JP6779668B2 - Insulation inspection equipment - Google Patents

Description

The present invention relates to insulation test equipment.

The solar cell module consists of a solar cell panel and a frame that surrounds and holds the solar cell panel. In the solar cell panel, the solar cell element is sandwiched between the cover glass and the back sheet via a sealing material and laminated. The solar cell element includes a substrate and a laminate in which at least a first electrode, a semiconductor layer, and a second electrode are laminated on the substrate.

The solar cell module is required to have an insulating performance that does not cause an electric leakage even when exposed to rainwater and does not cause an electric leakage even if it deteriorates over time. As one of the methods for giving the solar cell module an insulating property, the outer peripheral portion of the laminate on the substrate is deleted (removed) so that the laminate is formed between the end of the substrate and the end of the laminate. There is a way to form a removal area that does not exist. Then, for example, by the method disclosed in Patent Document 1, the insulation property of the removal region from which the laminate has been removed by the deletion is inspected and measured by a probe.

Japanese Unexamined Patent Publication No. 2014-99425

For example, as shown in FIG. 1, when the probes 101 and 102 of the insulation inspection device are brought into contact with the upper surface of the removal region 100 from which the laminate has been removed by deletion to inspect the insulation, the electrical characteristics required for the solar cell module. Depending on the case, it is necessary to apply a voltage of up to about 8000 V between the probes 101 and 102.

However, when the required creepage distance cannot be maintained, such as when the depth width is small or the distance between probes is short, the creepage discharge 300 is caused by ionization due to voltage application or the degree of pollution of the measurement target or environment. In some cases, accurate insulation inspection could not be performed.

An object of the present invention is to perform an accurate insulation inspection.

This insulation inspection device includes a first probe, a second probe, a first insulator, a support portion for supporting the first probe, the second probe, and the first insulator, and a first insulator . The probe, the second probe, and the first insulator are brought into contact with or separated from the inspection surface, and the first probe, the second probe, and the first insulator are on the inspection surface. The first insulator is located between the first probe and the second probe, and the support portion is the groove where the first probe is located and the groove where the second probe is located. A second insulator is provided so as to have a gap for communicating with and a part of the gap, and the first probe, the second probe, and the first insulator support a support portion by a moving mechanism. Move through .

According to the disclosed technology, accurate insulation inspection can be performed.

It is a figure explaining the conventional insulation inspection apparatus. It is sectional drawing (non-inspection state) which illustrates the structure of the insulation inspection apparatus which concerns on 1st Embodiment. It is a bottom view which illustrates the shape and positional relationship of a probe and an elastic insulator. It is sectional drawing (inspection state) which illustrates the structure of the insulation inspection apparatus which concerns on 1st Embodiment. It is a figure explaining the effect of the insulation inspection apparatus which concerns on 1st Embodiment. It is a figure explaining the position where each probe contacts. FIG. 1 is a schematic cross-sectional view 1 (inspection state) illustrating the structure of the insulation inspection apparatus according to the first modification of the first embodiment. FIG. 2 is a schematic cross-sectional view 2 (inspection state) illustrating the structure of the insulation inspection apparatus according to the first modification of the first embodiment. FIG. 3 is a schematic cross-sectional view 3 (inspection state) illustrating the structure of the insulation inspection device according to the first modification of the first embodiment. FIG. 1 is a schematic cross-sectional view 1 (inspection state) illustrating the structure of the insulation inspection apparatus according to the second modification of the first embodiment. FIG. 2 is a schematic cross-sectional view 2 (inspection state) illustrating the structure of the insulation inspection apparatus according to the second modification of the first embodiment. FIG. 3 is a schematic cross-sectional view 3 (inspection state) illustrating the structure of the insulation inspection device according to the second modification of the first embodiment. FIG. 1 is a schematic cross-sectional view 1 (inspection state) illustrating the structure of the insulation inspection apparatus according to the third modification of the first embodiment. FIG. 2 is a schematic cross-sectional view 2 (inspection state) illustrating the structure of the insulation inspection apparatus according to the third modification of the first embodiment. FIG. 3 is a schematic cross-sectional view 3 (inspection state) illustrating the structure of the insulation inspection device according to the third modification of the first embodiment.

