JPS599230B2 - How to clean the insulator surface - Google Patents
How to clean the insulator surfaceInfo
- Publication number
- JPS599230B2 JPS599230B2 JP5765576A JP5765576A JPS599230B2 JP S599230 B2 JPS599230 B2 JP S599230B2 JP 5765576 A JP5765576 A JP 5765576A JP 5765576 A JP5765576 A JP 5765576A JP S599230 B2 JPS599230 B2 JP S599230B2
- Authority
- JP
- Japan
- Prior art keywords
- resin
- marking
- mark
- corona discharge
- dust
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000012212 insulator Substances 0.000 title description 7
- 239000000428 dust Substances 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 16
- 238000004140 cleaning Methods 0.000 claims description 11
- 229920005989 resin Polymers 0.000 claims description 7
- 239000011347 resin Substances 0.000 claims description 7
- 238000007789 sealing Methods 0.000 claims description 2
- 208000028659 discharge Diseases 0.000 description 15
- 239000004065 semiconductor Substances 0.000 description 14
- 230000002950 deficient Effects 0.000 description 4
- 238000007664 blowing Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 3
- 230000003472 neutralizing effect Effects 0.000 description 3
- 229920003002 synthetic resin Polymers 0.000 description 3
- 239000000057 synthetic resin Substances 0.000 description 3
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000003851 corona treatment Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 208000014617 hemorrhoid Diseases 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920013716 polyethylene resin Polymers 0.000 description 1
- 208000024891 symptom Diseases 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
Landscapes
- Cleaning In General (AREA)
- Details Of Resistors (AREA)
- Insulators (AREA)
Description
【発明の詳細な説明】
本発明は、樹脂封止型電子部品の樹脂封止外殻の表面上
に各種のマークを鮮明に付することのできる樹脂封止型
電子部品のマーキング方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a marking method for resin-sealed electronic components that can clearly mark various marks on the surface of the resin-sealed outer shell of the resin-sealed electronic component. be.
一般に絶縁体は、絶縁体相互間の摩擦現象あるいは他の
物体との摩擦現象によつて帯電し易く、これが帯電した
場合、絶縁体の周囲に存在した塵埃が絶縁体の表面に多
量に付着する。Generally, insulators tend to become electrically charged due to friction between the insulators or friction with other objects, and when this becomes electrically charged, a large amount of dust existing around the insulator adheres to the surface of the insulator. .
このように、絶縁体表面に多量の塵埃が付着しても、通
常はこのことは問題とはならないが、マークを付与すべ
き対象物が比較的形状の小さい樹脂封止型電子部であり
、付与すべきマークも小さく、マークの鮮明度が帯電し
やすい樹脂の表面に付着した塵埃によつて損われる不都
合が生じることが判明した。近年、合成樹脂によつて封
止された電子部品が多々現出するに至つているが、これ
らに対しても製品名、製造年月日あるいは社名等の小さ
いマークを付す必要がある。ところで、合成樹脂体とし
て多用されるポリエチレン樹脂、スチロール樹脂あるい
はビニール樹脂よりなる布状体、さらに、エポキシ樹脂
を成型してなる樹脂成型体は、とりわけ帯電し易いもの
であつて、特に乾燥した環境下ではさらにこの現象が助
長される。In this way, even if a large amount of dust adheres to the insulator surface, this usually does not cause a problem, but if the object to be marked is a relatively small resin-sealed electronic part, It has been found that the mark to be applied is also small, and the clarity of the mark is impaired by dust adhering to the surface of the resin, which is easily charged. In recent years, many electronic components encapsulated with synthetic resin have appeared, and it is necessary to attach small marks such as the product name, date of manufacture, or company name to these as well. By the way, cloth-like bodies made of polyethylene resin, styrene resin, or vinyl resin, which are often used as synthetic resin bodies, as well as resin molded bodies formed by molding epoxy resin, are particularly susceptible to electrostatic charge, and are particularly prone to being used in dry environments. This phenomenon is further exacerbated at the bottom.
