JPS5813486B2 - Kagobutsunogouseihouhou - Google Patents
KagobutsunogouseihouhouInfo
- Publication number
- JPS5813486B2 JPS5813486B2 JP12609873A JP12609873A JPS5813486B2 JP S5813486 B2 JPS5813486 B2 JP S5813486B2 JP 12609873 A JP12609873 A JP 12609873A JP 12609873 A JP12609873 A JP 12609873A JP S5813486 B2 JPS5813486 B2 JP S5813486B2
- Authority
- JP
- Japan
- Prior art keywords
- gallium
- solution
- ash4
- composition
- compound
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910052733 gallium Inorganic materials 0.000 claims description 30
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 26
- 125000001319 lambda(5)-arsanyl group Chemical group [H][As]([H])([H])([H])[*] 0.000 claims description 18
- 150000001875 compounds Chemical class 0.000 claims description 17
- 238000006243 chemical reaction Methods 0.000 claims description 13
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 6
- 229910052799 carbon Inorganic materials 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 6
- 230000002194 synthesizing effect Effects 0.000 claims description 6
- 239000013078 crystal Substances 0.000 description 17
- 239000007789 gas Substances 0.000 description 15
- 229910052698 phosphorus Inorganic materials 0.000 description 13
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 12
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 12
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 11
- 229910052785 arsenic Inorganic materials 0.000 description 11
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 11
- 239000011574 phosphorus Substances 0.000 description 11
- 229910005540 GaP Inorganic materials 0.000 description 6
- 238000000354 decomposition reaction Methods 0.000 description 6
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 description 6
- 239000010453 quartz Substances 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 238000010587 phase diagram Methods 0.000 description 3
- 238000011109 contamination Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- RBFQJDQYXXHULB-UHFFFAOYSA-N arsane Chemical compound [AsH3] RBFQJDQYXXHULB-UHFFFAOYSA-N 0.000 description 1
- 229910000070 arsenic hydride Inorganic materials 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Description
【発明の詳細な説明】
本発明は、すくなくとも2種類以上の■族元素を含む■
−■族化合物GaAsPの合成方法に関するものである
。DETAILED DESCRIPTION OF THE INVENTION The present invention provides
-This invention relates to a method for synthesizing a group compound GaAsP.
密閉反応容器内で、■族元素のすくなくとも1種類を差
圧弁を通じ、加熱された■族元素の収容された封管中に
導き、これとあらかじめ同封管中に封入された他種の■
族元素とを同時に■族元素に吸収させ均一組成からなる
多成分を含むI−V族化合物を合成することを特徴とす
る化合物の合成方法は、さきに本発明者等が特願昭48
−63631号発明特開昭50−10796号として開
発したところである。In a sealed reaction vessel, at least one type of group ■ element is introduced through a differential pressure valve into a sealed tube containing a heated group ■ element, and other types of group
A method for synthesizing a compound, which is characterized by synthesizing a group IV compound containing multiple components with a uniform composition by simultaneously absorbing a group element and a group element, was previously proposed by the present inventors in a patent application filed in 1972.
This invention was developed as JP-A No. 50-10796.
すなわちその方法は、例えばGaAsPを合成する際に
、差圧弁を用い、加熱されたGa表面に一定比率でAs
およびPを供給することにより、均一な組成を持つ化合
物を合成することを可能にするものであった。That is, when synthesizing GaAsP, for example, a differential pressure valve is used to infuse As onto the heated Ga surface at a fixed ratio.
By supplying P and P, it was possible to synthesize a compound having a uniform composition.
しかしながら密閉反応容器内で化合物が合成されるので
、密閉反応器から種々の不純物が、化合物中にとりこま
れてしまうため、化合物の純度を高めることが困難であ
った。However, since the compound is synthesized in a closed reaction vessel, various impurities are incorporated into the compound from the closed reaction vessel, making it difficult to increase the purity of the compound.
本発明は、開管法で、GaAsPを合成する際に、加熱
されたGa表面に一定比率でAsH4およびPH3を供
給することにより、均一な組成を持つ高純度の化合物を
合成することを可能にするものである。The present invention makes it possible to synthesize a highly pure compound with a uniform composition by supplying AsH4 and PH3 at a fixed ratio to the heated Ga surface when synthesizing GaAsP using an open tube method. It is something to do.
以下一実施例をもとに説明する。A description will be given below based on one embodiment.
