JP7826708B2 - probe - Google Patents

Description

This disclosure relates to a probe used for inspecting connectors.

Patent Document 1 discloses a probe that includes a first elastic body for correcting misalignment between the connector to be tested and the probe, and a second elastic body for moving the probe pin to contact the connector terminal.

International Publication No. 2019/069576

In a probe such as that disclosed in Patent Document 1, the stroke amount of the entire probe must be distributed between the first elastic body and the second elastic body. If the stroke amount of the first elastic body is insufficient, the misalignment between the connector and the probe may not be corrected properly. This may result in the probe pin not making proper contact with the connector terminal. As a result, high-precision inspection of connectors is hindered with conventional probes.

This disclosure therefore provides a probe that improves connector inspection accuracy.

A probe according to one aspect of the present disclosure is a probe used to inspect a connector equipped with contacts, and includes a plunger having a tip portion containing a probe pin provided to correspond to the contact, a main body portion extending in the extension direction and containing a conductive portion electrically connected to the probe pin, and a flange portion fixed to the outer periphery of the main body portion; a flange having a hole that passes through the main body portion; a housing containing the main body portion at its center in the extension direction and containing the tip portion at one end in the extension direction; and a spring between the housing and the flange portion that urges the flange portion toward the flange and urges the housing away from the flange portion.

In a probe according to one aspect of the present disclosure, a spring urges the collar, which is fixed to the main body, toward the flange and urges the housing away from the collar. The stroke of the flange causes the spring to contract, and the plunger begins to move via the collar, which is urged toward the flange, and the main body to which the collar is fixed. Furthermore, with a single spring, there are fewer contact points, resulting in a more stable resistance value. These features improve the accuracy of connector inspection.

This disclosure provides a probe that improves connector inspection accuracy.

1A is a plan view, FIG. 1B is a perspective view, FIG. 1C is a side view, and FIG. 1D is a bottom view showing the appearance of a probe according to a first embodiment. FIG. FIG. 2 is a cross-sectional view taken along line AA in FIG. 2 is a cross-sectional view showing a cross section along line AA in FIG. 1(a) in a state where the pin is disengaged. FIG. 2 is a cross-sectional view showing a cross section along line AA in FIG. 1( a ) in a stroke state. FIG. 4 is a cross-sectional view showing a cross section of a probe according to a second embodiment, which corresponds to FIG. 3 .

Embodiments will be described in detail below with reference to the drawings. In the description, identical elements or elements with identical functions will be assigned the same reference numerals, and duplicate descriptions will be omitted.

[First embodiment]
FIG. 1 is a diagram showing the appearance of a probe 1 in a first embodiment. FIG. 1( a) is a plan view, FIG. 1( b) is a perspective view, FIG. 1( c) is a side view, and FIG. 1( d) is a bottom view. The shape of the probe 1 when viewed from above (see FIG. 1( a)) and the shape of the probe 1 when viewed from below (see FIG. 1( d)) are both approximately rectangular. Hereinafter, the direction along the long side of the rectangle will be referred to as the X-axis direction, and the direction along the short side of the rectangle will be referred to as the Y-axis direction. The height direction, which is perpendicular to the X-axis and Y-axis, will be referred to as the Z-axis direction. The X-axis, Y-axis, and Z-axis are perpendicular to one another. The probe 1 has a generally columnar shape extending in the Z-axis direction as a whole.

The probe 1 is a tool used to inspect the connector 100 (see Figure 4), which will be described later. The connector 100 is a multi-core connector including multiple contacts 1001 (see Figure 4). The multiple contacts 1001 are arranged, for example, in multiple rows. In this embodiment, the connector 100 includes two contacts 1001 arranged in two rows and an insulating housing 1003 that secures the contacts 1001. The connector 100 also includes a shell 1002 (see Figure 4) that surrounds the outer periphery of the insulating housing 1003 and separates the multiple contacts 1001. The shell 1002 functions as a ground connection portion. The connector 100 is disposed on a printed circuit board (not shown) and is electrically connected to the printed circuit board. During inspection, the connector 100 is electrically connected to the probe 1. In addition to the connector 100, various components may be disposed on the printed circuit board.

