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JP7569006B2 - Manufacturing method of copper clad laminate - Google Patents
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JP7569006B2 - Manufacturing method of copper clad laminate - Google Patents

Manufacturing method of copper clad laminate Download PDF

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JP7569006B2
JP7569006B2 JP2020178361A JP2020178361A JP7569006B2 JP 7569006 B2 JP7569006 B2 JP 7569006B2 JP 2020178361 A JP2020178361 A JP 2020178361A JP 2020178361 A JP2020178361 A JP 2020178361A JP 7569006 B2 JP7569006 B2 JP 7569006B2
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copper plating
clad laminate
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JP2022069271A (en
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芳英 西山
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Sumitomo Metal Mining Co Ltd
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Description

本発明は、銅張積層板の製造方法に関する。さらに詳しくは、本発明は、フレキシブルプリント配線板(FPC)などの製造に用いられる銅張積層板の製造方法に関する。 The present invention relates to a method for producing a copper-clad laminate. More specifically, the present invention relates to a method for producing a copper-clad laminate used in the manufacture of flexible printed circuit boards (FPCs) and the like.

液晶パネル、ノートパソコン、デジタルカメラ、携帯電話などの電子機器には、樹脂フィルムの表面に配線パターンが形成されたフレキシブルプリント配線板が用いられる。フレキシブルプリント配線板は樹脂フィルムに銅泊を積層した銅張積層板から製造される。また、銅張積層板は樹脂フィルムに乾式めっきにより下地金属層を成膜した後、電解めっきにより銅めっき被膜を成膜することにより得られる(例えば、特許文献1)。 Flexible printed wiring boards, in which wiring patterns are formed on the surface of a resin film, are used in electronic devices such as liquid crystal panels, notebook computers, digital cameras, and mobile phones. Flexible printed wiring boards are manufactured from copper-clad laminates, in which copper foil is laminated onto a resin film. Copper-clad laminates are also obtained by forming a base metal layer on a resin film by dry plating, and then forming a copper plating film by electrolytic plating (for example, Patent Document 1).

電子機器が処理する情報量は年々増加しており、電子機器は高周波信号の処理が求められている。これに伴い、フレキシブルプリント配線板は高周波信号の処理における伝送損失を低く抑えることが求められている。例えば、スマートフォンなどの携帯端末は、近年のデータ送受信量の増大に対応するため、高速なデータ通信が求められている。そして、携帯端末に用いられるフレキシブルプリント配線板は高周波無線通信を行なう際の伝送損失を低く抑えることが求められている。 The amount of information processed by electronic devices is increasing year by year, and electronic devices are required to process high-frequency signals. Accordingly, flexible printed wiring boards are required to keep transmission loss low when processing high-frequency signals. For example, mobile terminals such as smartphones are required to have high-speed data communication in order to keep up with the increase in data transmission and reception in recent years. Flexible printed wiring boards used in mobile terminals are required to keep transmission loss low when performing high-frequency wireless communication.

特開2010-205799号公報JP 2010-205799 A

配線に流れるパルスが高周波領域になると、表皮効果により配線の表面に多くの電流が流れる。そのため、配線の表面抵抗率を低くすれば、伝送損失を低く抑えることができる。配線の表面抵抗率は配線を構成する銅めっき被膜の結晶子が大きいほど低くなる。銅めっき被膜の結晶子は、めっき直後は小さく、時間の経過とともに進行する室温再結晶により大きくなる。しかし、室温再結晶により結晶子が十分な大きさとなるには長時間(例えば、数週間)を要する。 When the pulses flowing through the wiring reach a high frequency range, a large amount of current flows on the surface of the wiring due to the skin effect. Therefore, by lowering the surface resistivity of the wiring, transmission loss can be kept low. The larger the crystallites in the copper plating film that makes up the wiring, the lower the surface resistivity of the wiring. The crystallites in the copper plating film are small immediately after plating, and grow larger over time due to room-temperature recrystallization. However, it takes a long time (e.g., several weeks) for the crystallites to reach a sufficient size through room-temperature recrystallization.

本発明は上記事情に鑑み、短時間で銅めっき被膜の結晶子を大きくできる銅張積層板の製造方法を提供することを目的とする。 In view of the above circumstances, an object of the present invention is to provide a method for producing a copper-clad laminate capable of enlarging the crystallites of a copper plating film in a short period of time.

本発明の銅張積層板の製造方法は、基材の表面に銅めっき被膜を成膜して銅張積層板を得る電解めっき工程と、前記銅張積層板をロールツーロールにより搬送しつつ加熱する加熱工程と、を備え、前記加熱工程において、搬送張力を50~105N/mとし、加熱温度を134~170℃とするか、搬送張力を105~160N/mとし、加熱温度を113~170℃とすることを特徴とする The method for producing a copper-clad laminate of the present invention includes an electrolytic plating step of forming a copper plating film on the surface of a substrate to obtain a copper-clad laminate, and a heating step of heating the copper-clad laminate while transporting it by roll-to-roll, and is characterized in that in the heating step, the transport tension is set to 50 to 105 N/m and the heating temperature is set to 134 to 170°C, or the transport tension is set to 105 to 160 N/m and the heating temperature is set to 113 to 170°C .

