JPS5948324B2 - Inclination detection roughness measurement method using light reflection - Google Patents
Inclination detection roughness measurement method using light reflectionInfo
- Publication number
- JPS5948324B2 JPS5948324B2 JP6429679A JP6429679A JPS5948324B2 JP S5948324 B2 JPS5948324 B2 JP S5948324B2 JP 6429679 A JP6429679 A JP 6429679A JP 6429679 A JP6429679 A JP 6429679A JP S5948324 B2 JPS5948324 B2 JP S5948324B2
- Authority
- JP
- Japan
- Prior art keywords
- measured
- light
- differential amplifier
- angle
- roughness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 title claims description 11
- 238000001514 detection method Methods 0.000 title claims description 5
- 238000004439 roughness measurement Methods 0.000 title claims description 4
- 230000003287 optical effect Effects 0.000 claims description 35
- 239000007787 solid Substances 0.000 claims description 3
- 238000010521 absorption reaction Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 3
- 238000012937 correction Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】
本発明は光反射による傾角検出あらさ測定方法15に関
するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a tilt angle detection roughness measurement method 15 using light reflection.
平行で細い光ビームを被測定面の微小部分に当て、その
面での正反射または乱反射の中心を捉えて被測定面上の
微小部分の傾角を検出し、それを光ビームの掃引方向に
積分すれば、被測定面のあ20らさ波形を得ることがで
きる。A parallel, narrow light beam is applied to a minute portion of the surface to be measured, the center of specular reflection or diffused reflection on that surface is detected, the tilt angle of the minute portion on the surface to be measured is detected, and this is integrated in the direction in which the light beam is swept. Then, the roughness waveform of the surface to be measured can be obtained.
この種の光反射を利用したあらさ測定において特に考慮
する必要があるのは、被測定面が鏡面のような正反射面
であるか、または粗面のような乱反射面であるかによつ
て、反射光の態様に差異が25あるということであり、
そのいずれの反射面に適用しても正確にあらさを測定で
きることが望まれる。What needs to be considered in particular when measuring roughness using this type of light reflection is whether the surface to be measured is a specular reflection surface such as a mirror surface or a diffuse reflection surface such as a rough surface. This means that there are 25 differences in the form of reflected light,
It is desired that roughness can be measured accurately no matter which reflective surface is applied.
また、被測定面の反射率が常に一定であるとは限らない
ため、被測定面の反射率の変化に対応する補正を行いな
がら測定できるようにすること30も必要である。本発
明の測定方法は、このような問題を考慮してあらさ波形
を測定するようになしたものであり、基本的には、2個
の光センサーと簡単な回路系によつて非接触で測定でき
るように構成し、また被35測定面が正反射面である場
合に適用するのに有効ならしめたことを特徴とするもの
である。Furthermore, since the reflectance of the surface to be measured is not always constant, it is also necessary to be able to perform measurements 30 while making corrections corresponding to changes in the reflectance of the surface to be measured. The measurement method of the present invention measures the roughness waveform in consideration of such problems, and basically measures the roughness waveform without contact using two optical sensors and a simple circuit system. The present invention is characterized in that it is configured such that it can be used, and that it is effective for application when the surface to be measured 35 is a specular reflection surface.
以下に本発明の実施例について詳細に説明する。Examples of the present invention will be described in detail below.
まず、第1図に示すように、被測定面1のあらさ波形の
微小部分に対して光源2からレーザー等の平行で細い光
ビームを投射すると、その反射光の強度分布は、被測定
面1が鏡面のような正反射面である場合、図示したよう
に被測定面の微小部分の傾きに応じた偏角θをもつ方向
に正反射があり、その左右に若干の乱反射があるような
分布となる。そこで、被測定面1の直上に広い立体角に
わたる受光面をもつた左右対称の光センサ−3a,3b
を設け、両光センサーで被測定面からの反射光を直接的
に受光して、差動増幅器4でそれらの出力の差をとると
、第2図に曲線Aで示すような差出力が得られる。First, as shown in FIG. 1, when a parallel narrow light beam such as a laser is projected from the light source 2 onto a minute portion of the roughness waveform of the surface to be measured 1, the intensity distribution of the reflected light is When is a specular reflecting surface such as a mirror, as shown in the figure, there is a distribution in which there is specular reflection in the direction with an angle of deviation θ that corresponds to the inclination of the minute part of the measured surface, and there is some diffuse reflection on the left and right sides. becomes. Therefore, bilaterally symmetrical optical sensors 3a and 3b having a light-receiving surface extending over a wide solid angle directly above the surface to be measured 1
If the two optical sensors directly receive the reflected light from the surface to be measured, and the differential amplifier 4 calculates the difference in their outputs, a differential output as shown by curve A in Figure 2 can be obtained. It will be done.
