JPS609280B2 - Optical drive device for thin film EL elements - Google Patents
Optical drive device for thin film EL elementsInfo
- Publication number
- JPS609280B2 JPS609280B2 JP52099000A JP9900077A JPS609280B2 JP S609280 B2 JPS609280 B2 JP S609280B2 JP 52099000 A JP52099000 A JP 52099000A JP 9900077 A JP9900077 A JP 9900077A JP S609280 B2 JPS609280 B2 JP S609280B2
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- light
- pulse
- luminance
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Control Of El Displays (AREA)
Description
【発明の詳細な説明】
この発明は、発光輝度の対印加電圧特性に於いてヒステ
リシス現象を示す三層構造薄膜EL素子の駆動方法に関
し、特に光によるフィルム写真像の書込みに特徴を有す
るものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for driving a three-layer thin film EL element that exhibits a hysteresis phenomenon in the characteristic of luminance versus applied voltage, and is particularly characterized in writing photographic film images using light. be.
発光中心を形成する活性物質としてMn等を添加したZ
nS:Mn薄膜を、Y203等の絶縁膜でサンドイッチ
状にはさんだ、いわゆる三眉構造薄膜EL素子に於いて
、発光輝度特性の対印加電圧特性にヒステリシス現象の
あることが報告されている。Z added with Mn etc. as an active substance forming a luminescent center
It has been reported that a so-called three-eye structure thin film EL element in which an nS:Mn thin film is sandwiched between insulating films such as Y203 has a hysteresis phenomenon in the applied voltage characteristics of the luminance characteristics.
このヒステリシス現象を利用すると、上記EL素子を一
種のメモリー機能素子として動作させることができ、素
子の発光輝度の大小として任意に情報を書込み、メモリ
ーさせ消去することができる。本発明は、この様な三層
構造薄膜由L素子の駆動方法に関するものであり、特に
光によるフィルム写真像の書込みに特徴を有している。By utilizing this hysteresis phenomenon, the EL element can be operated as a type of memory function element, and information can be arbitrarily written, memorized, and erased based on the magnitude of the luminance of the element. The present invention relates to a method for driving such a three-layer thin film L element, and is particularly characterized in writing film photographic images using light.
以下に、上記ヒステリシス現象の説明と共に、すでに提
案されている駆動方法を述べ、後述する本発明方法の理
解を容易にする。Below, along with an explanation of the hysteresis phenomenon, already proposed driving methods will be described to facilitate understanding of the method of the present invention, which will be described later.
第1図は三層構造ZnS:Mn薄膜発光素子の構成を示
す断面図であり、1は発光中心を形成する活性物質とし
てMn等を添加したZnS薄膜層、2,3はY203等
の透明な絶縁薄膜、4は透明電極、5はAI等の背面電
極、6はガラス基板を示す。Figure 1 is a cross-sectional view showing the structure of a three-layer structure ZnS:Mn thin film light emitting device, in which 1 is a ZnS thin film layer doped with Mn or the like as an active substance to form a luminescent center, 2 and 3 are transparent layers such as Y203, etc. An insulating thin film, 4 a transparent electrode, 5 a back electrode such as AI, and 6 a glass substrate.
