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JPS5944779B2 - Automatic die bonder push-up collect - Google Patents
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JPS5944779B2 - Automatic die bonder push-up collect - Google Patents

Automatic die bonder push-up collect

Info

Publication number
JPS5944779B2
JPS5944779B2 JP55090115A JP9011580A JPS5944779B2 JP S5944779 B2 JPS5944779 B2 JP S5944779B2 JP 55090115 A JP55090115 A JP 55090115A JP 9011580 A JP9011580 A JP 9011580A JP S5944779 B2 JPS5944779 B2 JP S5944779B2
Authority
JP
Japan
Prior art keywords
push
collet
semiconductor chip
automatic die
die bonder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55090115A
Other languages
Japanese (ja)
Other versions
JPS5715431A (en
Inventor
光治 石橋
透 立川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP55090115A priority Critical patent/JPS5944779B2/en
Publication of JPS5715431A publication Critical patent/JPS5715431A/en
Publication of JPS5944779B2 publication Critical patent/JPS5944779B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7412Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
    • H10P72/7414Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support the auxiliary support including means facilitating the selective separation of some of a plurality of devices from the auxiliary support
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/0711Apparatus therefor
    • H10W72/07141Means for applying energy, e.g. ovens or lasers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • H10W72/07331Connecting techniques
    • H10W72/07337Connecting techniques using a polymer adhesive, e.g. an adhesive based on silicone or epoxy

Landscapes

  • Dicing (AREA)
  • Die Bonding (AREA)

Description

【発明の詳細な説明】 この発明は半導体装置の組立てに使用される自動ダイボ
ンダの突上げコレットに関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a push-up collet for an automatic die bonder used for assembling semiconductor devices.

近年半導体装置の組立て工程における自動化の進展には
著しいものがあるが、その中でも、半導体チップを半導
体装置用フレームに接続する自動ダイボンダは最も重要
な装置の一つである。
In recent years, there has been remarkable progress in automation in the assembly process of semiconductor devices, and among these, automatic die bonders that connect semiconductor chips to semiconductor device frames are one of the most important devices.

従来この種の装置として第1図に示すようなものが用い
られていた。同図においてアーム1に装着されたヘッド
2は、水平方向の往復および上下動が可能であり、その
下面に吸着コレット3を備えている。吸着コレット3は
吸気用の細孔を有しており、真空ホース4を通じて図示
しない真空排気装置に接続されている。ヘッド2の下面
には吸着コレット3と並んで受光器5が設けられている
。ヘッド2の水平動の径路の下方には突上げコレット6
が装着されている。この突上げコレット6は投光器を内
蔵し、その光は該突上げコレット6の先端から上方に投
ぜられる。このような自動ダイボンダによつてダイボン
ディングを行なう場合、第2図に示すようにヘッド2の
水平径路の下方にヒータTを内蔵したプラテン8を置き
、この上に半導体装置用フレーム9を載置する。
Conventionally, an apparatus of this type as shown in FIG. 1 has been used. In the figure, a head 2 mounted on an arm 1 is capable of horizontal reciprocation and vertical movement, and is equipped with a suction collet 3 on its lower surface. The suction collet 3 has pores for suction, and is connected to a vacuum evacuation device (not shown) through a vacuum hose 4. A light receiver 5 is provided on the lower surface of the head 2 alongside the suction collet 3. A push-up collet 6 is located below the horizontal movement path of the head 2.
is installed. This push-up collet 6 has a built-in light projector, and its light is thrown upward from the tip of the push-up collet 6. When performing die bonding using such an automatic die bonder, as shown in FIG. 2, a platen 8 with a built-in heater T is placed below the horizontal path of the head 2, and a semiconductor device frame 9 is placed on top of the platen 8. do.