本発明によれば、電解めっき工程の後に行なわれる加熱工程において、特定の加熱温度、搬送張力とすることにより、銅めっき被膜の結晶子を大きくできる。そのため、短時間で銅めっき被膜の結晶子を大きくできる。 According to the present invention, in the heating process carried out after the electrolytic plating process, the crystallites of the copper plating film can be enlarged by using a specific heating temperature and conveying tension. Therefore, the crystallites of the copper plating film can be enlarged in a short period of time.

本発明の一実施形態に係る銅張積層板の断面図である。1 is a cross-sectional view of a copper-clad laminate according to one embodiment of the present invention. 加熱炉の加熱温度と銅めっき被膜の結晶子径との関係を示すグラフである。1 is a graph showing the relationship between the heating temperature of a heating furnace and the crystallite size of a copper plating film. 銅めっき被膜の結晶子径と表面抵抗率との関係を示すグラフである。1 is a graph showing the relationship between crystallite size and surface resistivity of a copper plating film.

つぎに、本発明の実施形態を図面に基づき説明する。
図1に示すように、本発明の一実施形態に係る方法により製造される銅張積層板1は、基材10と、基材10の表面に成膜された銅めっき被膜20とからなる。図1に示すように基材10の片面のみに銅めっき被膜20が成膜されてもよいし、基材10の両面に銅めっき被膜20が成膜されてもよい。
Next, an embodiment of the present invention will be described with reference to the drawings.
As shown in Fig. 1, a copper clad laminate 1 produced by a method according to one embodiment of the present invention comprises a substrate 10 and a copper plating film 20 formed on the surface of the substrate 10. As shown in Fig. 1, the copper plating film 20 may be formed on only one side of the substrate 10, or the copper plating film 20 may be formed on both sides of the substrate 10.

基材10は絶縁性を有するベースフィルム11の表面に金属層12が成膜されたものである。ベースフィルム11としてポリイミドフィルム、液晶ポリマー(LCP)フィルムなどの樹脂フィルムを用いることができる。金属層12は、例えば、スパッタリング法により成膜される。金属層12は下地金属層13と銅薄膜層14とからなる。下地金属層13と銅薄膜層14とはベースフィルム11の表面にこの順に積層されている。一般に、下地金属層13はニッケル、クロム、またはニッケルクロム合金からなる。特に限定されないが、ベースフィルム11の厚さは30~40μmが一般的であり、下地金属層13の厚さは5~50nmが一般的であり、銅薄膜層14の厚さは50~400nmが一般的である。 The substrate 10 is a metal layer 12 formed on the surface of an insulating base film 11. A resin film such as a polyimide film or a liquid crystal polymer (LCP) film can be used as the base film 11. The metal layer 12 is formed, for example, by a sputtering method. The metal layer 12 is made of an undercoat metal layer 13 and a copper thin film layer 14. The undercoat metal layer 13 and the copper thin film layer 14 are laminated in this order on the surface of the base film 11. In general, the undercoat metal layer 13 is made of nickel, chromium, or a nickel-chromium alloy. Although not particularly limited, the thickness of the base film 11 is generally 30 to 40 μm, the thickness of the undercoat metal layer 13 is generally 5 to 50 nm, and the thickness of the copper thin film layer 14 is generally 50 to 400 nm.

なお、下地金属層13はなくてもよい。銅薄膜層14はベースフィルム11の表面に下地金属層13を介して成膜されてもよいし、下地金属層13を介さずベースフィルム11の表面に直接成膜されてもよい。 The base metal layer 13 may not be necessary. The copper thin film layer 14 may be formed on the surface of the base film 11 via the base metal layer 13, or may be formed directly on the surface of the base film 11 without the base metal layer 13.

銅めっき被膜20は銅薄膜層14の表面に成膜されている。特に限定されないが、銅めっき被膜20の厚さは、サブトラクティブ法により加工される銅張積層板1の場合8~12μmが一般的であり、セミアディティブ法により加工される銅張積層板1の場合0.1~5μmが一般的である。なお、金属層12と銅めっき被膜20とを合わせて「導体層」と称する。 The copper plating film 20 is formed on the surface of the copper thin film layer 14. Although not particularly limited, the thickness of the copper plating film 20 is generally 8 to 12 μm in the case of a copper clad laminate 1 processed by a subtractive method, and generally 0.1 to 5 μm in the case of a copper clad laminate 1 processed by a semi-additive method. The metal layer 12 and the copper plating film 20 are collectively referred to as the "conductor layer."