この図から明らかな様に、この発光素子はZnS薄膜層
1を透明絶縁薄膜2,3でサンドイッチ状にはさんだ構
造であり、Z船薄膜層1または透明絶縁薄膜2,3の材
質あるいは製造条件を適当に設定する事に依って、この
素子の発光輝度のヒステリシス現象を生じさせる事がで
きる。第2図は上許Z船薄膜発光素子の対印加電圧発光
輝度特性を示す図であって、機軸は印加交流電圧パルス
の振幅(波高値)Vを、縦軸は発光輝度Bをあらわして
いる。この第2図から明らかな様に、印加パルスの電圧
を上昇して行く時の素子の発光輝度(曲線Aで示す)と
、電圧を降下して行く時の素子の発光輝度(曲線Bで示
す)と、の間には、顕著なヒステリシス現象が存在する
。従って今、電圧上昇時の最小発光輝度Beと電圧下降
時の最大発光輝度Bwとの差が充分に大きい点の電圧値
Vs(維持電圧)を選び、これを振幅とする交流パルス
打舵sで上記素子を駆動する時、素子は輝度Bwの範囲
内の発光輝度をこのパルス列Psに依って維持する。即
ち、交流パルス列Psの振幅を瞬間的に変調して、高い
書込み電圧Vwを一瞬素子に印加すると、素子は瞬間輝
度Bw′で発光した後、次の交流維持パルスにて書込み
輝度Bwの点で落ちつき、以後の交流維持パルスの印加
によってこの輝度Bwを維持する。一方、このようにし
て書込み状態を維持している交流維持パルス列Psの振
幅さらに変調して、充分に低い消去電圧Veを一瞬素子
に印加すると素子は瞬間消去輝度Be′の点を通過した
後、次の交流維持パルス打Fsにて消去輝度Beに落ち
つきこの輝度Beを維持して、消去及び消去状態のメモ
リーを行う。また上記書込み、消去にあたって、書込み
あるいは消去電圧yw,Veを任意に選択すると、輝度
Bw,皮の間での中間調の輝度が得られる。以上述べた
のが、すでに提案されているZnS薄EL素子の駆動方
法であって、この様にする事により素子に一種のメモリ
ー機能を持たせることができる。As is clear from this figure, this light emitting element has a structure in which a ZnS thin film layer 1 is sandwiched between transparent insulating thin films 2 and 3, and the material or manufacturing conditions of the Z ship thin film layer 1 or the transparent insulating thin films 2 and 3 are different. By appropriately setting , it is possible to cause a hysteresis phenomenon in the luminance of this element. Figure 2 is a diagram showing the luminance versus applied voltage characteristics of the thin film light emitting device of the above-mentioned Z ship, where the axis represents the amplitude (peak value) V of the applied AC voltage pulse, and the vertical axis represents the luminance B. . As is clear from Fig. 2, the luminance of the device as the voltage of the applied pulse increases (shown by curve A) and the luminance of the device as the voltage decreases (shown as curve B). ), there is a significant hysteresis phenomenon. Therefore, we now select a voltage value Vs (maintenance voltage) at a point where the difference between the minimum luminance Be when the voltage increases and the maximum luminance Bw when the voltage decreases is sufficiently large, and use the AC pulse steering s with this as the amplitude. When driving the element, the element maintains the luminance within the range of luminance Bw depending on the pulse train Ps. That is, when the amplitude of the AC pulse train Ps is instantaneously modulated and a high writing voltage Vw is momentarily applied to the element, the element emits light at the instantaneous brightness Bw', and then emit light at the writing brightness Bw with the next AC sustaining pulse. After settling down, this brightness Bw is maintained by applying the AC sustaining pulse thereafter. On the other hand, if the amplitude of the alternating current sustaining pulse train Ps that maintains the write state in this way is further modulated and a sufficiently low erasing voltage Ve is momentarily applied to the element, the element passes through the instantaneous erasing brightness Be' point and then At the next alternating current sustaining pulse Fs, the brightness settles to the erased brightness Be, and this brightness Be is maintained to perform erasing and memory of the erased state. Further, in the above writing and erasing, if the writing or erasing voltages yw and Ve are arbitrarily selected, an intermediate brightness between the brightness Bw and the skin can be obtained. What has been described above is a method of driving a ZnS thin EL element that has already been proposed, and by doing so, the element can be provided with a kind of memory function.
またかかるZnS薄膜発光素子は外部からの照射光に対
して敏感である事に基いてこの発光素子の光駆動方法が
公知である。Furthermore, since such a ZnS thin film light emitting element is sensitive to external irradiation light, a method for optically driving this light emitting element is known.