Hereinafter, modes for carrying out the invention will be described with reference to the drawings. In each drawing, the same components may be designated by the same reference numerals and duplicate description may be omitted.

<First Embodiment>
FIG. 2 is a schematic cross-sectional view illustrating the structure of the insulation inspection device according to the first embodiment, and shows a non-inspection state (a state in which the probe is not in contact with the inspection surface of the inspection object).

Referring to FIG. 2, the insulation inspection device 1 is a device that performs an insulation inspection in contact with the inspection surface of the inspection object, and is a first probe 11, a second probe 12, and an elastic insulator (first probe). It includes an insulator) 13, a support portion 14, a moving mechanism 15, and a measuring portion 16. The measuring unit 16 measures a current that applies a voltage between the first probe 11 and the second probe 12 and a current that flows between the first probe 11 and the second probe 12. Includes a measuring unit.

The first probe 11, the second probe 12, and the elastic insulator 13 are each supported by the support portion 14. Specifically, the first probe 11 and the second probe 12, which are conductors, are supported by a support portion 14, which is an insulator, via an elastic body 17 such as a spring. Further, the elastic insulator 13 is directly supported by the support portion 14 so as to be located between the first probe 11 and the second probe 12. The cross-sectional shape of the elastic insulator 13 can be, for example, a rectangular shape.

Grooves are formed on the lower surface side of the support portion 14 corresponding to the probes 11 and 12, and a part of the probes 11 and 12 is located in the corresponding grooves. Further, the elastic body 17 that supports the probes 11 and 12 has one end fixed to the groove provided in the support portion 14 and the other end fixed to the probe. These probes 11 and 12 are electrically connected to a voltage application unit and a current measurement unit, respectively.

A moving mechanism 15 is provided on the upper surface side of the support portion 14, and the first probe 11, the second probe 12, and the elastic insulator 13 are indicated by an arrow A via the support portion 14 by the moving mechanism 15. It can move up and down.

As the support portion 14 moves, the first probe 11, the second probe 12, and the elastic insulator 13 come into contact with or separate from the inspection surface of the inspection object. Further, in the state where the probes 11 and 12 are not in contact with the inspection surface (the state shown in FIG. 2), the tips of the probes 11 and 12 are located closer to the inspection surface than the elastic insulator 13.

FIG. 3 is a bottom view illustrating the shape and positional relationship of the probe and the elastic insulator. In the example shown in FIG. 3A, the first probe 11 and the second probe 12 have a plate shape in contact with the inspection surface on the surface, and face each other via the elastic insulator 13. In the example shown in FIG. 3B, the first probe 11 and the second probe 12 have a needle shape in contact with the inspection surface at a point, and face each other via the elastic insulator 13.

In either case, the elastic insulator 13 is in the direction in which the first probe 11 and the second probe 12 face each other from within the region where the first probe 11 and the second probe 12 face each other in the bottom view. It is preferable that the protrusions are projected on both sides in the direction orthogonal to the (B direction). This is to effectively prevent creeping discharge.

In other words, in the plate-shaped elastic insulator 13 shown in FIG. 3A, the elastic insulator 13 is located between the probes in the bottom view, and the length of the elastic insulator 13 in the B direction (probe). The length in the extending direction) is preferably longer than the length in the B direction of the probe. Similarly, in the needle-shaped elastic insulator 13 shown in FIG. 3B, the elastic insulator 13 is located between the probes in the bottom view, and the length of the elastic insulator 13 in the B direction is the length of the probe. It is preferably longer than the length in the B direction (probe diameter).

