図20の左図は銅板を剥離した後のFTO基板表面の状態を示す写真であり、右図は剥離後の銅板裏面の状態を示す写真である。右図から銅板裏面に緻密なBiSI押圧成形物が転写されていることが分かる。 The copper plate was peeled off after the HP treatment. The left figure of FIG. 20 is a photograph showing the state of the surface of the FTO substrate after the copper plate is peeled off, and the right figure is a photograph showing the state of the back surface of the copper plate after the peeling. From the figure on the right, it can be seen that the dense BiSI pressed molded product is transferred to the back surface of the copper plate.
転写されたBiSI押圧成形物の上面SEM観察像を図21に示す。図21からは転写されたBiSI押圧成形物の表面はほぼ全面でFTO基板の形態通りであることが分かる(つまり、BiSI押圧成形物はFTO基板上にはほぼ残っていない)。このように、銅板裏面に緻密なBiSI押圧成形物が転写された理由としては、銅板とBiSI押圧成形物との間にCuI、CuSx、BiCuxSy等の少なくとも一種の中間層が形成されたことが推測される。
(試験例5−2.モリブデン板への転写)
試験例5−1において銅板をモリブデン板に変えた以外は試験例5−1と同様にして押圧成形後(HP処理後)にモリブデン板を剥離した。図22の左図はモリブデン板を剥離した後のFTO基板表面の状態を示す写真であり、右図は剥離後のモリブデン板裏面の状態を示す写真である。右図からモリブデン板裏面に緻密なBiSI押圧成形物が転写されていることが分かる。
The top SEM observation image of the transferred BiSI pressed molded product is shown in FIG. From FIG. 21, it can be seen that the surface of the transferred BiSI pressed molded product is almost the same as the form of the FTO substrate (that is, almost no BiSI pressed molded product remains on the FTO substrate). It is presumed that the reason why the dense BiSI pressed molded product was transferred to the back surface of the copper plate in this way is that at least one intermediate layer such as CuI, CuSx, or BiCuxSy was formed between the copper plate and the BiSI pressed molded product. Will be done.
(Test Example 5-2. Transfer to molybdenum plate)
The molybdenum plate was peeled off after press molding (after HP treatment) in the same manner as in Test Example 5-1 except that the copper plate was changed to a molybdenum plate in Test Example 5-1. The left figure of FIG. 22 is a photograph showing the state of the surface of the FTO substrate after the molybdenum plate is peeled off, and the right figure is a photograph showing the state of the back surface of the molybdenum plate after the peeling. From the figure on the right, it can be seen that the dense BiSI pressed molded product is transferred to the back surface of the molybdenum plate.
転写されたBiSI押圧成形物の上面SEM観察像を図23に示す。図23からは転写されたBiSI押圧成形物の表面は大部分でFTO基板の形態通りであることが分かる(つまり、BiSI押圧成形物はFTO基板上にはほぼ残っていない)。
(試験例5−3.CuOx−Cu板への転写)
試験例5−1において銅板をCuOx−Cu板に変えた以外は試験例5−1と同様にして押圧成形後(HP処理後)にCuOx−Cu板を剥離した。なお、CuOx−Cu板は試験例5−1で使用した銅板を大気中300℃×30分で加熱することにより銅板表面に酸化被膜(CuOx)を形成したものである。
The top SEM observation image of the transferred BiSI pressed molded product is shown in FIG. From FIG. 23, it can be seen that the surface of the transferred BiSI pressed molded product largely conforms to the form of the FTO substrate (that is, the BiSI pressed molded product hardly remains on the FTO substrate).
(Test Example 5-3. Transfer to CuOx-Cu plate)
The CuOx-Cu plate was peeled off after pressure molding (after HP treatment) in the same manner as in Test Example 5-1 except that the copper plate was changed to a CuOx-Cu plate in Test Example 5-1. The CuOx-Cu plate is obtained by heating the copper plate used in Test Example 5-1 in the air at 300 ° C. for 30 minutes to form an oxide film (CuOx) on the surface of the copper plate.
転写されたBiSI押圧成形物の上面SEM観察像を図24に示す。図24からは転写されたBiSI押圧成形物の表面はほぼ全面でFTO基板の形態通りであることが分かる(つまり、BiSI押圧成形物はFTO基板上にはほぼ残っていない)。 The top SEM observation image of the transferred BiSI pressed molded product is shown in FIG. From FIG. 24, it can be seen that the surface of the transferred BiSI pressed molded product is almost the same as the form of the FTO substrate (that is, almost no BiSI pressed molded product remains on the FTO substrate).
なお、XRD解析によりCuOxはCu2Oであることが分かった。また、HP処理前後においてCu2O−Cu板の酸化被膜(Cu2O)は維持されていることが分かった。このように、銅板裏面に緻密なBiSI押圧成形物が転写された理由としては、CuOx−Cu板とBiSI押圧成形物との間にCuI、CuSx、BiCuxSy等の少なくとも一種の中間層が形成されたことが推測される。 Incidentally, CuOx was found to be Cu 2 O by XRD analysis. It was also found that the oxide film (Cu 2 O) of the Cu 2 O-Cu plate was maintained before and after the HP treatment. The reason why the dense BiSI pressed molded product was transferred to the back surface of the copper plate in this way is that at least one intermediate layer such as CuI, CuSx, or BiCuxSy was formed between the CuOx-Cu plate and the BiSI pressed molded product. It is speculated.