このような現象により、合成樹脂体で封止された樹脂封
止型電子部品の表面上には多量の塵埃が付着するところ
となり、かかる表面に対して、例えばマークを付した場
合、マーキングインクと製品面との直接的な接触がたた
れ、マークが不鮮明になること、あるいは、マーキング
がなされたのち、塵埃の剥離に追随して付されたマーク
もまた剥離してしまうすなわち塵埃の除去が不充分な面
にマークを付した場合、初期状態ではマーク不良とはな
らないものの時間の経過につれてマークの剥離が生じる
などの不都合が生じる。樹脂封止型電子部品は近年その
形状が小型化される傾向にあり、これにつれて付される
マークも小さくなる傾向にあり、上記の不都合はより顕
著化する。このような不都合に鑑みて、樹脂封止型電子
部品の帯電しやすい表面上を帯電防止膜で覆い、このの
ちマークを付すマーキング方法がすでに提案されている
。Due to this phenomenon, a large amount of dust adheres to the surface of resin-sealed electronic components sealed with a synthetic resin body, and when a mark is placed on such a surface, for example, marking ink and The mark may become unclear due to direct contact with the product surface, or the mark may also peel off as dust peels off after marking has been done, i.e. dust cannot be removed. If a mark is applied to a sufficient surface, the mark will not be defective in the initial state, but as time passes, problems such as peeling of the mark will occur. In recent years, the shape of resin-sealed electronic components has tended to become smaller, and the marks attached thereto have also tended to become smaller, making the above-mentioned disadvantages more pronounced. In view of these inconveniences, a marking method has already been proposed in which the surface of a resin-sealed electronic component, which is easily charged, is covered with an antistatic film and then a mark is attached thereto.
しかしながら、この方法では、帯電防止膜を形成する工
程が付与されるため、製品コストが高まること、あるい
は、帯電防止膜上に実際にはマークが付されるため、帯
電防止膜が剥離した場合、同時にマークも剥離してしま
うことなどの問題が依然として残される。本発明は、か
かる帯電防止膜を形成し、こののちマークを付すマーキ
ング方法における不都合をことごとく排除することがで
き、しかも、マークを付すべき表面の状態を、容易に塵
埃の付着してない清浄な状態の面となしうる清浄化処理
を導入したマーキング方法を提案するもので、樹脂封止
型電子部品のマークを付すべき表面を交流コロナ放電の
下に晒すことにより、封止樹脂中に帯電された電荷を中
和し、さらに、交流コロナ放電の下に晒すと同時または
その直後に表面に気体を吹きつけ、表面に付着している
塵埃を飛散させることによつて、マークを付すべき表面
を清浄化しこののちマータを付すことに本発明O痔徴が
存する。However, this method requires a step to form an antistatic film, which increases the product cost, or marks are actually placed on the antistatic film, so if the antistatic film peels off, At the same time, problems such as peeling off of marks still remain. The present invention can eliminate all inconveniences in the marking method of forming such an antistatic film and then applying a mark, and moreover, it is possible to easily check the condition of the surface to be marked to be clean and dust-free. This paper proposes a marking method that introduces a cleaning treatment that can be used to determine the condition of the electronic component.By exposing the surface of the resin-sealed electronic component to be marked to an alternating current corona discharge, electrical charges are generated in the sealing resin. The surface to be marked is then prepared by blowing gas onto the surface at the same time or immediately after exposure to the alternating current corona discharge to scatter any dust adhering to the surface. The symptoms of hemorrhoids according to the present invention include cleaning and then applying mata.
以下に、本発明の方法が適用されてなる樹脂封止型半導
体装置に対するマーキング方法を例に、本発明を説明す
る。図は、樹脂封止型半導体装置用のマーキング装.置
の略図を示し、図中、1で示す樹脂封止型半導体装置が
、接地された金属レール2の上で移送され、マーキング
ローラ3の部分において、樹脂封止型半導体装置の上面
に必要なマークが付される構造となつている。The present invention will be described below using as an example a marking method for a resin-sealed semiconductor device to which the method of the present invention is applied. The figure shows a marking device for resin-sealed semiconductor devices. In the figure, a resin-sealed semiconductor device indicated by 1 is transported on a grounded metal rail 2, and a marking roller 3 places necessary marks on the upper surface of the resin-sealed semiconductor device. It has a structure in which marks are attached.