The probe 1 and connector 100 are electrically connected by the probe 1 moving in the Z-axis direction. Hereinafter, within the Z-axis direction, the direction in which the connector 100 is located as seen from the probe 1 will be referred to as "downward," and the direction in which the probe 1 is located as seen from the connector 100 will be referred to as "upward." The probe 1 is positioned upward as seen from the connector 100. When the probe 1 and connector 100 are connected, a force pressing upward on the probe 1 (hereinafter referred to as "pressure") is applied as a reaction to the force pressing the probe 1 downward. The state in which no pressure is being applied to the probe 1 is referred to as the initial state, and the state in which pressure is being applied is referred to as the stroke state.

Figure 2 is an exploded perspective view of the probe 1. The probe 1 includes a conductive portion 2, a probe pin 3, a plunger 4, a substrate 5, a flange 6, a spring 7, a housing 8, and a cap 9. The conductive portion 2 includes a coaxial cable 21 and a conductive member 22. The plunger 4 includes a main body 41, a tip 42, and a flange 43.

The configuration of probe 1 will be described with reference to Figure 3. Figure 3 is a cross-sectional view taken along line A-A in Figure 1(a).

The conductive portion 2 is electrically connected to the probe pin 3. Here, "electrically connected" refers not only to cases where the conductive portion 2 and the probe pin 3 are electrically connected by being directly physically connected to each other, but also to cases where the conductive portion 2 and the probe pin 3 are electrically connected by being indirectly connected to each other via a conductive component (e.g., a substrate 5) placed between the conductive portion 2 and the probe pin 3. The conductive portion 2 is also electrically connected to, for example, external testing equipment.

For example, the conductive portion 2 has multiple (e.g., two) coaxial cables 21 and multiple (e.g., two) conductive members 22. The coaxial cables 21 are conductors coated with an insulator that extend in the Z-axis direction. The conductive members 22 are conductive parts (e.g., conductors or wiring made of metal) that extend in the Z-axis direction. The coaxial cables 21 are electrically connected to the conductive members 22. The conductive portion 2 may be composed of at least one of the coaxial cables 21 and the conductive members 22.

The probe pin 3 is a needle-shaped conductive component, such as a pogo pin. A plurality of probe pins 3 (for example, two) are provided to correspond one-to-one with the contacts 1001, 1001 of the connector 100, and extend along the Z-axis direction. The tip (lower end) of the probe pin 3 faces the connector 100 in the Z-axis direction. In this embodiment, "facing" also includes cases where other components exist between the opposing objects.

The substrate 5 is a generally cylindrical component that electrically connects the conductive portion 2 and the multiple probe pins 3 to each other. The substrate 5 has a first main surface 51 and a second main surface 52 opposite the first main surface 51. The substrate 5 is electrically connected to the conductive member 22 of the conductive portion 2 on the first main surface 51. The substrate 5 is electrically connected to the multiple probe pins 3 on the second main surface 52. Details of the substrate 5 will be described later.

The plunger 4 is a conductive component having a main body 41, a tip 42, and a flange 43. The main body 41 is formed in a generally cylindrical shape and contains at least a portion of the conductive portion 2. Specifically, the main body 41 contains portions of multiple coaxial cables 21 and multiple conductive members 22, and extends in the Z-axis direction along these components. The main body 41 has a cylindrical top surface 411, a bottom surface 412, and a side surface 413 extending in the Z-axis direction from the top surface 411 to the bottom surface 412. The main body 41 has multiple through holes 41H formed along the Z-axis direction from the top surface 411 to the bottom surface 412. Insulators D, which contain the conductive members 22 and other components that make up the conductive portion 2, are disposed in the multiple through holes 41H. For example, coaxial cables 21 are inserted into the multiple through holes 41H from the top surface 411 along the Z-axis direction, and the gaps where the coaxial cables 21 are inserted are filled with collars C. The bottom surface 412 faces the substrate 5 in the Z-axis direction. The tips of the conductive portions 2 (e.g., conductive members 22) are exposed from the bottom surface 412.

The tip portion 42 is formed in a columnar shape and is disposed at the lower portion 415 of the main body portion 41 and fixed to the main body portion 41. The tip portion 42 contains multiple probe pins 3 and accommodates the substrate 5, extending in the Z-axis direction along the multiple probe pins 3. The substrate 5 is disposed so as to be sandwiched between the main body portion 41 and the tip portion 42.

