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JPS5823891B2 - Flash method thermal constant measurement device - Google Patents
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JPS5823891B2 - Flash method thermal constant measurement device - Google Patents

Flash method thermal constant measurement device

Info

Publication number
JPS5823891B2
JPS5823891B2 JP13893478A JP13893478A JPS5823891B2 JP S5823891 B2 JPS5823891 B2 JP S5823891B2 JP 13893478 A JP13893478 A JP 13893478A JP 13893478 A JP13893478 A JP 13893478A JP S5823891 B2 JPS5823891 B2 JP S5823891B2
Authority
JP
Japan
Prior art keywords
sample
holding table
thermal constant
peripheral edge
flash method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13893478A
Other languages
Japanese (ja)
Other versions
JPS5565142A (en
Inventor
安積忠彦
桑原勝男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Original Assignee
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd filed Critical Rigaku Denki Co Ltd
Priority to JP13893478A priority Critical patent/JPS5823891B2/en
Publication of JPS5565142A publication Critical patent/JPS5565142A/en
Publication of JPS5823891B2 publication Critical patent/JPS5823891B2/en
Expired legal-status Critical Current

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  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Description

【発明の詳細な説明】 平板状に形成された試料の表面にレーザ光のような輻射
線を瞬間的に入射させると、表面の温度が時間と共に上
昇しである時間の後に一定の温度に達する。
[Detailed description of the invention] When radiation such as a laser beam is instantaneously incident on the surface of a sample formed into a flat plate, the temperature of the surface increases over time and reaches a certain temperature after a certain time. .

この場合、試料に吸収されたエネルギと試料裏面の温度
上昇、並びにこの温度が2分の1だけ上昇する時間を求
めることにより、該試料の熱三定数すなわち熱容量、熱
拡散率および熱伝導率を測定することができる。
In this case, by determining the energy absorbed by the sample, the temperature rise on the back side of the sample, and the time it takes for this temperature to rise by half, we can calculate the three thermal constants of the sample: heat capacity, thermal diffusivity, and thermal conductivity. can be measured.

このようなフラッシュ法熱定数測定装置において試料裏
面の温度変化を検出するために従来は熱電対接点を添着
していだが、熱の伝導損による誤差が大きいと共に接着
の工作が煩雑であり、かつ高温に加熱すると離脱し易い
等の欠点がある。
Conventionally, thermocouple contacts were attached to such flash method thermal constant measuring devices to detect temperature changes on the back side of the sample, but this resulted in large errors due to heat conduction loss, complicated bonding work, and It has drawbacks such as easy separation when heated.

従って最近は赤外線検出器を用いて非接触的に検出する
装置が注目されているが、試料を照射する輻射線の一部
が試料面等で散乱するから、その散乱線の一部が試料と
保持台との間隙を通って検出器に入射するために測定誤
差を生じ易い欠点がある。
Therefore, recently, non-contact detection devices using infrared detectors have been attracting attention, but since some of the radiation that irradiates the sample is scattered by the sample surface, some of the scattered radiation may not be connected to the sample. Since the light enters the detector through the gap with the holder, it has the drawback that measurement errors are likely to occur.

本発明はこのような欠点を除去しようとするものである
The present invention seeks to eliminate these drawbacks.

第1図は本発明実施例の縦断面図で、例えばア・ルミナ
のような断熱材をもって筒状の試料収容筒1を形成して
、この収容筒を電気炉2の中に挿入すると共に該収容筒
の下端に輻射線遮蔽筒3の上端を対向させである。
FIG. 1 is a longitudinal cross-sectional view of an embodiment of the present invention, in which a cylindrical sample storage cylinder 1 is formed with a heat insulating material such as Alumina, and this storage cylinder is inserted into an electric furnace 2. The upper end of the radiation shielding cylinder 3 is opposed to the lower end of the housing cylinder.

上記収容筒1はその下部の側面に試料挿入口4を設ける
と共に下端に内方へ;突出しだ環状のつば5を形成した
もので、中央に孔を有する円板状の試料保持台6および
これに取付けた試料7を前記挿入口4から挿入してつば
5の上に載置しである。
The storage cylinder 1 has a sample insertion opening 4 on the side surface of its lower part and an annular collar 5 that protrudes inward at the lower end, and a disk-shaped sample holding table 6 with a hole in the center. The sample 7 attached to the holder was inserted through the insertion opening 4 and placed on the collar 5.

保持台6はアルミナ等で形成したもので、第2図および
第3図にその縦断面5図、並びに平面図を示しだように
前記孔の周辺および外周部に石英のような耐熱性の熱絶
縁材料で形成した例えば3本あてのピン8および9を植
設しである。
The holding table 6 is made of alumina or the like, and as shown in FIG. 2 and FIG. For example, three pins 8 and 9 made of an insulating material are implanted.

