JPS5948321B2 - Straight type micrometer - Google Patents
Straight type micrometerInfo
- Publication number
- JPS5948321B2 JPS5948321B2 JP18076580A JP18076580A JPS5948321B2 JP S5948321 B2 JPS5948321 B2 JP S5948321B2 JP 18076580 A JP18076580 A JP 18076580A JP 18076580 A JP18076580 A JP 18076580A JP S5948321 B2 JPS5948321 B2 JP S5948321B2
- Authority
- JP
- Japan
- Prior art keywords
- spindle
- linear
- measured
- anvil
- micrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000007246 mechanism Effects 0.000 claims description 32
- 238000005259 measurement Methods 0.000 claims description 20
- 238000006073 displacement reaction Methods 0.000 claims description 13
- 230000006835 compression Effects 0.000 description 8
- 238000007906 compression Methods 0.000 description 8
- 230000009471 action Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B3/00—Measuring instruments characterised by the use of mechanical techniques
- G01B3/18—Micrometers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Instruments Using Mechanical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Description
【発明の詳細な説明】
本発明は、直進型マイクロメータに係り、特にアンビル
が配設されたフレームと、該フレームに摺動自在に支承
された、測定時に先端が被測定物に当接される直進スピ
ンドルとを備え、アンビルとスピンドル間に被測定物を
挟持した時のスピンドルの直進変位から被測定物の長さ
を測定する直進型マイクロメータの改良に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a linear micrometer, and in particular to a frame provided with an anvil, the micrometer is slidably supported on the frame, and the tip of the micrometer is in contact with an object to be measured during measurement. This invention relates to an improvement in a linear micrometer that is equipped with a linearly moving spindle and measures the length of an object to be measured from the linear displacement of the spindle when the object is held between an anvil and the spindle.
被測定物の長さを測定する測長器の一種にマイクロメー
タがある。A micrometer is a type of length measuring device that measures the length of an object to be measured.
これは、アンビルが配設されたフレームと、該フレーム
に螺合された、或いは摺動自在に支承された、測定時に
先端が被測定物に当接される回転スピンドル或いは直進
スピンドルとを備え、アンビルとスピンドル間に被測定
物を挟持した時のスピンドルの変位から被測定物の長さ
を測定するものであり、従来は、フレームに対する回転
スピンドルの変位量を、回転スピンドルの後端に形成さ
れた、精密に加工されたねじの送り量を基準に、ねじの
斜面による拡大を利用して読み取る、いわゆる機械式の
回転型マイクロメータが主に用いられている。しかしこ
の回転型マイクロメータにおいては、測定の度毎にねじ
を逆回転してスピンドルを後退させることにより、被測
定物を開放しなければならず、同種の被測定物を繰り返
し測定する場合には、該被測定物を交換する操作が極め
て煩わしいものであつた。これは、エレクトロニクス化
の進展に伴い、近年提案されている。This includes a frame on which an anvil is disposed, and a rotary spindle or a linear spindle which is screwed onto the frame or is slidably supported and whose tip is brought into contact with the object to be measured during measurement. The length of the object to be measured is measured from the displacement of the spindle when the object is held between the anvil and the spindle. Conventionally, the amount of displacement of the rotating spindle with respect to the frame is measured using a sensor formed at the rear end of the rotating spindle. In addition, a so-called mechanical rotary micrometer is mainly used, which reads the feed amount of a precisely machined screw using magnification due to the slope of the screw. However, with this rotary micrometer, the object to be measured must be released by rotating the screw in the opposite direction and retracting the spindle each time a measurement is made. However, the operation of exchanging the object to be measured was extremely troublesome. This has been proposed in recent years with the advancement of electronics.
