JPS6041844B2 - Variable resistance board sorting device - Google Patents
Variable resistance board sorting deviceInfo
- Publication number
- JPS6041844B2 JPS6041844B2 JP52141223A JP14122377A JPS6041844B2 JP S6041844 B2 JPS6041844 B2 JP S6041844B2 JP 52141223 A JP52141223 A JP 52141223A JP 14122377 A JP14122377 A JP 14122377A JP S6041844 B2 JPS6041844 B2 JP S6041844B2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- variable resistance
- resistance board
- guide rail
- resistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000002950 deficient Effects 0.000 claims description 9
- 238000005259 measurement Methods 0.000 claims description 8
- 230000032258 transport Effects 0.000 claims description 3
- 239000000758 substrate Substances 0.000 description 10
- 238000010586 diagram Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 235000012489 doughnuts Nutrition 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 230000036544 posture Effects 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Landscapes
- Apparatuses And Processes For Manufacturing Resistors (AREA)
Description
【発明の詳細な説明】
本発明は可変抵抗基板の抵抗値を測定し、抵抗値区分
に従い分類・選別する装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for measuring the resistance value of variable resistance substrates and classifying and sorting them according to resistance value categories.
可変抵抗に用いられる抵抗基板は、セラミック等に抵
抗体を蒸着またはスパッタリング等で付着させ、その付
着形状は両端に外部リード端子を接続できるよう馬蹄形
をなしている。スパッタリング等で抵抗体を付着させた
後、通常熱処理を行なうが熱処理時の温度、時間等の条
件の変化で抵抗値にばらつきが生じる。このため、抵抗
値を測定し顧客の要求精度に応じて数分類に選別する必
要がある。 従来かかる可変抵抗基板の抵抗値の測定・
選別は測定器に接続した一対の接触針を抵抗体の両端に
押し当てその抵抗値に応じて分類収納箱に入れるという
人手による手作業で行なわれていた。A resistor substrate used for a variable resistor has a resistor attached to a ceramic or the like by vapor deposition or sputtering, and has a horseshoe shape so that external lead terminals can be connected to both ends. After a resistor is attached by sputtering or the like, a heat treatment is usually performed, but variations in the temperature, time, and other conditions during the heat treatment cause variations in the resistance value. Therefore, it is necessary to measure the resistance value and sort it into several categories according to the accuracy required by the customer. Conventional methods for measuring the resistance value of variable resistance boards
Sorting was done manually by pressing a pair of contact needles connected to a measuring device to both ends of the resistor and placing them into sorting storage boxes according to their resistance values.
したがつて、すべての作業が人手によつて行われている
ため作業能率が悪く、さらに多くの作業人員が必要とい
う大きな欠点があつた。また接触針を抵抗体の両端に押
し当てる際の加圧力は作業者によりばらつきがあり測定
した抵抗値の精度に信頼がおけない等の欠点があつた。
本発明はこのような欠点を除去し、自動的に可変抵抗
基板の抵抗値を測定しさらに分類選別をも行なう装置を
提供することを目的とする。Therefore, all work is done manually, resulting in poor work efficiency and the need for more workers, which is a major drawback. Further, the pressure applied when pressing the contact needle against both ends of the resistor varies depending on the operator, and the accuracy of the measured resistance value cannot be trusted.
It is an object of the present invention to eliminate such drawbacks and provide an apparatus that automatically measures the resistance value of a variable resistance substrate and also performs classification and selection.
以下本発明を図面について詳細に説明する。 The invention will now be explained in detail with reference to the drawings.
第1図は本発明の対象である可変抵抗基板1で、抵抗体
2は可変抵抗基板1の中心にあけられた穴4と同心でか
つ部分的に約90度切欠いたドーナツ状に付着されてお
り、外部端子3は抵抗体2の両端に接し、穴4を中心と
して抵抗体の径より外側または内側まてを含む面積を有
し、金等を付着して形成される。 このような可変抵抗
基板1を一列に移送する場合、第2図に示すように裏表
、方向によりイ、口・・・・・・・・・チまで合計8通
りの姿勢がある。FIG. 1 shows a variable resistance substrate 1, which is the object of the present invention, in which a resistor 2 is attached in a donut shape concentric with a hole 4 made in the center of the variable resistance substrate 1 and partially cut out at about 90 degrees. The external terminal 3 is in contact with both ends of the resistor 2, has an area centered on the hole 4, and includes an area outside or inside the diameter of the resistor, and is formed by depositing gold or the like. When such variable resistance substrates 1 are transferred in a line, there are a total of eight postures depending on the front and back and direction, from A to C, as shown in FIG.