このピン8の先端上に円板状の試料7を水平に載置し、
ピン9の先端で該試料の周側面1を押えである。
Place the disk-shaped sample 7 horizontally on the tip of this pin 8,
The tip of the pin 9 is used to hold down the circumferential surface 1 of the sample.

また保持板6の上に例えば0.5關程度の厚みを有する
白金板のような副射線遮蔽板をもって截頭円錐状に形成
した環状の輻射線遮蔽板10を載置してその先端すなわ
ち内周部を試料7の下面に微小の間隙を介して対向させ
である。
Further, an annular radiation shielding plate 10 formed in a truncated conical shape with a sub-ray shielding plate such as a platinum plate having a thickness of about 0.5 mm is placed on the holding plate 6, and the tip or inner portion of the annular radiation shielding plate 10 is placed on the holding plate 6. The circumferential portion was opposed to the lower surface of the sample 7 with a small gap therebetween.

ン更に保持台6の上には、同様の白金板で形成した円筒
状の輻射線遮蔽筒11を垂直に載置して、この遮蔽筒の
内部に前記試料7を配置しである。
Furthermore, a cylindrical radiation shielding tube 11 made of a similar platinum plate is placed vertically on the holding table 6, and the sample 7 is placed inside this shielding tube.

上述の装置において、炉2により試料γを所望の温度に
保持して矢印aのように上方から試料の1上面に例えば
レーザ光を瞬間的に照射し、該試料の下面から遮蔽筒3
を通って矢印すのように放射される熱線の変化を例えば
トロイダルミラー等を介してインジウム・アンチモンあ
るいは硫化鉛その他適宜の赤外線検出器で検出する。
In the above-mentioned apparatus, the sample γ is held at a desired temperature in the furnace 2, and a laser beam, for example, is instantaneously irradiated from above on the upper surface of the sample as shown by the arrow a, and the shielding tube 3 is emitted from the lower surface of the sample.
Changes in the heat rays emitted as shown by the arrows are detected by an indium antimony, lead sulfide, or other suitable infrared detector via a toroidal mirror or the like.

第4図はこのようにして検出された試料下面の温度Tと
時間tの関係である。
FIG. 4 shows the relationship between the temperature T of the lower surface of the sample detected in this way and the time t.

すなわち時刻toにおいてレーザ光を照射すると試料7
の下面の温度は例えば数百分の一部の後の時刻t1にお
いて最高の温度上昇ΔTを示す。
That is, when the laser beam is irradiated at time to, sample 7
The temperature on the lower surface of the casing shows the highest temperature rise ΔT at a time t1 after a few hundredths of a minute, for example.

この温度上昇ΔTと試料に吸収されたレーザ光のエネル
ギーとによって試料の熱容量が算出される。
The heat capacity of the sample is calculated from this temperature rise ΔT and the energy of the laser light absorbed by the sample.

またΔT/2の温度上昇を生ずる時間txと試料7の厚
みとによって、熱拡散率が、更に上述のようにして得ら
れた試料の熱容量および拡散率と試料の密度とによって
熱伝導率が算出される。
In addition, the thermal diffusivity is calculated from the time tx that causes a temperature rise of ΔT/2 and the thickness of the sample 7, and the thermal conductivity is calculated from the heat capacity and diffusivity of the sample obtained as described above and the density of the sample. be done.

上述の測定において、本発明の装置は前記実施例のよう
に試料7を熱遮蔽筒11の内部に配置すると共に環状の
熱遮蔽板10を設けてその内周部を試料の周縁に微小間
隙を介して対向させである。
In the above measurement, the apparatus of the present invention places the sample 7 inside the heat shield tube 11 as in the previous embodiment, and also provides an annular heat shield plate 10 whose inner periphery forms a minute gap around the periphery of the sample. They are facing each other through the middle.

従って試料7にレーザ光等を照射すると、該試料の表面
および保持台6の表面等でレーザ光の一部が散乱するが
、この散乱線は大部分が遮蔽筒11で吸収される。
Therefore, when the sample 7 is irradiated with a laser beam or the like, a portion of the laser beam is scattered on the surface of the sample, the surface of the holding table 6, etc., but most of this scattered radiation is absorbed by the shield cylinder 11.

また遮蔽筒11の表面で更に反射したレーザ光も遮蔽板
10によってほぼ完全に遮断されて赤外線検出器には殆
んど入射しない。
Furthermore, the laser light further reflected on the surface of the shielding cylinder 11 is almost completely blocked by the shielding plate 10, and hardly enters the infrared detector.

すなわち第4図におけるピークpがこの漏洩レーザ光に
よるものであるが、上述のような試料の表面等で散乱し
て検出器に入射するレーザ光が極めて少ないために上記
ピークpを充分小さくすることができて前述の時間tx
の測定に支障を生じないものである。
That is, the peak p in FIG. 4 is due to this leaked laser light, but since the amount of laser light that is scattered on the surface of the sample and enters the detector as described above is extremely small, the peak p must be made sufficiently small. The above mentioned time tx
This does not cause any problem in the measurement of .

