JPS6051683B2 - thin film optical lens - Google Patents
thin film optical lensInfo
- Publication number
- JPS6051683B2 JPS6051683B2 JP15659377A JP15659377A JPS6051683B2 JP S6051683 B2 JPS6051683 B2 JP S6051683B2 JP 15659377 A JP15659377 A JP 15659377A JP 15659377 A JP15659377 A JP 15659377A JP S6051683 B2 JPS6051683 B2 JP S6051683B2
- Authority
- JP
- Japan
- Prior art keywords
- dielectric layer
- layer
- refractive index
- dielectric
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Optical Integrated Circuits (AREA)
Description
【発明の詳細な説明】
本発明は誘電体層と金属層とを備えた薄膜形の光レンズ
に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a thin film type optical lens comprising a dielectric layer and a metal layer.
この種の薄膜形光レンズとして、例えば屈折率が比較的
小さい誘電体基板上に、比較的屈折率の大きい誘電体層
を積層し、所望の薄膜光レンズを形成すべく誘電体層を
部分的にエッチングして除去する構造が知られている。For this type of thin film optical lens, for example, a dielectric layer with a relatively high refractive index is laminated on a dielectric substrate with a relatively low refractive index, and the dielectric layer is partially layered to form the desired thin film optical lens. A structure is known in which the structure is removed by etching.
しかし、このようにして作成した薄膜光レンズでは、エ
ッチング側面、すなわち横方向境界面の境界不整が光の
波長程度で存在するため、この面精度の悪さが大きな光
散乱損失を引きおこし、光透過率の良いものを得ること
が困難であつた。本発明はこれらの欠点を緩和すること
を目的とし、これを誘電体基板上に作成した比較的大き
な屈折率を有する第1の誘電体層と、この第1の誘電体
層上に積層された比較的、屈折率の小さい第2の誘電層
と、所望のパターンの金属層とを積層した構成によつて
達成したものであり、以下図面について詳細に説明する
。第1図は本発明の一実施例を示す平面図、第2図は第
1図のX−Y方向に沿つた断面図である。However, in the thin-film optical lens created in this way, the etched side surface, that is, the lateral boundary surface, has boundary irregularities on the order of the wavelength of light, and this poor surface precision causes a large light scattering loss, resulting in light transmission. It was difficult to obtain a good rate. The present invention aims to alleviate these drawbacks, and includes a first dielectric layer having a relatively large refractive index formed on a dielectric substrate, and a layer laminated on the first dielectric layer. This is achieved by a structure in which a second dielectric layer having a relatively small refractive index and a metal layer having a desired pattern are laminated, and will be described in detail below with reference to the drawings. FIG. 1 is a plan view showing an embodiment of the present invention, and FIG. 2 is a sectional view taken along the X-Y direction of FIG. 1.
第1図と第2図において、1は屈折率が比較的小さい誘
電体基板、2は屈折率が比較的大きい第1の誘電体層、
3は屈折率が比較的小さい第2の誘電体基板、4は空気
、5は金属層、6は入射ビーム光を示している。第1の
誘電体層2中の入射ビーム光6との入出光の結合は、プ
リズムカプラー7a、7b、7cを介して行なうことが
できる。また、nl、n2、n3、n。、馬は順次それ
ぞれ誘・重体基板1、第1の誘電体層2、第2の誘電体
層3、空気4、金属層5の物質の光の屈折率である。こ
の実施例では誘電体基板1,第1の誘電体層2,第2の
誘電体層3,金属層5として順次それぞれ、SlO2基
板、Al2O3層、SiO2層、A1層を用い、SiO
2基板1上に高周波スパッタ法(あるいはC.V.D.
法その他の方法)でAl2O3層2を数千Aないしは、
数μm付着させ、更に同様の方法でSlO2層3を数千
A程度付着させ、次にA1層5を数千Aマスク蒸着法(
あるいは蒸着後のフォトエッチング法等)によつて付着
させて構成している。In FIGS. 1 and 2, 1 is a dielectric substrate with a relatively low refractive index, 2 is a first dielectric layer with a relatively high refractive index,
3 is a second dielectric substrate having a relatively small refractive index, 4 is air, 5 is a metal layer, and 6 is an incident light beam. Coupling of the input and output light with the incident light beam 6 in the first dielectric layer 2 can be performed via prism couplers 7a, 7b, 7c. Also, nl, n2, n3, n. , H are the optical refractive indexes of the materials of the dielectric/heavy substrate 1, the first dielectric layer 2, the second dielectric layer 3, the air 4, and the metal layer 5, respectively. In this example, a SlO2 substrate, an Al2O3 layer, a SiO2 layer, and an A1 layer are used as the dielectric substrate 1, first dielectric layer 2, second dielectric layer 3, and metal layer 5, respectively, and SiO
2. High frequency sputtering method (or C.V.D.
method or other method) to heat the Al2O3 layer 2 to several thousand amperes or
A few μm of the film was deposited, and then a SlO2 layer 3 of several thousand amps was deposited using the same method, and then an A1 layer 5 of several thousand amps was deposited using a mask evaporation method (
Alternatively, the film may be deposited by a photo-etching method after vapor deposition, etc.).
