JPS5934157B2 - Method for preventing oxidation of copper coating on ceramic body - Google Patents
Method for preventing oxidation of copper coating on ceramic bodyInfo
- Publication number
- JPS5934157B2 JPS5934157B2 JP14909380A JP14909380A JPS5934157B2 JP S5934157 B2 JPS5934157 B2 JP S5934157B2 JP 14909380 A JP14909380 A JP 14909380A JP 14909380 A JP14909380 A JP 14909380A JP S5934157 B2 JPS5934157 B2 JP S5934157B2
- Authority
- JP
- Japan
- Prior art keywords
- copper coating
- ceramic body
- copper
- hydrocarbon compound
- halogenated hydrocarbon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910052802 copper Inorganic materials 0.000 title claims description 115
- 239000010949 copper Substances 0.000 title claims description 115
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title claims description 114
- 238000000576 coating method Methods 0.000 title claims description 87
- 239000011248 coating agent Substances 0.000 title claims description 82
- 239000000919 ceramic Substances 0.000 title claims description 67
- 238000000034 method Methods 0.000 title claims description 39
- 230000003647 oxidation Effects 0.000 title claims description 28
- 238000007254 oxidation reaction Methods 0.000 title claims description 28
- 150000008282 halocarbons Chemical class 0.000 claims description 16
- 238000007747 plating Methods 0.000 claims description 15
- 235000014113 dietary fatty acids Nutrition 0.000 claims description 14
- 229930195729 fatty acid Natural products 0.000 claims description 14
- 239000000194 fatty acid Substances 0.000 claims description 14
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 claims description 12
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 claims description 12
- -1 fatty acid esters Chemical class 0.000 claims description 12
- 239000003595 mist Substances 0.000 claims description 11
- KYKAJFCTULSVSH-UHFFFAOYSA-N chloro(fluoro)methane Chemical compound F[C]Cl KYKAJFCTULSVSH-UHFFFAOYSA-N 0.000 claims description 9
- 239000004094 surface-active agent Substances 0.000 claims description 9
- MVPPADPHJFYWMZ-UHFFFAOYSA-N chlorobenzene Chemical compound ClC1=CC=CC=C1 MVPPADPHJFYWMZ-UHFFFAOYSA-N 0.000 claims description 8
- VZGDMQKNWNREIO-UHFFFAOYSA-N tetrachloromethane Chemical compound ClC(Cl)(Cl)Cl VZGDMQKNWNREIO-UHFFFAOYSA-N 0.000 claims description 8
- 150000004665 fatty acids Chemical class 0.000 claims description 7
- 238000007733 ion plating Methods 0.000 claims description 7
- 238000004544 sputter deposition Methods 0.000 claims description 7
- 229920000642 polymer Polymers 0.000 claims description 5
- 150000001875 compounds Chemical class 0.000 claims description 4
- 230000002265 prevention Effects 0.000 claims description 4
- NEHMKBQYUWJMIP-NJFSPNSNSA-N chloro(114C)methane Chemical compound [14CH3]Cl NEHMKBQYUWJMIP-NJFSPNSNSA-N 0.000 claims description 2
- 238000001771 vacuum deposition Methods 0.000 claims description 2
- 239000010408 film Substances 0.000 description 22
- 239000004065 semiconductor Substances 0.000 description 18
- 229910052573 porcelain Inorganic materials 0.000 description 14
- 230000008859 change Effects 0.000 description 12
- 239000007789 gas Substances 0.000 description 12
- 239000003985 ceramic capacitor Substances 0.000 description 10
- 150000002430 hydrocarbons Chemical class 0.000 description 10
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 8
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 8
- 229910052709 silver Inorganic materials 0.000 description 8
- 239000004332 silver Substances 0.000 description 8
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- 238000007738 vacuum evaporation Methods 0.000 description 6
- 239000002245 particle Substances 0.000 description 5
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 229910052759 nickel Inorganic materials 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 description 4
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 4
- HNNQYHFROJDYHQ-UHFFFAOYSA-N 3-(4-ethylcyclohexyl)propanoic acid 3-(3-ethylcyclopentyl)propanoic acid Chemical compound CCC1CCC(CCC(O)=O)C1.CCC1CCC(CCC(O)=O)CC1 HNNQYHFROJDYHQ-UHFFFAOYSA-N 0.000 description 3
- 235000021355 Stearic acid Nutrition 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000007772 electroless plating Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 3
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 3
- 239000000344 soap Substances 0.000 description 3
- 238000005476 soldering Methods 0.000 description 3
- 239000008117 stearic acid Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- CYRMSUTZVYGINF-UHFFFAOYSA-N trichlorofluoromethane Chemical compound FC(Cl)(Cl)Cl CYRMSUTZVYGINF-UHFFFAOYSA-N 0.000 description 3
- 229940029284 trichlorofluoromethane Drugs 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 2
- 239000002202 Polyethylene glycol Substances 0.000 description 2
- 239000004743 Polypropylene Substances 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 230000032683 aging Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000003197 catalytic effect Effects 0.000 description 2
- NEHMKBQYUWJMIP-UHFFFAOYSA-N chloromethane Chemical compound ClC NEHMKBQYUWJMIP-UHFFFAOYSA-N 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- IPCSVZSSVZVIGE-UHFFFAOYSA-N hexadecanoic acid Chemical compound CCCCCCCCCCCCCCCC(O)=O IPCSVZSSVZVIGE-UHFFFAOYSA-N 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- 229920001223 polyethylene glycol Polymers 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- XOAAWQZATWQOTB-UHFFFAOYSA-N taurine Chemical compound NCCS(O)(=O)=O XOAAWQZATWQOTB-UHFFFAOYSA-N 0.000 description 2
- 235000021314 Palmitic acid Nutrition 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 239000003945 anionic surfactant Substances 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000003093 cationic surfactant Substances 0.000 description 1
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical class OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 150000001879 copper Chemical class 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 150000002334 glycols Chemical class 0.000 description 1
- 239000002563 ionic surfactant Substances 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229940050176 methyl chloride Drugs 0.000 description 1
- WQEPLUUGTLDZJY-UHFFFAOYSA-N n-Pentadecanoic acid Natural products CCCCCCCCCCCCCCC(O)=O WQEPLUUGTLDZJY-UHFFFAOYSA-N 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- SOQBVABWOPYFQZ-UHFFFAOYSA-N oxygen(2-);titanium(4+) Chemical class [O-2].[O-2].[Ti+4] SOQBVABWOPYFQZ-UHFFFAOYSA-N 0.000 description 1
- 230000000607 poisoning effect Effects 0.000 description 1
- 229920001084 poly(chloroprene) Polymers 0.000 description 1
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 1
- 229920001225 polyester resin Polymers 0.000 description 1
- 239000004645 polyester resin Substances 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 229920002689 polyvinyl acetate Polymers 0.000 description 1
- 239000011118 polyvinyl acetate Substances 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 238000004321 preservation Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 229960003080 taurine Drugs 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
Landscapes
- Preventing Corrosion Or Incrustation Of Metals (AREA)
Description
【発明の詳細な説明】
この発明はセラミック素体上の銅被膜の酸化防止法に関
するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for preventing oxidation of a copper coating on a ceramic body.