ところが、かかる樹脂封止型半導体装置は、樹脂による
樹脂が完了してから、このマーキング工程に至る間の取
扱い時にその大半が帯電しており、その表面にはかなり
の塵埃が除去しにくい状態で付着している。かかる塵埃
をマーキング前に除去し、表面を清浄化するために、交
流コロナ放電による帯電電荷の中和と気体吹き付けより
なる清浄化処理が施される。すなわち、表面の清浄化は
、交流の高電圧が印加され、交流コロナ放電を生ぜしめ
る針状放電電極4、空気放出管5とからなる清浄化装置
によつてなされる。この清浄化装置は、マーキングロー
ラ3の手前で、しかも、移送されてくる樹脂封止型半導
体装置がこの下部で交流コロナ放電に晒されうる位置に
配置されている。したがつて、移送前に樹脂封止型半導
体装置が帯電し、その表面に塵埃が付着していても、清
浄化装置の下部でコロナ放電に晒されるため帯電してい
る電荷が中和され、この結果、塵埃は、単に表面に載置
された状態となる。このようにして、樹脂封止型半導体
装置が交流コロナ放電に晒されると同時あるいは晒され
た直後に樹脂封止型半導体装置表面へ向けて、空気放出
管5から空気を放出させるならば、表面上の塵埃は容易
に飛散し、樹脂封止型半導体装置の表面は、清浄な表面
となる。なお、飛散させた塵埃をそのまま放置すること
は好ましいことではなく、排気装置により塵埃の存在が
許される他部分へ排出することが望ましい。このように
して清浄化された表面状態を呈する樹脂封止型半導体装
置を、次いでマーキングローラ3の下部に移送し、マー
クを付すならば、確実に鮮明なマークを付すことができ
る。なお、コロナ放電を交流コロナ放電とすることの意
義は、正負いずれに帯電していても、電荷の中和が確実
になされることにある。However, most of these resin-sealed semiconductor devices are electrically charged when they are handled from the time the resin molding is completed until the marking process, and there is a considerable amount of dust on the surface that is difficult to remove. It's attached. In order to remove such dust and clean the surface before marking, a cleaning process consisting of neutralizing the electrical charge by alternating current corona discharge and blowing gas is performed. That is, the surface is cleaned by a cleaning device comprising a needle-shaped discharge electrode 4 and an air discharge tube 5 to which an AC high voltage is applied to generate an AC corona discharge. This cleaning device is disposed in front of the marking roller 3 and in a position where the resin-sealed semiconductor device being transferred can be exposed to alternating current corona discharge below. Therefore, even if the resin-sealed semiconductor device is electrically charged before being transported and has dust attached to its surface, the electrical charge is neutralized as it is exposed to corona discharge at the bottom of the cleaning device. As a result, the dust simply remains on the surface. In this way, if air is released from the air release tube 5 toward the surface of the resin-sealed semiconductor device at the same time as or immediately after the resin-sealed semiconductor device is exposed to AC corona discharge, the surface The dust on the surface is easily scattered, and the surface of the resin-sealed semiconductor device becomes a clean surface. Note that it is not preferable to leave the scattered dust as is, but it is preferable to exhaust it to other parts where the dust is allowed to exist using an exhaust device. If the resin-sealed semiconductor device exhibiting the surface condition thus cleaned is then transferred to the lower part of the marking roller 3 and marked thereon, it is possible to reliably make a clear mark. Note that the significance of using AC corona discharge as corona discharge is that the charges are reliably neutralized even if the battery is charged positively or negatively.
しかしながら交流コロナ放電による中和効果は、直流コ
ロナ放電のそれに比べて少い。このため、必要に応じて
清浄化装置の使用数量を増し、中和効果の不足分を補う
ことを行つてもよい。図示する例では、3個の清浄化装
置が配置してある。次に、本発明の方法を樹脂封止型電
力用1Cに適用した例を述べる。However, the neutralizing effect of AC corona discharge is smaller than that of DC corona discharge. Therefore, if necessary, the number of cleaning devices used may be increased to compensate for the lack of neutralizing effect. In the illustrated example, three cleaning devices are arranged. Next, an example will be described in which the method of the present invention is applied to a resin-sealed power 1C.
同1C(約10万個程度)に線幅0.2〜0.3mmの
マークを付与し、その一部でも欠け(非付着)が生じた
場合を不良とみなした。条件:交流コロナ放電処理(A
C3KV〜6KV)空気吹き付け処理(圧力1K′/C
T!L2)不良率・・・・・・・・・0.1%一方、何
も処理を施さない従来法の場合、不良率は4〜5%にも
達した。Marks with a line width of 0.2 to 0.3 mm were given to the same 1C (approximately 100,000 pieces), and when even a part of the mark was chipped (non-adhesive), it was considered to be defective. Conditions: AC corona discharge treatment (A
C3KV~6KV) Air blowing treatment (pressure 1K'/C
T! L2) Defective rate: 0.1% On the other hand, in the case of the conventional method in which no treatment was performed, the defective rate reached as high as 4 to 5%.
