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JPS5918641B2 - Inclination detection roughness measurement method using light reflection - Google Patents
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JPS5918641B2 - Inclination detection roughness measurement method using light reflection - Google Patents

Inclination detection roughness measurement method using light reflection

Info

Publication number
JPS5918641B2
JPS5918641B2 JP5362874A JP5362874A JPS5918641B2 JP S5918641 B2 JPS5918641 B2 JP S5918641B2 JP 5362874 A JP5362874 A JP 5362874A JP 5362874 A JP5362874 A JP 5362874A JP S5918641 B2 JPS5918641 B2 JP S5918641B2
Authority
JP
Japan
Prior art keywords
measured
light
optical sensors
roughness
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP5362874A
Other languages
Japanese (ja)
Other versions
JPS50146365A (en
Inventor
良司 村田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP5362874A priority Critical patent/JPS5918641B2/en
Publication of JPS50146365A publication Critical patent/JPS50146365A/ja
Publication of JPS5918641B2 publication Critical patent/JPS5918641B2/en
Expired legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Description

【発明の詳細な説明】 平行で細い光ビームを被測定面の微小部分に当て、その
面での正反射または乱反射の中心を捉えて被測定面上の
微小部分の傾角を検出し、それを光ビームの掃引方向に
積分すれば、被測定面のあらさ波形を得ることができる
[Detailed Description of the Invention] A parallel, thin beam of light is applied to a minute portion of the surface to be measured, and the center of specular reflection or diffuse reflection on that surface is detected to detect the tilt angle of the minute portion on the surface to be measured. By integrating in the scanning direction of the light beam, the roughness waveform of the surface to be measured can be obtained.

本発明は、このような原理を利用して被測定面のあらさ
波形を非接触で測定する方法に関するものである。
The present invention relates to a method of measuring the roughness waveform of a surface to be measured in a non-contact manner using such a principle.

この種の光反射を利用したあらさ測定において特に考慮
する必要があるのは、被測定面が鏡面のような正反射面
であるか、または粗面のような乱反射面であるかによつ
て、反射光の態様に差異があるということである。
What needs to be considered in particular when measuring roughness using this type of light reflection is whether the surface to be measured is a specular reflection surface such as a mirror surface or a diffuse reflection surface such as a rough surface. This means that there is a difference in the form of reflected light.

したがつて、希望的に歳そのいずれの反射面に適用して
も正確にあらさ測定できるようにすることが要求される
が、被測定面が鏡面であるか粗面であるかによつて装置
の一部に簡単な変更を加えるだけで変換できるような測
定方法であつても有効である。また、被測定面の反射率
が常に一定であるとは限らないため、被測定面の反射率
の変化に対応する補正を行ないながら測定できるように
することも必要である。本発明の測定方法は、このよう
な問題を考慮してあらさ波形を測定するようにしたもの
であり、基本的には、2個の光センサーと簡易な回路系
によつて非接触で測定できるように構成したことを特徴
とするのもである。以下に本発明の実施例について詳細
に説明する。
Therefore, it is necessary to be able to accurately measure the roughness even when applied to any reflecting surface, but depending on whether the surface to be measured is a mirror surface or a rough surface, the device Even a measurement method that can be converted by making a simple change to a part of the data is effective. Furthermore, since the reflectance of the surface to be measured is not always constant, it is also necessary to be able to perform measurements while making corrections corresponding to changes in the reflectance of the surface to be measured. The measurement method of the present invention measures the roughness waveform in consideration of such problems, and basically can be measured without contact using two optical sensors and a simple circuit system. It is also characterized by having the following structure. Examples of the present invention will be described in detail below.

まず、第1図にしたがつてあらさ波形を測定する方法は
、被測定面が乱反射面の場合に好適なものである。乱反
射する被測定面1のあらさ波形における微小部分に対し
て光源2からレーザ等の平行で細い光ビームを投射する
と、その反射光の強度分布頃図示したように被測定面の
微小部分の傾きに応じた偏角θをもつ方向に正反射があ
るが、その左右に比較的広く乱反射するような分布とな
る。
First, the method of measuring the roughness waveform according to FIG. 1 is suitable when the surface to be measured is a diffusely reflecting surface. When the light source 2 projects a parallel, thin beam of light such as a laser onto a minute portion of the roughness waveform of the surface to be measured 1 that reflects diffusely, the intensity distribution of the reflected light will change to the inclination of the minute portion of the surface to be measured, as shown in the figure. There is specular reflection in the direction with the corresponding declination angle θ, but the distribution is such that diffuse reflection is relatively wide to the left and right of the specular reflection.