特にこの発明はセラミック素体を含むセラミック電気回
路素子において電極または導電部として形成された銅被
膜の酸化防止法に関するものである。この発明の背景を
説明するのに好適な例としては、セラミック電気回路素
子の一つであるセラミックコンデンサがある。In particular, the present invention relates to a method for preventing oxidation of a copper coating formed as an electrode or conductive part in a ceramic electric circuit element including a ceramic body. A suitable example for explaining the background of this invention is a ceramic capacitor, which is one of ceramic electric circuit elements.
セラミックコンデンサの電極は、「般には高導電率の銀
が用いられていた。このような銀電極は、銀ペーストを
セラミック素体上に塗り、これを焼き付けることにより
形成していた。しかし、銀材料の価格の高騰に伴つて、
このような銀電極のコストがセラミックコンデンサの全
コストに占める割合が増えてきた。そのため、セラミッ
クコンデンサの全コストを高騰させる要因となつていた
。このような背景のもとで、安価な電極の開発に注目が
向けられた。The electrodes of ceramic capacitors generally used highly conductive silver.Such silver electrodes were formed by applying silver paste onto the ceramic body and baking it.However, With the rise in the price of silver materials,
The cost of such silver electrodes has been increasing as a proportion of the total cost of ceramic capacitors. This has been a factor in increasing the overall cost of ceramic capacitors. Against this background, attention has turned to the development of inexpensive electrodes.
その1つのアプローチとして、金属被膜の形成方法であ
る無電解メッキ法、真空蒸着法、スパツタリング法、イ
オンプレーテイング法、などについて種々検討が加えら
れた。また、他のアプローチとして、銀にかわる安価な
金属を電極に用いる検討もなされた。そこで、当初試み
られたのは、無電解メツキ法によるニツケルメツキ電極
であつた。As one approach, various studies have been made on methods for forming metal films, such as electroless plating, vacuum evaporation, sputtering, and ion plating. In addition, as another approach, studies have been made to use inexpensive metals instead of silver for the electrodes. Therefore, the first attempt was to create a nickel-plated electrode using an electroless plating method.
ニツケルメツキ電極は、銀電極にかわる安価な電極とし
てその一応の目的を達成することができた。しかしなが
ら、セラミツクコンデンサの電極としてニツケルメツキ
電極を用いることについては、次のような問題点を有し
ていることが明らかとなつた。すなわち、ニツケル電極
そのものの比抵抗がZ24×10−6Ω・礪であり、銀
の比抵抗1.62×10−6Ω・儂に比べて高い。した
がつて、高周波にふ・ける周波数特性が低下するという
問題があつた。また、モツケルメツキ電極は半田付け性
も悪いという問題点がある。さらに、ニツケルメツキ電
極の比抵抗を下げる手段として、全面に半田付けを行う
という手段も試みられた。しかし、電極全面に半田付け
をする際には、活性の強いフラツクスを多量に用いなけ
ればならない。そのため、半田付け後に不要なフラツク
スの洗浄を行わなければならない。さらに、半田付けの
際、たとえば、半田槽に浸漬して処理するが、セラミツ
クにストレスが加わつてセラミツクにクラツクがはいつ
たりするような欠点が見られた。次のステツプとして、
上述のようなニツケル電極に代わりうる安価で、導電率
のよい電極の開発がさらに望まれていた。The Nickelmetsuki electrode was able to achieve its intended purpose as an inexpensive alternative to silver electrodes. However, it has become clear that the use of nickel plated electrodes as electrodes of ceramic capacitors has the following problems. That is, the specific resistance of the nickel electrode itself is Z24 x 10-6 Ω·T, which is higher than the specific resistance of silver, which is 1.62 x 10-6 Ω·I. Therefore, there was a problem that the frequency characteristics at high frequencies deteriorated. Additionally, the Motsukermetsuki electrode has a problem in that it has poor solderability. Furthermore, an attempt was made to solder the entire surface of the nickel plated electrode as a means of lowering its resistivity. However, when soldering the entire surface of the electrode, a large amount of highly active flux must be used. Therefore, unnecessary flux must be cleaned after soldering. Furthermore, when soldering, for example, the ceramic is immersed in a solder bath, stress is applied to the ceramic, causing cracks to form in the ceramic. As the next step,
There has been a further desire for the development of an inexpensive and highly conductive electrode that can replace the nickel electrode as described above.
また無電解メツキ法による湿式メツキ法に代えて真空蒸
着法、スパツタリング法、イオンプレーテイング法など
の乾式メツキ法による金属被膜の形成方法も併せて検討
を試みた。そこで、新たに銅の乾式メツキ法による銅メ
ツキ電極が試みられた。In addition, instead of wet plating using electroless plating, methods for forming metal films using dry plating methods such as vacuum evaporation, sputtering, and ion plating were also investigated. Therefore, a new copper plating electrode using a copper dry plating method was attempted.
しかしながら、この銅の乾式メツキ処理によつて形成さ
れた銅メツキ電極は、そのままでは酸化されやすいとい
う性質を有している。このように銅被膜が酸化されやす
いという性質は次のような欠点をもたらす。However, the copper-plated electrode formed by this copper dry plating process has a property that it is easily oxidized as it is. The tendency of the copper coating to be easily oxidized brings about the following drawbacks.
たとえぱ、銅被膜をセラミツクコンデンサの電極として
用いると、酸化の結果として生じた酸化膜の形成により
、導電率の低下をもたらし、かつ半田付け性も低下する
という好ましくない現象が見られる。したがつて、乾式
メツキ法により形成された銅被膜に対して酸化防止処理
が必要となる。For example, when a copper film is used as an electrode of a ceramic capacitor, an undesirable phenomenon is observed in which the formation of an oxide film as a result of oxidation leads to a decrease in electrical conductivity and also decreases solderability. Therefore, it is necessary to perform oxidation prevention treatment on the copper coating formed by the dry plating method.
それゆえに、この発明の主たる目的は、セラミツク素体
上に形成された銅被膜のための酸化防止法を提供するこ
とである。Therefore, a primary object of the present invention is to provide a method for preventing oxidation of copper coatings formed on ceramic bodies.