第3図と第4図は本発明の原理を説明するための図で
、抵抗体2の径aよりやや大きい径を上において抵抗体
2に接続した外部端子3’のほぼ中央の点1に配置した
接触針11と、同様に外部端子3″のほぼ中央の点■に
配置した接触針12と、抵抗体2の径aよりやや大きい
径bと前記接触針11を中心に接触針11と12の間隔
Cを半径とした円との交点■に配置した接触針13と、
同様に接触針12を中心に接触針11と12との間隔C
を半径とした円と抵抗体2の径aよりやや大きい径bと
の交点■に配置した接触針14と、可変抵抗基板1に対
し接触針11,12,13,14と反対側に備え前記と
同様な位置に配置した接触針21,22,23,24と
、前記8本の接触針11〜14,21〜24に接続し、
かつ8本の内から抵抗体2の外部端子3に接する2本の
接触針を選び出す選択回路30と、選ひ出された2本の
接触針間の抵抗値を測定する測定回路40と、抵抗値に
応じて良品・不良品さらに良品の細区分を判別する判定
回路50から構成される。本発明の原理は以上のように
構成してあるから可変抵抗基板1が第2図イ〜チに示す
ようないずれの方向に置かれて移送されて来ても必ず接
触針が抵抗体2の外部端子3に接し抵抗値の測定ができ
る。次に本発明を第5図の実施例に従いさらに詳細に説
明する。3 and 4 are diagrams for explaining the principle of the present invention, in which a point 1 approximately in the center of an external terminal 3' connected to the resistor 2 is placed with the diameter slightly larger than the diameter a of the resistor 2 at the top. The contact needle 11 arranged in the same manner, the contact needle 12 similarly arranged at a point (3) approximately in the center of the external terminal 3'', the diameter b slightly larger than the diameter a of the resistor 2, and the contact needle 11 centered on the contact needle 11. A contact needle 13 placed at the intersection point ■ with a circle whose radius is the interval C of 12;
Similarly, the distance C between contact needles 11 and 12 with contact needle 12 at the center
A contact needle 14 is disposed at the intersection (3) of a circle with a radius of Contact needles 21, 22, 23, 24 arranged in the same positions as above and connected to the eight contact needles 11 to 14, 21 to 24,
and a selection circuit 30 that selects two contact needles that are in contact with the external terminal 3 of the resistor 2 from among the eight contact needles, a measurement circuit 40 that measures the resistance value between the selected two contact needles, and a resistor. It is comprised of a determination circuit 50 that discriminates between non-defective products, defective products, and subdivisions of non-defective products according to the values. The principle of the present invention is constructed as described above, so that no matter which direction the variable resistance board 1 is placed and transferred as shown in FIG. It is in contact with the external terminal 3 and the resistance value can be measured. Next, the present invention will be explained in more detail according to the embodiment shown in FIG.
第5図は本発明の実施例を示す図で、第6図と第7図は
第5図の一部を拡大した断面図である。第5図において
、可変抵抗基板1をガイドレール5に沿つて可変抵抗基
板1の一辺の長さ分づつ間歇送りする移送機構70と、
可変抵抗基板1の抵抗体2の外径よりやや大きい円と抵
抗体2に接.続した外部端子3のほぼ中心との交点に配
置した接触針11、同様な接触針12さらに接触針11
を中心として接触針11と12との間隔を半径とした円
と抵抗体2の径よりやや大きい径の円との交互に配置し
た接触針13、同様に接触針12を.中心として接触針
11と12との間隔を半径とした円と抵抗体2の径より
やや大きい径の円との交点に配置した接触針14とを保
持金具15に固定した上部接触針群10をガイドレール
5の上側に備え下側には上部接触針群10と同様な下部
接触・針群20とを備え、制御部60の測定開始指令に
より両方の接触針群10,20が可変抵抗基板1に接す
る方向に動作するコンタクト部80と、コンタクト部8
0の接触針11〜14,21〜24合計8本からの信号
のうち抵抗体2の外部端子に電気的に接続する2本の接
触針を選ひ出す選択回路30と、選び出された2本の接
触針間の抵抗値を測定する測定回路40と、抵抗値に応
じて良品、不良品さらに良品の細分類の区分を判別する
判定回路50と、判定回路50の分類区分に従いガイド
レール5から送られてくる可変抵抗基板1を指定された
収納箱91に入れる分類収納部90と、前記すべてを制
御する制御部60とから構成”される。FIG. 5 is a diagram showing an embodiment of the present invention, and FIGS. 6 and 7 are sectional views in which a part of FIG. 5 is enlarged. In FIG. 5, a transfer mechanism 70 that intermittently transports the variable resistance board 1 along the guide rail 5 by the length of one side of the variable resistance board 1;
