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JP7739986B2 - Ultrasonic flaw detection method for round bar materials - Google Patents
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JP7739986B2 - Ultrasonic flaw detection method for round bar materials - Google Patents

Ultrasonic flaw detection method for round bar materials

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JP7739986B2
JP7739986B2 JP2021195034A JP2021195034A JP7739986B2 JP 7739986 B2 JP7739986 B2 JP 7739986B2 JP 2021195034 A JP2021195034 A JP 2021195034A JP 2021195034 A JP2021195034 A JP 2021195034A JP 7739986 B2 JP7739986 B2 JP 7739986B2
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flaw
round bar
bar material
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learning
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航平 野▲崎▼
大輔 森
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Daido Steel Co Ltd
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Description

本発明は丸棒材の超音波探傷方法に関し、特に表面疵と表面直下の丸棒材内部に生じる表層疵を良好に識別して検出できる超音波探傷方法に関するものである。 The present invention relates to an ultrasonic flaw detection method for round bar material, and in particular to an ultrasonic flaw detection method that can accurately distinguish and detect surface flaws from surface flaws that occur inside the round bar material just below the surface.

丸棒材の表面近くの疵を探傷する場合には図6に示すように探傷用の超音波ビームUbの横波を使用しその屈折角(セクタースキャン角)を45度程度に設定して行う。しかし、この方法では、丸棒材Mの表面に開口する表面疵M1(図6(1))と丸棒材Mの表面直下の内部に生じる表層疵M2(図6(2))からの疵エコー信号(図7(1)、(2))がほほ同じ大きさで同じ時間帯に現れることがあるため、往々にして両者を区別することが困難であった。 When detecting flaws near the surface of a round bar material, the shear waves of the ultrasonic beam Ub for flaw detection are used, with the refraction angle (sector scan angle) set to approximately 45 degrees, as shown in Figure 6. However, with this method, the flaw echo signals (Figures 7(1) and 7(2)) from the surface flaw M1 (Figure 6(1)) that opens on the surface of the round bar material M and the surface flaw M2 (Figure 6(2)) that occurs just below the surface of the round bar material M can appear at roughly the same magnitude and at the same time, making it often difficult to distinguish between the two.

そこで、例えば特許文献1では異なるセクタースキャン角を設定して、各セクタースキャン角で得られた疵エコー信号の大きさが所定の閾値を超えたときにそれぞれ表面疵あるいは表層疵があるもと判定する探傷方法が開示されている。 For example, Patent Document 1 discloses a flaw detection method in which different sector scan angles are set and the presence of a surface flaw or subsurface flaw is determined when the magnitude of the flaw echo signal obtained at each sector scan angle exceeds a predetermined threshold.

特開2012-225887Patent Publication No. 2012-225887

しかし、上記従来の方法では、セクタースキャン角を変更して同様の探傷を繰り返す必要があるために探傷に時間を要し、ラインを流れる丸棒材の探傷を迅速に行えないという問題があった。 However, with the conventional method described above, it was necessary to change the sector scan angle and repeat the same inspection, which took time, making it difficult to quickly inspect round bar material flowing through the line.

そこで、本発明はこのような課題を解決するもので、表面疵と表層疵を迅速かつ確実に判別できる丸棒材の超音波探傷方法を提供することを目的とする。 The present invention aims to solve these problems by providing an ultrasonic flaw detection method for round bar material that can quickly and reliably distinguish between surface flaws and subsurface flaws.