アンビルが配置されたフレームと、該フレームに摺動自
在に支承された、測定時に先端が被測定物に当接される
直進スピンドルと、前記フレームに固着された固定スケ
ールと、前記直進スピンドルと連動された可動スケール
とを備え、スピンドルの直進変位に伴う可動スケールと
固定スケール間の物理量の変化、例えば、通過光量或い
は反射光量の変化から、アンビルとスピンドル間に挟持
された被測定物の長さを測定する、いわゆる電子式の直
進型マイクロメータにおいても同様である。この電子式
の直進型マイクロメータにおける前記のような欠点を解
消するべく、アンビルが配設されたフレームと、該フレ
ームに摺動自在に支承された、測定時に先端が被測定物
に当接される直進スピンドルと、前記フレームに固着さ
れた固定スケールと、前記スピンドルと連動された可動
スケールとを備え、スピンドルの変位に伴う可動スケー
ルと固定スケール間の物理量の変化から、アンビルとス
ピンドル間に挟持された被測定物の長さを測定する電子
式の直進型マイクロメータにぉいて、前記スピンドルを
全ストロークに渡り往復動させるための往復機構と、該
往復機構を任意の位置でロツクするためのロツク機構と
、該ロツク機構により前記往復機構がロツクされた状態
で、前記スピンドルを被測定物に対して一定の測定圧で
押圧するための定圧機構と、同じく前記ロツク機構によ
り前記往復機構がロツクされた状態で、前記定圧機構に
よる押圧力に打勝つて、前記スピンドルを所定ストロー
クだけ引戻して被測定物を開放するための開放機構とを
設けることも考えられるが、このような直進型マイクロ
メータにおいては、前記往復機構を構成する、スライダ
を操作するためのスライトソブと、前記開放機構を構成
する開放アームを操作するためのスナツフソブとを、マ
イクロメータ本体の両側面に、スピンドルの移動範囲全
域に渡つて移動可能な状態で配置する必要があり、本体
加工上、及び操作上不便であつた。A frame on which an anvil is arranged, a linear spindle slidably supported by the frame and whose tip abuts the object to be measured during measurement, a fixed scale fixed to the frame, and interlocked with the linear spindle. The length of the object to be measured held between the anvil and the spindle can be determined from changes in physical quantities between the movable scale and the fixed scale due to the linear displacement of the spindle, such as changes in the amount of transmitted light or reflected light. The same applies to so-called electronic linear micrometers that measure . In order to eliminate the above-mentioned drawbacks of this electronic linear micrometer, it is equipped with a frame on which an anvil is disposed, and a frame that is slidably supported on the frame, the tip of which comes into contact with the object to be measured during measurement. A linear spindle, a fixed scale fixed to the frame, and a movable scale interlocked with the spindle. An electronic linear micrometer for measuring the length of a measured object has a reciprocating mechanism for reciprocating the spindle over the entire stroke, and a reciprocating mechanism for locking the reciprocating mechanism at an arbitrary position. a lock mechanism; a constant pressure mechanism for pressing the spindle against the object to be measured with a constant measuring pressure when the reciprocating mechanism is locked by the lock mechanism; It is conceivable to provide a release mechanism for overcoming the pressing force of the constant pressure mechanism and pulling back the spindle by a predetermined stroke to release the object under test. In the above, a slide arm for operating the slider, which constitutes the reciprocating mechanism, and a snuff arm, for operating the opening arm, which constitutes the opening mechanism, are provided on both sides of the micrometer body, over the entire movement range of the spindle. It was necessary to arrange it so that it could be moved across the body, which was inconvenient in terms of processing and operation of the main body.
本発明の目的は、前記従来の欠点を解放するべくなされ
たもので、被測定物を測定位置にセツトし、あるいはセ
ツトを外すことが容易にできる程度にスピンド件の軸方
向の移動距離を規制し、多数の同一規格の被測定物を最
小のスピンドル移動量で測定し得るようにした直進型マ
イクロメータを提供すること。SUMMARY OF THE INVENTION An object of the present invention is to overcome the above-mentioned drawbacks of the conventional art, and to regulate the axial movement distance of the spindle to such an extent that the object to be measured can be easily set in or removed from the measurement position. To provide a linear micrometer capable of measuring a large number of objects to be measured of the same standard with a minimum amount of spindle movement.
