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JPS6047908B2 - How to polish gallium arsenide - Google Patents
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JPS6047908B2 - How to polish gallium arsenide - Google Patents

How to polish gallium arsenide

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Publication number
JPS6047908B2
JPS6047908B2 JP8075181A JP8075181A JPS6047908B2 JP S6047908 B2 JPS6047908 B2 JP S6047908B2 JP 8075181 A JP8075181 A JP 8075181A JP 8075181 A JP8075181 A JP 8075181A JP S6047908 B2 JPS6047908 B2 JP S6047908B2
Authority
JP
Japan
Prior art keywords
polishing
concentration
cyanuric trichloride
gallium arsenide
solution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8075181A
Other languages
Japanese (ja)
Other versions
JPS57196723A (en
Inventor
重幸 飯山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP8075181A priority Critical patent/JPS6047908B2/en
Publication of JPS57196723A publication Critical patent/JPS57196723A/en
Publication of JPS6047908B2 publication Critical patent/JPS6047908B2/en
Expired legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • ing And Chemical Polishing (AREA)
  • Weting (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Description

【発明の詳細な説明】 本発明は、半導体デバイス及び光素子の基板に用いられ
る、ヒ化ガリウム(GaAs)の表面を、1スクラツチ
及びきずのない無ひずみの鏡面に、仕上げ又は高速加工
するための、化学作用を主とする研摩方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention is for finishing or high-speed processing the surface of gallium arsenide (GaAs), which is used for substrates of semiconductor devices and optical devices, into a mirror surface without scratches or defects. The present invention relates to a polishing method mainly based on chemical action.

従来、GaAs単結晶ウェハの研摩方法として、以下に
略述するものがあつた。
Conventionally, there have been methods for polishing GaAs single crystal wafers as outlined below.

一般的には、回転する円形定盤に研摩布をはりつけ、こ
の表面に研摩液を滴下しながら、接着板に接着したGa
Asウェハを、研摩布に押圧しつつ、研摩布に対して自
転と公転を行わせて、化学的及び機械的作用によつて研
摩する方法である。
Generally, an abrasive cloth is attached to a rotating circular surface plate, and while the abrasive liquid is dripped onto the surface of the abrasive cloth, the Ga bonded to the adhesive plate is
This is a method of polishing an As wafer by chemical and mechanical action by pressing the As wafer against the polishing cloth and causing the polishing cloth to rotate and revolve.

。そして、従来の研摩剤には、以下のものがあつた。(
1)溶液lmι当り62m9の有効塩素を含有する溶液
を標準Na0c1溶液として用い、これを水で13.5
〜26倍に希釈して用いる(特公昭48−25817号
)。
. Conventional abrasives include the following: (
1) A solution containing 62 m9 of available chlorine per lmι of solution was used as a standard Na0c1 solution, and this was diluted with water to 13.5 m9 of available chlorine.
It is used after being diluted to ~26 times (Japanese Patent Publication No. 25817/1983).

(2)Na0c1+Na。(2) Na0c1+Na.

CO、(米国特許第334265四)。(3)水300
mιに、KA](SO。)2・川。Oを142.39溶
解し、NaOHでpHを7.5に調整し、漂白液(1l
中にNaOc1を180y含有) 11を添加し、水を
加えて合計21とする(特公昭53−38595号)。
、4)水ガラス(30重量%SiO。
CO, (U.S. Pat. No. 3,342,654). (3) Water 300
mι, KA] (SO.) 2. River. Dissolve 142.39% of O, adjust the pH to 7.5 with NaOH, and add bleach solution (1 l
11 (containing 180y of NaOc1) is added, and water is added to make a total of 21 (Japanese Patent Publication No. 53-38595).
, 4) water glass (30 wt% SiO.

)51及びCacl。・6H2Oの2.5に9を、水4
01に懸濁させ、HClによりpH7に調節する。他方
、3腫量%H。O。水301を、NH、OH水によりp
H7に調節する。この2つの溶液を、ポンプにより別個
に研摩機に供給する。すなわち、流出直前に混合する(
特公昭54−10824号)。(5)1771、ιNH
4OH水+ 700mι30重量%H。
) 51 and Cacl.・9 to 2.5 of 6H2O, 4 of water
01 and adjusted to pH 7 with HCl. On the other hand, 3 tumor volume%H. O. Water 301 was purified with NH and OH water.
Adjust to H7. The two solutions are fed separately to the sander by pumps. i.e. mixing just before the outflow (
Special Publication No. 54-10824). (5) 1771, ιNH
4OH water + 700mι30%H by weight.