この発明の他の目的は、セラミツク素体を含むセラミツ
ク電気回路素子の電極として用いられる銅被膜の高信頼
化を可能にすることである。Another object of the present invention is to make it possible to improve the reliability of a copper coating used as an electrode of a ceramic electric circuit element including a ceramic body.
この発明のざらに他の目的は、銅被膜の長期保存を可能
にすることである。上述の目的を達成するためになされ
たこの発明を要約すれば、乾式メツキ法によりセラミツ
ク素体上に銅被膜を形成し?のち、乾式メツキ装置の真
空槽内にハロゲン化炭化水素化合物を流入させ、銅被膜
と・・ロゲン化炭化水素化合物を接触させることを特徴
とするものである。Another object of the invention is to enable long-term preservation of copper coatings. To summarize this invention, which has been made to achieve the above object, a copper coating is formed on a ceramic body by a dry plating method. Afterwards, a halogenated hydrocarbon compound is flowed into the vacuum chamber of the dry plating device, and the copper coating is brought into contact with the halogenated hydrocarbon compound.
この発明によれば、銅被膜表面の酸化現象は見られす、
半田付け性も良好であるなど、銅被膜の酸化防止が有利
に実現される。また、この発明方法を採用すれば、銅被
膜を酸化が起らない温度で真空中に放置しても酸化が進
行せず、したがつて酸化防止のために特に冷却する手段
を講する必要はない。According to this invention, no oxidation phenomenon is observed on the surface of the copper coating.
The solderability is also good, and oxidation prevention of the copper coating is advantageously realized. Furthermore, if the method of this invention is adopted, oxidation will not proceed even if the copper coating is left in vacuum at a temperature at which oxidation does not occur, so there is no need to take special cooling measures to prevent oxidation. do not have.
また銅被膜が・・ロゲン化炭化水素化合物に接触したの
ちであれば、銅被膜が高温状態となつていても、つまり
熱時においても、大気中に取り出したときに酸化される
ことがなく、したがつて、従来のように着膜後に銅被膜
を冷却する余分な時間が不必要となり、銅被膜の形成処
理時間が短縮される利点を有する。上述した乾式メツキ
法としては、真空蒸着法、スパツタリング法、イオンプ
レーテイング法が掲げられる。かかる方法に対応した各
種の乾式メツキ装置の真空槽内にセラミツク素体が収容
され、所定の真空条件下で銅粒子が飛散されてセラミツ
ク素体上に銅被膜が形成される。・・ロゲン化炭化水素
化合物は銅被膜が形成されたのち真空槽内に流入される
か、ガス状、あるいは霧状となつて真空槽内に流入され
、セラミツク素体上に形成された銅被膜上に存在する活
性点がハロゲン化炭化水素化合物の被毒作用によつて消
減して触媒活性がなくなり、銅被膜は安定にな゛り、酸
化されにくくなるのである。またハロゲン化炭化水素化
合物の流入は銅被膜の形成後真空槽を犬気圧とするため
外部雰囲気ガスを真空槽に流入させると同時に行つても
よい。要は銅被膜の形成後に・・ロゲン化炭化水素化合
物を真空槽に流入させればよいのであり、銅被膜形成後
にできるだけ早く処理するのが銅被膜の酸化防止のため
に好ましい。ハロゲン化炭化水素化合物としては、好ま
しくは、トリクレン、パークレン、クロロフルオロカー
ボン、クロルベンゼン、塩化メチル、塩化メチレン、ク
ロロホルム、四塩化炭素を含むグループから選ばれた少
なくとも一種が用いられる。In addition, if the copper coating has come into contact with the rogenated hydrocarbon compound, it will not be oxidized when taken out into the atmosphere, even if the copper coating is in a high temperature state. Therefore, there is no need for extra time for cooling the copper coating after deposition as in the conventional method, and there is an advantage that the processing time for forming the copper coating is shortened. Examples of the above-mentioned dry plating method include a vacuum evaporation method, a sputtering method, and an ion plating method. A ceramic body is housed in a vacuum chamber of various dry plating devices compatible with such a method, and copper particles are scattered under predetermined vacuum conditions to form a copper coating on the ceramic body. After the copper coating is formed, the rogenated hydrocarbon compound is flowed into the vacuum chamber, or it is flowed into the vacuum chamber in the form of a gas or mist, and the copper coating is formed on the ceramic body. The active sites present on the copper coating are reduced by the poisoning action of the halogenated hydrocarbon compound, resulting in no catalytic activity, and the copper coating becomes more stable and less susceptible to oxidation. Further, the halogenated hydrocarbon compound may be introduced at the same time as external atmospheric gas is introduced into the vacuum chamber to bring the vacuum chamber to dog pressure after the formation of the copper coating. The point is that after the formation of the copper coating, the logenated hydrocarbon compound may be introduced into the vacuum chamber, and it is preferable to carry out the treatment as soon as possible after the formation of the copper coating, in order to prevent the oxidation of the copper coating. As the halogenated hydrocarbon compound, at least one selected from the group including trichrene, perchrene, chlorofluorocarbon, chlorobenzene, methyl chloride, methylene chloride, chloroform, and carbon tetrachloride is preferably used.
他の好ましい実施例として、・・ロゲン化炭化水素化合
物を接触させる工程に訃いて、界面活性剤を溶解したハ
ロゲン化炭化水素化合物溶液が用いられる。使用可能な
界面活性剤としては、たとえば、ナフテン酸石鹸のよう
なアニオン界面活性剤、アルキルオキサゾリンのような
カチオン界面活性剤、ポリエチレングリコールエステル
のような非イオン界面活性剤、またはタウリン縮合コ・
・ク酸エステルのような両性界面活性剤などが例示され
うる。すなわち、ハロゲン化炭化水素化合物に溶解可能
な界面活性剤であれば、いかなるものでもよい。したが
つて、界面活性剤の種類としては、上述した例に限定さ
れるものではないことを指摘しておく。この界面活性剤
を含む・・ロゲン化炭化水素化合物を接触工程に用いれ
ば、界面活性剤を含まない場合に比べて、界面活性剤の
単分子膜が銅被膜表面に形成されることにより、銅被膜
の酸化卦よひ経時変化の防止効果が一層顕著に現われる
。この発明にさらに他の好ましい実施例では、・・ロゲ
ン化炭化水素化合物を接触させる工程で、ステアリン酸
などの脂肪酸や蝋などの高位脂肪酸エステルを溶解した
ノ叩ゲン化炭化水素化合物溶液が用いられる。In another preferred embodiment, in the step of contacting the halogenated hydrocarbon compound, a solution of the halogenated hydrocarbon compound in which a surfactant is dissolved is used. Surfactants that can be used include, for example, anionic surfactants such as naphthenic acid soaps, cationic surfactants such as alkyloxazolines, nonionic surfactants such as polyethylene glycol esters, or taurine condensation co-sols.
