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JP7679753B2 - Inertial Sensors - Google Patents
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JP7679753B2 - Inertial Sensors - Google Patents

Inertial Sensors Download PDF

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JP7679753B2
JP7679753B2 JP2021174533A JP2021174533A JP7679753B2 JP 7679753 B2 JP7679753 B2 JP 7679753B2 JP 2021174533 A JP2021174533 A JP 2021174533A JP 2021174533 A JP2021174533 A JP 2021174533A JP 7679753 B2 JP7679753 B2 JP 7679753B2
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vibrator
mounting
substrate
recess
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JP2022155449A (en
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啓太郎 伊藤
翔太 原田
勝昭 後藤
優輝 稲垣
照久 明石
博文 船橋
貴彦 吉田
祐輔 川合
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Denso Corp
Toyota Motor Corp
Mirise Technologies Corp
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Toyota Motor Corp
Mirise Technologies Corp
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Description

本発明は、微小振動体を備える慣性センサおよびその製造方法に関する。 The present invention relates to an inertial sensor equipped with a micro-vibrator and a method for manufacturing the same.

近年、車両の自動運転のシステム開発が進められており、この種のシステムでは、高精度の自己位置の推定技術が必要である。例えば、いわゆるレベル3の自動運転向けに、GNSS(Global Navigation Satellite Systemの略)とIMU(Inertial Measurement Unitの略)とを備える自己位置推定システムの開発が進められている。IMUは、例えば、3軸のジャイロセンサと3軸の加速度センサから構成される6軸の慣性力センサである。将来的に、いわゆるレベル4以上の自動運転を実現するためには、現状よりもさらに高感度のIMUが求められる。 In recent years, autonomous driving systems for vehicles have been developed, and this type of system requires highly accurate self-location estimation technology. For example, for so-called level 3 autonomous driving, a self-location estimation system equipped with a GNSS (short for Global Navigation Satellite System) and an IMU (short for Inertial Measurement Unit) is being developed. The IMU is, for example, a six-axis inertial force sensor consisting of a three-axis gyro sensor and a three-axis acceleration sensor. In order to realize so-called level 4 or higher autonomous driving in the future, an IMU with even higher sensitivity than the current system will be required.

このような高感度のIMUを実現するためのジャイロセンサとしては、例えば、BRG(Bird-bath Resonator Gyroscopeの略)が有力視されている。BRGは、ワイングラスモードで振動する三次元曲面を有する微小振動体が実装基板に搭載されてなる(例えば特許文献1)。この微小振動体は、振動の状態を表すQ値が10以上に達するため、従来よりも高感度が見込まれる。 As a gyro sensor for realizing such a high-sensitivity IMU, for example, BRG (short for Bird-bath Resonator Gyroscope) is considered to be a promising candidate. BRG is configured by mounting a micro-vibrator having a three-dimensional curved surface that vibrates in wine glass mode on a mounting board (for example, Patent Document 1). This micro-vibrator has a Q value that represents the vibration state of 106 or more, so it is expected to have higher sensitivity than conventional ones.

米国特許出願公開第2019/0094024号明細書US Patent Application Publication No. 2019/0094024

この微小振動体は、例えば、特許文献1に記載のように、石英等の加熱によるリフロー工程が可能な板材を型にセットして溶融させ、固化させることによりワイングラスモードで振動する三次元曲面が形成される。この微小振動体は、上記の加工後の板材を封止材で覆った後、研磨やCMP(Chemical Mechanical Polishingの略)等での不要部分の除去により、実装基板に接合される実装部位と、実装基板への搭載時に中空状態になる三次元形状部位とを有する構造となる。また、この微小振動体は、表裏面を覆う電極膜を備えると共に、搭載される実装基板に形成された複数の電極部と距離を隔てて配置され、これらとキャパシタを形成する。 As described in Patent Document 1, for example, this micro-vibrator is formed by setting a plate material that can be subjected to a reflow process by heating, such as quartz, in a mold, melting it, and solidifying it to form a three-dimensional curved surface that vibrates in wine glass mode. After covering the plate material after the above processing with a sealing material, unnecessary parts are removed by polishing or CMP (short for Chemical Mechanical Polishing), etc., resulting in a structure having a mounting part that is bonded to the mounting board and a three-dimensional shape part that becomes hollow when mounted on the mounting board. In addition, this micro-vibrator has electrode films that cover the front and back surfaces, and is arranged at a distance from multiple electrodes formed on the mounting board on which it is mounted, forming a capacitor with these.

特許文献1に記載のBRGは、互いに距離を隔てて環状に配置された複数の電極部を有する実装基板に、共振器となる微小振動体(BR)が搭載され、BRのリムが中空状態とされる。しかし、このBRGを製造する際に、微小振動体は、実装部位が実装基板の搭載面に対して傾き、実装基板に対して傾いた状態で接合されるおそれがある。この場合、微小振動体は、複数の電極部に対向配置されるリムの面積が場所により異なった状態となる。すると、BRGは、BRと複数の電極部で構成される各キャパシタの静電容量のバラつきが生じ、センサ精度が低下してしまう。 In the BRG described in Patent Document 1, a micro-vibrator (BR) that serves as a resonator is mounted on a mounting board having multiple electrode parts arranged in a ring at a distance from each other, and the rim of the BR is made hollow. However, when this BRG is manufactured, the mounting part of the micro-vibrator may be inclined relative to the mounting surface of the mounting board, and the micro-vibrator may be joined in an inclined state relative to the mounting board. In this case, the area of the rim of the micro-vibrator that faces the multiple electrode parts varies depending on the location. This causes variation in the electrostatic capacitance of each capacitor composed of the BR and the multiple electrode parts in the BRG, reducing the sensor accuracy.

本発明は、上記の点に鑑み、ワイングラスモードで振動する微小振動体が実装基板に実装されてなる慣性センサにおいて、実装基板の複数の電極部に対向配置される微小振動体のリムの面積バラつきを抑制し、センサ精度を向上することを目的とする。 In view of the above, the present invention aims to suppress the variation in the area of the rim of the micro-vibrator arranged opposite multiple electrode portions of the mounting substrate in an inertial sensor in which a micro-vibrator that vibrates in wine glass mode is mounted on a mounting substrate, thereby improving the sensor accuracy.

上記目的を達成するため、請求項1ないし3に記載の慣性センサは、慣性センサであって、外径が大きい側の面である表面(2a)と表面の反対面である裏面(2b)とを有する薄肉部材であって、環状曲面を備える曲面部(21)と、曲面部から裏面の側に凹んだ有底筒状の凹部(22)とを有する微小振動体(2)と、枠体状の内枠部(51)と、互いに距離を隔てつつ、内枠部を囲む配置とされる複数の電極部(53)とを有してなる上部基板(5)が下部基板(4)に接合されてなる実装基板(3)と、実装基板のうち内枠部に囲まれた内側領域に配置される接合部材(52)と、を備え、微小振動体は、凹部のうち裏面の側の底面である実装面(22b)が、内側領域に配置され、接合部材を介して実装基板に接合されており、曲面部のうち凹部とは反対側の端部を含む一部の領域であるリム(211)は、中空状態であり、リムのうち表面と裏面とを繋ぐ面であるリム下面(211c)は、実装面または先端部(28)と同一の平面上に位置している。
そして、請求項1に記載の慣性センサは、微小振動体は、実装面に、裏面から表面に向かって凹んだ実装面凹部(26)と、実装面凹部から実装面に向かって突出する突出部(27)とを有し、実装基板は、突出部に対応する位置決め溝(43)を有し、突出部は、位置決め溝に挿入されている。
請求項2に記載の慣性センサは、微小振動体は、凹部のうち表面における底面近傍の側面に設けられ、表面と裏面とを繋ぐ側面貫通孔(24)を有し、接合部材は、少なくとも一部が側面貫通孔に入り込んでいる。
請求項3に記載の慣性センサは、微小振動体は、実装面に設けられた底面貫通孔(25)を有し、接合部材は、少なくとも一部が底面貫通孔に入り込んでいる。
In order to achieve the above object, the inertial sensor according to claims 1 to 3 is an inertial sensor comprising a micro-vibrator (2) which is a thin-walled member having a front surface (2a) which is a surface on the side with a larger outer diameter and a back surface (2b) which is the opposite surface to the front surface, the micro-vibrator (2) having a curved surface portion (21) with an annular curved surface and a bottomed cylindrical recess (22) recessed from the curved surface portion to the back surface side, an upper substrate (5) having a frame-shaped inner frame portion (51) and a plurality of electrode portions (53) arranged to surround the inner frame portion while being spaced apart from each other, the upper substrate (5) being joined to a lower substrate (4). and a bonding member (52) that is arranged in an inner region of the mounting substrate that is surrounded by an inner frame portion, and the micro-vibrator has a mounting surface (22b) that is the bottom surface of the back surface side of the recess that is arranged in the inner region and bonded to the mounting substrate via the bonding member, a rim (211) that is a partial region of the curved portion that includes the end portion opposite the recess is hollow, and a rim underside (211c) that is a surface of the rim that connects the front surface and the back surface is located on the same plane as the mounting surface or the tip portion (28).
In the inertial sensor described in claim 1, the micro-vibrator has, on its mounting surface, a mounting surface recess (26) recessed from the back surface toward the front surface, and a protrusion (27) protruding from the mounting surface recess toward the mounting surface, and the mounting board has a positioning groove (43) corresponding to the protrusion, and the protrusion is inserted into the positioning groove.
In the inertial sensor described in claim 2, the micro-vibrator is provided on a side surface of the recess near the bottom surface of the front surface, and has a side through hole (24) connecting the front surface and the back surface, and at least a portion of the joining member penetrates into the side through hole.
In the inertial sensor according to the third aspect of the present invention, the micro-vibrator has a bottom surface through-hole (25) provided on the mounting surface, and at least a portion of the bonding member fits into the bottom surface through-hole.

これによれば、三次元曲面を有する曲面部と曲面部から凹んだ凹部とを備える微小振動体が、実装基板に接合され、曲面部のうち凹部とは反対側の端部を含む一領域であるリムが中空状態となる慣性センサである。この慣性センサは、微小振動体が凹部のうち実装基板と接合される実装面またはその先端部と、リムのうち表面と裏面とを繋ぐリム下面とが同一平面に位置している。そのため、微小振動体が実装基板に対して傾いたときであっても、実装面とリム下面とが同じ高さに位置するため、実装基板の複数の電極部に対するリムの高さ方向の位置バラつき、すなわち対向配置されるリムの面積バラつきが低減される。よって、この慣性センサは、微小振動体が実装基板に対して傾いた場合であっても、微小振動体と実装基板の複数の電極部とで構成されるキャパシタの静電容量バラつきが抑制され、センサ精度が向上する。 According to this, a micro-vibrator having a curved surface portion having a three-dimensional curved surface and a recess recessed from the curved surface portion is bonded to a mounting substrate, and a rim, which is a region of the curved surface portion including the end portion opposite the recess, is in a hollow state. In this inertial sensor, the mounting surface of the micro-vibrator in the recess where it is bonded to the mounting substrate or its tip portion and the rim underside connecting the front and back surfaces of the rim are located on the same plane. Therefore, even when the micro-vibrator is tilted with respect to the mounting substrate, the mounting surface and the rim underside are located at the same height, so that the positional variation in the height direction of the rim with respect to the multiple electrodes of the mounting substrate, i.e., the area variation of the rim arranged opposite to the mounting substrate, is reduced. Therefore, in this inertial sensor, even when the micro-vibrator is tilted with respect to the mounting substrate, the capacitance variation of the capacitor formed by the micro-vibrator and the multiple electrodes of the mounting substrate is suppressed, improving the sensor accuracy.

請求項に記載の慣性センサの製造方法は、外径が大きい側の面である表面(2a)と表面の反対面である裏面(2b)とを有する薄肉部材であって、環状曲面を備える曲面部(21)と、曲面部から裏面の側に凹んだ有底筒状の凹部(22)とを有する微小振動体(2)と、枠体状の内枠部(51)と、互いに距離を隔てつつ、内枠部を囲む配置とされる複数の電極部(53)とを有してなる上部基板(5)が下部基板(4)に接合されてなる実装基板(3)と、が接合部材(52)を介して接合されてなる慣性センサの製造方法であって、微小振動体を用意することと、実装基板のうち内枠部に囲まれた内側領域に接合部材を配置することと、接合部材を配置した後、微小振動体のうち凹部を内側領域に配置し、凹部のうち裏面の側の底面である実装面(22b)を接合部材に接触させることと、接合部材を溶融させた後、固化させることで、微小振動体と実装基板とを接合し、微小振動体の曲面部のうち凹部とは反対側の端部であるリム(211)を中空状態とすることと、を含み、微小振動体を用意することにおいては、マイクロメートルオーダーの薄肉基材(20)を加熱溶融し、固化することで、後に曲面部となる曲面部位(201)、および後に凹部となる凹部位(202)を形成した後に、薄肉基材を封止材(E)で封止し、曲面部位、凹部位、および封止材の一部を研磨により除去することで、同一平面上に位置する、実装面、およびリムのうち表面と裏面とを繋ぐリム下面(211c)を形成し、実装面または実装面の近傍に貫通孔(24、25)を形成し、リムを中空状態にすることにおいては、貫通孔に溶融させた接合部材の一部を流し込む A manufacturing method of an inertial sensor according to claim 6 is a manufacturing method of an inertial sensor in which a micro-vibrator (2) is a thin-walled member having a front surface (2a) which is a surface with a larger outer diameter and a back surface (2b) which is the opposite surface to the front surface, the micro-vibrator having a curved surface portion (21) having an annular curved surface and a cylindrical recessed portion (22) with a bottom recessed from the curved surface portion to the back surface side, and a mounting substrate (3) in which an upper substrate (5) having a frame-shaped inner frame portion (51) and a plurality of electrode portions (53) arranged to surround the inner frame portion while being spaced apart from each other, is joined to a lower substrate (4) via a joining member (52), the manufacturing method comprising the steps of: preparing a micro-vibrator; arranging the joining member in an inner region of the mounting substrate surrounded by the inner frame portion; and, after arranging the joining member, arranging the recessed portion of the micro-vibrator in the inner region and bringing the mounting surface (22b), which is the bottom surface of the recessed portion on the back surface side, into contact with the joining member. and melting and then solidifying the bonding material to bond the micro-vibrator and the mounting board, and making the rim (211), which is the end of the curved portion of the micro-vibrator opposite the recess, hollow. In preparing the micro-vibrator, a thin-walled base material (20) on the order of micrometers is heated and melted and solidified to form a curved portion (201) that will later become the curved portion, and a recessed portion (202) that will later become the recess, and then the thin-walled base material is sealed with a sealing material (E). The curved portion, the recessed portion, and part of the sealing material are polished away to form a mounting surface and a rim underside (211c) that connects the front and back surfaces of the rim, which are located on the same plane . Through holes (24, 25) are formed on or near the mounting surface. In making the rim hollow, part of the molten bonding material is poured into the through holes .

