JPS6052632B2 - Correction signal measurement method and measurement device - Google Patents
Correction signal measurement method and measurement deviceInfo
- Publication number
- JPS6052632B2 JPS6052632B2 JP9269782A JP9269782A JPS6052632B2 JP S6052632 B2 JPS6052632 B2 JP S6052632B2 JP 9269782 A JP9269782 A JP 9269782A JP 9269782 A JP9269782 A JP 9269782A JP S6052632 B2 JPS6052632 B2 JP S6052632B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- correction signal
- light receiver
- correction
- picture tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/04—Diagnosis, testing or measuring for television systems or their details for receivers
Landscapes
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Biomedical Technology (AREA)
- General Health & Medical Sciences (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Description
【発明の詳細な説明】
テレビジョン受像機の受像管において、例えば糸巻き
形歪みを補正する場合には、従来は垂直周期及び水平周
期のパラボラ波を垂直偏向信号及び水平偏向信号に重畳
して行つていた。Detailed Description of the Invention When correcting, for example, pincushion distortion in a picture tube of a television receiver, conventionally, parabolic waves with vertical and horizontal periods are superimposed on vertical and horizontal deflection signals. It was on.
しかしながら、大形の受像管においては、単なるパラボ
ラ波では完全な補正を行うことはできない。 そこで例
えばラスタを吹出し、蛍光面の任意の点でビームが正し
くランデインクするように偏向信号を補正し、そのとき
必要とした補正量を測定すると共に、蛍光面の全面にわ
たつて同じ操作を繰り返し、各点の補正量をプロットし
て必要な補正信号の波形を得ることが行われている。However, in a large-sized picture tube, complete correction cannot be performed with a simple parabolic wave. So, for example, we blow out a raster, correct the deflection signal so that the beam will land ink correctly at an arbitrary point on the phosphor screen, measure the amount of correction needed at that time, and repeat the same operation over the entire surface of the phosphor screen. The waveform of the necessary correction signal is obtained by plotting the correction amount at each point.
ところでこのような測定を行う場合には、測定点の位
置を知る必要がある。By the way, when performing such measurements, it is necessary to know the position of the measurement point.
そのため従来は、蛍光面上にスケールを当てて位置を測
定するようにしていた。 ところが受像管において、ラ
スタは蛍光面よりも大きく、いわゆるオーバースキャン
されている。Conventionally, therefore, the position was measured by placing a scale on the phosphor screen. However, in a picture tube, the raster is larger than the phosphor screen, and is so-called overscanned.
このため蛍光面上で位置を測定しても、その位置と偏向
信号上での位置とは一致しない。またスケールを目で見
て測定するため正確な値を得ることもむずカルい。従つ
て、そのような測定量をプロットして得た補正信号を偏
向信号に重畳しても正しい補正を行うことはできなかつ
た。 本発明はこのような点にかんがみ、簡単な構成で
、正確な補正信号の波形を得ることができるようにした
ものである。Therefore, even if the position is measured on the phosphor screen, the position does not match the position on the deflection signal. It is also difficult to obtain accurate values because the scale is measured visually. Therefore, even if a correction signal obtained by plotting such a measured quantity is superimposed on a deflection signal, correct correction cannot be performed. In view of these points, the present invention is designed to enable obtaining accurate correction signal waveforms with a simple configuration.
以下、図面を参照しながら本発明の一実施例について
説明しよう。Hereinafter, one embodiment of the present invention will be described with reference to the drawings.
なお、この例では垂直方向の糸巻き歪みの補正信号を測
定する場合について述べる。 第1図において、偏向回
路1からの水平及び垂直偏向信号が受像管2の偏行コイ
ル3に供給される。In this example, a case will be described in which a correction signal for vertical pincushion distortion is measured. In FIG. 1, horizontal and vertical deflection signals from a deflection circuit 1 are applied to a deflection coil 3 of a picture tube 2. In FIG.
また、垂直偏向信号の一部がパラボラ波発生回路4に供
給され、この発生回路4からのパラボラ波信号Baが補
正用の偏向コイル5に供給される。また、このパラボラ
波信号Baが2現象のオシロスコープ6に供給される。
さらに受光器7からの検出信号Sbがアツテネータ8を
通じてオシロスコープ6に供給される。従つてこの回路
において、オシロスコープ6には第2図に示すようにパ
ラボラ波信号Saが映出される。Further, a part of the vertical deflection signal is supplied to a parabolic wave generation circuit 4, and a parabolic wave signal Ba from this generation circuit 4 is supplied to a correction deflection coil 5. Further, this parabolic wave signal Ba is supplied to a two-phenomenon oscilloscope 6.
Further, a detection signal Sb from the light receiver 7 is supplied to the oscilloscope 6 through an attenuator 8. Therefore, in this circuit, a parabolic wave signal Sa is displayed on the oscilloscope 6 as shown in FIG.
それと共に、受光器7を蛍光面の任意の点に当てること
により、その点を電子ビームが通過したときの発光が検
出され、これが検出信号Sbとして映出される。そして
この場合にパラボラ波信号Saと検出信号Sbとは、時
間軸が一致している。そこで、受光器7を当てている点
が正確なランディング状態となるようにパラボラ波発生
回路4を調整し、そのときの信号Sbの立ち上がり点と
信号Saとの交点のレベルBを読み取れば、その点の必
要な補正量を測定することができる。At the same time, by applying the light receiver 7 to an arbitrary point on the phosphor screen, the light emitted when the electron beam passes through that point is detected, and this is displayed as a detection signal Sb. In this case, the parabolic wave signal Sa and the detection signal Sb have the same time axis. Therefore, by adjusting the parabolic wave generation circuit 4 so that the point on which the light receiver 7 is applied is in an accurate landing state, and reading the level B at the intersection of the rising point of the signal Sb and the signal Sa at that time, the The required correction amount of the point can be determined.