第1図はこの発明方法を原理的に説明するための砒化ガ
リウムー燐化ガリウムーガリウム三元系状態図のガリウ
ム側の拡大図を示し、図中、実線は等温液相線、点線は
析出する結晶の燐化ガリウム等濃度線である。Figure 1 shows an enlarged view of the gallium side of the gallium arsenide-gallium phosphide-gallium ternary system phase diagram for explaining the principle of the method of this invention. In the figure, the solid line is the isothermal liquidus line, and the dotted line is the precipitation line. This is the gallium phosphide isodensity line of the crystal.
第2図はこの発明方法を、具体的に説明するための反応
装置の図並びにこの反応装置内の温度分布を示す図であ
る。FIG. 2 is a diagram showing a reaction apparatus and a temperature distribution within the reaction apparatus for specifically explaining the method of the present invention.
まず第2図の3で示すように縦型の高純度カーボンるつ
ぼにガリウムを入れて、高温でAsH3とPH3との混
合蒸気にさらす。First, as shown at 3 in FIG. 2, gallium is placed in a vertical high-purity carbon crucible and exposed to a mixed vapor of AsH3 and PH3 at high temperature.
この混合蒸気の蒸気圧を化合物の示す分解圧以上である
ようにする。The vapor pressure of this mixed vapor is set to be higher than the decomposition pressure of the compound.
この状態で、ガリウム溶液の表面に薄い化合物が出来、
それはガリウム溶液中に溶けこんでゆく。In this state, a thin compound is formed on the surface of the gallium solution,
It dissolves into the gallium solution.
溶液表面に対し底部を低い温度に保ち、第2図のような
温度勾配を与えておく。The bottom of the solution is kept at a lower temperature than the surface of the solution, creating a temperature gradient as shown in Figure 2.
溶けて拡散していった溶質は温度差のため、底部で最も
過飽和を起しやすく、最初に底部で結晶が析出し始める
。Due to the temperature difference, the solute that has melted and diffused is most likely to become supersaturated at the bottom, and crystals begin to precipitate at the bottom first.
結晶はこれ以後は自動的に成長し、最後にガリウム溶液
が無くなるまで成長は自動的に継続する。The crystal grows automatically from this point on, and growth continues automatically until the gallium solution is finally exhausted.
このことを第1図の三元系状態図によって設明する。This is established using the ternary system phase diagram shown in FIG.
ガリウム溶液は、その等温液相線から、同一温度で種々
の比率の砒素および燐を溶解させることができる。Due to its isothermal liquidus, gallium solution can dissolve various proportions of arsenic and phosphorus at the same temperature.
例えば砒素のみが溶けている溶液を、AsH4およびP
H3の混合ガス中におき、PH3の蒸気圧を高めてゆく
と、溶液の砒素および燐の組成は、液相線にしたがって
変化し、しだいに燐の濃度が増し、ある適当な混合比の
AsH4およびPH3の混合ガスの蒸気圧のもとではあ
る一定の組成となる。For example, a solution containing only arsenic dissolved in AsH4 and P
When placed in a mixed gas of H3 and increasing the vapor pressure of PH3, the composition of arsenic and phosphorus in the solution changes along the liquidus line, and the concentration of phosphorus gradually increases until AsH4 at a certain appropriate mixing ratio. Under the vapor pressure of the mixed gas of PH3 and PH3, it has a certain composition.
この混合ガスの蒸気圧が化合物の示す分解圧以上である
と、ガリウム溶液の表面に、第1図の点線で示される燐
化ガリウムの等濃度線上の一点で示されるところのある
組成を持った砒化燐化ガリウムの薄い化合物が出来、そ
れは溶液中に溶けこんでゆく。When the vapor pressure of this mixed gas is higher than the decomposition pressure of the compound, the surface of the gallium solution has a certain composition as indicated by a point on the isoconcentration line of gallium phosphide indicated by the dotted line in Figure 1. A thin compound of gallium arsenide phosphide forms, which dissolves into solution.
溶液表面に対し、底部の温度は低いから、砒素および燐
は溶液中を拡散して底部に至る。Since the temperature at the bottom is lower than that at the surface of the solution, arsenic and phosphorus diffuse through the solution and reach the bottom.
底部におけるガリウム溶液中の砒素および燐の組成比は
、結晶の成長速度と、砒素および燐のガリウム溶液中の
拡散係数によって決まるが、結晶成長速度が充分遅い時
には、溶液表面の組成比と同じになる。The composition ratio of arsenic and phosphorus in the gallium solution at the bottom is determined by the crystal growth rate and the diffusion coefficients of arsenic and phosphorus in the gallium solution, but when the crystal growth rate is slow enough, the composition ratio is the same as the composition ratio at the solution surface. Become.