A circle slightly larger than the outer diameter of the resistor 2 on the variable resistance board 1 touches the resistor 2. A contact needle 11, a similar contact needle 12, and a contact needle 11 disposed at the intersection with approximately the center of the connected external terminal 3
The contact needles 13 are arranged alternately with a circle having a radius equal to the distance between the contact needles 11 and 12 and a circle having a diameter slightly larger than the diameter of the resistor 2. The upper contact needle group 10 has a contact needle 14 disposed at the intersection of a circle whose radius is the distance between the contact needles 11 and 12 and a circle having a diameter slightly larger than the diameter of the resistor 2, and is fixed to a holding metal fitting 15. A lower contact needle group 20 similar to the upper contact needle group 10 is provided on the upper side of the guide rail 5 and a lower contact needle group 20 similar to the upper contact needle group 10 is provided on the lower side. a contact portion 80 that operates in a direction tangent to the contact portion 8;
A selection circuit 30 selects two contact needles to be electrically connected to the external terminal of the resistor 2 from among the signals from a total of eight contact needles 11 to 14 and 21 to 24 of 0, and the selected 2 contact needles. A measuring circuit 40 that measures the resistance value between the contact needles of a book, a judgment circuit 50 that discriminates between good products, defective products, and subclassifications of non-defective products according to the resistance value, and a guide rail 5 according to the classification classification of the judgment circuit 50. It is composed of a sorting/storage section 90 that puts the variable resistance boards 1 sent from the source into designated storage boxes 91, and a control section 60 that controls all of the above.
第6図は第5図の実施例のコンタクト部80の部分詳細
図で、コンタクト部80はモータ82の回転を中央で右
ねじおよび左ねじに分離した送りねじに伝え制御部60
の測定開始指令により上部接触針群10および下部接触
針群20がカイト81に案内されて同時に可変抵抗基板
1に接し、測定終了指令により同時に離れる構造である
。第7図は第6図の実施例の移送機構70の部分詳細図
で、移送機構70は可変抵抗基板1の一辺の長さに等し
いピッチの凸起73を円周上に設けた羽根車72にモー
タ71の回転を伝え制御部60の送り指令により可変抵
抗基板1をガイドレール5に沿つて可変抵抗基板1の一
辺の長さ分だけ間歇的に送る構造である。以上を動作さ
せるには制御部60の送り指令により移送機構70が動
作し可変抵抗基板1がガイドレール5上を間歇点に送ら
れる。FIG. 6 is a partial detailed view of the contact portion 80 of the embodiment shown in FIG.
The structure is such that the upper contact needle group 10 and the lower contact needle group 20 are guided by the kite 81 and come into contact with the variable resistance substrate 1 at the same time in response to a measurement start command, and are separated simultaneously in response to a measurement end command. FIG. 7 is a partial detailed view of the transfer mechanism 70 of the embodiment shown in FIG. The variable resistance board 1 is intermittently sent along the guide rail 5 by the length of one side of the variable resistance board 1 in response to a feed command from the control section 60. To operate the above, the transfer mechanism 70 is operated in response to a feed command from the control unit 60, and the variable resistance board 1 is fed onto the guide rail 5 to the intermittent point.