In the insulation inspection device 1, a probe having either a plate shape or a needle shape may be used, but the plate shape probe is preferable in that it can inspect a wider range at once than the needle shape probe. is there.

FIG. 4 is a schematic cross-sectional view illustrating the structure of the insulation inspection device according to the first embodiment, and shows an inspection state. In FIG. 4, the object to be measured is the solar cell element 30, which includes a substrate 31 and a laminate 32 in which a first electrode, a semiconductor layer, and a second electrode are sequentially laminated on the substrate 31. A removal region 31a is formed on the substrate 31 in which the outer peripheral portion of the laminated body 32 is deleted. In the example shown in FIG. 4, the removal region 31a is the inspection surface. In the following description, reference numerals 31a may be added to the inspection surface for description.

In the solar cell element 30, the substrate 31 is an insulating substrate made of glass or the like. The semiconductor layer constituting the laminate 32 is not particularly limited, but is, for example, a CIS-based thin film (thin film composed of a compound containing copper (Cu), indium (In), and selenium (Se)).

When performing an insulation inspection using the insulation inspection device 1, first, a contact step is performed in which the first probe 11, the second probe 12, and the elastic insulator 13 are brought into contact with the inspection surface by the moving mechanism 15. Run.

In the contact step, when the support portion 14 is moved downward (inspection surface direction) by the moving mechanism 15 and the support portion 14 is brought close to the inspection surface 31a, the probes 11 and 12 come into contact with the inspection surface 31a. Further, when the support portion 14 is moved toward the inspection surface 31a, the elastic body 17 contracts, the probes 11 and 12 enter the groove of the support portion 14, and the elastic insulator 13 comes into contact with the inspection surface 31a. Further, when the support portion 14 is moved toward the inspection surface 31a, the elastic insulator 13 strongly abuts on the inspection surface 31a, that is, adheres to the inspection surface 31a.

By the contact step, when the first probe 11, the second probe 12, and the elastic insulator 13 come into contact with the inspection surface 31a, the first probe 11 and the second probe 12 face each other and are elastic. The insulator 13 is located between the first probe 11 and the second probe 12.

By the way, in the removal region 31a, there is a difference in the distance between the elastic insulator 13 and the removal region 31a due to the unevenness caused by the distortion of the substrate 31. However, when the elastic insulator 13 is strongly brought into contact with the removal region 31a, as shown in FIG. 5, the elastic insulator 13 is deformed according to the unevenness of the removal region 31a, and the elastic insulator 13 becomes the removal region 31a. In close contact. That is, there is no gap between the elastic insulator 13, the support portion 14, and the removal region 31a.

Further, as can be seen from FIGS. 3 and 4, when the first probe 11, the second probe 12, and the elastic insulator 13 come into contact with the inspection surface, the first probe 11 side to the second probe Looking at 12, the elastic insulator 13 is positioned so as to block the second probe 12.

Therefore, even when a high voltage of, for example, 8000 V is applied between the first probe 11 and the second probe 12, the elastic insulator 13 exists between the probes 11 and 12, so that the creepage discharge 300 is generated. Can be prevented. As a result, the insulation inspection device 1 can perform an accurate insulation inspection.

It is preferable that the space formed by the inspection surface, the first probe 11 and the second probe 12 at the time of inspection is separated by an elastic insulator 13 so that no space is formed in the vertical direction.

Further, although the inspection surface is defined as the removal region 31a in the above description, the first probe 11 can be in contact with the substrate 31 or the removal region 31a, and the second probe 12 is in contact with the removal region 31a or the laminate 32. Can be done. As a result, the inspection surface is not limited to the removal region 31a, but can be the substrate 31, the laminate 32, and the removal region 31a.

That is, at the time of inspection, one of the first probe 11 and the second probe 12 is laminated not only when both of them are in contact with the removal region 31a as shown in FIG. 4 but also as shown in FIG. 6 (a). It may be in contact with the body 32 and the other may be in contact with the removal region 31a. In this case, the removal region 31a and the laminated body 32 serve as inspection surfaces.