The tip portion 42 has a support portion 421 and a holding portion 422. The support portion 421 is formed in a cylindrical shape with a bottom and accommodates the substrate 5. The holding portion 422 is formed in a columnar shape and extends in the Z-axis direction (downward) from a base end (upper end) that is continuous with the support portion 421, and contains multiple probe pins 3. The tip portion 42 also has a tip surface 423, which is the lower end surface in the Z-axis direction. The holding portion 422 also holds the multiple probe pins 3 so that the tips (lower ends) of the multiple probe pins 3 are exposed from the tip surface 423.

The support portion 421 has an upper surface 4211, a recess 4212 formed by recessing the upper surface 4211, and an inner bottom surface 4213 that is the bottom surface of the recess 4212. The recess 4212 accommodates the substrate 5. In other words, the recess 4212 functions as a receptacle for the substrate 5. The inner bottom surface 4213 faces the second main surface of the substrate 5. The base ends (other ends) of multiple probe pins 3 protrude from the center of the inner bottom surface 4213 and are in contact with the second main surface 52 of the substrate 5.

The flange 43 is fixed to the outer periphery of the main body 41. The flange 43 is formed of at least one resin selected from the group consisting of polyacetal resin, polyamide resin, polyether ether ketone resin, and polytetrafluoroethylene resin. These resins have low frictional resistance (high sliding properties). The flange 43 has an annular portion 430 having an upper surface 431 and a lower surface 432, and a cylindrical portion 433 that is continuous with the lower surface 432 and extends downward in the Z-axis direction along the side surface 413. When viewed from above or from the bottom, the region near the center of the flange 43 is hollowed out in a circular shape. The flange 43 is positioned on the lower surface 62 of the flange 6 along the outer periphery of a hole 6H in the flange 6 (described below). The flange 43 also surrounds the side surface 413 at the upper portion 414 of the main body 41. The cylindrical portion 433 faces the bottom surface 811 of the housing 8 (described below) in the Z-axis direction.

Through holes 43H are formed in the flange 43, extending from the upper surface 431 to the lower surface 432. Multiple (e.g., four) through holes 43H are formed at predetermined intervals along the circumferential direction of the flange 43 (see Figure 2). Ribs 83 of the housing 8, described below, are inserted into the through holes 43H from the lower surface 432 (see Figure 1(b)).

The substrate 5 in this embodiment is a build-up substrate (see Figure 3). For example, the substrate 5 is composed of a base layer and build-up layers that form a first main surface 51 and a second main surface 52 that sandwich the base layer in the Z-axis direction. The first main surface 51 forms the upper surface of the substrate 5, and the second main surface 52 forms the lower surface of the substrate 5.

The substrate 5 further has a signal conductive portion 53 and a ground conductive portion 54. The signal conductive portion 53 is provided across the first principal surface 51 and the second principal surface 52. The signal conductive portion 53 contacts a plurality of conductive members 22 on the first principal surface 51 and a plurality of probe pins 3 on the second principal surface 52, thereby electrically connecting the conductive portion 2 and the plurality of probe pins 3.

The substrate 5 converts the pitch of the conductive portions 2 and the pitch of the multiple probe pins 3. For example, the pitch of the multiple conductive members 22 is greater than the pitch of the multiple probe pins 3. Corresponding to this difference in pitch, the pitch of the signal conductive portions 53 on the first main surface 51 is greater than the pitch of the signal conductive portions 53 on the second main surface 52. In other words, the signal conductive portions 53 convert the pitch of the conductive portions 2 and the pitch of the multiple probe pins 3 in accordance with their positions on the first main surface 51 and second main surface 52.

The ground conductive portion 54 is a conductive layer provided on each of the first principal surface 51 and the second principal surface 52. The ground conductive portion 54 has a multilayer structure formed, for example, by plating. The ground conductive portion 54 on the first principal surface 51 surrounds the signal conductive portion 53 on the first principal surface 51. For example, when the substrate 5 is viewed from above, multiple (e.g., two) signal conductive portions 53 are provided on the first principal surface 51 near both ends in the X-axis direction, and the ground conductive portion 54 is provided so as to surround the periphery of the signal conductive portion 53. Similarly, when the substrate 5 is viewed from the bottom, multiple (e.g., two) signal conductive portions 53 are provided on the second principal surface 52 near both ends in the X-axis direction, and the ground conductive portion 54 is provided so as to surround the periphery of the signal conductive portion 53 (not shown).