-Ampholytic surfactants such as citric acid esters may be exemplified. That is, any surfactant may be used as long as it is soluble in the halogenated hydrocarbon compound. Therefore, it should be pointed out that the type of surfactant is not limited to the above-mentioned examples. If a logenated hydrocarbon compound containing this surfactant is used in the contact process, a monomolecular film of the surfactant will be formed on the surface of the copper coating, compared to the case where no surfactant is included, thereby increasing the copper The effect of preventing the oxidation of the film from changing over time becomes more pronounced. In yet another preferred embodiment of the present invention, in the step of contacting the logenated hydrocarbon compound, a solution of the beaten genated hydrocarbon compound in which fatty acids such as stearic acid and higher fatty acid esters such as wax are dissolved is used. .
使用可能な脂肪酸または脂肪酸エステルとしては、ステ
アリン酸、蝋に限ることなく、そのほか、パルミチン酸
、ラノリン酸などの脂肪酸類、脂肪酸エステル類なども
例示されうる。この好ましい実施例によれば、土述の界
面活性剤を用いた実施例と同様に、銅被膜表面に脂肪酸
や脂肪酸エステルの単分子膜を形成し、それによつて銅
被膜の酸化と経時変化が一層防止できるようになる。こ
のような観点から、この実施例に用いられる脂肪酸また
は脂肪酸エステルを選択すれはよく、単分子膜を銅被膜
表面に形成しやすい脂肪酸類または脂肪酸エステル類で
あればいずれでもよい。この発明のなち・も他の実施例
では、・・ロゲン化炭化水素化合物を接触させる工程は
、高分子化合物を溶解した・・ロゲン化炭化水素化合物
溶液によつて実施される。Usable fatty acids or fatty acid esters are not limited to stearic acid and wax, and may also include fatty acids such as palmitic acid and lanolic acid, fatty acid esters, and the like. According to this preferred embodiment, a monomolecular film of fatty acids or fatty acid esters is formed on the surface of the copper coating, thereby preventing oxidation and aging of the copper coating. This will make it even more preventable. From this point of view, the fatty acid or fatty acid ester used in this example may be selected, and any fatty acid or fatty acid ester that can easily form a monomolecular film on the surface of the copper coating may be used. In another embodiment of the invention, the step of contacting the logenated hydrocarbon compound is carried out with a solution of the logenated hydrocarbon compound in which the polymeric compound is dissolved.
使用可能な高分子化合物としては、たとえば、ポリエチ
レン、ポリプロピレン、ポリ塩化ビニル、ポリエステル
レジン、ポリ酢酸ビニル、ポリビニルホルマール、ポリ
スチレン、ポリビニルブチラール、ポリウレタン、MM
AlABS.SBR、ネオプレン、塩素化ゴムなどが例
示されうる。この実施例によれば、高分子化合物を用い
ない実施例に比べて、銅被膜表面に高分子化合物の膜を
形成する現象がさらに生じるので、一層の銅被膜の酸化
防止および経時変化防止効果が得られる。この発明の好
ましい実施例の概要を一般的に説明する。Examples of usable polymer compounds include polyethylene, polypropylene, polyvinyl chloride, polyester resin, polyvinyl acetate, polyvinyl formal, polystyrene, polyvinyl butyral, polyurethane, and MM.
AlABS. Examples include SBR, neoprene, and chlorinated rubber. According to this example, the phenomenon of forming a film of a polymer compound on the surface of the copper coating occurs more than in the example in which no polymer compound is used, so that the effect of preventing oxidation and preventing aging of the copper coating is further enhanced. can get. A general overview of preferred embodiments of the invention will now be described.
まず、誘電体、絶縁体、抵抗体、半導体などのセラミツ
ク素体を準備する。次に、セラミツク素体の表面に真空
蒸着法、スパツタリング法、イオンプレーテイング法な
どの薄膜形成技術により銅被膜を形成する。たとえば、
セラミツク素体として誘電体セラミツクを用い、表面に
銅被膜を形成することにより、コンデンサが構成できる
。また、セラミツク素体として、アルミナ、ジルコニア
、ホルステライトなどのセラミツクを用い、表面に銅被
膜からなる回路パターンを形成すれば、回路用基板を構
成することができる。そのほか、抵抗体、半導体などの
セラミツク素体表面に銅被膜を形成することにより種々
の電子部品が構成できる。このようにセラミツク素体表
面に各種方法により銅被膜が形成された種々の電子部品
は、その後、各種方法を実施するために用いられた真空
槽内に流入された・・ロゲン化炭化水素化合物に接触さ
せられ、銅被膜が大気に曝される前に活性点を消滅させ
て触媒活性をなくし、酸化されにくい銅被膜とすること
ができる。First, a ceramic element such as a dielectric, an insulator, a resistor, or a semiconductor is prepared. Next, a copper coating is formed on the surface of the ceramic body using a thin film forming technique such as vacuum evaporation, sputtering, or ion plating. for example,
A capacitor can be constructed by using dielectric ceramic as the ceramic body and forming a copper coating on the surface. Furthermore, a circuit board can be constructed by using ceramic such as alumina, zirconia, or holsterite as the ceramic body and forming a circuit pattern made of a copper film on the surface. In addition, various electronic components can be constructed by forming a copper coating on the surface of a ceramic element such as a resistor or a semiconductor. In this way, various electronic components with copper coatings formed on the surface of ceramic bodies by various methods are then flowed into vacuum chambers used to carry out the various methods. When brought into contact, the active sites are annihilated and the catalytic activity is eliminated before the copper coating is exposed to the atmosphere, resulting in a copper coating that is resistant to oxidation.
以下にこの発明を実施例に従つて詳細に説明する。The present invention will be explained in detail below based on examples.
実施例 1
チタン酸ストロンチウム系の粒界絶縁形半導体磁器とし
て、直径10.0m71L、厚み0.3m1のものを用
意し、この半導体磁器を直流二極スパツタリング装置の
1よ側に設置し、一方陰極側には金属銅のターゲツトを
設置した。Example 1 Strontium titanate-based grain-boundary insulated semiconductor porcelain with a diameter of 10.0 m71L and a thickness of 0.3 m1 was prepared, and this semiconductor porcelain was installed on the 1 side of a DC bipolar sputtering device, while the cathode A metallic copper target was set up on the side.