また、パラボラ波信号Saは垂直偏向信号に同期してい
るので、この信号Saの始めから信号Sbの立ち上がり
点までの距離′を測定することにより、偏向信号上での
測定点の位置を正確に知ることができる。そして測定点
を順次変化させ、測定されたレベルBと距離′とをプロ
ットすることにより、必要な補正信号の波形を得ること
ができる。Furthermore, since the parabolic wave signal Sa is synchronized with the vertical deflection signal, by measuring the distance from the beginning of the signal Sa to the rising point of the signal Sb, the position of the measurement point on the deflection signal can be accurately determined. You can know. Then, by sequentially changing the measurement points and plotting the measured level B and distance', the waveform of the necessary correction signal can be obtained.
なお実際には、測定点を順次変えていき、そのときどき
の交点をオシロスコープ上にプロットすることにより、
直接必要な波形を得ることもできる。In reality, by changing the measurement points sequentially and plotting the intersection points on the oscilloscope,
You can also directly obtain the required waveform.
こうして補正信号の波形を測定することができるわけで
あるが、本発明によれば、測定点を正確に知ることがで
きるので、測定される補正信号の波形が正確になる。In this way, the waveform of the correction signal can be measured. According to the present invention, the measurement point can be accurately known, so the waveform of the correction signal to be measured becomes accurate.
なお本発明は糸巻き形歪みの補正に限らす、リニアリテ
ィ、リンギング、ミスコンバージエンス等の補正信号の
測定にも使用できる。Note that the present invention is not limited to correction of pincushion distortion, but can also be used to measure correction signals for linearity, ringing, misconvergence, and the like.
また上述の例は垂直周期の測定の場合について述べたが
、水平周期の測定の場合には信号Sbの波形が鈍つて測
定しにくくなる。Furthermore, although the above example deals with the measurement of the vertical period, in the case of measuring the horizontal period, the waveform of the signal Sb becomes dull and difficult to measure.
そこで水平周期の測定の場合には検出信号Sbを微分回
路に供給し、さらにその微分信号をスライスして明瞭な
波形を得ることができる。さらに信号Saをデジタル測
定器に供給し、受光器からの信号で測定器をトリガして
、レベルを表示させるようにしてもよい。Therefore, in the case of measuring the horizontal period, the detection signal Sb is supplied to a differentiating circuit, and the differentiated signal is further sliced to obtain a clear waveform. Furthermore, the signal Sa may be supplied to a digital measuring instrument, and the measuring instrument may be triggered by the signal from the light receiver to display the level.
第1図は本発明の一例の系統図、第2図はその説明のた
めの波形図である。
5は補正用の偏向コイル、6はオシロスコープ、7は受
光器である。FIG. 1 is a system diagram of an example of the present invention, and FIG. 2 is a waveform diagram for explaining the same. 5 is a deflection coil for correction, 6 is an oscilloscope, and 7 is a light receiver.
Claims (1)
する補正信号発生器からの上記補正信号を波形測定器に
供給するとともに、上記受像管の前面の任意の点におい
た受光器からの信号を上記波形測定器に供給して、上記
受光器からの信号により上記任意の点における上記補正
信号のレベルを測定するようにした補正信号の測定方法
。 2 受像管のビーム走査位置を補正する補正信号を発生
する補正信号発生器と波形測定器と受光器とを有し、上
記受光器を上記受像管の前面の任意の位置におき、上記
補正信号発生器と上記受光器を上記波形測定器に接続し
、上記受光器からの信号により上記任意の点における上
記補正信号のレベルを測定するようにした補正信号の測
定装置。[Scope of Claims] 1. The correction signal from a correction signal generator that generates a correction signal for correcting the beam scanning position of the picture tube is supplied to a waveform measuring device, and the signal is placed at an arbitrary point on the front surface of the picture tube. A method for measuring a correction signal, wherein a signal from a light receiver is supplied to the waveform measuring device, and the level of the correction signal at the arbitrary point is measured using the signal from the light receiver. 2. A correction signal generator, a waveform measuring device, and a light receiver that generate a correction signal for correcting the beam scanning position of the picture tube, and the light receiver is placed at an arbitrary position in front of the picture tube, and the correction signal is generated by placing the light receiver at an arbitrary position in front of the picture tube. A correction signal measuring device, wherein a generator and the light receiver are connected to the waveform measuring device, and the level of the correction signal at the arbitrary point is measured based on the signal from the light receiver.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9269782A JPS6052632B2 (en) | 1982-05-31 | 1982-05-31 | Correction signal measurement method and measurement device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9269782A JPS6052632B2 (en) | 1982-05-31 | 1982-05-31 | Correction signal measurement method and measurement device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5850864A JPS5850864A (en) | 1983-03-25 |
| JPS6052632B2 true JPS6052632B2 (en) | 1985-11-20 |
Family
ID=14061685
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9269782A Expired JPS6052632B2 (en) | 1982-05-31 | 1982-05-31 | Correction signal measurement method and measurement device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6052632B2 (en) |
-
1982
- 1982-05-31 JP JP9269782A patent/JPS6052632B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5850864A (en) | 1983-03-25 |
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