第3図は光駆動方法にかかるタイムチャートであって、
図イは素子に印加する印加電圧波形を、図口は発光輝度
波形を示す。FIG. 3 is a time chart related to the optical driving method,
Figure A shows the applied voltage waveform applied to the element, and the figure in the figure shows the luminance luminance waveform.
尚両図にて横軸の時間tは互いに対応して示されている
。以下このタイムチャートに添って光駆動方法を述べる
と、図に示す如く上記維持電圧Veを振幅(波高値)と
する、パルスの休止期間を持った交流パルス列収sを素
子に印加する時、期間T,以前には電圧又は光による書
込みが行われておらず、交流維持パルス刃旧sによって
消去状態の輝度Beを維持している。In both figures, the time t on the horizontal axis is shown in correspondence with each other. The optical driving method will be described below with reference to this time chart. As shown in the figure, when an AC pulse train s having an amplitude (peak value) equal to the sustaining voltage Ve and a rest period of the pulse is applied to the element, the period Before T, no writing was performed using voltage or light, and the brightness Be in the erased state was maintained by the AC sustaining pulse blade s.
期間T2において交流維持パルス勿肝sのパルス期間に
同期して外部よりこの素子に光を照射すると、入射光エ
ネルギーに対応して発光輝度Bは上昇して充分な光照射
の後には白全な書込状態、即ち輝度Bwの状態に落着く
。光照射の停止後もこの書込状態は維持パルス乳肥sの
印加期間中絶持される。(期間t)。次に期間Lに示す
如く、上記パルス列Psの休止期間に同期して外部より
この素子に光を照射すると、入射光エネルギーに対応し
て発光輝度Bは低下し、充分な光照射の後には完全な消
去状態則ち輝度Beの状態に落ち着く。光照射の停止後
もこの消去状態は、維持パルス列Psの印加期間中絶持
され(期間L)、従ってパルス列Psの休止期間に同期
して光照射を行うという上記操作は、消去のための操作
とみなし得る。また期間m2及びT4に於けるこの光書
込及び光消去の時点で、書込み及び消去効果は照射光の
波長入と入射光量、即ち光エネルギーの大きさに対応し
ており、従って光書込み光消去に依る輝度はこの入射光
エネルギーを適当に選ぶ事に依って輝度Bwから輝度B
eまでの任意の値を取ることができ、中間調の書込み及
び消去が可能である。When this element is irradiated with light from the outside in synchronization with the pulse period of the alternating current sustaining pulse s in period T2, the luminance brightness B increases in response to the incident light energy, and after sufficient light irradiation, it becomes completely white. It settles into a writing state, that is, a state where the brightness is Bw. Even after the light irradiation is stopped, this written state is maintained for the duration of the application period of the maintenance pulse milk fertilizer s. (period t). Next, as shown in period L, when this element is irradiated with light from the outside in synchronization with the rest period of the pulse train Ps, the light emission brightness B decreases in accordance with the incident light energy, and after sufficient light irradiation, it becomes completely It settles into an erased state, that is, a state with brightness Be. Even after the light irradiation is stopped, this erased state is maintained for the application period of the sustain pulse train Ps (period L), so the above operation of performing light irradiation in synchronization with the rest period of the pulse train Ps is an operation for erasing. It can be considered. Furthermore, at the time of this optical writing and optical erasing in periods m2 and T4, the writing and erasing effects correspond to the wavelength of the irradiated light and the amount of incident light, that is, the magnitude of the optical energy. The brightness due to brightness can be changed from brightness Bw to brightness B by appropriately selecting this incident light energy.
It can take any value up to e, and can write and erase halftones.
