JPS5946739B2 - Surface polishing method - Google Patents
Surface polishing methodInfo
- Publication number
- JPS5946739B2 JPS5946739B2 JP56042278A JP4227881A JPS5946739B2 JP S5946739 B2 JPS5946739 B2 JP S5946739B2 JP 56042278 A JP56042278 A JP 56042278A JP 4227881 A JP4227881 A JP 4227881A JP S5946739 B2 JPS5946739 B2 JP S5946739B2
- Authority
- JP
- Japan
- Prior art keywords
- polisher
- workpiece
- processing
- grains
- particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Description
【発明の詳細な説明】 本発明は新規なる精密表面研摩法に関するものである。[Detailed description of the invention] The present invention relates to a novel precision surface polishing method.
工作物の表面加工には、付刃バイトや回転切刃等を用い
る切削加工、と石等を用いる研削加工。For surface processing of workpieces, cutting using a tool with a cutting edge or rotating cutting blade, etc., and grinding using a stone, etc.
0遊離の微細と粒をラップと工作物の間に注入しラップ
に圧力を加えつつラップと工作物に交差運動を与えるラ
ツピ/グ等の所謂機械加工法が古くより知られ、またと
粒などを工作物表面に噴射するプラステイングシヨット
ピーニ/グ、或はと粒を5超音波を利用し工作物表面に
激しく衝突させる超音波加工等の技術も逐次開発されて
きた。0 So-called machining methods such as rappi/gu have been known for a long time, in which loose fine particles and grains are injected between the lap and the workpiece, applying pressure to the lap and causing intersecting motion between the lap and the workpiece. Techniques such as plasting, which sprays abrasive particles onto the surface of a workpiece, and ultrasonic machining, which uses ultrasonic waves to violently impinge on the surface of a workpiece, have also been developed.
しカルながら、これらは何れも大きな応力場により工作
物材料内に先住する転位やクラックの活性化を併なつた
破壊による加工、塑性変形に基づく加工であるため、塑
性変形の現象精度が仕上面精度となり、より高性能高信
頼性の機器を生み出すためにはより高精度の加工技術の
開発が望まれている。ところで、全ての材料は原子の結
合により構成されているのであるから、加工における破
壊の単位を原子オーダーのものとすることができれば、
仕上面精度も原子オーダーにまで近づけうる筈である。
かかる原子オーダーでの除去加工法として電解研摩、化
学研摩などの電気化学的加工法、或は電子ビーム加工、
イオ/ビーム加工法等が鋭意研0究されてきた。前者に
おいては原子の結合を分離するに要するエネルギーが電
気化学的あるいは化学的に与えられ、また後者において
は電子の運動エネルギーが熱エネルギーに変換されて材
料原子の溶融、蒸発が行われるとか、或はイオノの弾性
05衝突により原子がはじき出されるスパッタ現象が利
用されているが、何れにしても原子の分離に必要なエネ
ルギーが何らかの方法により付与され。共に原子オーダ
ーの単位での加工を原理的に行いうる物理現象を利用し
ているものと言うことができる。しかしながら、これら
の方法の実際の加工においては、それ程よい精度は実現
されていない。電気化学的加工法では材料の不均一性や
内部の微視的欠陥の分布等のため選択的加工がなされる
のがその原因と思われるし、又一方物理的加工では供給
エネルギーが極めて大きく、溶融現象が優先し、また工
具としての電子やイオンが材料表面下に侵入するため加
工面あるいは内部に熱的変質あるいは多数の点欠陥を発
生し、加工表面層の物性が損なわれることが原因してい
るものであろう。従つて、加工表面層の物性を損うこと
なく該表面原子を選択的に除去しようとすれば、可久的
に微小な、但し電子やイオンよりは大きな工具で機械的
に加工エネルギーを供給するのがむしろ有利であること
が伺い知れる。勿論従来の切削、研削ラツピング等の機
械的加工法では工具切刃の及ぼす応力場の範囲が大にす
ぎるため、材料内に先在する転位やクラツクの振舞いに
よる塑性変形を伴つた破壊となりやはり加工表面層の物
性損傷はまぬがれない。そこで、電子やイオンに比し十
分に大きく、ラツピング等の工具切刃に比し十分に小さ
な工具(例えば微粒と粒)を用い、材料の欠陥分布間隔
の理想結晶領域に機械的にエネルギーを与えることがで
きれば、欠陥に関与しない原子オーダーに近い加工が可
能になるであろうことが考えられる。かかる考えに基い
て空気ど微粒子の混合流を回転円盤により加速し被加工
物に衝突させる加工法、あるいは微粒粉末をアルカリ性
液に懸濁した加工液中で加工物表面に接近して軸受状態
を利用する回転球による加工法が提案された。しかしな
がらこれらの方法によつてもなお精度は充分なものとは
いえず、より加工精度の向上した超精密表面研摩法が依
然要望されている。液体ホーニングにおいては、と粒を
液体に懸濁させた加工液を圧縮空気の力をかりて40〜
50の傾斜角で工作物表面に噴射させているが、微粉末
と粒を懸濁した加工液を工作物表面に作用させ加工を行
う場合、工作物材料の転位欠陥を避けて破壊を起すには
、と粒ができるだけ工作物の加工表面に対し平行に近い
角度で作用することが望ましい。However, these processes are based on destruction and plastic deformation, which involve the activation of dislocations and cracks existing in the workpiece material due to a large stress field, so the accuracy of the plastic deformation phenomenon may be affected by the finished surface. In order to produce higher-performance, more reliable equipment, it is desired to develop higher-precision processing technology. By the way, all materials are composed of atomic bonds, so if the unit of destruction during processing could be made to the atomic order,
The finished surface accuracy should be able to approach the atomic order.
