JPS5853864B2 - Local gas analysis method in metals - Google Patents
Local gas analysis method in metalsInfo
- Publication number
- JPS5853864B2 JPS5853864B2 JP53032028A JP3202878A JPS5853864B2 JP S5853864 B2 JPS5853864 B2 JP S5853864B2 JP 53032028 A JP53032028 A JP 53032028A JP 3202878 A JP3202878 A JP 3202878A JP S5853864 B2 JPS5853864 B2 JP S5853864B2
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- Japan
- Prior art keywords
- gas
- sample
- metal
- metals
- electron beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Investigating And Analyzing Materials By Characteristic Methods (AREA)
Description
【発明の詳細な説明】
本発明は金属中の局所ガス分析方法に関するものである
。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for local gas analysis in metals.
金属中に存在する水素は水素脆性など材料の性質に大き
な悪影響を及ぼす。Hydrogen present in metals has a significant negative effect on material properties such as hydrogen embrittlement.
したがって金属中での水素の挙動を知ることは破壊防止
上極めて重要であり、そのためには金属表面近傍だけで
なく金属内部での水素の分布すなわち局所水素存在量を
知ることが必要である。Therefore, knowing the behavior of hydrogen in metals is extremely important for preventing destruction, and for this purpose, it is necessary to know the distribution of hydrogen not only near the metal surface but also inside the metal, that is, the local amount of hydrogen present.
従来、金属中の局所元素分析に用いられているものにイ
オンマイクロアナライザがあるが、これには次のような
難点を有するものである。Ion microanalyzers have been conventionally used for local elemental analysis in metals, but they have the following drawbacks.
照射されるイオンビームが通常加速電圧数〜数10KV
、イオン電流数〜数101LAとパワーが小さく、また
水素についていえば検出に2次イオンとして生ずる水素
イオンを用いてbるため得られる信号量がバックグラウ
ンドに比して小さく測定精度が悪い。The irradiated ion beam usually has an accelerating voltage of several to several tens of kilovolts.
The power of the ion current is small, ranging from several 101 LA, and in the case of hydrogen, since hydrogen ions generated as secondary ions are used for detection, the amount of signal obtained is small compared to the background, resulting in poor measurement accuracy.
さらにパワーが小さいため試料のごく表面近傍の部分だ
けしか分析できない。Furthermore, because the power is low, only the area near the surface of the sample can be analyzed.
また近年レーザーを用いて鋼に再溶融により穴をあけそ
こに含1れる水素を質量分析計により定量するという方
法が提案されている。In recent years, a method has been proposed in which a laser is used to remelt a hole in the steel and the hydrogen contained therein is quantified using a mass spectrometer.
CV、 D、 Tarlinskii他、 Autom
atic Weld−ing 應6 、 ppl 6
〜18(1974) 、又はV、 I 、 Yav
oiski i、他シンポジウム報文。CV, D., Tarlinskii et al., Autom
atic Weld-ing 6, ppl 6
~18 (1974), or V, I, Yav
Oiski i, and other symposium reports.
Metallurgiya s (1970) )しか
し、この方法はきわめて短い時間のレーザパルスを用い
ているため溶融時間が短く溶融部に含1れる水素が完全
に抽出されない、またこの方法でも材料の表面にごく近
い部分(最大1間程度)しか分析できないなどの欠点を
有する。(Metalurgiyas (1970)) However, since this method uses extremely short laser pulses, the melting time is short and the hydrogen contained in the melted zone cannot be completely extracted. It has the disadvantage that it can only be analyzed for about 1 hour at most.