尚この書込み及び消去過程に於いて、素子への光照射は
パルスのーパルス期間及び一休止期間のみならず数個の
パルス期間及び休止期間に亘つて行ってもよい。以上に
述べた光書込みはZnS層の光分極作用により光消去は
ZnS層の光緩和作用によりなされると理解されている
。本発明は薄膜EL素子の光書込み作用を利用し、フィ
ルムに記録された光学像を薄膜EL素子に光書込みする
装置である。In this writing and erasing process, the element may be irradiated with light not only during one pulse period and one pause period, but also over several pulse periods and a pause period. It is understood that the optical writing described above is performed by the optical polarization effect of the ZnS layer, and the optical erasing is performed by the optical relaxation effect of the ZnS layer. The present invention is an apparatus for optically writing an optical image recorded on a film onto a thin film EL element by utilizing the optical writing action of the thin film EL element.
第4図は本発明の一実施例の光駆動装置のブロック図を
示し、21は薄膜EL素子であり、前述の通りの構成を
持つ。FIG. 4 shows a block diagram of an optical drive device according to an embodiment of the present invention, in which 21 is a thin film EL element and has the configuration as described above.
22はフラッシュランプよりなる光源ランプ23、レン
ズ24、反射板25等の光学系及びフラッシュランプを
点灯するためのフラッシュランプ点灯回路基板26、ト
リガーコイル27、コンデンサ28等の電気系、その他
を収納して構成されるプロジヱクタ−である。22 houses a light source lamp 23 consisting of a flash lamp, an optical system such as a lens 24, a reflector 25, etc., an electric system such as a flash lamp lighting circuit board 26, a trigger coil 27, a capacitor 28, etc. for lighting the flash lamp, and others. It is a projector consisting of
電気系特に基板26はノイズの点からプロジェクター内
に収納するのが望ましい。29は上記光学系の光路の途
中に出入自在のフィルムである。In view of noise, it is desirable that the electrical system, particularly the board 26, be housed within the projector. Reference numeral 29 denotes a film that can be inserted into and removed from the optical path of the optical system.
30は上記フラッシュランプ点灯回路基板26と薄膜E
L素子の駆動回路31に接続され、維持パルスのトリガ
信号とフラッシュランプ点灯用の充電パルスを作成する
制御回路である。30 is the flash lamp lighting circuit board 26 and the thin film E.
This control circuit is connected to the L element drive circuit 31 and creates a trigger signal for a sustain pulse and a charging pulse for lighting the flash lamp.
駆動回路31は前記維持パルスを発生して薄膜EL素子
の電極間に維持パルスを印加する。またこの駆動回路は
前詰消去パルスを発生し、これを薄膜EL素子の全軍極
に同時に印加して全面消去する。つまり光書込みされた
像を電圧消去する。第5図はフラッシュランプ点灯回路
を示し、23はフラッシュランプ、C,はフラッシュラ
ンプ点灯用大容量コンデンサ、T,は充電用スイッチン
グトランジスタ、T2はトランジスタT,の制御用トラ
ンジスタ、VLは電極、Mは巻数比が80:1のトリガ
ーコイル、T3はトリガートランジス夕、C2はコンデ
ンサ、aは充電パルス入力端子、bはトリガー入力端子
である。The drive circuit 31 generates the sustain pulse and applies the sustain pulse between the electrodes of the thin film EL element. This drive circuit also generates a front-fill erase pulse, which is applied to all the poles of the thin film EL element at the same time to erase the entire surface. In other words, the optically written image is erased by voltage. Figure 5 shows a flash lamp lighting circuit, 23 is a flash lamp, C is a large capacity capacitor for lighting the flash lamp, T is a switching transistor for charging, T2 is a control transistor for transistor T, VL is an electrode, M is a trigger coil with a turns ratio of 80:1, T3 is a trigger transistor, C2 is a capacitor, a is a charging pulse input terminal, and b is a trigger input terminal.
この回路はマニアルスイツチ(図示しない)により入力
された信号によって制御回路30が維持パルスのパルス
期間に同期したトリガーパルスを発生し、このトリガー
パルスが端子bを介してトランジスタT3をオンにして
フラッシュランプ23を発光動作させる。In this circuit, the control circuit 30 generates a trigger pulse synchronized with the pulse period of the sustain pulse in response to a signal inputted by a manual switch (not shown), and this trigger pulse turns on the transistor T3 via terminal b to turn on the flash lamp. 23 to emit light.