本実施形態に係る銅張積層板1の製造方法は電解めっき工程と加熱工程とを有している。また、ロールツーロール方式のめっき装置が用いられる。このめっき装置は、ロールツーロールにより長尺帯状の基材10を搬送しつつ、基材10に対して電解めっきを行なう装置である。 The manufacturing method of the copper-clad laminate 1 according to this embodiment includes an electrolytic plating process and a heating process. A roll-to-roll plating apparatus is used. This plating apparatus performs electrolytic plating on the long strip-shaped substrate 10 while transporting the substrate 10 by roll-to-roll.

めっき装置はロール状に巻回された基材10を繰り出す供給装置と、めっき後の基材10(銅張積層板1)をロール状に巻き取る巻取装置とを有する。供給装置と巻取装置との間の搬送経路には、前処理槽、めっき槽、後処理槽、液切装置、加熱炉を、上流から下流に向かってこの順に配置することが好ましい。前処理槽では基材10の酸洗を行なう。めっき槽では電解めっき工程を行なう。後処理槽では銅張積層板1の防錆処理を行なう。液切装置で銅張積層板1に付着した液を切る。加熱炉では加熱工程を行なう。 The plating equipment has a supply device that pays out the substrate 10 wound in a roll, and a winding device that winds up the substrate 10 (copper-clad laminate 1) after plating into a roll. On the transport path between the supply device and the winding device, a pre-treatment tank, a plating tank, a post-treatment tank, a liquid cutting device, and a heating furnace are preferably arranged in this order from upstream to downstream. In the pre-treatment tank, the substrate 10 is pickled. In the plating tank, an electrolytic plating process is performed. In the post-treatment tank, an anti-rust treatment is performed on the copper-clad laminate 1. The liquid that has adhered to the copper-clad laminate 1 is cut off by the liquid cutting device. The heating furnace performs a heating process.

このように、基材10の搬送経路にめっき槽と加熱炉とを配置すれば、基材10を一回搬送するだけで電解めっき工程と加熱工程とが完了する。そのため、加熱工程も含め銅張積層板1の製造を短時間で完了できる。また、基材10の搬送経路において加熱炉の前後に張力カット機構を設けることが好ましい。これにより、加熱炉における銅張積層板1の搬送張力を任意に設定できる。 In this way, by arranging a plating tank and a heating furnace on the transport path of the substrate 10, the electrolytic plating process and the heating process can be completed by transporting the substrate 10 once. Therefore, the manufacture of the copper-clad laminate 1, including the heating process, can be completed in a short time. It is also preferable to provide tension-cutting mechanisms before and after the heating furnace on the transport path of the substrate 10. This allows the transport tension of the copper-clad laminate 1 in the heating furnace to be set as desired.

(電解めっき工程)
めっき槽では電解めっき工程が行なわれる。基材10はめっき槽内を搬送されつつ、電解めっきよりその表面に銅めっき被膜20が成膜される。これにより、長尺帯状の銅張積層板1が得られる。
(Electrolytic plating process)
An electrolytic plating process is carried out in the plating tank. While the substrate 10 is transported through the plating tank, a copper plating film 20 is formed on the surface of the substrate 10 by electrolytic plating. In this way, a long strip-shaped copper-clad laminate 1 is obtained.

めっき槽には銅めっき液が貯留されている。銅めっき液は水溶性銅塩を含む。銅めっき液に一般的に用いられる水溶性銅塩であれば特に限定されず用いられる。銅めっき液は硫酸を含んでもよい。硫酸の添加量を調整することで、銅めっき液のpHおよび硫酸イオン濃度を調整できる。銅めっき液は一般的にめっき液に添加される添加剤を含んでもよい。添加剤として、ブライトナー成分、レベラー成分、ポリマー成分、塩素成分などから選択された1種類を単独で用いてもよいし、2種類以上を組み合わせて用いてもよい。 A copper plating solution is stored in the plating tank. The copper plating solution contains a water-soluble copper salt. Any water-soluble copper salt that is generally used in copper plating solutions may be used without any particular limitation. The copper plating solution may contain sulfuric acid. The pH and sulfate ion concentration of the copper plating solution can be adjusted by adjusting the amount of sulfuric acid added. The copper plating solution may contain additives that are generally added to plating solutions. As the additive, one type selected from a brightener component, a leveler component, a polymer component, a chlorine component, etc. may be used alone, or two or more types may be used in combination.

