JPS5850321B2 - Optical filter manufacturing equipment - Google Patents
Optical filter manufacturing equipmentInfo
- Publication number
- JPS5850321B2 JPS5850321B2 JP14675377A JP14675377A JPS5850321B2 JP S5850321 B2 JPS5850321 B2 JP S5850321B2 JP 14675377 A JP14675377 A JP 14675377A JP 14675377 A JP14675377 A JP 14675377A JP S5850321 B2 JPS5850321 B2 JP S5850321B2
- Authority
- JP
- Japan
- Prior art keywords
- vapor deposition
- optical filter
- substrate
- heating wire
- center
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 title claims description 26
- 238000004519 manufacturing process Methods 0.000 title claims description 14
- 238000007740 vapor deposition Methods 0.000 claims description 29
- 239000000758 substrate Substances 0.000 claims description 25
- 238000010438 heat treatment Methods 0.000 claims description 22
- 229910052751 metal Inorganic materials 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims description 9
- 238000002834 transmittance Methods 0.000 description 22
- 230000008020 evaporation Effects 0.000 description 16
- 238000001704 evaporation Methods 0.000 description 16
- 238000009826 distribution Methods 0.000 description 15
- 230000007423 decrease Effects 0.000 description 5
- 230000008021 deposition Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 238000004040 coloring Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 229910001026 inconel Inorganic materials 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Optical Elements Other Than Lenses (AREA)
- Formation Of Various Coating Films On Cathode Ray Tubes And Lamps (AREA)
Description
【発明の詳細な説明】
本発明は光学フィルタの製造装置に関し、特にカラー受
像管の発光スクリーンの形成時に用いられる露光量補正
用の光学フィルタの製造装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for manufacturing an optical filter, and more particularly to an apparatus for manufacturing an optical filter for exposure correction used when forming a luminescent screen for a color picture tube.
3つの偏向中心を管軸と直角な一直線上にもつインライ
ン形カラー受像管の発光スクリーンの形成においては、
露光用光源は上記−直線上の3点に順次に配設される。In forming the luminescent screen of an in-line color picture tube with three deflection centers on a straight line perpendicular to the tube axis,
The exposure light sources are sequentially arranged at three points on the above-mentioned straight line.
このため、フェースパネルの内面に付設された感光性膜
上の任意の一生領域に与えられる露光量は3光源のそれ
ぞれにより異なり、この不均一性は、結果的に上記小領
域に形成される3色蛍光体の占有面積比を異ならしめ、
スクリーン上に再生される画像に色むらを生じさせる。Therefore, the amount of exposure given to any given area on the photosensitive film attached to the inner surface of the face panel differs depending on each of the three light sources, and this non-uniformity results in the By varying the occupied area ratio of the color phosphors,
This causes uneven coloring in the image played on the screen.
このような欠点を除くために本出願人は、露光処理時に
おける光源とシャドウマスクとの間に、露光量の配分を
適切ならしめるための2種の光学フィルタを二者択一的
に、従来の光学フィルタに併せて配設することを既に提
案した。In order to eliminate such drawbacks, the present applicant has proposed to install two types of optical filters between the light source and the shadow mask during exposure processing, in order to properly distribute the exposure amount. We have already proposed that it be installed in conjunction with the optical filter.
本出願人が提案した光学フィルタはその等透過率分布が
第1図または第2図のようになっている。The optical filter proposed by the present applicant has an equal transmittance distribution as shown in FIG. 1 or 2.
第1図に示す等透過率分布を有する光学フィルタは、フ
ェースパネルを、その中心を中心0とするX軸およびy
軸を考えて、X軸に対称に、X軸の正方向に向って透過
率は順次低くなり、中心で高くなっている。The optical filter having the equal transmittance distribution shown in FIG.
Considering the axis, the transmittance gradually decreases in the positive direction of the X-axis symmetrically with respect to the X-axis, and increases at the center.
