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JPS599115B2 - hand tie memory - Google Patents
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JPS599115B2 - hand tie memory - Google Patents

hand tie memory

Info

Publication number
JPS599115B2
JPS599115B2 JP50148400A JP14840075A JPS599115B2 JP S599115 B2 JPS599115 B2 JP S599115B2 JP 50148400 A JP50148400 A JP 50148400A JP 14840075 A JP14840075 A JP 14840075A JP S599115 B2 JPS599115 B2 JP S599115B2
Authority
JP
Japan
Prior art keywords
voltage
pair
data lines
rewrite
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP50148400A
Other languages
Japanese (ja)
Other versions
JPS5272539A (en
Inventor
清男 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP50148400A priority Critical patent/JPS599115B2/en
Publication of JPS5272539A publication Critical patent/JPS5272539A/en
Publication of JPS599115B2 publication Critical patent/JPS599115B2/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4097Bit-line organisation, e.g. bit-line layout, folded bit lines

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)

Description

【発明の詳細な説明】 本発明は、データ線と交差する再書込信号線に発生する
メモリセルヘの再書込みパルスによるデータ線のアンバ
ランスを避けた半導体メモリに関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a semiconductor memory that avoids data line imbalance due to a rewrite pulse to a memory cell generated in a rewrite signal line that intersects with a data line.

従来高感度センスアンプとして第1図に示すような電荷
移送型のアンプが使用されていた。
Conventionally, a charge transfer type amplifier as shown in FIG. 1 has been used as a high-sensitivity sense amplifier.

この回路動作は以下の通りである。すなわちトランジス
タQpのゲートにプリチヤージ信号を印加して出力線D
Lとデータ線Dをブリチヤージしておく。ただし、Qt
のゲートには電圧VR(ただしVR<VDD)を印加し
ておく。次にワード線Wにパルスを印加して、メモリセ
ルMCの記憶情報を読み出す。この結果、Dの電圧は、
上記プリチヤージ電圧から微少に変化する。この変化す
る電圧はCsに比べてCdが大きければ大きいほど小さ
さい。しカルCo−Csでありさえすれば、たとえDに
現われる電圧が小さくても、DLには十分大きな電圧変
化として現われる。この場合Qtは一種の増幅器(アン
プ)として作用する(詳細はISSCC75Sessi
onX■Memory、“High−Sensitiv
eCharge−TransferSenseAmpl
i−fier”参照)。このようなメモリの特長として
、MCを読み出した後、MCに再書きこみする必要があ
る。この動作は図中のような1種のアンド回路AND(
アンプでもよい)で再書きこみ命◆信号R/Wによつて
、Qtを介して所定のMCから読み出された結果の信号
電圧を再書きこみする。しかし、差動増巾器で結ばれた
電気的に平衡した1対のデータ線の夫々に再書込み用の
回路を設ける場合には、片側のみに再書込命令信号R/
Wを入力することには問題がある。すなわち、R/W信
号線とデータ線との交差点に結合容量が存在するから、
片系のみに再書込命令信号R/Wを入力するとこの結合
容量により片方のみに電圧が生じじてしまう。本発明は
この欠点を解消するもので、以下実施例によつて詳細に
説明する。第2図は、電気的に平衡な2本のデータ線D
、Dの中間に、アンプと上記再書きこみ(あるいは書き
こみ)回路を付加したメモリである。
The operation of this circuit is as follows. That is, by applying a precharge signal to the gate of the transistor Qp, the output line D
Breach L and data line D. However, Qt
A voltage VR (where VR<VDD) is applied to the gate of. Next, a pulse is applied to the word line W to read out the information stored in the memory cell MC. As a result, the voltage of D is
It changes slightly from the above precharge voltage. The larger Cd is compared to Cs, the smaller this changing voltage becomes. As long as the voltage is Co-Cs, even if the voltage appearing at D is small, it will appear as a sufficiently large voltage change at DL. In this case, Qt acts as a kind of amplifier (for details, see ISSCC75Sessi
onX Memory, “High-Sensitive
eCharge-TransferSenseAmpl
i-fier"). A feature of this type of memory is that after reading the MC, it is necessary to rewrite the MC. This operation is performed using a type of AND circuit AND (
An amplifier may be used) to rewrite the resulting signal voltage read from a predetermined MC via Qt using the rewrite command ◆signal R/W. However, if a rewriting circuit is provided for each of a pair of electrically balanced data lines connected by a differential amplifier, the rewriting command signal R/
There is a problem with inputting W. In other words, since there is a coupling capacitance at the intersection of the R/W signal line and the data line,
If the rewrite command signal R/W is input to only one system, a voltage will be generated only in one system due to this coupling capacitance. The present invention solves this drawback and will be explained in detail below using examples. Figure 2 shows two electrically balanced data lines D.
, D, an amplifier and the rewriting (or writing) circuit described above are added to the memory.