As such removal processing methods on the atomic order, electrochemical processing methods such as electrolytic polishing and chemical polishing, or electron beam processing,
Io/beam processing methods have been intensively researched. In the former, the energy required to separate the bonds between atoms is provided electrochemically or chemically, and in the latter, the kinetic energy of electrons is converted into thermal energy to melt or evaporate the material atoms. The method uses the sputtering phenomenon in which atoms are ejected by the elastic 05 collision of ions, but in any case, the energy necessary to separate the atoms is applied by some method. Both methods can be said to utilize physical phenomena that can, in principle, be processed in units of atomic order. However, in actual processing using these methods, such good accuracy has not been achieved. This seems to be due to the fact that electrochemical processing requires selective processing due to the non-uniformity of the material and the distribution of internal microscopic defects.On the other hand, physical processing requires extremely large amounts of supplied energy. The melting phenomenon takes precedence, and electrons and ions from the tool penetrate beneath the surface of the material, resulting in thermal alteration or numerous point defects on the machined surface or inside, which impairs the physical properties of the machined surface layer. It's probably something that's happening. Therefore, in order to selectively remove surface atoms without damaging the physical properties of the processed surface layer, it is necessary to mechanically supply processing energy using a permanently minute tool, but larger than electrons or ions. It can be seen that this is rather advantageous. Of course, in conventional mechanical processing methods such as cutting, grinding and wrapping, the range of stress field exerted by the tool cutting edge is too large, resulting in fracture accompanied by plastic deformation due to the behavior of dislocations and cracks that already exist within the material, resulting in processing problems. Damage to the physical properties of the surface layer cannot be avoided. Therefore, using tools (e.g., fine grains) that are sufficiently large compared to electrons and ions and sufficiently small compared to cutting edges of tools such as wrapping, mechanical energy is applied to the ideal crystalline region of the defect distribution interval of the material. If possible, it is thought that processing close to the atomic order that does not involve defects would become possible. Based on this idea, a processing method in which a mixed flow of air and other fine particles is accelerated by a rotating disk and collides with the workpiece, or a processing method in which fine powder particles are suspended in an alkaline liquid and approaches the workpiece surface to check the bearing condition. A machining method using a rotating ball was proposed. However, even with these methods, the accuracy cannot be said to be sufficient, and there is still a need for an ultra-precision surface polishing method with improved processing accuracy. In liquid honing, a machining fluid containing carcasses suspended in a liquid is heated by compressed air to
The spray is applied to the workpiece surface at an angle of inclination of 50°, but when machining is performed by applying a machining liquid containing suspended fine powder and grains to the workpiece surface, it is difficult to avoid dislocation defects in the workpiece material and cause fracture. It is desirable that the grains act at an angle as close to parallel to the machined surface of the workpiece as possible.
また加工能率を大にするためには微粒粉末と粒にできる
だけ大きな運動エネルギーを与え、工作物表面に作用さ
せることの必要性は勿論のことである。そこで工作物の
加工表面と極めて狭い間隔で平行に設けられた対向面と
の間に微粒粉末と粒の低粘度流体懸濁液である加工液を
高速度で通過せしめる方法が当然に考慮せられる。しか
しながら粉末と粒の加速手段に流体の流れを用いる場合
、その加工単位(と粒)が微小であればある程その流動
状態に特別な考慮をはられねばならない。即ち上記の如
く流体の流路巾が決つているときには、流体速度が大に
つれ流動状態が層流から乱流へど移行する。層流では流
れの状態が流れ方向に一様で、流体中のと粒は壁面に垂
直方向へは運動しないが、乱流では流れが乱れていてと
粒の運動も一様ではない。従つて、と粒を工作物表面.
にできるだけ平行に近い角度で作用させるためには、流
体の流動状態は層流であることが望ましく加工液の流速
に自ら一定の制限があり、と粒にできるだけ大きな運動
エネルギーを付与すること、ひいては加工能率を大なら
しめることの命題とあ・い拮抗することになる。微粒粉
末と粒を懸濁させた流体(加工液)を工作物加工面と狭
い間隔で平行的に設けられた対向面との間に層流状態で
流動させ、懸濁と粒により表面仕上又は研摩を行わしめ
る方法は、従つて他の何らかの手段により乱流を生ぜし
めることなく該と粒自身に大きな運動エネルギ戸を与え
、或いはと粒の制御を行わぬ限りにおいては、加工能率
の点よりして工業的に有利な精密表面研摩法たり得ぬこ
とが容易に理解されるのである。In addition, in order to increase machining efficiency, it is of course necessary to give as much kinetic energy as possible to the fine powder and grains and have it act on the surface of the workpiece. Therefore, it is natural to consider a method in which a machining fluid, which is a low-viscosity fluid suspension of fine powder and grains, is passed at high speed between the machining surface of the workpiece and an opposing surface provided in parallel with an extremely narrow interval. . However, when using a fluid flow as a means for accelerating powder and grains, the smaller the processing unit (and grain), the more special consideration must be given to the flow state. That is, when the width of the fluid flow path is determined as described above, as the fluid velocity increases, the flow state changes from laminar flow to turbulent flow. In laminar flow, the flow condition is uniform in the flow direction, and particles in the fluid do not move in the direction perpendicular to the wall surface, but in turbulent flow, the flow is turbulent and the movement of particles is not uniform. Therefore, the grains are attached to the workpiece surface.
In order to make the particles act at an angle as close to parallel as possible, it is desirable that the flow state of the fluid be laminar, and that the flow rate of the machining fluid has its own certain limits, and that it imparts as much kinetic energy as possible to the grains. This almost conflicts with the proposition of increasing machining efficiency. A fluid (processing fluid) in which fine powder and particles are suspended is caused to flow in a laminar flow state between the workpiece processing surface and an opposing surface provided in parallel with a narrow interval, and the suspension and particles improve the surface finish or finish. Therefore, the method of carrying out the polishing is not suitable in terms of processing efficiency, unless some other means is used to impart large kinetic energy to the grains themselves without creating turbulence, or to control the grains. It is easily understood that this method cannot be used as an industrially advantageous precision surface polishing method.