The height of the substrate 5 is greater than the depth of the recess 4212 of the support portion 421. More specifically, the distance between the first main surface 51 and the second main surface 52 of the substrate 5 is greater than the distance between the top surface 4211 and the inner bottom surface 4213 of the support portion 421. Therefore, when the substrate 5 is accommodated in the recess 4212, the first main surface 51 of the substrate 5 protrudes beyond the top surface 4211 of the support portion 421.

The flange 6 is a plate-shaped component used to secure the probe 1 to the testing equipment. The flange 6 has a generally rectangular shape in plan view. The flange 6 has an upper surface 61 and a lower surface 62. A hole 6H is formed in the flange 6, extending from the center of the upper surface 61 to the center of the lower surface 62, through which the main body 41 passes. When the upper surface 61 is viewed in plan view or the lower surface 62 is viewed from the bottom, the area where the hole 6H is formed appears circular. The hole 6H in the upper surface 61 communicates with a hole 9H in the cap 9, described below. The hole 6H in the lower surface 62 communicates with a hole provided in an area near the center of the flange 43. The flange 6 also has a pair of holes 6W formed on either side of the hole 6H, extending from the upper surface 61 to the lower surface 62, at both ends along the X-axis direction. The flange 6 secures the probe 1 to the testing equipment by screwing through the holes 6W. The hole 6W may also be a so-called screw hole.

The upper surface 61 of the flange 6 secures a rod-shaped pin P formed separately from the flange 6. The pin P has an upper end P1 and a lower end P2 fixed to the upper surface 61.

The spring 7 is a single coil spring. The spring 7 is disposed between the flange 43 of the plunger 4 and the base 81 of the housing 8, which will be described later. Specifically, the spring 7 surrounds the side surface 413 of the main body 41 and is disposed so as to be sandwiched between the tubular portion 433 of the flange 43 and the bottom surface 811 of the base 81, which will be described later. The spring 7 biases the base 81 away from the flange 43, thereby biasing the housing 8 away from the flange 43. In the initial state, the spring 7 applies a downward biasing force to the housing 8 from the underside 432 of the flange 43. The spring 7 maintains the housing 8 in an initial position, spaced a predetermined distance from the flange 43. In the stroke state, the spring 7 is compressed in the Z-axis direction.

The housing 8 is a conductive member formed in a generally cylindrical shape and extending along the Z-axis direction. The housing 8 has a base 81, a bottom 82, and ribs 83 (see Figure 2). The housing 8 accommodates the plunger 4 and spring 7. Specifically, the housing 8 contains the main body 41 at a central portion 87 in the extension direction, and contains the tip portion 42 at one end 84 in the extension direction.

The base 81 is formed in a generally bottomed cylindrical shape and has a bottom surface 811 on one side (lower) in the extension direction. The bottom surface 811 faces the tubular portion 433 in the Z-axis direction, sandwiching the spring 7. The bottom portion 82 is a rectangular cylindrical portion that extends downward along the Z-axis direction from near the center of the bottom surface 811 of the base 81 at an end 84 (one end) on one side (lower) in the extension direction of the housing 8. The bottom portion 82 has a plate-shaped member 821 at its lower end. The plate-shaped member 821 has a tip surface 822 that faces the connector 100 and an inner bottom surface 823 that faces the tip surface 423 of the tip portion 42. The plate-shaped member 821 has multiple openings 82H that extend from the tip surface 822 to the inner bottom surface 823, respectively, for exposing the tips of the multiple probe pins 3 to the outside. The portions of the tip surface 822 between the multiple openings 82H come into contact with the shell 1002 that separates the multiple contacts 1001, 1001 in the connector 100 (see Figure 4). This contact establishes ground contact between the connector 100 and the housing 8.

The housing 8 is configured to enclose the tip portion 42, and further has a guide portion 86 at one (lower) end 84 that positions the connector 100. The guide portion 86 is fitted to the connector 100. The guide portion 86 is continuous with the tip surface 822 of the plate-like member 821 and is configured to protrude downward in the Z-axis direction. The tip (lower end) portion of the guide portion 86 is tapered so that its thickness becomes thinner (the opening becomes larger) toward the tip. For example, the guide portion 86 has a pair of tapered shapes in the X-axis direction and a pair of tapered shapes in the Y-axis direction. When the guide portion 86 approaches the connector 100 in the Z-axis direction, it adjusts the position of the connector 100 along the slope of the tapered shape.