他方、突上げコレット6の上方には接着シート10に貼
付けられた半導体チップ11が配置される。この半導体
チップ11が貼付けられた接着シート10は水平面内で
の移動が自由であり、図示しない監視カメラによる検出
結果に基づいて選択された良品の半導体チップ11を突
上げコレット6の上に位置合わせする。ここでヘッド2
が水平移動して該半導体チップ11の上方に達すると、
第3図に示すように下から突上げコレット6が上昇して
半導体チップ11を突上げ、接着テープ10から剥がす
。この時同時にヘッド2が下降し、吸着コレット3によ
り半導体チップ11を吸着保持する。半導体チップ11
を保持したヘッド2は先の径路を逆に移動して第4図に
示すように半導体装置用フレーム9の金メッキ等が施さ
れた接続個所に半導体チップ11を圧着する。該フレー
ム9はヒータTによつて加熱されているため、半導体チ
ップ11は該フレーム9に溶着され、ボンディングが完
了する。上述したボンディング工程において、ヘッド2
が半導体チップ11を吸着に向かう往路においては、受
光器5が吸着コレツト3に先行して半導体チツプ11の
上方を通過するが、この時、目的の半導体チツプ11が
突上げコレツト6の上に位置していれば、投光器12の
光は該半導体チツプ12にさえぎられて受光器5に達す
ることはない。しかるに第3図のように半導体チツプ1
1を吸着したヘツド2が、該半導体チツプ11を保持し
たまま半導体装置用フレーム9に向つて戻る復路におい
ては、受光器5は吸着コレット3の後を追う形となるた
めに、吸着コレツト3が半導体チツブ11を正しく吸着
してピツクアツプした場合には、突上げコレツト6の上
方を通過する際に投光器12の光が受光器5によつてキ
ヤツチされる。このように突上げコレツト6に投光器1
2を設け、その光が、ヘツド2の往路においては受光器
5に入射することなく、かつ復路においては入射するこ
とにより、半導体チツプ11が正常にピツクアツプされ
たことが判断されるようになつている。この突上げコレ
ツト6は第5図に示すように先端が細くなつた円筒状の
保持台6aと、その先端に嵌込まれた突上げ部6bとに
よつて構成される。この突上げ部6bは透光性を有し、
その径は先端に向かつて小さくなり、先端に小面積の突
上げ面6cが設けられている。ここで、この突上げ部6
bのうち実際に光を通すのは平たんな突上げ面6cの範
囲のみであり、テーパ部は加工による表面の凹凸が激し
くて事実上光を通さない。従つて、受光器5によつて検
出されるに汁分な光を通すために突上げ平面6cの寸法
として最低0.3〜0.411の直径が必要である。し
かしながら、この突上げ面6cの寸法が大きいと、第6
図に示すように突上げコレツト6が、接着テーブ10を
介して半導体チツプ11を突上げる際に該半導体チツブ
11と広い面積で接触するために、半導体チツプ11が
接着テープ10から剥がれにくくなる。このため該半導
体素子11が吸着コレツトによつてピツクアツプされ損
なつたり、正常な位”置からずれたり傾いたりした状態
でビツクアツプされる欠点が生じた。この発明の目的は
、ピツクアツプミスやチツプ位置ずれ、角度ずれ等をな
くした自動ダイボンダの突上げコレツトを提供すること
にある。
On the other hand, above the push-up collet 6, a semiconductor chip 11 attached to an adhesive sheet 10 is arranged. The adhesive sheet 10 to which the semiconductor chip 11 is attached is free to move in a horizontal plane, and a good semiconductor chip 11 selected based on the detection result by a surveillance camera (not shown) is pushed up and positioned on the collet 6. do. head 2 here
moves horizontally and reaches above the semiconductor chip 11,
As shown in FIG. 3, the push-up collet 6 rises from below to push up the semiconductor chip 11 and peel it off from the adhesive tape 10. At the same time, the head 2 descends and the suction collet 3 suctions and holds the semiconductor chip 11. semiconductor chip 11
The head 2 holding the head 2 moves in the opposite direction along the previous path and presses the semiconductor chip 11 onto the gold-plated connection point of the semiconductor device frame 9, as shown in FIG. Since the frame 9 is heated by the heater T, the semiconductor chip 11 is welded to the frame 9, and bonding is completed. In the bonding process described above, the head 2
On the outward journey toward suctioning the semiconductor chip 11, the photoreceiver 5 passes above the semiconductor chip 11 in advance of the suction collet 3, but at this time, the target semiconductor chip 11 is pushed up and positioned above the collet 6. If so, the light from the light projector 12 will not be blocked by the semiconductor chip 12 and will not reach the light receiver 5. However, as shown in Figure 3, the semiconductor chip 1
When the head 2 that has attracted the semiconductor chip 1 returns to the semiconductor device frame 9 while holding the semiconductor chip 11, the photodetector 5 follows the suction collet 3. When the semiconductor chip 11 is properly attracted and picked up, the light from the light projector 12 is caught by the light receiver 5 when it passes above the push-up collet 6. In this way, attach the projector 1 to the uplift collet 6.
2, and when the light does not enter the light receiver 5 on the outward path of the head 2 and enters the light receiver 5 on the return path, it is determined that the semiconductor chip 11 has been picked up normally. There is. As shown in FIG. 5, this push-up collet 6 is composed of a cylindrical holding base 6a with a tapered tip and a push-up portion 6b fitted into the tip. This raised portion 6b has translucency,
Its diameter becomes smaller toward the tip, and a small-area raised surface 6c is provided at the tip. Here, this raised portion 6
Of the parts b, only the flat raised surface 6c actually allows light to pass through, and the tapered part has a severely uneven surface due to processing and practically does not allow light to pass through. Therefore, in order to pass sufficient light to be detected by the light receiver 5, the diameter of the raised plane 6c is required to be at least 0.3 to 0.411 mm. However, if the dimensions of this thrusting surface 6c are large, the sixth
As shown in the figure, when the push-up collet 6 pushes up the semiconductor chip 11 through the adhesive tape 10, it comes into contact with the semiconductor chip 11 over a wide area, so that the semiconductor chip 11 is difficult to peel off from the adhesive tape 10. As a result, the semiconductor element 11 may fail to be picked up by the suction collet, or may be picked up in a state where it is deviated from its normal position or tilted. To provide a push-up collet for an automatic die bonder that eliminates deviations, angle deviations, etc.