一般に、砂粒とかコロイド粒子を懸濁した液中に2本の
電極を挿入しこの間に直流電圧をかけると粒子は移動し
、粒子側が負にまた溶液側が正に荷電されているときは
、粒子が陽極へと移動し、この現象を電気泳動と呼ぶこ
と、またこのときの粒子の泳動速度vは式v=εHE/
μ(式中、ε,μは溶媒の誘導率、粘性率;hは粒子の
ゼータ電位;Eは電場の大きさ)で与えられることは衆
知である。ところで研削工具のと粒として広く用いられ
ている例えばSiO2は、低粘性流体の代表的な水の中
では負に帯電する。これは、SiO2の酸性度が非常に
大きくかつ水の塩基性度も大きいためである。非水系溶
媒の代表例エチルアルコール中においても、アルコール
の塩基性度は水より小さいが、SiO2の酸性度が大き
いため、やはり負に帯電している。またAe2O3の場
合、酸性度はそれ程大きくないので、その面からはアル
コール中で負に帯電するとはいいがたいが、誘電率の面
から(コロイド粒子と溶媒の誘電率が異なるとき、誘電
率の大きい方が正に帯電)アルコールの方がAe2O3
よりはるかに誘電率が大であり、実際に試験してみても
アルコール中でAe2O3は負に帯電していることが判
る。このようにと粒の荷電状態を調べてみると、水中で
も排水系液体中でも通常加工液と呼ばれる流体中でと粒
は一般に負に帯電していることが判つた。従つて流体中
に懸濁せしめられた微粒粉末と粒は電気泳動的には陽極
側へひき付けられ移動する性質をもつ。また平行板コン
デンサーに電荷を蓄えると極板間の空間に電場が生じる
こと、磁場の変化により電場の誘導されることは物理学
の初歩的知識である。そこで加工面との間に僅かなすき
間を有する対向面があるとき、その間にと粒の懸濁され
た加工液を通じてそこへ電場を働らかせるなら、陽極側
となる加工面、対向面何れかの面へと粒が引付けられる
電気泳動現象が生じ、該空間内の何れかの面側において
と粒密度力吠となり、ひいては加工面に作用すると粒数
が大となり加工能率の向上へとつながることになる。か
くして本発明者らは、微粒粉末と粒が流体に懸濁された
加工液を、加工面とそれに極めて接近しかつ平行に配置
された対向面との間に層流状態で通過させこれにより工
作物の表面を仕上又は研摩する技術と、液中に分散して
いる粒子表面に電気二重層力拵在して該コロイド粒子系
に電場を与えた時、粒子が表面電荷により前記の場より
力をうけ電気泳動する現象を利用し、と粒を加工面ある
いは対向面に集中させ加工面に作用すると粒数を制御し
て加工能率を向上させる技術とを組合せることにより本
発明を完成するに至つた。即ち本発明に従えば、研摩材
微粒子の流体懸濁液中に浮力により加工物ホルダーを浮
かべること、該ホルダーから間隔をおいてポリシャを設
けること、加工物ホルダーに取付けた加工物の加工面と
ポリシヤのポリシヤ面とを平行に保持すること、加工物
ホルダーとポリシヤとに互いに逆方向の回転運動を付与
して加工面とポリシヤ面の作る空間内に前記懸濁液の層
流を形成すること、前記懸濁液中に加工物以外の場所に
設けた電極とポリシヤとに直流電圧を印加すること、及
び研摩材微粒子を電気泳動によりポリシヤ面上に引付け
て加工物表面に作用する研摩材微粒子数を制御すること
を包含してなる超精密表面研摩法が提供せられる。狭い
間隔で平行に保持される加工物表面と対向面との間にと
粒懸濁液の加工液を層流状態を作らしめるにあたり、本
発明では、研摩材微粒子(と粒)の流体懸濁液、すなわ
ち加工液中で、充分に接近し且つ等距離間隔を保持され
た加T物表面とポリシヤ面(対向面)とに互に逆方向の
回転運動を付与する手段が用いられる。平行に保持され
た両面の間に加工液の層流を作ることは可能性としては
勿論種々の別法も考慮せられるところであるが、加工液
のと粒の比重、分散密度、分散密度、溶媒の粘性率等、
あるいは加工物、ポリシヤの材質、寸法等多くの因子が
関係し。これらの面の間に外部より加工液を注入して有
効な層流を作り出すことはかなり複雑である。これに反
し、と粒の懸濁液中で平行に保持された加工面とポリシ
ヤ面とを例えば互いに別々の回転軸により相反する方向
へ回転させてそれらの面の間にと粒懸濁液の層流状態を
作り出すことは、加工面と対向面間の距離の調節、回転
面の速度調節が容易である点より極めて有効かつ容易な
方法である。加工物の加工面と対向ポリシヤ面の間の間
隔は、少tくとも加・工液のと粒が通過しうるようと粒
径より大でなければならないが、加工能率等の点よりす
れば可能な限り狭いことが望ましく、加工物、と粒の種
類および濃度、懸濁用流体、所望の加工効果、および後
述の電気泳動のための電場の強さ等を考慮し・簡単な試
験的操作でそれぞれの場合に応じ適宜最適範囲に選択せ
られる。その目的には加工面とポリシヤ面の間隔を例え
ば回転軸の移動により自由に調節可能となしうる配慮が
好ましい。本発明の好ましい一実施態様に従えば、加工
液中で狭い間・隔に平行に保持された加工面とポリシヤ
面とがそれぞれの回転軸により、最も好ましくは偏心回
転軸群により互いに逆方向に回転せしめられ、これら回
転軸の何れかを移動させることに2より加工面とポリシ
ヤ面の間の間隔が調整されて、その間にノ有効な加工液
層流が作られる。加工面とポリシヤ面の回転速度は加工
物、加工液により適宜選択せられる。このように加工液
中で互いに狭い間隔で平行に保持された加工面とポリシ
ャ面とに逆方向の回転運動が与えられ、その間に加工液
の有効な層流が形成せられると、加工液中の懸濁と粒に
より加工面は連続的に研摩作用を受け、加工時間に比例
し加工量は増大してゆく(添付第2〜5図参照)。Generally, when two electrodes are inserted into a liquid in which sand grains or colloidal particles are suspended, and a DC voltage is applied between them, the particles move.When the particle side is negatively charged and the solution side is positively charged, the particles move. This phenomenon is called electrophoresis, and the migration speed v of the particles at this time is expressed by the formula v=εHE/
It is well known that it is given by μ (where ε and μ are the dielectric constant and viscosity of the solvent; h is the zeta potential of the particles; and E is the magnitude of the electric field). By the way, SiO2, for example, which is widely used as abrasive grains for grinding tools, is negatively charged in water, which is a typical low-viscosity fluid. This is because the acidity of SiO2 is very high and the basicity of water is also high. Even in ethyl alcohol, which is a typical example of a non-aqueous solvent, the basicity of alcohol is lower than that of water, but since the acidity of SiO2 is high, it is also negatively charged. In addition, in the case of Ae2O3, the acidity is not so high, so from that point of view it is difficult to say that it will be negatively charged in alcohol. The larger one is positively charged) The alcohol is Ae2O3
The dielectric constant is much higher than that of Ae2O3, and actual tests show that Ae2O3 is negatively charged in alcohol. When we investigated the charging state of the particles in this way, we found that the particles are generally negatively charged in water, drainage liquid, and a fluid called machining fluid. Therefore, the fine powder and grains suspended in the fluid have the property of being electrophoretically attracted to and moving toward the anode. Furthermore, it is elementary knowledge in physics that when electric charge is stored in a parallel plate capacitor, an electric field is generated in the space between the plates, and that an electric field is induced by changes in the magnetic field. Therefore, if there is an opposing surface with a slight gap between it and the processed surface, and if an electric field is applied there through the processing liquid in which particles are suspended, either the processed surface or the opposing surface will become the anode side. An electrophoretic phenomenon occurs in which grains are attracted to the surface of the space, and the grain density increases on either side of the space, and when it acts on the machined surface, the number of grains increases, leading to improved machining efficiency. It turns out. Thus, the present inventors passed a machining liquid in which fine powder and grains were suspended in a fluid in a laminar flow state between a machining surface and an opposing surface disposed very close to and parallel to the machining surface, thereby machining. A technique for finishing or polishing the surface of an object, and when applying an electric field to the colloidal particle system by applying an electric double layer force to the surface of particles dispersed in a liquid, the particles generate a force from the field due to the surface charge. The present invention has been completed by utilizing the phenomenon of electrophoresis caused by electrophoresis, and combining this with technology that concentrates particles on the