Alternatively, as shown in FIG. 6B, one may be in contact with the removal region 31a and the other may be in contact with the side surface of the substrate 31. In this case, the removal region 31a and the substrate 31 serve as inspection surfaces. Alternatively, although not shown, one may be in contact with the laminate 32 and the other may be in contact with the side surface of the substrate 31. In this case, the laminated body 32 to the substrate 31 are the inspection surfaces.

Regardless of whether the inspection surface is the substrate 31, the laminated body 32, or the removal region 31a, the elastic insulator 13 always comes into contact with the removal region 31a. As a result, creeping discharge can be prevented.

As the elastic insulator 13, it is preferable to use natural rubber, diene-based rubber, non-diene-based rubber, or other rubber.

Examples of the diene rubber include styrene-butadiene rubber (SBR), isoprene rubber (IR), butadiene rubber (BR), chloroprene rubber (CR), and acrylonitrile-butadiene rubber (NBR).

Examples of non-diene rubbers include butyl rubber (isobutyene / isoprene rubber (IIR)), ethylene / propylene rubber (EPM, EP, EPDM), ethylene / propylene / diene rubber (EPDM), and urethane rubber (PUR, U). , Silicone rubber (Si, Q, VMQ, SR), fluororubber (FKM, FPM) and the like.

Examples of other rubbers include chlorosulfonated polyethylene (CSM), chlorinated polyethylene (CM), acrylic rubber (ACM, ANM), polysulfide rubber (T), epichlorohydrin rubber (CO, ECO) and the like. Be done.

<Modification 1 of the first embodiment>
In the first embodiment, an example is shown in which the elastic insulator 13 having a rectangular cross section is used in the insulation inspection device 1. However, the cross-sectional shape of the elastic insulator is not limited to the rectangular shape shown in FIG. 4 and the like, and may be various shapes exemplified below.

7 to 9 are schematic cross-sectional views illustrating the structure of the insulation inspection device according to the first modification of the first embodiment, and show the inspection state.

For example, as in the elastic insulator 13A shown in FIG. 7A, rectangular notches are provided on both sides of the removal region 31a side (lower surface side), and the width is wide from the wide rectangular portion on the support portion 14 side. A substantially T-shaped cross section may be formed in which a narrow rectangular portion protrudes toward the removal region 31a. Further, like the elastic insulator 13B shown in FIG. 7 (b), the area of the surface (lower surface) in contact with the removal region 31a is smaller than the area of the surface (upper surface) on the support portion 14 side (for example, an equileg). The cross-sectional shape may be trapezoidal).

Further, as in the elastic insulator 13C shown in FIG. 8A, the cross-sectional shape may be circular or elliptical. Further, as in the elastic insulator 13D shown in FIG. 8B, the cross-sectional shape is provided with a rectangular groove recessed from the surface side in contact with the removal region 31a to the support portion 14 side in the central portion on the removal region 31a side. May be good.

Further, the number of elastic insulators may be one or a plurality. For example, as in the elastic insulator 13E shown in FIG. 9, the elastic insulator may have two independent rectangular portions. Of course, the elastic insulator may have three or more independent portions, and instead of the rectangular cross-sectional shape, various cross-sectional shapes as shown in FIGS. 7 (a) to 8 (b) Can be adopted.

<Modification 2 of the first embodiment>
In the first embodiment, an example is shown in which the first probe 11, the second probe 12, and the elastic insulator 13 are supported by the same support portion 14 in the insulation inspection device 1. However, the present invention is not limited to this, and as illustrated below, the first probe 11, the second probe 12, and the elastic insulator 13 may be supported by separate supports.

10 to 12 are schematic cross-sectional views illustrating the structure of the insulation inspection device according to the second modification of the first embodiment, and show the inspection state.