また、第2図に示す光学フィルタは、上記と同様に考え
て、点Oに対して対称で、中心で最も透過率が高く、周
辺にいくほど低くなっている。Further, the optical filter shown in FIG. 2 is considered in the same way as above, and is symmetrical with respect to point O, with the transmittance being highest at the center and decreasing toward the periphery.
第3図、第4図に上記2種の光学フィルタのX軸におけ
る光透過率分布を示す。FIGS. 3 and 4 show the light transmittance distributions of the above two types of optical filters along the X axis.
ところで、従来の光学フィルタは、その光透過率分布が
中央部において光透率が低く、周辺部に拡がるに従って
高くなっている。By the way, in the conventional optical filter, the light transmittance distribution is low in the central part and increases as it spreads to the peripheral part.
したがって、従来の光学フィルタを製造する装置は、そ
の構成が、蒸着基板の中央部にその周辺部より多くの蒸
着金属を蒸着するような構成となっているため、このよ
うな製造装置であっては、既述のような、中央部で最も
光透過率が高く、また周辺部に拡がるに従って均等に同
透過率の低下する新規な光学フィルタは得られない。Therefore, conventional equipment for manufacturing optical filters has a structure in which more metal is deposited in the center of the deposition substrate than in the periphery. However, it is not possible to obtain a novel optical filter in which the light transmittance is highest in the center and the transmittance decreases evenly as it spreads to the periphery, as described above.
そこで本出願人は、第5図に示すような構成の製造装置
を提案し、これによって、第2図、第4図に示す光透過
率分布を有する光学フィルタを達成した。Therefore, the present applicant proposed a manufacturing apparatus having the configuration shown in FIG. 5, and thereby achieved an optical filter having the light transmittance distribution shown in FIGS. 2 and 4.
この製造装置は、蒸着基板11と加熱線12との間に蒸
着マスク13を設置した装置であって、加熱線12は相
対向する2個の側辺部121とこれらを連結する連結部
122とを有するコ字状のものとし、加熱線12に溶接
する蒸着金属14は上記連結部122で密に、上記側辺
部121に進むにしたがって疎としたもので、また蒸着
マスク13は加熱線12で形成される形状の内部を覆う
ようにしたものである。This manufacturing apparatus is an apparatus in which a vapor deposition mask 13 is installed between a vapor deposition substrate 11 and a heating wire 12, and the heating wire 12 has two opposing side portions 121 and a connecting portion 122 that connects them. The vapor deposited metal 14 to be welded to the heating wire 12 is densely deposited at the connecting portion 122 and becomes sparse as it advances toward the side portion 121, and the vapor deposition mask 13 is welded to the heating wire 12. It is designed to cover the inside of the shape formed by.
そして、第2図、第4図に示す透過率分布を有する光学
フィルタを作成するには、まず所定の位置に加熱線12
および蒸着マスク13を設置して完全蒸着を行った後、
次に上記加熱線12および蒸着マスク13を1800回
転させて設置して再度完全蒸着するのである。To create an optical filter having the transmittance distribution shown in FIGS. 2 and 4, first place a heating wire 12 at a predetermined position.
After installing the vapor deposition mask 13 and performing complete vapor deposition,
Next, the heating wire 12 and vapor deposition mask 13 are rotated 1800 revolutions and set up to perform complete vapor deposition again.
しかしながら、このような製造装置であってもまだ以下
のような問題点が残されていた。However, even with such a manufacturing apparatus, the following problems still remain.
(1)1回目と2回目の蒸着で、真空度、蒸着金属14
の量、加熱線12の通電条件等を完全に一致させること
が必要であり、これらの調整が困難である。(1) During the first and second evaporation, the degree of vacuum, the evaporated metal 14
It is necessary to completely match the amount of heating wire 12, the energization conditions of the heating wire 12, etc., and it is difficult to adjust these.
(2)完全蒸着を行なうので1回目の蒸着が終わると、
蒸発源の取り替え、位置の設定、再度の真空引きを行な
わねばならず、手数がかかる。(2) Complete evaporation is performed, so once the first evaporation is completed,
The evaporation source must be replaced, its position set, and vacuum drawn again, which is time-consuming.