O。水〔ジャーナル オブ ジ エレクトロケミカル
ソサイエテイ(J、Electrochem、Soc、
) 11& p1346(1971)〕前記研摩剤のう
ち、(1)〜(3)に示すものは、Na0c1濃度の高
い場合には加工速度が高いが、表面が酸化されるという
欠点があつた。
O. Water [Journal of the Electrochemical
Society (J, Electrochem, Soc,
) 11 & p 1346 (1971)] Among the abrasives mentioned above, those shown in (1) to (3) have a high machining speed when the Na0c1 concentration is high, but they have the disadvantage that the surface is oxidized.

また、(4)と(5)は、高価で危険度の高いH。02
の量が相対的に多量であるので、経済性、操業性、安全
性に欠けるという欠点があつた。
In addition, (4) and (5) are expensive and highly dangerous H. 02
Since the amount of is relatively large, there were disadvantages such as lack of economy, operability, and safety.

本発明は、前述の欠点を解消するために、従来にない新
らしい液によつて、ヒ化ガリウムを研摩する方法を提供
するものである。
The present invention provides a method for polishing gallium arsenide using a new and unprecedented liquid in order to eliminate the above-mentioned drawbacks.

すなわち、本発明を概説すれば、本発明は、Ξ塩化シア
ヌルをアルカリ水溶液に溶解させた液を用いて、GaA
sを研摩することを特徴とする、ヒ化ガリウム(GaA
s)の研摩方法に関する。
That is, to summarize the present invention, the present invention uses a solution in which Ξ cyanuric chloride is dissolved in an alkaline aqueous solution, and GaA
Gallium arsenide (GaA
The present invention relates to the polishing method of s).

三塩化シアヌルは、構造式:すなわち、分子式C3N3
Cl3で表わされる化合物である。水には溶け難く、そ
の飽和水溶液は酸・l/1を呈する。他方、本発明にお
いて、水溶液の状態で使用Jるアルカリのうち、好適な
ものには、水酸化ナトリウム、水酸化カリウム、又は炭
酸ナトリウムがある。
Cyanuric trichloride has the structural formula: i.e. molecular formula C3N3
It is a compound represented by Cl3. It is hardly soluble in water, and its saturated aqueous solution exhibits acid l/1. On the other hand, in the present invention, among the alkalis used in the form of an aqueous solution, preferred ones include sodium hydroxide, potassium hydroxide, and sodium carbonate.

例えば、三塩化シアヌルを、水酸化ナトリウム水溶液に
溶解すると、下記反応方程式:2C3N3c13+6N
a0H+側,O−3Na0c1+3Nac1+3N2↑
+6C02↑+12H2↑に従つて反応するものと推定
され、NaOclを生成する。
For example, when cyanuric trichloride is dissolved in an aqueous sodium hydroxide solution, the following reaction equation: 2C3N3c13+6N
a0H+ side, O-3Na0c1+3Nac1+3N2↑
It is estimated that the reaction occurs according to +6C02↑+12H2↑, and NaOcl is produced.

NaOclは、アルカリ水溶液中で安定である。同様に
、三塩化シアヌルを水酸化カリウム水溶液に溶解すると
、KOclを生成する。
NaOcl is stable in alkaline aqueous solutions. Similarly, dissolving cyanuric trichloride in aqueous potassium hydroxide produces KOCl.

以上のように、本発明方法によれば、価格の安い三塩化
シアヌル粉末をアルカリ水溶液に溶解することによつて
、任意の濃度に調整することができる。
As described above, according to the method of the present invention, an arbitrary concentration can be adjusted by dissolving inexpensive cyanuric trichloride powder in an aqueous alkaline solution.

以下、本発明を実施例によつて例証するが、本発明はこ
れらに限定されるものではない。
Hereinafter, the present invention will be illustrated by examples, but the present invention is not limited thereto.

なお、各実施例においては、三塩化シアヌルとして、有
効成分を9哩量%含有する粉末を、標準として用いた。
In each Example, a powder containing 9% by weight of the active ingredient as cyanuric trichloride was used as a standard.