銅めっき液の各成分の含有量は任意に選択できる。ただし、銅めっき液は銅を15~70g/L、硫酸を20~250g/L含有することが好ましい。そうすれば、銅めっき被膜20を十分な速度で成膜できる。銅めっき液はブライトナー成分を1~50mg/L含有することが好ましい。そうすれば、析出結晶を微細化し銅めっき被膜20の表面を平滑にできる。銅めっき液はレベラー成分を1~300mg/L含有することが好ましい。そうすれば、突起を抑制し平坦な銅めっき被膜20を成膜できる。銅めっき液はポリマー成分を10~1,500mg/L含有することが好ましい。そうすれば、基材10端部への電流集中を緩和し均一な銅めっき被膜20を成膜できる。銅めっき液は塩素成分を20~80mg/L含有することが好ましい。そうすれば、異常析出を抑制できる。 The content of each component in the copper plating solution can be selected as desired. However, the copper plating solution preferably contains 15 to 70 g/L of copper and 20 to 250 g/L of sulfuric acid. This allows the copper plating film 20 to be formed at a sufficient speed. The copper plating solution preferably contains 1 to 50 mg/L of a brightener component. This allows the precipitated crystals to be finer and the surface of the copper plating film 20 to be smooth. The copper plating solution preferably contains 1 to 300 mg/L of a leveller component. This allows protrusions to be suppressed and a flat copper plating film 20 to be formed. The copper plating solution preferably contains 10 to 1,500 mg/L of a polymer component. This allows current concentration at the end of the substrate 10 to be alleviated and a uniform copper plating film 20 to be formed. The copper plating solution preferably contains 20 to 80 mg/L of a chlorine component. This allows abnormal precipitation to be suppressed.

銅めっき液の温度は20~35℃が好ましい。また、めっき槽内の銅めっき液を撹拌することが好ましい。例えば、ノズルから噴出させた銅めっき液を基材10に吹き付けることで、銅めっき液を撹拌できる。 The temperature of the copper plating solution is preferably 20 to 35°C. It is also preferable to stir the copper plating solution in the plating tank. For example, the copper plating solution can be stirred by spraying the copper plating solution from a nozzle onto the substrate 10.

(加熱工程)
加熱炉では加熱工程が行なわれる。すなわち、銅めっき被膜20の成膜後、銅めっき被膜20の温風加熱を行なう。加熱工程は、銅張積層板1をロールツーロールにより搬送しつつ銅めっき被膜20に温風を吹き付けて加熱することにより行なわれる。
(Heating process)
A heating step is carried out in the heating furnace. That is, after the copper plating film 20 is formed, the copper plating film 20 is heated with hot air. The heating step is carried out by blowing hot air onto the copper plating film 20 to heat it while transporting the copper-clad laminate 1 by roll-to-roll.

加熱工程の目的は、通常、銅めっき被膜20の乾燥である。そのため、通常の加熱温度(銅張積層板1の温度)は50~70℃、処理時間は1分程度である。 The purpose of the heating process is usually to dry the copper plating film 20. Therefore, the usual heating temperature (temperature of the copper-clad laminate 1) is 50 to 70°C, and the treatment time is about 1 minute.

ところが、本願発明者が、通常は行なわない高温での加熱を行なったところ、加熱温度を高くするほど銅めっき被膜20の結晶子が大きくなることが確認された。また、高温での加熱を行なう場合、銅張積層板1の搬送張力を高くするほど銅めっき被膜20の結晶子が大きくなることが確認された。これより、本願発明者は、加熱工程における加熱温度および搬送張力を特定の条件とすることで、銅めっき被膜20の結晶子を大きくすることの着想を得た。すなわち、本実施形態における加熱工程は、銅めっき被膜20の再結晶を進行させ、結晶子を大きくすることを目的としている。 However, when the inventors of the present application performed heating at a high temperature, which is not normally performed, it was confirmed that the higher the heating temperature, the larger the crystallites of the copper plating film 20. It was also confirmed that when heating at a high temperature, the higher the conveying tension of the copper-clad laminate 1, the larger the crystallites of the copper plating film 20. From this, the inventors of the present application came up with the idea of enlarging the crystallites of the copper plating film 20 by setting the heating temperature and conveying tension in the heating process to specific conditions. In other words, the heating process in this embodiment is intended to promote recrystallization of the copper plating film 20 and enlarge the crystallites.

具体的には、搬送張力を50~105N/mとし、加熱温度を134~170℃とするか、搬送張力を105~160N/mとし、加熱温度を113~170℃とすればよい。そうすれば、銅めっき被膜20の結晶子径を1,500Å以上にできる。銅めっき被膜20の結晶子径を1,500Å以上にすれば、表面抵抗率が0.25Ω/□以下となる。そのため、銅張積層板1から製造されるフレキシブルプリント配線板の高周波信号の処理における伝送損失を低く抑えることができる。 Specifically, the conveying tension is set to 50-105 N/m and the heating temperature is set to 134-170°C, or the conveying tension is set to 105-160 N/m and the heating temperature is set to 113-170°C. This allows the crystallite diameter of the copper plating film 20 to be 1,500 Å or more. If the crystallite diameter of the copper plating film 20 is set to 1,500 Å or more, the surface resistivity will be 0.25 Ω/□ or less. Therefore, the transmission loss in the processing of high-frequency signals in the flexible printed wiring board manufactured from the copper-clad laminate 1 can be kept low.