本発明の直進型マイクロメータは、一定の隙間をもつて
対峙された一対の支承部にスピンドルを摺動自在に支持
すると共に、前記両支承部間のスピンドルにはアンビル
側の支承部に当接するようにばねによつて付勢された連
結片が遊嵌され、この連結片に前記スピンドルと一体的
に結合するための係止部材、及び前記ばねと定圧機構と
の両付勢力に打勝つてスピンドルを引戻すための開放操
作部材とからなる開放機構を設けたものである。In the linear micrometer of the present invention, a spindle is slidably supported by a pair of support parts facing each other with a certain gap, and the spindle between the two support parts is in contact with a support part on the anvil side. A connecting piece biased by a spring is loosely fitted into the connecting piece, and a locking member for integrally coupling with the spindle is provided to overcome the biasing forces of the spring and the constant pressure mechanism. The opening mechanism includes an opening operation member for pulling back the spindle.
上述の構成によると、多数の同一規格の被測定物を測定
する場合、まずスピンドルをわずかに移動するだけで被
測定物がアンビルとスピンドル間にセツトでき2または
セツトを外すことができるようにスピンドルに連結片を
固定してその移動量を規制する。そして、連結片を指で
操作し、スピンドルを移動させ、スピンドルとアンビル
間に被測定物を位置させた後、連結片に掛けた指の力を
抜くと、直ちにばね及び定圧機構による押圧力によつて
連結片と一緒にスピンドルがアンビル方向に移動し、そ
の先端が一定の測定力でもつて被測定物に当接する。こ
の時の可動スケールと固定スケールとの変位置から被測
定物の長さが測定できる。続いて、連結片を操作してス
ピンドルを引戻して被測定物への押圧を解除し、被測定
物を測定位置から取除き、つぎの被測定物をセツトし、
前回同様に測定を行なう。アンビルとスピンドル間に被
測定物がない場合に連結片から指を離すと、連結片はア
ンビル側の支承部に当接するまで移動し、その状態でス
ピンドルのアンビル方向への移動が止められる。したが
つて、つぎの被測定物の測定位置へのセツトは、連結片
によるスピンドルのわずかな移動によつて行うことがで
きる。以下図面を参照して、本発明の実施例を詳細に説
明する。本実施例は、第1図乃至第3図に示す如く、先
端内側にアンビル12が配設された略U字形状のフレー
ム10と、該フレーム10K摺動自在に支承された、測
定時に先端14aが被測定物に当接される直進スピンド
ル14と、前記フレーム10に固定された、ガラス製の
平板上に光の透過部と不透過部とが等間隔の縞模様に形
成されて成る固定スケール(図示省略)と、前記直進ス
ピンドル14に固定された、ガラス製の平板上に光の透
過部と不透過部が等間隔の縞模様に形成されて成る可動
スケール(図示省略)とを備え、アンビル12と直進ス
ピンドル14の先端14a間に被測定物を挟持した時の
直進スピンドル14の直進変位に伴う固定スケールと可
動スケール間の通過光量の変位から、被測定物の長さを
測定する電子式の直進型マイクロメータにおいて、測定
時に前記直進スピンドル14を被測定物に対して一定の
測定力で押圧するための、例えば、直進スピンドル14
を移動操作するスライトソブによつて操作される、直進
スピンドル14に沿つて移動可能なラチエツトストツプ
機構と直進スピンドル14間に張架された直進スピンド
ル14の先端が被測定物に当接したとき有効に作用する
測定力付与ばねを有してなる定圧機構(図示省略)と、
該定圧機構による押圧力に打勝つて、前記直進スピンド
ル14を片手で所定ストロークAだけ(例えば定圧機構
のストローク分だけ)引戻して被測定物を開放するため
のスピンドル開放機構が設けられている。前記機構はフ
レーム10のスピンドル支承部10aに配設された、所
定ストロークA内で前記直進スピンドル14に対して摺
動自在に遊嵌された連結片18、該連結片18を前記ス
ピンドル支承部10aの前方に当接しておくための圧縮
ばね20と、前記連結片18と螺合し、先端が直進スピ
ンドル14側面に当接可能な、左ねじの当接用ねじ部2
2a、及び、フレーム表面に突出する、指掛け用凹部2
2C(第3図参照)が形成された固定及び開放操作用頭
部22bを有して成るねじ22とによつて構成されてい
る。前記開放機構を構成する圧縮ばね20は、前記定圧
機構等の操作取扱い上の支障となることが無いように、
前記定圧機構の押圧力より極めて弱いものとされている
。According to the above configuration, when measuring a large number of objects to be measured of the same standard, first the spindle is moved so that the objects to be measured can be set between the anvil and the spindle by slightly moving the spindle, and the objects to be measured can be set between the anvil and the spindle. The connecting piece is fixed to and the amount of movement thereof is regulated. Then, after operating the connecting piece with your fingers to move the spindle and positioning the object to be measured between the spindle and the anvil, when you release the force of your fingers on the connecting piece, the pressing force from the spring and constant pressure mechanism is immediately applied. Therefore, the spindle moves toward the anvil together with the connecting piece, and its tip abuts against the object to be measured with a constant measuring force. The length of the object to be measured can be measured from the displaced positions of the movable scale and the fixed scale at this time. Next, operate the connecting piece to pull back the spindle to release the pressure on the object to be measured, remove the object to be measured from the measurement position, set the next object to be measured,