この場合、夫々の再書込回路に設けられたR/W信号線
は2本のデータ線と夫々交差することとなる。つまり、
半導体メモリは、第2図のメモリ回路が上下に多数並ん
でいる。R/W信号線はデータ線に対して垂直方向に配
して、各メモリ回路に接続されるので、データ線と交差
することになるのである(図示せず)。端子AをVR(
VRくDD−)にしておき、Qp,Qp−によつてDL
,DL,D,Dをプリチヤージした後で、周知のように
MCと雑音相殺用のダミーセルDCをそのワード線W,
DWに電圧を加えることによつて選択して、DL,DL
に差動の読み出し信号をとり出す。この後でR/Wを0
NにしてAND,AND(アンプでもよい)を動作させ
て、Qw,Owのゲート電圧(これは結局は読み出し時
のMCの記憶容量Csの電圧で決まる)に応じてMCに
再書きこみする。すなわちR/Wl)50Nになる直前
のDLが、DLに比べて低電圧なら、(MCO)Csの
電圧が低電圧に対応)Qwのゲート電圧は低電圧(0)
のままである。なぜならQwのゲート電圧はプリチヤー
ジ時に0に送電しているためである。一方DLはD.L
に比べて高電圧のためQ1のゲートは高電圧に充電され
る結果、Dは?によつで高電圧に充電される。もしMC
O)Csの電圧が高電圧なら、上記とは逆にQwのゲー
ト電圧は高電圧になつてMCには高電圧が再書きこみさ
れる。この回路の問題点はMCO)Csの電圧が低い場
合に読そ出されて、この読み出し信号を検出してQwを
用いて低電圧をMCに再書きこみする場合である。なぜ
ならCsくCdのために、再書きこみ時点でのDの電圧
が読み出し完了後のほぼR−V,h(Th:Q,のしき
い電圧)近傍の高電圧であり、しかもQwのゲート電圧
が0VのためにQwはカツトオフになつている。このた
めMCには低電圧(0)が書きこめないことにある。こ
れを解決するための差動増幅器がQ2,Q2である。す
なわち端子Bは読み出し時にはQ2,Q2がカツトオフ
になつているように、十分高電圧(〉VR−Th)にし
ておき、再書きこみ時には、低電圧(0)にする。この
時DはQwによつて高電圧に充電され続けており、一方
?はカツトオフのためDはDよりも高い高圧になつてい
るからQ2,Q2によつて高速にフイードバツクされて
DはOに放電してしまう。この結果MCに低電圧が再書
きこみされる。なおこの回路の特長はQw,Qwのいず
れかが必らずカツトオフのためほぼダイナミツク動作を
行うので低消費電力であることである。なお再書きこみ
動作をさらに速めるために、この動作時に端子Aを0に
してQl,Qtをカツトオフにし、DL,Dl,の容量
がQw,″Qwの負荷になりないようにしてもよい。さ
て再書きこみ完了後に、Qt,Q,で1),Dをプリチ
ヤージ(このタイプの電荷移送型アンプではこの電圧レ
ベルはほぼR−Vthにしなければならない)しようと
しても、その直前の再書きこみ時点でD,Dのいずれか
は十分高電圧(〜DD−Th)に充電され、他方はOに
放電されているので、プリチヤージ時に端子AがVR(
くDD)である限り、高電圧に充電されたデータ線は、
それにつながるQ,あるいはQ,がカツトオフのため、
決してVR−Vthにプリチヤージすることはできない
。そこでプリチヤージ信号で0NするQ,を用いる。も
し再書きこみされた結果、Dが0,DがVDD−Thに
なつているものとする。CEが0N7!Q1が0Nとす
ると、D,Dの容量はほぼ等しいために、D,−
1Dの電圧はほぼl(DO−,h)と等し
くなる。
In this case, the R/W signal line provided in each rewrite circuit crosses the two data lines. In other words,
A semiconductor memory has a large number of memory circuits shown in FIG. 2 arranged vertically. Since the R/W signal line is arranged perpendicularly to the data line and connected to each memory circuit, it crosses the data line (not shown). Connect terminal A to VR (
Set VR to DD-) and use Qp, Qp- to DL
, DL, D, and D, MC and a dummy cell DC for noise cancellation are connected to the word lines W, DL, D, and D, as is well known.
Select by applying voltage to DW, DL, DL
A differential readout signal is extracted. After this, set R/W to 0
By setting it to N and operating the AND (an amplifier may be used), the MC is rewritten according to the gate voltages of Qw and Ow (this is ultimately determined by the voltage of the MC's storage capacity Cs at the time of reading). In other words, if DL just before reaching R/Wl)50N is a low voltage compared to DL, the gate voltage of (MCO)Cs corresponds to a low voltage) Qw's gate voltage is a low voltage (0).
It remains as it is. This is because the gate voltage of Qw is transmitted to 0 during precharging. On the other hand, DL is D. L
As a result, the gate of Q1 is charged to a high voltage due to the high voltage compared to D. The battery is charged to high voltage. If MC
O) If the voltage of Cs is a high voltage, contrary to the above, the gate voltage of Qw becomes a high voltage, and the high voltage is rewritten to MC. The problem with this circuit is that it is read when the voltage of MCO)Cs is low, and this read signal is detected and Qw is used to rewrite the low voltage to MC. Because Cs and Cd, the voltage of D at the time of rewriting is a high voltage close to R-V,h (threshold voltage of Th:Q,) after completion of reading, and the gate voltage of Qw is 0V, so Qw is cut off. For this reason, a low voltage (0) cannot be written to the MC. Differential amplifiers Q2 and Q2 are used to solve this problem. That is, terminal B is set to a sufficiently high voltage (>VR-Th) so that Q2 and Q2 are cut off during reading, and is set to a low voltage (0) during rewriting. At this time, D continues to be charged to a high voltage by Qw, and on the other hand? Since D is at a high voltage higher than D due to cut-off, D is fed back quickly by Q2 and Q2, and D is discharged to O. As a result, the low voltage is rewritten to the MC. The feature of this circuit is that either Qw or Qw is always cut off, so almost dynamic operation is performed, so power consumption is low. In order to further speed up the rewriting operation, the terminal A may be set to 0 during this operation to cut off Ql and Qt so that the capacitances of DL and Dl do not become a load on Qw and ``Qw. Even if you try to pre-charge Qt, Q, 1) and D after the rewriting is completed (in this type of charge transfer amplifier, this voltage level must be approximately R-Vth), the rewriting point just before that Since either D or D is charged to a sufficiently high voltage (~DD-Th) and the other is discharged to O, terminal A becomes VR (VR) during pre-charging.
As long as the data line is charged to a high voltage,
Because the Q or Q that leads to this is cut off,
It is never possible to precharge to VR-Vth. Therefore, Q, which is 0N with a precharge signal, is used. Assume that as a result of rewriting, D becomes 0 and D becomes VDD-Th. CE is 0N7! If Q1 is 0N, the capacitances of D and D are almost equal, so D, -
The voltage of 1D is approximately equal to l(DO-, h).