これによれば、慣性センサの製造方法であって、薄肉基材を加熱溶融し、固化して曲面部位および凹部位を形成し、研磨することで、同一平面上に位置する実装面およびリム下面を有する微小振動体を形成することを含む。微小振動体の実装面とリム下面とが同一平面上に位置するため、実装基板に微小振動体を接合する際に、微小振動体の傾きが生じた場合であっても、実装基板の複数の電極部に対向配置されるリムの面積バラつきが低減される。よって、微小振動体と実装基板の複数の電極部とで構成されるキャパシタの静電容量バラつきが抑制され、センサ精度が向上した慣性センサを製造することができる。 According to this, the method for manufacturing an inertial sensor includes heating and melting a thin-walled substrate, solidifying it to form curved portions and recessed portions, and polishing it to form a micro-vibrator having a mounting surface and a rim underside located on the same plane. Because the mounting surface and the rim underside of the micro-vibrator are located on the same plane, even if the micro-vibrator is tilted when bonding the micro-vibrator to the mounting board, the variation in the area of the rim that is placed opposite the multiple electrode portions of the mounting board is reduced. Therefore, the variation in the electrostatic capacitance of the capacitor formed by the micro-vibrator and the multiple electrode portions of the mounting board is suppressed, and an inertial sensor with improved sensor accuracy can be manufactured.

請求項に記載の慣性センサの製造方法は、外径が大きい側の面である表面(2a)と表面の反対面である裏面(2b)とを有する薄肉部材であって、環状曲面を備える曲面部(21)と、曲面部から裏面の側に凹んだ有底筒状の凹部(22)と、凹部の底面である実装面(22b)に形成された貫通孔(25)とを有する微小振動体(2)と、枠体状の内枠部(51)と、互いに距離を隔てつつ、内枠部を囲む配置とされる複数の電極部(53)と、内枠部に囲まれた領域に配置された支柱部(55)とを有してなる上部基板(5)が下部基板(4)に接合されてなる実装基板(3)と、が接合部材(52)を介して接合されてなる慣性センサの製造方法であって、微小振動体を用意することと、微小振動体の貫通孔に実装基板の支柱部を挿入し、微小振動体を実装基板に載置することと、実装基板に微小振動体を載置した後、凹部に接合部材を流し込み、固化させることで、微小振動体と実装基板とを接合し、微小振動体の曲面部のうち凹部とは反対側の端部であるリム(211)を中空状態とすることと、を含み、微小振動体を用意することにおいては、マイクロメートルオーダーの薄肉基材(20)を加熱溶融し、固化することで、後に曲面部となる曲面部位(201)、および後に凹部となる凹部位(202)を形成した後に、薄肉基材を封止材(E)で封止し、曲面部位、凹部位、および封止材の一部を研磨により除去することで、同一平面上に位置する、実装面、およびリムのうち表面と裏面とを繋ぐリム下面(211c)を形成する。 A manufacturing method of an inertial sensor according to a seventh aspect of the present invention is a manufacturing method of an inertial sensor in which a micro-vibrator (2) is a thin-walled member having a front surface (2a) which is a surface with a larger outer diameter and a back surface (2b) which is the opposite surface to the front surface, the micro-vibrator (2) having a curved surface portion (21) with an annular curved surface, a cylindrical recess (22) with a bottom recessed from the curved surface portion to the back surface side, and a through hole (25) formed in a mounting surface (22b) which is the bottom surface of the recess, and a mounting board (3) formed by bonding an upper substrate (5) having a frame-shaped inner frame portion (51), a plurality of electrode portions (53) arranged to surround the inner frame portion while being spaced apart from each other, and support portions (55) arranged in an area surrounded by the inner frame portion to a lower substrate (4) via a bonding member (52), the manufacturing method comprising the steps of: preparing a micro-vibrator; The process includes inserting the support portion of the substrate and placing the micro-vibrator on the mounting substrate; and after placing the micro-vibrator on the mounting substrate, pouring a bonding material into the recess and solidifying it to bond the micro-vibrator to the mounting substrate, and making a rim (211), which is the end of the curved portion of the micro-vibrator opposite the recess, hollow. In preparing the micro-vibrator, a thin-walled base material (20) on the order of micrometers is heated, melted, and solidified to form a curved portion (201) that will later become the curved portion, and a recessed portion (202) that will later become the recess, and then sealing the thin-walled base material with a sealing material (E). The curved portion, the recessed portion, and part of the sealing material are polished away to form the mounting surface and the rim underside (211c) that connects the front and back surfaces of the rim, which are located on the same plane.

これによれば、請求項7に記載の慣性センサの製造方法と同様に、実装面とリム下面とが同一平面上に位置することに加え、実装面に貫通孔を有する微小振動体を形成することを含む。一方、実装基板としては、微小振動体の実装面に形成された貫通孔に挿入される支柱部を有するものを用意する。そして、微小振動体の貫通孔に実装基板の支柱部を挿入して載置した後に、微小振動体の凹部に接合部材を流し込み、固化することで、微小振動体と実装基板とを接合する。このような接合工程を経た場合であっても、実装面とリム下面とが同一平面上に位置するため、微小振動体と実装基板の複数の電極部とで構成されるキャパシタの静電容量バラつきが抑制され、センサ精度が向上した慣性センサを製造することができる。 According to this, as with the inertial sensor manufacturing method described in claim 7, in addition to the mounting surface and the rim underside being located on the same plane, a micro-vibrator having a through hole is formed on the mounting surface. Meanwhile, a mounting substrate is prepared that has a support portion that is inserted into the through hole formed on the mounting surface of the micro-vibrator. Then, after inserting and placing the support portion of the mounting substrate into the through hole of the micro-vibrator, a bonding material is poured into the recess of the micro-vibrator and solidified to bond the micro-vibrator to the mounting substrate. Even after such a bonding process, since the mounting surface and the rim underside are located on the same plane, the capacitance variation of the capacitor formed by the micro-vibrator and the multiple electrodes of the mounting substrate is suppressed, and an inertial sensor with improved sensor accuracy can be manufactured.

なお、各構成要素等に付された括弧付きの参照符号は、その構成要素等と後述する実施形態に記載の具体的な構成要素等との対応関係の一例を示すものである。 The reference symbols in parentheses attached to each component indicate an example of the correspondence between the component and the specific components described in the embodiments described below.

第1実施形態に係る慣性センサを示す上面レイアウト図である。FIG. 2 is a top view showing the layout of the inertial sensor according to the first embodiment. 慣性センサに用いられる微小振動体を示す斜視図である。FIG. 2 is a perspective view showing a micro-vibrator used in the inertial sensor. 図2のIII-III間の断面構成を示す断面図である。FIG. 3 is a cross-sectional view showing a cross-sectional configuration taken along line III-III in FIG. 2 . 微小振動体の形成工程のうち部材の用意工程を示す図である。11A to 11C are diagrams showing a process of preparing a member in a process of forming a micro-vibrator. 図4Aに続く工程を示す図である。FIG. 4B is a diagram showing a process following FIG. 4A. 図4Bに続く工程を示す図である。FIG. 4C is a diagram showing a process following FIG. 4B. 図4Cに続く工程を示す図である。FIG. 4D is a diagram showing a process following FIG. 4C. 図2の微小振動体が搭載される実装基板を示す上面レイアウト図である。3 is a top view of a layout showing a mounting substrate on which the microvibrator of FIG. 2 is mounted. 図5のVI-VI間の断面構成を示す断面図である。6 is a cross-sectional view showing a cross-sectional configuration taken along line VI-VI in FIG. 5 . 図5のVII-VII間の断面構成を示す断面図である。FIG. 7 is a cross-sectional view showing a cross-sectional configuration taken along line VII-VII in FIG. 5 . 図1のVIII-VIII間の断面構成を示す断面図である。FIG. 2 is a cross-sectional view showing a cross-sectional configuration taken along line VIII-VIII in FIG. 1 . 図1のIX-IX間の断面構成を示す断面図である。FIG. 2 is a cross-sectional view showing a cross-sectional configuration taken along line IX-IX in FIG. 1 . 比較例の微小振動体を示す断面図である。FIG. 11 is a cross-sectional view showing a micro-vibration body of a comparative example. 図10Aの微小振動体を実装基板に搭載した比較例の慣性センサの断面構成を示す断面である。10B is a cross-sectional view showing a cross-sectional configuration of an inertial sensor of a comparative example in which the micro-vibrator of FIG. 10A is mounted on a mounting substrate. 慣性センサの製造における微小振動体の搭載工程を示す図であって、部材の用意工程を示す図である。10A to 10C are diagrams showing a step of mounting a micro-vibrator in the manufacture of an inertial sensor, and are diagrams showing a step of preparing a member. 図11Aに続く工程を示す図である。FIG. 11B is a diagram showing a process following FIG. 11A. 図11Bに続く工程を示す図である。FIG. 11B is a diagram showing a process following FIG. 図11Cに続く工程を示す図である。FIG. 11D is a diagram showing a process following FIG. 図11Dに続く工程を示す図である。FIG. 11D shows a step following FIG. 第1実施形態の慣性センサに係る微小振動体の変形例を示す断面図である。FIG. 11 is a cross-sectional view showing a modified example of the micro-vibrator of the inertial sensor of the first embodiment. 第1実施形態の慣性センサの変形例を示す断面図である。FIG. 4 is a cross-sectional view showing a modified example of the inertial sensor of the first embodiment. 第2実施形態の慣性センサを示す断面図である。FIG. 11 is a cross-sectional view showing an inertial sensor according to a second embodiment. 第2実施形態の慣性センサに係る微小振動体を示す断面図である。FIG. 11 is a cross-sectional view showing a micro-vibrator in an inertial sensor according to a second embodiment. 第3実施形態の慣性センサを示す断面図である。FIG. 11 is a cross-sectional view showing an inertial sensor according to a third embodiment. 第3実施形態の慣性センサに係る微小振動体を示す断面図である。FIG. 11 is a cross-sectional view showing a micro-vibrator in an inertial sensor according to a third embodiment. 第3実施形態における底面貫通孔の形成方法の一例を説明するための説明図である。13A to 13C are explanatory views for explaining an example of a method for forming a bottom surface through hole in the third embodiment. 第3実施形態の慣性センサの変形例を示す上面レイアウト図である。FIG. 13 is a top view showing a layout of a modified example of the inertial sensor of the third embodiment. 第3実施形態の慣性センサの変形例に係る実装基板を示す上面レイアウト図である。FIG. 13 is a top view showing a layout of a mounting board according to a modified example of the inertial sensor of the third embodiment. 図19のXXI-XXI間の断面構成を示す断面図である。FIG. 20 is a cross-sectional view showing a cross-sectional configuration taken along line XXI-XXI of FIG. 19 . 第4実施形態の慣性センサを示す断面図である。FIG. 13 is a cross-sectional view showing an inertial sensor according to a fourth embodiment. 第4実施形態の慣性センサに係る微小振動体を示す断面図である。FIG. 13 is a cross-sectional view showing a micro-vibrator in an inertial sensor according to a fourth embodiment. 第4実施形態の慣性センサに係る実装基板を示す上面レイアウト図である。FIG. 13 is a top view showing a layout of a mounting board for the inertial sensor according to the fourth embodiment. 図22に示す微小振動体の成形工程のうち部材の用意工程を示す図である。23 is a diagram showing a member preparation step in the molding process of the micro-vibration body shown in FIG. 22. 図24Aに続く工程を示す図である。FIG. 24B is a diagram showing a process following FIG. 24A. 第4実施形態の慣性センサの変形例に係る微小振動体を示す断面図である。FIG. 13 is a cross-sectional view showing a micro-vibrator according to a modified example of the inertial sensor of the fourth embodiment. 第4実施形態の慣性センサの変形例に係る実装基板を示す上面レイアウト図である。FIG. 13 is a top view showing a layout of a mounting board according to a modified example of the inertial sensor of the fourth embodiment. 第4実施形態の慣性センサの変形例を示す断面図である。FIG. 13 is a cross-sectional view showing a modified example of the inertial sensor of the fourth embodiment. 第4実施形態の慣性センサの別の変形例を示す断面図である。FIG. 13 is a cross-sectional view showing another modified example of the inertial sensor of the fourth embodiment. 図29の慣性センサの製造における微小振動体の搭載工程を示す図であって、実装基板への微小振動体の載置工程およびその後の接合部材の充填工程を説明するための説明図である。30 is a diagram showing a step of mounting a micro-vibrator in the manufacture of the inertial sensor of FIG. 29, and is an explanatory diagram for explaining a step of placing the micro-vibrator on a mounting substrate and a subsequent step of filling with a bonding material. FIG. 微小振動体の他の形状例を示す断面図である。11A and 11B are cross-sectional views showing other examples of the shape of the micro-vibrator.

以下、本発明の実施形態について図に基づいて説明する。なお、以下の各実施形態相互において、互いに同一もしくは均等である部分には、同一符号を付して説明を行う。 The following describes embodiments of the present invention with reference to the drawings. In the following embodiments, parts that are the same or equivalent to each other are denoted by the same reference numerals.

(第1実施形態)
実施形態に係る慣性センサ1について、図1~図9を参照して説明する。
First Embodiment
An inertial sensor 1 according to an embodiment will be described with reference to FIGS.

図2では、後述する微小振動体2の構成を分かり易くするため、微小振動体2の一部を省略して断面を示すと共に、微小振動体2の外郭のうち図2に示す角度から見えない部分については破線で示している。 In FIG. 2, in order to make it easier to understand the configuration of the micro-vibrator 2 described later, a portion of the micro-vibrator 2 is omitted to show the cross section, and the portion of the outer periphery of the micro-vibrator 2 that cannot be seen from the angle shown in FIG. 2 is shown by dashed lines.

以下、説明の便宜上、図1に示すように、紙面における左右方向に沿った方向を「x方向」と、同紙面上においてx方向に直交する方向を「y方向」と、xy平面に対する法線方向を「z方向」と、それぞれ称する。図3以降の図中のx、y、z方向は、図1のx、y、z方向にそれぞれ対応するものである。また、本明細書における「上」とは、図中のz方向に沿った方向であって、矢印側を意味し、「下」とは上の反対側を意味する。さらに、本明細書では、例えば図1等に示すように、z方向上側から慣性センサ1または実装基板3を見た状態を「上面視」と称することがある。 For ease of explanation, the direction along the left-right direction on the paper as shown in FIG. 1 will be referred to as the "x-direction", the direction perpendicular to the x-direction on the paper as the "y-direction", and the normal direction to the xy plane as the "z-direction". The x, y, and z directions in FIG. 3 and subsequent figures correspond to the x, y, and z directions in FIG. 1, respectively. In addition, in this specification, "up" refers to the direction along the z-direction in the figure, and refers to the side indicated by the arrow, and "down" refers to the opposite side to the top. Furthermore, in this specification, the state in which the inertial sensor 1 or the mounting board 3 is viewed from above in the z direction, as shown in FIG. 1, for example, may be referred to as "top view".