次いで真空槽内を一旦高真空状態としたのち、アルゴン
ガスを注入しながら真空度を5×10−2〜4×10−
4T0rr、たとえば3×10−3T0rrとし、ター
ゲツトに単位面積当たり、たとえば6W/C7iの電力
が供給されるように陰極と陽極間に直流電圧を印加した
。このようにして半導体磁器の表面にスパツタリングに
よる銅被膜を形成し、そののちガス供給口より真空槽内
にクロロフルオロカーボンの1種であるトリクロロフル
オロメタンを流入させ、銅被膜表面にトリクロロフルオ
ロメタンを接触させた。得られた半導体磁器について、
自然雰囲気中に放置したところ、1力月後に}いても何
らの変化も見られず、半田付け性も良好であつた。な}
、上述した方法のほかトリクロロフルオロメタンガスは
真空槽のリークバルブより流入させてもよい。Next, once the inside of the vacuum chamber is brought to a high vacuum state, the degree of vacuum is increased to 5 x 10-2 to 4 x 10-2 while injecting argon gas.
4T0rr, for example 3.times.10@-3 T0rr, and a DC voltage was applied between the cathode and the anode so that power of, for example, 6W/C7i per unit area was supplied to the target. In this way, a copper film is formed on the surface of the semiconductor ceramic by sputtering, and then trichlorofluoromethane, a type of chlorofluorocarbon, is flowed into the vacuum chamber from the gas supply port, and the trichlorofluoromethane is brought into contact with the surface of the copper film. I let it happen. Regarding the obtained semiconductor porcelain,
When left in a natural atmosphere, no change was observed even after one month, and the solderability was good. Nah}
In addition to the method described above, trichlorofluoromethane gas may be introduced through a leak valve of a vacuum chamber.
実施例 2
直径6.5mm、厚み0.5mmの酸化チタン系誘電体
よりなるセラミツク素体を準備した。Example 2 A ceramic body made of a titanium oxide dielectric having a diameter of 6.5 mm and a thickness of 0.5 mm was prepared.
次いで、このセラミツク素体を真空蒸着装置の真空槽内
に設置し、さらに真空槽内が5×10−5〜5×10−
6T0rrの真空度になるように給排気口より排気した
。引きつづき加熱源ヒータに通電して蒸発源である銅を
加熱し、銅を蒸発させセラミツク素体に銅被膜を形成し
た。こののち給排気口のバルブを開らくと同時にここか
らクロロホルムを霧状に流入させ、銅被膜表面にクロロ
ホルムを接触させた。Next, this ceramic element body is placed in a vacuum chamber of a vacuum evaporation device, and the inside of the vacuum chamber is further reduced to 5×10−5 to 5×10−5.
The air was evacuated through the air supply and exhaust ports to a degree of vacuum of 6T0rr. Subsequently, electricity was applied to the heating source heater to heat the copper, which was the evaporation source, to evaporate the copper and form a copper coating on the ceramic body. Thereafter, the valve of the supply/exhaust port was opened, and at the same time, chloroform was flowed in from the port in the form of a mist to bring the chloroform into contact with the surface of the copper coating.
このようにして得られたセラミツク素体とクロロホルム
処理をしていないセラミツク素体について、それぞれ2
4時間自然雰囲気中に放置し、銅被膜表面を観察したと
ころ、この発明によるクロロホルム処理を行つていない
ものについては、褐色を程しはじめ半田付け性も低下し
た。For the ceramic bodies obtained in this way and the ceramic bodies not treated with chloroform, each
When the surface of the copper coating was observed after being left in a natural atmosphere for 4 hours, it was found that the copper coating surface, which had not been subjected to the chloroform treatment according to the present invention, began to turn brown and its solderability decreased.
しかしながらこの発明方法によるものは一カ月後放置し
たものは、何らの変化も見られず、半田付け性も良好で
あつた。実施例 3
直径6.5mm、厚み0.5mmの酸化チタン系誘導体
のセラミツク素体を準備した。However, when the method of this invention was left for one month, no change was observed and the solderability was good. Example 3 A ceramic body of a titanium oxide derivative having a diameter of 6.5 mm and a thickness of 0.5 mm was prepared.
こののち実施例2と同様にセラミツク素体の表面に銅被
膜を形成し、しかる後真空蒸着装置の給排気口のバルブ
を開らくと同時にポリエチレングリコールエステルを溶
解したトリクレンをガス状に流入させ、銅被膜表面に接
触させた。Thereafter, a copper coating was formed on the surface of the ceramic body in the same manner as in Example 2, and then, at the same time as the valve of the supply and exhaust port of the vacuum evaporation device was opened, trichlene in which polyethylene glycol ester was dissolved was introduced in gaseous form. It was brought into contact with the surface of the copper coating.
このようにして得られたセラミツク素体と界面活性剤を
溶解したトリクレンによる処理を行つていないセラミツ
ク素体について、それぞれ24時間自然雰囲気中に放置
し、銅被膜表面を観察したところ、この発明方法による
処理を行つていないものについては、褐色を程しはじめ
、半田付け性も低下した。The thus obtained ceramic body and the ceramic body which had not been treated with trichlene in which a surfactant was dissolved were left in a natural atmosphere for 24 hours, and the surface of the copper coating was observed. For those that were not treated by this method, the brown color began to fade and the solderability also decreased.
一方この発明方法によるものは一カ月放置したものにつ
いても、何ら変化が見られず、半田付け性も良好であつ
た。実施例 4
チタン酸ストロンチウム系の粒界絶縁形半導体磁器とし
て、直径10.0mm1厚み0.3mmのものを準備し
た。On the other hand, in the case of the method of this invention, no change was observed even after leaving it for one month, and the solderability was good. Example 4 Strontium titanate-based grain boundary insulated semiconductor porcelain having a diameter of 10.0 mm and a thickness of 0.3 mm was prepared.
次いでこの半導体磁器をイオンプレーテイング装置の陰
極側に設置し、一方陽極側に被膜形成材料の銅を設置し
た。こののち真空槽の給排気口より槽内を高真空とし、
さらにアルゴンガスをガス給供口より流入させて槽内を
10−1〜10−4T0rrのガス圧に調整した。引き
つづき陰極、陽極間に高電圧を印加してグロー放電させ
、さらにプラズマを発生させた。次いで被膜形成材料の
銅を加熱することにより銅を蒸発させ、プラズマ中でイ
オン化あるいは励起されたアルゴンガスに衝突▲せて荷
電交換を行わしめ、銅粒子をイオン化粒子または粒子群
として飛散させ、銅被膜を半導体磁器被膜に付着させた
。さらに、真空槽の給排気口のバルブを開らくとともに
ナフテン酸石鹸を溶解したクロロフルオロカーボン溶液
を霧状に真空槽に流入させ、銅被膜にナフテン酸石鹸を
溶解したクロロフルオロカーボンを接触させた。Next, this semiconductor porcelain was placed on the cathode side of the ion plating apparatus, and on the other hand, copper as a coating material was placed on the anode side. After this, the inside of the tank is made into a high vacuum through the supply and exhaust ports of the vacuum tank.