この電圧がVR−,hよりも小さければ、Qt,Qtは
0Nする結果、D,′DはVR−,hまでプリチヤージ
されて、次の読み出し動作が正常に行われるための条件
を整う。このように本実施例ではデータ線の夫々の再書
込回路に再書込命令信号R/Wを与えているから、夫々
の側のデータ線とR/W信号線との交差点の結合容量に
より発生する静電誘導電位がバランスする。したがつて
2つの再書込回路を区別することなく、同時に再書込信
号を与えることができるので、再書込信号を発生する回
路を共通にすることができ、回路が簡単になるという効
果がある。また第3図は、電気的に平衡した2本のデー
タ線と、ワード線の交点のいずれか一方にだけ接続され
たメモリセルからの読み出し信号を検出する、いわゆる
2交点/ビツトメモリセル方式に上記発明を適用した例
である。
If this voltage is smaller than VR-,h, Qt and Qt are turned ON, and as a result, D and 'D are precharged to VR-,h, thereby establishing the conditions for the next read operation to be performed normally. In this embodiment, since the rewrite command signal R/W is given to each rewrite circuit of the data line, the coupling capacitance at the intersection of the data line and the R/W signal line on each side The electrostatic induction potentials generated are balanced. Therefore, the rewrite signal can be given at the same time without distinguishing between the two rewrite circuits, so the circuit that generates the rewrite signal can be shared, which has the effect of simplifying the circuit. There is. Figure 3 also shows the so-called two-intersection/bit memory cell method, which detects a read signal from a memory cell connected only to one of the intersections of two electrically balanced data lines and a word line. This is an example to which the above invention is applied.

