JPS581864B2 - Dedicated line connection test equipment - Google Patents
Dedicated line connection test equipmentInfo
- Publication number
- JPS581864B2 JPS581864B2 JP10419977A JP10419977A JPS581864B2 JP S581864 B2 JPS581864 B2 JP S581864B2 JP 10419977 A JP10419977 A JP 10419977A JP 10419977 A JP10419977 A JP 10419977A JP S581864 B2 JPS581864 B2 JP S581864B2
- Authority
- JP
- Japan
- Prior art keywords
- line
- circuit
- operating
- key
- telephone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M3/00—Automatic or semi-automatic exchanges
- H04M3/22—Arrangements for supervision, monitoring or testing
Landscapes
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Monitoring And Testing Of Exchanges (AREA)
Description
【発明の詳細な説明】
本発明は本配線盤(以下MDFと略称する)、避雷器弾
器(以下ARRと略称する)等に収容されている電電公
社各種規格の専用回線について、電鍵の操作のみで簡単
に出合い、および各種試験(容量、絶縁抵抗、導体抵抗
、接地抵抗、呼出、通話試験等)ができる装置に関する
ものである。DETAILED DESCRIPTION OF THE INVENTION The present invention provides for dedicated lines that comply with the various standards of the Telegraph and Telephone Public Corporation, which are housed in distribution frames (hereinafter referred to as MDF), lightning arresters (hereinafter referred to as ARR), etc., to be operated only with a telephone key. This relates to a device that can be easily encountered and performs various tests (capacitance, insulation resistance, conductor resistance, ground resistance, ringing, communication tests, etc.).
従来、電話局市内試験部門における専用回線の試験は、
次のように行なわれているが、それぞれ欠点がある。Traditionally, dedicated line testing at the local telephone office testing department was carried out by
The following methods are used, but each has its drawbacks.
(1)PD(耐圧30V1W)挿入の回線に対しては、
自動局線路試験架(以下LTFと略称する)の信号電圧
(A.C75V)の送出や、回線試験電圧(DC48V
)の印加をさけ、通称テスター等の低い電圧によるもの
で、絶縁試験や導体抵抗試験等を実施している。(1) For lines with PD (withstand voltage 30V1W) inserted,
Transmission of signal voltage (A.C75V) of automatic station line test frame (hereinafter abbreviated as LTF) and line test voltage (DC48V)
), insulation tests, conductor resistance tests, etc. are performed using a low voltage tester, commonly known as a tester.
(2)LTFは加入電話の試験を主体として開発された
ため4W回線に対する出合い等の機能がなく、そのため
4W回線に対応するにはLTFを2座席使用するか、別
途備え付けの特聴アンプを2台使用するか、特聴アンプ
と受話器等を併用するか等その都度準備し、対応してい
る。(2) LTF was developed mainly for testing subscriber telephones, so it does not have functions such as detection for 4W lines. Therefore, to support 4W lines, you must use two LTF seats or install two separately installed special listening amplifiers. We make preparations and respond to each situation, such as whether to use a special listening amplifier or a telephone receiver.
(3)専用回線の端末設備は加入者宅内に設置されるた
め、上位端末と下位端末の双方に対し出合いや試験を必
要とするため、その都度MDFまたはARRにおいてプ
ラグの挿入替えを必要とする。(3) Since the terminal equipment for the leased line is installed in the subscriber's premises, it is necessary to meet and test both the upper and lower terminals, so it is necessary to insert and replace the plug in the MDF or ARR each time. .
またLTFによる試験が可能な回線でもプラグ挿入等や
差替えのためLTFとMDF間の往復に要する時間が加
わる。Furthermore, even on lines that can be tested using LTF, the time required for round trip between LTF and MDF is added due to plug insertion and replacement.
(4)専用回線の試験担当局所は複数以上介在するのが
大半であり、障害や開通等の出合いや試験時には回線監
視のため聴話等を要するためMDF等に要員の所謂貼り
付けが必要である。(4) In most cases, there are multiple locations in charge of testing dedicated lines, and when encountering failures, openings, etc., and during tests, listening is required to monitor the line, so it is necessary for personnel to paste the information on MDF, etc. .
本発明は上記のような従来技術の欠点を解決し、1回の
プラグ挿入により各種規格の専用回線についても、また
上位端末下位端末いずれの方向にも電鍵の操作のみで出
合いができるとともに、各種試験や聴話、割込み等に簡
単に対応でき、専用回線に対する出合いや試験等の簡便
化、能率化をはかった専用回線出合試験装置を提供する
ものである。The present invention solves the above-mentioned drawbacks of the prior art, and with a single plug insertion, it is possible to connect to dedicated lines of various standards and to both upper and lower terminals by simply operating a telephone key. The purpose of the present invention is to provide a dedicated line detection test device that can easily handle testing, listening, interruptions, etc., and that simplifies and streamlines the testing and testing of dedicated lines.