Claims (33)
AXY (1)
で示される金属複合アニオン化合物の粒子を含有する押圧成形物であって、
(1)前記カチオンAのうち96〜100モル%が第15族元素カチオンであり、
(2)前記アニオンXは第16族元素アニオン且つ周期表第3周期以降の元素のアニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(3)前記アニオンYは第17族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(4)前記粒子の結晶子径が28nm以上であり、
(5)前記押圧成形物の押圧方向の断面における、幅10μmの範囲の厚さの差が1μm以内であり、
(6)前記押圧成形物の前記金属複合アニオン化合物の結晶構造がPDF:00−043−0652及び/又はPDF:01−075−1811であり、前記PDF:00−043−0652の場合には前記金属複合アニオン化合物の(110)結晶面と(002)結晶面との配向比(110)/(002)が2.0以上であり、前記PDF:01−075−1811の場合には前記金属複合アニオン化合物の(110)結晶面と(121)結晶面との配向比(110)/(121)が1.0以上である、
ことを特徴とする押圧成形物。 The following general formula (1) composed of cation A, anion X and anion Y:
AXY (1)
A pressed molded product containing particles of a metal composite anion compound represented by.
(1) 96 to 100 mol% of the cation A is a Group 15 elemental cation.
(2) The anion X is a group 16 element anion and an anion of an element after the third period of the periodic table , and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(3) The anion Y is a Group 17 elemental anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(4) The crystallite diameter of the particles is 28 nm or more,
(5) in the pressing direction of the cross section of the pressing molding state, and are within 1μm difference in thickness in the range of width 10 [mu] m,
(6) The crystal structure of the metal composite anion compound of the pressed molded product is PDF: 00-043-0652 and / or PDF: 01-075-1811, and in the case of the PDF: 00-043-0652, the above. The orientation ratio (110) / (002) between the (110) crystal plane and the (002) crystal plane of the metal composite anion compound is 2.0 or more, and in the case of the PDF: 01-075-1811, the metal composite The orientation ratio (110) / (121) of the anion compound between the (110) crystal plane and the (121) crystal plane is 1.0 or more.
A pressed molded product characterized by this.
AXY (1)
で示される金属複合アニオン化合物の粒子を含有する被押圧原料を無機系板材で挟持した状態で押圧成形することにより押圧成形物を製造する方法であって、
(1)前記カチオンAのうち96〜100モル%が第15族元素カチオンであり、
(2)前記アニオンXは第16族元素アニオン且つ周期表第3周期以降の元素のアニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(3)前記アニオンYは第17族元素アニオンであり、その量はアニオンの総量のうち35〜65モル%であり、
(4)0〜300℃の温度条件下、0.01Pa〜2MPaの雰囲気圧力中、0.1MPa〜20MPaの押圧圧力を1秒〜20時間印加することにより前記押圧成形を行うことにより、前記金属複合アニオン化合物の結晶構造がPDF:00−043−0652及び/又はPDF:01−075−1811であり、前記PDF:00−043−0652の場合には前記金属複合アニオン化合物の(110)結晶面と(002)結晶面との配向比(110)/(002)が2.0以上であり、前記PDF:01−075−1811の場合には前記金属複合アニオン化合物の(110)結晶面と(121)結晶面との配向比(110)/(121)が1.0以上である前記押圧成形物を得る、
ことを特徴とする押圧成形物の製造方法。 The following general formula (1) composed of cation A, anion X and anion Y:
AXY (1)
This is a method for producing a pressed molded product by press-molding a pressed raw material containing particles of a metal composite anion compound represented by the above in a state of being sandwiched between inorganic plate materials .
(1) 96 to 100 mol% of the cation A is a Group 15 elemental cation.
(2) The anion X is a group 16 element anion and an anion of an element after the third period of the periodic table , and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(3) The anion Y is a Group 17 elemental anion, and the amount thereof is 35 to 65 mol% of the total amount of the anion.
(4) The metal by performing the press molding by applying a pressing pressure of 0.1 MPa to 20 MPa for 1 second to 20 hours in an atmospheric pressure of 0.01 Pa to 2 MPa under a temperature condition of 0 to 300 ° C. The crystal structure of the composite anion compound is PDF: 00-043-0652 and / or PDF: 01-075-1811, and in the case of the PDF: 00-043-0652, the (110) crystal plane of the metal composite anion compound. And (002) crystal plane orientation ratio (110) / (002) is 2.0 or more, and in the case of the PDF: 01-075-1811, the (110) crystal plane and (110) crystal plane of the metal composite anion compound 121) Obtain the pressed molded product having an orientation ratio (110) / (121) with respect to the crystal plane of 1.0 or more.
A method for producing a pressed molded product.
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