processed surface or the opposing surface and controls the number of particles when acting on the processed surface to improve processing efficiency. I've reached it. That is, according to the present invention, a workpiece holder is floated by buoyancy in a fluid suspension of fine abrasive particles, a polisher is provided at a distance from the holder, and the machined surface of the workpiece attached to the workpiece holder is Holding the polisher surface parallel to the polisher, and applying rotational motion in opposite directions to the workpiece holder and the polisher to form a laminar flow of the suspension in the space created by the processed surface and the polisher surface. , applying a DC voltage to an electrode and a polisher provided in the suspension at a location other than the workpiece; and an abrasive that acts on the surface of the workpiece by attracting abrasive fine particles onto the polisher surface by electrophoresis. An ultra-precision surface polishing method is provided that includes controlling the number of particulates. In order to create a laminar flow state for the processing liquid of the particle suspension between the workpiece surface and the opposing surface that are held in parallel with a narrow interval, the present invention uses a fluid suspension of the abrasive fine particles (and grains). Means is used to impart rotational motion in opposite directions to the surface of the workpiece and the polisher surface (opposing surface), which are sufficiently close to each other and maintained at equal distances in the liquid, that is, the machining fluid. It is of course possible to create a laminar flow of the machining fluid between the two surfaces held in parallel, and various other methods can be considered, but the The viscosity of
Or, many factors such as the workpiece, polisher material, dimensions, etc. are involved. Externally injecting machining fluid between these surfaces to create effective laminar flow is fairly complex. On the other hand, by rotating the machined surface and the polishing surface, which are held parallel to each other in a suspension of grains, in opposite directions using separate rotating shafts, Creating a laminar flow state is an extremely effective and easy method since it is easy to adjust the distance between the processing surface and the opposing surface and the speed of the rotating surface. The distance between the machined surface of the workpiece and the opposing polisher surface must be at least t larger than the particle size so that the particles of the processing fluid can pass through, but from the viewpoint of processing efficiency, etc. It is desirable that it be as narrow as possible, taking into account the type and concentration of the processed product, the carcass grains, the suspension fluid, the desired processing effect, and the strength of the electric field for electrophoresis, which will be described later.・Simple experimental operation The optimum range can be selected depending on each case. For this purpose, it is preferable to make the distance between the processed surface and the polished surface freely adjustable by, for example, moving the rotating shaft. According to a preferred embodiment of the present invention, the machined surface and the polisher surface, which are held parallel to each other with a narrow gap in the processing fluid, are rotated in opposite directions by their respective rotating shafts, most preferably by a group of eccentric rotating shafts. By rotating one of these rotation axes, the distance between the machining surface and the polisher surface is adjusted by 2, and an effective laminar flow of machining liquid is created therebetween. The rotational speeds of the processed surface and the polisher surface are appropriately selected depending on the workpiece and processing fluid. When the machining surface and the polisher surface, which are held parallel to each other at a narrow interval in the machining fluid, are given rotational motion in opposite directions, and an effective laminar flow of the machining fluid is formed between them, The processed surface is continuously subjected to an abrasive action due to the suspension and particles, and the processed amount increases in proportion to the processing time (see attached Figures 2 to 5).
既に述べた如く、この層流加工液による研摩では液の流
速をそれ以上増大させることは乱流を生じさせることに
なり不可であるため、本発明方法においては次にこの加
工面と対向ポリシャ面との間の層流に電場を付与し、流
体内微粒子を電気泳動的に加工物表面あるいはポリシヤ
面側に引付け加工物表面に作用する研摩材微粒子数を増
大させ、これにより加工能率の著しい増大をはかるもの
である。液体中の分散粒子は一般に電荷を有し、それが
粒子半径、溶媒誘電率ならびにゼータ電位に比例するこ
と、および一様の電場内にある電荷をもつ粒子が存在す
ると該粒子には電場の強さならびに電荷に正比例した静
電気力が作用することはよく知られていることである。As already mentioned, in polishing using this laminar flow machining fluid, it is impossible to further increase the flow velocity of the fluid because it will cause turbulence, so in the method of the present invention, next, this machining surface and the opposing polisher surface are An electric field is applied to the laminar flow between the fluid and the fine particles in the fluid are electrophoretically attracted to the workpiece surface or polisher surface side, increasing the number of abrasive fine particles acting on the workpiece surface, thereby significantly improving machining efficiency. It is intended to increase the number of people. Dispersed particles in a liquid generally have an electric charge that is proportional to the particle radius, the solvent permittivity, and the zeta potential, and that the presence of charged particles in a uniform electric field causes the particles to have an electric charge that is proportional to the electric field strength. It is well known that there is an electrostatic force that is directly proportional to the force and charge.