そこで、被測定面1の直上に広い立体角にわたる受光面
をもつた左右対称の光センサー3a,3bを設け、両光
センサーで被測定面からの反射光を受光して、差動増幅
器4でそれらの出力の差をとると、第2図に示すような
出力特性が得られる。第2図に実線で示す曲線は上記差
動増幅器出力と偏角θとの関係を示すもので、反射光の
中心が光センサーから外れる程度に偏角θが大きくなつ
た場合は出力が0に近ずくが、一定範囲内においては出
力が偏角θにほ〜比例する。したがつて、この出力の検
出により被測定面上の光ビームが当つた微小部分の傾角
を知ることができる。なお、被測定面が鏡面であれば、
出力は同図に点線で示すような曲線になるため、この方
法によるあらさ測定は適当でない。
Therefore, symmetrical optical sensors 3a and 3b with light-receiving surfaces spanning a wide solid angle are provided directly above the surface to be measured 1, and both optical sensors receive the reflected light from the surface to be measured. By taking the difference between these outputs, output characteristics as shown in FIG. 2 are obtained. The curve shown by the solid line in Figure 2 shows the relationship between the differential amplifier output and the declination angle θ.If the declination angle θ increases to the extent that the center of the reflected light deviates from the optical sensor, the output becomes 0. However, within a certain range, the output is approximately proportional to the deflection angle θ. Therefore, by detecting this output, it is possible to know the inclination angle of the minute portion on the surface to be measured that is hit by the light beam. In addition, if the surface to be measured is a mirror surface,
Since the output becomes a curve as shown by the dotted line in the figure, it is not appropriate to measure roughness using this method.

そして、上記傾角の検出を行ないながら被測定面1を矢
印x方向に移動させ、その出力を積分回路5で被測定面
上における光ビームの掃引方向に積分することによりあ
らさ曲線f(X)を得ることができる。
Then, the surface to be measured 1 is moved in the direction of the arrow x while detecting the above-mentioned inclination angle, and the output thereof is integrated by the integrating circuit 5 in the sweeping direction of the light beam on the surface to be measured, thereby obtaining the roughness curve f(X). Obtainable.

この場合に、被測定面の反射率変化の補正は、増幅器6
a,6bを介して上記両光センサー3a,3bの和をと
り、それによつて差動増幅器4に接続した電圧制御減衰
器7を動作させて減衰率を制御することにより行なうも
のである。
In this case, correction of the change in reflectance of the surface to be measured is performed using the amplifier 6.
This is done by calculating the sum of the two optical sensors 3a and 3b via the optical sensors 3a and 6b, and operating the voltage-controlled attenuator 7 connected to the differential amplifier 4 to control the attenuation rate.

その結果、上記あらさ曲線f(x)における反射率変化
の影響を除去することができる。上記測定方法は、簡単
に反射率変化の補正を行なうことができ、また2個の光
センサーと簡易な回路系によつて測定装置を構成できる
点において有利なものである。
As a result, the influence of reflectance changes on the roughness curve f(x) can be removed. The above measurement method is advantageous in that reflectance changes can be easily corrected and a measurement device can be configured with two optical sensors and a simple circuit system.

しかしながら、被測定面が鏡面の場合には、偏角θが比
較的小さいときでも反射光の殆んどが一方の光センサー
に当ることになり、あらさ測定が困難となる(第2図点
線参照)。
However, if the surface to be measured is a mirror surface, most of the reflected light will hit one of the optical sensors even when the deflection angle θ is relatively small, making roughness measurement difficult (see the dotted line in Figure 2). ).