上記目的を達成するために、本第1発明では、丸棒材(M)に向けて斜角探傷用超音波(Ub)を送信して、前記丸棒材(M)の表面疵(M1)、ないし表面直下の丸棒材(M)内部に生じる表層疵(M2)で反射して戻る反射超音波を受信し、受信信号(Sa)中の疵エコー信号(Sk)をそのピーク値(a)の前後に亘って、使用するニューラルネットワーク(3)につきその学習誤差と学習時間の兼ね合いで予め定めた所定の前記斜角探傷用超音波(Ub)の波長換算長さに対応した時間で抽出して、抽出した前記疵エコー信号(Sk)の信号データを前記ニューラルネットワーク(3)に与えて学習させ、新たな受信信号中の疵エコー信号(Sk)を前記所定の波長換算長さに対応した時間で抽出したものの信号データを、学習済みの前記ニューラルネットワーク(3)に与えて前記疵エコー信号(Sk)に対応する疵が表面疵(M1)か表層疵(M2)かを判別させる。 In order to achieve the above object, in the first invention, an ultrasonic beam for flaw detection (Ub) is transmitted toward a round bar material (M), and the reflected ultrasonic waves reflected and returned by the surface flaws (M1) of the round bar material (M) or the surface flaws (M2) occurring just below the surface of the round bar material (M) are received. The flaw echo signal (Sk) in the received signal (Sa) is detected before and after its peak value (a) at a predetermined angle determined in advance for the neural network (3) used, taking into account the learning error and learning time. The flaw echo signal (Sk) is extracted over a time period corresponding to the wavelength conversion length of the flaw detection ultrasonic wave (Ub), and the signal data of the extracted flaw echo signal (Sk) is given to the neural network (3) for learning, and the signal data of the flaw echo signal (Sk) in the new received signal extracted over a time period corresponding to the predetermined wavelength conversion length is given to the trained neural network (3) to determine whether the flaw corresponding to the flaw echo signal (Sk) is a surface flaw (M1) or a subsurface flaw (M2).

本第1発明においては、ニューラルネットワークを使用したことにより従来のようにセクタースキャン角を変更して同様の探傷を繰り返す必要がないから、表面疵と表層疵の判別探傷を迅速に行うことができ、しかも学習誤差と学習時間の兼ね合いで予め定めた所定の波長換算長さに対応した時間で抽出した疵エコー信号の信号データを上記ニューラルネットワークの学習データとしているから、ニューラルネットワークの学習を必要な学習精度で効率的に行うことができる。加えて、新たな受信信号中の疵エコー信号を上記所定の波長換算長さに対応した時間で抽出したものの信号データを、学習済みの前記ニューラルネットワークに与えて前記疵エコー信号に対応する疵が表面疵か表層疵かを判別させているから、ニューラルネットワークの推論時間を短くすることができ、丸棒材搬送のライン速度が速い場合にも対応することができる。 In the first invention, the use of a neural network eliminates the need to change the sector scan angle and repeat the same flaw detection as in the past, allowing for rapid flaw detection that distinguishes between surface flaws and subsurface flaws. Furthermore, the signal data for the neural network is flaw echo signals extracted over a time corresponding to a predetermined wavelength conversion length, which is determined in advance based on a balance between learning error and learning time. This allows the neural network to be trained efficiently with the required learning accuracy. In addition, signal data for flaw echo signals extracted over a time corresponding to the predetermined wavelength conversion length from a newly received signal is provided to the trained neural network to determine whether the flaw corresponding to the flaw echo signal is a surface flaw or subsurface flaw. This shortens the neural network's inference time and makes it possible to handle fast line speeds for conveying round bar material.

本第2発明では、前記信号データとして、前記所定の波長換算長さに対応した時間で抽出した前記疵エコー信号の二次元の波形画像データを使用する。 In this second invention, the signal data used is two-dimensional waveform image data of the flaw echo signal extracted over a time period corresponding to the specified wavelength conversion length.

本第2発明においては、信号データとして二次元の波形画像データを使用することによって、一次元の波形データを使用するのに比して、表面疵と表層疵の判別精度がより向上する。 In this second invention, by using two-dimensional waveform image data as signal data, the accuracy of distinguishing between surface defects and subsurface defects is improved compared to using one-dimensional waveform data.

上記カッコ内の符号は、後述する実施形態に記載の具体的手段との対応関係を参考的に示すものである。 The symbols in parentheses above indicate, for reference purposes, the correspondence with the specific means described in the embodiments below.

以上のように、本発明の丸棒材の超音波探傷方法によれば、ラインを流れる丸棒材の表面疵と表層疵を迅速かつ確実に判別することができる。 As described above, the ultrasonic flaw detection method for round bar material of the present invention makes it possible to quickly and reliably distinguish between surface defects and subsurface defects on round bar material traveling through a production line.