Further, argon gas was introduced from the gas supply port to adjust the gas pressure in the tank to 10-1 to 10-4T0rr. Subsequently, a high voltage was applied between the cathode and anode to cause a glow discharge, and further plasma was generated. Next, the copper, which is the film forming material, is heated to evaporate the copper, and the copper is collided with ionized or excited argon gas in the plasma to perform charge exchange, scattering the copper particles as ionized particles or particle groups, and forming copper particles. The coating was applied to a semiconductor porcelain coating. Furthermore, the valves at the supply and exhaust ports of the vacuum chamber were opened, and a chlorofluorocarbon solution in which naphthenic acid soap had been dissolved was flowed into the vacuum chamber in the form of a mist, so that the chlorofluorocarbon in which naphthenic acid soap had been dissolved was brought into contact with the copper coating.
このようにして得られた銅被膜を有する半導体磁器を湿
度95%、温度40℃の条件で強制的に酸化したところ
、5000hr後に卦いても銅被膜表面の色調変化は全
くなく、また半田付け性も良好であつた。When the semiconductor porcelain having the copper coating thus obtained was forcibly oxidized under conditions of humidity of 95% and temperature of 40°C, there was no change in color tone of the surface of the copper coating even after 5000 hours, and the solderability was improved. It was also good.
実施例 5
直径6.5m7!L、厚み0.5mmの酸化チタン系誘
電体のセラミツク素体を準備した。Example 5 Diameter 6.5m7! A titanium oxide dielectric ceramic body having a thickness of 0.5 mm was prepared.
こののち実施例1と同様にして銅被膜を形成するととも
に、蝋を溶解させたトリクレンを霧状に真空槽内に流入
させ、銅被膜の表面にこのトリクレンを接触させた。Thereafter, a copper coating was formed in the same manner as in Example 1, and a mist of trichlene in which wax had been dissolved was flowed into the vacuum chamber to contact the surface of the copper coating.
このようにして得られたセラミック素体と蝋を溶解した
トリクレンによる処理を行つていないセラミツク素体に
ついて、それぞれ24時間自然雰囲気中に放置し、銅被
膜を観察したところ、この発明方法によるものは何らの
変化も見られず、半田付け性も良好であつた。The thus obtained ceramic body and the ceramic body which had not been treated with trichlene containing melted wax were left in a natural atmosphere for 24 hours, and the copper coating was observed. No change was observed, and the solderability was good.
しかしながらこの発明方法によらないものは褐色を程し
はじめ、半田付け性も低下した。実施例 6
セラ一、ミツク素体としてチタン酸ストロンチウム系の
粒界絶縁形半導体磁器を用い、大きさが直径10.0m
m1厚み0.3mmのものを用意した。However, the products that were not produced by the method of this invention began to lose their brown color and their solderability also deteriorated. Example 6 Strontium titanate-based grain boundary insulated semiconductor porcelain was used as the ceramic body, and the size was 10.0 m in diameter.
A piece with m1 thickness of 0.3 mm was prepared.
この半導体磁器を実施例1と同様に処理してその表面に
銅被膜を形成するとともに、ステアリン酸を溶解したク
ロロフルオロカーボン溶液をガス状としてリークバルブ
より真空槽内に流入させ、銅被膜の表面にこのクロロフ
ルオロカーボンを接触させた。このようにして得られた
半導体磁器を湿度9570、温度40℃の条件で強制的
に酸化したところ、5000hr後に卦いても銅被膜表
面の色調変化は全くなく、また半田付け性も良好であつ
た。This semiconductor porcelain was treated in the same manner as in Example 1 to form a copper coating on its surface, and a chlorofluorocarbon solution in which stearic acid had been dissolved was flowed in gaseous form into a vacuum chamber through a leak valve to coat the surface of the copper coating. This chlorofluorocarbon was contacted. When the semiconductor porcelain thus obtained was forcibly oxidized at a humidity of 9,570 degrees and a temperature of 40 degrees Celsius, there was no change in color tone on the surface of the copper coating even after 5,000 hours, and the solderability was also good. .
実施例 7直径6.5mm、厚み0.5mmの酸化チタ
ン系誘電体のセラミツク素体を準備した。Example 7 A titanium oxide dielectric ceramic body having a diameter of 6.5 mm and a thickness of 0.5 mm was prepared.
このセラミツク素体を実施例2と同様に処理してその表
面に銅被膜を形成するとともに、ポリエチレンを溶解し
たトリクレン溶液を霧状にして真空槽の給排気口より流
入させ、銅被膜表面にこのトリクレンを接触させた。This ceramic body was treated in the same manner as in Example 2 to form a copper coating on its surface, and a trichlene solution in which polyethylene was dissolved was made into a mist and flowed in from the air supply and exhaust port of the vacuum chamber to form a copper coating on the surface of the copper coating. Triclean was contacted.
このようにして得られたセラミツク誘電体について、1
力月間自然雰囲気中に放置し、銅被膜表面を観察したと
ころ、何らの変化も見られず、半田付け性も良好であつ
た。Regarding the ceramic dielectric thus obtained, 1
When the copper coating surface was observed after being left in a natural atmosphere for several months, no changes were observed and the solderability was good.
実施例 8
セラミツク素体としてチタン酸ストロンチウム系の粒界
絶縁形半導体磁器を用い、大きさが直径10.0m71
1厚み0.3mmのものを用意した。Example 8 Strontium titanate-based grain boundary insulated semiconductor porcelain was used as the ceramic body, and the size was 10.0 m71 in diameter.
One with a thickness of 0.3 mm was prepared.