本発明者らはこのような現状に鑑み、種々検討を行なっ
た結果、高真空中にかいて照射ビームとして電子ビーム
を用いて金属試料の目的とする部分に照射することによ
り該部分を短時間のうちに溶融せしめ溶融金属中のガス
拡散速度が固体金属中のガス拡散速度に比してきわめて
速いとと卦よび沸騰によジ該溶融部分が激しく攪拌され
ることにより該溶融部分に含lれるガスを中性原子およ
び分子として真空容器中にすみやかに抽出することが可
能であること、抽出されるガス量が多いため非常に精度
良くガス分析計によりガスを定量することが可能である
こと、一方溶融部分周辺の温度上昇により抽出されるガ
スは溶融金属部と固体金属部とでのガス拡散速度の差を
利用して分別することが可能であること、照射エネルギ
ーの制御により任意の深さ1での分析が可能であること
を見出した。In view of the current situation, the present inventors conducted various studies and found that by irradiating a target part of a metal sample with an electron beam as an irradiation beam in a high vacuum, the part can be irradiated for a short time. The gas diffusion rate in the molten metal is extremely fast compared to the gas diffusion rate in the solid metal, and the molten metal is vigorously stirred by boiling, so that the molten metal is rapidly stirred. It is possible to quickly extract the gas that is extracted into a vacuum container as neutral atoms and molecules, and because the amount of gas extracted is large, it is possible to quantify the gas with a gas analyzer with very high accuracy. On the other hand, it is possible to separate the gas extracted due to the temperature rise around the molten part by utilizing the difference in gas diffusion rate between the molten metal part and the solid metal part, and that it is possible to separate the gas extracted from the molten metal part by using the difference in gas diffusion rate between the molten metal part and the solid metal part. We found that it is possible to perform analysis using
本発明はこれらの知見に基づいてなされたものであり、
金属内部の局所に存在するガスを分析する方法を提供す
るものである。The present invention was made based on these findings,
The present invention provides a method for analyzing gases locally present inside metals.
すなわち1本発明の要旨とするところは、高真空中に卦
いて細く絞った電子ビームを金属に照射して該照射部を
深さ17nrIL以上にわたって溶融攪拌せしめて該溶
融部に含1れるガスを中性原子)よび分子として抽出し
、ガス分析計により分析し、あらかじめ求めである電子
ビームの照射条件と溶融金属量からガス含有量を求める
ことを特徴とする金属中の局近ガス分析方法にあり、こ
のようにして金属内部の任意の深さ1での局所に存在す
るガスを照射エネルギーを変えることにより抽出し。That is, the gist of the present invention is to irradiate a metal with a narrowly focused electron beam in a high vacuum, melt and stir the irradiated part over a depth of 17 nm or more, and remove the gas contained in the molten part. A local gas analysis method in metals, which is characterized by extracting them as neutral atoms) and molecules, analyzing them with a gas analyzer, and determining the gas content from predetermined electron beam irradiation conditions and the amount of molten metal. In this way, the locally existing gas at any depth 1 inside the metal can be extracted by changing the irradiation energy.
バックグラウンドの影響を受けることなく、精度良く分
析することを可能としたものである。This enables highly accurate analysis without being influenced by background.
な釦本発明の対象となるガスとは水素、窒素卦よび酸素
を指す。Gases to which the present invention applies refer to hydrogen, nitrogen, and oxygen.
以下本発明を図面にもとづき詳細に説明する。The present invention will be explained in detail below based on the drawings.
第1図は金属中の局所ガス分析のための本発明を実施す
るための装置の一例である。FIG. 1 is an example of an apparatus for carrying out the invention for local gas analysis in metals.
金属試料1を真空容器2の側面に設けた試料出入用ドア
3より試料設置板4に設置した後、真空容器2内部を真
空ポンプ5により排気し、高真空(1〜5X10 ’
Torr )に達せしめる。After installing the metal sample 1 on the sample installation plate 4 through the sample entry/exit door 3 provided on the side of the vacuum container 2, the inside of the vacuum container 2 is evacuated by the vacuum pump 5, and the vacuum container 2 is evacuated to a high vacuum (1 to 5 x 10'
Torr).
この際真空容器内壁に吸着している水蒸気等のガスを脱
着させ迅速に高真空を得るため該容器を図示していない
ヒータなどを用い、2〜3時間程度加熱しながら排気す
るとよい。At this time, in order to desorb gas such as water vapor adsorbed on the inner wall of the vacuum container and quickly obtain a high vacuum, the container is preferably heated for about 2 to 3 hours while being evacuated using a heater (not shown).
