JP7760029B2 - Voltage Controlled Oscillator - Google Patents
Voltage Controlled OscillatorInfo
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- JP7760029B2 JP7760029B2 JP2024190692A JP2024190692A JP7760029B2 JP 7760029 B2 JP7760029 B2 JP 7760029B2 JP 2024190692 A JP2024190692 A JP 2024190692A JP 2024190692 A JP2024190692 A JP 2024190692A JP 7760029 B2 JP7760029 B2 JP 7760029B2
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/08—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance
- H03B5/12—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device
- H03B5/1237—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device comprising means for varying the frequency of the generator
- H03B5/124—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device comprising means for varying the frequency of the generator the means comprising a voltage dependent capacitance
- H03B5/1243—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device comprising means for varying the frequency of the generator the means comprising a voltage dependent capacitance the means comprising voltage variable capacitance diodes
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/08—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance
- H03B5/12—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device
- H03B5/1206—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device using multiple transistors for amplification
- H03B5/1212—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device using multiple transistors for amplification the amplifier comprising a pair of transistors, wherein an output terminal of each being connected to an input terminal of the other, e.g. a cross coupled pair
- H03B5/1215—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device using multiple transistors for amplification the amplifier comprising a pair of transistors, wherein an output terminal of each being connected to an input terminal of the other, e.g. a cross coupled pair the current source or degeneration circuit being in common to both transistors of the pair, e.g. a cross-coupled long-tailed pair
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/08—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance
- H03B5/12—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device
- H03B5/1228—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising lumped inductance and capacitance active element in amplifier being semiconductor device the amplifier comprising one or more field effect transistors
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/20—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising resistance and either capacitance or inductance, e.g. phase-shift oscillator
- H03B5/24—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising resistance and either capacitance or inductance, e.g. phase-shift oscillator active element in amplifier being semiconductor device
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/06—Receivers
- H04B1/16—Circuits
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B2200/00—Indexing scheme relating to details of oscillators covered by H03B
- H03B2200/003—Circuit elements of oscillators
- H03B2200/004—Circuit elements of oscillators including a variable capacitance, e.g. a varicap, a varactor or a variable capacitance of a diode or transistor
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B2200/00—Indexing scheme relating to details of oscillators covered by H03B
- H03B2200/006—Functional aspects of oscillators
- H03B2200/0062—Bias and operating point
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- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)
Description
本発明は電圧制御発振回路に関し、特に可変容量にトランジスタを用いた電圧制御発振回路に関する。 The present invention relates to a voltage-controlled oscillator circuit, and in particular to a voltage-controlled oscillator circuit that uses a transistor as a variable capacitor.
無線通信機の局部発振信号を発生させる手段として電圧により局部発振信号の周波数を可変出来る電圧制御発振回路が広く使用されている。この電圧制御発振回路では、制御電圧の可変量に対する出力信号の可変範囲を広くすることが求められる。そこで、特許文献1、2に電圧制御発振回路に関する技術が開示されている。 Voltage-controlled oscillator circuits, which can vary the frequency of a local oscillation signal using voltage, are widely used as a means of generating a local oscillation signal for wireless communication devices. These voltage-controlled oscillator circuits are required to have a wide variable range of output signals relative to the amount of control voltage variation. Patent documents 1 and 2 disclose technologies related to voltage-controlled oscillator circuits.
特許文献1に記載の電圧制御発振器は、同一の制御電圧により容量が制御される1対の可変容量コンデンサと、前記1対の可変容量コンデンサに接続された1対のインダクタと、前記1対のインダクタに電流を供給する定電流源と、前記1対のインダクタの電流が流れる部分の長さを切り替える切替手段と、を有する。 The voltage-controlled oscillator described in Patent Document 1 comprises a pair of variable capacitors whose capacitances are controlled by the same control voltage, a pair of inductors connected to the pair of variable capacitors, a constant current source that supplies current to the pair of inductors, and switching means that switches the length of the portions of the pair of inductors through which current flows.
特許文献2には電圧制御発振器に用いる可変容量コンデンサであって、可変容量コンデンサとしてMOSトランジスタを用いる例が開示されている。 Patent document 2 discloses an example of a variable capacitor used in a voltage-controlled oscillator, in which a MOS transistor is used as the variable capacitor.
しかしながら、特許文献1、2に記載の可変容量コンデンサは、MOSトランジスタの容量変化の範囲に制限があり、出力信号の発振周波数の可変範囲には制限がある問題がある。 However, the variable capacitors described in Patent Documents 1 and 2 have a problem in that the range of capacitance change of the MOS transistor is limited, and the variable range of the oscillation frequency of the output signal is also limited.