本発明方法を適用する超音波探傷装置の構成を示す図である。1 is a diagram showing the configuration of an ultrasonic flaw detection device to which the method of the present invention is applied. 探触子で得られる受信信号の波形図とその部分拡大図である。3A and 3B are waveform diagrams of received signals obtained by a probe and enlarged views of parts thereof; 受信信号をデジタル化したデータ列の一例を示す概念図である。FIG. 2 is a conceptual diagram showing an example of a data string obtained by digitizing a received signal. 畳み込みニューラルネットワークの概略構成を示す図である。FIG. 1 is a diagram illustrating a schematic configuration of a convolutional neural network. 波長換算長さに対する平均学習誤差と平均学習時間の関係を示すグラフである。10 is a graph showing the relationship between the average learning error and the average learning time with respect to the wavelength-equivalent length. 従来例を示す斜角探傷の概念的断面図である。FIG. 10 is a conceptual cross-sectional view of an angle beam flaw detection method according to a conventional example. 従来例を示す疵エコー信号の波形図である。FIG. 10 is a waveform diagram of a flaw echo signal showing a conventional example.

なお、以下に説明する実施形態はあくまで一例であり、本発明の要旨を逸脱しない範囲で当業者が行う種々の設計的改良も本発明の範囲に含まれる。 Please note that the embodiment described below is merely an example, and various design improvements made by those skilled in the art that do not deviate from the gist of the present invention are also included within the scope of the present invention.

図1には本発明の超音波探傷方法を実施する装置の構成を示す。図1において、金属製丸棒材Mの外周面に対向させて、単一の広帯域超音波振動子を有する探触子1が設けられている。探触子1は、本実施形態では約45度のセクタースキャン角を有し丸棒材Mの表面およびその直下の表層を含む領域に至る、斜角探傷用超音波たる横波超音波ビームUbを生成している。この超音波ビームUbは普通1.5~3波長の長さのパルス波である。超音波ビームUbが表面疵M1あるいは表層疵M2を含む丸棒材Mの各部で反射されて生じる反射超音波は探触子1で受信されて、受信信号Saとして判別装置2へ入力する。 Figure 1 shows the configuration of an apparatus for implementing the ultrasonic flaw detection method of the present invention. In Figure 1, a probe 1 having a single wideband ultrasonic vibrator is provided facing the outer peripheral surface of a metal round bar material M. In this embodiment, the probe 1 generates a shear wave ultrasonic beam Ub, which is an ultrasonic beam for angle beam flaw detection, with a sector scan angle of approximately 45 degrees and reaches the surface of the round bar material M and the area including the surface layer immediately below it. This ultrasonic beam Ub is typically a pulse wave with a length of 1.5 to 3 wavelengths. The ultrasonic beam Ub is reflected by each part of the round bar material M, including the surface flaw M1 or surface flaw M2, and the reflected ultrasonic waves generated are received by the probe 1 and input to the discrimination device 2 as a received signal Sa.

図2には受信信号Saの一例を示す。受信信号Saには表面疵M1あるいは表層疵M2で反射された疵エコー信号Skが含まれており、これは図中の四角で囲った時間領域内の信号である。受信信号Saは判別装置2内に設けられたAD変換回路(図示略)に入力する。AD変換回路は受信信号Saの正負の最大振幅範囲をカバーできる入力レンジを有し、受信信号SaはAD変換回路で、所定サンプリング時間毎の、振幅に応じた数列(一次元データ列)からなるデジタル信号Sd(図3)に変換される。なお、図3は8ビットのAD変換回路を使用した場合のデジタル信号Sdの一例である。 Figure 2 shows an example of a received signal Sa. The received signal Sa includes a flaw echo signal Sk reflected by a surface flaw M1 or a subsurface flaw M2, which is a signal within the time domain enclosed by a square in the figure. The received signal Sa is input to an AD conversion circuit (not shown) provided within the discrimination device 2. The AD conversion circuit has an input range that can cover the maximum positive and negative amplitude range of the received signal Sa, and the received signal Sa is converted by the AD conversion circuit into a digital signal Sd (Figure 3) consisting of a sequence of numbers (one-dimensional data sequence) corresponding to the amplitude at each specified sampling time. Note that Figure 3 is an example of a digital signal Sd when an 8-bit AD conversion circuit is used.

判別装置2内では、受信信号Saに対応した各デジタル信号Sdのデータ列から疵エコー信号Skのピーク値a(図2)に対応するデータを検出して、当該ピークデータを中央として詳細を後述する前後所定数に亘るデータ(学習データ)を抽出する。この学習データは、図2の四角で囲った時間領域内の疵エコー信号Skに対応するデータである。 In the discrimination device 2, data corresponding to peak value a (Figure 2) of the flaw echo signal Sk is detected from the data sequence of each digital signal Sd corresponding to the received signal Sa, and a predetermined number of pieces of data (learning data) are extracted around the peak data, as described in detail below. This learning data corresponds to the flaw echo signal Sk within the time region enclosed by the square in Figure 2.