For example, as shown in FIG. 10 (a), two support portions 14A and 14B arranged horizontally separated from each other may be provided. The support portions 14A and 14B are configured to be simultaneously movable in the vertical direction indicated by the arrow A by, for example, the moving mechanism 15.

In the example shown in FIG. 10A, the first probe 11 is fixed in the groove of the support portion 14A via the elastic body 17, and the second probe 12 is fixed in the groove of the support portion 14B via the elastic body 17. It is fixed to. Further, the elastic insulator 13F has a rectangular cross section and is fixed to the opposite side surfaces of the support portion 14A and the support portion 14B so as to be located between the first probe 11 and the second probe 12. ing.

The cross-sectional shape of the elastic insulator is not limited to the rectangular shape shown in FIG. 10A and the like, and may be various shapes exemplified below. For example, as in the elastic insulator 13G shown in FIG. 10B, rectangular cutouts are provided on both sides of the removal region 31a side, and the width is wide from the wide rectangular portion on the moving mechanism 15 side (upper surface side). A substantially T-shaped cross section may be formed in which a narrow rectangular portion protrudes toward the removal region 31a.

Further, as in the elastic insulator 13H shown in FIG. 11A, the shape of the portion protruding from between the opposite side surfaces of the support portion 14A and the support portion 14B toward the removal region 31a is the area of the surface in contact with the removal region 31a. May be a cross-sectional shape having a trapezoidal shape (for example, an isobaric trapezoidal shape) smaller than the area on the moving mechanism 15 side. Further, as in the elastic insulator 13I shown in FIG. 11B, the cross-sectional shape may be circular or elliptical.

Further, as in the elastic insulator 13J shown in FIG. 12A, the cross-sectional shape is provided with a rectangular groove recessed from the surface side in contact with the removal region 31a to the moving mechanism 15 side in the central portion on the removal region 31a side. May be good. Further, as in the elastic insulator 13K shown in FIG. 12B, elastic insulators may be provided in each of the support portions 14A and 14B.

<Modification 3 of the first embodiment>
Modification 3 of the first embodiment shows other modifications.

13 to 15 are schematic cross-sectional views illustrating the structure of the insulation inspection apparatus according to the third modification of the first embodiment, and show the inspection state.

For example, as shown in FIG. 13A, the support portion may have a structure composed of a plurality of units. In the example shown in FIG. 13A, the support portion 14D is arranged on the support portion 14C with a predetermined gap. The upper ends of each of the first probe 11 and the second probe 12 are exposed in the gap between the support portion 14C and the support portion 14D.

However, in the case of the structure of FIG. 13A, creeping discharge 300 may occur between the probes through the gap. Therefore, as shown in FIG. 13B, the elastic insulator (second insulator) 23 can be arranged so as to close at least a part of the gap between the first probe 11 and the second probe 12. preferable. For example, a groove can be provided at a position where the upper surface of the support portion 14C and the lower surface of the support portion 14D face each other, and the elastic insulator 23 can be arranged in the groove.

In the structure of FIG. 13B, not only the elastic insulator 13 is arranged between the probes so as to block the second probe 12 when viewed from the first probe 11, but also a gap is similarly provided. An elastic insulator 23 is also arranged inside. Therefore, even when a high voltage of, for example, 8000 V is applied between the probes, the elastic insulators 13 and 23 are present between the probes, so that the occurrence of creepage discharge 300 can be prevented. As a result, it becomes possible to perform an accurate insulation inspection.

It should be noted that the surfaces of the two support portions facing each other as shown in FIG. 13B do not necessarily have to be flat. For example, like the support portion 14E and the support portion 14F shown in FIG. 14, a concave portion is provided in the center of the upper surface of the support portion 14E, and a convex portion is provided on the lower surface of the support portion 14F at a position facing the concave portion of the support portion 14E. A structure may be provided in which the convex portion of the support portion 14F is fitted into the concave portion of the support portion 14E with a predetermined gap.