第2図は上記差出力と偏角θとの関係を示すもので、反
射光の中心が光センサーから外れる程度に偏角θが大き
くなつた場合及び偏角θがほぼOの場合には差出力がO
に近づくが、それらの間においては差出力が偏角θに関
係なくほぼ一定を示す。Figure 2 shows the relationship between the difference output and the declination angle θ.When the declination angle θ becomes large enough that the center of the reflected light deviates from the optical sensor, and when the declination angle θ is approximately O, the difference Output is O
However, the difference output between them is almost constant regardless of the angle of deviation θ.
そこで、本発明においては、上記差出力の検出により被
測定面上の微小部分の傾角を測定できるようにするため
、被測定面からの反射光をその中心の偏角θに応じた重
みづけを行つて上記光センサ−3a,3bで受光させる
。Therefore, in the present invention, in order to be able to measure the inclination angle of a minute portion on the surface to be measured by detecting the difference output, the reflected light from the surface to be measured is weighted according to the declination angle θ of the center. Then, the light is received by the optical sensors 3a and 3b.
第1図は、上記重みづけを行うための手段として、左右
の光センサ−3a,3bの前に、中心付近では反射光の
吸収が多く周辺付近ではその吸収が少ない光学くさび6
を配置した場合を示している。FIG. 1 shows an optical wedge 6 in front of the left and right optical sensors 3a and 3b, which absorbs more reflected light near the center and less absorption near the periphery, as a means for performing the above weighting.
This shows the case where .
このような重みづけを行つて反射光を受光し、差動増幅
器4でそれらの出力の差をとると、その差出力は、第2
図に曲線Bで示すように一定範囲内において偏角θにほ
ぼ比例することになり、したがつて、上記差出力により
被測定面上の光ビームが当つた微小部分の傾角を知るこ
とができる。さらに、上記傾角の検出を行いながら被測
定面1を矢印x方向に移動させ、その出力を積分回路5
で被測定面1上における光ビームの掃引方向に積分する
ことによりあらさ曲線f(x)を得ることができる。上
記重みづけを行うための手段としては、第3図に示すよ
うな方法を用いることもできる。When the reflected light is received with such weighting and the difference between the outputs is taken by the differential amplifier 4, the difference output is the second
As shown by curve B in the figure, it is approximately proportional to the declination angle θ within a certain range, and therefore, the inclination angle of the minute portion of the surface to be measured that is hit by the light beam can be determined from the difference output. . Furthermore, the surface to be measured 1 is moved in the direction of arrow
The roughness curve f(x) can be obtained by integrating in the scanning direction of the light beam on the surface 1 to be measured. As a means for performing the above weighting, a method as shown in FIG. 3 can also be used.
すなわち、上記実施例では一般的に四角形状の光センサ
ーを用いることになるが、その光センサ−3a,3bを
中央で分断した三角形状または球面三角形状に形成し、
それらの頂角部分を突き合わせた状態で配置することに
より上記重みづけを行うこともできる。この場合、光セ
ンサーそのものを上記形状に形成しなくても、平板状ま
たは半球ドーム状の光センサーに三角形状の受光面を残
して他を覆いかくしても差支えない。このような形状の
光センサ−3a,3bを用いれば、光センサーの出力電
流が光の当る面積にほぼ比例するので、光源2からスリ
ツト7を経て被測定面1に投射した光の反射光の偏角θ
が小さいときは、その反射光が光センサーの中央に近い
位置にあるため出力が小さく、偏角θが大きいときは反
射光が光センサーの周辺部に当るために出力が大きくな
り、重みづけを行うことができる。That is, in the above embodiment, a quadrangular optical sensor is generally used, but the optical sensors 3a and 3b are formed into a triangular shape divided at the center or a spherical triangular shape,
The above-mentioned weighting can also be performed by arranging the apex portions so as to butt each other. In this case, the optical sensor itself does not have to be formed into the above-described shape, but a triangular light-receiving surface may be left on the flat or hemispherical dome-shaped optical sensor and the rest may be covered. If the optical sensors 3a and 3b having such a shape are used, the output current of the optical sensor is approximately proportional to the area hit by the light, so that the reflected light of the light projected from the light source 2 through the slit 7 onto the surface to be measured 1 is reduced. Declination angle θ
When θ is small, the output is small because the reflected light is close to the center of the optical sensor, and when the angle of deviation θ is large, the output is large because the reflected light hits the periphery of the optical sensor, which causes weighting. It can be carried out.