この半導体磁器を実施例4と同様に処理してその表面に
銅被膜を形成するとともに、ポリプロピレンを溶解した
クロロフルオロカーボン溶液をガス状として給排気口か
ら流入させ、銅被膜表面にこのクロロフルオロカーボン
を接触させた。このようにして得られた半導体磁器を湿
度95%、温度40℃の条件下で強制的に酸化したとこ
ろ、5000hr後においても銅被膜表面の色調変化は
全くなく、また、半田付け性も良好であつた。実施例
9
4.5mm×2.0mm×1.5mmの積層セラミツク
コンデンサ素体を準備した。This semiconductor porcelain was treated in the same manner as in Example 4 to form a copper coating on its surface, and a chlorofluorocarbon solution in which polypropylene was dissolved was flowed in gaseous form through the supply and exhaust ports to bring the chlorofluorocarbon into contact with the surface of the copper coating. I let it happen. When the semiconductor porcelain thus obtained was forcibly oxidized under conditions of 95% humidity and 40°C, there was no change in color tone on the surface of the copper coating even after 5000 hours, and the solderability was also good. It was hot. Example
9. A multilayer ceramic capacitor body measuring 4.5 mm x 2.0 mm x 1.5 mm was prepared.
これを実施例1と同様に処理して積層セラミツクコンデ
ンサ素体の表面に銅被膜を形成し、そののちガス供給口
より真空槽内に約2CCの四塩化炭素を霧状に流入させ
、銅被膜表面に四塩化炭素を接触させた。This was treated in the same manner as in Example 1 to form a copper film on the surface of the multilayer ceramic capacitor body, and then about 2 CC of carbon tetrachloride was flowed in a mist form into the vacuum chamber from the gas supply port to form a copper film. Carbon tetrachloride was brought into contact with the surface.
このようにして得られた積層セラミツクコンデンサにつ
いて、自然雰囲気中に放置したところ、1力月後に訃い
ても銅被膜に何らの変化も見られず、半田付け性も良好
であつた。When the multilayer ceramic capacitor thus obtained was left in a natural atmosphere, no change was observed in the copper coating even after one month, and the solderability was good.
実施例 10
10mm×20mmX0.6mmのアルミナ基板を準備
した。Example 10 An alumina substrate of 10 mm x 20 mm x 0.6 mm was prepared.
これを実施例2と同様にしてアルミナ基板表面に銅被膜
を形成し、そののち真空蒸着装置の給排気口のバルブを
開くと同時に約3CCの塩化メチレンを霧状に流入させ
、銅被膜表面に塩化メチレンを接触させた。A copper film was formed on the surface of the alumina substrate in the same manner as in Example 2, and then, at the same time as the valve of the supply and exhaust port of the vacuum evaporation equipment was opened, about 3 CC of methylene chloride was flowed in a mist to coat the surface of the copper film. Methylene chloride was contacted.
このようにして得られたアルミナ基板について、自然雰
囲気中に放置したところ、1力月後に}いても銅被膜に
何らの変化も見られす、半田付け性も良好であつた。When the alumina substrate thus obtained was left in a natural atmosphere, no change was observed in the copper coating even after one month, and the solderability was good.
実施例 11
直径6.5mTL1厚み0.5m77!の酸化チタン系
からなる高周波用セラミツク素体を準備した。Example 11 Diameter 6.5m TL1 Thickness 0.5m77! A high-frequency ceramic body made of titanium oxide was prepared.
このセラミツク素体を高周波イオンプレーテイングの陰
極側に設置し、さらに真空槽内が2×10−6T0rr
の真空度になるように給排気口より排気した。This ceramic body was installed on the cathode side of high-frequency ion plating, and the inside of the vacuum chamber was 2×10-6T0rr.
The air was evacuated through the air supply and exhaust ports to achieve a vacuum level of .
引きつづき加熱源ヒータに通電して蒸発源である銅を加
熱して蒸発させ、蒸発した銅を正にイオン化しセラミツ
ク素体に銅被膜を形成した。こののち給排気口のバルブ
を開くと同時にここから約2CCのパークレンを霧状に
流入させ、銅被膜表面にパークレンを接触させた。Subsequently, electricity was applied to the heating source heater to heat and evaporate the copper serving as the evaporation source, and the evaporated copper was positively ionized to form a copper coating on the ceramic body. Thereafter, at the same time as the valve of the supply/exhaust port was opened, about 2 cc of perchloren was flowed in from the port in the form of a mist, and the perchloren was brought into contact with the surface of the copper coating.
このようにして得られたセラミツク素体について、自然
雰囲気中に放置したところ、1力月後にふ・いても銅被
膜に何らの変化も見られず、半田付け性も良好であつた
。When the ceramic body thus obtained was left in a natural atmosphere, no change was observed in the copper coating even after one month, and the solderability was good.
実施例 12
8m77I×5m771×1mm(7)SnO2−Ti
O2系のセラミツク抵抗体を準備した。Example 12 8m77I x 5m771 x 1mm (7) SnO2-Ti
An O2-based ceramic resistor was prepared.
このセラミツク抵抗体を実施例1と同様に処理してその
表面に銅被膜を形成し、そののちガス供給口より真空槽
内に約2ccのクロロベンゼンを霧状に流入させ、銅被
膜をクロロベンゼンと接触させた。This ceramic resistor was treated in the same manner as in Example 1 to form a copper film on its surface, and then approximately 2 cc of chlorobenzene was flowed into the vacuum chamber from the gas supply port in the form of a mist to bring the copper film into contact with the chlorobenzene. I let it happen.
このようにして得られたセラミツク抵抗体について、自
然雰囲気中に放置したところ、1力月後においても銅被
膜に何らの変化も見られず、半田付け性も良好であつた
。When the ceramic resistor thus obtained was left in a natural atmosphere, no change was observed in the copper coating even after one month, and the solderability was good.
実施例 13
外径7mm、内径3mm)高さ7m7nの円筒状からな
るTiO2−ZrO2−ZnO系のセラミツク誘電体を
準備した。Example 13 A cylindrical TiO2-ZrO2-ZnO ceramic dielectric having a height of 7m7n (outer diameter 7mm, inner diameter 3mm) was prepared.
このセラミツク誘電体を実施例1と同様に処理してその
表面に銅被膜を形成し、そののちガス供給口より真空槽
内に約2CCの塩化メチルを霧状に流入させ、銅被膜を
塩化メチルと接触させた。This ceramic dielectric was treated in the same manner as in Example 1 to form a copper film on its surface, and then approximately 2 CC of methyl chloride was flowed into the vacuum chamber from the gas supply port in the form of a mist to form a copper film. brought into contact with.
このようにして得られたセラミツク抵抗体について、自
然雰囲気中に放置したところ、1力月後においても銅被
膜に何らの変化も見られず、半田付け性も良好であつた
。When the ceramic resistor thus obtained was left in a natural atmosphere, no change was observed in the copper coating even after one month, and the solderability was good.