以下図面を用いて詳細に説明する。This will be explained in detail below using the drawings.
第1図主装置と外部電源及びMDF,又はARRへの接
続関係を示す。Figure 1 shows the connection relationship between the main device, external power supply, MDF, or ARR.
(イ)外部からの電源としては公社D2規格による端末
が電話機の専用回線の呼出信号用電源(AC75V)及
び通話用等の電源(DC48V)を接続するためのプラ
グから供給される。(b) External power is supplied from a plug for connecting the telephone's private line calling signal power (AC 75V) and call power (DC 48V) to the terminal according to the public corporation D2 standard.
(ロ)MDF又はARRプラグはL1、L2の上位端末
方面、下位端末方而対応の4心線のものを2個設備し、
SL(又は2W回線)用として1個、4W回線対応のR
L用として1個を使用した。(b) Install two 4-core MDF or ARR plugs for L1 and L2 upper terminals and lower terminals,
One for SL (or 2W line), R for 4W line
One piece was used for L.
(ハ)主装置には関係図面に記載したすべてを内蔵させ
たものである。(c) The main device incorporates everything described in the related drawings.
第2図はMDF又はARRプラグと256(または25
4)試験弾器又はARR弾器との接続図で、プラグの挿
入により、
(イ)上位端末方面に対しては試験装置への回路又は通
話回路が接続される。Figure 2 shows MDF or ARR plug and 256 (or 25
4) In the connection diagram with the test ammunition or ARR ammunition, by inserting the plug, (a) For the upper terminal direction, the circuit to the test device or the communication circuit is connected.
(ロ)下位端末方面は、スピーカーによる聴話回路が接
続される。(b) A listening circuit using a speaker is connected to the lower terminal.
(ハ)a1〜a4接点はプラグ挿入時通話中等に対し、
回線への影響を防止するため挿入したものである。(c) Contacts a1 to a4 are for calls etc. when the plug is inserted.
This was inserted to prevent any impact on the line.
第3図a,b,cは主装置の回路を示しており、対応す
る端子が相互に接続される。Figures 3a, b, and c show the circuits of the main device, and the corresponding terminals are interconnected.
(1)プラグを弾器に挿入することにより若し通話中の
場合には影響を与えることなく、スピーカーによる聴話
等が可能である。(1) By inserting the plug into the ammunition, it is possible to listen to a conversation through the speaker without affecting a call in progress.
(2)2W回線への出合い等の場合、No.1プラグを
該当試験弾器等に挿入する。(2) In the case of encountering a 2W line, etc., No. 1 plug into the applicable test ammunition, etc.
(イ)上位端末への出合等
A)OUT電鍵の操作によりA及びB継電器が動作し、
a1、a2、a3、a4接点により上位、下位それぞれ
の端末方面が分離され、上位端末方面はb1、b2、b
3、b4の動作接点及び電鍵ならびにd1、d2の平常
接点を経て1号回路計(テスター)の回路へ接続される
。(B) Encounter with the host terminal, etc.A) Relays A and B operate by operating the OUT key,
The upper and lower terminals are separated by the a1, a2, a3, and a4 contacts, and the upper and lower terminals are separated by b1, b2, and b.
It is connected to the circuit of No. 1 circuit tester through the operating contacts and electric key 3 and b4 and the normal contacts d1 and d2.
また下位端末方面はc1、c2、c3、c4の平常接点
によりスピーカー回路に接続となり、聴話及び監視が可
能となる。Further, the lower terminals are connected to the speaker circuit through normal contacts c1, c2, c3, and c4, allowing listening and monitoring.
B)上位端末方面はMET電鍵の操作により、回線の容
量、絶縁ならびに導体抵抗試験及びアース試験等が可能
である。B) For upper terminals, line capacity, insulation, conductor resistance tests, grounding tests, etc. can be performed by operating the MET key.
また上位端末や上位試験局等の要請による回線の断、短
絡、接地等がそれぞれの電鍵L1E,
L2E,SSHORTの操作により対応することができ
る。In addition, line disconnections, short circuits, grounding, etc. requested by higher-level terminals, higher-level test stations, etc. can be handled by operating the respective electric keys L1E, L2E, and SSHORT.