したがって表面にできた薄い砒化燐化ガリウムと同じ組
成を持つ結晶が底部で最初に析出し始める。Therefore, crystals having the same composition as the thin gallium arsenide phosphide formed on the surface begin to precipitate at the bottom.
これ以後は、表面の砒化燐化ガリウムの組成が一定であ
るならば、すなわちAsH4およびPH3の混合ガスの
混合比が一定であるならば、一定の組成を持つ砒化燐化
ガリウム結晶が自動的に成長し、最後にガリウム溶液が
無くなるまで成長は自動的に継続する。From this point on, if the composition of the gallium arsenide phosphide on the surface is constant, that is, if the mixing ratio of the mixed gas of AsH4 and PH3 is constant, then the gallium arsenide phosphide crystal with a constant composition will automatically form. The growth continues automatically until the gallium solution is finally exhausted.
そして均一な組成の砒化燐化ガリウム結晶が得られるの
である。As a result, gallium arsenide phosphide crystals with a uniform composition can be obtained.
以下に数値をあげて具体的に説明する。A concrete explanation will be given below with numerical values.
ガリウム溶液の表面を1150℃,底部を1100℃と
する。The surface temperature of the gallium solution is 1150°C, and the bottom temperature is 1100°C.
1150℃における砒素および燐のガリウム溶液への溶
解量はそれぞれatom%で28係および7.4%であ
るので、例えば燐化ガリウムの組成が40係であるよう
な砒化燐化ガリウムの薄膜を溶液表面に生成させるよう
な組成の溶液、すなわち第1図のa点の組成の溶液を得
るためには、混合ガスの混合比をAsH4とPH3のモ
ル比で約3対2とすればよい。The amounts of arsenic and phosphorus dissolved in a gallium solution at 1150°C are 28% and 7.4% in atom%, respectively, so for example, a thin film of gallium arsenide phosphide whose composition is 40% is dissolved in a solution. In order to obtain a solution having such a composition as to be generated on the surface, that is, a solution having the composition at point a in FIG. 1, the mixing ratio of the mixed gases should be approximately 3:2 (mole ratio of AsH4 and PH3).
即ち、このAsH4とPH3のモル比は次のようにして
求められる。That is, the molar ratio of AsH4 and PH3 is determined as follows.
第1図から1150℃における砒素および燐のガリウム
溶液への溶解量はそれぞれatom%で28係および7
.4%である。From Figure 1, the amounts of arsenic and phosphorus dissolved in the gallium solution at 1150°C are 28 and 7 atom%, respectively.
.. It is 4%.
したがって例えば混合ガス中のAsH4とPH3のモル
比を1対1とすればガリウム溶液中の砒素および燐の濃
度比は28対7.4即ち3.8対1となる。Therefore, for example, if the molar ratio of AsH4 and PH3 in the mixed gas is 1:1, the concentration ratio of arsenic and phosphorus in the gallium solution will be 28:7.4, or 3.8:1.
第1図a点のガリウム溶液中の砒素および燐の濃度比は
図より16.2対2.8即ち5.7対1となる。From the figure, the concentration ratio of arsenic and phosphorus in the gallium solution at point a in FIG. 1 is 16.2:2.8, or 5.7:1.
この時の混合ガス中のAsH4とPH3のモル比をX対
Yとすれば
3.8X:Y=5.7:1
したがってX対Yは3対2となる。If the molar ratio of AsH4 and PH3 in the mixed gas at this time is X:Y, then it is 3.8X:Y=5.7:1. Therefore, X:Y is 3:2.
尚、第1図においてXGaPは砒化燐化ガリウム中の燐
化ガリウムのモル濃度を示している。In FIG. 1, XGaP indicates the molar concentration of gallium phosphide in gallium arsenide phosphide.
1150℃における燐化ガリウムの組成が40モル係の
砒化燐化ガリウム(GaAsO.6PO.4)の分解圧
は0.2気圧程度であるので、混合ガスの蒸気圧をこの
分解圧以上とすれば、ガリウム溶液の表面に薄い化合物
が生成する。The decomposition pressure of gallium arsenide phosphide (GaAsO.6PO.4) with a composition of 40 molar gallium phosphide at 1150°C is about 0.2 atm, so if the vapor pressure of the mixed gas is made equal to or higher than this decomposition pressure, , a thin compound forms on the surface of the gallium solution.