ランプの発光動作が終了した後、制御回路30は充電パ
ルスを1〜2秒間発生し、これが端子aを介してトラン
ジスタT,及びLをオンにしてコンデンサC,に次の発
光に備えて充電する。After the lamp has finished emitting light, the control circuit 30 generates a charging pulse for 1 to 2 seconds, which turns on transistors T and L via terminal a, charging capacitor C in preparation for the next light emission. .
しかして、このフラッシュランプの発光時に薄膜EL素
子に維持パルスのパルス期間が同期しているので、プロ
ジヱクター22により3〜4倍に拡大された像の光書込
みが行われる。フラッシュランプで発した光はネガフイ
ルム29で変調を受け、ネガフィルムの像(即ちネガ)
が薄膜EL素子に光書込みされる。ネガフィルム29で
光量が制御されるので、薄膜EL素子の光書込み像は中
間調表示する。なお、第5図の回路コンデンサC,の容
量は400仏F、コンデンサC2の容量は0.1AF、
電圧VIは250Vである。Since the pulse period of the sustain pulse is synchronized with the thin film EL element when the flash lamp emits light, an image magnified three to four times is optically written by the projector 22. The light emitted by the flash lamp is modulated by the negative film 29, and the image of the negative film (i.e., negative) is
is optically written into the thin film EL element. Since the amount of light is controlled by the negative film 29, the optically written image on the thin film EL element is displayed in halftone. In addition, the capacitance of circuit capacitor C in Fig. 5 is 400 French F, the capacitance of capacitor C2 is 0.1 AF,
Voltage VI is 250V.
また第5図の回路において、コンデンサC,を急速充電
する必要がなければ、トランジスタスイッチを用いない
で、大きな抵抗を使用してもよいoところで、本発明の
上記実施例はキセノンフラッシュランプを使用している
が、これは次のような理由による。In addition, in the circuit of FIG. 5, if there is no need to rapidly charge the capacitor C, a large resistor may be used instead of the transistor switch. However, the above embodiment of the present invention uses a xenon flash lamp. However, this is due to the following reasons.
薄膜EL素子の照射光波長に対する光感度の特性は第6
図の曲線イに示す通りであって、3500Aに最大感度
のピークを持つ。従って光源としては3500△の波長
を多く含むものが最適であることが分る。この光源とし
ては例えば光源として駆動の簡単さ、取り扱いの手軽さ
よりタングステンランプがあり、フラッシュランプの一
例としてキセノンランプがある。それらの発光波長特性
を第7図に示す。この図より3500Aを比較して多く
含むキセノンランプの方がタングステンランプに比べて
EL素子の光書込み、消去には適していることがわかる
。さらに、本発明のようにタイミングをとって発光させ
るには、タングステンランプのように応答の遅いもので
は不可能である。なぜならEL素子の維持駆動周波数は
100日2以上を必要とするので、1位hsec以内の
タングステンランプのオン−オフは非常に困難だからで
ある。それに対し、キセノンフラッシュランプは、電荷
充電用コンデンサの容量にもよるが、数msec以下の
発光が可能であり、十分第3図に示すような維持交流パ
ルスとタイミングをとつて発光させることは可能である
。さらに、強度的にもタングステンランプよりキセノン
フラッシュランプの方が非常に強くてEL素子への光書
込み、消去に適している。EL素子にフィルム画像を光
書込みする場合、維持パルスが加わっているときに瞬時
強力な光を照射しなければならない。連続的に光が照射
されると、維持パルスのパルス期間では光書込みが行わ
れるが、パルス休止期間では光消去が行われる。結局、
光書込みと光消去の差の光書込みしか行われず、光書込
みの効率が悪いばかりでなく、維持パルスのデューティ
が小さい場合は、光書込みができなくなる。またこの場
合、フィルムを介して光量を制御し、薄膜由L素子の光
書込み像は中間調表示するので、特に、光書込みと光消
去の差だけの光書込みは中間調表示に著しい悪影響を与
える。The characteristics of the photosensitivity of the thin film EL element with respect to the wavelength of the irradiated light are as follows.