−したがって本発明は上記の問題点に鑑みてなされたも
ので、蒸着マスクの形状、および同マスクと加熱線の設
置位置を規定することにより、中央部で透過率が高く、
周辺部に拡がるにしたがって透過率が均等に低下する新
規な光学フィルタを煩わしい調整もなく簡単に製造する
ことのできる新規な光学フィルタの製造装置を提供する
ものである。- Therefore, the present invention was made in view of the above problems, and by specifying the shape of the vapor deposition mask and the installation position of the mask and heating wire, the transmittance is high in the central part.
An object of the present invention is to provide a novel optical filter manufacturing apparatus that can easily manufacture a novel optical filter whose transmittance decreases uniformly as it spreads toward the periphery without any troublesome adjustments.
以下本発明を図面を用いて実施例とともに述べる。The present invention will be described below along with examples using the drawings.
第6図は本発明の一実施例を示す構成斜視図である。FIG. 6 is a perspective view showing an embodiment of the present invention.
光学フィルタとなる透光性の蒸着基板21と蒸発源とな
る加熱線22との間には蒸着7スク23が設置されてお
り、蒸着マスク23−には所定の開口部24が形成され
ている。A vapor deposition mask 23 is installed between a transparent vapor deposition substrate 21 serving as an optical filter and a heating wire 22 serving as an evaporation source, and a predetermined opening 24 is formed in the vapor deposition mask 23-. .
同図において、蒸着基板21の中心0は加熱線22の中
心o3とは一直線上にはなく、中心o5は蒸着基板21
の端部に位置している。In the figure, the center 0 of the vapor deposition substrate 21 is not on a straight line with the center o3 of the heating wire 22, and the center o5 of the vapor deposition substrate 21 is not on a straight line.
located at the end of the
さらに、蒸着マスク23の開口部24は加熱線22の中
心o5上に位置している。Furthermore, the opening 24 of the vapor deposition mask 23 is located on the center o5 of the heating wire 22.
正確にいえば、加熱線22の中心o5と蒸着マスク23
の開口部24の中心omは光学フィルタの透過率が最も
低くなる部分、すなわち第2図に示す透過率分布を有す
る光学フィルタでは、外方に拡がるにしたがって透過率
が低くなるので、蒸着基板21の有効径の部分より外方
に位置している。To be precise, the center o5 of the heating wire 22 and the vapor deposition mask 23
The center om of the opening 24 is the part where the transmittance of the optical filter is lowest, that is, in the case of an optical filter having the transmittance distribution shown in FIG. 2, the transmittance decreases as it spreads outward. It is located outward from the effective diameter of the
また、直線状の加熱線22の設置方向は、蒸着基板21
のx −x ’軸方向に一致している。Moreover, the installation direction of the linear heating wire 22 is
It coincides with the x-x' axis direction.
さらにまた、蒸着基板21はz −z ’軸を中心に回
転している。Furthermore, the deposition substrate 21 is rotating around the z-z' axis.
次に、上記の構成で第2図に示す透過率分布が得られる
ことを説明する。Next, it will be explained that the transmittance distribution shown in FIG. 2 can be obtained with the above configuration.
第7図は第6図に示す装置のxz平面断面図である。FIG. 7 is an xz plane sectional view of the device shown in FIG. 6.
同図において、蒸発源の半影部の最大径25は蒸着基板
21の中心0付近に位置する様に、蒸着マスク23の開
口部24の大きさ、および加熱線22の長さ、および各
要素間の距離が定められている。In the figure, the size of the opening 24 of the evaporation mask 23, the length of the heating wire 22, and each element are adjusted so that the maximum diameter 25 of the penumbra of the evaporation source is located near the center 0 of the evaporation substrate 21. The distance between them is determined.
したがって、同図から明らかなように、蒸着基板21上
の蒸着膜厚は、os−0m線上の付近で最も厚くなり、
そこから中心に向うにしたがい次第に薄くなり、中心0
付近ではほとんど零になってしまい、同図に示す膜厚分
布となる。Therefore, as is clear from the figure, the thickness of the deposited film on the deposition substrate 21 is the thickest near the os-0m line,
From there, it gradually becomes thinner toward the center, and the center becomes 0.