Perform the measurement in the same way as last time. When there is no object to be measured between the anvil and the spindle, when you release your finger from the connecting piece, the connecting piece moves until it comes into contact with the support on the anvil side, and in that state, the movement of the spindle toward the anvil is stopped. Therefore, the next object to be measured can be set at the measurement position by a slight movement of the spindle by the connecting piece. Embodiments of the present invention will be described in detail below with reference to the drawings. As shown in FIGS. 1 to 3, this embodiment includes a substantially U-shaped frame 10 having an anvil 12 disposed inside the tip, and a tip 14a that is slidably supported by the frame 10K. a linear spindle 14 that is brought into contact with an object to be measured, and a fixed scale that is fixed to the frame 10 and has light transmitting parts and non-light transmitting parts formed in a striped pattern at equal intervals on a glass flat plate. (not shown), and a movable scale (not shown) fixed to the linear spindle 14 and formed of a glass flat plate in which light transmitting parts and non-transmissive parts are formed in a striped pattern at equal intervals, An electronic device that measures the length of an object to be measured based on the displacement of the amount of light passing between the fixed scale and the movable scale due to the linear displacement of the linear spindle 14 when the object is held between the anvil 12 and the tip 14a of the linear spindle 14. In the type of linear micrometer, for example, the linear spindle 14 is used to press the linear spindle 14 against the object to be measured with a constant measuring force during measurement.
When the tip of the linear spindle 14, which is stretched between the linear spindle 14 and a ratchet stop mechanism that is movable along the linear spindle 14 and is operated by a slide control that moves the linear spindle 14, comes into contact with the object to be measured. a constant pressure mechanism (not shown) having a measuring force imparting spring that acts effectively;
A spindle opening mechanism is provided for overcoming the pressing force of the constant pressure mechanism and pulling back the linear spindle 14 by a predetermined stroke A (for example, the stroke of the constant pressure mechanism) with one hand to release the object to be measured. The mechanism includes a connecting piece 18 that is disposed on the spindle support 10a of the frame 10 and is loosely fitted to the linear spindle 14 within a predetermined stroke A, and the connecting piece 18 is connected to the spindle support 10a. a compression spring 20 for contacting the front side of the left-hand threaded contact thread portion 2 which is threadedly engaged with the connecting piece 18 and whose tip can come into contact with the side surface of the linear spindle 14;
2a, and a finger hook recess 2 protruding from the frame surface.
