JP7618963B2 - Ultrasonic inspection method for round bar material - Google Patents
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本発明は丸棒材の超音波探傷方法に関し、特に表面疵と表面直下の丸棒材内部に生じる表層疵を良好に識別して検出できる超音波探傷方法に関するものである。 The present invention relates to an ultrasonic inspection method for round bar material, and in particular to an ultrasonic inspection method that can easily distinguish and detect surface defects and surface layer defects that occur inside the round bar material just below the surface.
丸棒材の表面近くの疵を探傷する場合には図7に示すように探傷用の超音波ビームUbの横波を使用しその屈折角(セクタースキャン角)を45度程度に設定して行う。しかし、この方法では、丸棒材Mの表面に開口する表面疵M1(図7(1))と丸棒材Mの表面直下の内部に生じる表層疵M2(図7(2))からの疵エコー信号(図8(1)、(2))がほほ同じ大きさで同じ時間帯に現れることがあるため、往々にして両者を区別することが困難であった。 When detecting flaws near the surface of a round bar material, the transverse waves of the ultrasonic beam Ub for flaw detection are used with the refraction angle (sector scan angle) set to about 45 degrees, as shown in Figure 7. However, with this method, the flaw echo signals (Figures 8 (1) and 8 (2)) from the surface flaw M1 (Figure 7 (1)) opening on the surface of the round bar material M and the surface flaw M2 (Figure 7 (2)) occurring just below the surface of the round bar material M can appear at the same time with almost the same magnitude, making it often difficult to distinguish between the two.
そこで、例えば特許文献1では異なるセクタースキャン角を設定して、各セクタースキャン角で得られた疵エコー信号の大きさが所定の閾値を超えたときにそれぞれ表面疵あるいは表層疵があるもと判定する探傷方法が開示されている。 For example, Patent Document 1 discloses a flaw detection method in which different sector scan angles are set and when the magnitude of the flaw echo signal obtained at each sector scan angle exceeds a predetermined threshold, it is determined that there is a surface flaw or a subsurface flaw.
しかし、上記従来の方法では、セクタースキャン角を変更して同様の探傷を繰り返す必要があるために探傷に時間を要し、ラインを流れる丸棒材の探傷を迅速に行えないという問題があった。 However, the conventional method described above requires changing the sector scan angle and repeating the same inspection, which takes time, and there is a problem in that it is not possible to quickly inspect round bar material flowing through the line.
そこで、本発明はこのような課題を解決するもので、表面疵と表層疵を迅速かつ確実に判別できる丸棒材の超音波探傷方法を提供することを目的とする。 Therefore, the present invention aims to solve these problems by providing an ultrasonic flaw detection method for round bar material that can quickly and reliably distinguish between surface flaws and subsurface flaws.
上記目的を達成するために、本第1発明では、丸棒材(M)に向けて斜角探傷用超音波(Ub)を送信しつつこれを前記丸棒材(M)の周面に沿う方向で走査し、前記丸棒材(M)の表面疵(M1)、ないし表面直下の丸棒材(M)内部に生じる表層疵(M2)で反射して戻る反射超音波を受信して疵エコー信号とし、前記斜角探傷用超音波(Ub)の各走査位置と、当該走査位置における疵エコー信号の信号強度の時間変化とから疵エコー画像を作成して、必要数の前記疵エコー画像を学習データ画像として畳み込みニューラルネットワーク(CNN)(3)に与えて学習させ、学習済みの前記畳み込みニューラルネットワーク(3)に対して新たな前記疵エコー画像を与えて当該疵エコー画像に対応する疵が前記表面疵(M1)か表層疵(M2)かを判別させる丸棒材の超音波探傷方法であって、前記疵エコー画像の、疵エコー信号を含む所定領域(X)を表面疵(M1)、表層疵(M2)についてそれぞれ切り出し、前記所定領域(X)を、当該所定領域(X)における全走査位置よりも少ない走査位置で抽出した画像を前記学習データ画像とする。 In order to achieve the above object, in the first invention, an ultrasonic wave for angle beam inspection (Ub) is transmitted toward a round bar material (M) while scanning the round bar material (M) in a direction along the peripheral surface thereof, and reflected ultrasonic waves reflected and returned by surface defects (M1) of the round bar material (M) or surface defects (M2) occurring inside the round bar material (M) just below the surface are received as defect echo signals, and defect echo images are created from each scanning position of the ultrasonic wave for angle beam inspection (Ub) and the time change in the signal intensity of the defect echo signal at the scanning position, and a required number of the defect echo images are convoluted as learning data images to perform neural network analysis. In this ultrasonic inspection method for round bar material, the flaw echo image is fed to a convolutional neural network (CNN) (3) for learning, and a new flaw echo image is fed to the trained convolutional neural network (3) to determine whether the flaw corresponding to the flaw echo image is the surface flaw (M1) or the surface flaw (M2). In the flaw echo image, predetermined areas (X) containing flaw echo signals are cut out for the surface flaw (M1) and the surface flaw (M2), respectively, and images extracted from the predetermined area (X) at scanning positions fewer than all scanning positions in the predetermined area (X) are used as the learning data image.