研摩方法は、通常の回転円盤式ポリシ機を用い、直径1
80wnのポリシ定盤上にポリシヤとして、ポリウレタ
ン−ポリエステル2層不織布(商品名 ポリテックス
シユプリーム)をはりつけた。前記ポリシヤ表面に、各
例の組成の研摩液を滴下しながら、接着板に接着したヒ
化ガリウム単結晶面(100)を、回転するポリシヤに
58〜105ykI1の圧力で押付け、摩擦力によつて
自転させた。実施例1 本例では、三塩化シアヌルを、水酸化ナトリウム水溶液
に溶解して使用した場合の例を示す。
The polishing method uses a regular rotating disk type polisher, with a diameter of 1
A polyurethane-polyester two-layer nonwoven fabric (product name Polytex
Supreme) was crucified. While dropping the polishing liquid having the composition of each example onto the surface of the polisher, the gallium arsenide single crystal surface (100) adhered to the adhesive plate was pressed against the rotating polisher with a pressure of 58 to 105 ykI1, and by the frictional force. Rotated. Example 1 This example shows an example in which cyanuric trichloride is used after being dissolved in an aqueous sodium hydroxide solution.

その場合における濃度と、PH及び研摩仕上がり面の状
態との関係を第1図に示す。すなわち、第1図は、三塩
化シアヌルと水酸化ナトリウムとによる水溶液作成の場
合における、濃度と、PH及び研摩仕上がり面の状態と
の関係を示す図面である。横軸は、水酸化ナトリウムの
Fle又はモル濃度5を、縦軸は、PH値を示す。そし
て、図中の数字は、三塩化シアヌル(90%)の溶解量
(Yle)を示す。例えば、1e中8yの三塩化シアヌ
ルは、約4V0Na0Hで中和される傾向を示す。研摩
仕上がり面は、三塩化シアヌルの濃度と、O三塩化シア
ヌル対水酸化ナトリウムの割合によつて変化し、それは
、第1図に示すように、鏡面となる領域(1)、選択性
エッチ面となる領域(■)及ひ表面に膜を生成する領域
(■)の3つに大別される。5 相対的にNaOH濃度
が低く、PHの小さい場合には、研摩面に反応生成物の
膜が付着する■の領域となる。
The relationship between the concentration, PH and the state of the polished surface in that case is shown in FIG. That is, FIG. 1 is a diagram showing the relationship between the concentration, PH, and the state of the polished surface in the case of creating an aqueous solution of cyanuric trichloride and sodium hydroxide. The horizontal axis shows Fle or molar concentration 5 of sodium hydroxide, and the vertical axis shows the PH value. The numbers in the figure indicate the dissolved amount (Yle) of cyanuric trichloride (90%). For example, 8y cyanuric trichloride in 1e shows a tendency to be neutralized with about 4V0NaOH. The polished surface changes depending on the concentration of cyanuric trichloride and the ratio of O cyanuric trichloride to sodium hydroxide. It is roughly divided into three regions: a region where the film is formed on the surface (■) and a region where a film is formed on the surface (■). 5 When the NaOH concentration is relatively low and the pH is low, a film of reaction products adheres to the polished surface in the region (2).

NaOH濃度が中間の範囲では、研摩時に適当な生成物
拡散層を通してヒ化ガリウムが溶解される結果、鏡面が
得られるIの領域となる。つNaOHが過剰で、PHが
大きい場合には、反応生成物の溶解速度が高いために、
反応律速過程に近付き、選択性エッチとなり、表面粗さ
の大きい■の領域となる。以上に述べたとおり、三塩化
シアヌル濃度の高己)ときは、反応生成物質の生成速度
が大きいので、鏡面を得るためには、NaOH濃度を高
くする必要がある。
In the intermediate NaOH concentration range, gallium arsenide is dissolved during polishing through a suitable product diffusion layer, resulting in region I where a mirror surface is obtained. When NaOH is in excess and the pH is high, the dissolution rate of the reaction product is high;
As the reaction rate-determining process approaches, selective etching occurs, resulting in a region (3) with large surface roughness. As described above, when the cyanuric trichloride concentration is high, the rate of production of reaction products is high, so in order to obtain a mirror surface, it is necessary to increase the NaOH concentration.

実施例2 本例では、三塩化シアヌルを、水酸化カリウム水溶液に
溶解して使用した場合の例を示す。
Example 2 This example shows an example in which cyanuric trichloride is used after being dissolved in an aqueous potassium hydroxide solution.