このように構成すると、金属板5と第2の誘電体層3を
介して接した第1の誘電体層2の等価屈折率すなわち領
域Aにおける第1の誘電体層2の等価屈折率は約1.6
04となり空気4が接したB領域での第1の誘電体層2
の等価屈折率は約1.636となり、金属層5のパター
ンに従つて第1誘電体層2に於ける屈折率差が生じる。With this structure, the equivalent refractive index of the first dielectric layer 2 in contact with the metal plate 5 via the second dielectric layer 3, that is, the equivalent refractive index of the first dielectric layer 2 in the region A is approximately 1.6
04 and the first dielectric layer 2 in the B region in contact with the air 4
The equivalent refractive index of is approximately 1.636, and a refractive index difference occurs in the first dielectric layer 2 according to the pattern of the metal layer 5.
この屈折率差を例えば第1図中の金属層4のパターンで
示される通常の光学凹レンズ上に生じせしめることによ
り、入射ビーム光6に対して第1の誘電体層2中では集
束レンズを構成することができる。この実施例のように
構成すると、容易に製造できると共に第2の誘電体層の
効果によつて金属層のオーミックな損失が小さくかつ光
の進行方向境界面での光散乱損失が少なく、光透過損失
の少い薄膜光レンズを得ることができる。次に第1の誘
電体層2の上に第2の誘電体層3を設けることにより、
第1の誘電体層2のおける光の伝送損失が低下する理由
について述べる。By creating this refractive index difference, for example, on a normal optical concave lens shown by the pattern of the metal layer 4 in FIG. 1, a focusing lens is formed in the first dielectric layer 2 for the incident beam light 6. can do. With the structure of this embodiment, it is easy to manufacture, the ohmic loss of the metal layer is small due to the effect of the second dielectric layer, and the light scattering loss at the boundary surface in the direction of light propagation is small, resulting in light transmission. A thin film optical lens with low loss can be obtained. Next, by providing the second dielectric layer 3 on the first dielectric layer 2,
The reason why the optical transmission loss in the first dielectric layer 2 is reduced will be described.
誘.電体2中の光伝播定数β,光の減衰定数αと誘電体
2の膜厚T2,誘電体3の膜厚bとの関係は、b=0と
した良く知られている。(例えばAppIiedOpt
ics第1?第5号A.Reisjnger参照)関係
式の拡張として次式で示すことができる。ここで、γ4
=1,γ32=1,γ53=1(TEモードの場合)
γf÷さγ32:÷きγ534ら(TMモードの場合)
であり、λoは光の真空中での波長、ε1,ε2,ε3
,ε4,ε5は波長λ。Temptation. The relationship between the light propagation constant β and the light attenuation constant α in the electric body 2, the film thickness T2 of the dielectric body 2, and the film thickness b of the dielectric body 3 is well known, with b=0. (For example, AppIiedOpt
ics first? No. 5 A. (Reisjnger) can be expressed as the following equation as an extension of the relational equation. Here, γ4
=1, γ32=1, γ53=1 (for TE mode)
γf ÷ γ32: ÷ γ534, etc. (for TM mode)
, λo is the wavelength of light in vacuum, ε1, ε2, ε3
, ε4, ε5 are wavelengths λ.
に対する誘電体基板1,誘電体層2,誘電体層3,空気
4,もしくは金属層5それぞれの物質の誘電率、ちは光
伝送路となる薄膜誘電体層の厚さ、bは中間絶縁層3の
厚さ、Nは光の次数、Nl,n2,rl3,rLi,n
5はλoに対する誘電体基板1,誘電体層2,誘電体・
層3,空気4,もしくは金属層5それぞれの物質の屈折
率である。誘電体基板1,誘電体層2,誘電体層3,金
属層5の物質をそれぞれSlO2,Al2O3,SiO
2,AIとし屈折率をn1=1.48,n2=1.68
,n3=1.48,T111.=1.2−J7.Oとし
て、また波長6328AのHe−Neレーザー光を用い
て、誘電体層2の厚さを3000A,誘電体層3の厚さ
を3000A,金属5の欠除部分の横方向幅6.5μm
とした場合、TEOモードの伝播光に対する減衰量は、
4dB/Crn程度となり誘電体層3を設けない場合の
85dB/c!RL程度と比較して大巾に改善される。The dielectric constant of each substance of the dielectric substrate 1, dielectric layer 2, dielectric layer 3, air 4, or metal layer 5, that is, the thickness of the thin film dielectric layer that becomes the optical transmission path, and b is the intermediate insulating layer. 3 thickness, N is the order of light, Nl, n2, rl3, rLi, n
5 is a dielectric substrate 1, a dielectric layer 2, a dielectric material for λo,
This is the refractive index of each substance of layer 3, air 4, or metal layer 5. The materials of the dielectric substrate 1, dielectric layer 2, dielectric layer 3, and metal layer 5 are SlO2, Al2O3, and SiO, respectively.