動作ぱ第2図と同様である。この場合は、データ線が折
り返し配置される。つまり、半導体メモリは、第3図の
メモリ回路が上下に多数並ぶ構造となるので、R/W信
号線はデータ線に対して垂直方向に配され、各メモリ回
路に接続されることになる。したがつて、R/W信号線
は2本のデータ線と夫々交錯することになり(図示せず
)、夫々のデータ線と結合容量を有することになる。し
たがつて、一方の再書込回路に再書込命令信号R/Wを
加えても、両方のデータ線に同様に静電誘導による電位
が生ずるので、電気的な平衡を保つことができる。又、
2本のデータ線分のスペースを再書込回路の配置に用い
ることができ、第2図のような1本のデータ線のスペー
スのものと比べて、再書込回路のレイアウトが楽になる
という効果もある。なお第2,3回でQw,Qwのゲー
トの電圧は読み出し信号として差動信号D。
The operation is similar to that shown in FIG. In this case, the data lines are arranged in a folded manner. That is, since the semiconductor memory has a structure in which a large number of memory circuits shown in FIG. 3 are arranged vertically, the R/W signal line is arranged perpendicularly to the data line and connected to each memory circuit. Therefore, the R/W signal line crosses each of the two data lines (not shown) and has a coupling capacitance with each data line. Therefore, even if the rewrite command signal R/W is applied to one rewrite circuit, a potential due to electrostatic induction is similarly generated in both data lines, so that electrical balance can be maintained. or,
The space for two data lines can be used for arranging the rewriting circuit, making the layout of the rewriting circuit easier compared to the space for one data line as shown in Figure 2. It's also effective. Note that in the second and third times, the voltage at the gates of Qw and Qw is a differential signal D as a read signal.

,DOという形で外部にとり出せる。また書きこみ時に
は、Qw,Qwのゲート電圧を差動に制御すれば、外部
からの書きこみデータ信号をMCに書きこめることは自
明であろう。なおANDは前述したようにアンプでもよ
いわけだが、その具体例を2交点/ビツトメモリセル方
式を例に第4図に示した。
, DO. Furthermore, it is obvious that during writing, if the gate voltages of Qw and Qw are controlled differentially, a write data signal from the outside can be written to the MC. Note that the AND may be an amplifier as described above, but a specific example thereof is shown in FIG. 4 using a two-intersection/bit memory cell system as an example.

かつこ内Kの部分が第3図のAND,ANDに相当する
。動作は以下のようにして行われる。Q4,Q4のゲー
トにQtを通して現われた信号を、それまで高レベルで
(Q3,Q3がカツトオフになるように)あつたφPa
をOにしてQ3,Q3をオンにして増幅して、Qイ,Q
4のいずれかを読み出し情報に応じて、片方を0Vに放
電し、他方を高レベルに保持しておく。次にQ4,Q4
もカツトオフにしておくために高レベルにしていたφ,
を、上記φ8による動作が完了し、すなわちQ4,Q4
のゲートのいずれかがほぼOに放電された後で0にする
。これによつて、もしQ4のゲートが0VならQ6のゲ
ートはQ5によつて予めプリチヤージされている高レベ
ルのままであり、一方この場合Q4のゲートは高レベル
であるから、Q4がオンしてQ6のゲートは放電して0
Vになる。この後でR/Wをオン(高レベルにする)す
ると、Qwのゲートは、R/Wをオンする直前までの電
圧、すなわちOのままであるからカツトオフになる。一
方Q6はオンであるから、QwのゲートOから高電圧に
充電される結果、QwはオンとなりDは高レベルが充電
される。以上のように、本発明によれば、2つの再書込
回路の区別をすることなく同時に再書込信号を与えても
2本のデータ線の電気的平衡を保つことができるので、
再書込信号を送出する回路を共通することができ回路が
簡単になるという効果がある。又、他の発明では、1つ
の再書込回路に再書込信号を与えたとしても2本のデー
タ線の電気的平衡を保つことができ、さらに、再書込回
路のレイアウトが楽になるという効果がある。
The part K in the box corresponds to AND in FIG. 3. The operation is performed as follows. The signal appearing at the gates of Q4 and Q4 through Qt is changed to φPa, which was previously at a high level (so that Q3 and Q3 are cut off).
is set to O, Q3, Q3 are turned on and amplified, and Qi, Q
Depending on the read information, one is discharged to 0V and the other is held at a high level. Next, Q4, Q4
φ, which was set to a high level to keep it cut off,
, the operation by φ8 is completed, that is, Q4, Q4
0 after any of the gates of is discharged to approximately 0. This ensures that if the gate of Q4 is 0V, the gate of Q6 remains at a high level precharged by Q5, while in this case the gate of Q4 is at a high level, so Q4 is turned on. The gate of Q6 is discharged to 0
It becomes V. After this, when R/W is turned on (set to high level), the gate of Qw remains at the voltage just before turning on R/W, that is, O, and is therefore cut off. On the other hand, since Q6 is on, the gate O of Qw is charged to a high voltage, so that Qw is on and D is charged to a high level. As described above, according to the present invention, it is possible to maintain electrical balance between the two data lines even if rewrite signals are applied simultaneously without distinguishing between the two rewrite circuits.
This has the effect that the circuit for sending out the rewrite signal can be shared, which simplifies the circuit. In another invention, even if a rewrite signal is given to one rewrite circuit, the electrical balance between the two data lines can be maintained, and furthermore, the layout of the rewrite circuit can be made easier. effective.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の回路図、第2〜4図は本発明の実施例で
ある。
FIG. 1 is a conventional circuit diagram, and FIGS. 2 to 4 are examples of the present invention.