〔基本構成〕
慣性センサ1は、例えば、図1に示すように、微小振動体2と、実装基板3とを備え、微小振動体2の一部が実装基板3に接合されてなる。慣性センサ1は、ワイングラスモードで振動することが可能な薄肉の微小振動体2と実装基板3のうち後述する複数の電極部53との間における静電容量の変化に基づき、慣性センサ1に印加された角速度を検出する構成となっている。慣性センサ1は、例えば、BRG構造のジャイロセンサであって、自動車等の車両に搭載される用途に適用されると好適であるが、勿論、他の用途にも適用されうる。
[Basic configuration]
1, the inertial sensor 1 includes a micro-vibrator 2 and a mounting substrate 3, with a portion of the micro-vibrator 2 bonded to the mounting substrate 3. The inertial sensor 1 is configured to detect an angular velocity applied to the inertial sensor 1 based on a change in capacitance between the thin-walled micro-vibrator 2 capable of vibrating in a wine glass mode and a plurality of electrode parts 53 (described later) of the mounting substrate 3. The inertial sensor 1 is, for example, a gyro sensor with a BRG structure, and is suitable for use in applications in which it is mounted on a vehicle such as an automobile, but can of course also be used for other applications.

微小振動体2は、例えば図1や図2に示すように、略半球形の三次元曲面の外形を有する曲面部21と、略半球の曲面部21の頂点側から当該半球の中心側に向かうように凹んだ凹部22とを備える。微小振動体2は、曲面部21のうち凹部22とは反対側の端部であるリム211が略円筒形状となっている。微小振動体2は、例えば、曲面部21が椀状の三次元曲面を有し、その振動のQ値が10以上となっている。曲面部21のうち凹部22とは反対側の端部をリム211として、リム211は、例えば、微小振動体2が実装基板3に搭載された際に、表面2a側が実装基板3のうち後述する複数の電極部53と向き合うと共に、複数の電極部53の間隔が等間隔とされる。 1 and 2, the micro-vibrator 2 includes a curved surface portion 21 having an outer shape of a three-dimensional curved surface of a substantially hemisphere, and a recessed portion 22 recessed from the apex side of the substantially hemisphere curved surface portion 21 toward the center side of the hemisphere. The micro-vibrator 2 has a rim 211, which is an end portion of the curved surface portion 21 opposite the recessed portion 22, having a substantially cylindrical shape. For example, the curved surface portion 21 of the micro-vibrator 2 has a bowl-shaped three-dimensional curved surface, and the Q value of the vibration is 10 6 or more. When the micro-vibrator 2 is mounted on the mounting substrate 3, for example, the surface 2a side of the rim 211 faces a plurality of electrode portions 53 of the mounting substrate 3 described later, and the plurality of electrode portions 53 are spaced at equal intervals.

微小振動体2は、例えば図3に示すように、外径が大きいほうの面を表面2aとし、その反対面を裏面2bとして、凹部22のうち裏面2b側のZ方向における底面が実装基板3に接合される実装面22bとなっている。微小振動体2は、例えば、凹部22のうち表面2a側のZ方向における底面が、実装基板3に搭載する際の搬送に用いられる吸着面22aとなっている。微小振動体2は、実装基板3への搭載時において、リム211を含む曲面部21が他の部材と接触しない中空状態となり、中空状態のリム211がワイングラスモードで振動する構造となっている。 As shown in FIG. 3, for example, the micro-vibrator 2 has a surface with a larger outer diameter as the front surface 2a and a back surface 2b as the opposite surface, and the bottom surface of the recess 22 in the Z direction on the back surface 2b side serves as the mounting surface 22b to be bonded to the mounting substrate 3. For example, the bottom surface of the recess 22 in the Z direction on the front surface 2a side serves as the adsorption surface 22a used for transport when mounting the micro-vibrator 2 on the mounting substrate 3. When mounted on the mounting substrate 3, the micro-vibrator 2 has a structure in which the curved surface portion 21 including the rim 211 is in a hollow state where it does not come into contact with other members, and the hollow rim 211 vibrates in a wine glass mode.

微小振動体2は、例えば図3に示すように、リム211のうち表面2aと裏面2bとを繋ぐ面をリム下面211cとして、リム下面211cと実装面22bとが同一の仮想平面22b1を構成する形状となっている。これは、後述する微小振動体2の形成工程において、研磨およびCMPによって、リム下面211cおよび実装面22bを同時に形成した結果である。微小振動体2は、リム下面211cと実装面22bとが同一平面に位置する形状であるため、実装基板3に搭載されたときに、実装基板3の複数の電極部53に対するリム211の高さ方向の位置バラつきが低減される。言い換えると、微小振動体2は、実装基板3への搭載時に、複数の電極部53に対向配置されるリム211の面積バラつきが低減される形状となっている。微小振動体2は、例えば、表面2aおよび裏面2bの全域が導電層23により覆われている。 As shown in FIG. 3, the micro-vibrator 2 has a shape in which the surface of the rim 211 that connects the front surface 2a and the back surface 2b is the rim undersurface 211c, and the rim undersurface 211c and the mounting surface 22b form the same imaginary plane 22b1. This is the result of simultaneously forming the rim undersurface 211c and the mounting surface 22b by polishing and CMP in the formation process of the micro-vibrator 2 described later. Since the rim undersurface 211c and the mounting surface 22b of the micro-vibrator 2 are in the same plane, when the micro-vibrator 2 is mounted on the mounting substrate 3, the positional variation in the height direction of the rim 211 relative to the multiple electrode parts 53 of the mounting substrate 3 is reduced. In other words, the micro-vibrator 2 has a shape that reduces the area variation of the rim 211 that is arranged opposite the multiple electrode parts 53 when mounted on the mounting substrate 3. For example, the entire front surface 2a and back surface 2b of the micro-vibrator 2 are covered with the conductive layer 23.

導電層23は、例えば、限定するものではないが、下地側からCr(クロム)あるいはTi(チタン)と、Au(金)やPt(白金)等の任意の導電性材料との積層膜で構成され、電極膜として機能する。導電層23は、例えば、スパッタリングや蒸着等の任意の真空成膜法により微小振動体2の表面2aおよび裏面2bに成膜される。 The conductive layer 23 is, for example and not limited to, made of a laminated film of Cr (chromium) or Ti (titanium) and any conductive material such as Au (gold) or Pt (platinum) from the base side, and functions as an electrode film. The conductive layer 23 is formed on the front surface 2a and rear surface 2b of the micro-vibration body 2 by any vacuum film formation method such as sputtering or vapor deposition.

微小振動体2は、例えば、石英、ガラス、シリコンやセラミック等の材料で構成されるが、三次元曲面形状とされた曲面部21、および凹部22を形成でき、ワイングラスモードでの振動が可能なものであればよく、これらの材料に限定されない。微小振動体2は、例えば、後述する形成工程により、上記した材料で構成された薄肉基材を加工して形成されることで、曲面部21、凹部22の厚みが20μm~80μmといった具合のマイクロメートルオーダーの薄肉部材となっている。微小振動体2は、例えば、実装基板3の厚み方向に沿った方向を高さ方向として、高さ方向の寸法が2.5mm、リム211の表面2a側の外径が5mmといったミリサイズの形状となっている。 The micro-vibrator 2 is made of materials such as quartz, glass, silicon, and ceramic, but is not limited to these materials as long as it can form the curved surface portion 21 and the recessed portion 22 in a three-dimensional curved shape and can vibrate in wine glass mode. The micro-vibrator 2 is formed by processing a thin-walled base material made of the above-mentioned materials, for example, in a forming process described below, to form a thin-walled member on the order of micrometers, with the curved surface portion 21 and the recessed portion 22 having thicknesses of 20 μm to 80 μm. The micro-vibrator 2 has a millimeter-sized shape, for example, with the height direction being along the thickness direction of the mounting substrate 3, with a height dimension of 2.5 mm and an outer diameter of the rim 211 on the surface 2a side being 5 mm.

微小振動体2は、例えば、次のような工程により形成される。 The micro-vibration body 2 is formed, for example, by the following process.

まず、例えば図4Aに示すように、石英板20、三次元曲面形状を形成するための型Mおよび型Mを冷却するための冷却体Cを用意する。型Mは、例えば、石英板20に三次元曲面形状を形成する際のスペースとなる凹部M1と、凹部M1の中心において、凹部M1の深さ方向に沿って延設され、加工時に石英板20の一部を支える柱状の支持部M2とを備える。型Mは、凹部M1の底面に貫通孔M11が形成されており、冷却体Cに取り付けられることで、貫通孔M11が冷却体Cに連通する構成となっている。冷却体Cは、型Mが嵌め込まれる嵌め込み部C1と、嵌め込み部C1の底面に排気用の排気口C11とを備え、石英板20を加工する際に型Mを冷却する役割を果たす。石英板20は、型Mの凹部M1の全域を覆うように配置される。 First, as shown in FIG. 4A, for example, a quartz plate 20, a mold M for forming a three-dimensional curved shape, and a cooling body C for cooling the mold M are prepared. The mold M includes, for example, a recess M1 that serves as a space when forming a three-dimensional curved shape on the quartz plate 20, and a columnar support M2 that extends along the depth direction of the recess M1 at the center of the recess M1 and supports a part of the quartz plate 20 during processing. The mold M has a through hole M11 formed in the bottom surface of the recess M1, and is attached to the cooling body C so that the through hole M11 communicates with the cooling body C. The cooling body C includes an insertion portion C1 into which the mold M is inserted, and an exhaust port C11 on the bottom surface of the insertion portion C1, and serves to cool the mold M when the quartz plate 20 is processed. The quartz plate 20 is arranged to cover the entire area of the recess M1 of the mold M.

続けて、例えば図4Bに示すように、石英板20に向けてトーチTから火炎Fを吹きかけ、石英板20を加熱溶融させる。このとき、型Mの凹部M1は、図示しない真空機構により冷却体Cの排気口C11を通じて真空引きされている。これにより、石英板20のうち溶融した部分は、凹部M1の底面に向かって引き延ばされると共に、その中心周辺領域が支持部M2により支えられた状態となる。その後、石英板20の加熱をやめて冷却することで、石英板20は、略半球形の三次元曲面形状とされた曲面部位201と、支持部M2に支えられることで曲面部位201の中心近傍で凹んだ凹部位202とが形成される。また、石英板20は、凹部M1の外側に位置する部分が、曲面部位201の外周端に位置し、平坦形状とされた端部203となる。 Next, as shown in FIG. 4B, for example, a flame F is blown from a torch T toward the quartz plate 20 to heat and melt the quartz plate 20. At this time, the recess M1 of the mold M is evacuated through the exhaust port C11 of the cooling body C by a vacuum mechanism (not shown). As a result, the molten part of the quartz plate 20 is stretched toward the bottom surface of the recess M1, and its central peripheral area is supported by the support part M2. After that, by stopping the heating of the quartz plate 20 and cooling it, the quartz plate 20 is formed with a curved surface part 201 having a substantially hemispherical three-dimensional curved shape, and a recessed part 202 recessed near the center of the curved surface part 201 by being supported by the support part M2. In addition, the part of the quartz plate 20 located outside the recess M1 is located at the outer peripheral end of the curved surface part 201, and becomes a flat-shaped end part 203.

次いで、型Mの凹部M1を常圧に戻し、加工後の石英板20を取り外し、例えば図4Cに示すように、任意の硬化性樹脂材料によりなる封止材Eで石英板20を封止する。その後、例えば、図4Dに示すように、封止材Eを端部203に近い側の面から研磨およびCMP(Chemical Mechanical Polishingの略)を行い、封止材Eごと端部203および凹部位202の先端部分を除去する。これにより、石英板20は、環状曲面の曲面部21と、曲面部21から凹んだ凹部22を有し、リム下面211cおよび実装面22bが同一平面上に位置する形状となる。 Then, the depression M1 of the mold M is returned to normal pressure, the processed quartz plate 20 is removed, and the quartz plate 20 is sealed with a sealant E made of any curable resin material, as shown in FIG. 4C, for example. After that, as shown in FIG. 4D, for example, the sealant E is polished and CMP (short for Chemical Mechanical Polishing) is performed from the surface close to the end 203, and the end 203 and the tip portion of the recessed portion 202 are removed together with the sealant E. As a result, the quartz plate 20 has a curved surface portion 21 with an annular curved surface and a recessed portion 22 recessed from the curved surface portion 21, and the rim lower surface 211c and the mounting surface 22b are shaped to be located on the same plane.

そして、加熱や薬液を用いた溶解等の任意の方法により、封止材Eをすべて除去し、石英板20を取り出す。最後に、例えば、スパッタリング、蒸着、原子層堆積(ALD)や化学蒸着(CVD)等の任意の成膜プロセスにより、上記の加工後の石英板20の表面および裏面に導電層23を形成する。 Then, all of the sealing material E is removed by any method, such as heating or dissolving with a chemical solution, and the quartz plate 20 is removed. Finally, a conductive layer 23 is formed on the front and back surfaces of the processed quartz plate 20 by any film formation process, such as sputtering, vapor deposition, atomic layer deposition (ALD), or chemical vapor deposition (CVD).

なお、微小振動体2は、例えば、上記のような製造プロセスにより製造され、Z方向を回転軸として回転対称な略ハーフトロイダル形状とされるが、基材の成形については上記の方法に限定されるものではなく、他の公知の方法が採用されても構わない。また、微小振動体2は、ワイングラスモードで振動可能な形状であればよく、BRの形状に限定されるものではない。 The micro-vibration body 2 is manufactured, for example, by the manufacturing process described above, and has a roughly half-toroidal shape that is rotationally symmetric with the Z direction as the axis of rotation, but the method for forming the base material is not limited to the above method, and other known methods may be used. Furthermore, the micro-vibration body 2 is not limited to the BR shape as long as it has a shape that allows it to vibrate in wine glass mode.

実装基板3は、例えば図5に示すように、下部基板4と、上部基板5とを備え、これらが接合された構成となっている。例えば、実装基板3は、絶縁材料のホウケイ酸ガラスにより構成された下部基板4に、半導体材料のSi(シリコン)により構成された上部基板5を陽極接合することで得られる。実装基板3は、内枠部51と、内枠部51を囲むように互いに離隔して配置された複数の電極部53と、電極部53を囲むように配置された外枠部54とを備える。 As shown in FIG. 5, the mounting substrate 3 comprises a lower substrate 4 and an upper substrate 5 which are bonded together. For example, the mounting substrate 3 is obtained by anodically bonding the upper substrate 5 made of a semiconductor material, Si (silicon), to the lower substrate 4 made of an insulating material, borosilicate glass. The mounting substrate 3 comprises an inner frame portion 51, a plurality of electrode portions 53 arranged at a distance from each other to surround the inner frame portion 51, and an outer frame portion 54 arranged to surround the electrode portions 53.