As shown in curve A in the figure, it has a maximum sensitivity peak at 3500A. Therefore, it can be seen that the optimal light source is one that includes many wavelengths of 3500Δ. As this light source, for example, a tungsten lamp is used because it is easy to drive and easy to handle, and a xenon lamp is an example of a flash lamp. Their emission wavelength characteristics are shown in FIG. From this figure, it can be seen that the xenon lamp containing a larger amount of 3500A is more suitable for optical writing and erasing of EL elements than the tungsten lamp. Furthermore, it is impossible to emit light at the right timing as in the present invention with a slow response lamp such as a tungsten lamp. This is because the sustain driving frequency of the EL element requires 100 days or more, so it is very difficult to turn on and off the tungsten lamp within 1 hsec. On the other hand, xenon flash lamps can emit light for several milliseconds or less, depending on the capacity of the charging capacitor, and it is possible to emit light in time with the maintenance AC pulse as shown in Figure 3. It is. Furthermore, in terms of intensity, a xenon flash lamp is much stronger than a tungsten lamp and is suitable for optical writing and erasing of EL elements. When optically writing a film image onto an EL element, intense light must be instantaneously irradiated while a sustain pulse is being applied. When light is continuously irradiated, optical writing is performed during the pulse period of the sustain pulse, but optical erasing is performed during the pulse rest period. in the end,
Only the optical writing that is the difference between optical writing and optical erasing is performed, and not only is the efficiency of optical writing poor, but also optical writing becomes impossible if the duty of the sustain pulse is small. In addition, in this case, the amount of light is controlled through the film, and the optically written image on the thin film L element displays halftones, so in particular, optical writing based on the difference between light writing and light erasing has a significant negative effect on the halftone display. .
したがって光書込みを効率よく正確に行うには維持パル
スのパルス期間だけ光を通すようなシャッターが必要で
あり、このシャッターは維持パルスと同期をとって開閉
しなければならない。このように、タングステンランプ
は薄膜EL素子の光書込みの場合の光源としては不適当
であり、且つシャッター等の機械系を必要とし、故障等
の原因となりやすい。Therefore, in order to perform optical writing efficiently and accurately, a shutter that allows light to pass through for only the duration of the sustain pulse is required, and this shutter must be opened and closed in synchronization with the sustain pulse. As described above, the tungsten lamp is not suitable as a light source for optical writing of thin film EL elements, and requires a mechanical system such as a shutter, which is likely to cause malfunctions.
これに対してキセノンフラッシュランプを使用する場合
は、上記のような問題はない。本発明の光書込みの場合
、薄膜EL素子の電極4及び5は互いに直交する稿状の
電極、いわゆるマトリックス状に形成しなくとも電極4
及び5はそれぞれ全一面の電極であってもよい。On the other hand, when using a xenon flash lamp, the above problems do not occur. In the case of optical writing of the present invention, the electrodes 4 and 5 of the thin film EL element are paper-shaped electrodes that are orthogonal to each other, and even if the electrodes 4 and 5 are not formed in a so-called matrix shape, the electrodes 4 and 5 of the thin film EL element are
and 5 may each be an entire surface electrode.