本第1発明においては、疵エコー画像を作成し、当該疵エコー画像によって予め学習させたニューラルネットワークに、新たな疵エコー画像を与えて当該疵画像に対応する疵が表面疵か表層疵かを判別するようにしたから、表面疵と表層疵を迅速かつ確実に判別することができる。また、抽出される疵エコー信号の数を適宜大小変更することによって、判別の精度とこれとトレードオフの関係にある判別のスピードを探傷対象に応じて適正に選択することができる。 In the first invention, a flaw echo image is created, and a new flaw echo image is given to a neural network that has been trained in advance using the flaw echo image to determine whether the flaw corresponding to the flaw image is a surface flaw or a subsurface flaw, so that surface flaws and subsurface flaws can be quickly and reliably determined. Also, by appropriately changing the number of extracted flaw echo signals, the accuracy of determination and the speed of determination, which are in a trade-off relationship with this, can be appropriately selected according to the object to be detected.
本第2発明では、前記斜角探傷用超音波の送信と受信にフェーズドアレイ探触子(1)を使用する。 In the second invention, a phased array probe (1) is used to transmit and receive the ultrasonic waves for angle beam inspection.
本第2発明によれば、フェーズドアレイ探触子によって斜角探傷用超音波を送信と走査、および反射超音波の受信を簡易かつコンパクトに行うことができる。 According to the second invention, the phased array probe can transmit and scan ultrasonic waves for angle beam inspection, and receive reflected ultrasonic waves in a simple and compact manner.
本第3発明では、前記疵エコー画像は、前記疵エコー信号の信号強度が高い部分は高い明度で表示され、前記疵エコー信号の信号強度が低い部分は低い明度で表示される。 In the third invention , in the flaw echo image, a portion where the signal intensity of the flaw echo signal is high is displayed with high brightness, and a portion where the signal intensity of the flaw echo signal is low is displayed with low brightness.
本第4発明では、前記疵エコー画像は、前記疵エコー信号の信号強度が高い部分は低い明度で表示され、前記疵エコー信号の信号強度が低い部分は高い明度で表示される。 In the fourth invention , in the flaw echo image, a portion where the flaw echo signal has a high signal intensity is displayed in low brightness, and a portion where the flaw echo signal has a low signal intensity is displayed in high brightness.
本第5発明では、前記丸棒材(M)は黒皮材である。 In the fifth invention , the round bar material (M) is a black surface material.
上記カッコ内の符号は、後述する実施形態に記載の具体的手段との対応関係を参考的に示すものである。 The symbols in parentheses above are for reference purposes only and indicate the corresponding relationship with the specific means described in the embodiments below.
以上のように、本発明の丸棒材の超音波探傷方法によれば、表面疵と表層疵を迅速かつ確実に判別することができる。より具体的には、丸棒材が圧延工程、熱処理工程、曲がり矯正工程を経た状態で、その表面が酸化金属である黒錆で覆われた状態のものを対象とすることができる。黒皮材は最表層に黒錆を備えることから、特に表面疵と表層疵等の判別が困難であるが、本発明の方法を適用することで、表面疵と表層疵を迅速かつ確実に判別することが可能となる。 As described above, the ultrasonic inspection method for round bar material of the present invention can quickly and reliably distinguish between surface defects and subsurface defects. More specifically, the method can be used for round bar material that has been through a rolling process, a heat treatment process, and a bending straightening process, and whose surface is covered with black rust, which is a metal oxide. Since black skin material has black rust on the outermost layer, it is particularly difficult to distinguish between surface defects and subsurface defects, but by applying the method of the present invention, it is possible to quickly and reliably distinguish between surface defects and subsurface defects.