本発明にかかる電圧制御発振回路の一態様は、ソースに第1の電源が接続される第1のトランジスタと、ソースに前記第1の電源が供給され、ドレインが前記第1のトランジスタのゲートに接続され、ゲートが前記第1のトランジスタのドレインに接続される第2のトランジスタと、一方の端子が前記第1のトランジスタのドレインに接続され、他方の端子が前記第2のトランジスタのドレインに接続され、共通接続端子に第2の電源が供給される誘導性インピーダンス素子と、前記第1のトランジスタのドレインに一方の端子が接続され、他方の端子に周波数制御電圧が与えられる第1の可変容量性インピーダンス素子と、前記第2のトランジスタのドレインに一方の端子が接続され、他方の端子に周波数制御電圧が与えられる第2の可変容量性インピーダンス素子と、を有し、前記第1の可変容量性インピーダンス素子及び前記第2の可変容量性インピーダンス素子は、それぞれ、ソースが前記第2の電源に接続される容量トランジスタと、前記容量トランジスタのゲートに一方の端子が接続され、他方の端子に前記周波数制御電圧が与えられる抵抗と、一方の端子が自素子の前記一方の端子となり、他方の端子が前記容量トランジスタのゲートに接続される第1のコンデンサと、前記容量トランジスタのゲートとドレインとの間に接続される第2のコンデンサと、を有する。 One aspect of the voltage-controlled oscillator circuit of the present invention comprises a first transistor having a source connected to a first power supply; a second transistor having a source supplied with the first power supply, a drain connected to the gate of the first transistor, and a gate connected to the drain of the first transistor; an inductive impedance element having one terminal connected to the drain of the first transistor, the other terminal connected to the drain of the second transistor, and a common connection terminal supplied with a second power supply; a first variable capacitive impedance element having one terminal connected to the drain of the first transistor and the other terminal to which a frequency control voltage is applied; and a second variable capacitive impedance element having one terminal connected to the drain of the first variable capacitive impedance transistor and having the other terminal supplied with a frequency control voltage. The first variable capacitive impedance element and the second variable capacitive impedance element each have a capacitance transistor having a source connected to the second power supply, one terminal connected to the gate of the capacitance transistor and the other terminal supplied with the frequency control voltage, a first capacitor having one terminal serving as the first terminal of the element and the other terminal connected to the gate of the capacitance transistor, and a second capacitor connected between the gate and drain of the capacitance transistor.
これにより、本発明にかかる電圧制御発振回路の一態様では、第2のコンデンサを容量トランジスタの寄生容量に加えた容量値に基づき容量値の可変範囲が決定される。 As a result, in one aspect of the voltage-controlled oscillator circuit of the present invention, the variable range of the capacitance value is determined based on the capacitance value of the second capacitor added to the parasitic capacitance of the capacitance transistor.
本発明にかかる電圧制御発振回路によれば、周波数可変範囲を拡大することができる。 The voltage-controlled oscillator circuit of the present invention can expand the frequency variable range.
実施の形態1
以下、図面を参照して本発明の実施の形態について説明する。まず、図1に実施の形態1にかかる電圧制御発振回路1のブロック図を示す。図1に示すように、実施の形態1にかかる電圧制御発振回路1は、第1のトランジスタ(例えば、トランジスタTr1)、第2のトランジスタ(例えば、トランジスタTr2)、抵抗R1、R2、第1の可変容量性インピーダンス素子(例えば、可変容量性インピーダンス素子Cv1)、第2の可変容量性インピーダンス素子(例えば、可変容量性インピーダンス素子Cv2)、誘導性インピーダンス素子L1を有する。また、実施の形態1にかかる電圧制御発振回路1は、電圧制御発振回路1に付随する回路として、バッファ回路BUF1、BUF2、負荷抵抗RLを有する。また、電圧制御発振回路1では、第1の電源として電源電圧VDDが供給され、第2の電源として接地電圧が供給される。また、電圧制御発振回路1の出力信号Voutの周波数を制御する周波数制御電圧VCTRLが与えられる。
First Embodiment
Hereinafter, embodiments of the present invention will be described with reference to the drawings. First, FIG. 1 shows a block diagram of a voltage-controlled oscillator circuit 1 according to a first embodiment. As shown in FIG. 1, the voltage-controlled oscillator circuit 1 according to the first embodiment includes a first transistor (e.g., transistor Tr1), a second transistor (e.g., transistor Tr2), resistors R1 and R2, a first variable capacitive impedance element (e.g., variable capacitive impedance element Cv1), a second variable capacitive impedance element (e.g., variable capacitive impedance element Cv2), and an inductive impedance element L1. The voltage-controlled oscillator circuit 1 according to the first embodiment also includes buffer circuits BUF1 and BUF2 and a load resistor RL as circuits associated with the voltage-controlled oscillator circuit 1. The voltage-controlled oscillator circuit 1 is supplied with a power supply voltage VDD as a first power supply and a ground voltage as a second power supply. A frequency control voltage VCTRL is also provided to control the frequency of the output signal Vout of the voltage-controlled oscillator circuit 1.