今ある一定のすき間hで加工面と対向面が平行に保持さ
れ、負に帯電したと粒がその間を加工面と平行に移動せ
しめられ、加工面が正、対向面が負に帯電するよう直流
電圧vが印加されるものとする。すると加工面と対向面
の間にはE=VAなる電場が生じるので、と粒には静電
気的に加工面の方向への力が作用し、それによりVEの
運動速度を生じる。またと粒には重力が作用し−Vaの
運動速度も生じるので、加工面への垂直方向には結局こ
のVEとVaの合力としての運動速度Vyが与えられる
ことになる。他方と粒は流体と同速度でもつて加工面に
対し平行に移動しようとの力が働いているからVxなる
横方向への運動速度も与えられ、加工面に対すると粒の
相対速度vはにより表されることが判る。If the machined surface and the opposing surface are held parallel with a certain gap h, and the particles are negatively charged, they will be moved parallel to the machined surface between them, and a direct current will be applied so that the machined surface is positively charged and the opposing surface is negatively charged. Assume that a voltage v is applied. Then, an electric field E=VA is generated between the machined surface and the opposing surface, so that an electrostatic force acts on the grain in the direction of the machined surface, thereby producing a motion velocity of VE. In addition, since gravity acts on the grain and a motion velocity of -Va is also generated, a motion velocity Vy as the resultant force of this VE and Va is ultimately given in the direction perpendicular to the machined surface. Since a force is acting on the other grain to move parallel to the machined surface at the same speed as the fluid, a lateral motion velocity of Vx is also given, and the relative velocity v of the grain with respect to the machined surface is expressed as It turns out that it will be done.
すなわち平行に保持された加工面と対向面の間にと粒を
含む加工液が層流状態で通過せしめられ、加工面と対向
面の間に直流寞流が印加され電場が作られるとき、Vx
は層流状態の保持で一定であり、Vaは加工液により一
定しているから、と粒に対しては結局VEに比例した加
工面に対しての相対速度が与えられることは明らかであ
る。電場が強くなればなる程静電気的に加工面の方向へ
と粒が引寄せられる力、すなわちと粒のVE運動速度が
大となり、電場は又加工面と対向面間の距離が一定して
おれば印加電圧に比例することからして、印加電圧の制
御により電気泳動すると粒の加工面に対しての相対速度
を制御なしうることが容易に理解されよう。また加工量
がと粒の加工面に接触するときの運動エネルギーに比例
するものと考えれば、加工量も又電場の強さ、すなわち
電圧の制御で制御可能であることが理解されよう。次に
と粒が対向面に集中する場合、すなわち対向面が正、加
工面または他の電極が負の電荷をもつように距離hをお
いて直流電圧vをかける場合について考察する。この場
合には加工面または他の電極と対向面の間にE=v/h
なる電場が生じ、これによつてと粒は対向面へと引張ら
れる。こうして対向面上に集中したと粒は対向面との摩
擦力により対向面と共に運動して加工面へ作用を及ぼす
ことになるが、電場の強さが大となり対向面へ集中する
と粒数が増大すれば増大する程加工面へ作用すると粒密
度が大となることが判るし、また対向面とと粒、と粒同
志間の結合力がこの静電気力と重力とにより左右される
こと、それらの結合はと粒が加工面と接触しそれから力
を受ければ簡単に解けるものであり、と粒が加工面に与
えるエネルギーはこの結合力に比例していることを考慮
すれば、電場すなわち電圧を大にし静電気力を増大せし
めれはせしめるだけ、加工面に与えると粒のエネルギー
も大になること及び電場の強さの制御力劾旺量あるいは
表面処理効果の制御につながるものであることが容易に
理解されよう。先に述べた如く一般にと粒の流体懸濁液
(加工液)中において、流体が水系、非水系を問わず、
と粒は負に帯電されている。In other words, when a machining fluid containing particles is passed in a laminar flow state between the machined surface and the opposing surface that are held parallel, and a DC current is applied between the machined surface and the opposing surface to create an electric field, Vx
is constant when the laminar flow state is maintained, and Va is constant due to the machining fluid, so it is clear that the grains are ultimately given a relative velocity with respect to the machined surface that is proportional to VE. As the electric field becomes stronger, the force that electrostatically attracts the grains toward the machined surface, that is, the VE motion velocity of the grains, increases. Since it is proportional to the applied voltage, it is easy to understand that when electrophoresis is performed by controlling the applied voltage, the relative speed of the grains to the machined surface can be controlled. Furthermore, if we consider that the amount of processing is proportional to the kinetic energy when the grain comes into contact with the processed surface, it will be understood that the amount of processing can also be controlled by controlling the strength of the electric field, that is, the voltage. Next, we will consider the case where the particles are concentrated on the opposing surface, that is, the case where a DC voltage v is applied at a distance h such that the opposing surface has a positive charge and the processed surface or other electrode has a negative charge. In this case, E=v/h between the processing surface or other electrode and the opposing surface.
An electric field is created, which pulls the grains towards the opposite surface. When the particles are concentrated on the opposing surface in this way, they move together with the opposing surface due to the frictional force with the opposing surface and act on the machined surface, but as the electric field becomes stronger and concentrates on the opposing surface, the number of particles increases. It can be seen that the grain density increases as it acts on the machined surface as it increases, and that the bonding force between opposing surfaces and grains, and between grains is influenced by this electrostatic force and gravity. Bonds are easily broken when the grains come in contact with the machined surface and receive force from it, and considering that the energy given by the grains to the machined surface is proportional to this bonding force, it is possible to increase the electric field, or voltage. The more the electrostatic force is increased, the more the energy of the particles applied to the processed surface increases, and the ability to control the strength of the electric field is easily linked to controlling the amount or surface treatment effect. be understood. As mentioned above, in general, in a fluid suspension (processing fluid) of carcasses, regardless of whether the fluid is aqueous or non-aqueous,
and the grains are negatively charged.
従つて電場の付与によりと粒は電気泳動的に陽極側へと
引かれ、該陽極面上に密に集中する傾向がある。しかし
ながら水を加工液に用いる場合にはと粒表面の電離度が
大で、と粒はイオン化して電解質溶液となり電極反応で
陽極面に吸着される点に考慮をはられねばならない。水
を加工液溶媒とする場合にはと粒表面は電解度が大きい
ので、,加工試料に直接電圧を印加すると、加工試料面
上で電極反応が起こり、イオン化していると粒は電気的
に中和して力旺面上?吸着してしまい加工をさまたげる
ことになる。Therefore, by application of an electric field, the grains are electrophoretically drawn towards the anode and tend to concentrate densely on the anode surface. However, when water is used as the processing fluid, consideration must be given to the fact that the surface of the grains has a high degree of ionization, and the grains are ionized and become an electrolyte solution, which is adsorbed to the anode surface in an electrode reaction. When water is used as a processing liquid solvent, the surface of grains has a high electrolyte, so when a voltage is applied directly to the processed sample, an electrode reaction occurs on the surface of the processed sample, and when ionized, the grains become electrically Neutralize and improve your strength? This will cause it to stick and interfere with machining.