このように、本発明の方法ではマーク不良率が著るしく
低下した。以上、樹脂封止型半導体装置のマーキングに
本発明を適用した場合を例に説明してきたのであるが、
本発明の方法は、絶縁体が帯電することによりその表面
に付着する塵埃を除去し、表面を清浄化する必換がある
他の樹脂封止型電子部品のマーキングに広く適用するこ
とが可能である。以上説明してきたところから明らかな
ように、本発明にかかる樹脂封止型電子部品のマーキン
グ方法によれば、帯電によりマークを付すべき表面に付
着した塵埃を、特別な作業工程を付加することなく除去
してこの表面を清浄化しマーク不良を著しく低下するこ
とができ、帯電防止膜を形成する従来の方法における不
都合が排除され、従来法にくらべ作業性に富み、しかも
マーキング作業の自動化を容易なものとすることができ
、極めて工業的に有意義な方法である。As described above, the mark defect rate was significantly reduced by the method of the present invention. Above, the case where the present invention is applied to marking of resin-sealed semiconductor devices has been explained as an example.
The method of the present invention can be widely applied to the marking of other resin-sealed electronic components that require cleaning the surface by removing dust that adheres to the surface of the insulator when it is charged. be. As is clear from the above explanation, according to the method for marking resin-sealed electronic components according to the present invention, dust attached to the surface to be marked due to charging can be removed without adding any special work steps. It can be removed to clean this surface and significantly reduce mark defects, eliminating the inconveniences of the conventional method of forming an antistatic film, offering greater workability compared to the conventional method, and making it easier to automate marking work. This is an extremely industrially meaningful method.
【図面の簡単な説明】
図は、本発明にかかるマーキング方法を可能にする表面
清浄化作用の付加されてなる樹脂封止型半導体装置用マ
ーキング装置を示す。
゛1・・・・・・樹脂封止型半導体装置、2・・・・・
・金属レール、3・・・・・・マーキングローラ、4・
・・・・・交流コロナ放電発生用の針状放電電極、5・
・・・・・空気放出管。BRIEF DESCRIPTION OF THE DRAWINGS The figure shows a marking device for a resin-sealed semiconductor device that has a surface cleaning effect that enables the marking method according to the present invention.゛1...Resin-sealed semiconductor device, 2...
・Metal rail, 3...Marking roller, 4・
...Acicular discharge electrode for generating AC corona discharge, 5.
...Air release pipe.
Claims (1)
もマーク付与面を交流コロナ放電の下に晒し、封止樹脂
中に帯電された電荷を中和し、さらに、前記マーク付与
面が交流コロナ放電に晒されると同時またはその直後に
同マーク付与面へ向けて気体を吹き一つけ、表面に付着
している塵埃を飛散させてマーク付与面を清浄化し次い
でマーク付与面に所定のマークを付すことを特徴とする
樹脂封止型電子部品のマーキング方法。1 Prior to marking, at least the marking surface of the resin-sealed electronic component is exposed to alternating current corona discharge to neutralize the electrical charges in the sealing resin, and further, the marking surface is exposed to alternating current corona discharge. At the same time or immediately after being exposed to the electric discharge, a gas is blown toward the mark-bearing surface to scatter dust adhering to the surface, cleaning the mark-bearing surface, and then marking the mark-bearing surface with a specified mark. A method for marking resin-sealed electronic components.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5765576A JPS599230B2 (en) | 1976-05-18 | 1976-05-18 | How to clean the insulator surface |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5765576A JPS599230B2 (en) | 1976-05-18 | 1976-05-18 | How to clean the insulator surface |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS52139995A JPS52139995A (en) | 1977-11-22 |
| JPS599230B2 true JPS599230B2 (en) | 1984-03-01 |
Family
ID=13061907
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5765576A Expired JPS599230B2 (en) | 1976-05-18 | 1976-05-18 | How to clean the insulator surface |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS599230B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01207548A (en) * | 1988-02-12 | 1989-08-21 | Fujisash Co | Ventilator for curtain wall |
| JPH0434155A (en) * | 1990-05-30 | 1992-02-05 | Sankyo Alum Ind Co Ltd | Outer wall structure |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5671958A (en) * | 1979-11-19 | 1981-06-15 | Toshiba Corp | Marking resin-sealed semiconductor device |
| JPS6121246Y2 (en) * | 1980-10-31 | 1986-06-25 |
-
1976
- 1976-05-18 JP JP5765576A patent/JPS599230B2/en not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01207548A (en) * | 1988-02-12 | 1989-08-21 | Fujisash Co | Ventilator for curtain wall |
| JPH0434155A (en) * | 1990-05-30 | 1992-02-05 | Sankyo Alum Ind Co Ltd | Outer wall structure |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS52139995A (en) | 1977-11-22 |
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