第3図の方法は、サーボ機構を利用してこのような問題
を解決したものであり、被測定面が粗面のような乱反射
面であつても、鏡面のような正反射面であつても、その
あらさ測定を行なうことができる。
The method shown in Figure 3 solves this problem by using a servo mechanism, and can be used to measure whether the surface to be measured is a rough reflecting surface or a regular reflecting surface such as a mirror surface. The roughness can also be measured.

すなわち、第3図の方法では、第1図の場合と同様に接
続した電圧制御減衰器7からの出力を誤差出力としてサ
ーボ機構8に送り、このサーボ機構8によつて被測定面
からの反射光の中心を左右の光センサー3a,3bの中
心で受けるように制制することにより、上記減衰器7か
らの出力を0に追尾させる。
That is, in the method shown in FIG. 3, the output from the voltage-controlled attenuator 7 connected in the same way as in the case of FIG. By controlling the center of the light so that it is received at the center of the left and right optical sensors 3a and 3b, the output from the attenuator 7 is tracked to zero.

この場合、サーボ機構8による制御動作としては、光源
2および光センサー3a,3bを一体化した反射光検出
部9をサーボモータMによつて機械的に回転させたり、
あるいは反射光をサーボミラーに当ててこのサーボミラ
ーをサーボモータで回転させたりするような動作を行な
わせることができる。このサーボ機構8の制御動作に連
動して、光ビームを投射した被測定面上の微小部分の傾
角に相当する出力を発生させ、これを積分回路5で被測
定面上における光ビームの掃引方向に積分することによ
り、あらさ曲線f(x)を得ることができる。
In this case, the control operation by the servo mechanism 8 includes mechanically rotating the reflected light detection section 9, which integrates the light source 2 and the optical sensors 3a and 3b, with the servo motor M;
Alternatively, the servo mirror can be rotated by a servo motor by applying reflected light to the servo mirror. In conjunction with the control operation of this servo mechanism 8, an output corresponding to the inclination angle of a minute portion on the surface to be measured onto which the light beam is projected is generated, and this output is sent to the integrating circuit 5 in the direction in which the light beam is swept on the surface to be measured. By integrating the roughness curve f(x), it is possible to obtain the roughness curve f(x).

なお、この場合に被測定面の反射率変化が補正されてい
ることは勿論である。上記方法によれば、鏡面等の正反
射面のあらさ測定を行なうのに有効ではあるが、その場
合、サーボ機構を用いるため応答が遅くなるという問題
がある。
In this case, it goes without saying that the change in reflectance of the surface to be measured is corrected. Although the above method is effective for measuring the roughness of specular reflection surfaces such as mirror surfaces, there is a problem in that the response is slow because a servo mechanism is used.

したがつて、測定に時間的余裕がある場合であればよい
が、測定を高速で行なう必要がある場合には、次のよう
な方法が適している。すなわち、第4図に示す場合は、
左右の光センサー3a,3bと被測定面1との間に光拡
散板10を配置し、被測定面からの反射光を乱反射化す
るようにしたもので、この光拡散板10を用いるだけで
第1図の方法における乱反射面のあらさ測定の場合と全
く同様にして鏡面等の正反射面のあらさ測定を行なうこ
とができる。被測定面が乱反射面であつてもそのあらさ
測定ができることは勿論であり、また被測定面の反射率
変化の補正も第1図の場合と同様にして行なうことがで
きる。なお、以上に説明した各方法において、光源2か
らの光ビームを被測定面1に投射する場合、それを被測
定面に対して直上入射させる必要はなく、斜入射させる
こともでき、この場合、一対の光センサーを被測定面が
平面の場合の正反射方向に設ければよく、これによつて
左右の光センサーの間に入射光の通路を形成する必要を
なくすことができる。
Therefore, the following method is suitable as long as there is sufficient time for measurement, but if measurement needs to be performed at high speed, the following method is suitable. That is, in the case shown in Figure 4,
A light diffusing plate 10 is placed between the left and right optical sensors 3a, 3b and the surface to be measured 1 to diffuse the reflected light from the surface to be measured. The roughness of a specular reflection surface such as a mirror surface can be measured in exactly the same way as the roughness measurement of a diffuse reflection surface using the method shown in FIG. Even if the surface to be measured is a diffusely reflecting surface, it is of course possible to measure its roughness, and correction of changes in reflectance of the surface to be measured can also be performed in the same manner as in the case of FIG. In addition, in each of the methods described above, when projecting the light beam from the light source 2 onto the surface to be measured 1, it is not necessary to make it incident directly on the surface to be measured, but it can also be made obliquely incident; , a pair of optical sensors may be provided in the specular reflection direction when the surface to be measured is a flat surface, thereby eliminating the need to form a path for incident light between the left and right optical sensors.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の測定方法に関する説明図、第2図は差
動増幅器からの出力と反射光の偏角の関係を示す線図、
第3図および第4図は本発明の他の実施例に関する説明
図である。 1・・・・・・被測定面、2・・・・・・光源、3a,
3b・・・・・・光センサー、4・・・・・・差動増幅
器、5・・・・・・積分回路、6a,6b・・・・・・
増幅器、7・・・・・・電圧制御減衰器、8・・・・・
・サーボ機構、9・・・・・・反射光検出部、10・・
・・・・光拡散板。
FIG. 1 is an explanatory diagram regarding the measurement method of the present invention, and FIG. 2 is a diagram showing the relationship between the output from the differential amplifier and the polarization angle of reflected light.
FIGS. 3 and 4 are explanatory diagrams regarding other embodiments of the present invention. 1... Surface to be measured, 2... Light source, 3a,
3b...Photo sensor, 4...Differential amplifier, 5...Integrator circuit, 6a, 6b...
Amplifier, 7... Voltage controlled attenuator, 8...
・Servo mechanism, 9...Reflected light detection section, 10...
...Light diffusion plate.