製造コストの観点からは加熱温度が低い方が好ましい。そこで、上記の範囲で、搬送張力を高くしつつ、加熱温度を低くすることが好ましい。そうすれば、銅めっき被膜20の結晶子径を所望の大きさにしつつ、加熱によるコスト増を抑えることができる。 From the viewpoint of manufacturing costs, a lower heating temperature is preferable. Therefore, within the above range, it is preferable to increase the conveying tension while decreasing the heating temperature. In this way, it is possible to suppress the increase in costs due to heating while achieving the desired crystallite size of the copper plating film 20.

以上のように、電解めっき工程の後に行なわれる加熱工程において、特定の加熱温度、搬送張力とすることにより、銅めっき被膜20の結晶子を大きくできる。加熱工程の処理時間は1~2分でよい。室温再結晶により結晶子を十分な大きさとするには数週間を要する。これに比べると、極めて短時間で銅めっき被膜20の結晶子を大きくできる。 As described above, the crystallites of the copper plating film 20 can be enlarged by using a specific heating temperature and conveying tension in the heating process carried out after the electrolytic plating process. The processing time for the heating process can be 1 to 2 minutes. It takes several weeks to make the crystallites large enough by room temperature recrystallization. In comparison, the crystallites of the copper plating film 20 can be enlarged in an extremely short time.

なお、電解めっき工程と加熱工程とを別々の装置で行なってもよい。すなわち、めっき装置で銅張積層板1を製造して巻取装置でロール状に巻き取った後、別の加熱装置で銅張積層板1をロールツーロールにより搬送しつつ加熱してもよい。ただし、この場合、基材10(銅張積層板1)の繰り出し、巻き取りを2回行なわなければならないので、作業が煩雑になり、また処理時間が長くなる。 The electrolytic plating process and the heating process may be performed in separate devices. That is, the copper-clad laminate 1 may be produced in a plating device and wound into a roll by a winding device, and then the copper-clad laminate 1 may be heated in a separate heating device while being transported in a roll-to-roll manner. In this case, however, the substrate 10 (copper-clad laminate 1) must be unwound and wound twice, making the process more complicated and lengthening the processing time.

また、ロール状に巻回された銅張積層板1をその状態のまま加熱すると、ロールの外側と内側とで温度差が生じ、銅めっき被膜20を均一に加熱できない。しかも、ロールの内部まで加熱しようとすると、長時間(例えば、数時間)を要する。これに対し、ロールツーロールで搬送しながら加熱すれば、銅めっき被膜20を均一に加熱できるし、短時間(1~2分)で処理を完了できる。 In addition, if the copper-clad laminate 1 wound in a roll is heated in that state, a temperature difference occurs between the outside and inside of the roll, and the copper plating film 20 cannot be heated uniformly. Moreover, if the inside of the roll is heated, a long time (e.g., several hours) is required. In contrast, if the copper plating film 20 is heated while being transported by roll-to-roll, the copper plating film 20 can be heated uniformly and the process can be completed in a short time (1 to 2 minutes).

(共通の条件)
ベースフィルムとして、厚さ35μmの長尺帯状のポリイミドフィルム(宇部興産社製 Upilex-35SGAV1)を用意した。ベースフィルムをマグネトロンスパッタリング装置にセットした。マグネトロンスパッタリング装置内にはニッケルクロム合金ターゲットと銅ターゲットとが設置されている。ニッケルクロム合金ターゲットの組成はCrが20質量%、Niが80質量%である。真空雰囲気下で、ベースフィルムの両面に、厚さ25nmのニッケルクロム合金からなる下地金属層を形成し、その上に厚さ100nmの銅薄膜層を形成した。
(Common conditions)
A long strip-shaped polyimide film (Upilex-35SGAV1 manufactured by Ube Industries, Ltd.) having a thickness of 35 μm was prepared as the base film. The base film was set in a magnetron sputtering device. A nickel-chromium alloy target and a copper target were installed in the magnetron sputtering device. The composition of the nickel-chromium alloy target was 20 mass % Cr and 80 mass % Ni. Under a vacuum atmosphere, a base metal layer made of a nickel-chromium alloy having a thickness of 25 nm was formed on both sides of the base film, and a copper thin film layer having a thickness of 100 nm was formed thereon.