即ち、混合ガスの蒸気圧は特定組成、特定温度の砒化燐
化ガリウムの分解圧以上であればよく、AsH4および
PH3の供給速度は任意である。That is, the vapor pressure of the mixed gas need only be equal to or higher than the decomposition pressure of gallium arsenide phosphide having a specific composition and a specific temperature, and the supply rate of AsH4 and PH3 is arbitrary.
ただしAsH4およびPH3の供給速度が遅すぎると結
晶成長速度がそれより限定されて遅くなり、速すぎると
原料ガスがムダに消費されることになるのでガリウム溶
液表面の混合ガスの蒸気圧は各ガスの供給量即ち供給速
度で一義的に決まる。However, if the supply rate of AsH4 and PH3 is too slow, the crystal growth rate will be more limited and slow, and if it is too fast, the raw material gas will be wasted, so the vapor pressure of the mixed gas on the surface of the gallium solution will be lower than that of each gas. It is uniquely determined by the supply amount, that is, the supply speed.
これは溶液中に溶けこみ、温度勾配があるので、溶液の
底部すなわち第1図のb点に向って拡散してゆく。This dissolves into the solution, and because there is a temperature gradient, it diffuses toward the bottom of the solution, ie, point b in FIG. 1.
b点において砒素および燐は過飽和となるから、点線の
燐化ガリウムの等濃度線によって示されるところの燐化
ガリウムの組成40モルチの砒化燐化ガリウム結晶(G
aAsO.6P0.4)が折出する。Since arsenic and phosphorus become supersaturated at point b, a gallium arsenide phosphide crystal (G
aAsO. 6P0.4) is precipitated.
結晶はこれ以後自動的にb点からa点に向って成長する
。Thereafter, the crystal automatically grows from point b to point a.
そして燐化ガリウムの組成40モル係の均一な組成の砒
化燐化ガリウム結晶が得られる。Then, a gallium arsenide phosphide crystal having a uniform composition of 40 mol of gallium phosphide is obtained.
次にこの発明の実施例を第2図により説明する。Next, an embodiment of the present invention will be described with reference to FIG.
結晶成長装置は縦型で、AsH4およびPH3の混合ガ
スの混合比を制御する必要があるため、それぞれは独立
にAsH4供給管1、およびPH3供給管2から供給さ
れる。Since the crystal growth apparatus is of a vertical type and it is necessary to control the mixing ratio of the AsH4 and PH3 mixed gases, each of them is supplied independently from the AsH4 supply pipe 1 and the PH3 supply pipe 2.
金属ガリウム3は高純度カーボンるつぼ4に収容され、
この高純度カーボンるつぼ4は高周波コイル5によって
加熱され、図に示すような温度分布に保たれる。Metal gallium 3 is housed in a high purity carbon crucible 4,
This high purity carbon crucible 4 is heated by a high frequency coil 5 and maintained at a temperature distribution as shown in the figure.
6は石英反応管であるが、密閉反応容器を用いて化合物
を合成するときのように加熱されることはないから、本
発明においては石英反応管6からの汚染はきわめて少く
、その結果高純度の化合物が得られるのである。Although 6 is a quartz reaction tube, it is not heated unlike when a compound is synthesized using a closed reaction vessel, so in the present invention, contamination from the quartz reaction tube 6 is extremely small, resulting in high purity. The compound obtained is as follows.
高純度カーボンるつぼの径を22mmφとし、金属ガリ
ウムを50g用いる。The diameter of a high-purity carbon crucible is 22 mmφ, and 50 g of metal gallium is used.
金属ガリウム表面の温度を1150℃とし、底部の温度
を1100℃とする希ガスで希釈した10係の濃度のA
sH4およびPH3ガスをそれぞれ30mz/minお
よび20ml/minAsH4供給管およびPH3供給
管より供給する。A with a concentration of 10 diluted with a rare gas with a surface temperature of metallic gallium of 1150°C and a bottom temperature of 1100°C.
sH4 and PH3 gases are supplied at 30 mz/min and 20 ml/min from the AsH4 supply pipe and the PH3 supply pipe, respectively.
また石英反応管内には50ml/minの水素ガスを流
す。Further, hydrogen gas was flowed at a rate of 50 ml/min into the quartz reaction tube.
この状態で約5日間放置すれば、径22mmφ長さ約5
5mmの燐化ガリウムの組成40係の均一な組成を持つ
砒化燐化ガリウム結晶が得られる。If you leave it in this state for about 5 days, the diameter will be 22mmφ and the length will be about 5mm.
A 5 mm gallium arsenide phosphide crystal having a uniform composition of 40 parts is obtained.