このような目的を達成するために、この発明による自動
ダイボンダの突上げコレツトは、チツプ有無検出用の光
の径路となる部分を半導体チツプを突上げる部分とは別
個に設けたことにより、受光器に感知されるに十分な光
量を確保しつつ、該突上げ面の面積を十分に小さくして
突上げ効果を高めたものである。
In order to achieve this object, the push-up collet of the automatic die bonder according to the present invention has a part that serves as a light path for detecting the presence or absence of a chip, which is separate from a part that pushes up the semiconductor chip. The area of the thrusting surface is made sufficiently small to enhance the thrusting effect while ensuring a sufficient amount of light to be detected by the user.

以下図面を用いてこの発明による自動ダイボンダの突上
げコレツトを詳細に説明する。第7図は、この発明によ
る自動ダイボンダの突上げコレツトの一実施例を示す断
面図である。
The push-up collet of the automatic die bonder according to the present invention will be explained in detail below with reference to the drawings. FIG. 7 is a sectional view showing one embodiment of the push-up collet of the automatic die bonder according to the present invention.

同図において突上げコレツト13は円筒部材13aおよ
びその先端に突出した突上げ部材13bによつて構成さ
れ、該円筒部材13aの内部空間には投光器12を有し
ている。この突上げコレツト13は、第1図に示す突上
げコレツト6と同様に同図に示すような自動ダイボンダ
の一部として使用される。上述した突上げ部材13bは
先端に向かつて細くテーパ加工が施され、その最先端面
は直径0.1m1の微小な突上げ面13cを構成してい
る。この突上げ面13cの近傍のテーパ面から円筒部材
13aの内部空間まで、突上げ部材13bを貫通して細
孔14が突上げ方向に沿つて延在している。以下、上記
構成による自動ダイボンダの突上げコレツトを用いてダ
イボンデイングする場合について詳細に説明する。先ず
、第2図に示すと同様にボンデイングの対象となる半導
体装置用フレーム9と半導体チツプ11とを配置する。
In the figure, the push-up collet 13 is composed of a cylindrical member 13a and a push-up member 13b projecting from the tip thereof, and has a projector 12 in the interior space of the cylindrical member 13a. This push-up collet 13 is used as a part of an automatic die bonder as shown in FIG. 1, similarly to the push-up collet 6 shown in FIG. The above-mentioned push-up member 13b is tapered toward its tip, and its most extreme surface constitutes a minute push-up surface 13c with a diameter of 0.1 m1. A pore 14 extends along the thrusting direction from the tapered surface near the thrusting surface 13c to the internal space of the cylindrical member 13a, passing through the thrusting member 13b. Hereinafter, a case in which die bonding is performed using the push-up collet of the automatic die bonder having the above configuration will be described in detail. First, a semiconductor device frame 9 and a semiconductor chip 11 to be bonded are placed in the same manner as shown in FIG.