トランジスタTr1は、ソースに電源電圧VDDが与えられ、ゲートがトランジスタTr2のドレインに接続され、ドレインがトランジスタTr2のゲートに接続される。また、トランジスタTr2は、ソースに電源電圧VDDが与えられ、ゲートがトランジスタTr2のドレインに接続され、ドレインがトランジスタTr2のゲートに接続される。なお、図1に示す例では、トランジスタTr1のドレインには抵抗R1の一方の端子が接続され、トランジスタTr2のドレインには抵抗R2の一方の端子が接続される。そして、トランジスタTr1のゲートは、抵抗R2の他方の端子に接続され、トランジスタTr2のゲートは、抵抗R1の他方の端子に接続される。この抵抗R1、R2は、トランジスタTr1、Tr2の負荷抵抗となるものであり、抵抗R1、R2を用いない回路構成も考えられる。 Transistor Tr1 has a source supplied with power supply voltage VDD, a gate connected to the drain of transistor Tr2, and a drain connected to the gate of transistor Tr2. Transistor Tr2 also has a source supplied with power supply voltage VDD, a gate connected to the drain of transistor Tr2, and a drain connected to the gate of transistor Tr2. In the example shown in FIG. 1, one terminal of resistor R1 is connected to the drain of transistor Tr1, and one terminal of resistor R2 is connected to the drain of transistor Tr2. The gate of transistor Tr1 is connected to the other terminal of resistor R2, and the gate of transistor Tr2 is connected to the other terminal of resistor R1. Resistors R1 and R2 serve as load resistors for transistors Tr1 and Tr2, and circuit configurations that do not use resistors R1 and R2 are also possible.
誘導性インピーダンス素子L1の一方の端子は、抵抗R1を介してトランジスタTr1のドレインに接続される。ここで、誘導性インピーダンス素子L1の一方の端子と、抵抗R1の他方の端子とを接続するノードを以下では第1の出力ノードN1と称す。誘導性インピーダンス素子L1の他方の端子は、抵抗R2を介してトランジスタTr2のドレインに接続される。ここで、誘導性インピーダンス素子L1の他方の端子と、抵抗R2の他方の端子とを接続するノードを以下では第2の出力ノードN2と称す。 One terminal of the inductive impedance element L1 is connected to the drain of the transistor Tr1 via a resistor R1. Here, the node connecting one terminal of the inductive impedance element L1 and the other terminal of the resistor R1 is hereinafter referred to as the first output node N1. The other terminal of the inductive impedance element L1 is connected to the drain of the transistor Tr2 via a resistor R2. Here, the node connecting the other terminal of the inductive impedance element L1 and the other terminal of the resistor R2 is hereinafter referred to as the second output node N2.
可変容量性インピーダンス素子Cv1は、一方の端子が抵抗R1を介してトランジスタTr1のドレイン(例えば、第1の出力ノードN1)に接続され、他方の端子に周波数制御電圧VCTRLが与えられる。可変容量性インピーダンス素子Cv2は、一方の端子が抵抗R2を介してトランジスタTr2のドレイン(例えば、第1の出力ノードN1)に接続され、他方の端子に周波数制御電圧VCTRLが与えられる。 One terminal of the variable capacitive impedance element Cv1 is connected to the drain of transistor Tr1 (e.g., the first output node N1) via resistor R1, and the other terminal is supplied with the frequency control voltage VCTRL. One terminal of the variable capacitive impedance element Cv2 is connected to the drain of transistor Tr2 (e.g., the first output node N1) via resistor R2, and the other terminal is supplied with the frequency control voltage VCTRL.
電圧制御発振回路1では、抵抗R2の他方の端子と誘導性インピーダンス素子L1の他方の端子とを接続する第2の出力ノードN2からバッファ回路BUF2を介して出力信号Voutを出力する。バッファ回路BUF2は、電圧制御発振回路1で生成される発信信号を増幅する。また、電圧制御発振回路1では、抵抗R1の他方の端子と誘導性インピーダンス素子L1の一方の端子とを接続する第1の出力ノードN1に接続されるバッファ回路BUF1により負荷抵抗RLを駆動する。バッファ回路BUF1は、電圧制御発振回路1で生成される発信信号を増幅するとともに、第1の出力ノードN1と第2の出力ノードN2のインピーダンスを揃える。 In the voltage-controlled oscillator circuit 1, an output signal Vout is output from a second output node N2 connecting the other terminal of resistor R2 and the other terminal of inductive impedance element L1 via a buffer circuit BUF2. The buffer circuit BUF2 amplifies the oscillation signal generated in the voltage-controlled oscillator circuit 1. In addition, in the voltage-controlled oscillator circuit 1, the load resistor RL is driven by a buffer circuit BUF1 connected to a first output node N1 connecting the other terminal of resistor R1 and one terminal of the inductive impedance element L1. The buffer circuit BUF1 amplifies the oscillation signal generated in the voltage-controlled oscillator circuit 1 and matches the impedance of the first output node N1 and the second output node N2.