Claims (1)

【特許請求の範囲】 1 1対のデータ線と、該1対のデータ線の電位を差動
に増巾して一方のデータ線の電位を第一電位レベルにす
る差動増巾器と、該1対のデータ線に夫々対応して設け
られ対応するデータ線の電位が第二電位レベルのときに
、再書込信号により該対応するデータ線を第三電位レベ
ルにする1対の第一の手段と、該1対の第一の手段に再
書込信号を同時に送出する第2の手段とを有することを
特徴とする半導体メモリ。 2 折り返し配置された1対のデータ線と、該1対のデ
ータ線の電位を差動に増巾して一方のデータ線の電位を
第一電位レベルにする差動増巾器と、該1対のデータ線
に夫々対応して設けられ、対応するデータ線の電位が第
二電位レベルのときに、再書込信号により該対応するデ
ータ線を第三電位レベルにする1対の第一の手段と、該
1対の第一の手段に再書込信号を送出する第二の手段と
を有することを特徴とする半導体メモリ。
[Scope of Claims] 1. A pair of data lines, and a differential amplifier that differentially amplifies the potentials of the pair of data lines to bring the potential of one data line to a first potential level; A pair of first circuits are provided corresponding to the pair of data lines, and set the corresponding data lines to a third potential level by a rewrite signal when the potential of the corresponding data lines is at the second potential level. and second means for simultaneously sending a rewrite signal to the pair of first means. 2 a pair of folded data lines; a differential amplifier that differentially amplifies the potentials of the pair of data lines to bring the potential of one data line to a first potential level; A pair of first electrodes are provided corresponding to each pair of data lines, and when the potential of the corresponding data line is at the second potential level, the rewrite signal causes the corresponding data line to be at the third potential level. A semiconductor memory comprising: means; and second means for sending a rewrite signal to the first means of the pair.
JP50148400A 1975-12-15 1975-12-15 hand tie memory Expired JPS599115B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50148400A JPS599115B2 (en) 1975-12-15 1975-12-15 hand tie memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50148400A JPS599115B2 (en) 1975-12-15 1975-12-15 hand tie memory

Publications (2)

Publication Number Publication Date
JPS5272539A JPS5272539A (en) 1977-06-17
JPS599115B2 true JPS599115B2 (en) 1984-02-29

Family

ID=15451925

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50148400A Expired JPS599115B2 (en) 1975-12-15 1975-12-15 hand tie memory

Country Status (1)

Country Link
JP (1) JPS599115B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6317193A (en) * 1986-07-09 1988-01-25 ヤマハ発動機株式会社 Exhuast pipe device for motorcycle

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6317193A (en) * 1986-07-09 1988-01-25 ヤマハ発動機株式会社 Exhuast pipe device for motorcycle

Also Published As

Publication number Publication date
JPS5272539A (en) 1977-06-17

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