ヘツド2が目的の半導体チツブ11まで水平移動すると
、第8図に示すように下から突上げコレツト13が上昇
して半導体チツプ11を突上げ、接着テーブ10から貼
がす。この時、第3図に示すと同様にヘツド2が下降し
、吸着コレツト3の下端に該半導体チツプ11を吸着す
る。次いでヘツド2は半導体チツブ11を吸着保持した
まま半導体装置用フレーム9に向かつて戻り、運んで来
た半導体チツプ11を該半導体装置用フレーム9の所望
個所に溶着させる。この時も、半導体チツブ11が確実
に吸着されかつ搬送されたかの判断は、投光器12の発
する光がヘツド2の往路においては受光器5によつて受
光されずかつ復路においては受光されることによつて行
なわれる。この場合、投光器13から発せられる光は突
上げ部材13bを貫通する細孔14を通して上方に投ぜ
られる。従つて、従来この光を突上げ面から得ていた場
合のように十分な光量を得るために突上げ面を大きくす
る必要がないために、突上げ面13cはその直径が0.
1mmと非常に゛小さく形成されている。この結果、突
上げコレツト13が半導体チツプ11を突上げた時に、
該突上げコレツト13と半導体チツプ11を貼り付けて
いる接着シート10とは極く小さな面積で接触する。従
つて半導体チツプ11と接着シート10との接触面積も
小さくなるため、吸着コレツト3によつて吸引された時
に容易に剥れて該吸着コレツト3に吸着される。このよ
うに突上げコレツトによ.る突上げ効果が増大する結果
、ピツクアツプミスやチツプの位置ずれ、角度ずれ等の
機会が減少する。以上説明したようにこの発明による自
動ダイボンダの突上げコレツトによれば、半導体チツプ
が吸着コレツトによつて正常にピツクアツプされたかを
判断するのに必要なチツプ有無検出用の光を投する径路
として、半導体チツプを突上げる先端部からずらした位
置に細孔を設けたことにより、検出用の光量を減少させ
ることなしに、従来0.3〜0.4mm必要であつた突
上げ面の寸法を0.1mm以下と小さくすることができ
る。
When the head 2 moves horizontally to the target semiconductor chip 11, the push-up collet 13 rises from below to push up the semiconductor chip 11 and attach it from the adhesive tape 10, as shown in FIG. At this time, the head 2 descends in the same way as shown in FIG. 3, and the semiconductor chip 11 is sucked onto the lower end of the suction collet 3. Next, the head 2 moves back toward the semiconductor device frame 9 while holding the semiconductor chip 11 by suction, and welds the carried semiconductor chip 11 to a desired location on the semiconductor device frame 9. At this time as well, it is possible to judge whether the semiconductor chip 11 has been reliably attracted and conveyed because the light emitted by the light projector 12 is not received by the light receiver 5 on the outward path of the head 2, but is received on the return path. It is carried out with In this case, the light emitted from the projector 13 is projected upward through the pore 14 penetrating the thrusting member 13b. Therefore, the diameter of the raised surface 13c is set to 0.0 mm because it is not necessary to make the raised surface large in order to obtain a sufficient amount of light, unlike the conventional case where this light was obtained from the raised surface.
It is formed very small at 1mm. As a result, when the push-up collet 13 pushes up the semiconductor chip 11,
The push-up collet 13 and the adhesive sheet 10 to which the semiconductor chip 11 is attached come into contact with each other over a very small area. Therefore, since the contact area between the semiconductor chip 11 and the adhesive sheet 10 is also small, when it is sucked by the suction collet 3, it is easily peeled off and adsorbed by the suction collet 3. In this way, push up and collect. As a result, the chances of pick-up errors, chip positional deviations, angular deviations, etc. are reduced. As explained above, according to the automatic die bonder push-up collect according to the present invention, as a path for projecting light for detecting the presence or absence of chips necessary for determining whether a semiconductor chip has been normally picked up by the suction collect, By providing a pore at a position offset from the tip of the semiconductor chip, the size of the thrust surface, which conventionally required 0.3 to 0.4 mm, can be reduced to 0 without reducing the amount of light for detection. It can be made as small as .1 mm or less.

