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JPS6058577B2 - How to fix hard mask - Google Patents
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JPS6058577B2 - How to fix hard mask - Google Patents

How to fix hard mask

Info

Publication number
JPS6058577B2
JPS6058577B2 JP54060285A JP6028579A JPS6058577B2 JP S6058577 B2 JPS6058577 B2 JP S6058577B2 JP 54060285 A JP54060285 A JP 54060285A JP 6028579 A JP6028579 A JP 6028579A JP S6058577 B2 JPS6058577 B2 JP S6058577B2
Authority
JP
Japan
Prior art keywords
hard mask
melting point
low melting
masks
metal powder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54060285A
Other languages
Japanese (ja)
Other versions
JPS55153331A (en
Inventor
文男 堀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP54060285A priority Critical patent/JPS6058577B2/en
Publication of JPS55153331A publication Critical patent/JPS55153331A/en
Publication of JPS6058577B2 publication Critical patent/JPS6058577B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Description

【発明の詳細な説明】 本発明は半導体装置の製造において各種素子パターンを
形成するためのハードマスクに関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a hard mask for forming various element patterns in the manufacture of semiconductor devices.

半導体装置の素子パターンを形成するためのマスクとし
ては、エマルジョンマスクが古くから用いられていたが
、半導体ウエハーヘの焼付耐久性を高めたハードマスク
が近年利用される傾向にある。
Emulsion masks have been used for a long time as masks for forming element patterns of semiconductor devices, but in recent years there has been a trend toward the use of hard masks that have increased durability for printing onto semiconductor wafers.

ハードマスクの材料には、クロムマスク、酸化クロムマ
スク、酸化鉄マスク、シリコンマスク、シリコンゲルマ
ニウムマスクなどが知られている。これらのハードマス
ク材料はポジ型ホトレジストを用いる露光法によつてパ
ターニングされるが、マスクには1〜数ミクロンのピン
ホール等の欠陥があると回路素子パターンの精度を損う
。したがつてハードマスクのピンホール修正を行う必要
が生じる。従来のハードマスク修正法によると、ハード
マスクを顕微鏡で検査して欠陥が発見された場合には、
ハードマスクにポジレジストを塗布し、紫外線ビームに
よりスポット露光を行い欠陥部のネガレジストを除去し
、続いてハードマスク全体に金属を蒸着又はスパッタし
てピンホール等の欠陥部を埋めていた。しかし、この方
法によると蒸着又はスパッタが比較的長い時間を必要と
するために、マスク自体がコスト高になつていた。
Known materials for hard masks include chrome masks, chromium oxide masks, iron oxide masks, silicon masks, and silicon germanium masks. These hard mask materials are patterned by an exposure method using a positive photoresist, but if the mask has defects such as pinholes of 1 to several microns, the accuracy of the circuit element pattern will be impaired. Therefore, it becomes necessary to correct pinholes in the hard mask. According to traditional hardmask repair methods, if a defect is found by inspecting the hardmask under a microscope,
A positive resist is applied to a hard mask, spot exposure is performed with an ultraviolet beam to remove the negative resist in defective areas, and then metal is deposited or sputtered over the entire hard mask to fill in defective areas such as pinholes. However, according to this method, vapor deposition or sputtering requires a relatively long time, resulting in an increase in the cost of the mask itself.

また、スパッタ又は蒸着金属はピンホール部だけでなく
マスク全体に被着されるために、不必要なところにスパ
ッタ又は蒸着金属膜が残るという欠点があつた。本発明
は、上記のようなハードマスク欠陥修正法の欠点を解消
するためになされたものであつて、低融点金属粉末をハ
ードマスク上に塗布し、”ハードマスク上のピンホール
のある位置の低融点金属粉末をレーザー光で融着させる
ことによりピンホールの補修又は修正を行うものである
Furthermore, since the sputtered or vapor-deposited metal is applied not only to the pinholes but also to the entire mask, there is a drawback that the sputtered or vapor-deposited metal film remains in unnecessary areas. The present invention has been made in order to eliminate the drawbacks of the hard mask defect repair method as described above. Pinholes are repaired or corrected by fusing low melting point metal powder with laser light.