ここで、実施の形態1にかかる電圧制御発振回路1では、可変容量性インピーダンス素子Cv1、Cv2の構成に特徴の1つを有する。そこで、可変容量性インピーダンス素子Cv1、Cv2の構成について詳細に説明する。図2に実施の形態1にかかる可変容量性インピーダンス素子Cv1、Cv2の詳細な回路図を説明する電圧制御発振回路1の回路図を示す。 Here, one of the features of the voltage-controlled oscillator circuit 1 according to the first embodiment is the configuration of the variable capacitive impedance elements Cv1 and Cv2. Therefore, the configuration of the variable capacitive impedance elements Cv1 and Cv2 will be described in detail. Figure 2 shows a circuit diagram of the voltage-controlled oscillator circuit 1 according to the first embodiment, illustrating the detailed circuit diagram of the variable capacitive impedance elements Cv1 and Cv2.
図2に示すように、可変容量性インピーダンス素子Cv1、可変容量性インピーダンス素子Cv2は同一の構成を有する。具体的には、可変容量性インピーダンス素子Cv1は、コンデンサC11、コンデンサC12、容量トランジスタTr11、抵抗R11を有する。コンデンサC11は、一方の端子が可変容量性インピーダンス素子Cv1の一方の端子となり、他方の端子が容量トランジスタTr11のゲートに接続される。抵抗R11は、一方の端子に周波数制御電圧VCTRLが与えられ、他方の端子が容量トランジスタTr11のゲートに接続される。容量トランジスタTr11は、ソースに接地電圧が与えられる、コンデンサC12は、容量トランジスタTr11のドレインとゲートとの間に接続される。 As shown in Figure 2, the variable capacitive impedance elements Cv1 and Cv2 have the same configuration. Specifically, the variable capacitive impedance element Cv1 has a capacitor C11, a capacitor C12, a capacitance transistor Tr11, and a resistor R11. One terminal of the capacitor C11 serves as one terminal of the variable capacitive impedance element Cv1, and the other terminal is connected to the gate of the capacitance transistor Tr11. One terminal of the resistor R11 is supplied with a frequency control voltage VCTRL, and the other terminal is connected to the gate of the capacitance transistor Tr11. The source of the capacitance transistor Tr11 is supplied with a ground voltage, and the capacitor C12 is connected between the drain and gate of the capacitance transistor Tr11.
また、可変容量性インピーダンス素子Cv2は、コンデンサC21、コンデンサC22、容量トランジスタTr21、抵抗R21を有する。コンデンサC21は、一方の端子が可変容量性インピーダンス素子Cv2の一方の端子となり、他方の端子が容量トランジスタTr21のゲートに接続される。抵抗R21は、一方の端子に周波数制御電圧VCTRLが与えられ、他方の端子が容量トランジスタTr21のゲートに接続される。容量トランジスタTr21は、ソースに接地電圧が与えられる、コンデンサC22は、容量トランジスタTr21のドレインとゲートとの間に接続される。 The variable capacitive impedance element Cv2 also has a capacitor C21, a capacitor C22, a capacitance transistor Tr21, and a resistor R21. One terminal of the capacitor C21 serves as one terminal of the variable capacitive impedance element Cv2, and the other terminal is connected to the gate of the capacitance transistor Tr21. One terminal of the resistor R21 is supplied with a frequency control voltage VCTRL, and the other terminal is connected to the gate of the capacitance transistor Tr21. The source of the capacitance transistor Tr21 is supplied with ground voltage, and the capacitor C22 is connected between the drain and gate of the capacitance transistor Tr21.
なお、コンデンサC11、C12、C21、C22は、配線層の間に形成される層間絶縁膜と、層間絶縁膜を挟む金属配線と、を用いた層間容量で形成される。 Capacitors C11, C12, C21, and C22 are formed as interlayer capacitances using an interlayer insulating film formed between wiring layers and metal wiring sandwiching the interlayer insulating film.