2. As AI, refractive index is n1=1.48, n2=1.68
, n3=1.48, T111. =1.2-J7. The thickness of the dielectric layer 2 is 3000A, the thickness of the dielectric layer 3 is 3000A, and the lateral width of the cutout part of the metal 5 is 6.5 μm.
In this case, the amount of attenuation for the TEO mode propagating light is
It becomes about 4 dB/Crn, which is 85 dB/c when the dielectric layer 3 is not provided! This is a huge improvement compared to RL.
なお、誘電体層2中の入射ビーム光6との入出力光の結
合はプリズムカプラー7の他に誘電体層2の表面に回折
格子を形成し入射ビーム光6との干渉により行うことも
できる。In addition to the prism coupler 7, coupling of input and output light with the incident beam 6 in the dielectric layer 2 can also be achieved by forming a diffraction grating on the surface of the dielectric layer 2 and interfering with the incident beam 6. .
また、誘電体層2中に半導体レーザ等の活性層を埋め込
む構造にしても良い。また、本実施例では集束型レンズ
を構成する場合について述べたが、金属層を任意の形状
にすることにより、第3図に示す発散型レンズにも応用
できることはいうまでもない。Alternatively, an active layer such as a semiconductor laser may be embedded in the dielectric layer 2. Further, in this embodiment, the case where a converging type lens is constructed has been described, but it goes without saying that the present invention can also be applied to a diverging type lens shown in FIG. 3 by forming the metal layer into an arbitrary shape.
さらに本実施例の応用例として、第4図に示す薄膜中の
異なる多数の位置に埋込まれた半導体レーザ8a,8b
,8cより発せられた光線を集光し、薄膜中に埋込まれ
た光検出器9で、効率よく検出する構成も可能である。
以上説明したように、本発明によれば屈折率差を生じる
境界面での光の散乱を小さくかつ透過光の損失も小さく
できるため、効率の良い、あるいは容易に製作できる等
の利点を有する。Furthermore, as an application example of this embodiment, semiconductor lasers 8a and 8b are embedded in a large number of different positions in a thin film as shown in FIG.
, 8c can be condensed and efficiently detected by a photodetector 9 embedded in a thin film.
As explained above, according to the present invention, it is possible to reduce the scattering of light at the boundary surface where the difference in refractive index occurs and also to reduce the loss of transmitted light, so it has advantages such as high efficiency and easy manufacture.
第1図は本発明の一実施例を示す光レンズの平面図、第
2図は第1図のX−Y線に沿つた断面図、第4図は本実
施例の応用例を示す図である。
1・・・・・・誘電体基板、2・・・・・・第1の誘電
体層、3・・・・・・第2の誘電体層、4・・・・・・
空気、5・・・・・・金属層、6・・・・・・入射ビー
ム光、7・・・・・・プリズムカプラー、8・・・・・
・半導体レーザー、9・・・・・・光検出器。Fig. 1 is a plan view of an optical lens showing an embodiment of the present invention, Fig. 2 is a sectional view taken along the X-Y line in Fig. 1, and Fig. 4 is a diagram showing an example of application of this embodiment. be. DESCRIPTION OF SYMBOLS 1... Dielectric substrate, 2... First dielectric layer, 3... Second dielectric layer, 4...
Air, 5... Metal layer, 6... Incident beam light, 7... Prism coupler, 8...
- Semiconductor laser, 9... photodetector.
Claims (1)
比較的大きい第1誘電体層と、この第1誘電体層上に積
層された比較的屈折率が小さく且つ前記第1誘電体層の
特定部分を導波する伝播光の損失が小さくなるような比
較的薄い第2誘電体層と、この第2誘電体層上に積層さ
れた金属層とを含み、前記第1誘電体層中に形成される
光伝送路に対して前記金属層がレンズの断面形状に形成
した薄膜光レンズ。1. A first dielectric layer having a relatively high refractive index laminated on a dielectric substrate having a low refractive index, and the first dielectric layer having a relatively low refractive index and laminated on the first dielectric layer. a relatively thin second dielectric layer that reduces loss of propagating light guided through a specific portion of the first dielectric layer, and a metal layer laminated on the second dielectric layer; A thin film optical lens in which the metal layer is formed in the cross-sectional shape of a lens with respect to an optical transmission path formed in the optical transmission path.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15659377A JPS6051683B2 (en) | 1977-12-27 | 1977-12-27 | thin film optical lens |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15659377A JPS6051683B2 (en) | 1977-12-27 | 1977-12-27 | thin film optical lens |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49032643A Division JPS6051085B2 (en) | 1974-03-25 | 1974-03-25 | optical device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS53114450A JPS53114450A (en) | 1978-10-05 |
| JPS6051683B2 true JPS6051683B2 (en) | 1985-11-15 |
Family
ID=15631142
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15659377A Expired JPS6051683B2 (en) | 1977-12-27 | 1977-12-27 | thin film optical lens |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6051683B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5879710B2 (en) * | 2011-03-18 | 2016-03-08 | 富士通株式会社 | Optical device and optical modulator |
-
1977
- 1977-12-27 JP JP15659377A patent/JPS6051683B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS53114450A (en) | 1978-10-05 |
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