It becomes almost zero in the vicinity, resulting in the film thickness distribution shown in the figure.
その結果、透過率は第1図。第3図に示す様な分布とな
る。As a result, the transmittance is shown in Figure 1. The distribution will be as shown in Figure 3.
しかしながら、実際は蒸着基板21が回転しているので
、第2図。However, since the deposition substrate 21 is actually rotating, FIG.
第4図に示す中央が最も透過率の高い同心円状の等透過
率分布を有する光学フィルタを得ることができる。An optical filter having a concentric uniform transmittance distribution with the highest transmittance at the center as shown in FIG. 4 can be obtained.
ところで、蒸着マスク23の開口部24は中心omに対
して対称である必要はなく、蒸着基板21の中心0に対
して外側方向は膜厚分布には重要な役目は果さないため
、第8図に示すように中心omに対して非対称であって
も良く、また斜線を施した部分のみであっても良い。By the way, the opening 24 of the evaporation mask 23 does not need to be symmetrical with respect to the center om, and the outward direction with respect to the center 0 of the evaporation substrate 21 does not play an important role in the film thickness distribution. As shown in the figure, it may be asymmetrical with respect to the center om, or it may be only the shaded portion.
さらに、蒸発源となる加熱線22は、その側面図を第9
図に示すものが用いられる。Furthermore, the heating wire 22 serving as an evaporation source is shown in a side view as shown in FIG.
The one shown in the figure is used.
すなわち、直径が0.3〜3mmgのタングステン線か
らなる加熱線22に、ニッケル、クロム、インコーネル
等の蒸着金属の細線(0,03〜0.3 m速度)25
を4關のピッチで巻回したものである。That is, a thin wire (0.03 to 0.3 m speed) 25 of vapor-deposited metal such as nickel, chromium, Inconel, etc. is attached to a heating wire 22 made of a tungsten wire with a diameter of 0.3 to 3 mm.
is wound with a pitch of 4.
この他に、同蒸着金属を所定間隔ごとに溶接することも
できる。In addition, the same vapor-deposited metal can also be welded at predetermined intervals.
26は加熱線22に電流を通ずるための電極、27は蒸
発源の長さを決めるスリット板である。26 is an electrode for passing a current through the heating wire 22, and 27 is a slit plate that determines the length of the evaporation source.
さらにまた、本実施例では蒸着基板21を回転させてお
り、その構成を第10図に示す。Furthermore, in this embodiment, the deposition substrate 21 is rotated, and its configuration is shown in FIG.
同図において、真空容器28の内部には蒸着基板21と
蒸着マスク23と加熱線22が設置されており、蒸着基
板21にはギア29によってモータ30から与えられる
回転が伝えられる。In the figure, a vapor deposition substrate 21, a vapor deposition mask 23, and a heating wire 22 are installed inside a vacuum container 28, and rotation given by a motor 30 is transmitted to the vapor deposition substrate 21 by a gear 29.
なお、透過率分布の調整は、蒸着マスク23の開口部2
4の大きさ、蒸着金属25の長さくスリット27の長さ
)、各要素間の間隔、あるいは水平方向の配置で行なう
ことができ、更に精度を高めようとすれは蒸着マスク2
7を複数個用いることもできるし、また1回の蒸着金属
の設置で数枚のフィルタが得られる。Note that the transmittance distribution can be adjusted using the opening 2 of the vapor deposition mask 23.
4, the length of the vapor deposition metal 25 and the length of the slit 27), the spacing between each element, or the horizontal arrangement.
A plurality of filters 7 can be used, and several filters can be obtained by installing the vapor-deposited metal once.