The rib 83 is provided contiguous with the base 81 at the other (upper) end 85 in the extension direction of the housing 8. For example, the rib 83 is a plate-shaped protrusion that extends upward along the Z-axis direction from the base 81 as its base end. Multiple ribs 83 (for example, four) are provided at predetermined intervals around the periphery of the base 81 (see Figure 1(b)). The rib 83 is inserted into the through-hole 43H from the underside 432 of the flange 43.

The cap 9 is a generally rectangular parallelepiped component. The cap 9 is positioned to surround the rib 83 of the housing 8. The cap 9 has an upper surface 91 and a lower surface 92. A hole 9H is formed in the cap 9 along the Z-axis direction, extending from the center of the upper surface 91 to the center of the lower surface 92. When the upper surface 91 is viewed from above or the lower surface 92 is viewed from the bottom, the area where the hole 9H is formed is hollowed out in a circular shape. The diameter of the hole 9H in the upper surface 91 is smaller than the diameter of the hole 9H in the lower surface 92. The lower surface 92 faces the upper surface 61 of the flange 6. The hole 9H in the lower surface 92 communicates with the hole 6H in the upper surface 61 of the flange 6. The rib 83 of the housing 8 is inserted into the hole 9H from the lower surface 92 and press-fitted to a position between the lower end 93 of the upper surface 91 and the lower surface 92 (e.g., an intermediate position). The lower end 93 may be indirectly in contact with the rib 83 by contacting an insulator attached to the rib 83.

Multiple (e.g., two) pin holes 92H are formed in the underside 92 of the cap 9 at both ends in the X-axis direction. The pin holes 92H are formed from the underside 92 toward the top side 91 (upward), but do not reach (pass through) the top side 91. A hole bottom 94 is formed at the deepest part (top end) of the pin holes 92H. The hole bottom 94 has a tapered shape that tapers toward the deepest part (top end), and then has a constant hole diameter. Pins P are arranged on the top side 61 of the flange 6 to correspond to the pin holes 92H.

The pin P has an upper end P1 that engages with the hole bottom 94, and this engagement is releasable. In the initial state, the upper end P1 of the pin P abuts against the hole bottom 94, thereby engaging the flange 6 and the cap 9. Hereinafter, the state in which the pin P is engaged with the cap 9 will be referred to as the "first state." In the first state, the distance L1 between the tip of the probe pin 3 and the tip surface 822 of the housing 8 that faces the connector 100 is determined. That is, the probe 1 is fixed in position along the X and Y axes by the engagement between the pin P and the cap 9, and along the Z axis, the flange 43 of the plunger 4 is biased toward the flange 6 by the spring 7, thereby determining the initial position of the probe 1. In the stroke state, the upper end P1 of the pin P moves away from the hole bottom 94. When the upper end P1 of the pin P moves to a position where it forms the tapered shape of the hole bottom 94, the engagement between the pin P and the hole bottom 94 is released.

In this embodiment, the hole bottom 94 is described as being formed in the cap 9, but the hole bottom 94 may also be formed in the flange 6. For example, the hole bottom 94 may be formed in the upper surface 61 of the flange 6 instead of the cap 9. In this case, the cap 9 may secure the upper end P1 of the pin P. The pin P may be configured so that its lower end P2 engages with the hole bottom 94 formed in the flange 6, and this engagement is releasable. In other words, the pin P may extend toward the other member of the flange 6 and the cap 9, engage with the other member, and be configured so that this engagement is releasable.

[stroke]
Next, the stroke state of the probe 1 will be described with reference to Figures 4 and 5. Figure 4 is a cross-sectional view showing a cross section along line AA in Figure 1(a) in a state where the engagement of the pin P is released.

With the housing 8 abutting against the connector 100 at one end 84, the plunger 4 moves in the extension direction (downward in the Z-axis direction) relative to the housing 8 in response to the flange 6 moving in the direction pressing against the flange portion 43 (downward in the Z-axis direction). The plunger 4 has a first movement range from a first state to a second state in which the pin P moves in conjunction with the movement of the flange 6 and the engagement of the pin P with the cap 9 is released.