内枠部51は、上面視にて、例えば円環形状となっているが、下部基板4のうち微小振動体2が接合される領域を囲む枠体状であればよく、この形状に限定されない。内枠部51は、例えば図8や図9に示すように、その外径および内径が、断面視にて略M字形状の微小振動体2に当接しない寸法となっている。 The inner frame portion 51 has, for example, a circular ring shape when viewed from above, but is not limited to this shape as long as it is a frame shape that surrounds the area of the lower substrate 4 to which the micro-vibration body 2 is bonded. As shown in Figures 8 and 9, for example, the outer and inner diameters of the inner frame portion 51 are sized so that they do not come into contact with the micro-vibration body 2, which is approximately M-shaped when viewed in cross section.

複数の電極部53は、エッチング溝41の外周側の位置において、内枠部51を囲むように互いに離れて配置されている。複数の電極部53は、例えば図5に示すように、上面視にて、内周側および外周側の辺がそれぞれ円弧状となっており、内周側および外周側の辺それぞれを繋げると、径の異なる断続的な円を描く状態となっている。言い換えると、複数の電極部53は、内枠部51を囲む円環を所定間隔で均等に分割した構成となっている。 The multiple electrode portions 53 are arranged at a distance from one another around the inner frame portion 51 at positions on the outer periphery of the etching groove 41. As shown in FIG. 5, for example, when viewed from above, the multiple electrode portions 53 have inner and outer periphery sides each having an arc shape, and when the inner and outer periphery sides are connected, they form intermittent circles of different diameters. In other words, the multiple electrode portions 53 are configured such that a ring surrounding the inner frame portion 51 is evenly divided at predetermined intervals.

複数の電極部53は、例えば図6に示すように、それぞれ上面に電極膜531が形成されている。複数の電極部53は、例えば、電極膜531に図示しないワイヤが接続され、図示しない外部の回路基板等と電気的に接続されることで、電位の制御が可能となっている。複数の電極部53は、いずれも、例えば図1や図8に示すように、微小振動体2が搭載されたとき、微小振動体2のリム211と所定の距離を隔てた状態となり、それぞれが微小振動体2とキャパシタを形成する。つまり、実装基板3は、複数の電極部53を介して、微小振動体2との間の静電容量を検出したり、微小振動体2との間に静電引力を生じさせ、微小振動体2をワイングラスモードで振動させたりすることが可能となっている。 As shown in FIG. 6, the electrode film 531 is formed on the upper surface of each of the electrode parts 53. The electrode parts 53 are electrically connected to an external circuit board or the like (not shown) by connecting wires (not shown) to the electrode film 531, so that the potential of the electrode parts 53 can be controlled. When the micro-vibrator 2 is mounted, each of the electrode parts 53 is spaced a predetermined distance from the rim 211 of the micro-vibrator 2, as shown in FIG. 1 or FIG. 8, for example. Each of the electrode parts 53 forms a capacitor with the micro-vibrator 2. In other words, the mounting board 3 can detect the electrostatic capacitance between the micro-vibrator 2 and the mounting board 3 through the electrode parts 53, generate electrostatic attraction between the micro-vibrator 2 and vibrate the micro-vibrator 2 in wine glass mode.

なお、実装基板3の「内周側」とは、図5に示すような上面視において、内枠部51に囲まれた内側領域の中心側を意味し、「外周側」とは、内周側とは反対に位置する側を意味する。また、図1等には、実装基板3に16個の電極部53が互いに離れて環を描くように均等配置された例を示しているが、これに限定されるものではなく、電極部53の数や配置については微小振動体2の形状やサイズ等に応じて適宜変更されうる。 The "inner circumference side" of the mounting substrate 3 means the center side of the inner region surrounded by the inner frame portion 51 in a top view as shown in FIG. 5, and the "outer circumference side" means the side located opposite the inner circumference side. Also, FIG. 1 and other figures show an example in which 16 electrode portions 53 are evenly arranged on the mounting substrate 3 so as to form a ring at a distance from each other, but this is not limited to this, and the number and arrangement of the electrode portions 53 can be changed as appropriate depending on the shape and size of the micro-vibration body 2, etc.

外枠部54は、上面視にて、内枠部51を囲む1つの枠体形状とされ、例えば図5や図7に示すように、上面にAl等によりなる電極膜541を備える。外枠部54は、電極膜541に図示しないワイヤが接続され、図示しない外部の回路基板等と電気的に接続されることで、図示しない外部の電源等により、外枠部54の電位制御が可能となっている。 When viewed from above, the outer frame portion 54 is in the shape of a single frame surrounding the inner frame portion 51, and has an electrode film 541 made of Al or the like on its upper surface, as shown in, for example, Figures 5 and 7. The outer frame portion 54 has wires (not shown) connected to the electrode film 541, and is electrically connected to an external circuit board (not shown), etc., so that the potential of the outer frame portion 54 can be controlled by an external power source (not shown).

実装基板3は、上面視にて、円環形状の内枠部51よりも外周側の位置に、内枠部51を囲む環状のエッチング溝41が形成されている。これにより、微小振動体2が実装基板3に搭載されたとき、微小振動体2は、例えば図8や図9に示すように、リム211を含む曲面部21が中空状態となる。 When viewed from above, the mounting substrate 3 has an annular etching groove 41 formed at a position on the outer periphery side of the annular inner frame portion 51, surrounding the inner frame portion 51. As a result, when the micro-vibrator 2 is mounted on the mounting substrate 3, the curved surface portion 21 including the rim 211 of the micro-vibrator 2 becomes hollow, as shown in, for example, Figures 8 and 9.

実装基板3は、例えば図5に示すように、上面視にて、下部基板4のエッチング溝41を跨ぎつつ、内枠部51と外枠部54と繋ぐブリッジ配線42を備える。ブリッジ配線42は、例えばAl(アルミニウム)等の導電性材料により構成されると共に、複数の電極部53の間を通過する配置とされ、複数の電極部53とは電気的に独立している。ブリッジ配線42は、例えば図7に示すように、その一端が外枠部54により覆われ、その反対側の他端が内枠部51により覆われている。これにより、ブリッジ配線42は、内枠部51と外枠部54とを電気的に接続し、これらを同電位とする役割を果たす。また、実装基板3のうち内枠部51に囲まれた内側領域には接合部材52が配置され、微小振動体2が接合されるため、外枠部54は、ブリッジ配線42、内枠部51および接合部材52を介して、微小振動体2と電気的に接続される。言い換えると、実装基板3は、外枠部54の電位調整により、微小振動体2の電位調整が可能となっている。なお、ブリッジ配線42の本数や配置等については、図5に示す例に限定されるものではなく、適宜変更されうる。 5, the mounting substrate 3 has a bridge wiring 42 that connects the inner frame portion 51 and the outer frame portion 54 while straddling the etching groove 41 of the lower substrate 4 in a top view. The bridge wiring 42 is made of a conductive material such as Al (aluminum) and is arranged to pass between the multiple electrode portions 53 and is electrically independent from the multiple electrode portions 53. As shown in FIG. 7, one end of the bridge wiring 42 is covered by the outer frame portion 54 and the other end on the opposite side is covered by the inner frame portion 51. As a result, the bridge wiring 42 electrically connects the inner frame portion 51 and the outer frame portion 54 and plays a role of making them at the same potential. In addition, a bonding member 52 is arranged in the inner area surrounded by the inner frame portion 51 of the mounting substrate 3, and the micro-vibrator 2 is bonded thereto, so that the outer frame portion 54 is electrically connected to the micro-vibrator 2 via the bridge wiring 42, the inner frame portion 51, and the bonding member 52. In other words, the mounting substrate 3 is capable of adjusting the potential of the micro-vibrator 2 by adjusting the potential of the outer frame portion 54. Note that the number and arrangement of the bridge wiring 42 are not limited to the example shown in FIG. 5 and can be changed as appropriate.

実装基板3は、例えば、次のような工程により製造されうる。 The mounting substrate 3 can be manufactured, for example, by the following process.

まず、例えば、ホウケイ酸ガラスによりなる下部基板4を用意し、バッファードフッ酸を用いたウエットエッチングにより円環状のエッチング溝41を形成する。その後、エッチング溝41を跨ぐブリッジ配線42を、例えばAlのスパッタによる成膜を用いたリフトオフ法により形成する。なお、ブリッジ配線42の厚みは、例えば、0.1μm程度とされる。 First, a lower substrate 4 made of, for example, borosilicate glass is prepared, and an annular etching groove 41 is formed by wet etching using buffered hydrofluoric acid. Then, a bridge wiring 42 spanning the etching groove 41 is formed by a lift-off method using, for example, Al sputtering to form a film. The thickness of the bridge wiring 42 is, for example, about 0.1 μm.

続けて、例えば、SiによりなるSi基板(後の上部基板5)を用意し、ホウケイ酸ガラスの下部基板4と陽極接合する。次にSi基板に後の内枠部51、複数の電極部53、外枠部54となる領域に区画する溝を公知のエッチング方法により形成する。 Next, a Si substrate (later upper substrate 5) made of, for example, Si is prepared and anodically bonded to the lower substrate 4 made of borosilicate glass. Next, grooves that partition the areas that will later become the inner frame portion 51, the multiple electrode portions 53, and the outer frame portion 54 are formed in the Si substrate by a known etching method.

具体的には、例えば、DRIE(Deep Reactive Ion Etchingの略)によりトレンチエッチングを行って、下部基板4を露出させ、内枠部51、複数の電極部53、外枠部54の各領域を分離させる。これにより、Si基板は、互いに離隔した内枠部51、複数の電極部53、および外枠部54を備える上部基板5となる。また、下部基板4に形成されたエッチング溝41は、このSi基板の区画工程により、上部基板5から露出した状態となる。 Specifically, for example, trench etching is performed by DRIE (short for Deep Reactive Ion Etching) to expose the lower substrate 4 and separate the inner frame portion 51, the multiple electrode portions 53, and the outer frame portion 54. As a result, the Si substrate becomes the upper substrate 5 having the inner frame portion 51, the multiple electrode portions 53, and the outer frame portion 54 that are spaced apart from one another. In addition, the etching grooves 41 formed in the lower substrate 4 are exposed from the upper substrate 5 by this partitioning process of the Si substrate.

最後に、例えば、複数の電極部53および外枠部54の上面にスパッタ等により電極膜531、541を形成する。このような工程の結果、上述した構造の実装基板3が得られる。そして、実装基板3は、微小振動体2が搭載される際に、下部基板4の位置決め溝43内に、接合部材52が配置される。接合部材52は、例えば、AuSn(金錫)、Ag(銀)、Auなどの導電性材料を有してなるペースト状の導電材とされ、内枠部51に囲まれた内側領域に塗布される。 Finally, electrode films 531, 541 are formed on the upper surfaces of the multiple electrode portions 53 and the outer frame portion 54 by sputtering or the like. As a result of this process, the mounting substrate 3 having the above-mentioned structure is obtained. Then, when the micro-vibrator 2 is mounted on the mounting substrate 3, the bonding member 52 is placed in the positioning groove 43 of the lower substrate 4. The bonding member 52 is, for example, a paste-like conductive material made of a conductive material such as AuSn (gold tin), Ag (silver), or Au, and is applied to the inner region surrounded by the inner frame portion 51.

なお、図5等で示す1つの実装基板3は、例えば、ウエハに上記構造の複数の実装基板3となる領域を形成し、ダイシングカット等により個片化することにより得られる。言い換えると、実装基板3の製造については、ウエハレベルでの対応が可能である。 Note that one mounting substrate 3 shown in FIG. 5 etc. can be obtained, for example, by forming areas on a wafer that will become multiple mounting substrates 3 of the above structure, and then dividing the wafer into individual pieces by dicing or the like. In other words, the manufacturing of the mounting substrate 3 can be handled at the wafer level.

また、実装基板3は、例えば、所定以下の真空度とされた真空環境下において、図示しないキャップ部材が微小振動体2に接触しないように取り付けられ、微小振動体2が真空気密封止される。 In addition, the mounting substrate 3 is attached to the micro-vibrator 2 so that a cap member (not shown) does not come into contact with the micro-vibrator 2 in a vacuum environment with a vacuum level equal to or lower than a predetermined level, and the micro-vibrator 2 is vacuum-tightly sealed.

以上が、慣性センサ1の基本的な構成である。慣性センサ1は、駆動時には、複数の電極部53の一部と微小振動体2との間に静電引力を生じさせることで、微小振動体2をワイングラスモードで振動させる。慣性センサ1は、微小振動体2が振動状態のときに、外部からコリオリ力が印加されると、微小振動体2が変位してその振動モードの節の位置が変化する。慣性センサ1は、この振動モードの節の変化を微小振動体2と複数の電極部53との静電容量で検出することで、慣性センサ1に働く角速度の検出が可能となっている。 The above is the basic configuration of the inertial sensor 1. When the inertial sensor 1 is driven, it generates an electrostatic attraction between some of the multiple electrode parts 53 and the micro-vibrator 2, causing the micro-vibrator 2 to vibrate in wine glass mode. When an external Coriolis force is applied to the inertial sensor 1 while the micro-vibrator 2 is in a vibrating state, the micro-vibrator 2 is displaced and the position of the node of the vibration mode changes. The inertial sensor 1 detects the change in the node of this vibration mode by the electrostatic capacitance between the micro-vibrator 2 and the multiple electrode parts 53, making it possible to detect the angular velocity acting on the inertial sensor 1.

この慣性センサ1は、実装面22bとリム下面211cとが同一平面上に位置する形状とされた微小振動体2が実装基板3に接合されることで、リム211と複数の電極部53とで構成される各キャパシタの静電容量バラつきが低減されている。 This inertial sensor 1 has a micro-vibrator 2 shaped so that the mounting surface 22b and the rim underside 211c are located on the same plane, and is joined to a mounting substrate 3, thereby reducing the variation in capacitance of each capacitor formed by the rim 211 and the multiple electrode portions 53.

ここで、微小振動体2の形状による上記の効果について、例えば図10Aに示す比較例の微小振動体6と対比して説明する。 Here, the above effects due to the shape of the micro-vibration body 2 will be explained by comparing it with the micro-vibration body 6 of the comparative example shown in FIG. 10A.

