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JPS5917364B2 - Optical roughness measurement method - Google Patents
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JPS5917364B2 - Optical roughness measurement method - Google Patents

Optical roughness measurement method

Info

Publication number
JPS5917364B2
JPS5917364B2 JP50022645A JP2264575A JPS5917364B2 JP S5917364 B2 JPS5917364 B2 JP S5917364B2 JP 50022645 A JP50022645 A JP 50022645A JP 2264575 A JP2264575 A JP 2264575A JP S5917364 B2 JPS5917364 B2 JP S5917364B2
Authority
JP
Japan
Prior art keywords
measured
roughness
group
light
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP50022645A
Other languages
Japanese (ja)
Other versions
JPS5197459A (en
Inventor
秀彦 竹山
博 関口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP50022645A priority Critical patent/JPS5917364B2/en
Publication of JPS5197459A publication Critical patent/JPS5197459A/ja
Publication of JPS5917364B2 publication Critical patent/JPS5917364B2/en
Expired legal-status Critical Current

Links

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  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】 本発明は、オプチカル・ファイバを用いた面のあらさの
光学式測定方法に関するものであり、さらに詳しくは面
の反射率による影響を除去したあらさの光学式測定方法
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical method for measuring the roughness of a surface using an optical fiber, and more particularly to an optical method for measuring the roughness in which the influence of the reflectance of the surface is removed. It is.

オプチカル・ファイバを通して被測定面に光をあてると
、被測定面のあらさに応じて反射光の光量が変化するた
め、その光量の測定により面のあらさを求めることがで
きるが、被測定面を形成する材料によつて反射率が相違
するため、この反射率の影響を除去しなければならない
。本発明は、簡単な手段によりその反射率の影響を補正
して面のあらさを測定できるようにした方法を提供しよ
うとするものであつて、入射用ファイバ群と受光用ファ
イバ群とからなるオプチカル・ファイバの端面を被測定
面に対向させ、このオプチカル・ファイバを被測定面に
垂直に配置した場合と傾斜させて配置した場合について
、入射用ファイバ群を通して被測定面に投射した光の反
射光を受光用ファイバ群を通して光電素子より受光し、
それぞれの場合の光電出力の特性の差異に基づいて被測
定面を形成する材料の反射率の影響を除去してあらさを
求めることを特徴とするものである。
When light is shined onto the surface to be measured through an optical fiber, the amount of reflected light changes depending on the roughness of the surface to be measured, so the roughness of the surface can be determined by measuring the amount of light. Since the reflectance differs depending on the material used, the influence of this reflectance must be removed. The present invention aims to provide a method for measuring surface roughness by correcting the influence of reflectance using simple means.・The reflected light of the light projected onto the surface to be measured through the input fiber group, with the end face of the fiber facing the surface to be measured, and when this optical fiber is placed perpendicularly to the surface to be measured and when placed at an angle. is received by a photoelectric element through a group of light-receiving fibers,
This method is characterized in that the roughness is determined by removing the influence of the reflectance of the material forming the surface to be measured based on the difference in the characteristics of the photoelectric output in each case.

図面を参照して本発明の方法について詳述すると、第1
図に示すように、まず、被測定面1に対して、入射用フ
ァイバ群2aと受光用ファイバ群2bとを結束してなる
オプチカル・ファイバ2を垂直(θ=0)に配置してそ
の端面を対向させ、入射用ファイバ群2aの他端に対向
させた光源3からの光をその入射用ファイバ群2aを通
して被測定面1に投射し、被測定面における反射光を受
光用ファイバ群2bを通して光電素子4で受光すると、
第2図aの実験例に示すように、被測定面のあらさに応
じて変化する光電出力を得ることができる。さらに、第
1図に鎖線で示すように、被測定面1に対してオプチカ
ル・ファイバ2を適当な角度θだけ傾斜させて、同様に
被測定面からの反射光を光電素子4において受光すると
、第2図をに示すように被測定面のあらさに応じて変化
する光電出力を得ることができる。
The method of the present invention will be described in detail with reference to the drawings.
As shown in the figure, first, an optical fiber 2 formed by bundling an incident fiber group 2a and a light receiving fiber group 2b is arranged perpendicularly (θ=0) to the surface to be measured 1, and its end surface is The light from the light source 3 facing the other end of the input fiber group 2a is projected onto the surface to be measured 1 through the input fiber group 2a, and the reflected light from the surface to be measured is transmitted through the light receiving fiber group 2b. When light is received by the photoelectric element 4,
As shown in the experimental example of FIG. 2a, it is possible to obtain a photoelectric output that changes depending on the roughness of the surface to be measured. Furthermore, as shown by the chain line in FIG. 1, when the optical fiber 2 is tilted at an appropriate angle θ with respect to the surface to be measured 1 and the reflected light from the surface to be measured is similarly received by the photoelectric element 4, As shown in FIG. 2, it is possible to obtain a photoelectric output that changes depending on the roughness of the surface to be measured.