C)SPK電鍵の操作によりD継電器が動作し、d1、
d2の動作接点、g1、g2、g3、g4、g5、g6
、g7、g8の平常接点を経て送受話器T,Rの回路に
接続され通話が可能となる。C) D relay operates by operating the SPK key, and d1,
Operating contacts of d2, g1, g2, g3, g4, g5, g6
, g7, and g8, and are connected to the circuits of the handsets T and R, allowing a telephone conversation.
D)専用回線がD2規格における端末が自動式電話機の
場合、BATT電鍵の操作により、端末電話機との通話
が可能である。D) If the terminal is an automatic telephone whose dedicated line is based on the D2 standard, it is possible to talk to the terminal telephone by operating the BATT telephone key.
またこの場合における端末電話機に対する呼出信号は、
RING電鍵の操作による。In this case, the ringing signal to the terminal telephone is
By operating the RING key.
E)接続されている回線についてL1、L2の転極を要
する場合はREV(2W)電鍵を操作する。E) If polarity reversal of L1 and L2 is required for the connected line, operate the REV (2W) telephone key.
(ロ)下位端末への出合等
A)IN電鍵の操作によりA及びC継電器が動作し、a
1、a2、a3、a4及びc1、c2、c3、c44の
動作接点により下位端末方面が試験機方面の回路に接続
される。(b) Encounter with lower terminal, etc. A) Relays A and C operate by operating the IN key, a
1, a2, a3, a4 and c1, c2, c3, c44, the lower terminal side is connected to the test machine side circuit.
この場合上位端末方面はb1,b2,b3,b4の平常
接点によりスピーカー回路に接続となり聴話等が可能さ
なる。In this case, the upper terminal is connected to the speaker circuit through the normal contacts b1, b2, b3, and b4, making it possible to listen and talk.
B)試験又は通話等は前記(イ)項と同様である。B) Tests, telephone calls, etc. are the same as in (a) above.
(3)4W回線への出合等の場合はNo.1プラグをS
L,No.2プラグをRL対応の試験弾器等に挿入する
。(3) In the case of encountering a 4W line, etc., No. 1 plug S
L, No. 2. Insert the plug into the RL compatible test ammunition.
(イ)上位端末方面への出合いか又は下位端末方面への
出合いかによりOUT又はIN電鍵を操作する。(b) Operate the OUT or IN key depending on whether the encounter is towards the upper terminal or towards the lower terminal.
この操作による継電器の動作は2W回線と同様である。The operation of the relay by this operation is similar to that of a 2W line.
(ロ)TR4W電鍵の操作によりG継電器が動作し、g
1〜g8の動作接点により、No.1プラグ挿入回線に
送話回路がNo.2プラグ挿入回線に受話回路が、それ
ぞれ接続され、SPK電鍵の操作でd1、d2の動作接
点により通話が可能となる。(b) G relay operates by operating the TR4W key, and
No. 1 to g8 operating contacts allow No. 1. The transmitting circuit is the No. 1 plug insertion line. A receiving circuit is connected to each of the two plug insertion lines, and a call can be made by operating the SPK telephone key through the operating contacts d1 and d2.
(ハ)上位端末方面か、下位端末方面かにより、SL,
RLと反対となるので、その場合
REV(4W)電鍵の操作により対応ができる。(c) SL, depending on whether it is towards a higher terminal or a lower terminal.
Since it is the opposite of RL, in that case you can respond by operating the REV (4W) electric key.
(ニ)回線の試験については2W回線き同様であるが、
RL対応回線の試験の場合には(ハ)項と同様REV(
4W)電鍵を操作することにより可能である。(d) Line testing is the same as for 2W lines, but
In the case of testing an RL compatible line, the REV (
4W) This is possible by operating the electric key.
(4)割込みについて
OFF2W又はOFF4W電鍵の操作により、E(4W
の場合はE、及びF)継電器が動作し、その動作接点及
びb1、b2、b3、b4ならびにc1、c2、c3、
c4の平常接点により割込みができる。(4) About interrupts E (4W
In the case of E and F) the relay operates and its operating contacts b1, b2, b3, b4 and c1, c2, c3,
An interrupt can be made using the normal contact point of c4.
但し4W回線への割込みにはTR4W電鍵も合わせて操
作する。However, to interrupt the 4W line, the TR4W key must also be operated.
またこの場合スピーカー回路にも接続される。In this case, it is also connected to the speaker circuit.
(5)ランプ表示について
現在の操作内容について可視表示をする目的で主要と思
われる6点について、ランプが点火するように設備した
。(5) Regarding lamp displays In order to visually display the current operation contents, lamps were set up to light at six points considered to be important.