2C (see FIG. 3) and a screw 22 having a head 22b for fixing and opening operations. The compression spring 20 constituting the opening mechanism is designed such that it does not interfere with the operation and handling of the constant pressure mechanism, etc.
The pressing force is said to be extremely weaker than the pressing force of the constant pressure mechanism.
以下作用を説明する。The action will be explained below.
測定に際して、先ず図示されないスライトソブ等を操作
して、直進スピンドル14を第1図の矢印Bで示す方向
に後退させる。すると、直進スピンドル14の先端が完
全に後退して測定に備えられる。次いで、フレーム10
のアンビル12と直進スピンドル14の先端14a間に
被測走物を介装し、スライトソブ等を操作して、直進ス
ピンドル14を第1図の矢印Cに示す方向に前進させ、
被測定物が.アンビル12と直進スピンドル14の先端
14a間で挟持される状態とする。この時、図示されな
い定圧機構により、直進スピンドル14が第1図の矢印
C方向に付勢されているので、所定の測定力が掛げられ
た状態で、測定が行なわれる。具体的には、基準位置に
対する直進スピンドル14の変位に伴う可動スケールと
固定スケール間の相対変位量を、通過光量の変化から検
出することにより、可動スケールの基準位置からの変化
量を知ることができる。従つて、可動スケールが固着さ
れている直進スピンドル14の変位量を知ることができ
、被測定物の長さが測定することができる。この時にお
いて定圧機構により直進スピンドル14が常時被測定物
に当接する方向に押圧されているため、測定者の操作力
のばらつき等に拘わらず、常に一定の測定力が付与され
、正確な測定が可能である。又、連結片18は、圧縮ば
ね20の作用により、常時スピンドル支承部10aの前
方に当接した状態とされている。従つて、連結片18の
移動ストロークAは、常時、確保されている。次に同種
の被測定物を繰り返し測定するに際して、従来は、一々
スライトソプ等を第1図に矢印Bで示す方向に操作して
、定圧機構を構成する、例えばラチエツトストツプ機構
の係合関係を解いた上で直進スピンドル14を後退させ
て被測定物を取り外し、再び、被測定物をアンビル12
と直進スピンドル14の先端14aの間に介装した状態
で、スライトソブ等を操作して直進スピンドル14を前
進させて測定状態としなければならず、その操作が極め
て煩わしく、時間がかかるものであつた。In the measurement, first, a slide control (not shown) or the like is operated to move the linear spindle 14 backward in the direction shown by arrow B in FIG. Then, the tip of the linear spindle 14 is completely retracted and is ready for measurement. Then frame 10
A running object to be measured is interposed between the anvil 12 and the tip 14a of the straight spindle 14, and the straight spindle 14 is advanced in the direction shown by arrow C in FIG. 1 by operating a slide control or the like.
The object to be measured. It is held between the anvil 12 and the tip 14a of the linear spindle 14. At this time, since the linear spindle 14 is urged in the direction of arrow C in FIG. 1 by a constant pressure mechanism (not shown), the measurement is performed with a predetermined measuring force applied. Specifically, by detecting the amount of relative displacement between the movable scale and the fixed scale due to the displacement of the linear spindle 14 with respect to the reference position from the change in the amount of passing light, it is possible to know the amount of change of the movable scale from the reference position. can. Therefore, the amount of displacement of the linear spindle 14 to which the movable scale is fixed can be known, and the length of the object to be measured can be measured. At this time, since the linear spindle 14 is always pressed in the direction of contacting the object to be measured by the constant pressure mechanism, a constant measuring force is always applied regardless of variations in the operator's operating force, ensuring accurate measurements. It is possible. Further, the connecting piece 18 is kept in contact with the front side of the spindle support portion 10a at all times due to the action of the compression spring 20. Therefore, the movement stroke A of the connecting piece 18 is always ensured. Next, when repeatedly measuring the same type of object to be measured, conventionally, a slide saw or the like was operated one by one in the direction shown by arrow B in FIG. After releasing the
The linear spindle 14 had to be inserted between the front end 14a of the linear spindle 14, and the linear spindle 14 had to be moved forward to the measurement state by operating a slide sob, etc., and this operation was extremely troublesome and time consuming. .