むしろ全一面の電極の場合には縞状電極の間隙がないの
で、光書込み像はより繊密になる。これは第6図に示す
ように、薄膜EL素子の受光感度特性のピークが350
0Aにあるのに対して、発光特性は第6図の曲線口で示
すように、Mnを活性物質とするとき、6000A付近
にピークをもつ黄燈発光をするからであり、そして薄膜
EL素子は自己の発光を受けて発光領域を広げる作用、
即ち光のにじみ出しがないからである。以上のように本
発明はフラッシュランプの点灯時期を薄膜EL素子に印
加する維持パルスのパルス期間に同期させるので、シャ
ッターは不要である。In fact, in the case of electrodes covering the entire surface, there are no gaps between the striped electrodes, so the optically written image becomes more delicate. As shown in Figure 6, this means that the peak of the light receiving sensitivity characteristic of the thin film EL element is 350.
This is because when Mn is used as the active material, yellow light emission occurs with a peak around 6000 A, and the thin film EL element emits yellow light as shown by the curve opening in Figure 6. The effect of expanding the luminous area by receiving its own luminescence,
That is, there is no light seepage. As described above, the present invention synchronizes the lighting timing of the flash lamp with the pulse period of the sustain pulse applied to the thin film EL element, so a shutter is not required.
また薄膜EL素子に印加する維持パルスのデューティは
特別な制限がなく任意に選ぶことができる。フラッシュ
ランプの光量は点灯用コンデンサの容量を変化させるこ
とにより容易に変化することができる。更に普通プロジ
ェクターに備えられている冷却ファンはフラッシュラン
プを使用することにより不要である。Further, the duty of the sustain pulse applied to the thin film EL element is not particularly limited and can be arbitrarily selected. The amount of light from the flash lamp can be easily changed by changing the capacity of the lighting capacitor. Furthermore, the use of a flash lamp eliminates the need for a cooling fan, which is normally provided in projectors.
第1図は本発明の薄膜EL素子の断面構成図、第2図薄
膜EL素子の電圧−輝度特性図、第3図イは交流パルス
列肝sと光照射のタイミングを説明する図、第3図口は
交流パルス列Psと光照射と発光輝度の関係図、第4図
は本発明による光書込み装置の構成図、第5図は本発明
の要部を構成するフラッシュランプ点灯回路図、第6図
はEL素子の光感度特性と発光特性図、第7図はタング
ステンランプとキセノンランプの分光特性図である。
21は薄膜EL素子、22はプロジェクタ、23はフラ
ッシュランプ、30は制御回路、31は駆動回路。
キー図
力2図
矛3図
ギ4図
才5図
矛6図
才7図Fig. 1 is a cross-sectional configuration diagram of the thin film EL device of the present invention, Fig. 2 is a voltage-luminance characteristic diagram of the thin film EL device, Fig. 3A is a diagram explaining the AC pulse train reference s and the timing of light irradiation, Fig. 3 Figure 4 is a diagram showing the relationship between AC pulse train Ps, light irradiation, and luminance, Figure 4 is a configuration diagram of an optical writing device according to the present invention, Figure 5 is a flash lamp lighting circuit diagram constituting the main part of the present invention, and Figure 6 is a diagram showing the relationship between AC pulse train Ps, light irradiation, and luminance. 7 shows the photosensitivity and light emission characteristics of the EL element, and FIG. 7 shows the spectral characteristics of a tungsten lamp and a xenon lamp. 21 is a thin film EL element, 22 is a projector, 23 is a flash lamp, 30 is a control circuit, and 31 is a drive circuit. Key figure 2 figure spear 3 figure gi 4 figure 5 figure 6 figure 7 figure
Claims (1)
薄膜EL素子、該薄膜EL素子に電圧上昇時の最小発光
輝度と電圧下降時の最大発光輝度との差が充分に大きい
点の電圧値を持つ交流パルス列を印加する手段、上記交
流パルス列のパルス期間に同期して光学的像を記録した
フイルムを介してキセノンフラツシユランプ光を前記薄
膜EL素子に照射する手段とを備えてなることを特徴と
する薄膜EL素子の光駆動装置。1. A thin film EL element that has a hysteresis phenomenon in its applied voltage and luminance characteristics, and an alternating current that has a voltage value at a point where the difference between the minimum luminance when the voltage increases and the maximum luminance when the voltage decreases is sufficiently large. It is characterized by comprising means for applying a pulse train, and means for irradiating the thin film EL element with xenon flash lamp light via a film recording an optical image in synchronization with the pulse period of the alternating current pulse train. Optical drive device for thin film EL elements.