本発明によると金属粉末の塗布等によりピンホールの修
正を行うから、蒸着スパッタ等の時間がかかる工程を省
略し、単時間でピンホールの修正を行う利点がある。低
融点金属としてはアルミニウム、鉛、錫、亜鉛、又はこ
れらの金属を含む合金を用いることが好ましい。この金
属粉の塗布方法としては、ハードマスク全体又はピンホ
ール部附近にのみ適当な方法で散布する方法が好ましい
。低融点金属粉末の粒度は噴霧法などの金属粉化法によ
つて得られる粉末粒度であれば特に制限はない。
According to the present invention, since pinholes are corrected by applying metal powder or the like, there is an advantage that time-consuming processes such as vapor deposition sputtering can be omitted and pinholes can be corrected in a single time. As the low melting point metal, it is preferable to use aluminum, lead, tin, zinc, or an alloy containing these metals. As a method for applying the metal powder, it is preferable to spray it on the entire hard mask or only in the vicinity of the pinholes by an appropriate method. The particle size of the low melting point metal powder is not particularly limited as long as it can be obtained by a metal powdering method such as a spraying method.

低融点金属粉末塗布の具体的方法としては、従来のスパ
ッタによる修正法で行われていたように、ネガレジスト
塗布、紫外線露光を行い、その後にNaOH溶液などで
レジストを除去する方法を採用してもよい。
The specific method for applying the low melting point metal powder is to apply a negative resist, expose it to ultraviolet light, and then remove the resist using a NaOH solution, etc., as was done in the conventional sputtering correction method. Good too.

低融点金属としては前述のように、鉛、錫、亜鉛、アル
ミニウム及びこれらを含む合金を使用できるが、ハード
マスクに要求される性質の一つである耐薬品性、特に耐
硫酸性、を考慮すると、鉛、又はその合金が有利である
As mentioned above, lead, tin, zinc, aluminum, and alloys containing these can be used as low melting point metals, but chemical resistance, especially sulfuric acid resistance, which is one of the properties required for hard masks, must be taken into consideration. Lead or its alloys are then advantageous.

上記の説明から明らかなように、本発明によると蒸着又
はスパッタによることなくハードマスクの欠陥を修正で
きるから、ハードマスクの製造時間とともにそのコスト
が減少されるものである。
As is clear from the above description, according to the present invention, defects in a hard mask can be repaired without using evaporation or sputtering, thereby reducing the manufacturing time and cost of the hard mask.

Claims (1)

【特許請求の範囲】[Claims] 1 低融点金属粉末をハードマスク上に塗布し、該ハー
ドマスク上のピンホールが位置する部分の前記低融点金
属粉末にレーザー光を照射することによつて低融点金属
粉末を融着させることを特徴とするハードマスクの修正
方法。
1 Applying a low melting point metal powder onto a hard mask, and irradiating the low melting point metal powder on the portion of the hard mask where the pinhole is located with a laser beam to fuse the low melting point metal powder. Features a hard mask correction method.
JP54060285A 1979-05-18 1979-05-18 How to fix hard mask Expired JPS6058577B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54060285A JPS6058577B2 (en) 1979-05-18 1979-05-18 How to fix hard mask

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54060285A JPS6058577B2 (en) 1979-05-18 1979-05-18 How to fix hard mask

Publications (2)

Publication Number Publication Date
JPS55153331A JPS55153331A (en) 1980-11-29
JPS6058577B2 true JPS6058577B2 (en) 1985-12-20

Family

ID=13137719

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54060285A Expired JPS6058577B2 (en) 1979-05-18 1979-05-18 How to fix hard mask

Country Status (1)

Country Link
JP (1) JPS6058577B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007298858A (en) * 2006-05-02 2007-11-15 Hoya Corp Method for producing substrate for mask blank, method for producing mask blank and method for producing mask for exposure, and mask blank and mask for exposure

Also Published As

Publication number Publication date
JPS55153331A (en) 1980-11-29

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