これに対して、本発明においては、同種の被測定物を繰
り返し測定する際には、スライトソブ等を操作すること
無く、ねじ22のみを操作すれば良いものである。In contrast, in the present invention, when repeatedly measuring the same type of object to be measured, it is sufficient to operate only the screw 22 without operating the slide control or the like.
即ち、同種の被測定物を繰り返し測定する際には、最初
の測定が終つた状態で、ねじ22の頭部22bの指掛け
用凹部22Cに第3図に示す如く指を掛け、ねじ22を
第3図の矢印Dに示す反時計方向に微回動する。すると
、ねじ22の当接用ねじ部22aは左ねじとされている
ので、ねじ22が第2図の矢印Eに示す方向に前進し、
その先端が直進スピンドル14の側面と当接して、直進
スピンドル14と連結片18が一体化される。次いで、
ねじ22の頭部22bを圧縮ばね20及び測定力付与ば
ねに抗して第1図の矢印B方向に移動すれば、連結片1
8が直進スピンドル14と共に所定ストロークAの範囲
内で第1図の矢印B方向に引戻される。この時において
操作力は、圧縮ばね20による力と測定力付与ばねによ
る力の合力となるが、圧縮ばね20は極めて弱いもので
あるので、操作力が大きく増大することはない。この状
態で、被測定物を交換し、ねじ22の頭部22bから指
を離すと、圧縮ばね20及び定圧機構の測定力付与ばね
の作用により直進スピンドル14が再び測定位置迄前進
し、直ちに次回の測定が行なわれる。従つて、同種の被
測定物を繰り返し測定する場合には、一々スライトソブ
等を操作する必要が無くなり、ねじ22を操作するのみ
で、前回測定の被測定物を取り去るための微小間隙が容
易に得られ、且つ、次回被測定物が挿入された後は、そ
の微小間隙が無くなり、且つ所定の測定力が付与される
ものである。That is, when repeatedly measuring the same type of object, after the first measurement is completed, place your finger in the finger hook recess 22C of the head 22b of the screw 22 as shown in FIG. Slightly rotate in the counterclockwise direction shown by arrow D in Figure 3. Then, since the abutting threaded portion 22a of the screw 22 is a left-handed thread, the screw 22 moves forward in the direction shown by arrow E in FIG.
Its tip abuts against the side surface of the linear spindle 14, so that the linear spindle 14 and the connecting piece 18 are integrated. Then,
If the head 22b of the screw 22 is moved in the direction of arrow B in FIG. 1 against the compression spring 20 and the measuring force applying spring, the connecting piece 1
8 is pulled back together with the linear spindle 14 within a predetermined stroke A in the direction of arrow B in FIG. At this time, the operating force is the resultant force of the force exerted by the compression spring 20 and the force exerted by the measuring force applying spring, but since the compression spring 20 is extremely weak, the operating force does not increase significantly. In this state, when the object to be measured is replaced and the finger is released from the head 22b of the screw 22, the linear spindle 14 moves forward again to the measurement position due to the action of the compression spring 20 and the measuring force applying spring of the constant pressure mechanism, and immediately next time. measurements are taken. Therefore, when repeatedly measuring the same type of object, there is no need to operate the slide sob each time, and by simply operating the screw 22, a minute gap can be easily created to remove the previously measured object. Then, after the object to be measured is inserted next time, the minute gap disappears and a predetermined measuring force is applied.