ロールツーロール方式のめっき装置を用いて基材の両面に銅めっき被膜を成膜して銅張積層板を得た。基材の搬送経路にはめっき槽と循環式温風加熱炉とが配置されており、基材の一回の搬送で電解めっきと加熱とが行なわれるようになっている。 A copper-plated laminate was obtained by forming a copper plating film on both sides of the substrate using a roll-to-roll plating device. A plating tank and a circulating hot air heating furnace were placed on the substrate transport path, so that electrolytic plating and heating were performed in a single transport of the substrate.

めっき槽に貯留される銅めっき液は硫酸銅を120g/L、硫酸を70g/L、ブライトナー成分を16mg/L、レベラー成分を20mg/L、ポリマー成分を1,100mg/L、塩素成分を50mg/L含有する。ブライトナー成分としてビス(3-スルホプロピル)ジスルフィド(RASCHIG GmbH社製の試薬)を用いた。レベラー成分としてジアリルジメチルアンモニウムクロライド-二酸化硫黄共重合体(ニットーボーメディカル株式会社製 PAS-A―5)を用いた。ポリマー成分としてポリエチレングリコール-ポリプロピレングリコール共重合体(日油株式会社製 ユニルーブ50MB-11)を用いた。塩素成分として塩酸(和光純薬工業株式会社製の35%塩酸)を用いた。 The copper plating solution stored in the plating tank contains 120 g/L copper sulfate, 70 g/L sulfuric acid, 16 mg/L brightener, 20 mg/L leveler, 1,100 mg/L polymer, and 50 mg/L chlorine. Bis(3-sulfopropyl) disulfide (a reagent manufactured by RASCHIG GmbH) was used as the brightener. Diallyldimethylammonium chloride-sulfur dioxide copolymer (PAS-A-5 manufactured by Nittobo Medical Co., Ltd.) was used as the leveler. Polyethylene glycol-polypropylene glycol copolymer (UNILUBE 50MB-11 manufactured by NOF Corporation) was used as the polymer. Hydrochloric acid (35% hydrochloric acid manufactured by Wako Pure Chemical Industries, Ltd.) was used as the chlorine component.

めっき槽に基材を供給し、電解めっきにより基材の両面に厚さ2.0μmの銅めっき被膜を成膜した。電解めっきにおける電流条件は、電流密度1.0A/dm2で1分、3.0A/dm2で1分、5.0A/dm2で1分とした。ここで、銅めっき液の温度を31℃とした。また、電解めっきを施す間、ノズルから噴出させた銅めっき液を基材の表面に対して略垂直に吹き付けることで、銅めっき液を撹拌した。電解めっき中の搬送張力は105N/mに設定した。 The substrate was fed into the plating tank, and a copper plating film having a thickness of 2.0 μm was formed on both sides of the substrate by electrolytic plating. The current conditions in the electrolytic plating were a current density of 1.0 A/dm 2 for 1 minute, 3.0 A/dm 2 for 1 minute, and 5.0 A/dm 2 for 1 minute. The temperature of the copper plating solution was set to 31° C. During the electrolytic plating, the copper plating solution was agitated by spraying the copper plating solution ejected from the nozzle substantially perpendicularly to the surface of the substrate. The conveying tension during the electrolytic plating was set to 105 N/m.

循環式温風加熱炉により加熱工程を行なった。加熱炉の前後には、搬送張力をカットできるサクションローラーを備えており、炉内の搬送張力を任意に設定できる。加熱処理時間は1分とした。 The heating process was carried out in a circulating hot air heating furnace. Suction rollers that can cut the conveying tension are installed before and after the heating furnace, allowing the conveying tension inside the furnace to be set as desired. The heating process time was 1 minute.

得られた銅張積層板の銅めっき被膜の結晶子径を測定した。測定は、株式会社リガク製の全自動多目的X線回折装置SmartLabを用い、(200)面ピークの半値幅からScherrerの式により算出した。なお、測定は、電解めっき完了から18時間後に行なった。 The crystallite diameter of the copper plating film of the obtained copper-clad laminate was measured. The measurement was performed using a fully automated multipurpose X-ray diffraction device SmartLab manufactured by Rigaku Corporation, and the crystallite diameter was calculated from the half-width of the (200) plane peak using the Scherrer formula. The measurement was performed 18 hours after the completion of electrolytic plating.

(試験1)
加熱工程における搬送張力を50N/mとした。また、加熱温度を80、100、11
0、130、150、170℃のいずれかとした。各条件で製造した銅張積層板の結晶子径を表1および図2に示す。
(Test 1)
The conveying tension in the heating step was set to 50 N/m.
The temperature was either 0, 130, 150 or 170° C. The crystallite sizes of the copper-clad laminates produced under each condition are shown in Table 1 and FIG.

(試験2)
加熱工程における搬送張力を105N/mとした。また、加熱温度を50、60、70、80、100、110、130、150、170℃のいずれかとした。各条件で製造した銅張積層板の結晶子径を表1および図2に示す。
(Test 2)
The conveying tension in the heating step was 105 N/m, and the heating temperature was 50, 60, 70, 80, 100, 110, 130, 150, or 170° C. The crystallite diameters of the copper-clad laminates produced under each condition are shown in Table 1 and FIG.