学習データは判別装置2内に構成されている公知の構成の畳み込みニューラルネットワーク(CNN)3に与えられる。CNN3は図4に示すような、適当数(例えば9層)の畳み込み層31とプーリング層32、および全結合層33を有しており、複数の既知の表面疵M1と表層疵M2を有する丸棒材Mに、上述のように超音波ビームUbを当てて得られる各受信信号Sa中の疵エコー信号Skに基づく複数の学習データが与えられて学習する。 The training data is provided to a convolutional neural network (CNN) 3 of known configuration configured within the discrimination device 2. As shown in Figure 4, the CNN 3 has an appropriate number of convolutional layers 31 (e.g., nine layers), pooling layers 32, and a fully connected layer 33, and learns by providing multiple training data based on the flaw echo signals Sk in each received signal Sa obtained by irradiating a round bar M having multiple known surface flaws M1 and subsurface flaws M2 with an ultrasonic beam Ub as described above.

ところで、学習データは上述のように、ピークデータの前後の所定数のデータを抽出したものであるが、発明者の実験によれば、学習データのデータ数を多くすればそれに応じて学習精度が向上するというわけではないことが判明した。これを図5で説明する。 As mentioned above, the training data is a set number of data points extracted before and after the peak data. However, the inventors' experiments have shown that increasing the number of training data points does not necessarily improve the training accuracy. This is explained in Figure 5.

図5は、抽出される疵エコー信号Skの長さを波長(λ)換算で横軸に、平均学習誤差(Crossentropy loss ave.:線x)と平均学習時間(learning time ave.:線y)をそれぞれ縦軸にして描いたグラフである。図中の各箱ひげ図は、複数の学習データの順番を入れ替える等によって各10個のCNN3のモデルを作成し、各モデルに対してその学習誤差を測定して得たものである。抽出される疵エコー信号Skの波長(λ)換算長さ(学習データのデータ数に相当)は2.0波長から9.0波長まで0.5波長刻みとなっている。 Figure 5 is a graph showing the wavelength (λ)-converted length of the extracted flaw echo signal Sk on the horizontal axis, and the average learning error (Crossentropy loss ave.: line x) and average learning time (learning time ave.: line y) on the vertical axis. Each boxplot in the figure was obtained by creating 10 CNN3 models by, for example, shuffling the order of multiple learning data sets, and measuring the learning error for each model. The wavelength (λ)-converted length (equivalent to the number of data sets in the learning data) of the extracted flaw echo signal Sk ranges from 2.0 wavelengths to 9.0 wavelengths in 0.5 wavelength increments.

図5より明らかなように、平均学習時間(線y)は波長(λ)換算長さが多くなるほど、つまり学習データのデータ数が多くなるほど長くなるが、平均学習誤差(線x)は、波長(λ)換算長さが5.0λ以下では当該波長(λ)換算長さが長くなるほど小さくなるものの、波長(λ)換算長さが5.0λ以上だと、それ以上波長(λ)換算長さが長くなっても、つまり学習データのデータ数が多くなっても平均学習誤差はそれほど変わらない。したがって、学習時間と学習誤差の兼ね合いから、この例では疵エコー信号Skのピーク値を中央にしてその前後に5.0λの長さに亘る疵エコー信号に対応する学習データのデータ数でCNN3の学習を行うのが学習時間を短くしかつ学習誤差も小さくできる最適の条件ということになる。ただし、学習誤差を可能な限り小さくすることを優先する場合には、平均学習時間が長くなっても、波長(λ)換算長さをもっと長くすなわち学習データのデータ数をもっと多くする選択もあり得る。 As is clear from Figure 5, the average learning time (line y) increases as the wavelength (λ) converted length increases, i.e., the number of pieces of training data increases. However, the average learning error (line x) decreases as the wavelength (λ) converted length increases when the wavelength (λ) converted length is 5.0λ or less. However, when the wavelength (λ) converted length is 5.0λ or more, the average learning error does not change significantly even if the wavelength (λ) converted length increases further, i.e., even if the number of pieces of training data increases. Therefore, in this example, balancing learning time and learning error, the optimal condition for shortening learning time and minimizing learning error is to train CNN3 with a number of pieces of training data corresponding to flaw echo signals extending 5.0λ around the peak value of the flaw echo signal Sk, with the peak value at the center. However, if minimizing learning error is a priority, it may be possible to choose a longer wavelength (λ) converted length, i.e., a larger number of pieces of training data, even if it increases the average learning time.