比較例の微小振動体6は、略半球形の曲面部61と、曲面部61の略半球の頂点からその中心に向かって凹む凹部62と、これらを覆う電極膜63とを有し、凹部62の底面62bよりもリム611のリム下面611cがz方向の下側に突き出た形状である。比較例の微小振動体6は、例えば、本実施形態に係る微小振動体2と同様に、図4A~図4Cに示す工程を経た後、不要部分の除去工程を凹部62の底面62bにまで到達しない段階で留めることにより形成される。そのため、比較例の微小振動体6は、リム下面611cが一点鎖線で示すように、同一平面上に位置すると共に、凹部62の底面62bとは異なる平面上に位置する形状となる。 The micro-vibration body 6 of the comparative example has a curved surface portion 61 of a substantially hemispherical shape, a recessed portion 62 recessed from the apex of the substantially hemispherical curved surface portion 61 toward its center, and an electrode film 63 covering these, and has a shape in which the rim lower surface 611c of the rim 611 protrudes downward in the z direction beyond the bottom surface 62b of the recessed portion 62. The micro-vibration body 6 of the comparative example is formed, for example, in the same manner as the micro-vibration body 2 of this embodiment, by going through the steps shown in Figures 4A to 4C, and then stopping the process of removing unnecessary parts at a stage before the bottom surface 62b of the recessed portion 62 is reached. Therefore, the micro-vibration body 6 of the comparative example has a shape in which the rim lower surface 611c is located on the same plane as the bottom surface 62b of the recessed portion 62, as shown by the dashed line, and is located on a different plane from the bottom surface 62b of the recessed portion 62.

上記の不要部分の除去工程において、研削面が凹部62の底面62bに対して傾いた状態となると、比較例の微小振動体6のように、断面視にてリム611の底面62bに対する突出度合いが左右で異なる形状となる。この比較例の微小振動体6を実装基板3に搭載し、比較例の微小振動体6が実装基板3に対して傾いた状態で得られる慣性センサを「比較例の慣性センサ100」と称する。 When the grinding surface is tilted relative to the bottom surface 62b of the recess 62 in the above-mentioned process of removing unnecessary portions, the degree to which the rim 611 protrudes relative to the bottom surface 62b differs on the left and right sides in cross-sectional view, as in the micro-vibration body 6 of the comparative example. When the micro-vibration body 6 of the comparative example is mounted on the mounting substrate 3 and an inertial sensor is obtained in a state in which the micro-vibration body 6 of the comparative example is tilted relative to the mounting substrate 3, this is referred to as the "inertial sensor 100 of the comparative example."

具体的には、比較例の慣性センサ100は、例えば図10Bに示すように、比較例の微小振動体6が傾き、実装基板3の複数の電極部53ごとに、対向配置されるリム611の面積が大きく異なった状態となる。例えば、比較例の微小振動体6は、z方向におけるリム下面611cの高さ位置に分布が生じ、リム611が電極部53のうちz方向に沿った側面の一部とのみ向き合う箇所と、電極部53の側面全部と向き合う箇所とが生じる。この場合、側面の全域がリム611およびこれを覆う電極膜63と向き合う電極部53は、側面の一部のみがリム611およびこれを覆う電極膜63と向き合う他の電極部53に比べて、その静電容量が大きくなる。つまり、比較例の慣性センサ100は、複数の電極部53ごとに静電容量のバラつきが大きい構成であり、センサ精度が低下してしまう。 Specifically, in the inertial sensor 100 of the comparative example, as shown in FIG. 10B, the micro-vibrator 6 of the comparative example is tilted, and the area of the rim 611 arranged opposite each of the multiple electrode parts 53 of the mounting substrate 3 is greatly different. For example, in the micro-vibrator 6 of the comparative example, a distribution occurs in the height position of the rim lower surface 611c in the z direction, and there are parts where the rim 611 faces only a part of the side surface of the electrode part 53 along the z direction, and parts where it faces the entire side surface of the electrode part 53. In this case, the electrode part 53 whose entire side surface faces the rim 611 and the electrode film 63 covering it has a larger capacitance than the other electrode part 53 whose only a part of the side surface faces the rim 611 and the electrode film 63 covering it. In other words, the inertial sensor 100 of the comparative example has a configuration in which the capacitance varies greatly for each of the multiple electrode parts 53, and the sensor accuracy decreases.

これに対して、本実施形態の慣性センサ1は、実装面22bとリム下面211cとが同一平面上に位置する微小振動体2を用いて構成されるため、微小振動体2が傾いたとしても、電極部53と対向配置されるリム211の面積バラつきが低減される。その結果、慣性センサ1は、比較例の慣性センサ100に比べて、リム211と複数の電極部53とで構成される各キャパシタの静電容量バラつきが低減され、センサ精度が向上する効果が得られる。 In contrast, the inertial sensor 1 of this embodiment is configured using a micro-vibrator 2 in which the mounting surface 22b and the rim underside 211c are located on the same plane, so even if the micro-vibrator 2 is tilted, the area variation of the rim 211 arranged opposite the electrode portion 53 is reduced. As a result, the inertial sensor 1 has reduced capacitance variation of each capacitor configured by the rim 211 and multiple electrode portions 53 compared to the inertial sensor 100 of the comparative example, and an effect of improving sensor accuracy is obtained.

なお、図10Aは、図3に相当する断面を示す断面図である。図10Bは、図9に相当する断面を示す断面である。 Note that FIG. 10A is a cross-sectional view showing a cross section corresponding to FIG. 3. FIG. 10B is a cross-sectional view showing a cross section corresponding to FIG. 9.

〔慣性センサの製造方法〕
次に、本実施形態の慣性センサ1の製造方法について図11A~図11Eを参照して説明するが、微小振動体2および実装基板3自体の製造については上記したため、ここでは、微小振動体2を実装基板3に接合する工程について主に説明する。
[Inertial sensor manufacturing method]
Next, the manufacturing method of the inertial sensor 1 of this embodiment will be described with reference to Figures 11A to 11E. However, since the manufacture of the micro-vibrator 2 and the mounting substrate 3 themselves has been described above, the process of joining the micro-vibrator 2 to the mounting substrate 3 will be mainly described here.

なお、図11A~図11Eは、図9に示す断面図に相当するものである。また、図11C~図11Eでは、見易くするため、後述するピックアップ機構300の一部のみを簡易的に示すと共に、コレット302の内部を破線で示している。また、図11D、図11Eでは、ピックアップ機構300の移動方向を分かり易くするため、その移動方向を白抜き矢印で示している。 Note that Figures 11A to 11E correspond to the cross-sectional view shown in Figure 9. Also, in Figures 11C to 11E, for ease of viewing, only a portion of the pick-up mechanism 300 (described later) is shown in a simplified manner, and the inside of the collet 302 is shown with a dashed line. Also, in Figures 11D and 11E, for ease of understanding, the movement direction of the pick-up mechanism 300 is shown with a hollow arrow.

まず、図11Aに示すように、例えば、上記の方法により製造した微小振動体2および実装基板3を用意する。その後、例えば、図11Bに示すように、内枠部51に囲まれた内側領域に接合部材52を配置する。接合部材52としては、例えば、AuペーストやAgペースト等の導電性の接合材料が用いられ、シリンジ等を用いた塗布により配置される。 First, as shown in FIG. 11A, for example, a micro-vibrator 2 and a mounting substrate 3 manufactured by the above-mentioned method are prepared. Then, for example, as shown in FIG. 11B, a bonding member 52 is placed in the inner area surrounded by an inner frame portion 51. For example, a conductive bonding material such as Au paste or Ag paste is used as the bonding member 52, and the bonding member 52 is placed by applying it using a syringe or the like.

そして、例えば、実装基板3を図示しないマウンタ装置の吸着面に載置し、真空吸着により実装基板3を固定する。なお、この図示しないマウンタ装置は、吸着面を加熱可能な加熱機構を備えた構成となっている。 Then, for example, the mounting substrate 3 is placed on the suction surface of a mounter device (not shown), and the mounting substrate 3 is fixed by vacuum suction. Note that this mounter device (not shown) is configured with a heating mechanism capable of heating the suction surface.

続いて、例えば図11Cに示すように、微小振動体2の凹部22のうち表面2a側の底部である吸着面22aにピックアップ機構300の一部を挿入し、真空吸着により微小振動体2を把持する。ピックアップ機構300は、例えば、台座部301と、略円筒形状のコレット302とを備え、台座部301が図示しない搬送部および真空機構に接続されており、コレット302による真空吸着と、吸着した物体の搬送とが可能な構成となっている。ピックアップ機構300は、例えば、コレット302の最大径が凹部22の内径よりも小さくされ、コレット302の先端部の外径が他の部分よりも小さくなっている。また、ピックアップ機構300は、コレット302の長さが微小振動体2の凹部22の深さよりも大きく、コレット302を微小振動体2の凹部22に挿入した際に、コレット302が微小振動体2の吸着面22a以外に当接しない構成となっている。これにより、微小振動体2を搬送する際に、微小振動体2の導電層23や基材に傷が生じることが抑止される。 Next, as shown in FIG. 11C, for example, a part of the pickup mechanism 300 is inserted into the suction surface 22a, which is the bottom of the recess 22 of the micro-vibrator 2 on the surface 2a side, and the micro-vibrator 2 is gripped by vacuum suction. The pickup mechanism 300 includes, for example, a base 301 and a collet 302 having a substantially cylindrical shape, and the base 301 is connected to a transport unit and a vacuum mechanism (not shown), and is configured to be capable of vacuum suction by the collet 302 and transport of the object that has been sucked up. For example, the maximum diameter of the collet 302 is smaller than the inner diameter of the recess 22, and the outer diameter of the tip of the collet 302 is smaller than the other parts. In addition, the pickup mechanism 300 is configured such that the length of the collet 302 is greater than the depth of the recess 22 of the micro-vibrator 2, and when the collet 302 is inserted into the recess 22 of the micro-vibrator 2, the collet 302 does not come into contact with anything other than the suction surface 22a of the micro-vibrator 2. This prevents the conductive layer 23 and base material of the micro-vibration body 2 from being damaged when the micro-vibration body 2 is transported.

一方、図示しないマウンタ装置により実装基板3を吸着した状態で加熱し、接合部材52を溶融もしくは軟化させておく。そして、例えば図11Dに示すように、上記のピックアップ機構300を用いて、微小振動体2の吸着面22aを真空吸着により把持しつつ、微小振動体2のうち凹部22の実装面22bを実装基板3の内枠部51の内側に挿入する。そして、微小振動体2を実装基板3側に近づけていき、微小振動体2の実装面22bを接合部材52に接触させる。 Meanwhile, the mounting substrate 3 is heated while being adsorbed by a mounter device (not shown) to melt or soften the bonding member 52. Then, for example as shown in FIG. 11D, the above-mentioned pickup mechanism 300 is used to hold the adsorption surface 22a of the micro-vibrator 2 by vacuum adsorption while the mounting surface 22b of the recess 22 of the micro-vibrator 2 is inserted inside the inner frame portion 51 of the mounting substrate 3. Then, the micro-vibrator 2 is brought closer to the mounting substrate 3, and the mounting surface 22b of the micro-vibrator 2 is brought into contact with the bonding member 52.

なお、微小振動体2の実装基板3に対する位置合わせについては、例えば、微小振動体2および実装基板3を撮像し、公知の画像処理技術によりエッジ検出により特徴点を抽出することで、相対位置を調整するといった方法で行うことができる。 The alignment of the micro-vibrator 2 with respect to the mounting substrate 3 can be achieved, for example, by capturing images of the micro-vibrator 2 and mounting substrate 3 and extracting feature points by edge detection using known image processing techniques, thereby adjusting the relative positions.

その後、図示しないマウンタ装置等の吸着面の温度を下げ、溶融した接合部材52を固化させることで微小振動体2と実装基板3とを接合する。そして、例えば図11Eに示すように、コレット302の内部を常圧に戻して微小振動体2の真空吸着を解除し、ピックアップ機構300を退避させ、コレット302を微小振動体2の凹部22から抜き出す。 Then, the temperature of the suction surface of a mounting device (not shown) is lowered, and the molten bonding material 52 is solidified to bond the micro-vibrator 2 and the mounting substrate 3. Then, as shown in FIG. 11E, for example, the inside of the collet 302 is returned to normal pressure to release the vacuum suction of the micro-vibrator 2, the pickup mechanism 300 is retracted, and the collet 302 is removed from the recess 22 of the micro-vibrator 2.

続いて、図示しないマウンタ装置等による吸着を解除し、微小振動体2が接合された実装基板3を吸着面から取り外す。そして、実装基板3を図示しない回路基板等に搭載し、実装基板3の電極膜531、541にワイヤボンディングをし、回路基板等と実装基板3の電極部53および外枠部54とを電気的に接続する。最後に、例えば、実装基板3あるいは実装基板3が取り付けられる外部の部材に、図示しないキャップ材を真空環境で取り付け、微小振動体2を実装基板3と図示しないキャップ材とによりなる内部空間に気密封止を行う。このような工程により、実施形態に係る慣性センサ1を製造することができる。 Next, the suction by the mounting device (not shown) or the like is released, and the mounting substrate 3 to which the micro-vibrator 2 is bonded is removed from the suction surface. The mounting substrate 3 is then mounted on a circuit substrate (not shown) or the like, and wire bonding is performed on the electrode films 531, 541 of the mounting substrate 3 to electrically connect the circuit substrate or the like to the electrode portion 53 and outer frame portion 54 of the mounting substrate 3. Finally, for example, a cap material (not shown) is attached in a vacuum environment to the mounting substrate 3 or an external member to which the mounting substrate 3 is attached, and the micro-vibrator 2 is hermetically sealed in the internal space formed by the mounting substrate 3 and the cap material (not shown). Through these steps, the inertial sensor 1 according to the embodiment can be manufactured.

以上が、本実施形態の慣性センサ1の基本的な製造方法である。なお、ここでは、微小振動体2を把持する方法として凹部22の吸着面22aを真空吸着する場合を代表例として説明したが、これに限定されるものではない。例えば、コレット302の構成を変更し、凹部22の表面2a側の側壁を真空吸着することで把持してもよいし、機械的に当該側壁を2か所以上で押圧することで把持しても構わない。 The above is the basic manufacturing method of the inertial sensor 1 of this embodiment. Note that, although the method of gripping the micro-vibrator 2 has been described here as a representative example in which the suction surface 22a of the recess 22 is vacuum-sucked, the method is not limited to this. For example, the configuration of the collet 302 may be changed to grip the side wall on the surface 2a side of the recess 22 by vacuum suction, or the side wall may be mechanically pressed at two or more points to grip the micro-vibrator 2.

本実施形態によれば、ワイングラスモードで振動可能な曲面部21と、凹部22とを有し、凹部22のうち裏面2b側の実装面22bとリム611のリム下面611cとが同一平面に位置する微小振動体2が、実装基板3に接合されてなる慣性センサ1となる。実装面22bとリム下面611cとが同一平面に位置することで、微小振動体2が実装基板3に対して傾いた場合であっても、複数の電極部53に対向配置されるリム211の面積バラつきが低減される。そのため、この慣性センサ1は、リム211と複数の電極部53とで構成される各キャパシタの静電容量のバラつきが抑制され、センサ精度が向上する効果が得られる。 According to this embodiment, the micro-vibrator 2 has a curved surface portion 21 that can vibrate in wine glass mode, a recessed portion 22, and the mounting surface 22b of the recessed portion 22 on the back surface 2b side and the rim lower surface 611c of the rim 611 are located on the same plane, and is joined to the mounting substrate 3 to form an inertial sensor 1. By having the mounting surface 22b and the rim lower surface 611c located on the same plane, even if the micro-vibrator 2 is tilted with respect to the mounting substrate 3, the area variation of the rim 211 arranged opposite the multiple electrode portions 53 is reduced. Therefore, this inertial sensor 1 has the effect of suppressing the variation in the electrostatic capacitance of each capacitor formed by the rim 211 and the multiple electrode portions 53, and improving the sensor accuracy.