ここで、可変容量性インピーダンス素子Cv1、Cv2では、容量トランジスタと、容量トランジスタのドレインとゲートとの間に接続されるコンデンサと、により決定される容量値が可変する。そこで、可変容量性インピーダンス素子Cv1の容量トランジスタTr12及びコンデンサC12の等価回路を例に、可変容量性インピーダンス素子Cv1の容量値について説明する。 Here, the variable capacitive impedance elements Cv1 and Cv2 have variable capacitance values determined by a capacitance transistor and a capacitor connected between the drain and gate of the capacitance transistor. Therefore, the capacitance value of the variable capacitive impedance element Cv1 will be explained using the equivalent circuit of the capacitance transistor Tr12 and capacitor C12 of the variable capacitive impedance element Cv1 as an example.
そこで、図3に実施の形態1にかかる可変容量性インピーダンス素子Cv1の等価回路図を示す。図3に示す等価回路図では、容量トランジスタTr11のゲートを端子G、容量トランジスタTr11のドレインを端子D、容量トランジスタTr11のソースを端子Sとして示した。可変容量性インピーダンス素子Cv1の等価回路は、端子Gと端子Sとの間に周波数制御電圧VCTRLにより容量値が変化するゲート・ソース間容量Cgsが設けられ、端子Sと端子Dとの間に周波数制御電圧VCTRLにより抵抗値が変化するソース・ドレイン間抵抗Rdsが設けられる。また、端子Gと端子Dとの間にコンデンサC12が接続される。 Figure 3 shows an equivalent circuit diagram of the variable capacitive impedance element Cv1 according to the first embodiment. In the equivalent circuit diagram shown in Figure 3, the gate of the capacitance transistor Tr11 is shown as terminal G, the drain of the capacitance transistor Tr11 as terminal D, and the source of the capacitance transistor Tr11 as terminal S. In the equivalent circuit diagram of the variable capacitive impedance element Cv1, a gate-source capacitance Cgs whose capacitance value varies depending on the frequency control voltage VCTRL is provided between terminals G and S, and a source-drain resistance Rds whose resistance value varies depending on the frequency control voltage VCTRL is provided between terminals S and D. In addition, a capacitor C12 is connected between terminals G and D.
図3に示す等価回路図を用いて可変容量性インピーダンス素子Cv1のアドミッタンスYを考えると、アドミッタンスYは(1)式で表される。なお、以下の式ではコンデンサC11を500fF程度の容量値を有するものとして考える。
一方、周波数制御電圧VCTRLの電圧が1Vであった場合、ソース・ドレイン間抵抗Rdsがゼロとなり、1>>ω2C122Rds2となるため、アドミッタンスYは、(3)式のように表せる。なお、(3)式において、Cgs1は、周波数制御電圧VCTRLが1Vの時のゲート・ドレイン間容量である。
つまり、実施の形態1にかかる可変容量性インピーダンス素子は、周波数制御電圧VCTRLの電圧が0VではコンデンサC12がない回路と同等の容量値となり、周波数制御電圧VCTRLの電圧が1Vではゲート・ソース間容量CgsにコンデンサC12分の容量が加算された容量値となる。従って、実施の形態1にかかる可変容量性インピーダンス素子は、コンデンサC12がない回路と比べて容量値の可変範囲が広くなる。また、可変容量性インピーダンス素子Cv1、Cv2を有する電圧制御発振回路1は、発振周波数の可変範囲が広くなる。 In other words, the variable capacitive impedance element of embodiment 1 has a capacitance value equivalent to that of a circuit without capacitor C12 when the frequency control voltage VCTRL is 0 V, and has a capacitance value obtained by adding the capacitance of capacitor C12 to the gate-source capacitance Cgs when the frequency control voltage VCTRL is 1 V. Therefore, the variable capacitive impedance element of embodiment 1 has a wider variable range of capacitance value than a circuit without capacitor C12. Furthermore, a voltage-controlled oscillator circuit 1 having variable capacitive impedance elements Cv1 and Cv2 has a wider variable range of oscillation frequency.
そこで、実施の形態1にかかる可変容量性インピーダンス素子Cv1、Cv2の特性、及び、可変容量性インピーダンス素子Cv1、Cv2を有する電圧制御発振回路1の特性について説明する。なお、以下の説明では、可変容量性インピーダンス素子の容量トランジスタのゲートとドレインとの間に設けられるコンデンサを削除した可変容量性インピーダンス素子及び当該可変容量性インピーダンス素子を含む電圧制御発振回路を比較例として参照する。 The following describes the characteristics of the variable capacitive impedance elements Cv1 and Cv2 according to the first embodiment, and the characteristics of a voltage-controlled oscillator circuit 1 that includes the variable capacitive impedance elements Cv1 and Cv2. In the following description, a variable capacitive impedance element in which the capacitor provided between the gate and drain of the capacitance transistor of the variable capacitive impedance element has been removed, and a voltage-controlled oscillator circuit that includes this variable capacitive impedance element, are used as comparative examples.