Claims (1)

【特許請求の範囲】 1 光源から被測定面のあらさ波形における微小部分に
対して平行で細い光ビームを投射し、その被測定面が平
面の場合の正反射方向の左右両側に対称に一対の広い立
体角にわたる光センサーを配置して、両光センサーで被
測定面からの反射光を受光し、差動増幅器で両センサー
の出力の差をとることにより被測定面上の微小部分の傾
角を検出し、その差動増幅器に接続した電圧制御減衰器
を両光センサーの出力の和によつて動作させることによ
り、上記差動増幅器からの出力の減衰率を制御して、被
測定面の反射率変化に対する補正を行ない、これを被測
定面上における光ビームの掃引方向に積分することによ
りあらさ波形を得ることを特徴とする光反射による傾角
検出あらさ測定方法。 2 光源から被測定面にあらさ波形における微小部分に
対して平行で細い光ビームを投射し、その被測定面が平
面の場合の正反射方向の左右両側に対称に一対の広い立
体角にわたる光センサーを配置して、両光センサーで被
測定面からの反射光を受光し、差動増幅器で両光センサ
ーの出力の差をとり、その差動増幅器に接続した電圧制
御減衰器を両光センサーの出力の和によつて動作させる
ことにより、上記差動増幅器からの出力の減衰率を制御
し、その電圧制御減衰器からの出力を誤差出力としてサ
ーボ機構に送り、このサーボ機構によつて被測定面から
の反射光の中心を前記左右の光センサーの中心で受ける
ように制御することにより、上記減衰器からの出力を0
に追尾させ、サーボ機構の上記制御に連動して、光ビー
ムを投射した被測定面上の微小部分の傾角に相当する出
力を発生させ、それを被測定面上における光ビームの掃
引方向に積分することによりあらさ波形を得ることを特
徴とする光反射による傾角検出あらさ測定方法。 3 光源から被測定面のあらさ波形における微小部分に
対して平行で細い光ビームを投射し、その被測定面が平
面の場合の正反射方向の左右両側に対称に一対の広い立
体角にわたる光センサーを配置して、両光センサーで被
測定面からの反射光を受光し、差動増幅器で両センサー
の出力の差をとることにより被測定面上の微小部分の傾
角を検出し、その差動増幅器に接続した電圧制御減衰器
を両光センサーの出力の和によつて動作させることによ
り、上記差動増幅器からの出力の減衰率を制御して、被
測定面の反射率変化に対する補正を行ない、これを被測
定面上における光ビームの掃引方向に積分することによ
りあらさ波形を得る方法において、上記左右の光センサ
ーと被測定面との間に光拡散板を配置し、被測定面から
の反射光を乱反射化することを特徴とする光反射による
傾角検出あらさ測定方法。
[Claims] 1. A light beam that is parallel and thin is projected from a light source onto a minute portion in the roughness waveform of a surface to be measured, and when the surface to be measured is a flat surface, a pair of parallel light beams are projected symmetrically on both sides of the specular reflection direction. By arranging optical sensors covering a wide solid angle, both optical sensors receive reflected light from the surface to be measured, and a differential amplifier calculates the difference between the outputs of both sensors to calculate the tilt angle of a minute portion on the surface to be measured. By operating a voltage-controlled attenuator connected to the differential amplifier based on the sum of the outputs of both optical sensors, the attenuation rate of the output from the differential amplifier is controlled, and the reflection on the surface to be measured is controlled. An inclination detection roughness measurement method using light reflection, characterized in that a roughness waveform is obtained by correcting for a change in ratio and integrating the correction in a direction in which a light beam is swept on a surface to be measured. 2. An optical sensor that projects a narrow light beam parallel to the minute portion of the roughness waveform from a light source onto the surface to be measured, and covers a pair of wide solid angles symmetrically on both sides of the specular reflection direction when the surface to be measured is flat. , both optical sensors receive the reflected light from the surface to be measured, a differential amplifier takes the difference between the outputs of both optical sensors, and a voltage-controlled attenuator connected to the differential amplifier is connected to the output of both optical sensors. By operating based on the sum of the outputs, the attenuation rate of the output from the differential amplifier is controlled, and the output from the voltage-controlled attenuator is sent to the servo mechanism as an error output, and this servo mechanism By controlling the center of the reflected light from the surface to be received at the center of the left and right optical sensors, the output from the attenuator is reduced to 0.