なお、以下に説明する実施形態はあくまで一例であり、本発明の要旨を逸脱しない範囲で当業者が行う種々の設計的改良も本発明の範囲に含まれる。 The embodiment described below is merely an example, and various design improvements made by those skilled in the art that do not deviate from the gist of the present invention are also included in the scope of the present invention.
図1には本発明の超音波探傷方法を実施する装置の構成を示す。図1において、金属製丸棒材Mの外周面に対向させてフェーズドアレイ探触子1が設けられている。フェーズドアレイ探触子1では、多数の超音波振動子(図示略)が丸棒材Mの外周に倣って湾曲する送受信面1aを形成するように公知の構造で隣接配置されており、隣接する所定数の超音波振動子を、コンピュータを内蔵した制御装置2から出力される所定の時間差を有する励振信号で振動させることによって、本実施形態では略45度のセクタースキャン角を有して丸棒材の表面およびその直下の表層を含む領域で収束する斜角探傷用超音波たる横波超音波ビームUbを生成している。そして振動させる所定数の超音波振動子の範囲を順次移動させることによって、約90度の角度範囲Dで横波超音波ビームUbを走査して、この範囲にある表面疵M1および表層疵M2からの反射超音波をフェーズドアレイ探触子1で再び受信して、疵エコー信号として制御装置2へ出力している。 Figure 1 shows the configuration of an apparatus for carrying out the ultrasonic flaw detection method of the present invention. In Figure 1, a phased array probe 1 is provided facing the outer periphery of a metal round bar M. In the phased array probe 1, a number of ultrasonic transducers (not shown) are arranged adjacent to each other in a known structure so as to form a transmission/reception surface 1a that curves to follow the outer periphery of the round bar M. In this embodiment, a shear wave ultrasonic beam Ub, which is an ultrasonic beam for angle flaw detection that has a sector scan angle of approximately 45 degrees and converges on the surface of the round bar and the surface layer immediately below it, is generated by vibrating a predetermined number of adjacent ultrasonic transducers with an excitation signal having a predetermined time difference output from a control device 2 having a built-in computer. Then, by sequentially moving the range of the predetermined number of ultrasonic transducers to be vibrated, the shear wave ultrasonic beam Ub is scanned in an angle range D of approximately 90 degrees, and the reflected ultrasonic waves from the surface flaw M1 and surface flaw M2 in this range are received again by the phased array probe 1 and output to the control device 2 as a flaw echo signal.
なお、丸棒材Mの全周について表面疵M1および表層疵M2を検出する場合には、同様の構成のフェーズドアレイ探触子1を丸棒材Mの全周に沿って複数(4つ)設けるか、丸棒材Mを回転させ、ないしフェーズドアレイ探触子1を丸棒材M周りに旋回させる。 When detecting surface defects M1 and surface defects M2 around the entire circumference of the round bar material M, multiple (four) phased array probes 1 of similar configuration are provided around the entire circumference of the round bar material M, or the round bar material M is rotated or the phased array probe 1 is rotated around the round bar material M.
図2には超音波ビームUbを走査し、走査位置を横軸に、疵エコー信号の信号強度の時間変化を縦軸にして制御装置2内で描かれた疵エコー画像(Bスコープ)を示す。ここで、図2の破線で囲った領域の白線部が疵エコー信号に相当する部分である。なお、この場合の疵エコー画像は97ライン(走査位置)/45度の走査位置間隔で得たものである。 Figure 2 shows a flaw echo image (B-scope) drawn in the control device 2 by scanning with an ultrasonic beam Ub, with the horizontal axis representing the scanning position and the vertical axis representing the time change in signal strength of the flaw echo signal. Here, the white line portion in the area surrounded by a dashed line in Figure 2 corresponds to the flaw echo signal. Note that the flaw echo image in this case was obtained at a scanning position interval of 97 lines (scanning positions)/45 degrees.