(第1実施形態の変形例)
上記第1実施形態では、吸着面22aと実装面22bとが平行であると共に、実装面22bとリム下面211cとが同一平面上に位置する形状の微小振動体2を用いた例について説明したが、これに限定されるものではない。
(Modification of the first embodiment)
In the above first embodiment, an example was described in which a micro-vibrator 2 having a shape in which the suction surface 22a and the mounting surface 22b are parallel and the mounting surface 22b and the rim underside 211c are located on the same plane was used, but this is not limited to this.

微小振動体2は、例えば図12に示すように、実装面22bとリム下面211cとが同一平面上に位置する一方で、実装面22bが吸着面22aに対して平行でない形状であってもよい。この場合、慣性センサ1は、例えば図13に示すように、微小振動体2の実装面22bが実装基板3の搭載面に対して平行に配置されると、リム下面211cのz方向における高さ位置が、図13紙面左右方向において同じとなる。言い換えると、慣性センサ1は、複数の電極部53に対して対向配置されるリム211の面積がすべて同じとなっている。仮に、微小振動体2が実装基板3に対して傾いたとしても、実装面22bとリム下面211cとが同一平面上に位置するため、複数の電極部53に対して対向配置されるリム211の面積のバラつきが低減された慣性センサ1となる。 As shown in FIG. 12, the mounting surface 22b and the rim lower surface 211c of the micro-vibrator 2 may be located on the same plane, while the mounting surface 22b may not be parallel to the suction surface 22a. In this case, as shown in FIG. 13, when the mounting surface 22b of the micro-vibrator 2 is arranged parallel to the mounting surface of the mounting board 3, the height position in the z direction of the rim lower surface 211c is the same in the left-right direction of the paper surface of FIG. 13. In other words, in the inertial sensor 1, the areas of the rims 211 arranged opposite the multiple electrode parts 53 are all the same. Even if the micro-vibrator 2 is tilted with respect to the mounting board 3, the mounting surface 22b and the rim lower surface 211c are located on the same plane, so that the inertial sensor 1 has reduced variation in the area of the rims 211 arranged opposite the multiple electrode parts 53.

本変形例によっても、上記第1実施形態と同様の効果が得られる。 This modification also provides the same effects as the first embodiment.

(第2実施形態)
第2実施形態の慣性センサ1について、図14、図15を参照して説明する。図14は、図9に相当する断面を示す断面図である。図15は、図3に相当する断面を示す断面図である。
Second Embodiment
The inertial sensor 1 of the second embodiment will be described with reference to Fig. 14 and Fig. 15. Fig. 14 is a cross-sectional view showing a cross section corresponding to Fig. 9. Fig. 15 is a cross-sectional view showing a cross section corresponding to Fig. 3.

本実施形態の慣性センサ1は、例えば図14に示すように、微小振動体2が凹部22の吸着面22a近傍の側面に形成された貫通孔である側面貫通孔24を備え、接合部材52が側面貫通孔24に流れ込んでいる点で上記第1実施形態と相違する。本実施形態では、この相違点について主に説明する。 The inertial sensor 1 of this embodiment differs from the first embodiment in that, as shown in FIG. 14, the micro-vibrator 2 has a side through-hole 24, which is a through-hole formed on the side surface of the recess 22 near the adsorption surface 22a, and the bonding member 52 flows into the side through-hole 24. This difference will be mainly described in this embodiment.

微小振動体2は、本実施形態では、例えば図15に示すように、凹部22のうち表面2aにおける底面近傍の側面、すなわち吸着面22aに近接する側壁の部分に、基材の表面2aと裏面2bとを繋ぐ側面貫通孔24を備える。側面貫通孔24は、例えば、微小振動体2を構成する薄肉基材(石英等)にレーザ光を照射し、部分的に溶融させる等の方法により形成される。また、側面貫通孔24は、例えば図4Aに示す工程において、石英板20のうち型Mの支持部M2の少し外側に位置する領域にあらかじめ貫通孔を開けておく等の方法でも形成されうる。側面貫通孔24は、例えば図14に示すように、微小振動体2を実装基板3に搭載したときにおいて、凹部22のうち内枠部51のz方向の高さよりも低い位置に形成される。側面貫通孔24は、例えば、上面視にて対称となる位置に離れて2つ形成されるが、これに限定されるものではなく、その数やその位置については適宜変更されうる。 In this embodiment, the micro-vibrator 2 has a side through hole 24 connecting the front surface 2a and the back surface 2b of the substrate on the side surface of the recess 22 near the bottom surface of the front surface 2a, i.e., on the side wall portion near the adsorption surface 22a, as shown in FIG. 15, for example. The side through hole 24 is formed, for example, by irradiating a thin-walled substrate (such as quartz) constituting the micro-vibrator 2 with laser light to partially melt it. The side through hole 24 can also be formed, for example, by pre-opening a through hole in an area of the quartz plate 20 located slightly outside the support portion M2 of the mold M in the process shown in FIG. 4A. The side through hole 24 is formed in a position lower than the height of the inner frame portion 51 in the z direction of the recess 22 when the micro-vibrator 2 is mounted on the mounting substrate 3, as shown in FIG. 14, for example. The side through hole 24 is formed, for example, in two positions symmetrically in a top view, but is not limited to this, and the number and positions can be changed as appropriate.

接合部材52は、本実施形態では、一部が微小振動体2の側面貫通孔24に流れ込み、微小振動体2の凹部22のうち表面2a側の底面、すなわち吸着面22aの一部または全部を覆いうる。言い換えると、接合部材52の量が多い場合であっても、微小振動体2の側面貫通孔24に接合部材52の一部が流れ込み、実装面22bと実装基板3の搭載面との間に過度の接合部材52が介在することが抑制される。また、この場合、微小振動体2と接合部材52との接触面積が上記第1実施形態に比べて増大することで、微小振動体2の接合強度が向上する。 In this embodiment, a portion of the bonding member 52 flows into the side through-hole 24 of the micro-vibrator 2 and can cover the bottom surface of the recess 22 of the micro-vibrator 2 on the surface 2a side, i.e., the adsorption surface 22a, in part or all. In other words, even if the amount of bonding member 52 is large, a portion of the bonding member 52 flows into the side through-hole 24 of the micro-vibrator 2, and the presence of an excessive amount of bonding member 52 between the mounting surface 22b and the mounting surface of the mounting board 3 is suppressed. In this case, the contact area between the micro-vibrator 2 and the bonding member 52 is increased compared to the first embodiment, thereby improving the bonding strength of the micro-vibrator 2.

本実施形態によれば、上記第1実施形態と同様の効果が得られる慣性センサ1となる。また、微小振動体2に側面貫通孔24が形成されているため、実装基板3に配置される接合部材52の量が多くなった場合であっても、接合部材52の一部が側面貫通孔24に流れ込むこととなる。そのため、実装面22bと実装基板3の搭載面との間に必要以上の接合部材52が介在すること、ひいては微小振動体2が実装基板3に対して傾くことが抑制される。また、接合部材52が吸着面22a上にも達した場合には、微小振動体2と接合部材52との接触面積が増加し、接合強度が向上する効果も得られる。 According to this embodiment, the inertial sensor 1 can obtain the same effect as the first embodiment. In addition, since the side through hole 24 is formed in the micro-vibrator 2, even if the amount of the bonding member 52 arranged on the mounting substrate 3 is increased, a part of the bonding member 52 flows into the side through hole 24. Therefore, it is possible to prevent the bonding member 52 from being interposed more than necessary between the mounting surface 22b and the mounting surface of the mounting substrate 3, and thus to prevent the micro-vibrator 2 from tilting with respect to the mounting substrate 3. In addition, when the bonding member 52 reaches the suction surface 22a, the contact area between the micro-vibrator 2 and the bonding member 52 increases, and the effect of improving the bonding strength is also obtained.

(第3実施形態)
第3実施形態の慣性センサ1について、図16~図18を参照して説明する。図16は、図9に相当する断面を示す断面図である。図17は、図3に相当する断面を示す断面図である。
Third Embodiment
The inertial sensor 1 of the third embodiment will be described with reference to Fig. 16 to Fig. 18. Fig. 16 is a cross-sectional view showing a cross section corresponding to Fig. 9. Fig. 17 is a cross-sectional view showing a cross section corresponding to Fig. 3.

本実施形態の慣性センサ1は、例えば図16に示すように、微小振動体2が凹部22のうちz方向における底面に底面貫通孔25を有し、底面貫通孔25に接合部材52が流れ込んでいる点で上記第1実施形態と相違する。本実施形態では、この相違点について主に説明する。 The inertial sensor 1 of this embodiment differs from the first embodiment in that, as shown in FIG. 16, the micro-vibrator 2 has a bottom through-hole 25 on the bottom surface of the recess 22 in the z-direction, and the bonding material 52 flows into the bottom through-hole 25. This difference will be mainly described in this embodiment.

微小振動体2は、本実施形態では、例えば図17に示すように、凹部22のうちz方向における底面に実装面22bまで連通する底面貫通孔25を備える。底面貫通孔25は、例えば、上記第2実施形態の側面貫通孔24と同様の方法により形成される。また、底面貫通孔25は、例えば図18に示すように、成形用の型Mとして支持部M2の上端に突出部M21を備えるものを用意し、凹部位202のうち突出部M21に追従して突出した部分をすべて研磨除去する方法によって形成されてもよい。底面貫通孔25は、例えば、実装面22bの中心位置に1つ形成されるが、これに限定されるものではなく、複数形成されてもよいし、実装面22bの中心位置とは異なる位置に形成されてもよく、その数やその位置については適宜変更されうる。 In this embodiment, the micro-vibration body 2 has a bottom through-hole 25 that is connected to the mounting surface 22b on the bottom surface of the recess 22 in the z direction, as shown in FIG. 17. The bottom through-hole 25 is formed, for example, by the same method as the side through-hole 24 of the second embodiment. The bottom through-hole 25 may be formed, for example, as shown in FIG. 18, by preparing a molding mold M having a protrusion M21 at the upper end of the support part M2, and polishing and removing all of the protruding parts of the recess 202 that follow the protrusion M21. The bottom through-hole 25 is formed, for example, at the center position of the mounting surface 22b, but is not limited to this, and may be formed in multiple places, or may be formed at a position different from the center position of the mounting surface 22b, and the number and positions of the holes may be changed as appropriate.

接合部材52は、本実施形態では、一部が微小振動体2の底面貫通孔25に流れ込み、微小振動体2の凹部22のうち吸着面22aの一部または全部を覆いうる。これにより、上記第2実施形態と同様に、実装面22bと実装基板3の搭載面との間に過度の接合部材52が介在することが抑制されると共に、微小振動体2と接合部材52との接触面積の増大により、微小振動体2の接合強度が向上する効果が得られる。また、底面貫通孔25が実装面22bに位置することで、接合部材52中に気泡が存在する場合であっても、底面貫通孔25を通じて外部に気泡が抜けやすくなり、微小振動体2と実装基板3との接合がより安定する効果も得られる。 In this embodiment, the bonding member 52 can flow into the bottom through-hole 25 of the micro-vibrator 2 and cover part or all of the suction surface 22a of the recess 22 of the micro-vibrator 2. As a result, as in the second embodiment, the presence of an excessive amount of bonding member 52 between the mounting surface 22b and the mounting surface of the mounting substrate 3 is suppressed, and the contact area between the micro-vibrator 2 and the bonding member 52 is increased, resulting in an effect of improving the bonding strength of the micro-vibrator 2. In addition, since the bottom through-hole 25 is located on the mounting surface 22b, even if air bubbles are present in the bonding member 52, the air bubbles can easily escape to the outside through the bottom through-hole 25, and the effect of more stable bonding between the micro-vibrator 2 and the mounting substrate 3 is obtained.

本実施形態によれば、上記第1実施形態と同様の効果が得られる慣性センサ1となる。また、微小振動体2が底面貫通孔25を備え、接合部材52の一部が底面貫通孔25に流れ込む構造であるため、微小振動体2の傾き抑制、接合部材52の気泡影響低減、および微小振動体2と実装基板3との接合強度向上の効果も得られる。 According to this embodiment, the inertial sensor 1 can obtain the same effect as the first embodiment. In addition, since the micro-vibrator 2 has a bottom through-hole 25 and a part of the bonding member 52 flows into the bottom through-hole 25, it is possible to suppress the tilt of the micro-vibrator 2, reduce the influence of air bubbles in the bonding member 52, and improve the bonding strength between the micro-vibrator 2 and the mounting substrate 3.

(第3実施形態の変形例)
上記第3実施形態の慣性センサ1は、例えば図19に示すように、実装基板3の一部である支柱部55が微小振動体2の底面貫通孔25に挿入された構成であってもよい。
(Modification of the third embodiment)
The inertial sensor 1 of the third embodiment may have a configuration in which a support portion 55 that is a part of the mounting substrate 3 is inserted into a bottom through-hole 25 of the micro-vibrator 2, as shown in, for example, FIG.

具体的には、実装基板3は、微小振動体2に底面貫通孔25が形成されている場合には、例えば図20に示すように、上面視にて、上部基板5が内枠部51に囲まれた内側領域に配置される支柱部55をさらに有する構成とされうる。支柱部55は、底面貫通孔25の内径よりも直径が小さく、底面貫通孔25に挿入可能になっている。支柱部55は、例えば、内枠部51、電極部53および外枠部54と同時にエッチングにより形成される。変形例に係る慣性センサ1は、例えば図21に示すように、微小振動体2が底面貫通孔25に支柱部55が挿入された状態で、接合部材52により実装基板3に接合されている。なお、底面貫通孔25が複数設けられる場合には、実装基板3は、底面貫通孔25と同数の支柱部55を有した構成とされうる。 Specifically, when the micro-vibrator 2 has a bottom through-hole 25, the mounting substrate 3 may further include a support 55 arranged in an inner region surrounded by the inner frame 51 when viewed from above, as shown in FIG. 20, for example. The support 55 has a diameter smaller than the inner diameter of the bottom through-hole 25 and can be inserted into the bottom through-hole 25. The support 55 is formed, for example, by etching simultaneously with the inner frame 51, the electrode 53, and the outer frame 54. As shown in FIG. 21, for example, the inertial sensor 1 according to the modified example is joined to the mounting substrate 3 by the joining member 52 with the micro-vibrator 2 and the support 55 inserted into the bottom through-hole 25. When a plurality of bottom through-holes 25 are provided, the mounting substrate 3 may be configured to have the same number of support 55 as the bottom through-holes 25.