加熱終了後の冷却中も排気を続は所定の真空度に達せし
める。Even during cooling after heating is complete, the exhaust continues to reach a predetermined degree of vacuum.
な卦加熱中の試料の温度上昇あるいは排気中の試料から
のガスの逸散が問題となるときは図示はしないが試料出
入用ドア3のかわりに真空容器2に予備排気室中よび気
密試料出入機構を設は真空容器が所定の圧力に達した後
予備排気した予備排気室中の試料を真空を破らずに気密
試料出入機構により試料を試料設置板に設置する構造と
してもよい。When the temperature rise of the sample during heating or the dissipation of gas from the sample during evacuation is a problem, the sample entrance/exit door 3 is replaced by the vacuum container 2, which is not shown in the figure, and the inside of the preliminary evacuation chamber and the airtight sample entrance/exit door 3 are used. The mechanism may be configured such that after the vacuum container reaches a predetermined pressure, the sample in the preliminary evacuation chamber is placed on the sample placement plate by an airtight sample loading/unloading mechanism without breaking the vacuum.
次に図示していないのぞき窓より試料を観察しながら試
料移動・・ンドル7.γを用いてXY方向に移動せしめ
目的とする分析位置を電子ビームの光軸と一致せしめる
。Next, move the sample while observing the sample through a peephole (not shown).7. It is moved in the X and Y directions using γ to align the target analysis position with the optical axis of the electron beam.
図示はしないが試料移動ハンドル7.7′のシャフト6
.6′が真空容器2を貫通する部分にかいては真空の破
れない構造としてかくことは勿論である。Although not shown, the shaft 6 of the sample transfer handle 7.7'
.. It goes without saying that the portion where 6' penetrates the vacuum container 2 is constructed so that the vacuum cannot be broken.
次に制御系8により制御された電子銃9より放出された
電子ビームを電磁レンズ系10により集束して金属試料
1に照射し該照射部を短時間のうちに溶融、攪拌せしめ
該溶融部に存在するガスを中性原子および分子として抽
出する。Next, an electron beam emitted from an electron gun 9 controlled by a control system 8 is focused by an electromagnetic lens system 10 and irradiated onto the metal sample 1, melting and stirring the irradiated part in a short time to cause the molten part to melt. Extract the gases present as neutral atoms and molecules.
その後抽出されたガスをガス分析計11により分析し記
録計12により記録する。Thereafter, the extracted gas is analyzed by a gas analyzer 11 and recorded by a recorder 12.
ガス分析計11としてはたとえば質量分析計などを用い
ることができる。As the gas analyzer 11, for example, a mass spectrometer or the like can be used.
またガスを抽出した後真空容器内にキャリアガスな導入
して真空容器内をパージし、ガスクロマトグラフなどに
より分析することも可能である。Furthermore, after the gas has been extracted, a carrier gas may be introduced into the vacuum container to purge the interior of the vacuum container, and analysis may be performed using a gas chromatograph or the like.
な)電子ビームの照射)よび分析に際しては必要に応じ
真空容器2と真空ポンプ5との間のバルブ13を開閉す
る。(b) Electron beam irradiation) and analysis, the valve 13 between the vacuum container 2 and the vacuum pump 5 is opened and closed as necessary.
ひとつの試料について2ケ所以上の分析位置で局所ガス
分析を行なう場合は試料移動ノ・ンドル7゜γを用いて
試料を移動せしめ繰返し分析を行なう。When local gas analysis is performed on one sample at two or more analysis positions, the sample is moved using the sample movement knob 7° γ and repeated analysis is performed.
本発明の方法は電子ビームを用いるものであるから1〜
IOK、W、程度の大きな出力のものが選べ、従って分
析試料の局所として面積10−2〜1 rtta、深さ
1〜30關ぐらいのところ1で溶融。Since the method of the present invention uses an electron beam, 1 to
A large output of IOK, W, can be selected, and therefore, the area of the analysis sample is 10-2 to 1 rtta, and the depth is 1 to 30 degrees.