ここで、前述した図8(1)(2)に示した疵エコー信号では、反射強度の波形を絶対値で換算しているため、正の波形と負の波形の各々を表しておらず、分解能が低くなっているため疵の判定精度に影響が出てしまう。これに対して、図2に示した疵エコー画像(Bスコープ)では、絶対値では換算しておらず、信号強度において、正の疵エコー信号と負の疵エコー信号の双方を反映していることから、図8(1)(2)の疵エコー信号と比較すると分解能が2倍となり、高分解能を有していることが明らかである。 In the flaw echo signal shown in Figures 8(1) and (2) above, the reflection intensity waveform is converted into an absolute value, so it does not represent both positive and negative waveforms, and the resolution is low, which affects the accuracy of flaw determination. In contrast, the flaw echo image (B-scope) shown in Figure 2 is not converted into an absolute value, and the signal intensity reflects both positive and negative flaw echo signals, so it has twice the resolution compared to the flaw echo signals in Figures 8(1) and (2), clearly demonstrating high resolution.
さらに、疵エコー画像は、疵エコー信号の信号強度が高い部分は高い明度で表示され、疵エコー信号の信号強度が低い部分は低い明度で表示されることで高い分解能が得られ、後述する学習データ画像として好適に使用することができる。なお、疵エコー画像は、疵エコー信号の信号強度が高い部分が低い明度で表示され、疵エコー信号の信号強度が低い部分が高い明度で表示されても、同様に高い分解能が得られるから、学習データ画像として好適に使用することができる。 Furthermore, the defect echo image has high resolution because the parts of the defect echo signal with high signal strength are displayed at high brightness and the parts of the defect echo signal with low signal strength are displayed at low brightness, and thus can be suitably used as a learning data image, as described below. Note that the defect echo image can also have high resolution even if the parts of the defect echo signal with high signal strength are displayed at low brightness and the parts of the defect echo signal with low signal strength are displayed at high brightness, and thus can be suitably used as a learning data image, as described below.
所定数得られた疵エコー画像の、疵エコー信号を含む所定領域X(図2)を表面疵M1、表層疵M2についてそれぞれ図3(1)、(2)に示すように切り出し、それぞれについて適当数の学習データ画像とテストデータ画像に振り分ける。一例として、表面疵M1の学習データ画像を309枚、テストデータ画像を1236枚取得し、表層疵M2の学習データ画像を260枚、テストデータ画像を1040枚取得した。 A specific region X (Figure 2) containing the defect echo signal from the specified number of obtained defect echo images is cut out for the surface defect M1 and the surface defect M2 as shown in Figures 3 (1) and (2), respectively, and an appropriate number of learning data images and test data images are allocated for each. As an example, 309 learning data images and 1236 test data images were obtained for the surface defect M1, and 260 learning data images and 1040 test data images were obtained for the surface defect M2.
そして、制御装置2内に構築された図4に示す、適当数の畳み込み層31とプーリング層32、および全結合層33を有する公知の構成の畳み込みニューラルネットワーク(CNN)に、学習データ画像(309枚+260枚)を与えて学習させた後、テストデータ画像(1236枚+1040枚)を与えてテスト正解率を得た。これを表1(1)に示す。 Then, a convolutional neural network (CNN) of a known configuration having an appropriate number of convolutional layers 31, pooling layers 32, and a fully connected layer 33 as shown in FIG. 4, which was constructed in the control device 2, was given training data images (309 images + 260 images) to learn from, and then given test data images (1236 images + 1040 images) to obtain a test accuracy rate. This is shown in Table 1 (1).
表1(1)に示すように、表面疵M1、表層疵M2ともにテスト正解率は100%で非常に良い判定結果を得ている。しかし一方で、生産ラインでの使用を考えた場合に問題となるデータ転送速度は比較的遅く、学習モデル生成の処理時間も比較的長い。なお、表1中のデータ転送速度比率および学習モデル生成の処理時間比率は後述する表1(3)のものを1.0とした時の比率である。 As shown in Table 1 (1), the test accuracy rate for both surface defects M1 and surface defects M2 was 100%, which is an extremely good result. However, on the other hand, the data transfer speed, which is problematic when considering use on a production line, is relatively slow, and the processing time for generating the learning model is also relatively long. Note that the data transfer speed ratios and processing time ratios for generating the learning model in Table 1 are ratios when those in Table 1 (3) described below are taken as 1.0.