従つて、接着テープに貼られた半導体チツプを該接着テ
ーブを介して突上げた時の接触面積が小さくなるため半
導体チツプを突上げて接着テープから剥がす効果が増大
する。この結果、吸着コレツトは容易に半導体チツプを
吸着し、ピツクアツプミスや、チツプ位置ずれ、角度ず
れ等のトラブルを減少させることができる効果を有する
Therefore, when a semiconductor chip attached to an adhesive tape is pushed up through the adhesive tape, the contact area becomes smaller, so that the effect of pushing up the semiconductor chip and peeling it off from the adhesive tape increases. As a result, the suction collet easily adsorbs semiconductor chips and has the effect of reducing problems such as pick-up errors, chip position deviations, and angle deviations.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の自動ダイボンダの一例を示すr視図、第
2図ないし第4図は第1図の要部を示1正面図、第5図
および第6図は従来の自動ダイボンダの突上げコレツト
の一例を示す断面図およびその突上げ動作を示す一部断
面図、第7図および第8図はこの発明による自動ダイボ
ンダの突上げコレツトの一実施例を示す断面図およびそ
の突上げ動作を示す一部断面図である。 11・・・・・・半導体チツプ、12・・・・・・投光
器、13・・・・・・突上げコレツト、13a・・・・
・・円筒部材、13b・・・・・・突上げ部材、13c
・・・・・・突上げ面、14・・・・・・細孔。
Fig. 1 is a perspective view showing an example of a conventional automatic die bonder, Figs. 2 to 4 are front views showing main parts of Fig. 1, and Figs. 5 and 6 are projections of a conventional automatic die bonder. FIGS. 7 and 8 are cross-sectional views showing an example of a lifting collet and a partial sectional view showing its lifting operation; FIGS. FIG. 11... Semiconductor chip, 12... Floodlight, 13... Push-up collector, 13a...
... Cylindrical member, 13b... Push-up member, 13c
... Thrust-up surface, 14... Pore.

Claims (1)

【特許請求の範囲】 1 内部空間に投光器を収容した中空部材と、該中空部
材から外部に突出した突上げ部材と、該突上げ部材の先
端に位置する小面積の突上げ面と、該突上げ面の近傍か
ら該中空部材の内部空間に至る細孔とを備え、該細孔は
該突上げ面が半導体チップを突上げる突上げ方向にほぼ
平行に延在していることを特徴とする自動ダイボンダの
突上げコレット。 2 突上げ面の寸法は0.1mm以下であることを特徴
とする特許請求の範囲第1項記載の自動ダイボンダの突
上げコレット。
[Scope of Claims] 1. A hollow member that accommodates a floodlight in an internal space, a projecting member protruding from the hollow member to the outside, a small-area projecting surface located at the tip of the projecting member, and a projecting surface located at the tip of the projecting member. and a pore extending from the vicinity of the raised surface to the internal space of the hollow member, and the pore is characterized in that the pore extends substantially parallel to the direction in which the raised surface pushes up the semiconductor chip. Push-up collet for automatic die bonder. 2. The push-up collet for an automatic die bonder according to claim 1, wherein the push-up surface has a dimension of 0.1 mm or less.
JP55090115A 1980-06-30 1980-06-30 Automatic die bonder push-up collect Expired JPS5944779B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55090115A JPS5944779B2 (en) 1980-06-30 1980-06-30 Automatic die bonder push-up collect

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55090115A JPS5944779B2 (en) 1980-06-30 1980-06-30 Automatic die bonder push-up collect

Publications (2)

Publication Number Publication Date
JPS5715431A JPS5715431A (en) 1982-01-26
JPS5944779B2 true JPS5944779B2 (en) 1984-11-01

Family

ID=13989508

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55090115A Expired JPS5944779B2 (en) 1980-06-30 1980-06-30 Automatic die bonder push-up collect

Country Status (1)

Country Link
JP (1) JPS5944779B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100346482B1 (en) * 1994-12-03 2002-11-23 앰코 테크놀로지 코리아 주식회사 Ejecting Device of Die Bonding
US6889427B2 (en) * 2002-02-15 2005-05-10 Freescale Semiconductor, Inc. Process for disengaging semiconductor die from an adhesive film

Also Published As

Publication number Publication date
JPS5715431A (en) 1982-01-26

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