In this case as well, as in the case of FIG. 13B, by arranging the elastic insulator 23 in the recess so as to close at least a part of the gap between the first probe 11 and the second probe 12. , It is possible to prevent the occurrence of creeping discharge 300. As a result, it becomes possible to perform an accurate insulation inspection.

FIG. 15 shows an example in which the elastic insulator is arranged so as to be in contact with the probes 11 and 12 in the groove in which the probes 11 and 12 are arranged. In the example shown in FIG. 15, the elastic insulator 33 is embedded in the support portion 14G so as to be in contact with the upper end surfaces of the first probe 11 and the second probe 12. In this structure, in addition to the elastic insulator 13, the elastic insulator 33 in contact with the upper end surfaces of the probes 11 and 12 is present, so that the occurrence of creepage discharge 300 can be prevented. As a result, it becomes possible to perform an accurate insulation inspection.

Although the preferred embodiment has been described in detail above, it is not limited to the above-described embodiment, and various modifications and substitutions are made to the above-described embodiment without departing from the scope of claims. Can be added.

For example, it is clear that an insulator having no elasticity may be used as long as creepage discharge can be suppressed. Further, the elastic insulator does not need to be supported by the support portion, and the elastic insulator may be a separate body from the support portion. In this case, a second moving mechanism for inserting the elastic insulator from the lateral direction may be provided under the support portion. At the time of inspection, first, the elastic insulator is laterally moved by the second moving mechanism and placed at a predetermined position. After that, the support portion 14 may be lowered by the moving mechanism 15 so that the support portion 14 presses the elastic insulator from above. Here, the predetermined position is a position where the elastic insulator is arranged between the first probe and the second probe facing each other.

1 Insulation inspection device 11 1st probe 12 2nd probe 13, 13A to 13K Elastic insulator (1st insulator)
14, 14A-14G Support part 15 Moving mechanism 16 Measuring part 17 Elastic body 23, 33 Elastic insulator (second insulator)
30 Solar cell element 31 Substrate 31a Removal area 32 Laminate

Claims (7)

It is an insulation inspection device
With the first probe
With the second probe
With the first insulator,
A support portion that supports the first probe, the second probe, and the first insulator, and
It has a moving mechanism for bringing the first probe, the second probe, and the first insulator into contact with or separated from the inspection surface.
When the first probe, the second probe, and the first insulator come into contact with the inspection surface, the first insulator is formed by the first probe and the second probe. located in between,
The support portion has a gap communicating the groove in which the first probe is located and the groove in which the second probe is located, and a second insulator is provided so as to close a part of the gap. ,
An insulation inspection device in which the first probe, the second probe, and the first insulator move via the support portion by the moving mechanism . When the first probe, the second probe, and the first insulator come into contact with the inspection surface, the second probe is viewed from the first probe side. The insulation inspection device according to claim 1, wherein the insulator is positioned so as to block the second probe. The insulation according to claim 1 or 2 , wherein the first probe and the second probe are supported by the support portion via an elastic body, and the first insulator is directly supported by the support portion. Inspection device. The first insulator is used in a direction in which the first probe and the second probe face each other from within a region where the first probe and the second probe face each other in bottom view. The insulation inspection apparatus according to any one of claims 1 to 3 , which protrudes on both sides in the orthogonal direction. The inspection object provided with the inspection surface is
A substrate, a laminate in which a first electrode, a semiconductor layer, and a second electrode are laminated in this order on the substrate, and a removal region formed on the outer peripheral portion of the laminate on the substrate. The insulation inspection device according to any one of claims 1 to 4 , which is a solar cell element. The inspection surface is the substrate, the laminate, and the removal region, the first probe can be in contact with the substrate or the removal region, and the second probe is in contact with the removal region or the laminate. The insulation inspection apparatus according to claim 5 , wherein the first insulator is in contact with the removal region. The insulation inspection device according to any one of claims 1 to 6 , wherein the first insulator has elasticity.

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