攪拌を行なうことが出来1局所部分を切り出す必要がな
いので切削・加工・温度上昇等の影響をほとんど受けず
に分析を行なうことが可能であり且つ局所部分は300
0℃以上にも達する高温で溶解されるので含有されてい
る水素のみならず窒化物や酸化物の形で台筐れている窒
素卦よび酸素も同時に抽出することが可能であって、こ
れらを質量分析計などのガス分析計により分別定量する
ことが出来る。Since stirring can be performed and there is no need to cut out a local part, it is possible to conduct analysis with almost no influence from cutting, processing, temperature rise, etc., and the local part can be
Since it is melted at high temperatures reaching over 0°C, it is possible to simultaneously extract not only the hydrogen contained in it, but also nitrogen and oxygen, which are present in the form of nitrides and oxides. It can be separated and quantified using a gas analyzer such as a mass spectrometer.
本発明の方法では電子ビームの照射条件を一定にするこ
とにより溶融金属量を一定にすることが可能であるから
、前記の分析結果とあらかじめ求めである電子ビームの
照射条件と溶融金属量から溶融部のガス含有量を求める
ことができる。In the method of the present invention, it is possible to keep the amount of molten metal constant by keeping the electron beam irradiation conditions constant. It is possible to determine the gas content of .
また、分析の用途としては金属材料中の局所ガス量の測
定、試料面の幅、長さ方向のガス量の分布、深さ方向の
分布の測定に適用することが可能である。In addition, as an analytical application, it can be applied to measuring the local gas amount in a metal material, the width of the sample surface, the distribution of gas amount in the length direction, and the distribution in the depth direction.
以下本発明の効果を実施例によりさらに具体的に説明す
る。Hereinafter, the effects of the present invention will be explained in more detail with reference to Examples.
実施例 1
鋼種HT60鋼の低水素系被覆アーク溶接棒による溶接
部近傍に卦けるガスの分布を測定するため溶接部を含む
鋼片をioo間X100mmX4Q間に切断し、溶接方
向と垂直な切断面の目的とする分析位置(溶接金属部・
熱影響部・母材部の3位置)にマーキングした後、第1
図の装置ならびに前記の実施要領により真空容器2内の
試料設置板4に設置しガスを抽出・分析した。Example 1 In order to measure the gas distribution in the vicinity of the welded area using a low-hydrogen coated arc welding rod of steel type HT60 steel, a steel piece including the welded area was cut between Ioo x 100 mm x 4 Q, and the cut plane perpendicular to the welding direction was cut. Target analysis position (weld metal part/
After marking the 3 positions (heat affected zone and base metal part),
Using the apparatus shown in the figure and the procedure described above, it was installed on the sample installation plate 4 in the vacuum container 2, and the gas was extracted and analyzed.
用いた電子ビームの照射条件は加速電圧 60KV、ビーム電流50 m A 、照射時間1秒。The electron beam irradiation conditions used were acceleration voltage 60KV, beam current 50 mA, irradiation time 1 second.
ビーム径1rnrILであり、このとき照射部の溶融深
さは21關であった。The beam diameter was 1rnrIL, and the melting depth of the irradiated area was 21 degrees.
ガス分析計11としては質量分析計を用いた。A mass spectrometer was used as the gas analyzer 11.
真空容器の容積とビーム照射前後の真空容器内の圧力変
化卦よび質量分析計から得られる質量スペクトルの変化
からあらかじめ求めである検量線を用いて抽出されたガ
ス量を求めた。The amount of extracted gas was determined using a calibration curve determined in advance from the volume of the vacuum chamber, the pressure change in the vacuum chamber before and after beam irradiation, and the change in the mass spectrum obtained from the mass spectrometer.
さらに照射条件と溶融金属量との検量線を用いて換算し
た結果、各部分に卦ける局所ガス量は第1表のようであ
ることが明らかとなった。Further, as a result of conversion using a calibration curve between the irradiation conditions and the amount of molten metal, it became clear that the local gas amount in each part was as shown in Table 1.
第1表にみられる如く1本発明方法によれば溶接部近傍
での局所ガス含有量分よびその分布についての情報を得
ることができる。As shown in Table 1, according to the method of the present invention, information about the local gas content and its distribution in the vicinity of the weld can be obtained.