このような光センサーを用いた場合、反射率変化に対す
る補正は、左右の光センサ−3a,3bを各中央で二分
し、その間に一定幅の反射率検出用光センサ−8a,8
bを設けて、差動増幅器4で光センサ−3a,3bの出
力の差をとることにより被測定面1の傾角を検出し、反
射率検出用光センサ−8a,8bの出力の和で電圧制御
減衰器9の減衰率を制御すればよく、これによつて反射
率変化の影響を除去したあらさ曲線f(x)を得ること
ができる。なお、上記各方法において、光源2からの光
ビームを被測定面1に投射する場合、それを被測定面1
に対して直上入射させる必要はなく斜入射させることも
でき、この場合、一対の光センサーを被測定面が平面の
場合の正反射方向に設ければよく、これによつて左右の
光センサーの間に入射光の通路を形成する必要をなくす
ることができる。When such an optical sensor is used, correction for changes in reflectance can be achieved by dividing the left and right optical sensors 3a and 3b into two at the center, and connecting optical sensors 8a and 8 with a constant width between them.
b is provided, and the inclination of the surface to be measured 1 is detected by taking the difference between the outputs of the optical sensors 3a and 3b using the differential amplifier 4, and the voltage is determined by the sum of the outputs of the optical sensors 8a and 8b for detecting reflectance. It is only necessary to control the attenuation rate of the control attenuator 9, and thereby it is possible to obtain a roughness curve f(x) in which the influence of reflectance changes is removed. In addition, in each of the above methods, when projecting the light beam from the light source 2 onto the surface to be measured 1, the light beam is projected onto the surface to be measured 1.
It is not necessary to make the light incident directly on the surface of the object, but it is also possible to make it incident obliquely. In this case, it is sufficient to install a pair of photosensors in the direction of regular reflection when the surface to be measured is flat. It is possible to eliminate the need to form a path for incident light between the two.
また、この方法では被測定面1が乱反射面であつてもそ
のあらさ測定ができることは勿論である。以上に詳述し
たところから明らかなように、本発明の方法によれば、
被測定面のあらさ波形の微小部分における反射光をその
偏角θに応じて重みづけを行つて光センサーで受光し、
その光センサーの出力を簡単な回路系で処理することに
より非接触で被測定面のあらさ波形を測定することがで
き、特に被測定面が正反射面の場合のあらさ波形の測定
に極めて有効である。また、測定面からの反射光をその
中心の偏角に応じた重みづけを行う手段として、光セン
サーの前に光学くさびを配置するようにしたので、簡単
な手段により目的に応じた任意の重みづけを行うことが
できる。Furthermore, with this method, it is of course possible to measure the roughness of the surface to be measured 1 even if it is a diffusely reflecting surface. As is clear from the detailed explanation above, according to the method of the present invention,
The reflected light from the minute portion of the roughness waveform of the surface to be measured is weighted according to its polarization angle θ and received by the optical sensor.
By processing the output of the optical sensor with a simple circuit system, it is possible to measure the roughness waveform of the surface to be measured without contact, and it is especially effective for measuring the roughness waveform when the surface to be measured is a specular reflective surface. be. In addition, an optical wedge is placed in front of the optical sensor as a means of weighting the reflected light from the measurement surface according to the declination angle of its center. can be attached.
第1図は本発明の測定方法に関する説明図、第2図は差
動増幅器からの出力と反射光の偏角の関係を示す線図、
第3図は本発明の他の方法に関する説明図である。
1・・・・・・被測定面、2・・・・・・光源、3a,
3b・・・・・・光センサー、4・・・・・・差動増幅
器、5・・・・・・積分回路、6・・・・・・光学くさ
び、8a.8b・・・・・・反射率検出用光センサー、
9・・・・・・電圧制御減衰器。FIG. 1 is an explanatory diagram regarding the measurement method of the present invention, and FIG. 2 is a diagram showing the relationship between the output from the differential amplifier and the polarization angle of reflected light.
FIG. 3 is an explanatory diagram regarding another method of the present invention. 1... Surface to be measured, 2... Light source, 3a,
3b... Optical sensor, 4... Differential amplifier, 5... Integrating circuit, 6... Optical wedge, 8a. 8b... Optical sensor for detecting reflectance,
9... Voltage controlled attenuator.