Specifically, when the flange 6 moves from the initial state in a direction pressing the flange 43, the entire plunger 4 moves downward in the Z-axis direction via the flange 43. Furthermore, the upper end P1 of the pin P moves away from the hole bottom 94, creating a gap inside the pin hole 92H. The plunger 4 can only move in the Z-axis direction from the initial state up to an engagement length L2, which is the length over which the pin P engages with the cap 9. When the plunger 4 moves downward in the Z-axis direction by the engagement length L2, the pin P disengages. When the pin P disengages, the probe 1 becomes movable in the X-axis and Y-axis directions. This allows the probe 1 to adjust for axial misalignment between the probe 1 and the connector 100.

Here, in the first state, the engagement length L2 is shorter than the distance L1 (see Figure 3) between the tip of the probe pin 3 and the tip surface 822 of the housing 8 that faces the connector 100. In other words, within the first range of movement of the plunger 4, the tip of the probe pin 3 is not exposed from the opening 82H in the bottom 82 of the housing 8. In other words, within the first range of movement until the pin P disengages from the cap 9, the probe pin 3 is prevented from being exposed to the outside of the housing 8 due to sudden movement of the plunger 4.

Figure 5 is a cross-sectional view taken along line A-A in Figure 1(a) in the stroke state. Figure 5 shows a state in which further pressure has been applied from the state shown in Figure 4 so that the probe 1 is pressed against the connector 100.

The plunger 4 has a second range of movement within its range of movement, in which the flange 6 moves further in the extension direction from the second state. In the stroke state, the plunger 4 moves downward in the Z-axis direction. In the second range of movement of the plunger 4, the tip of the probe pin 3 is exposed to the outside through the opening 82H in the bottom 82 of the housing 8. In other words, after positioning with respect to the connector 100 in the first range of movement, the pin P disengages from the cap 9, allowing the flange 6 and probe pin 3 to move smoothly, and the probe pin 3 is exposed to the outside from the housing 8. The probe pin 3 is then connected to the connector 100.

[Effects of this embodiment]
A probe 1 according to one aspect of this embodiment is a probe 1 used for inspecting a connector 100 having contacts 1001, 1001, and includes a plunger 4 having a tip portion 42 containing a probe pin 3 provided to correspond to the contacts 1001, 1001, a main body portion 41 extending in the extension direction and containing a conductive portion 2 electrically connected to the probe pin 3, and a flange portion 43 fixed to the outer periphery of the main body portion 41, a flange 6 provided with a hole 6H through which the main body portion 41 passes, a housing 8 containing the main body portion 41 at a central portion 87 in the extension direction and containing the tip portion 42 at one end portion 84 in the extension direction, and one spring 7 between the housing 8 and the flange portion 43, which urges the flange portion 43 toward the flange 6 and urges the housing 8 in a direction away from the flange portion 43.

In the probe 1 according to one aspect of this embodiment, the spring 7 biases the flange 43, which is fixed to the main body 41, toward the flange 6, and biases the housing 8 away from the flange 43. The stroke of the flange 6 causes the spring 7 to contract, and the plunger 4 begins to move via the flange 43, which is biased toward the flange 6, and the main body 41 to which the flange 43 is fixed. Because the compression of a single spring 7 determines the range of motion of the plunger 4, the probe 1 of the present disclosure allows for a simple and compact design of the spring 7, and ensures a larger inspection range (stroke amount) than conventional probes equipped with multiple springs 7. As a result, the stroke amount available for correcting misalignment between the probe 1 and the connector 100 is longer than in conventional probes, improving the positioning accuracy between the probe 1 and the connector 100. Furthermore, with a single spring 7, the number of components is reduced compared to conventional probes, resulting in fewer contacts for ground conduction, resulting in more stable resistance. These factors contribute to improved inspection accuracy of the connector 100.

