JPS5819074B2 - How to test a capacitor - Google Patents
How to test a capacitorInfo
- Publication number
- JPS5819074B2 JPS5819074B2 JP51088327A JP8832776A JPS5819074B2 JP S5819074 B2 JPS5819074 B2 JP S5819074B2 JP 51088327 A JP51088327 A JP 51088327A JP 8832776 A JP8832776 A JP 8832776A JP S5819074 B2 JPS5819074 B2 JP S5819074B2
- Authority
- JP
- Japan
- Prior art keywords
- capacitor
- voltage
- measurement
- charging
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000003990 capacitor Substances 0.000 title claims description 31
- 238000012360 testing method Methods 0.000 title description 6
- 238000000034 method Methods 0.000 claims description 30
- 238000005259 measurement Methods 0.000 claims description 16
- 238000007689 inspection Methods 0.000 claims description 8
- 238000007599 discharging Methods 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 1
Landscapes
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Electric Double-Layer Capacitors Or The Like (AREA)
Description
【発明の詳細な説明】
本発明は電解コンデンサなどの有極性のコンデンサの検
査方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for testing polar capacitors such as electrolytic capacitors.
通常この種のコンデンサはベルトコンベヤ等で搬送しな
がら短絡の有無、リーケージ電流、Ctanδの測定の
順に検査を行なう。Normally, this type of capacitor is inspected in the order of measurement of short circuit, leakage current, and Ctan δ while being transported on a belt conveyor or the like.
そして夫々の検査工程の前にその検査に必要な電圧値ま
でコンデンサを充電する工程があるのが普通である。Before each inspection step, there is usually a step of charging the capacitor to the voltage value required for that inspection.
ところでリーケージ電流の測定においてはコンデンサに
高電圧を充電する必要があるが、次のCtanδ測定工
程では1.5V程の低い充電々圧で良いために、リーケ
ージ電流の測定をし終えたコンデンサをそのまま次工程
に送ることはできず、その充電された高電圧を放電する
工程が必要である。By the way, when measuring leakage current, it is necessary to charge the capacitor with a high voltage, but in the next Ctan δ measurement step, a charging voltage as low as 1.5 V is sufficient, so the capacitor after leakage current measurement can be used as is. It cannot be sent to the next process, and a process is required to discharge the charged high voltage.
このため工程数の増加が避けられないものとなっている
のであるが、この不利益に加えて、高電圧に充電されて
いるためにそれを放電するのに長時間を要するという作
業能率面での欠点ももっているものである。For this reason, an increase in the number of processes is unavoidable, but in addition to this disadvantage, there is a problem in terms of work efficiency because it takes a long time to discharge because it is charged to a high voltage. It also has some drawbacks.
即ち高電圧に充電されているコンデンサの端子間を短絡
すると短時間に放電することができるが、これではサー
ジ電流を発生してコンデンサを損壊することになるため
、高抵抗を接続して徐々に、即ち時間をかけて放電せね
ばならないのである。In other words, if you short the terminals of a capacitor charged to a high voltage, it can be discharged in a short time, but this will generate a surge current and damage the capacitor, so connect a high resistance and gradually discharge the capacitor. In other words, it is necessary to discharge the battery over time.
通常この放電に要する時間は10sec程である。Normally, the time required for this discharge is about 10 seconds.
しかもこの放電を完了した後に今度はCtanδの:測
定に必要な充電々圧に充電せねばならず、この充電時間
も加味するとり一ケージ電流を測定してからCtanδ
を測定するまでには相当長時間を要するものである。Moreover, after completing this discharge, it is necessary to charge the Ctan δ to the charging voltage required for measurement, and taking this charging time into consideration, one cage current must be measured and then Ctan δ
It takes a considerable amount of time to measure.