実施例 2
厚板の板厚方向のガスの分布を測定するため鋼片を10
0mm×100mmX 20mmに切断し、圧延面の適
当な分析位置(A、B2ケ所とする)にマーキングした
後、真空容器2内の試料設置板3に設置し、第1図の要
領により但し、電子ビームによる板厚方向への溶融深さ
をAとBとで変えて照射し、ガスを抽出分析した。Example 2 To measure the gas distribution in the thickness direction of a thick plate, 10 steel pieces were
After cutting into 0 mm x 100 mm x 20 mm and marking appropriate analysis positions (2 locations A and B) on the rolled surface, place it on the sample installation plate 3 in the vacuum container 2, and perform the electronic test according to the procedure shown in Figure 1. The beam was irradiated with different melting depths in the thickness direction between A and B, and the gas was extracted and analyzed.
用いた電子ビームの照射条件は第2表のと)りであった
。The irradiation conditions of the electron beam used were as shown in Table 2.
実施例1と同様にしてガスを抽出分析した結果は第3表
のようであり板厚方向の深さによりガス量が異なること
がわかった。The results of gas extraction and analysis in the same manner as in Example 1 are shown in Table 3, and it was found that the amount of gas varied depending on the depth in the thickness direction.
このように電子ビームの照射条件を制御することにより
試料の任意の深さ1での部分に含lれるガスを分析でき
る。By controlling the electron beam irradiation conditions in this manner, it is possible to analyze the gas contained in a portion of the sample at an arbitrary depth 1.
第1図は本発明方法を実施するための装置の一態様例を
示す図である。
1・・・金属試料、2・・・真空容器、3・・・試料出
入用ドア、4・・・試料設置板、5・・・真空ポンプ、
7 、7’・・・試料移動バンドル 8・・・制御系
、9山電子銃。
10・・・電磁レンズ系、11・・・ガス分析計、12
・・・記録計、13・・・バルブ。FIG. 1 is a diagram showing an example of an embodiment of an apparatus for carrying out the method of the present invention. DESCRIPTION OF SYMBOLS 1... Metal sample, 2... Vacuum container, 3... Sample entrance/exit door, 4... Sample installation plate, 5... Vacuum pump,
7, 7'... Sample movement bundle 8... Control system, 9-mount electron gun. 10... Electromagnetic lens system, 11... Gas analyzer, 12
...Recorder, 13...Valve.
Claims (1)
射して該照射部を深さ1間以上にわたって溶融攪拌せし
めて該溶融部に含1れるガスを中性原子)よび分子とし
て抽出しガス分析計により分析し、あらかじめ求めであ
る電子ビームの照射条件と溶融金属量からガス含有量を
求めることを特徴とする金属中の局所ガス分析方法。1. Irradiate the metal with a finely focused electron beam in a high vacuum, melt and stir the irradiated part over a depth of 1 inch or more, and extract the gas contained in the molten part as neutral atoms) and molecules. A local gas analysis method in a metal, which is characterized in that the gas content is determined using a predetermined electron beam irradiation condition and the amount of molten metal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP53032028A JPS5853864B2 (en) | 1978-03-20 | 1978-03-20 | Local gas analysis method in metals |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP53032028A JPS5853864B2 (en) | 1978-03-20 | 1978-03-20 | Local gas analysis method in metals |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS54124795A JPS54124795A (en) | 1979-09-27 |
| JPS5853864B2 true JPS5853864B2 (en) | 1983-12-01 |
Family
ID=12347400
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP53032028A Expired JPS5853864B2 (en) | 1978-03-20 | 1978-03-20 | Local gas analysis method in metals |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5853864B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01110234A (en) * | 1987-10-23 | 1989-04-26 | Showa Alum Corp | Analyzer for gas contained in metal material |
| JPH01110235A (en) * | 1987-10-23 | 1989-04-26 | Showa Alum Corp | Analyzer for gas contained in metal material |
-
1978
- 1978-03-20 JP JP53032028A patent/JPS5853864B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS54124795A (en) | 1979-09-27 |
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