A comparative example of a probe includes a probe with multiple springs (e.g., two). This probe has, for example, a first spring that positions the probe relative to the connector and a second spring that controls the protrusion of the probe pin. The multiple springs limit the stroke of each spring, potentially limiting the amount of protrusion of the probe pin from the tip, i.e., the inspection range, and potentially reducing the reliability of the probe pin's contact with the contact. This is particularly pronounced when the elastic force of the second spring is greater than that of the first spring (i.e., when the first spring moves first). On the other hand, when the elastic force of the second spring is less than that of the first spring, the second spring moves and exposes the probe pin before it has been positioned, potentially causing buckling of the probe pin and reducing or damaging the inspection accuracy due to the probe pin not contacting the contact. Furthermore, alternately (or simultaneously) stroking multiple springs is technically difficult, and assembly or manufacturing tolerances can easily reduce inspection accuracy. Furthermore, using multiple springs increases the number of contact points, which can lead to problems such as a deterioration in electrical characteristics due to increased resistance. As described above, probes with multiple springs may not be able to ensure sufficient inspection accuracy due to various factors. In this regard, the probe 1 of this embodiment is configured with a single spring, which means that the stroke amount that can be used to correct misalignment between the probe 1 and the connector 100 is longer than that of the comparative probe (conventional probe), thereby improving the positioning accuracy between the probe 1 and the connector 100. Furthermore, with a single spring 7, variation due to assembly tolerances or manufacturing tolerances is suppressed, and the number of contact points between parts is reduced, resulting in a more stable resistance value.

In the probe 1, the housing 8 further has a guide portion 86 at one end 84 that positions the probe relative to the connector 100. The guide portion 86 improves positioning accuracy. For example, the guide portion 86 has a tapered tip (lower end) so that when the probe approaches the connector 100 in the Z-axis direction, the position of the connector 100 is adjusted along the slope of the tapered shape.

The probe 1 further includes a cap 9 attached to the other end 85 of the housing 8 in the extension direction, sandwiching the flange 6 between the cap 9 and the flange 43, and a pin P attached to one of the flange 6 and cap 9, extending toward the other of the flange 6 and cap 9, and configured to engage with and disengage from the other. When the housing 8 abuts the connector 100 at one end 84, the plunger 4 moves relative to the housing 8 in the extension direction in response to the flange 6 moving in a direction pressing the flange 43. The plunger 4 has a first movement range from a first state in which the pin P engages with the other member to a second state in which the pin P moves in conjunction with the movement of the flange 6 and disengages from the other member, and a second movement range in which the flange 6 moves further in the extension direction from the second state. With this configuration, the pin P engages with either the flange 6 or the cap 9, preventing the flange 6 from moving suddenly and restricting the movement of the plunger 4, which moves in response to the flange 6. As a result, within the first range of movement until the pin P disengages from either the flange 6 or the cap 9, the probe pin 3 is prevented from being exposed to the outside of the housing 8 due to sudden movement of the plunger 4, allowing for proper positioning relative to the connector 100. After positioning relative to the connector 100 within the first range of movement, the pin P disengages from either the flange 6 or the cap 9, allowing the flange 6 and probe pin 3 to move smoothly, allowing the probe 1 to quickly and properly contact the connector 100 after positioning.

In the above-described probe 1, in the first state, the engagement length L2, which is the length over which the pin P is engaged with the other member, is shorter than the distance L1 between the tip of the probe pin 3 and the tip surface 822 of the housing 8 that faces the connector 100. This configuration more reliably prevents the probe pin 3 from being exposed outside the housing 8 before the probe 1 and connector 100 are positioned.

In the probe 1, the flange 43 is made of at least one resin selected from the group consisting of polyacetal resin, polyamide resin, polyether ether ketone resin, and polytetrafluoroethylene resin. By making the flange 43 from a resin with low frictional resistance, the plunger 4 moves easily.

[Second embodiment]
6 is a cross-sectional view of a probe 1A according to the second embodiment, corresponding to FIG. 3. The following mainly describes the differences from the probe 1 according to the first embodiment. The probe 1A has a spring 7A instead of the spring 7 in the probe 1.

The spring 7A has different elastic forces at both ends in the extension direction. For example, the spring 7A has a first portion 71A, which is the upper end, and a second portion 72A, which is the lower end, and has a higher elastic force than the first portion 71A. The first portion 71A and the second portion 72A may have different shapes, resulting in different elastic forces. For example, the spring 7A may have at least one of the following characteristics: a smaller pitch, a smaller diameter, and a thinner winding thickness as it moves away from the flange 43. In one example, as shown in FIG. 6 , the diameter of the spring 7A decreases as it moves away from the flange 43. In other words, the diameter of the spring 7A decreases as it approaches the bottom surface 811 of the housing 8. The diameter of the spring 7A may gradually decrease, or may decrease from a predetermined position in the extension direction of the spring 7A (e.g., halfway along the extension direction).