図4に実施の形態1にかかる可変容量性インピーダンス素子の容量可変範囲を説明するグラフを示す。図4では、上図に比較例にかかる可変容量性インピーダンス素子の容量値の可変範囲を説明するグラフを示し、下図に実施の形態1にかかる可変容量性インピーダンス素子の容量値の可変範囲を説明するグラフを示した。また、図4に示したグラフでは、周波数制御電圧VCTRLを0Vから1Vに変化させた場合の容量値の変化を示した。 Figure 4 shows a graph illustrating the variable capacitance range of the variable capacitance impedance element according to embodiment 1. In Figure 4, the upper figure shows a graph illustrating the variable capacitance range of the variable capacitance impedance element according to the comparative example, and the lower figure shows a graph illustrating the variable capacitance range of the variable capacitance impedance element according to embodiment 1. The graph shown in Figure 4 also shows the change in capacitance value when the frequency control voltage VCTRL is changed from 0V to 1V.
図4に示すように、比較例にかかる可変容量性インピーダンス素子では、容量値の可変範囲は、50fF程度から100fF程度の範囲で可変する。一方、実施の形態1にかかる可変容量性インピーダンス素子は、50fF程度から600fF以上の容量値まで容量値を可変させることができる。つまり、実施の形態1にかかる可変容量性インピーダンス素子は、容量トランジスタのゲートとドレインとの間に接続されるコンデンサがない比較例にかかる可変容量性インピーダンス素子に比べて広い容量値の可変範囲を有する。 As shown in Figure 4, the variable capacitance impedance element of the comparative example has a variable capacitance range of approximately 50 fF to 100 fF. On the other hand, the variable capacitance impedance element of embodiment 1 can vary the capacitance from approximately 50 fF to a capacitance value of 600 fF or more. In other words, the variable capacitance impedance element of embodiment 1 has a wider variable capacitance range than the variable capacitance impedance element of the comparative example, which does not have a capacitor connected between the gate and drain of the capacitance transistor.
また、図5に実施の形態1にかかる電圧制御発振回路1の周波数可変範囲を説明するグラフを示す。図5では、上図に比較例にかかる電圧制御発振回路の周波数の可変範囲を説明するグラフを示し、下図に実施の形態1にかかる電圧制御発振回路の周波数の可変範囲を説明するグラフを示した。また、図5に示したグラフでは、周波数制御電圧VCTRLを0Vから1Vに変化させた場合の発振周波数の周波数の変化を示した。 Figure 5 also shows a graph illustrating the frequency variable range of the voltage-controlled oscillator circuit 1 according to the first embodiment. In Figure 5, the upper figure shows a graph illustrating the frequency variable range of the voltage-controlled oscillator circuit according to the comparative example, and the lower figure shows a graph illustrating the frequency variable range of the voltage-controlled oscillator circuit according to the first embodiment. The graph shown in Figure 5 also shows the change in the oscillation frequency when the frequency control voltage VCTRL is changed from 0V to 1V.
図5に示すように、比較例にかかる電圧制御発振回路では、周波数の可変範囲が6.5GHzから7.1GHz程度となる。一方、実施の形態1にかかる電圧制御発振回路1では、周波数の可変範囲が4.0GHz程度から6.7GHz程度となる。つまり、実施の形態1にかかる電圧制御発振回路1では、比較例にかかる電圧制御発振回路よりも明らかに周波数の可変範囲が拡大する。 As shown in Figure 5, the voltage-controlled oscillator circuit of the comparative example has a variable frequency range of approximately 6.5 GHz to 7.1 GHz. On the other hand, the voltage-controlled oscillator circuit 1 of embodiment 1 has a variable frequency range of approximately 4.0 GHz to 6.7 GHz. In other words, the voltage-controlled oscillator circuit 1 of embodiment 1 has a clearly wider variable frequency range than the voltage-controlled oscillator circuit of the comparative example.
上記説明より、実施の形態1にかかる電圧制御発振回路1では、可変容量性インピーダンス素子を構成する容量トランジスタのゲートとドレイン間にコンデンサを設けることで可変容量性インピーダンス素子の容量値の可変範囲を拡大することができる。また、実施の形態1にかかる可変容量性インピーダンス素子を有する電圧制御発振回路1は、出力信号の周波数可変範囲を、容量トランジスタのゲートとドレイン間にコンデンサがない可変容量性インピーダンス素子を有する電圧制御発振回路よりも大幅に広くすることができる。 As explained above, in the voltage-controlled oscillator circuit 1 according to the first embodiment, the variable range of the capacitance value of the variable capacitance impedance element can be expanded by providing a capacitor between the gate and drain of the capacitance transistor that constitutes the variable capacitance impedance element. Furthermore, the voltage-controlled oscillator circuit 1 having the variable capacitance impedance element according to the first embodiment can significantly widen the frequency variable range of the output signal compared to a voltage-controlled oscillator circuit having a variable capacitance impedance element that does not have a capacitor between the gate and drain of the capacitance transistor.