本変形例によっても、上記第3実施形態と同様の効果が得られる。また、微小振動体2を実装基板3に接合する際に、底面貫通孔25に支柱部55を嵌め込む構造のため、実装基板3に対する位置合わせが容易になる効果も得られる。 This modified example also provides the same effect as the third embodiment. In addition, because the support column 55 is fitted into the bottom through-hole 25 when bonding the micro-vibrator 2 to the mounting substrate 3, it also provides the effect of facilitating alignment with the mounting substrate 3.

(第4実施形態)
第4実施形態の慣性センサ1について、図22~図24を参照して説明する。図22は、図9に相当する断面を示す断面図である。図23は、図3に相当する断面を示す断面図である。
Fourth Embodiment
The inertial sensor 1 of the fourth embodiment will be described with reference to Fig. 22 to Fig. 24. Fig. 22 is a cross-sectional view showing a cross section corresponding to Fig. 9. Fig. 23 is a cross-sectional view showing a cross section corresponding to Fig. 3.

本実施形態の慣性センサ1は、例えば図22に示すように、微小振動体2が凹部22のうち実装面22b側に表面2aに向かって凹んだ実装面凹部26を有し、実装基板3に位置決め溝43を有する点で上記第1実施形態と相違する。本実施形態では、この相違点について主に説明する。 The inertial sensor 1 of this embodiment differs from the first embodiment in that, as shown in FIG. 22, the micro-vibrator 2 has a mounting surface recess 26 on the mounting surface 22b side of the recess 22 that is recessed toward the surface 2a, and the mounting substrate 3 has a positioning groove 43. This difference will be mainly described in this embodiment.

微小振動体2は、本実施形態では、例えば図23に示すように、凹部22のうち実装面22b側の底部に、表面2a側に向かって凹んだ実装面凹部26が形成されている。微小振動体2は、実装面凹部26の底面から突出する部分を突出部27として、突出部27の先端面が、リム下面211cと同一平面上に位置する実装面22bとなっている。 In this embodiment, as shown in FIG. 23, the micro-vibration body 2 has a mounting surface recess 26 recessed toward the front surface 2a at the bottom of the recess 22 on the mounting surface 22b side. The micro-vibration body 2 has a protruding portion 27 protruding from the bottom surface of the mounting surface recess 26, and the tip surface of the protruding portion 27 forms the mounting surface 22b located on the same plane as the rim lower surface 211c.

実装基板3は、本実施形態では、例えば図24に示すように、下部基板4のうち内枠部51に囲まれた内側領域であって、微小振動体2の突出部27に対応する位置に環状の位置決め溝43が形成されている。位置決め溝43は、例えば、エッチング溝41と同時に、DRIE等によるエッチング工程において形成される。位置決め溝43は、例えば図22に示すように、微小振動体2のうち突出部27が入り込める幅となっており、実装基板3に対する微小振動体2の位置決めを容易にする役割を果たす。 In this embodiment, as shown in FIG. 24, for example, the mounting substrate 3 is an inner region of the lower substrate 4 surrounded by an inner frame portion 51, and has an annular positioning groove 43 formed at a position corresponding to the protrusion 27 of the micro-vibrator 2. The positioning groove 43 is formed, for example, in an etching process such as DRIE at the same time as the etching groove 41. As shown in FIG. 22, for example, the positioning groove 43 has a width that allows the protrusion 27 of the micro-vibrator 2 to enter, and serves to facilitate the positioning of the micro-vibrator 2 relative to the mounting substrate 3.

本実施形態の微小振動体2は、例えば、図25A、図25Bに示す工程を経て形成される。まず、三次元曲面を形成する成形用の型Mとして、図25Aに示すように、支持部M2の先端面に窪み部M22を有するものを用意する。続けて、石英板20を火炎Fにより溶融させ、曲面部位201および凹部位202を形成する。このとき、凹部位202は、図25Bに示すように、窪み部M22に追従し、後に実装面凹部26および突出部27に相当する形状となる。 The micro-vibration body 2 of this embodiment is formed, for example, through the process shown in Figures 25A and 25B. First, as shown in Figure 25A, a mold M for forming a three-dimensional curved surface is prepared, which has a recessed portion M22 on the tip surface of the support portion M2. Next, the quartz plate 20 is melted by a flame F to form the curved surface portion 201 and the recessed portion 202. At this time, the recessed portion 202 follows the recessed portion M22 as shown in Figure 25B, and later takes on a shape corresponding to the mounting surface recess 26 and the protruding portion 27.

なお、支持部M2として窪み部M22を有する型Mを用いた微小振動体2の製造例について説明したが、これに限定されるものではない。例えば、窪み部M22に代わって、冷却体Cの嵌め込み部C1の底面側に連通する貫通孔を有するものを用い、真空引きによって実装面凹部26を形成してもよく、実装面凹部26の形成方法については適宜変更されてもよい。 Although an example of manufacturing the micro-vibration body 2 using a mold M having a recessed portion M22 as the support portion M2 has been described, the present invention is not limited to this. For example, instead of the recessed portion M22, a mold having a through hole that communicates with the bottom side of the fitting portion C1 of the cooling body C may be used, and the mounting surface recess 26 may be formed by vacuum drawing, and the method of forming the mounting surface recess 26 may be changed as appropriate.

本実施形態によれば、上記第1実施形態と同様の効果が得られる慣性センサ1となる。また、この慣性センサ1は、微小振動体2が実装面凹部26を有し、微小振動体2の突出部27が実装基板3の位置決め溝43に挿入される構成であるため、微小振動体2の位置決めが容易になる効果も得られる。 According to this embodiment, the inertial sensor 1 can obtain the same effect as the first embodiment. In addition, this inertial sensor 1 has a micro-vibrator 2 having a mounting surface recess 26, and the protrusion 27 of the micro-vibrator 2 is inserted into the positioning groove 43 of the mounting substrate 3, so that the effect of facilitating positioning of the micro-vibrator 2 is also obtained.

(第4実施形態の変形例)
第4実施形態の慣性センサ1は、例えば、図26に示すように、微小振動体2が実装面凹部26にさらに底面貫通孔25を有し、図27に示すように実装基板3が支柱部55をさらに有し、これらが接合された構成であってもよい。この慣性センサ1は、例えば図28に示すように、微小振動体2の底面貫通孔25に実装基板3の支柱部55が挿入されている。
(Modification of the fourth embodiment)
The inertial sensor 1 of the fourth embodiment may be configured such that, for example, as shown in Fig. 26, the micro-vibrator 2 further has a bottom surface through-hole 25 in the mounting surface recess 26, and the mounting substrate 3 further has a support portion 55 as shown in Fig. 27, and these are joined together. In this inertial sensor 1, for example, as shown in Fig. 28, the support portion 55 of the mounting substrate 3 is inserted into the bottom surface through-hole 25 of the micro-vibrator 2.

本変形例によれば、上記第4実施形態の効果に加えて、底面貫通孔25への支柱部55の挿入による微小振動体2の位置決め精度の向上、および接合部材52の気泡影響低減の効果が得られる。 In addition to the effects of the fourth embodiment, this modification provides the effects of improving the positioning accuracy of the micro-vibration body 2 by inserting the support portion 55 into the bottom through-hole 25, and reducing the effect of air bubbles in the joining member 52.

なお、本変形例に係る慣性センサ1は、例えば図29に示すように、凹部22が接合部材52で充填された構成であってもよい。この慣性センサ1は、凹部22が接合部材52により充填されているため、z方向上側において接合部材52に図示しないワイヤを接続することが可能な構造となっている。例えば、この慣性センサ1は、外枠部54の上面に複数の電極膜541の1つと凹部22を充填する接合部材52とを直接ワイヤで接続することが可能である。この場合、実装基板3は、ブリッジ配線42が不要となる。 The inertial sensor 1 according to this modified example may have a configuration in which the recess 22 is filled with a bonding member 52, as shown in FIG. 29, for example. Since the recess 22 of this inertial sensor 1 is filled with the bonding member 52, it is possible to connect a wire (not shown) to the bonding member 52 on the upper side in the z direction. For example, this inertial sensor 1 can directly connect one of the multiple electrode films 541 on the upper surface of the outer frame portion 54 to the bonding member 52 filling the recess 22 with a wire. In this case, the mounting substrate 3 does not require the bridge wiring 42.

図29の慣性センサ1は、例えば、図30に示すように、位置決め溝43および支柱部55を有する実装基板3に、底面貫通孔25および実装面凹部26を有する微小振動体2を取り付けた後、凹部22に接合部材52を流し込み、固化させることで製造できる。このような構成であっても、上記した変形例と同様の効果が得られる。また、接合部材52と微小振動体2との接合面積が増大するため、微小振動体2と実装基板3との接合強度がさらに向上する効果も得られる。さらに、微小振動体2を実装基板3に取り付けた後に、接合部材52を凹部22に流し込んで接合するため、流動性のある状態の接合部材52上に微小振動体2が載置されないことから、接合部材52に起因する傾きが生じない。 The inertial sensor 1 in FIG. 29 can be manufactured, for example, as shown in FIG. 30, by attaching a micro-vibrator 2 having a bottom through-hole 25 and a mounting surface recess 26 to a mounting substrate 3 having a positioning groove 43 and a support portion 55, and then pouring a bonding member 52 into the recess 22 and solidifying it. Even with this configuration, the same effect as the above-mentioned modified example can be obtained. In addition, since the bonding area between the bonding member 52 and the micro-vibrator 2 is increased, the effect of further improving the bonding strength between the micro-vibrator 2 and the mounting substrate 3 can be obtained. Furthermore, since the bonding member 52 is poured into the recess 22 and bonded after the micro-vibrator 2 is attached to the mounting substrate 3, the micro-vibrator 2 is not placed on the bonding member 52 in a fluid state, and therefore no tilt due to the bonding member 52 occurs.

(他の実施形態)
本発明は、実施例に準拠して記述されたが、本発明は当該実施例や構造に限定されるものではないと理解される。本発明は、様々な変形例や均等範囲内の変形をも包含する。加えて、様々な組み合わせや形態、さらには、それらの一要素のみ、それ以上、あるいはそれ以下、を含む他の組み合わせや形態をも、本発明の範疇や思想範囲に入るものである。
Other Embodiments
Although the present invention has been described based on the embodiment, it is understood that the present invention is not limited to the embodiment or structure. The present invention also includes various modifications and modifications within the equivalent range. In addition, various combinations and forms, and other combinations and forms including only one element, more than one, or less than one, are also within the scope and concept of the present invention.

(1)例えば、図29では、実装基板3が位置決め溝43および支柱部55のいずれも有する構成である慣性センサ1の例を示したが、微小振動体2が実装面凹部26を有さず、実装基板3が位置決め溝43を有しない構成であってもよい。 (1) For example, FIG. 29 shows an example of an inertial sensor 1 in which the mounting substrate 3 has both a positioning groove 43 and a support portion 55, but the micro-vibrator 2 may not have a mounting surface recess 26 and the mounting substrate 3 may not have a positioning groove 43.

(2)上記第4実施形態およびその変形例に係る慣性センサ1は、例えば図31に示すように、微小振動体2の突出部27が断面視にて全域が曲面の椀状とされ、平面部位を有しない構成であってもよい。この場合、微小振動体2は、突出部27の頂点を先端部28として、例えば、先端部28が円環形状とされ、リム下面211cと同一平面に位置する構造になっている。言い換えると、微小振動体2は、実装基板3への搭載時に、突出部27の実装面22bが面で実装基板3と接するのではなく、先端部28が実装基板3と点で接する構造である。 (2) The inertial sensor 1 according to the fourth embodiment and its modified example may be configured such that the protrusion 27 of the micro-vibrator 2 is curved and bowl-shaped in cross section over the entire area, with no flat portion, as shown in FIG. 31, for example. In this case, the micro-vibrator 2 has a structure in which the apex of the protrusion 27 is the tip 28, for example, the tip 28 is annular and located on the same plane as the rim lower surface 211c. In other words, when the micro-vibrator 2 is mounted on the mounting substrate 3, the mounting surface 22b of the protrusion 27 does not contact the mounting substrate 3 in a plane, but the tip 28 contacts the mounting substrate 3 at a point.

なお、この微小振動体2は、リム下面211cが形成される端部203の除去工程を突出部27の頂点に到達した時点で止める点を除き、上記第4実施形態と基本的に同様の工程にて製造可能である。例えば、この微小振動体2は、端部203の除去工程において、図25に示す型Mのうち石英板20と接する面と支持部M2の先端面との距離の分だけ研削されることで上記の構造となる。 This micro-vibration body 2 can be manufactured in a manner basically similar to that of the fourth embodiment, except that the process of removing the end 203 where the rim lower surface 211c is formed is stopped when the apex of the protrusion 27 is reached. For example, in the process of removing the end 203, the micro-vibration body 2 is ground to the distance between the surface of the mold M in contact with the quartz plate 20 shown in FIG. 25 and the tip surface of the support part M2, resulting in the above structure.