なお、第2図a、bにおける横軸はオプチカル・ファイ
バの端面と被測定面との間のクリアランスを示している
。このような測定結果かられかるように、オプチカル・
フアイバ2を被測定面1に垂直に配置した場合の光電出
力は、被測定面のあらさがすぐれている程大きい出力を
示し、またオプチカル・フアイバ2を被測定面1に傾斜
させて配置した場合には、逆に被測定面のあらさがすぐ
れている程小さい出力を示しており、両光電出力は被測
定面のあらさをあられすものとすることができるが、被
測定面を形成する材料特有の反射率の影響を含み、その
出力特性を異にしているため、両光電出力の比をとるこ
とにより材料の反射率による影響を消去した被測定面の
あらさを求めることができる。
Note that the horizontal axis in FIGS. 2a and 2b indicates the clearance between the end face of the optical fiber and the surface to be measured. As can be seen from these measurement results, optical
The photoelectric output when the optical fiber 2 is placed perpendicular to the surface to be measured 1 increases as the roughness of the surface to be measured increases, and when the optical fiber 2 is placed at an angle to the surface to be measured 1. On the other hand, the rougher the surface to be measured, the smaller the output, and both photoelectric outputs can be used to indicate the roughness of the surface to be measured. The roughness of the surface to be measured can be determined by taking the ratio of the two photoelectric outputs, which eliminates the influence of the reflectance of the material.

すなわち、第3図はあらさを横軸にして上記両光電出力
の比をとつたものであるが、その比(Vθ=07Vθ=
15つ)の値は反射率が相違する材料(SUS、および
S55C)についても、反射率の影響が消去されて同一
直線上に位置している。従つて、測定系の特性を予め調
べておくことにより、被測定面だけから直接的に反射率
補正したあらさを測定することができる。このように、
本発明の方法によれば、被測定面に非接触の光学式あら
さ測定法において、オプチカル・フアイバを被測定面に
対して垂直に配置した場合と傾斜させて配置した場合の
反射光入光量を測定するという極めて簡単な手段により
材料の反射率の影響を補正した被測定面のあらさを求め
ることができる。
In other words, in Figure 3, the roughness is taken as the horizontal axis and the ratio of the two photoelectric outputs is calculated, and the ratio (Vθ=07Vθ=
Even for materials with different reflectances (SUS and S55C), the values of 15) are located on the same straight line, with the influence of reflectance eliminated. Therefore, by checking the characteristics of the measurement system in advance, it is possible to directly measure the reflectance-corrected roughness only from the surface to be measured. in this way,
According to the method of the present invention, in an optical roughness measurement method that does not contact the surface to be measured, the amount of incident reflected light can be calculated when the optical fiber is placed perpendicularly to the surface to be measured and when it is placed at an angle. By extremely simple measurement, the roughness of the surface to be measured can be determined by correcting the influence of the reflectance of the material.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施の態様についての説明図、第2図
A,bおよび第3図は実験結果を示す線図である。 1・・・・・・被測定面、2・・・・・・オプチカル・
フアイバ、2a・・・・・・入射用フアイバ群、2b・
・・・・・受光用フアイバ群、3・・・・・・光源、4
・・・・・・光電素子。
FIG. 1 is an explanatory diagram of an embodiment of the present invention, and FIGS. 2A, b, and 3 are diagrams showing experimental results. 1... Surface to be measured, 2... Optical.
Fiber, 2a... Input fiber group, 2b.
...Fiber group for light reception, 3...Light source, 4
・・・・・・Photoelectric element.

Claims (1)

【特許請求の範囲】[Claims] 1 入射用ファイバ群と受光用ファイバ群とを結束して
なるオプチカル・ファイバの端面を被測定面に対向させ
、このオプチカル・ファイバを被測定面に垂直に配置し
た場合と傾斜させて配置した場合について、入射用ファ
イバ群を通して被測定面に投射した光の投射側への反射
光を受光用ファイバ群を通して光電素子により受光し、
それぞれの場合の光電出力の比をとることにより被測定
面を形成する材料の反射率の影響を除去したあらさを求
めることを特徴とする光学式あらさ測定方法。
1. When the end face of an optical fiber made by bundling a group of input fibers and a group of receiving fibers faces the surface to be measured, and when this optical fiber is arranged perpendicularly to the surface to be measured and when it is arranged at an angle. , the reflected light of the light projected onto the surface to be measured through the input fiber group to the projection side is received by the photoelectric element through the light receiving fiber group,
An optical roughness measuring method characterized in that the roughness is determined by removing the influence of the reflectance of the material forming the surface to be measured by taking the ratio of the photoelectric outputs in each case.
JP50022645A 1975-02-24 1975-02-24 Optical roughness measurement method Expired JPS5917364B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50022645A JPS5917364B2 (en) 1975-02-24 1975-02-24 Optical roughness measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50022645A JPS5917364B2 (en) 1975-02-24 1975-02-24 Optical roughness measurement method

Publications (2)

Publication Number Publication Date
JPS5197459A JPS5197459A (en) 1976-08-27
JPS5917364B2 true JPS5917364B2 (en) 1984-04-20

Family

ID=12088573

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50022645A Expired JPS5917364B2 (en) 1975-02-24 1975-02-24 Optical roughness measurement method

Country Status (1)

Country Link
JP (1) JPS5917364B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2648024B2 (en) * 1990-12-14 1997-08-27 三洋電機株式会社 Drum type washing machine

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS451060Y1 (en) * 1969-03-06 1970-01-19
JPS4926671U (en) * 1972-06-09 1974-03-07

Also Published As

Publication number Publication date
JPS5197459A (en) 1976-08-27

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