本実施例においては、開放機構の係止部材と開放操作部
材とが一体化されているので、構成が単純である。In this embodiment, the locking member of the opening mechanism and the opening operation member are integrated, so the configuration is simple.
又、係止部材の係止用ねじ部が左ねじとされているので
、−アクシヨンによる片手操作が可能となり、操作絶に
優れている。尚、前記実施例においては、本発明が、可
動スケールと固定スケール間の通過光量の変化から直進
スピンドルの直進変位を測定する電子式の直進型マイク
ロメータに適用されていたが、本発明の適用範囲はこれ
に限定されず、固定スケールと可動スケール間の反射光
量の変化から測定対象の変位を測定する電子式の直進型
マイクロメータ、或いは、可動スケールと固定スケール
間の他の物理量の変化からスピンドルの直進変位を測定
する、一般の直進型マイクロメータにも同様に適用でき
ることは明らかである。Furthermore, since the locking threaded portion of the locking member is a left-hand thread, it is possible to operate the locking member with one hand using a -action, and the locking member is highly operable. In the above embodiments, the present invention was applied to an electronic linear micrometer that measures the linear displacement of a linear spindle from changes in the amount of light passing between a movable scale and a fixed scale. The range is not limited to this, but it can be measured by an electronic linear micrometer that measures the displacement of the measurement target from changes in the amount of reflected light between the fixed scale and the movable scale, or from changes in other physical quantities between the movable scale and the fixed scale. It is clear that the present invention can be similarly applied to a general linear micrometer that measures the linear displacement of a spindle.
又、前記実施例は、本発四を、マイクロメータに適用し
たものであつたが、本発明は、マイクロメータ以外の測
長器であるノギスや八イトゲージにも同様に適用させる
こと力.Zできるのは明らかである。Further, in the above embodiment, the present invention was applied to a micrometer, but the present invention can be similarly applied to length measuring instruments other than micrometers, such as calipers and eight-meter gauges. It is obvious that Z can be done.
以上説明した通り、本発明によれば開放操作部材をマイ
クロメータ本体の側面全域に渡つて移動可能な状態で配
置すること無く、前回の被測定物を取り去るための微小
間隙が容易に得られ、且つ次回の被測定物を挿入した後
直ちにその微小間隙が元に戻され、所定の測定力が付与
されるので、同種の測定物の繰り返し測定が極めて容易
となる。As explained above, according to the present invention, a minute gap for removing the previous measured object can be easily obtained without disposing the opening operation member in a movable state over the entire side surface of the micrometer main body. In addition, immediately after inserting the next object to be measured, the minute gap is returned to its original state and a predetermined measuring force is applied, making it extremely easy to repeatedly measure the same type of object.
又、スピンドル開放機構が、フレームのスピンドル支承
部に配設されているので、開放操作部材の操作が極めて
容易となり、片手操作も可能であり、またばねによつて
連結片をアンビル方向に付勢していることから、読取中
にはスピンドルあるいは入ごンドル開放機構から指を離
すことができるため、測定者の疲労を軽減することがで
き、特に多数の同一規格品の測定に際しその効果が大と
なる。In addition, since the spindle opening mechanism is arranged on the spindle support part of the frame, the operation of the opening operation member is extremely easy, even one-handed operation is possible, and the connecting piece is biased toward the anvil by the spring. Because of this, it is possible to take your fingers off the spindle or inlet release mechanism during reading, which reduces operator fatigue, which is especially effective when measuring a large number of products of the same standard. becomes.