可変抵抗基板1が互いに押されながらコンタクト部80
まで進むと、制御部60の測定開始指令によりコンタク
ト部80が動作し上部および下部接触針群10,20が
可変抵抗基板1の外部端子3に接する。選択回路30は
8本の接触針から外部端子3に接続する2本の接触針の
みを選択し測定回路40により抵抗値が測定される。判
定回路50ではその抵抗値に応じて良品および不良品さ
らに良品の細分類の区分を判定し制御部60に信号を返
し、その区分を一旦記憶する。次に制御部60の測定終
了指令によりコンタクト部80の接触針群10,20が
可変抵抗基板1から離れ続いて移送機構70が働いて可
変抵抗基板1が送られる。この動作を繰り返しガイドレ
ール5の終端までくると、制御部60に記憶されている
分類区分に従い分類収納部90を動作させ制御部60で
指定された収納箱91をガイドレール5の終端の下に移
動させ可変抵抗基板を受け取る。これら一連の動作を繰
り返しすべての可変抵抗基板の分類・選別を行なう。本
発明ば以上のように構成されているから従来のように作
業者による測定分類に比し格段の作業能率をもたらすと
同時に全工程の自動化が可能になり、その効果は計り知
れない。While the variable resistance substrates 1 are pressed together, the contact portions 80
When the process advances to this point, the contact section 80 is operated in response to a measurement start command from the control section 60, and the upper and lower contact needle groups 10 and 20 come into contact with the external terminal 3 of the variable resistance board 1. The selection circuit 30 selects only two contact needles connected to the external terminal 3 from the eight contact needles, and the resistance value is measured by the measurement circuit 40. The determination circuit 50 determines the classification of good products, defective products, and subclassification of non-defective products according to the resistance value, returns a signal to the control section 60, and temporarily stores the classification. Next, in response to a measurement end command from the control section 60, the contact needle groups 10, 20 of the contact section 80 are separated from the variable resistance substrate 1, and the transfer mechanism 70 operates to transport the variable resistance substrate 1. Repeating this operation, when the end of the guide rail 5 is reached, the classification storage section 90 is operated according to the classification category stored in the control section 60, and the storage box 91 specified by the control section 60 is placed under the end of the guide rail 5. Move and receive the variable resistance board. These series of operations are repeated to classify and select all variable resistance boards. Since the present invention is constructed as described above, it is possible to achieve much higher work efficiency than the conventional method of measuring and classifying by an operator, and at the same time, it is possible to automate the entire process, and its effects are immeasurable.
第1図は本発明の対象の可変抵抗基板を示し、第2図は
可変抵抗基板を一列上に移送する場合の姿勢を示す立体
図、第3図は本発明の原理説明図、第4図は接触針の配
置を示す説明図であり、第5図は本発明の実施例を示し
、第6図および第7図は第5図の実施例の部分詳細図で
ある。Fig. 1 shows a variable resistance board that is the subject of the present invention, Fig. 2 is a three-dimensional view showing the attitude when transferring the variable resistance board one row up, Fig. 3 is an explanatory diagram of the principle of the invention, and Fig. 4 5 is an explanatory view showing the arrangement of the contact needle, FIG. 5 shows an embodiment of the present invention, and FIGS. 6 and 7 are partial detailed views of the embodiment of FIG. 5.
Claims (1)
つ間歇送りする移送機構と、可変抵抗基板の外部端子に
少くとも2本が接するように配置した上部接触針群をガ
イドレールの上側に同様な下側接触針群を下側に備え、
測定開始または終了指令により前記両方の接触針群を可
変抵抗基板に対し接近または離れる方向に同時に上下動
するコンタクト部と、コンタクト部の接触針群から抵抗
体の外部端子に接続する2本の接触針の信号を選び出す
選択回路と、選び出された2本の接触針間の抵抗値を測
定する測定回路と、抵抗値に応じて良品不良品さらに良
品の細分類の区分を判別する判路回路と、前記分類区分
に従いガイドレールから送られてくる可変抵抗基板を指
定された収納箱に入れる分類収納部と、前記すべてを制
御する制御部とからなる可変抵抗基板選別装置。1. A transfer mechanism that intermittently transports the variable resistance board by the length of one side along the guide rail, and a group of upper contact needles arranged so that at least two of them are in contact with the external terminals of the variable resistance board are similarly placed above the guide rail. Equipped with a lower contact needle group on the lower side,
A contact section that simultaneously moves both contact needle groups up and down toward or away from the variable resistance board in response to a measurement start or end command, and two contacts that connect the contact needle groups of the contact section to the external terminals of the resistor. A selection circuit that selects needle signals, a measurement circuit that measures the resistance value between the two selected contact needles, and a judgment circuit that discriminates between good products, defective products, and subclassifications of non-defective products according to the resistance value. A variable resistance board sorting device comprising: a sorting/storage section for placing variable resistance boards sent from the guide rail into specified storage boxes according to the classification categories; and a control section for controlling all of the above.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP52141223A JPS6041844B2 (en) | 1977-11-24 | 1977-11-24 | Variable resistance board sorting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP52141223A JPS6041844B2 (en) | 1977-11-24 | 1977-11-24 | Variable resistance board sorting device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5473261A JPS5473261A (en) | 1979-06-12 |
| JPS6041844B2 true JPS6041844B2 (en) | 1985-09-19 |
Family
ID=15286976
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP52141223A Expired JPS6041844B2 (en) | 1977-11-24 | 1977-11-24 | Variable resistance board sorting device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6041844B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4376566A4 (en) | 2021-09-24 | 2024-11-06 | Samsung Electronics Co., Ltd. | Camera module for heat dissipation and grounding, and electronic device comprising same |
-
1977
- 1977-11-24 JP JP52141223A patent/JPS6041844B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5473261A (en) | 1979-06-12 |
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