In conjunction with the above-mentioned control of the servo mechanism, an output corresponding to the inclination of the minute portion on the surface to be measured on which the light beam is projected is generated, and this is integrated in the sweeping direction of the light beam on the surface to be measured. A method for measuring roughness by detecting an inclination angle by light reflection, which is characterized by obtaining a roughness waveform by 3. An optical sensor that projects a parallel, narrow light beam from a light source to a minute portion of the roughness waveform of the surface to be measured, and covers a pair of wide solid angles symmetrically on both sides of the specular reflection direction when the surface to be measured is flat. is placed, both optical sensors receive the reflected light from the surface to be measured, and a differential amplifier detects the inclination angle of a minute portion on the surface to be measured by taking the difference between the outputs of both sensors. By operating a voltage-controlled attenuator connected to the amplifier based on the sum of the outputs of both optical sensors, the attenuation rate of the output from the differential amplifier is controlled and correction is made for changes in the reflectance of the surface to be measured. In the method of obtaining the roughness waveform by integrating this in the sweeping direction of the light beam on the surface to be measured, a light diffusing plate is placed between the left and right optical sensors and the surface to be measured, and the roughness waveform from the surface to be measured is obtained. A tilt angle detection roughness measurement method using light reflection, which is characterized by making reflected light diffusely reflected.
JP5362874A 1974-05-14 1974-05-14 Inclination detection roughness measurement method using light reflection Expired JPS5918641B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5362874A JPS5918641B2 (en) 1974-05-14 1974-05-14 Inclination detection roughness measurement method using light reflection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5362874A JPS5918641B2 (en) 1974-05-14 1974-05-14 Inclination detection roughness measurement method using light reflection

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP6429679A Division JPS5948324B2 (en) 1979-05-24 1979-05-24 Inclination detection roughness measurement method using light reflection

Publications (2)

Publication Number Publication Date
JPS50146365A JPS50146365A (en) 1975-11-25
JPS5918641B2 true JPS5918641B2 (en) 1984-04-28

Family

ID=12948163

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5362874A Expired JPS5918641B2 (en) 1974-05-14 1974-05-14 Inclination detection roughness measurement method using light reflection

Country Status (1)

Country Link
JP (1) JPS5918641B2 (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4910067A (en) * 1972-05-25 1974-01-29

Also Published As

Publication number Publication date
JPS50146365A (en) 1975-11-25

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