(6)その他
イ)聴話時等において、送話回路を断とすることを目的
としてTCO電鍵が用いられる。(6) Others a) A TCO telephone key is used for the purpose of cutting off the transmitting circuit when listening to a call.
ロ)スピーカー回路に挿入したトランス、IC等は市販
のものを使用したので説明は省略する。b) The transformer, IC, etc. inserted into the speaker circuit were commercially available ones, so their explanation will be omitted.
本発明装置は従来の出合いや試験方法に比し、次のよう
な利点がある。The device of the present invention has the following advantages over conventional testing and testing methods.
(1)1回のプラグ挿入のみですべて対応でき、他の試
験機器の準備や持運びが不要となり、またLTFとMD
F間の往復等の時間も不要となり、作業が大巾にスピー
ドアップされた。(1) All tests can be performed with just one plug insertion, eliminating the need to prepare or carry other test equipment, and
There is no need to spend time going back and forth between F and F, greatly speeding up the work.
(2)他の試験機器が他の用途に供されている場合の代
替品の準備等が不要となったほか、それぞれの配備機器
が本来の目的に常時活用されることができる。(2) In addition to eliminating the need to prepare substitutes when other test equipment is used for other purposes, each deployed equipment can be used for its original purpose at all times.
(3)専用回線は、その性格上迅速な試験が要求されて
おり、それらの要求にマツチした機能のものとなり能率
的である。(3) Dedicated lines are required to be tested quickly due to their nature, and are efficient because they have functions that meet these requirements.
(4)端末設備の機器やPD(回線保護装置)等に対す
る影響を与えることなく要求される試験等が可能となっ
た。(4) Required tests can now be performed without affecting terminal equipment or PDs (line protection devices).
第1図は主装置から外部への接続を示すブロック図、第
2図はMDF試験弾器又はARR弾器へのプラグ挿入の
状況を示す回路図、第3図a、b、cは本発明装置の実
施例を示す回路図である。Fig. 1 is a block diagram showing the connection from the main device to the outside, Fig. 2 is a circuit diagram showing the state of plug insertion into the MDF test munition or ARR munition, and Fig. 3 a, b, and c are the invention of the present invention. FIG. 2 is a circuit diagram showing an embodiment of the device.
Claims (1)
対のプラグと、回路計と、スピーカ回路と、前記2対の
プラグのうちの一方に接続される2W回線に対して電鍵
操作で上位局側に前記回路計を接続するとともに下位局
側に前記スピーカ回路を接続する接続手段と、前記2対
のプラグのうちの一方に接続される2W回線に対して電
鍵操作で送話回路を接続し他方の2W回線に対して受話
回路を接続する接続手段と、前記2対のプラグのうちの
一方に接続される2W回線に電鍵操作で送受話回路を接
続する接続手段とを備えて2W回線および4W回線に対
する必要な出合試験ができるように構成した専用回線出
合試験装置。1 2 connected to dedicated line storage ammunition with 2W line each
Connect the circuit meter to the upper station side by operating the electric key for the pair of plugs, the circuit meter, the speaker circuit, and the 2W line connected to one of the two pairs of plugs, and connect the circuit meter to the lower station side. A connecting means for connecting a speaker circuit, and a connecting means for connecting a transmitting circuit to a 2W line connected to one of the two pairs of plugs by operating a telephone key, and connecting a receiving circuit to the other 2W line. and a connecting means for connecting a transmitting/receiving circuit to the 2W line connected to one of the two pairs of plugs by operating a telephone key, and is configured to be able to carry out the necessary output tests for the 2W line and 4W line. Line output test equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10419977A JPS581864B2 (en) | 1977-09-01 | 1977-09-01 | Dedicated line connection test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10419977A JPS581864B2 (en) | 1977-09-01 | 1977-09-01 | Dedicated line connection test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5438712A JPS5438712A (en) | 1979-03-23 |
| JPS581864B2 true JPS581864B2 (en) | 1983-01-13 |
Family
ID=14374293
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10419977A Expired JPS581864B2 (en) | 1977-09-01 | 1977-09-01 | Dedicated line connection test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS581864B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63253105A (en) * | 1987-04-08 | 1988-10-20 | Hitachi Ltd | Combined power plant |
| JPH0392852U (en) * | 1990-01-05 | 1991-09-20 | ||
| JPH07143527A (en) * | 1993-11-19 | 1995-06-02 | Nec Corp | Spring jack for monitor |
-
1977
- 1977-09-01 JP JP10419977A patent/JPS581864B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5438712A (en) | 1979-03-23 |
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