When a pressing force is applied to the probe 1A, the first portion 71A elastically deforms faster than the second portion 72A. In other words, the first portion 71A contracts in the Z-axis direction faster than the second portion 72A. When the first portion 71A elastically deforms and the second portion 72A does not, the plunger 4 is in the first movement range. At this time, the first portion 71A adjusts the axial misalignment between the probe 1 and the connector 100 while contracted in the Z-axis direction. When further pressing force is then applied to the probe 1, the second portion 72A contracts in the Z-axis direction. At this time, the plunger 4 is in the second movement range, and the tip of the probe pin 3 is exposed to the outside. By elastically deforming the spring 7 in this order, the axial misalignment can be adjusted while protecting the tip of the probe pin 3.

With the probe 1A, the elastic force of the spring 7A increases as it contracts. This more reliably prevents the probe pin 3 from being exposed outside the housing 8 before the probe 1A and connector 100 are positioned.

[Modification]
Although the embodiments have been described above, the present disclosure is not necessarily limited to the above-described embodiments, and various modifications are possible without departing from the spirit of the present disclosure.

In the above embodiment, the substrate 5 is described as being housed in the tip portion 42, but the substrate 5 may also be housed in the main body portion 41. For example, the recess 4212 that houses the substrate 5 may be provided so that the lower portion 415 of the main body portion 41 is recessed.

1, 1A...probe, 2...conductive portion, 3...probe pin, 4...plunger, 5...substrate, 6...flange, 7, 7A...spring, 8...housing, 9...cap, 41...main body portion, 42...tip portion, 43...flange portion, 51...first main surface, 52...second main surface, 53...signal conductive portion, 54...ground conductive portion, 82...bottom portion, 84...end portion, 86...guide portion, 87...central portion, 82H...opening, 100...connector, 822...tip surface, P...pin.

Claims (6)

A probe used to inspect a connector having contacts,
a plunger having a columnar tip portion that holds, in an insulated state , a needle-shaped probe pin provided to correspond to the contact; a cylindrical main body portion that extends along the extension direction of the probe pin and that contains , in an insulated state , a conductive member that is electrically connected to the probe pin; and a flange portion fixed to the outer periphery of the main body portion;
a flange having a hole passing through the main body;
a housing formed in a cylindrical shape along the extension direction, the housing containing the main body portion at a center portion in the extension direction and containing the tip portion at one end portion in the extension direction;
a spring disposed between the housing and the flange, which urges the flange toward the flange and urges the housing away from the flange;
Equipped with
the flange is in contact with the flange along the outer periphery of the hole provided in the flange, and is disposed between the flange and the spring;
the tip portion holds the probe pin so that the tip of the probe pin is exposed from a tip surface of the tip portion through a through hole through which the probe pin is inserted,
the main body holds the conductive member such that a tip of the conductive member is exposed from a bottom surface of the main body through a through hole through which the conductive member is inserted,
probe. The probe of claim 1, wherein the housing further has a guide portion at the one end for positioning relative to the connector. a cap attached to the other end of the housing in the extension direction, the cap being provided to sandwich the flange between the flange and the cap;
a pin provided on one of the flange and the cap, extending toward the other of the flange and the cap, and configured to be able to engage with and release the engagement with the other;
Further provided with
The plunger
When the housing abuts against the connector at the one end, the flange moves toward the connector , and the flange moves relative to the housing toward the connector ;
The movement range includes a first movement range from a first state in which the pin is engaged with the other member to a second state in which the pin moves in accordance with the movement of the flange and the engagement of the pin with the other member is released, and a second movement range in which the flange moves further from the second state toward the connector .
The probe according to claim 1 or 2. A probe as described in claim 3, wherein in the first state, the engagement length, which is the length over which the pin is engaged with the other member, is shorter than the distance between the tip of the probe pin and the tip surface of the housing facing the connector. The probe described in any one of claims 1 to 4, wherein the spring satisfies at least one of the following: a pitch that decreases, a diameter that decreases, and a thickness of the winding that decreases in a direction away from the flange. The probe according to any one of claims 1 to 5, wherein the flange portion is formed of at least one resin selected from the group consisting of polyacetal resin, polyamide resin, polyether ether ketone resin, and polytetrafluoroethylene resin.