AsH4およびPH3の供給する割合を変えれば他の任
意の組成の結晶を得ることができる。By changing the supply ratio of AsH4 and PH3, crystals of any other composition can be obtained.
成長温度を高くすると、成長速度も大きくなるが、余り
高くすると分解圧が大きくなるので、1000℃〜12
50℃の間で成長させた。Increasing the growth temperature will increase the growth rate, but if it is too high, the decomposition pressure will increase, so
It was grown between 50°C.
またガリウム溶液の温度勾配を大きくすれば、成長速度
も大きくなるが、60℃/cm以上では組成変化が大き
くなるようであり、5℃/cm以下では、成長速度が非
常に遅くなって実用的でない。In addition, if the temperature gradient of the gallium solution is increased, the growth rate will also increase, but at temperatures above 60°C/cm, the compositional change seems to become large, and below 5°C/cm, the growth rate becomes extremely slow, making it impractical. Not.
またAsH4およびPH3の供給量は結晶成長速度をあ
る程度大きくする必要があるので、それぞれ5ml/m
inおよび3ml/min以上とした。In addition, since it is necessary to increase the crystal growth rate to some extent, the supply amount of AsH4 and PH3 is 5 ml/m each.
in and 3 ml/min or more.
また過剰な供給は無駄に排気されるだけなので100m
l/min以下とした。Also, excess supply will only be exhausted, so 100 m
l/min or less.
以上述べたように、本発明によれば石英反応管からの汚
染が防止されるとともに、AsU,およびPH3の供給
比を変えるだけで任意の組成の高純度の化合物を合成す
ることができる。As described above, according to the present invention, contamination from a quartz reaction tube is prevented, and a highly pure compound of any composition can be synthesized by simply changing the supply ratio of AsU and PH3.
第1図はこの発明の原理を説明するための砒化ガリウム
ー燐化ガリウムーガリウム三元系状態図のガリウム側の
拡大図であって、等温液相線および析出する結晶の燐化
ガリウムの等濃度線を示す図。
第2図はこの発明の実施側を説明するための図である。
1はAsH4供給管、2はPH3供給管、3はガリウム
、4は高温度カーボンるつぼ、5は加熱用高周波コイル
、6は石英反応管であ1る。FIG. 1 is an enlarged view of the gallium side of the gallium arsenide-gallium phosphide-gallium ternary system phase diagram for explaining the principle of the present invention, showing the isothermal liquidus line and the equal concentration of gallium phosphide in the precipitated crystals. Diagram showing lines. FIG. 2 is a diagram for explaining the implementation side of this invention. 1 is an AsH4 supply pipe, 2 is a PH3 supply pipe, 3 is gallium, 4 is a high temperature carbon crucible, 5 is a high frequency coil for heating, and 6 is a quartz reaction tube.
Claims (1)
おいて、反応装置として、ガリウムを収容するカーボン
るつぼとAsH4を供給するAsH4供給管とPH3を
供給するPH3供給管とからなり、上記ガリウムの温度
を1000℃〜1250℃とし、かつるつぼ中の温度勾
配を5℃/cm〜60℃/cmとし、上記ガリウムに5
ml/min〜100ml/minの供給速度でAsH
4を、および3ml/min〜100ml/minの供
給速度でPH3を供給することを特徴とする化合物の合
成方法。1. A method for synthesizing a compound in a vertical open-tube reaction vessel, in which the reaction apparatus consists of a carbon crucible containing gallium, an AsH4 supply pipe for supplying AsH4, and a PH3 supply pipe for supplying PH3, The temperature of
AsH at a feed rate of ml/min to 100 ml/min
4 and PH3 at a supply rate of 3 ml/min to 100 ml/min.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12609873A JPS5813486B2 (en) | 1973-11-09 | 1973-11-09 | Kagobutsunogouseihouhou |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12609873A JPS5813486B2 (en) | 1973-11-09 | 1973-11-09 | Kagobutsunogouseihouhou |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5075595A JPS5075595A (en) | 1975-06-20 |
| JPS5813486B2 true JPS5813486B2 (en) | 1983-03-14 |
Family
ID=14926548
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12609873A Expired JPS5813486B2 (en) | 1973-11-09 | 1973-11-09 | Kagobutsunogouseihouhou |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5813486B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6273969B1 (en) | 1998-01-07 | 2001-08-14 | Rensselaer Polytechnic Institute | Alloys and methods for their preparation |
-
1973
- 1973-11-09 JP JP12609873A patent/JPS5813486B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5075595A (en) | 1975-06-20 |
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