Claims (1)
対して平行で細い光ビームを投射し、その被測定面が平
面の場合の正反射方向の左右両側に対称に一対の広い立
体角にわたる光センサーを配置して、被測定面からの反
射光をその中心の偏角に応じた重みづけを行つて上記セ
ンサーで受光し、差動増幅器で両光センサーの出力の差
をとることにより、被測定面上の微小部分の傾角を検出
し、これを被測定面上における光ビームの掃引方向に積
分してあらさ波形を得る方法において、上記左右の光セ
ンサーの前に、中心付近で反射光の吸収が多く、周辺付
近でその吸収が少ない光学くさびを配置することにより
、反射光の中心の偏角に応じた重みづけを行うことを特
徴とする光反射による傾角検出あらさ測定方法。 2 光源から被測定面のあらさ波形における微小部分に
対して平行で細い光ビームを投射し、その被測定面が平
面の場合の正反射方向の左右両側に対称に一対の広い立
体角にわたる光センサーを配置して、被測定面からの反
射光をその中心の偏角に応じた重みづけを行つて上記セ
ンサーで受光し、差動増幅器で両光センサーの出力の差
をとることにより、被測定面上の微小部分の傾角を検出
し、これを被測定面上における光ビームの掃引方向に積
分してあらさ波形を得る方法において、上記左右の光セ
ンサーの中央に一定幅の反射率検出用光センサーを配置
し、この反射率検出用光センサーの出力の和によつて差
動増幅器に接続した電圧制御減衰器を動作させることに
より、上記差動増幅器の出力の減衰率を制御し、被測定
面の反射率変化に対する補正を行うことを特徴とする光
反射による傾角検出あらさ測定方法。[Claims] 1. A light beam that is parallel and thin is projected from a light source onto a minute portion in the roughness waveform of a surface to be measured, and when the surface to be measured is a flat surface, a pair of parallel light beams are projected symmetrically on both sides of the specular reflection direction. An optical sensor covering a wide solid angle is arranged, and the reflected light from the surface to be measured is weighted according to the declination angle of the center and received by the sensor, and a differential amplifier is used to calculate the difference between the outputs of both optical sensors. In this method, a roughness waveform is obtained by detecting the inclination angle of a minute portion on the surface to be measured and integrating this in the scanning direction of the light beam on the surface to be measured. Inclination detection roughness measurement using optical reflection that weights reflected light according to the declination angle at the center by arranging an optical wedge that absorbs more reflected light in the vicinity and less absorption near the periphery. Method. 2. An optical sensor that projects a parallel, narrow light beam from a light source onto a minute portion of the roughness waveform of the surface to be measured, and covers a pair of wide solid angles symmetrically on both sides of the specular reflection direction when the surface to be measured is flat. The reflected light from the surface to be measured is weighted according to the declination angle of the center and received by the above sensor, and the difference between the outputs of both optical sensors is taken by a differential amplifier. In the method of obtaining a roughness waveform by detecting the inclination angle of a minute portion on a surface and integrating this in the scanning direction of the light beam on the surface to be measured, a reflectance detection light of a constant width is placed in the center of the left and right optical sensors. By arranging the sensor and operating the voltage-controlled attenuator connected to the differential amplifier by the sum of the outputs of the optical sensors for detecting reflectance, the attenuation rate of the output of the differential amplifier is controlled, and the attenuation rate of the output of the differential amplifier is controlled. A tilt angle detection roughness measurement method using light reflection, characterized by correcting changes in reflectance of a surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6429679A JPS5948324B2 (en) | 1979-05-24 | 1979-05-24 | Inclination detection roughness measurement method using light reflection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6429679A JPS5948324B2 (en) | 1979-05-24 | 1979-05-24 | Inclination detection roughness measurement method using light reflection |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5362874A Division JPS5918641B2 (en) | 1974-05-14 | 1974-05-14 | Inclination detection roughness measurement method using light reflection |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5543487A JPS5543487A (en) | 1980-03-27 |
| JPS5948324B2 true JPS5948324B2 (en) | 1984-11-26 |
Family
ID=13254130
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6429679A Expired JPS5948324B2 (en) | 1979-05-24 | 1979-05-24 | Inclination detection roughness measurement method using light reflection |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5948324B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60161923U (en) * | 1984-04-02 | 1985-10-28 | カネボウ株式会社 | Retractable cosmetic stick container |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3037622C2 (en) * | 1980-10-04 | 1987-02-26 | Theodor Prof. Dr.-Ing. 1000 Berlin Gast | Device for determining surface quality |
| JPS5815198U (en) * | 1981-07-22 | 1983-01-29 | 旭可鍛鉄株式会社 | heat treatment equipment |
| JPS61149092U (en) * | 1985-03-07 | 1986-09-13 | ||
| CN103018326A (en) * | 2012-11-29 | 2013-04-03 | 北京理工大学 | Contact type ultrasonic non-destructive testing straight-line automatic scanning device |
-
1979
- 1979-05-24 JP JP6429679A patent/JPS5948324B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60161923U (en) * | 1984-04-02 | 1985-10-28 | カネボウ株式会社 | Retractable cosmetic stick container |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5543487A (en) | 1980-03-27 |
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