以上の説明からも明らかなように、本発明によれば、蒸
着基板が回転せしめられるとともに、蒸着マスクが前記
蒸着基板の中央部から一方の方向に伸びて覆うように構
成されているため、蒸着基板は中央部で全く蒸着されず
、また周辺に拡がるに従って均一に蒸着量が増えていき
、したがって透過率分布が中央部で最も高く周辺部では
同心円状に漸次低くなった光学フィルタが得られる。As is clear from the above description, according to the present invention, the evaporation substrate is rotated and the evaporation mask is configured to extend from the center of the evaporation substrate in one direction to cover the evaporation substrate. The substrate is not deposited at all in the center, and the amount of vapor deposited increases uniformly as it spreads to the periphery. Therefore, an optical filter is obtained in which the transmittance distribution is highest in the center and gradually decreases concentrically in the periphery.
しかも、その製造が1回の工程で行なえるため各機構の
調整は1回で簡単に済み、1枚の光学フィルタの製造に
要する時間が大幅に節約できる。Furthermore, since the manufacturing process can be carried out in one step, each mechanism can be easily adjusted only once, and the time required to manufacture one optical filter can be greatly reduced.
よって、本発明によれば、材料の節約とともに作業能率
の向上が図れる。Therefore, according to the present invention, it is possible to save materials and improve work efficiency.
第1図〜第4図は本出願人が既に提案した光学フィルタ
の光透過率分布特性図、第5図は本出願人が既に提案し
た光学フィルタの製造装置の構成斜視図、第6図、第7
図、第10図は本発明の光学フィルタの製造装置の一実
施例を示す概略構成図および同側面図、第8図、第9図
は同実施例の要部構成図である。
21・・・・・・蒸着基板、22・・・・・・加熱線、
23・・・・・・蒸着マスク、24・・・・・・開口部
、25・・・・・・蒸着金属、26・・・・・・電極、
27・・・・・・スリット板、28・・・・・・真空容
器、29・・・・・・ギア、30・・・・・・モータ。1 to 4 are light transmittance distribution characteristic diagrams of an optical filter already proposed by the applicant, FIG. 5 is a perspective view of the configuration of an optical filter manufacturing apparatus already proposed by the applicant, and FIG. 7th
10 are schematic configuration diagrams and side views showing one embodiment of the optical filter manufacturing apparatus of the present invention, and FIGS. 8 and 9 are configuration diagrams of essential parts of the same embodiment. 21... Vapor deposition substrate, 22... Heating wire,
23... Vapor deposition mask, 24... Opening, 25... Vapor deposited metal, 26... Electrode,
27... Slit plate, 28... Vacuum container, 29... Gear, 30... Motor.
Claims (1)
た光学フィルタの製造装置であって、前記蒸着基板には
同基板に垂直な軸を回転軸とする回転が与えられ、前記
蒸着マスクは前記蒸着基板を同基板の中央部から一方向
に覆うように設置せられ、前記加熱線には前記蒸着基板
に蒸着すべき蒸着金属が設けられてなることを特徴とす
る光学フィルタの製造装置。1. An optical filter manufacturing apparatus in which a vapor deposition mask is installed between a vapor deposition substrate and a heating wire, wherein the vapor deposition substrate is rotated about an axis perpendicular to the substrate, and the vapor deposition mask is rotated about an axis perpendicular to the substrate. is installed to cover the vapor deposition substrate in one direction from the center of the substrate, and the heating wire is provided with a vapor deposition metal to be vapor deposited on the vapor deposition substrate. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14675377A JPS5850321B2 (en) | 1977-12-06 | 1977-12-06 | Optical filter manufacturing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14675377A JPS5850321B2 (en) | 1977-12-06 | 1977-12-06 | Optical filter manufacturing equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5479051A JPS5479051A (en) | 1979-06-23 |
| JPS5850321B2 true JPS5850321B2 (en) | 1983-11-10 |
Family
ID=15414795
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14675377A Expired JPS5850321B2 (en) | 1977-12-06 | 1977-12-06 | Optical filter manufacturing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5850321B2 (en) |
-
1977
- 1977-12-06 JP JP14675377A patent/JPS5850321B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5479051A (en) | 1979-06-23 |
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