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP52099000A JPS609280B2 (en) | 1977-08-17 | 1977-08-17 | Optical drive device for thin film EL elements |
| DE2831788A DE2831788C3 (en) | 1977-07-20 | 1978-07-19 | Method and circuit arrangement for controlling a thin-film electroluminescent display element that can be excited by the action of light |
| US05/925,973 US4210848A (en) | 1977-07-20 | 1978-07-19 | Thin-film EL display panel with light-activated write and erase means |
| FR7821430A FR2398358A1 (en) | 1977-07-20 | 1978-07-19 | THIN LAYER ELECTROLUMINESCENT DISPLAY PANEL |
| GB7830590A GB2003171B (en) | 1977-07-20 | 1978-07-20 | Thin-film el display panel with light-activated write and erase means |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP52099000A JPS609280B2 (en) | 1977-08-17 | 1977-08-17 | Optical drive device for thin film EL elements |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5432286A JPS5432286A (en) | 1979-03-09 |
| JPS609280B2 true JPS609280B2 (en) | 1985-03-08 |
Family
ID=14234691
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP52099000A Expired JPS609280B2 (en) | 1977-07-20 | 1977-08-17 | Optical drive device for thin film EL elements |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS609280B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6031340A (en) * | 1983-08-01 | 1985-02-18 | Nippon Telegr & Teleph Corp <Ntt> | Time division line channel selecting system |
| JPS6033763A (en) * | 1983-08-05 | 1985-02-21 | Nippon Telegr & Teleph Corp <Ntt> | Speed selecting communication system |
-
1977
- 1977-08-17 JP JP52099000A patent/JPS609280B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5432286A (en) | 1979-03-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3975661A (en) | Driving method for a thin-film electroluminescent element of a three-layer construction | |
| JP3242941B2 (en) | Active EL matrix and driving method thereof | |
| DE2656140C2 (en) | Electroluminescent storage and display element | |
| BRPI0712688A2 (en) | method of optically writing to a read light valve; optical recording valve; a computer program incorporated in a memory comprising computer readable instructions for performing actions directed at recording light emission. | |
| US2468452A (en) | Cathode-ray indicator system | |
| US4210848A (en) | Thin-film EL display panel with light-activated write and erase means | |
| US4206460A (en) | EL Display drive controlled by an electron beam | |
| US5210468A (en) | Gas-discharge display element driven by using seed discharge | |
| JPS609280B2 (en) | Optical drive device for thin film EL elements | |
| US3967112A (en) | Photo-image memory panel and activating method thereof | |
| US2885560A (en) | X-ray method | |
| US4818913A (en) | Aging method for thin-film electroluminescent display panel | |
| JPS609279B2 (en) | Optical driving method for thin film EL elements | |
| US4024389A (en) | Photo-image memory panel and activating method therefor | |
| JPS5842473B2 (en) | Hakumaku EL Soshino Kudohouhou | |
| JPS599067B2 (en) | Elimination circuit for thin film electroluminescent panels | |
| JPS609278B2 (en) | Light erasing circuit for thin film EL elements | |
| JPS599068B2 (en) | How to erase thin film electroluminescent panels | |
| JPS5823189A (en) | Method of ageing thin film el element | |
| JPS60216388A (en) | EL drive device | |
| EP0516352A2 (en) | Apparatus and method of successively recording information carried by electro-magnetic radiation beam | |
| JPS6010629B2 (en) | Driving method of thin film EL element | |
| JPS609277B2 (en) | How to erase thin film EL elements | |
| US3286027A (en) | Electro-luminescent phosphorescent dynamic display | |
| JPH04315138A (en) | Self-light emitting screen and method for displaying image information by using this self-light emitting screen |