そこでこの場合には加工物以外に電極をおきこの電極と
ポリシャの間に直流電圧を印加することが望ましい。本
発明者らは水を加工液溶媒として用いる場合の本発明方
法が第1図に示される如き装置を用い、かつポリシャ側
を陽極とする電場の付与により有効に実施可能であるこ
とを確認した。第1図に示された装置は非導電性材料で
作られ、底面中央に軸開口の設けられた加工液を収容す
るための円筒形容器1;容器内底部に収容され平滑な上
表面と容器内側壁に沿つてすベリ運動するための平滑な
外周側面を有する円盤状の金属製ポリシヤ2;ポリシヤ
に回転運動を与えるためその底面中心に接合され容器底
面の軸開口を貫通し下方へと垂直に伸びる金属製ポリシ
ャ回転軸3;その底面で加工物5を加工面がポリシャ面
と平行になるよう保持することができ、浮力により加工
液4中に浮かべられるプラスチツク製試料ホルダー6;
試料ホルダーをポリシヤと逆方向に回転させるためホル
ダーの中心から上方に垂直に伸び且つポリシヤ回転軸か
ら偏心位置に設けられたホルダー回転軸7リホルダ一回
転軸と組合わされ加工面とポリシヤ面の間隔を調節する
ため該軸を上下に移動せしめるための手段(図示なし)
;加工液中に加工物以外の場所にポリシヤに対向しても
うけられる電極8;ポリシヤ回転軸3と電極8に直流電
源10より電圧を印加するための手段(電源10;ブラ
シ9;電圧計11;電流計12)からなる。Therefore, in this case, it is desirable to provide an electrode other than the workpiece and apply a DC voltage between the electrode and the polisher. The present inventors have confirmed that the method of the present invention when water is used as a processing fluid solvent can be effectively carried out by using the apparatus shown in FIG. 1 and by applying an electric field with the polisher side as the anode. . The apparatus shown in FIG. 1 is a cylindrical container 1 for containing a machining fluid made of a non-conductive material and having an axial opening in the center of the bottom; A disk-shaped metal polisher 2 with a smooth outer circumferential side surface for vertical movement along the inner wall; a metal polisher 2 is joined at the center of the bottom surface to give rotational movement to the polisher, and passes through an axial opening in the bottom of the container and vertically downward. a metal polisher rotating shaft 3 extending from the bottom surface of the shaft to which the workpiece 5 can be held so that the surface to be processed is parallel to the polisher surface, and a plastic sample holder 6 which is floated in the processing liquid 4 by buoyancy;
In order to rotate the sample holder in the opposite direction to the polisher, the holder rotation shaft 7 extends vertically upward from the center of the holder and is located eccentrically from the polisher rotation axis. Means for moving the shaft up and down for adjustment (not shown)
; Electrode 8 provided in the machining liquid at a location other than the workpiece, facing the polisher; Means for applying voltage from a DC power supply 10 to the polisher rotating shaft 3 and the electrode 8 (power supply 10; brush 9; voltmeter 11); ; consists of an ammeter 12).
伺この装置を用いる本発明方法の実施においては加工物
が試料ホルダーの底面にその加工面がポリシヤ面と平行
になる様に保持され、試料ホルダーの回転軸が加工面と
ポリシヤ面の間に適当な間隔が保たれるよう下方へと移
動され、加工液が容器に入れられたあと、試料ホルダー
回転軸とポリシャ回転軸が逆方向へと回転運動せしめら
れて、加工面とポリシヤ面の間に加工液の所望の層流が
作られてからポリシヤ面が陽極となるようポリシャと電
極とに直流電圧が印加せられるのである。本発明方法の
効果を示すための下記具体的実施例においては黄銅製の
外径80mmの円盤形ポリシャ、アクリル製試料ホルダ
ー、上下回転軸の偏心距離44mm1黄銅製電極の上記
装置を用い、試料ホルダー回転速度300rpm、ポリ
シャ回転速度100rpmv電圧0〜500V1すき間
10〜30μmの加工条件で、Si・単結晶ウエハ20
Y20×0.8ノブ
關の試料でAe2O3滝2000と粒でラツピング仕上
の前加工したものの(001)面および(】1】)面を
SiO2およびAe2O3の各種濃度水懸濁液を加工液
として加工処理した。In carrying out the method of the present invention using this device, the workpiece is held on the bottom of the sample holder so that its machined surface is parallel to the polisher surface, and the rotation axis of the sample holder is placed between the machined surface and the polisher surface. After the sample holder rotation axis and the polisher rotation axis are rotated in opposite directions, the sample holder rotation axis and the polisher rotation axis are rotated in opposite directions to create a gap between the processing surface and the polisher surface. After the desired laminar flow of the working fluid is created, a DC voltage is applied to the polisher and the electrode so that the polisher surface becomes the anode. In the following specific example to demonstrate the effects of the method of the present invention, the above-mentioned apparatus including a brass disk-shaped polisher with an outer diameter of 80 mm, an acrylic sample holder, and a brass electrode with an eccentric distance of 44 mm between the vertical rotation axis and the sample holder was used. 20 Si single crystal wafers were processed under the following processing conditions: rotation speed 300 rpm, polisher rotation speed 100 rpm, voltage 0 to 500 V, gap 10 to 30 μm.
A sample of Y20×0.8 knob was pre-processed for wrapping finish with Ae2O3 Waterfall 2000 and grains, but the (001) and (】1】) sides were processed using water suspensions of various concentrations of SiO2 and Ae2O3 as the processing fluid. Processed.