実施の形態2
実施の形態2では、実施の形態1にかかる可変容量性インピーダンス素子Cv1、Cv2の別の形態となる可変容量性インピーダンス素子Cv1a、Cv2aについて説明する。なお、実施の形態2の説明では、実施の形態1と同じ構成要素については、実施の形態1と同じ符号を付して説明を省略する。
Embodiment 2
In the second embodiment, a description will be given of variable capacitive impedance elements Cv1a and Cv2a which are different from the variable capacitive impedance elements Cv1 and Cv2 according to the first embodiment. In the description of the second embodiment, the same components as those in the first embodiment will be assigned the same reference numerals as those in the first embodiment, and the description thereof will be omitted.
図6に実施の形態2にかかる可変容量性インピーダンス素子Cv1a、Cv2aの詳細な回路図を説明する電圧制御発振回路の回路図を示す。図6に示すように、可変容量性インピーダンス素子Cv1aは、可変容量性インピーダンス素子Cv1に第1のミラートランジスタ(例えば、ミラートランジスタTr31)、第2のミラートランジスタ(例えば、ミラートランジスタTr32)、ミラー抵抗R31により構成されるバイアス回路を追加したものである。当該バイアス回路は、容量トランジスタTr11のドレインに、バイアス電流を供給する。 Figure 6 shows a circuit diagram of a voltage-controlled oscillator circuit illustrating the detailed circuit diagrams of the variable capacitive impedance elements Cv1a and Cv2a according to the second embodiment. As shown in Figure 6, the variable capacitive impedance element Cv1a is configured by adding a bias circuit composed of a first mirror transistor (e.g., mirror transistor Tr31), a second mirror transistor (e.g., mirror transistor Tr32), and a mirror resistor R31 to the variable capacitive impedance element Cv1. This bias circuit supplies a bias current to the drain of the capacitance transistor Tr11.
ミラートランジスタTr31は、ソースにバイアス電圧Vdが与えられ、ゲートとドレインが共通接続される。ミラートランジスタTr32は、ソースにバイアス電圧Vdが与えられ、ゲートがミラートランジスタTr31のゲートと共通接続され、ドレインが容量トランジスタTr11のドレインに接続される。ミラー抵抗R31は、ミラートランジスタTr31のドレインと接地電圧を供給する接地端子との間に接続される。 The source of the mirror transistor Tr31 is supplied with a bias voltage Vd, and the gate and drain are commonly connected. The source of the mirror transistor Tr32 is supplied with a bias voltage Vd, the gate is commonly connected to the gate of the mirror transistor Tr31, and the drain is connected to the drain of the capacitance transistor Tr11. The mirror resistor R31 is connected between the drain of the mirror transistor Tr31 and a ground terminal that supplies a ground voltage.
可変容量性インピーダンス素子Cv2aは、可変容量性インピーダンス素子Cv1aと実質的に同じ構成である。つまり、可変容量性インピーダンス素子Cv2aは、可変容量性インピーダンス素子Cv2に第1のミラートランジスタ(例えば、ミラートランジスタTr41)、第2のミラートランジスタ(例えば、ミラートランジスタTr42)、ミラー抵抗R41により構成されるバイアス回路を追加したものである。当該バイアス回路は、容量トランジスタTr21のドレインに、バイアス電流を供給する。 The variable capacitive impedance element Cv2a has substantially the same configuration as the variable capacitive impedance element Cv1a. In other words, the variable capacitive impedance element Cv2a is configured by adding a bias circuit consisting of a first mirror transistor (e.g., mirror transistor Tr41), a second mirror transistor (e.g., mirror transistor Tr42), and a mirror resistor R41 to the variable capacitive impedance element Cv2. This bias circuit supplies a bias current to the drain of the capacitive transistor Tr21.
ミラートランジスタTr41は、ソースにバイアス電圧Vdが与えられ、ゲートとドレインが共通接続される。ミラートランジスタTr42は、ソースにバイアス電圧Vdが与えられ、ゲートがミラートランジスタTr41のゲートと共通接続され、ドレインが容量トランジスタTr21のドレインに接続される。ミラー抵抗R41は、ミラートランジスタTr41のドレインと接地電圧を供給する接地端子との間に接続される。 The source of the mirror transistor Tr41 is supplied with a bias voltage Vd, and the gate and drain are commonly connected. The source of the mirror transistor Tr42 is supplied with a bias voltage Vd, the gate is commonly connected to the gate of the mirror transistor Tr41, and the drain is connected to the drain of the capacitance transistor Tr21. The mirror resistor R41 is connected between the drain of the mirror transistor Tr41 and a ground terminal that supplies a ground voltage.