(試験3)
加熱工程における搬送張力を160N/mとした。また、加熱温度を80、100、110、130、150、170℃のいずれかとした。各条件で製造した銅めっき被膜の結晶子径を表1および図2に示す。
(Test 3)
The conveying tension in the heating step was 160 N/m, and the heating temperature was either 80, 100, 110, 130, 150, or 170° C. The crystallite diameters of the copper plating films produced under each condition are shown in Table 1 and FIG.

Figure 0007569006000001
Figure 0007569006000001

表1および図2のグラフから分かるように、加熱温度が50~70℃の範囲では銅めっき被膜の結晶子径は加熱温度によりほとんど変化しない。これに対し、加熱温度を80℃以上とすれば、銅めっき被膜の結晶子径は加熱温度を高くするほど大きくなる。また、加熱温度を80℃以上とした場合、銅めっき被膜の結晶子径は搬送張力を高くするほど大きくなる。 As can be seen from Table 1 and the graph in Figure 2, when the heating temperature is in the range of 50 to 70°C, the crystallite diameter of the copper plating film hardly changes with the heating temperature. In contrast, when the heating temperature is 80°C or higher, the crystallite diameter of the copper plating film increases as the heating temperature is increased. In addition, when the heating temperature is 80°C or higher, the crystallite diameter of the copper plating film increases as the conveying tension is increased.

銅めっき被膜の結晶子径が大きいほど、表面抵抗率が低くなり、高周波パルスの伝送損失を低減できる。そのため、銅めっき被膜の結晶子径は大きいほど好ましい。 The larger the crystallite diameter of the copper plating film, the lower the surface resistivity and the less transmission loss of high-frequency pulses. Therefore, the larger the crystallite diameter of the copper plating film, the more preferable it is.

銅めっき被膜の結晶子径を1,500Å以上にするには、搬送張力を50~105N/mとし、加熱温度を134~170℃とするか、搬送張力を105~160N/mとし、加熱温度を113~170℃とすればよい。 To achieve a crystallite diameter of 1,500 Å or more in the copper plating film, the conveying tension should be 50 to 105 N/m and the heating temperature should be 134 to 170°C, or the conveying tension should be 105 to 160 N/m and the heating temperature should be 113 to 170°C.

銅めっき被膜の結晶子径を2,000Å以上にするには、搬送張力を50~105N/mとし、加熱温度を152~170℃とするか、搬送張力を105~160N/mとし、加熱温度を125~170℃とすればよい。 To achieve a crystallite diameter of 2,000 Å or more in the copper plating film, the conveying tension should be 50 to 105 N/m and the heating temperature should be 152 to 170°C, or the conveying tension should be 105 to 160 N/m and the heating temperature should be 125 to 170°C.

銅めっき被膜の結晶子径を2,500Å以上にするには搬送張力を50~105N/mとし、加熱温度を162~170℃とするか、搬送張力を105~160N/mとし、加熱温度を140~170℃とすればよい。 To achieve a crystallite diameter of 2,500 Å or more in the copper plating film, the conveying tension should be 50 to 105 N/m and the heating temperature should be 162 to 170°C, or the conveying tension should be 105 to 160 N/m and the heating temperature should be 140 to 170°C.

図3に、銅めっき被膜の結晶子径と表面抵抗率との関係を示す。なお、図3のグラフはつぎの手順で行なった試験により得られたものである。共通の条件に記載の手順および条件で基材を作成し、基材の両面に銅めっき被膜を成膜した。循環式温風加熱炉における加熱温度は50℃とし、搬送張力は105N/mとした。得られた銅張積層板に対して、電解めっき完了から2時間後、40時間後、85時間後、229時間後に、結晶子径および表面抵抗率の測定を行なった。表面抵抗率の測定には三菱ケミカルアナリティック製ロレスタAX MCP-T370を用いた。 Figure 3 shows the relationship between the crystallite size and surface resistivity of the copper plating film. The graph in Figure 3 was obtained from a test carried out using the following procedure. A substrate was prepared using the procedure and conditions described under common conditions, and a copper plating film was formed on both sides of the substrate. The heating temperature in the circulating hot air heating furnace was 50°C, and the conveying tension was 105 N/m. The crystallite size and surface resistivity of the resulting copper-clad laminate were measured 2 hours, 40 hours, 85 hours, and 229 hours after the completion of electrolytic plating. A Mitsubishi Chemical Analytical Loresta AX MCP-T370 was used to measure the surface resistivity.