その楊合における濃度と、PH及び研摩仕上がり面の状
態との関係を第2図に示す。すなわち、第2図は、三塩
化シアヌルと水酸化カリウムとによる水溶液作成の場合
における、濃度と、PH及び研摩仕上がり面の状態との
関係を示す図面てある。横軸は、水酸化カリウムのモル
濃度を、縦軸は、PH値を示す。そして、図中の数字は
、三塩化シアヌル(90%)の溶解量(Yle)を示す
。前記実施例1と同様に、相対的にKOH濃度が高く、
PHが大きい場合には、選択性エッチの領域(■)とな
り、三塩化シアヌルとKOHとの割合が適当な場合には
、鏡面領域(1)が得られる。
FIG. 2 shows the relationship between the concentration at the time of polishing, the PH, and the state of the polished surface. That is, FIG. 2 is a diagram showing the relationship between the concentration, PH, and the state of the polished surface in the case of preparing an aqueous solution of cyanuric trichloride and potassium hydroxide. The horizontal axis shows the molar concentration of potassium hydroxide, and the vertical axis shows the PH value. The numbers in the figure indicate the dissolved amount (Yle) of cyanuric trichloride (90%). As in Example 1, the KOH concentration is relatively high;
When the pH is large, a selectively etched region (■) is obtained, and when the ratio of cyanuric trichloride and KOH is appropriate, a mirror-like region (1) is obtained.

実施例3本例では、三塩化シアヌルを、炭酸ナトリウム
水溶液に溶解して使用した場合の例を示す。
Example 3 This example shows an example in which cyanuric trichloride is used after being dissolved in an aqueous sodium carbonate solution.

その場合における濃度と、PH及び研摩仕上がり面の状
態との関係を第3図に示す。すなわち第3図は、1N●
炭酸ナトリウム水溶液中の三塩化シアヌル(90%)の
溶解量(ql′)と、PH及び研摩仕上がり面の状態と
の関係を示す図面である。横軸は、三塩化シアヌル(9
0%)の溶解量(ql′)を、縦軸は、PH値を示す。
前記実施例1と同様に、相対的にNa2cO3濃度が低
い場合には、表面に膜が付着する領域(■)となり、三
塩化シアヌルとNa2cO3との割合が適当な場合には
、鏡面領域(1)が得られる。
FIG. 3 shows the relationship between the concentration, PH, and the state of the polished surface in that case. In other words, in Figure 3, 1N●
FIG. 2 is a diagram showing the relationship between the amount of cyanuric trichloride (90%) dissolved in an aqueous sodium carbonate solution (ql'), the pH, and the condition of a polished surface. The horizontal axis is cyanuric trichloride (9
0%), and the vertical axis shows the pH value.
As in Example 1, when the Na2cO3 concentration is relatively low, a film adheres to the surface (■), and when the ratio of cyanuric trichloride and Na2cO3 is appropriate, a mirror-like region (1 ) is obtained.

実施例4本例ては、水酸化ナトリウム、水酸化カリウム
、又は炭酸ナトリウムの各種濃度の水溶液中に、三塩化
シアヌルを、その濃度を変えて溶解した場合、また、研
摩圧力を変えた場合における、研摩加工速度について例
示する。
Example 4 This example shows the results when cyanuric trichloride is dissolved in aqueous solutions of sodium hydroxide, potassium hydroxide, or sodium carbonate at various concentrations, and when the polishing pressure is varied. , the polishing speed will be exemplified.

その得られた結果を第4図に示す。すなわち第4図は、
水酸化ナトリウム、水酸化カリウム、又は炭酸ナトリウ
ムの各種濃度の水溶液中に、三塩化シアヌル(90%)
を、その濃度を変えて溶解した場合、また、研摩圧力を
変えた場合における、研摩加工速度の変化を示す図面て
ある。横軸は、三塩化シアヌル(90%)の溶解量(q
l′)を、縦軸は、研摩加工速度(μm/時)を示す。
そして、図中の数字は、NaOH.KOH又はNa2c
O3のノルマル濃度を示す。しかして、図中、「●」印
は、NaOH水溶液で研摩圧力105gIcT11「○
」印は、NaOH水溶液で研摩圧力58VId1「Δ」
印は、KOH水溶液て研摩圧力105VIcT11「口
」印は、Na2cO3水溶液て研摩圧力105VIcI
Lの場合を表す。研摩加工速度は、略、三塩化シアヌル
の濃度に比例し、また、同一の三塩化シアヌル濃度の場
合には、アルカリ濃度の高いほど早い。
The obtained results are shown in FIG. In other words, Figure 4 is
Cyanuric trichloride (90%) in aqueous solutions of sodium hydroxide, potassium hydroxide, or sodium carbonate at various concentrations.
The drawings show the changes in polishing speed when the concentration of the particles is changed and the polishing pressure is changed. The horizontal axis is the amount of cyanuric trichloride (90%) dissolved (q
l'), and the vertical axis shows the polishing speed (μm/hour).
The numbers in the figure are NaOH. KOH or Na2c
The normal concentration of O3 is shown. In the figure, the "●" mark indicates the polishing pressure of 105 gIcT11 "○" with NaOH aqueous solution.
” mark means polishing pressure 58VId1 “Δ” with NaOH aqueous solution
The mark indicates a polishing pressure of 105 VIcT11 using a KOH aqueous solution.
This represents the case of L. The polishing speed is approximately proportional to the concentration of cyanuric trichloride, and for the same cyanuric trichloride concentration, the higher the alkali concentration, the faster the polishing speed.