第1図は、本発明に係る直進型マイクロメータの実施例
の要部を示す縦断面図、第2図は第1図の−線に沿う横
断面図、第3図は、前記実施例の係止部材及び開放操作
部材を構成するねじの頭部形状を示す正面図である。
10・・・・・・フレーム.. 10a・・・・・・ス
ピンドル支承部、12・・・・・・アンビル、14・・
・・・・直進スピンドル、18・・・・・・連結片、2
0・・・・・・圧縮ばね、22・・・・・・ねじ、22
a・・・・・・当接用ねじ部、22b・・・・・・頭部
、22c・・・・・・指掛け用凹部。FIG. 1 is a longitudinal cross-sectional view showing the main parts of an embodiment of a linear micrometer according to the present invention, FIG. 2 is a cross-sectional view taken along the line - in FIG. 1, and FIG. It is a front view which shows the head shape of the screw which comprises a locking member and an opening operation member. 10...Frame. .. 10a...Spindle bearing part, 12...Anvil, 14...
... Straight spindle, 18 ... Connection piece, 2
0...Compression spring, 22...Screw, 22
a... Screw part for contact, 22b... Head, 22c... Recessed part for finger hook.
Claims (1)
対向させて摺動自在にフレームに支持された直進スピン
ドルと、前記スピンドルを測定時に被測定物に対して一
定の測定力で押圧付勢するための定圧機構と、前記スピ
ンドルを進退動させるためのノブ等の移動手段とを備え
、前記スピンドルの直進変位からアンビルとスピンドル
間に挟持した被測定物の長さを測定する直進型マイクロ
メータにおいて、前記フレームに前記スピンドルの軸方
向に一定の隙間をもつて対峙され、且つスピンドルを摺
動自在に支持する一対の支承部を設け、この両支承部間
内で軸方向に移動可能に前記スピンドルに遊嵌されると
共に、アンビル側の支承部に当接するようにばねで付勢
されている連結片を設け、この連結片にスピンドルと一
体的に結合するための係止部材、及び前記ばねと定圧機
構との両付勢力に打勝つてスピンドルを引戻すための開
放操作部材とからなる開放機構を設けたことを特徴とす
る直進型マイクロメータ。 2 前記係止部材と開放操作部材とが、前記連結片と螺
合し、先端がスピンドル側面に当接可能な係止用ねじ部
と、フレーム表面に突出する指掛け用凹部が形成された
係止及び開放操作用頭部とからなるねじにより一体的に
構成されていることを特徴とする特許請求の範囲第1項
記載の直進型マイクロメータ。[Claims] 1. An anvil fixed to a frame, a linear spindle slidably supported by the frame in opposition to the anvil, and a linear spindle that applies a constant measuring force to the object to be measured during measurement. A linear movement device comprising a constant pressure mechanism for pressing and urging, and a moving means such as a knob for moving the spindle forward and backward, and measuring the length of the object to be measured held between the anvil and the spindle from the linear displacement of the spindle. type micrometer, the frame is provided with a pair of support parts that face each other with a certain gap in the axial direction of the spindle and that slidably support the spindle, and the micrometer is moved in the axial direction between the two support parts. a locking member for integrally connecting with the spindle, a connecting piece being loosely fitted onto the spindle and biased by a spring so as to come into contact with the anvil-side support portion; and an opening mechanism for pulling back the spindle by overcoming the biasing forces of the spring and the constant pressure mechanism. 2. A lock in which the locking member and the opening operation member are screwed together with the connecting piece, and a locking screw portion whose tip can come into contact with the spindle side surface and a finger hook recess projecting from the frame surface are formed. 2. The linear micrometer according to claim 1, wherein the linear micrometer is integrally constructed by a screw consisting of a screw and a head for opening operation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18076580A JPS5948321B2 (en) | 1980-12-19 | 1980-12-19 | Straight type micrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18076580A JPS5948321B2 (en) | 1980-12-19 | 1980-12-19 | Straight type micrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57103001A JPS57103001A (en) | 1982-06-26 |
| JPS5948321B2 true JPS5948321B2 (en) | 1984-11-26 |
Family
ID=16088924
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18076580A Expired JPS5948321B2 (en) | 1980-12-19 | 1980-12-19 | Straight type micrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5948321B2 (en) |
-
1980
- 1980-12-19 JP JP18076580A patent/JPS5948321B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57103001A (en) | 1982-06-26 |
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