図3のグラフより、銅めっき被膜の結晶子径が大きいほど、表面抵抗率が低いことが分かる。銅めっき被膜の結晶子径を1,500Å以上にすれば、表面抵抗率を0.25Ω/□以下にできる。銅めっき被膜の結晶子径を2,000Å以上にすれば、表面抵抗率を0.23Ω/□以下にできる。銅めっき被膜の結晶子径を2,500Å以上にすれば、表面抵抗率を0.22Ω/□以下にできる。 The graph in Figure 3 shows that the larger the crystallite diameter of the copper plating film, the lower the surface resistivity. If the crystallite diameter of the copper plating film is 1,500 Å or more, the surface resistivity can be reduced to 0.25 Ω/□ or less. If the crystallite diameter of the copper plating film is 2,000 Å or more, the surface resistivity can be reduced to 0.23 Ω/□ or less. If the crystallite diameter of the copper plating film is 2,500 Å or more, the surface resistivity can be reduced to 0.22 Ω/□ or less.

なお、室温再結晶により銅めっき被膜の結晶子径が1,500Åとなるには約1週間を要し、3,000Åとなるには約2週間を要する。これに比べれば、本実施例によれば極めて短時間で銅めっき被膜の結晶子を大きくできる。 It takes about one week for the crystallite diameter of the copper plating film to reach 1,500 Å by room temperature recrystallization, and about two weeks for it to reach 3,000 Å. In comparison, this embodiment makes it possible to enlarge the crystallites of the copper plating film in an extremely short time.

1 銅張積層板
10 基材
11 ベースフィルム
12 金属層
13 下地金属層
14 銅薄膜層
20 銅めっき被膜
REFERENCE SIGNS LIST 1 copper-clad laminate 10 substrate 11 base film 12 metal layer 13 undercoat metal layer 14 thin copper layer 20 copper plating film

Claims (4)

基材の表面に銅めっき被膜を成膜して銅張積層板を得る電解めっき工程と、
前記電解めっき工程の後、前記銅張積層板に付着した液を切る液切工程と、
前記液切工程の後、前記銅張積層板をロールツーロールにより搬送しつつ加熱する加熱工程と、を備え、
前記加熱工程において、搬送張力を50~105N/mとし、加熱温度を134~170℃とするか、搬送張力を105~160N/mとし、加熱温度を113~170℃とする
ことを特徴とする銅張積層板の製造方法。
an electrolytic plating step of forming a copper plating film on the surface of the substrate to obtain a copper-clad laminate;
a liquid draining step of draining the liquid adhering to the copper-clad laminate after the electrolytic plating step;
A heating step of heating the copper-clad laminate while transporting it by roll-to-roll after the liquid-draining step,
In the heating step, the conveying tension is set to 50 to 105 N/m and the heating temperature is set to 134 to 170°C, or the conveying tension is set to 105 to 160 N/m and the heating temperature is set to 113 to 170°C.
ロールツーロールによる前記基材の搬送経路に、前記電解めっき工程を行なうめっき槽と、前記液切工程を行なう液切装置と、前記加熱工程を行なう加熱炉とを配置する
ことを特徴とする請求項1記載の銅張積層板の製造方法。
The method for manufacturing a copper-clad laminate according to claim 1, characterized in that a plating tank for performing the electrolytic plating process, a liquid draining device for performing the liquid draining process, and a heating furnace for performing the heating process are arranged on a roll-to-roll transport path of the substrate.
前記加熱工程において、搬送張力を50~105N/mとし、加熱温度を152~170℃とするか、搬送張力を105~160N/mとし、加熱温度を125~170℃とする
ことを特徴とする請求項1または2記載の銅張積層板の製造方法。
The method for producing a copper-clad laminate according to claim 1 or 2, characterized in that in the heating step, the conveying tension is 50 to 105 N/m and the heating temperature is 152 to 170 ° C., or the conveying tension is 105 to 160 N/m and the heating temperature is 125 to 170 ° C.
前記加熱工程において、搬送張力を50~105N/mとし、加熱温度を162~170℃とするか、搬送張力を105~160N/mとし、加熱温度を140~170℃とする
ことを特徴とする請求項1または2記載の銅張積層板の製造方法。
The method for producing a copper-clad laminate according to claim 1 or 2, characterized in that in the heating step, the conveying tension is 50 to 105 N/m and the heating temperature is 162 to 170 ° C., or the conveying tension is 105 to 160 N/m and the heating temperature is 140 to 170 ° C.
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JP2007002296A (en) 2005-06-23 2007-01-11 Fujifilm Holdings Corp Apparatus for producing film having plated film, and method therefor
JP2007287994A (en) 2006-04-18 2007-11-01 Fujifilm Corp Metal pattern forming method, metal pattern, and printed wiring board
JP2012001793A (en) 2010-06-21 2012-01-05 Sumitomo Metal Mining Co Ltd Method and apparatus for manufacturing metallized resin film
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