実験の結果を第2〜7図に示す。第2図はAe,O,(
0.2μm)の10容積%水懸濁液を用い、Si(11
1)面を該面とポリシャ面のすき間(以下すき間と称す
)10μmで0〜200Vの電圧を印加し加工量と電圧
の関係を調べた結果である。図から明らかなように電圧
が増加し電場が強くなるにつれ加工量は次第に増えてい
る。第3図はAe2O,(10μm)を5容積%とSi
O2(0.02μm)を2容積%水に懸濁した力旺液を
用い、すき間20μm−(:Si(001)面を、10
0Vの直流を用い加工処理する場合の、電流の強さと加
工量の関係を、また第4図は5容積f)Ae2O3(1
6μm)水懸濁液、すき間30μm1電圧200VでS
i(001)面を加工処理する場合の電流の強さと加工
量の関係を調べた結果である。これらの結果から加工量
は電流に比例し増加していることが判る。このように水
をと粒の懸濁溶媒として用い、Ae,O3と粒を用いる
際にはポリシヤ側を陽極とする直流電圧の印加による本
発明方法の実施により加工能率は非常に増大し、加工量
は電流・電圧の増大により増加することが明らかである
。向第1図に示される装置は水を溶媒とする加工液の場
合に特に有用ではあるが、それに限定されるものではな
いこと、また非水系溶媒を用いる場合にと粒をポリシャ
側に引付けることも極めて有効な処理手段であることを
より明確ならしめるため、第5図に5容積%Ae2O3
(8μm)のアルコール液を加工液として用い、第1図
の装置でポリシヤ一側を陽極とし、すき間20μmで電
圧を増大させながらSi(001)面を加工処理する場
合の加工量と電圧の関係を示した。図から分る通り電圧
を増大させ電場を強くするならばポリシヤ一側を陽極と
する際にも極めて優れた効果の得られることが理解され
よう。次にSiO2をと粒とし水を溶媒として選択する
場合について考察する。The results of the experiment are shown in Figures 2-7. Figure 2 shows Ae, O, (
Si (11
1) The results were obtained by applying a voltage of 0 to 200 V to the surface with a gap (hereinafter referred to as the gap) of 10 μm between the surface and the polisher surface, and examining the relationship between the amount of processing and the voltage. As is clear from the figure, as the voltage increases and the electric field becomes stronger, the amount of processing gradually increases. Figure 3 shows 5% by volume of Ae2O (10 μm) and Si
Using a liquid solution in which O2 (0.02 μm) was suspended in 2% by volume water, a gap of 20 μm-(:Si(001) surface was
Figure 4 shows the relationship between the strength of the current and the amount of processing when processing using 0V direct current, and Figure 4 shows the relationship between the current strength and the amount of processing using 0V direct current.
6μm) Water suspension, gap 30μm 1 voltage 200V S
These are the results of investigating the relationship between the strength of current and the amount of processing when processing the i(001) plane. These results show that the amount of processing increases in proportion to the current. In this way, when water is used as a suspending solvent for grains and Ae, O3 and grains are used, the processing efficiency is greatly increased by implementing the method of the present invention by applying a DC voltage with the polisher side as an anode. It is clear that the amount increases with increasing current/voltage. The apparatus shown in Figure 1 is particularly useful, but not limited to, in the case of water-based machining fluids, and is particularly useful when using non-aqueous solvents to attract grains to the polisher side. In order to make it clearer that this is also an extremely effective treatment means, Fig. 5 shows 5 volume% Ae2O3.
Relationship between processing amount and voltage when processing a Si (001) surface using a (8 μm) alcoholic liquid as the processing fluid, using the apparatus shown in Figure 1 with one side of the polisher as an anode, and increasing the voltage with a gap of 20 μm. showed that. As can be seen from the figure, it will be understood that if the voltage is increased and the electric field is strengthened, an extremely excellent effect can be obtained even when one side of the polisher is used as an anode. Next, a case will be considered in which SiO2 is used as grains and water is selected as a solvent.
この場合の組合わせは電離度が大きく最もと粒を負に帯
電させる傾向の強いものである。第6図にSiO2(2
μm)を5容積%水に加えた加工液を用い、すき間20
μmで電圧を増大させつつSi(1】1)面を加工処理
した場合の加工量と電圧の関係を示した。図より加工量
は電圧が大きくなつても増大していないので発明効果が
得られていないようにも思われる。しかしながら第7図
に同じ条件下での表面のあらさh(μm)(連続指示型
表面粗さ測定機〔東京精密〕触針先端半径5μm、測定
力4mN以下で測定)対電圧の関係が示されている如く
、加工表面のあらさは電圧の増大と共に次第に減少し、
又顕微鏡写真測定によつても電圧が大きくなると加工面
はラツピングした面からポリシンクした面如くになり超
精密表面研摩の発明目的が確かに達成せられることがわ
かる。水11C.SiO2と粒を分散させた場合には電
離度が大きくSlO2の帯電量があまりにも大きいため
、ポリシャ面上に集まつたと粒はそこに付着し離れなく
なる。電圧の増加と共にポリシヤ面上に集まると粒数は
増え、それは容易に飽和状態に達し、従つて加工量もそ
れ以上増加しないようになる。しかしながらポリシャ面
上に付着すると粒が増すにつれ、加工面に対すると粒の
接触角は小さくなるため加工表面のあらさが比例して小
さくなることが、第6図および第7図に示される結果の
原因であると考えられる。何れにせよ水を溶媒とする加
工液の場合にも、ポリシヤ側を陽極とする直流電圧印加
による本発明方法により発明目的が達成せられるのであ
る。本発明方法はこのようにと粒の流体懸濁液中で加工
面と対向面を互に逆方向に回転させそれらの面の作る狭
いすき間に懸濁液の層流を作らしめて、加工物材料の転
位欠陥のない機械的加工を行わしめ、同時に該層流に電
場を作用させてと粒を電気泳動的にポリシヤ面に集中さ
せ加工面に作用すると粒数を制御し超精密表面研摩を達
成する。なお本発明においては、加工物ホルダーを流体
懸濁液中に浮力により浮かべるので、電気泳動によりポ
リシャ面上に引付けられたと粒が加工物ホルダーに保持
した加工物の加工面に対し弾力的に作用し、これにより
加工面の精密研摩による平坦化を無理なく促進すること
ができる。The combination in this case has a high degree of ionization and has the strongest tendency to negatively charge the grains. Figure 6 shows SiO2(2
Using a machining fluid containing 5% by volume of water (μm), a gap of 20
The relationship between the amount of processing and the voltage is shown when the Si (1) 1) surface is processed while increasing the voltage in μm. As the figure shows, the amount of processing does not increase even when the voltage increases, so it seems that the effects of the invention are not being obtained. However, Figure 7 shows the relationship between the surface roughness h (μm) (continuous indicator surface roughness measuring machine [Tokyo Seimitsu], measured with a stylus tip radius of 5 μm and a measuring force of 4 mN or less) under the same conditions and the voltage. As shown, the roughness of the machined surface gradually decreases as the voltage increases,
Also, microphotograph measurements show that as the voltage increases, the processed surface changes from a lapped surface to a polysynched surface, and the object of the invention of ultra-precision surface polishing is certainly achieved. Water 11C. When SiO2 and grains are dispersed, the degree of ionization is large and the amount of charge of SlO2 is too large, so that if they gather on the polisher surface, the grains will stick there and will not be separated. As the voltage increases, the number of particles increases as they gather on the polisher surface, and it easily reaches a saturation state, so that the amount of processing does not increase any further. However, as the number of grains increases as they adhere to the polisher surface, the contact angle of the grains with the machined surface decreases, and the roughness of the machined surface decreases proportionally, which is the reason for the results shown in Figures 6 and 7. It is thought that. In any case, even in the case of a machining liquid using water as a solvent, the object of the invention can be achieved by the method of the present invention, which involves applying a direct current voltage to the polisher side as an anode. In this way, the method of the present invention rotates the processing surface and the opposing surface in opposite directions in a fluid suspension of grains to create a laminar flow of the suspension in the narrow gap formed by these surfaces, thereby removing the material from the workpiece. At the same time, an electric field is applied to the laminar flow to electrophoretically concentrate the grains on the polished surface, and when applied to the processed surface, the number of grains is controlled and ultra-precision surface polishing is achieved. do. In the present invention, since the workpiece holder is floated in the fluid suspension by buoyancy, particles attracted onto the polisher surface by electrophoresis will elastically move against the machined surface of the workpiece held in the workpiece holder. As a result, flattening of the machined surface by precision polishing can be promoted without difficulty.