三塩化シアヌル1%の濃度で、100PTn./時以上
の高い研摩加工速度を得た。なお、上記化学処理液に、
粒径0.01〜0.05pm.のSlO2粉末を混入す
ると、反応生成物の除去に有効であり、研摩加工速度の
安定性が向上することが判明した。
At a concentration of 1% cyanuric trichloride, 100PTn. A high polishing speed of more than /hour was obtained. In addition, in the above chemical treatment liquid,
Particle size 0.01-0.05pm. It has been found that mixing in SlO2 powder of 20% is effective in removing reaction products and improves the stability of the polishing speed.

以上説明したように、本発明方法によれば、研摩剤の価
格が低廉で、しかも研摩加工速度が高く、化学的作用に
基づく研摩であるため、本質的に加工ひずみを生ずるこ
となく、鏡面が得られるという長所がある。
As explained above, according to the method of the present invention, the price of the abrasive is low, the polishing speed is high, and the polishing is based on chemical action, so that essentially no processing distortion occurs and a mirror surface is created. It has the advantage of being obtainable.

また本発明方法は、その研摩加工速度が高いことを利用
して、ヒ化ガリウム基板の粗ポリシングに特に好適なも
のであり、片面加工法のみならず、両面同時ポリシ機を
用いた両面鏡面研摩にも適用することができる。
Furthermore, the method of the present invention is particularly suitable for rough polishing of gallium arsenide substrates by taking advantage of its high polishing speed, and is suitable not only for single-sided polishing but also for double-sided mirror polishing using a double-sided simultaneous polishing machine. It can also be applied to

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、三塩化シアヌルと水酸化ナトリウムとによる
水溶液作成の場合における、濃度と、PH及び研摩仕上
がり面の状態との関係を示す図面である。
FIG. 1 is a drawing showing the relationship between the concentration, PH, and the state of the polished surface in the case of preparing an aqueous solution of cyanuric trichloride and sodium hydroxide.

Claims (1)

【特許請求の範囲】 1 三塩化シアヌルをアルカリ水溶液に溶解させた液を
用いて、ヒ化ガリウムを研摩することを特徴とする、ヒ
化ガリウムの研摩方法。 2 該アルカリが、水酸化ナトリウム、水酸化カリウム
、又は炭酸ナトリウムである、特許請求の範囲第1項に
記載のヒ化ガリウムの研摩方法。
[Claims] 1. A method for polishing gallium arsenide, which comprises polishing gallium arsenide using a solution prepared by dissolving cyanuric trichloride in an alkaline aqueous solution. 2. The method for polishing gallium arsenide according to claim 1, wherein the alkali is sodium hydroxide, potassium hydroxide, or sodium carbonate.
JP8075181A 1981-05-29 1981-05-29 How to polish gallium arsenide Expired JPS6047908B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8075181A JPS6047908B2 (en) 1981-05-29 1981-05-29 How to polish gallium arsenide

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8075181A JPS6047908B2 (en) 1981-05-29 1981-05-29 How to polish gallium arsenide

Publications (2)

Publication Number Publication Date
JPS57196723A JPS57196723A (en) 1982-12-02
JPS6047908B2 true JPS6047908B2 (en) 1985-10-24

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JP (1) JPS6047908B2 (en)

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Publication number Priority date Publication date Assignee Title
JPS6149425A (en) * 1984-08-17 1986-03-11 Hitachi Cable Ltd Polishing method of gaas substrate
JPH085007B2 (en) * 1986-12-12 1996-01-24 日産化学工業株式会社 Group III-V compound semiconductor polishing agent
JPH0645808Y2 (en) * 1988-11-14 1994-11-24 三洋電機株式会社 Water heater

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JPS57196723A (en) 1982-12-02

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