そこで、疵エコー信号を含む上記所定領域X(図2)を3ラインの走査位置でのみ抽出した画像(図5)を得て、これより、表面疵M1の学習データ画像を372枚、テストデータ画像を1125枚取得し、表層疵M2の学習データ画像を299枚、テストデータ画像を900枚取得した。続いてCNNに上記各学習データ画像(372枚+299枚)を与えて学習させた後、テストデータ画像(1125枚+900枚)を与えてテスト正解率を得た。これを表1(2)に示す。これによると表面疵M1のテスト正解率は100%、表層疵M2のテスト正解率は99.4%であった。データ転送速度、および学習モデル生成の処理時間はいずれも大きく改善されている。 Therefore, an image (FIG. 5) was obtained by extracting the above-mentioned predetermined region X (FIG. 2) containing the flaw echo signal only at the scanning position of three lines, and from this, 372 learning data images of the surface flaw M1, 1125 test data images, 299 learning data images of the surface flaw M2, and 900 test data images were obtained. Next, the above-mentioned learning data images (372 images + 299 images) were given to the CNN for learning, and then the test data images (1125 images + 900 images) were given to obtain the test accuracy rate. This is shown in Table 1 (2). According to this, the test accuracy rate of the surface flaw M1 was 100%, and the test accuracy rate of the surface flaw M2 was 99.4%. Both the data transfer speed and the processing time for generating the learning model have been greatly improved.
さらに、疵エコー信号を含む上記所定領域X(図2)を1ラインの走査位置でのみ抽出した画像(図6)を得て、表面疵M1の学習データ画像を298枚、テストデータ画像を1203枚取得し、表層疵M2の学習データ画像を246枚、テストデータ画像を992枚取得した。続いてCNNに上記各学習データ画像(298枚+246枚)を与えて学習させた後、テストデータ画像(1203枚+992枚)を与えてテスト正解率を得た。これを表1(3)に示す。これによると表面疵M1のテスト正解率は98.3%、表層疵M2のテスト正解率は98.0%であった。データ転送速度、および学習モデル生成の処理時間はいずれもさらに改善されている。 Furthermore, an image (FIG. 6) was obtained by extracting the above-mentioned predetermined region X (FIG. 2) containing the flaw echo signal only at the scanning position of one line, and 298 learning data images of the surface flaw M1 and 1203 test data images were obtained, and 246 learning data images and 992 test data images were obtained for the surface flaw M2. Next, the above-mentioned learning data images (298 images + 246 images) were given to the CNN for learning, and then the test data images (1203 images + 992 images) were given to obtain the test accuracy rate. This is shown in Table 1 (3). According to this, the test accuracy rate for the surface flaw M1 was 98.3%, and the test accuracy rate for the surface flaw M2 was 98.0%. Both the data transfer speed and the processing time for generating the learning model have been further improved.
このように、CNNに与える疵エコー画像を得るために抽出される疵エコー信号を多くすると(疵エコー画像の精細度を上げると)CNNのテスト正解率(判定結果)は向上するが、一方でデータ転送速度は遅く、学習モデル生成の処理時間は長くなるので、CCNに与える疵エコー画像を得るために抽出する疵エコー信号の数を用途に応じて最適に選択すると良い。 In this way, if more defect echo signals are extracted to obtain the defect echo image to be provided to the CNN (if the resolution of the defect echo image is increased), the CNN test accuracy rate (judgment result) will improve, but on the other hand, the data transfer speed will be slow and the processing time for generating the learning model will be long, so it is best to optimally select the number of defect echo signals extracted to obtain the defect echo image to be provided to the CCN depending on the application.
1…フェーズドアレイ探触子、2…制御装置、3…畳み込みニューラルネットワーク、M…丸棒材、M1…表面疵、M2…表層疵、Ub…横波超音波ビーム(斜角探傷用超音波)。 1...phased array probe, 2...control device, 3...convolutional neural network, M...round bar material, M1...surface defect, M2...surface defect, Ub...transverse wave ultrasonic beam (ultrasonic for angle beam inspection).
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