すなわち遮蔽筒11および遮蔽板10を設けない場合は
散乱レーザ光が試料7と保持台60間隙を通過しである
いは更に試料収容筒1等で散乱して検出器に入射するた
めに、第4図に破線qで示したように極めて大きなピー
クを生じて時間txの測定に支障を生じたものである。
That is, if the shield tube 11 and the shield plate 10 are not provided, the scattered laser light passes through the gap between the sample 7 and the holding table 60, or is further scattered by the sample storage tube 1, etc., and enters the detector. As shown by the broken line q, an extremely large peak was generated, which caused trouble in measuring the time tx.

かつ遮蔽筒11はヒートシンクとしての作用をも有する
から、試料温度を安定に保持し得る効果がある。
Moreover, since the shielding cylinder 11 also functions as a heat sink, it has the effect of stably maintaining the sample temperature.

また遮蔽板10は試料7に接触していないから、熱の伝
導によって測定誤差を生ずるようなおそれがないもので
ある。
Furthermore, since the shielding plate 10 is not in contact with the sample 7, there is no risk of measurement errors due to conduction of heat.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明実施例の縦断面図、第2図は第1図にお
ける一部の拡大図、第3図は第2図の装置の平面図、第
4図は本発明の詳細な説明するだめの測定曲線の一例で
ある。 なお図において、1は試料収容筒、2は電気炉、3は遮
蔽筒、4は試料挿入口、5はつば、6は試料保持台、7
は試料、8.9はピン、10は輻射線遮蔽板、11は輻
射線遮蔽筒である。
Fig. 1 is a longitudinal sectional view of an embodiment of the present invention, Fig. 2 is an enlarged view of a part of Fig. 1, Fig. 3 is a plan view of the device shown in Fig. 2, and Fig. 4 is a detailed explanation of the present invention. This is an example of a measurement curve for sudame. In the figure, 1 is a sample storage cylinder, 2 is an electric furnace, 3 is a shielding cylinder, 4 is a sample insertion port, 5 is a collar, 6 is a sample holding stand, and 7
is a sample, 8.9 is a pin, 10 is a radiation shielding plate, and 11 is a radiation shielding tube.

Claims (1)

【特許請求の範囲】[Claims] 1 保持台に熱絶縁性のピンで取付けて所望の温度に保
持し一方の面に輻射線を瞬間的に照射して他方の面から
放射される熱線の変化を赤外線検出器で放出することに
より熱定数を測定される板状の試料を輻射線遮蔽筒の内
部に配置すると共に前記保持台と試料との間に一方の周
縁が該保持台に連結されて他方の周縁り天試料の周縁に
微小間隙を介して対向する環状の輻射線遮蔽板を設けた
ことを特徴とするフラッシュ法熱定数測定装置。
1 By attaching it to a holding table with a heat insulating pin and maintaining it at a desired temperature, one side is momentarily irradiated with radiation and the changes in the heat rays emitted from the other side are emitted by an infrared detector. A plate-shaped sample whose thermal constant is to be measured is placed inside a radiation shielding cylinder, and one peripheral edge is connected to the holding table between the holding table and the sample, and the other peripheral edge is connected to the upper peripheral edge of the sample. A flash method thermal constant measuring device characterized by having annular radiation shielding plates facing each other with a minute gap interposed therebetween.
JP13893478A 1978-11-13 1978-11-13 Flash method thermal constant measurement device Expired JPS5823891B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13893478A JPS5823891B2 (en) 1978-11-13 1978-11-13 Flash method thermal constant measurement device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13893478A JPS5823891B2 (en) 1978-11-13 1978-11-13 Flash method thermal constant measurement device

Publications (2)

Publication Number Publication Date
JPS5565142A JPS5565142A (en) 1980-05-16
JPS5823891B2 true JPS5823891B2 (en) 1983-05-18

Family

ID=15233551

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13893478A Expired JPS5823891B2 (en) 1978-11-13 1978-11-13 Flash method thermal constant measurement device

Country Status (1)

Country Link
JP (1) JPS5823891B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5950349A (en) * 1982-09-16 1984-03-23 Shinku Riko Kk Thermal constant measuring device
JPS5997457U (en) * 1982-12-20 1984-07-02 三洋電機株式会社 Battery current collector welding inspection equipment
EP0851221A1 (en) * 1996-12-23 1998-07-01 European Atomic Energy Community (Euratom) Measuring head for use in radiant energy flash measuring of the thermal diffusivity of heterogeneous samples
JP5894757B2 (en) * 2011-09-30 2016-03-30 アドバンス理工株式会社 Thermal constant measuring device

Also Published As

Publication number Publication date
JPS5565142A (en) 1980-05-16

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