この点にあって本発明はり一ケージ電流測定に1要する
充電々圧よりも次工程の測定に要する充電電圧が低いと
いう点に着目し、リーケージ電流測定後の放電工程を改
良してその放電の過程で一挙に次工程の測定に要する充
電々圧を得るようにし、もって前記従来のコンデンサ検
査方法における欠)点及び不利益を解消しようとするも
のである。In this regard, the present invention focuses on the fact that the charging voltage required for the next measurement step is lower than the charging voltage required for measuring the leakage current, and improves the discharging process after measuring the leakage current. This method attempts to obtain the charging pressure required for the measurement in the next process all at once during the process, thereby solving the drawbacks and disadvantages of the conventional capacitor testing methods.
以下に本発明のコンデンサの検査方法を説明す礼
第1図はコンデンサの各種検査を示す工程図で、ベルト
コンベヤ等で搬送されつつあるコンデンサ1はまず第1
の充電工程1で所要の電圧まで充電されて短絡検査工程
2に送られ短絡の有無が検査される。The capacitor inspection method of the present invention will be explained below. Figure 1 is a process diagram showing various inspections of capacitors.
In the charging step 1, the battery is charged to a required voltage and sent to the short-circuit inspection step 2, where it is inspected for the presence or absence of a short circuit.
この検査結果で良品と判定されると第2の充電工程3に
て所要の電圧に再充電されてリーケージ電流測定工程4
に送られ、リーケージ電流のノ測定がなされる。If this test result determines that the product is good, it is recharged to the required voltage in the second charging process 3 and leakage current measurement process 4.
The leakage current is measured.
次に該測定工程4でも良品と判定されたコンデンサは放
電工程5に送られ、その充電々圧が放電されるのである
が、この工程5には後に述べるクランプ回路を用いてい
るので、完全に放電されずに次工程6での測定に必要の
充電;電圧例えば1.5■にクランプされる。Next, the capacitors determined to be good in the measuring step 4 are sent to the discharging step 5, where their charge voltage is discharged, but since a clamp circuit, which will be described later, is used in this step 5, the capacitors are completely The battery is not discharged and is clamped to a voltage of, for example, 1.5μ, which is necessary for charging in the next step 6.
そして該工程5で所要の充電々圧にクランプされたコン
デンサは次のCtaロδ測定工程に送られ、Cta口δ
の測定がなされて全検査工程を終了する。Then, the capacitor clamped to the required charging pressure in step 5 is sent to the next Ctaro δ measurement step, and the Cta port δ is
The entire inspection process is completed with the measurement of .
第2図は前記放電工程5に用いているクランプ回路を示
し、Cxはリーケージ電流測定を終えた被測定用コンデ
ンサで既述したように高電圧に充電されている。FIG. 2 shows the clamp circuit used in the discharge step 5, and Cx is the capacitor to be measured after leakage current measurement, and is charged to a high voltage as described above.
Rは放電抵抗で前記被測定コンデンサCxが接続される
と同時にこの放電抵抗Rを通じて放電を始める。R is a discharge resistor, and discharge starts through this discharge resistor R at the same time as the capacitor to be measured Cx is connected.
周知のようにこの放電の時定数はCxRである。As is well known, the time constant of this discharge is CxR.
Eは次工程6での測定用バイアス電源でこの電源Eとダ
イオードDとて被測定コンデンサCxを所要の電圧にク
ランプする働きを行なう。E is a bias power supply for measurement in the next step 6, and the power supply E and diode D serve to clamp the capacitor Cx to be measured to a required voltage.
即ち、リーケージ電流を測定し終えたコンデンサCxが
第2図に示すように接続されるとまず充電されている高
電圧を放電抵抗Rを通じて放電してゆくが、該コンデン
サCxの端子間電圧がバイアス電源Eの電圧と等しくな
るまで低下すると、ダイオードDを介してバイアス電源
Eによって充電されるため、それ以下の電圧に降下する
ことはなく、当該バイアス電圧にクランプされるのであ
る。That is, when the capacitor Cx whose leakage current has been measured is connected as shown in FIG. 2, the charged high voltage is first discharged through the discharge resistor R, but the voltage between the terminals of the capacitor Cx is biased. When the voltage drops to be equal to the voltage of the power source E, it is charged by the bias power source E via the diode D, so the voltage does not drop below that level and is clamped to the bias voltage.