得られたセラミツク誘電体はNCO(電圧制御発振器)
の一部を構成する誘電体共振器として用いられる。The resulting ceramic dielectric is an NCO (voltage controlled oscillator)
It is used as a dielectric resonator that forms part of the
以上の各実施例から明らかなように、この発明によれば
、乾式メツキ法によりセラミツク素体上に銅被膜を形成
したのち、乾式メツキ装置の真空槽内に・・ロゲン化炭
化水素化合物を流入させ、銅被膜と・・ロゲン化炭化水
素化合物を接触させるようにしたものであるため、銅被
膜表面の酸化現象は見られず、半田付け性も良好である
など、銅被膜の酸化防止法としてきわめて有用なもので
ある。As is clear from the above embodiments, according to the present invention, after a copper coating is formed on a ceramic body by a dry plating method, a logenated hydrocarbon compound is introduced into a vacuum chamber of a dry plating device. Since the copper coating is made to come into contact with the rogenated hydrocarbon compound, no oxidation phenomenon is observed on the surface of the copper coating, and it has good solderability, making it an effective method for preventing oxidation of copper coatings. It is extremely useful.
またこの発明方法によれば、銅被膜の形成工程に引きつ
づき実施できるので、同じ真空槽内にて処理が行えるこ
とになり、酸化雰囲気に放置することもないので、迅速
な酸化防止処理が行える。In addition, according to the method of the present invention, the process can be carried out immediately after the step of forming the copper coating, so the process can be carried out in the same vacuum chamber, and there is no need to leave it in an oxidizing atmosphere, allowing for rapid oxidation prevention treatment. .
なお、上記した実施例では誘電体セラミツク素体、粒界
絶縁形半導体磁器について説明したが、そのほかの誘電
体、絶縁体、半導体、抵抗体よりなるものに銅被膜を形
成したものにこの発明を適用しても同様な効果が得られ
る。In the above embodiments, dielectric ceramic bodies and grain-boundary insulated semiconductor porcelain were explained, but the present invention can be applied to other dielectrics, insulators, semiconductors, and resistors with copper coatings formed thereon. A similar effect can be obtained by applying
また、銅被膜からなる電極を有するセラミツクコンデン
サを製造するに当つて、この発明方法を実施したのち、
セラミツク素体全体に銅被膜を形成したものについては
、対向電極とするため、たとえば円板状のセラミツク素
体を用いたときは、不要な周側面の銅被膜を除去するこ
とはもちろんである。Further, in manufacturing a ceramic capacitor having an electrode made of a copper film, after carrying out the method of this invention,
Since a ceramic body with a copper coating formed on the entire ceramic body is used as a counter electrode, for example, when a disk-shaped ceramic body is used, it is of course necessary to remove unnecessary copper coating on the circumferential side.
Claims (1)
成したのち、乾式メッキ装置の真空槽内にハロゲン化炭
化水素化合物を流入させ、銅被膜とハロゲン化炭化水素
化合物を接触することを特徴とするセラミック素体上の
銅被膜の酸化防止法。 2 乾式メッキ法は真空蒸着法、スパッタリング法、イ
オンプレーティング法のいずれかである特許請求の範囲
第1項記載のセラミック素体上の銅被膜の酸化防止法。 3 ハロゲン化炭化水素化合物はガス状、あるいは霧状
にて真空槽内に流入させられる特許請求の範囲第1項記
載のセラミック素体上の銅被膜の酸化防止法。 4 ハロゲン化炭化水素化合物の流入は外部雰囲気ガス
を真空槽内に流入させると同時に行うものである特許請
求の範囲第1項記載のセラミック素体上の銅被膜の酸化
防止法。 5 ハロゲン化炭化水素化合物としては、トリクレン、
パークレン、クロロフルオロカーボン、クロルベンゼン
、塩化メチル、塩化メチレン、クロロホルム、四塩化炭
素を含むグループから選ばれた少なくとも1種からなる
特許請求の範囲第1項記載のセラミック素体上の銅被膜
の酸化防止法。 6 ハロゲン化炭化水素化合物はこの中に界面活性剤を
溶解させたものである特許請求の範囲第1項記載のセラ
ミック素体上の銅被膜の酸化防止法。 7 ハロゲン化炭化水素化合物はこの中に脂肪酸および
高位脂肪酸エステルを含むグループから選ばれた少なく
とも1種を溶解されたものである特許請求の範囲第1項
記載のセラミック素体上の銅被膜の酸化防止法。 8 ハロゲン化炭化水素化合物はこの中に高分子化合物
が溶解されたものである特許請求の範囲第1項記載のセ
ラミック素体上の銅被膜の酸化防止法。[Claims] 1. After a copper film is formed on a ceramic body by a dry plating method, a halogenated hydrocarbon compound is flowed into a vacuum chamber of a dry plating device, and the copper film and the halogenated hydrocarbon compound are brought into contact with each other. A method for preventing oxidation of a copper coating on a ceramic body. 2. A method for preventing oxidation of a copper coating on a ceramic body according to claim 1, wherein the dry plating method is any one of a vacuum evaporation method, a sputtering method, and an ion plating method. 3. A method for preventing oxidation of a copper coating on a ceramic body according to claim 1, wherein the halogenated hydrocarbon compound is introduced into the vacuum chamber in the form of a gas or mist. 4. A method for preventing oxidation of a copper coating on a ceramic body according to claim 1, wherein the halogenated hydrocarbon compound is introduced at the same time as external atmospheric gas is introduced into the vacuum chamber. 5 Examples of halogenated hydrocarbon compounds include trichlene,
Preventing oxidation of the copper coating on the ceramic body according to claim 1, which is made of at least one member selected from the group including perchloren, chlorofluorocarbon, chlorobenzene, methyl chloride, methylene chloride, chloroform, and carbon tetrachloride. Law. 6. A method for preventing oxidation of a copper coating on a ceramic body according to claim 1, wherein the halogenated hydrocarbon compound has a surfactant dissolved therein. 7. Oxidation of a copper coating on a ceramic body according to claim 1, wherein the halogenated hydrocarbon compound has at least one selected from the group containing fatty acids and higher fatty acid esters dissolved therein. Prevention method. 8. A method for preventing oxidation of a copper coating on a ceramic body according to claim 1, wherein the halogenated hydrocarbon compound has a polymer compound dissolved therein.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14909380A JPS5934157B2 (en) | 1980-10-23 | 1980-10-23 | Method for preventing oxidation of copper coating on ceramic body |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14909380A JPS5934157B2 (en) | 1980-10-23 | 1980-10-23 | Method for preventing oxidation of copper coating on ceramic body |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5771882A JPS5771882A (en) | 1982-05-04 |
| JPS5934157B2 true JPS5934157B2 (en) | 1984-08-20 |
Family
ID=15467537
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14909380A Expired JPS5934157B2 (en) | 1980-10-23 | 1980-10-23 | Method for preventing oxidation of copper coating on ceramic body |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5934157B2 (en) |
-
1980
- 1980-10-23 JP JP14909380A patent/JPS5934157B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5771882A (en) | 1982-05-04 |
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