2・・・微小振動体、2a・・・表面、2b・・・裏面、20・・・薄肉基材、
201・・・曲面部位、202・・・凹部位、21・・・曲面部、211・・・リム、
211c・・・リム下面、22・・・凹部、22b・・・実装面、
24・・・貫通孔、25・・・(底面)貫通孔、26・・・実装面凹部、
27・・・突出部、3・・・実装基板、4・・・下部基板、43・・・位置決め溝、
5・・・上部基板、51・・・内枠部、52・・・接合部材、53・・・電極部、
55・・・支柱部、E・・・封止材
2... Micro vibrator, 2a... Front surface, 2b... Back surface, 20... Thin base material,
201: curved surface portion, 202: concave portion, 21: curved surface portion, 211: rim,
211c: rim lower surface, 22: recess, 22b: mounting surface,
24: through hole, 25: (bottom surface) through hole, 26: mounting surface recess,
27: protrusion; 3: mounting substrate; 4: lower substrate; 43: positioning groove;
5: upper substrate, 51: inner frame portion, 52: bonding member, 53: electrode portion,
55: Support portion, E: Sealing material

Claims (7)

慣性センサであって、
外径が大きい側の面である表面(2a)と前記表面の反対面である裏面(2b)とを有する薄肉部材であって、環状曲面を備える曲面部(21)と、前記曲面部から前記裏面の側に凹んだ有底筒状の凹部(22)とを有する微小振動体(2)と、
枠体状の内枠部(51)と、互いに距離を隔てつつ、前記内枠部を囲む配置とされる複数の電極部(53)とを有してなる上部基板(5)が下部基板(4)に接合されてなる実装基板(3)と、
前記実装基板のうち前記内枠部に囲まれた内側領域に配置される接合部材(52)と、を備え、
前記微小振動体は、前記凹部のうち前記裏面の側の底面である実装面(22b)が、前記内側領域に配置され、前記接合部材を介して前記実装基板に接合されており、
前記曲面部のうち前記凹部とは反対側の端部を含む一部の領域であるリム(211)は、中空状態であり、
前記リムのうち前記表面と前記裏面とを繋ぐ面であるリム下面(211c)は、前記実装面またはその先端部(28)と同一の平面上に位置しており、
前記微小振動体は、前記実装面に、前記裏面から前記表面に向かって凹んだ実装面凹部(26)と、前記実装面凹部から前記実装面に向かって突出する突出部(27)とを有し、
前記実装基板は、前記突出部に対応する位置決め溝(43)を有し、
前記突出部は、前記位置決め溝に挿入されている、慣性センサ。
An inertial sensor,
A micro-vibration body (2) is a thin-walled member having a front surface (2a) which is a surface on the side with a larger outer diameter and a back surface (2b) which is the opposite surface to the front surface, the micro-vibration body having a curved surface portion (21) having an annular curved surface and a bottomed cylindrical recessed portion (22) recessed from the curved surface portion toward the back surface;
a mounting substrate (3) formed by joining an upper substrate (5) having a frame-shaped inner frame portion (51) and a plurality of electrode portions (53) arranged to surround the inner frame portion while being spaced apart from each other, to a lower substrate (4);
a bonding member (52) arranged in an inner region of the mounting board surrounded by the inner frame portion,
The micro-vibrator has a mounting surface (22b) that is a bottom surface of the recess on the back surface side and is disposed in the inner region and bonded to the mounting substrate via the bonding member,
A rim (211) which is a part of the curved surface including the end portion opposite to the recess is hollow,
A rim lower surface (211c) of the rim, which is a surface connecting the front surface and the back surface, is located on the same plane as the mounting surface or a tip portion (28) thereof ,
The micro-vibrator has, on the mounting surface, a mounting surface recess (26) recessed from the back surface toward the front surface, and a protrusion (27) protruding from the mounting surface recess toward the mounting surface,
The mounting substrate has a positioning groove (43) corresponding to the protrusion,
The protrusion is inserted into the positioning groove .
慣性センサであって、
外径が大きい側の面である表面(2a)と前記表面の反対面である裏面(2b)とを有する薄肉部材であって、環状曲面を備える曲面部(21)と、前記曲面部から前記裏面の側に凹んだ有底筒状の凹部(22)とを有する微小振動体(2)と、
枠体状の内枠部(51)と、互いに距離を隔てつつ、前記内枠部を囲む配置とされる複数の電極部(53)とを有してなる上部基板(5)が下部基板(4)に接合されてなる実装基板(3)と、
前記実装基板のうち前記内枠部に囲まれた内側領域に配置される接合部材(52)と、を備え、
前記微小振動体は、前記凹部のうち前記裏面の側の底面である実装面(22b)が、前記内側領域に配置され、前記接合部材を介して前記実装基板に接合されており、
前記曲面部のうち前記凹部とは反対側の端部を含む一部の領域であるリム(211)は、中空状態であり、
前記リムのうち前記表面と前記裏面とを繋ぐ面であるリム下面(211c)は、前記実装面またはその先端部(28)と同一の平面上に位置しており、
前記微小振動体は、前記凹部のうち前記表面における底面近傍の側面に設けられ、前記表面と前記裏面とを繋ぐ側面貫通孔(24)を有し、
前記接合部材は、少なくとも一部が前記側面貫通孔に入り込んでいる慣性センサ。
An inertial sensor,
A micro-vibration body (2) is a thin-walled member having a front surface (2a) which is a surface on the side with a larger outer diameter and a back surface (2b) which is the opposite surface to the front surface, the micro-vibration body having a curved surface portion (21) having an annular curved surface and a bottomed cylindrical recessed portion (22) recessed from the curved surface portion toward the back surface;
a mounting substrate (3) formed by joining an upper substrate (5) having a frame-shaped inner frame portion (51) and a plurality of electrode portions (53) arranged to surround the inner frame portion while being spaced apart from each other, to a lower substrate (4);
a bonding member (52) arranged in an inner region of the mounting board surrounded by the inner frame portion,
The micro-vibrator has a mounting surface (22b) that is a bottom surface of the recess on the back surface side and is disposed in the inner region and bonded to the mounting substrate via the bonding member,
A rim (211) which is a part of the curved surface including the end portion opposite to the recess is hollow,
A rim lower surface (211c) of the rim, which is a surface connecting the front surface and the back surface, is located on the same plane as the mounting surface or a tip portion (28) thereof,
The micro-vibrator has a side through hole (24) provided on a side surface of the recess in the vicinity of a bottom surface of the front surface and connecting the front surface and the back surface,
An inertial sensor, wherein at least a portion of the joining member is inserted into the side through hole .
慣性センサであって、
外径が大きい側の面である表面(2a)と前記表面の反対面である裏面(2b)とを有する薄肉部材であって、環状曲面を備える曲面部(21)と、前記曲面部から前記裏面の側に凹んだ有底筒状の凹部(22)とを有する微小振動体(2)と、
枠体状の内枠部(51)と、互いに距離を隔てつつ、前記内枠部を囲む配置とされる複数の電極部(53)とを有してなる上部基板(5)が下部基板(4)に接合されてなる実装基板(3)と、
前記実装基板のうち前記内枠部に囲まれた内側領域に配置される接合部材(52)と、を備え、
前記微小振動体は、前記凹部のうち前記裏面の側の底面である実装面(22b)が、前記内側領域に配置され、前記接合部材を介して前記実装基板に接合されており、
前記曲面部のうち前記凹部とは反対側の端部を含む一部の領域であるリム(211)は、中空状態であり、
前記リムのうち前記表面と前記裏面とを繋ぐ面であるリム下面(211c)は、前記実装面またはその先端部(28)と同一の平面上に位置しており、
前記微小振動体は、前記実装面に設けられた底面貫通孔(25)を有し、
前記接合部材は、少なくとも一部が前記底面貫通孔に入り込んでいる、慣性センサ。
An inertial sensor,
A micro-vibration body (2) is a thin-walled member having a front surface (2a) which is a surface on the side with a larger outer diameter and a back surface (2b) which is the opposite surface to the front surface, the micro-vibration body having a curved surface portion (21) having an annular curved surface and a bottomed cylindrical recessed portion (22) recessed from the curved surface portion toward the back surface;
a mounting substrate (3) formed by joining an upper substrate (5) having a frame-shaped inner frame portion (51) and a plurality of electrode portions (53) arranged to surround the inner frame portion while being spaced apart from each other, to a lower substrate (4);
a bonding member (52) arranged in an inner region of the mounting board surrounded by the inner frame portion,
The micro-vibrator has a mounting surface (22b) that is a bottom surface of the recess on the back surface side and is disposed in the inner region and bonded to the mounting substrate via the bonding member,
A rim (211) which is a part of the curved surface including the end portion opposite to the recess is hollow,
A rim lower surface (211c) of the rim, which is a surface connecting the front surface and the back surface, is located on the same plane as the mounting surface or a tip portion (28) thereof,
The micro-vibrator has a bottom surface through-hole (25) provided on the mounting surface,
An inertial sensor, wherein at least a portion of the joining member is inserted into the bottom surface through-hole.
前記微小振動体は、前記実装面凹部の底面に設けられた底面貫通孔(25)を有し、
前記接合部材は、少なくとも一部が前記底面貫通孔に入り込んでいる、請求項に記載の慣性センサ。
The micro-vibrator has a bottom surface through-hole (25) provided in a bottom surface of the mounting surface recess,
The inertial sensor according to claim 1 , wherein at least a portion of the joining member is inserted into the bottom surface through-hole.
前記実装基板は、前記内枠部に囲まれた領域に、前記底面貫通孔に挿入される支柱部(55)を有する、請求項3または4に記載の慣性センサ。 5. The inertial sensor according to claim 3 , wherein the mounting board has, in a region surrounded by the inner frame, a support column (55) to be inserted into the bottom through-hole. 外径が大きい側の面である表面(2a)と前記表面の反対面である裏面(2b)とを有する薄肉部材であって、環状曲面を備える曲面部(21)と、前記曲面部から前記裏面の側に凹んだ有底筒状の凹部(22)とを有する微小振動体(2)と、
枠体状の内枠部(51)と、互いに距離を隔てつつ、前記内枠部を囲む配置とされる複数の電極部(53)とを有してなる上部基板(5)が下部基板(4)に接合されてなる実装基板(3)と、が接合部材(52)を介して接合されてなる慣性センサの製造方法であって、
前記微小振動体を用意することと、
前記実装基板のうち前記内枠部に囲まれた内側領域に前記接合部材を配置することと、
前記接合部材を配置した後、前記微小振動体のうち前記凹部を前記内側領域に配置し、前記凹部のうち前記裏面の側の底面である実装面(22b)を前記接合部材に接触させることと、
前記接合部材を溶融させた後、固化させることで、前記微小振動体と前記実装基板とを接合し、前記微小振動体の前記曲面部のうち前記凹部とは反対側の端部であるリム(211)を中空状態とすることと、を含み、
前記微小振動体を用意することにおいては、
マイクロメートルオーダーの薄肉基材(20)を加熱溶融し、固化することで、後に前記曲面部となる曲面部位(201)、および後に前記凹部となる凹部位(202)を形成した後に、前記薄肉基材を封止材(E)で封止し、
前記曲面部位、前記凹部位、および前記封止材の一部を研磨により除去することで、同一平面上に位置する、前記実装面、および前記リムのうち前記表面と前記裏面とを繋ぐリム下面(211c)を形成し、
前記実装面または前記実装面の近傍の側面に貫通孔(24、25)を形成し、
前記リムを中空状態にすることにおいては、前記貫通孔に溶融させた前記接合部材の一部を流し込む、慣性センサの製造方法。
A micro-vibration body (2) is a thin-walled member having a front surface (2a) which is a surface on the side with a larger outer diameter and a back surface (2b) which is the opposite surface to the front surface, the micro-vibration body having a curved surface portion (21) having an annular curved surface and a bottomed cylindrical recessed portion (22) recessed from the curved surface portion toward the back surface;
A method for manufacturing an inertial sensor in which an upper substrate (5) having a frame-shaped inner frame portion (51) and a plurality of electrode portions (53) arranged to surround the inner frame portion while being spaced apart from each other is joined to a lower substrate (4) to form a mounting substrate (3), the upper substrate (5) being joined to a lower substrate (4) via a joining member (52),
preparing the micro-vibrator;
disposing the bonding member in an inner region of the mounting substrate that is surrounded by the inner frame portion;
After arranging the bonding member, the recess of the micro-vibrator is arranged in the inner region, and a mounting surface (22b) which is a bottom surface of the recess on the back surface side is brought into contact with the bonding member;
The bonding material is melted and then solidified to bond the micro-vibrator and the mounting substrate, and a rim (211) of the curved surface of the micro-vibrator, which is an end portion of the curved surface of the micro-vibrator opposite to the recess, is made hollow.
In preparing the micro-vibrator,
A thin substrate (20) of the order of micrometers is heated, melted, and solidified to form a curved surface portion (201) that will later become the curved surface portion, and a recessed portion (202) that will later become the recessed portion, and then the thin substrate is sealed with a sealant (E);
The curved surface portion, the recessed portion, and a portion of the sealing material are removed by polishing to form the mounting surface and a rim lower surface (211c) that connects the front surface and the back surface of the rim, which are located on the same plane ;
A through hole (24, 25) is formed on the mounting surface or a side surface in the vicinity of the mounting surface,
A method for manufacturing an inertial sensor , comprising the steps of: making the rim hollow by pouring a molten portion of the joining material into the through hole .
外径が大きい側の面である表面(2a)と前記表面の反対面である裏面(2b)とを有する薄肉部材であって、環状曲面を備える曲面部(21)と、前記曲面部から前記裏面の側に凹んだ有底筒状の凹部(22)と、前記凹部の底面である実装面(22b)に形成された貫通孔(25)とを有する微小振動体(2)と、
枠体状の内枠部(51)と、互いに距離を隔てつつ、前記内枠部を囲む配置とされる複数の電極部(53)と、前記内枠部に囲まれた領域に配置された支柱部(55)とを有してなる上部基板(5)が下部基板(4)に接合されてなる実装基板(3)と、が接合部材(52)を介して接合されてなる慣性センサの製造方法であって、
前記微小振動体を用意することと、
前記微小振動体の前記貫通孔に前記実装基板の前記支柱部を挿入し、前記微小振動体を前記実装基板に載置することと、
前記実装基板に前記微小振動体を載置した後、前記凹部に前記接合部材を流し込み、固化させることで、前記微小振動体と前記実装基板とを接合し、前記微小振動体の前記曲面部のうち前記凹部とは反対側の端部であるリム(211)を中空状態とすることと、を含み、
前記微小振動体を用意することにおいては、
マイクロメートルオーダーの薄肉基材(20)を加熱溶融し、固化することで、後に前記曲面部となる曲面部位(201)、および後に前記凹部となる凹部位(202)を形成した後に、前記薄肉基材を封止材(E)で封止し、
前記曲面部位、前記凹部位、および前記封止材の一部を研磨により除去することで、同一平面上に位置する、前記実装面、および前記リムのうち前記表面と前記裏面とを繋ぐリム下面(211c)を形成する、慣性センサの製造方法。
a micro-vibration body (2) which is a thin-walled member having a front surface (2a) which is a surface on the side with a larger outer diameter and a back surface (2b) which is the opposite surface to the front surface, the micro-vibration body (2) having a curved surface portion (21) with an annular curved surface, a bottomed cylindrical recess (22) recessed from the curved surface portion toward the back surface, and a through hole (25) formed in a mounting surface (22b) which is the bottom surface of the recess;
A method for manufacturing an inertial sensor in which an upper substrate (5) having a frame-shaped inner frame portion (51), a plurality of electrode portions (53) arranged to surround the inner frame portion while being spaced apart from one another, and support portions (55) arranged in an area surrounded by the inner frame portion is joined to a lower substrate (4) to form a mounting substrate (3), the upper substrate (5) being joined to a lower substrate (4) via a joining member (52),
preparing the micro-vibrator;
inserting the support portion of the mounting substrate into the through hole of the micro-vibrator and placing the micro-vibrator on the mounting substrate;
and after placing the micro-vibrator on the mounting substrate, pouring the bonding material into the recess and solidifying it to bond the micro-vibrator to the mounting substrate, and making a rim (211) of the curved portion of the micro-vibrator, which is an end portion opposite to the recess, into a hollow state.
In preparing the micro-vibrator,
A thin substrate (20) of the order of micrometers is heated, melted, and solidified to form a curved surface portion (201) that will later become the curved surface portion, and a recessed portion (202) that will later become the recessed portion, and then the thin substrate is sealed with a sealant (E);
A method for manufacturing an inertial sensor, comprising removing the curved portion, the recessed portion, and a portion of the sealing material by polishing to form the mounting surface and a rim underside (211c) that connects the front surface and the back surface of the rim, which are located on the same plane.
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