本発明に係るコンデンサの検査方法は以上のようニ被測
定コンデンサのリーケージ電流測定後の放電工程におい
て、同コンデンサにダイオード、一定電圧のバイアス電
源との直列回路を順方向に接続することにより、被測定
コンデンサの端子電圧を次工程の測定に必要なバイアス
電源に等しい電圧にクランプするものであるから、放電
工程という単一の工程で済み工程数の低減が図れる吉共
に、従来のように完全に放電してから充電する如き方法
に比べて大幅に時間短絡ができ作業能率の向上が期待で
きるものである。As described above, in the capacitor inspection method according to the present invention, in the discharging process after measuring the leakage current of the capacitor to be measured, the capacitor is connected in the forward direction with a diode and a series circuit with a constant voltage bias power supply. Since the terminal voltage of the measurement capacitor is clamped to a voltage equal to the bias power supply required for the next measurement process, it only requires a single process, the discharge process, which reduces the number of processes and completely eliminates the need for conventional methods. Compared to the method of discharging and then charging, this method can significantly shorten the time and can be expected to improve work efficiency.
尚、C、tanδの測定には被測定コンデンサに交流電
圧が印加されるが、本発明方法の直流バイアス法を適用
しない場合にはCta口δの測定の際にリーケージ電流
が流れてtanδがみかけ上増えているようになり測定
精度が悪いものであり、高精度の測定を行なうためには
充分に充電してからでないと測定できないという欠点が
あったが、本発明の方法を適用すると、即ちそのCta
nδの測定工程の前の放電工程で、所要の充電々圧にク
ランプするようにすると、工程数は増加することなく前
述した欠点を解消し得るものである。Note that when measuring C, tan δ, an AC voltage is applied to the capacitor under test, but if the DC bias method of the method of the present invention is not applied, a leakage current will flow during the measurement of Cta port δ, and tan δ will appear. However, when the method of the present invention is applied, Its Cta
If the charging voltage is clamped at the required charging pressure in the discharging process before the nδ measurement process, the above-mentioned drawbacks can be overcome without increasing the number of processes.
第1図は本発明に係るコンデンサの検査方法の一実施例
を示すブ爾ツク図、第2図は本発明の方法の主要な動作
を行なう一例としての電気回路図である。FIG. 1 is a block diagram showing an embodiment of the capacitor testing method according to the present invention, and FIG. 2 is an electric circuit diagram showing an example of the main operations of the method of the present invention.
Claims (1)
の放電工程において、同コンデンサにダイオード、一定
電圧のバイアス電源との直列回路を順方向に接続するこ
とにより、被測定コンデンサの端子電圧を次工程の測定
に必要なバイアス電源に等しい電圧にクランプすること
を特徴とするコンデンサの検査方法。1. In the discharging process after measuring the cage current of a polar capacitor to be measured, by connecting a diode and a series circuit with a constant voltage bias power supply to the same capacitor in the forward direction, the terminal voltage of the capacitor to be measured can be adjusted to the next step. A capacitor inspection method characterized by clamping to a voltage equal to the bias power supply required for measurement.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP51088327A JPS5819074B2 (en) | 1976-07-23 | 1976-07-23 | How to test a capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP51088327A JPS5819074B2 (en) | 1976-07-23 | 1976-07-23 | How to test a capacitor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5313156A JPS5313156A (en) | 1978-02-06 |
| JPS5819074B2 true JPS5819074B2 (en) | 1983-04-15 |
Family
ID=13939786
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51088327A Expired JPS5819074B2 (en) | 1976-07-23 | 1976-07-23 | How to test a capacitor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5819074B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57138066U (en) * | 1981-02-23 | 1982-08-28 |
-
1976
- 1976-07-23 JP JP51088327A patent/JPS5819074B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5313156A (en) | 1978-02-06 |
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