第1図は本発明方法の実施に用いられる研摩装置の縦断
面図、第2図は第1図の装置を用いSiウエ一・を加工
処理した場合の加工量に及ぼす電圧の影響を表す図、第
3図は加工量と電流の関係を示す第2図と同様の図、第
4図は加工量と電流の関係を示す第2図と同様の図、第
5図は加工量と電圧の関係を示す果2図と同様の図、第
6図は加工量と電圧の関係を示す第2図と同様の図、第
7図は同じく第1図の装置でSiウエハを加工処理した
場合の電圧と加工面の表面あらさの関係を示す図である
。
1・・・・・・容器、2・・・・・・ポリシヤ(対向面
)、3・・・・・・ポリシヤ回転軸、4・・・・・−7
J旺液(研摩材微粒子の流体懸濁液)、5・・・・・−
7J江物、6・・・・・・加工物ホルダー、7・・・・
・・ホルダー回転軸、8・・・・・・電極、10・・・
・・・直流。FIG. 1 is a longitudinal cross-sectional view of a polishing device used to carry out the method of the present invention, and FIG. 2 is a diagram showing the influence of voltage on the processing amount when a Si wafer is processed using the device shown in FIG. , Figure 3 is a diagram similar to Figure 2 showing the relationship between the amount of machining and current, Figure 4 is a diagram similar to Figure 2 showing the relationship between the amount of machining and current, and Figure 5 is a diagram showing the relationship between the amount of machining and voltage. Figure 6 is a diagram similar to Figure 2 showing the relationship between processing amount and voltage. Figure 7 is a diagram similar to Figure 2 showing the relationship between processing amount and voltage. FIG. 3 is a diagram showing the relationship between voltage and surface roughness of a machined surface. 1... Container, 2... Polyshear (opposing surface), 3... Polyshear rotating shaft, 4...-7
J liquid (fluid suspension of fine abrasive particles), 5...-
7J Emono, 6... Workpiece holder, 7...
...Holder rotation axis, 8...Electrode, 10...
...DC.
Claims (1)
ダーを浮かべること、該ホルダーから間隔をおいてポリ
シヤを設けること、加工物ホルダーに取付けた加工物の
加工面とポリシヤのポリシヤ面とを平行に保持すること
、加工物ホルダーとポリシャ面とを平行に保持すること
、加工物ホルダーとポリシヤとに互に逆方向の回転運動
を付与して加工面とポリシャ面の作る空間内に前記懸濁
液の層流を形成すること、前記懸濁中に加工物以外の場
所に設けた電極とポリシヤとに直流電圧を印加すること
、及び研摩材微粒子を電気泳動によりポリシャ面上に引
付けで加工物表面に作用する研摩材微粒子数を制御する
ことを包含してなる表面研摩法。 2 前記加工面とポリシヤ面とが、少なくとも懸濁研摩
材微粒子の粒子径以上である狭い間隔に平行保持される
特許請求の範囲第1項に記載の表面研摩法。[Claims] 1. A processing holder is floated by buoyancy in a fluid suspension of fine abrasive particles, a polisher is provided at a distance from the holder, and a polisher is attached to the processing surface of a workpiece attached to the workpiece holder. The workpiece holder and the polisher surface are held parallel to each other, the workpiece holder and the polisher surface are held parallel to each other, and the workpiece holder and the polisher are given rotational motion in opposite directions to create the workpiece surface and polisher surface. forming a laminar flow of the suspension in a space; applying a DC voltage to an electrode and a polisher provided at a location other than the workpiece during the suspension; and transferring fine abrasive particles to the polisher surface by electrophoresis. A surface polishing method that involves controlling the number of abrasive particles that act on the surface of a workpiece by attraction. 2. The surface polishing method according to claim 1, wherein the processed surface and the polisher surface are held parallel to each other at a narrow interval that is at least the particle diameter of the suspended abrasive fine particles.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56042278A JPS5946739B2 (en) | 1981-03-25 | 1981-03-25 | Surface polishing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56042278A JPS5946739B2 (en) | 1981-03-25 | 1981-03-25 | Surface polishing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57163055A JPS57163055A (en) | 1982-10-07 |
| JPS5946739B2 true JPS5946739B2 (en) | 1984-11-14 |
Family
ID=12631568
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56042278A Expired JPS5946739B2 (en) | 1981-03-25 | 1981-03-25 | Surface polishing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5946739B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60186368A (en) * | 1984-03-02 | 1985-09-21 | Taihoo Kogyo Kk | Polishing method using magnetic fluid |
| JPH0775829B2 (en) * | 1985-10-16 | 1995-08-16 | 治 今中 | Precision polishing method |
-
1981
- 1981-03-25 JP JP56042278A patent/JPS5946739B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57163055A (en) | 1982-10-07 |
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