このような過程で学習させた学習済みCNN3に、学習データと同様の5.0λに相当するデータ数の疵エコー信号を与えることによって、表面疵あるいは表層疵の判定確率を十分大きくすることができ、判定閾値を上げて疵エコー信号に対応する疵が表面疵か表層疵かを精度良く識別することができる。 By providing the trained CNN3, which has been trained through this process, with a number of flaw echo signals equivalent to 5.0λ, the same number as the training data, the probability of determining whether the flaw is a surface flaw or a subsurface flaw can be sufficiently increased, and the determination threshold can be raised to accurately identify whether the flaw corresponding to the flaw echo signal is a surface flaw or a subsurface flaw.

なお、上記実施形態では5.0λの長さの信号に対応する学習データのデータ数とするのが最適としたが、使用するCNN3の畳み込み層31等の層数が変われば図5のグラフは変化するから、常に5.0λの長さの信号に対応する学習データのデータ数が最適であるわけではない。 In the above embodiment, it was assumed that the optimal number of pieces of training data corresponds to a signal with a length of 5.0λ. However, if the number of layers, such as the convolutional layer 31, of the CNN 3 used changes, the graph in Figure 5 will change, so the optimal number of pieces of training data corresponds to a signal with a length of 5.0λ is not always the case.

また、上記実施形態では学習データとして、疵エコー信号Skの一次元のデータ列を使用したが、疵エコー信号Skの波形をそのまま二次元の画像データとしたものを使用しても良い。 Furthermore, in the above embodiment, a one-dimensional data string of the flaw echo signal Sk was used as the learning data, but the waveform of the flaw echo signal Sk may also be used as two-dimensional image data.

1…超音波振動子、2…判別装置、3…ニューラルネットワーク、M…丸棒材、M1…表面疵、M2…表層疵、Sa…受信信号、Sk…疵エコー信号、Ub…斜角探傷用超音波。 1...ultrasonic transducer, 2...discrimination device, 3...neural network, M...round bar material, M1...surface flaw, M2...surface flaw, Sa...received signal, Sk...flaw echo signal, Ub...ultrasonic waves for angle beam flaw detection.

Claims (2)

丸棒材に向けて斜角探傷用超音波を送信して、前記丸棒材の表面疵、ないし表面直下の丸棒材内部に生じる表層疵で反射して戻る反射超音波を受信し、受信信号中の疵エコー信号をそのピーク値の前後に亘って、使用するニューラルネットワークの学習誤差と学習時間の兼ね合いで予め定めた所定の前記斜角探傷用超音波の波長換算長さに対応した時間で抽出して、抽出した前記疵エコー信号の信号データを前記ニューラルネットワークに与えて学習させ、新たな受信信号中の疵エコー信号を前記所定の波長換算長さに対応した時間で抽出したものの信号データを、学習済みの前記ニューラルネットワークに与えて前記疵エコー信号に対応する疵が表面疵か表層疵かを判別させることを特徴とする丸棒材の超音波探傷方法。 An ultrasonic flaw detection method for round bar material, comprising: transmitting ultrasonic waves for angle beam inspection toward the round bar material; receiving reflected ultrasonic waves reflected from surface flaws or surface flaws occurring inside the round bar material just below the surface; extracting flaw echo signals from the received signal around their peak value for a time period corresponding to a predetermined wavelength equivalent length of the ultrasonic waves for angle beam inspection, which is determined in advance based on the learning error and learning time of the neural network used; providing the signal data of the extracted flaw echo signals to the neural network for learning; and providing the signal data of flaw echo signals from a new received signal extracted for a time period corresponding to the predetermined wavelength equivalent length to the trained neural network to determine whether the flaw corresponding to the flaw echo signal is a surface flaw or a subsurface flaw. 前記信号データとして、前記所定の波長換算長さに対応した時間で抽出した前記疵エコー信号の二次元の波形画像データを使用する請求項1に記載の丸棒材の超音波探傷方法。 The ultrasonic flaw detection method for round bar material described in claim 1 uses, as the signal data, two-dimensional waveform image data of the flaw echo signal extracted at a time corresponding to the specified wavelength conversion length.
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