上記実施の形態2にかかる可変容量性インピーダンス素子Cv1a、Cv2aでは、ミラー抵抗R31、R41の値を適切に設定することで、バイアス電圧Vdの値の変動に対して、容量トランジスタに流れる電流値の変動が非常に少ない回路が達成できる。 In the variable capacitive impedance elements Cv1a and Cv2a according to the second embodiment, by appropriately setting the values of the mirror resistors R31 and R41, a circuit can be achieved in which the fluctuations in the current value flowing through the capacitance transistor are extremely small in response to fluctuations in the value of the bias voltage Vd.
なお、本発明は上記実施の形態に限られたものではなく、趣旨を逸脱しない範囲で適宜変更することが可能である。 The present invention is not limited to the above-described embodiment, and modifications can be made as appropriate without departing from the spirit of the invention.
1、2 電圧制御発振回路
Tr1、Tr2 トランジスタ
Tr11、Tr21 容量トランジスタ
Tr31、Tr32、Tr41、Tr42 ミラートランジスタ
R1、R2、R11、R21 抵抗
R31、R41 ミラー抵抗
L1 誘導性インピーダンス素子
Cv1、Cv2、Cv1a、Cv2a 可変容量性インピーダンス素子
C11、C12、C21、C22 コンデンサ
BUF1、BUF2 バッファ回路
RL 負荷抵抗
Vout 出力信号
VCTRL 周波数制御電圧
1, 2 Voltage controlled oscillator circuit Tr1, Tr2 Transistor Tr11, Tr21 Capacitor transistor Tr31, Tr32, Tr41, Tr42 Mirror transistor R1, R2, R11, R21 Resistor R31, R41 Mirror resistor L1 Inductive impedance element Cv1, Cv2, Cv1a, Cv2a Variable capacitive impedance element C11, C12, C21, C22 Capacitor BUF1, BUF2 Buffer circuit RL Load resistor Vout Output signal VCTRL Frequency control voltage
Claims (5)
ソースに前記第1の電源が接続され、ドレインが前記第2のノードに接続され、ゲートが前記第1のノードに接続される第2のトランジスタと、
前記第1のノードに接続された第1の端子と、前記第2のノードに接続された第2の端子と、を有する誘導性インピーダンス素子と、
前記第1のノードに接続された第1の端子と、第3のノードに結合された第2の端子とを有する第1の可変容量性インピーダンス素子と、
前記第2のノードに結合された第1の端子と、前記第3のノードに結合された第2の端子とを有する第2の可変容量性インピーダンス素子と、を有し、
前記第1の可変容量性インピーダンス素子は、
第3のトランジスタと、
前記第3のトランジスタのゲートと前記第3のノードとの間に接続される第3の抵抗と、
前記第3のトランジスタのゲートと前記第3のトランジスタのドレインとの間に接続された第1のコンデンサと、を備える電圧制御発振回路。 a first transistor having a source connected to a first power supply, a drain connected to a first node, and a gate connected to a second node;
a second transistor having a source connected to the first power supply, a drain connected to the second node, and a gate connected to the first node;
an inductive impedance element having a first terminal connected to the first node and a second terminal connected to the second node;
a first variable capacitive impedance element having a first terminal connected to the first node and a second terminal coupled to a third node;
a second variable capacitive impedance element having a first terminal coupled to the second node and a second terminal coupled to the third node;
The first variable capacitive impedance element comprises:
a third transistor; and
a third resistor connected between the gate of the third transistor and the third node;
a first capacitor connected between the gate of the third transistor and the drain of the third transistor.
第4のトランジスタと、
前記第4のトランジスタのゲートと前記第4のトランジスタのドレインとの間に接続される第3のコンデンサと、
を有する請求項1に記載の電圧制御発振回路。 The second variable capacitive impedance element comprises:
a fourth transistor; and
a third capacitor connected between the gate of the fourth transistor and the drain of the fourth transistor;
2. The voltage controlled oscillator circuit of claim 1, comprising:
前記第2のトランジスタのドレインと前記第2のノードとの間に接続される第2の抵抗と、
を更に有する請求項1に記載の電圧制御発振回路。 a first resistor connected between the drain of the first transistor and the first node;
a second resistor connected between the drain of the second transistor and the second node;
2. The voltage controlled oscillator circuit of claim 1, further comprising:
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